Semiconductor module

WO2026063046A1PCT designated stage Publication Date: 2026-03-26FUJI ELECTRIC CO LTD
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Patent Information

Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Filing Date
2025-07-24
Publication Date
2026-03-26

AI Technical Summary

Technical Problem

Existing semiconductor modules face challenges in reducing the inductance of gate wiring, which can lead to variations in wiring distance and increased inductance between semiconductor chips, causing gate vibration and inefficiencies.

Method used

The semiconductor module design includes a gate wiring configuration with branching and folded-back portions, along with auxiliary signal wiring, to minimize inductance and stabilize wiring distances, using a printed circuit board with specific intervals and connections to reduce inductance.

Benefits of technology

This configuration effectively reduces inductance and stabilizes wiring distances, suppressing gate vibration and improving the performance of semiconductor modules.

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  • Figure JP2025026207_26032026_PF_FP_ABST
    Figure JP2025026207_26032026_PF_FP_ABST
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Abstract

The present invention reduces the inductance of gate wiring for a plurality of semiconductor chips. A plurality of semiconductor chips each having a gate electrode and a first main electrode on the upper surface thereof are disposed in two rows in a first direction orthogonal to a center line (CL) in a mirror image arrangement with the center line (CL) interposed therebetween. Gate wiring (31) of a printed circuit board (30) disposed on the upper side of the plurality of semiconductor chips includes: a first region extending in the first direction between a first semiconductor chip belonging to a first row and a second semiconductor chip belonging to a second row; a second region including a branch portion that branches into two branches in mutually opposite directions in a second direction orthogonal to the first direction from each of both ends facing each other in the first direction of the first region, and a folded portion that is folded back in the first direction from the branch portion such that the first region is put therebetween with a first gap therebetween; a gate terminal connection region (31c) that is a portion intersecting with the center line (CL) of the first region; and gate electrode connection regions (31d1-31d8) provided in the branch portion and the folded portion of the second region.
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Citation Information

Patent Citations

  • Semiconductor module

    JP2021141219A

  • Semiconductor device

    JP2022191879A

  • Power conversion device

    WO2019064874A1