Mold system, parameter tuning method, and device

Abstract

A mold system, a parameter tuning method, and a device. The method comprises: acquiring measured values of multiple key parameters of a mold system; determining the deviations between the measured values and theoretical values of the multiple key parameters; on the basis of the deviations of the multiple key parameters, determining correlation impact values of the multiple key parameters on stable production; on the basis of the correlation impact values, determining whether to trigger parameter tuning of the mold system; if it is determined to trigger parameter tuning of the mold system, selecting target key parameters from the multiple key parameters; and performing parameter tuning on the target key parameters.

Description

Mold system, parameter debugging methods and equipment

[0001] This application claims priority to Chinese Patent Application No. 202411440964.8, filed on October 15, 2024, entitled "Mold System, Parameter Adjustment Method and Equipment", the entire contents of which are incorporated herein by reference. Technical Field

[0002] This application relates to the field of intelligent control technology, specifically to a mold system, parameter debugging method, and equipment. Background Technology

[0003] Traditional mold system debugging involves adjusting parameters related to the mold, stamping equipment, or production materials. Each debugging session requires trial and error to reach a balance point for various parameters in production, thereby achieving stable production. However, this trial-and-error approach leads to significant resource waste, including personnel, equipment, raw materials, utilities, and space, as well as wasted debugging time. Furthermore, it's difficult to determine whether the adjusted parameters are appropriate. Therefore, efficiently debugging mold system parameters has become a crucial technical problem to be solved. Summary of the Invention

[0004] In view of this, embodiments of the present invention provide a mold system, parameter debugging method and equipment, which can debug parameters based on the superimposed influence of each key parameter on stable production, provide a reasonable basis for debugging parameters, and improve debugging efficiency.

[0005] In a first aspect, embodiments of the present invention provide a method for adjusting parameters of a mold system, including:

[0006] Obtain the measured values ​​of several key parameters of the mold system;

[0007] Determine the deviations between the measured and theoretical values ​​of the multiple key parameters;

[0008] Based on the deviations of the multiple key parameters, determine the correlation impact values ​​of the multiple key parameters on stable production;

[0009] Based on the associated impact value, determine whether to trigger parameter adjustment of the mold system;

[0010] If it is determined that parameter debugging of the mold system is triggered, then the target key parameter is selected from the plurality of key parameters;

[0011] The key parameters of the target are adjusted.

[0012] In some embodiments, determining the deviation between the measured and theoretical values ​​of the plurality of key parameters includes:

[0013] Determine the differences between the theoretical and measured values ​​of the multiple key parameters respectively;

[0014] Based on the ratio of the difference between the multiple key parameters to the corresponding theoretical value, the difference rate of the multiple key parameters is determined respectively. The difference rate is used to represent the deviation between the measured value and the theoretical value of the key parameter.

[0015] In some embodiments, determining the correlation impact values ​​of the plurality of key parameters on stable production based on the deviations of the plurality of key parameters includes:

[0016] The correlation impact value is obtained by weighting the difference rates of the multiple key parameters.

[0017] In some embodiments, determining whether to trigger parameter adjustments to the mold system based on the associated influence value includes:

[0018] If the associated influence value is greater than the first set value, then it is determined that parameter adjustment of the mold system will be triggered.

[0019] In some embodiments, the step of selecting a target key parameter from the plurality of key parameters if it is determined that parameter debugging of the mold system is triggered includes:

[0020] The key parameter whose deviation is within a preset adjustable range is selected as the target key parameter.

[0021] In some embodiments, the parameter tuning of the target key parameter includes:

[0022] Based on the difference between the theoretical and measured values ​​of the target key parameters, determine the parameter adjustment amount and direction;

[0023] Based on the parameter adjustment amount and direction, the target key parameters are adjusted; wherein...

[0024] The parameter adjustment amount is less than the absolute value of the difference between the theoretical value and the measured value of the target key parameter;

[0025] The adjustment direction is to approach the theoretical value of the target key parameter.

[0026] In some embodiments, determining the parameter adjustment amount based on the difference between the theoretical and measured values ​​of the target key parameter includes:

[0027] If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than the second set value, then the first adjustment amount is determined;

[0028] The target key parameter is adjusted in a direction that approaches the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value;

[0029] Based on the second set value, the target key parameter is adjusted multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0030] In some embodiments, the step of adjusting the target key parameter multiple times based on the second set value until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value includes:

[0031] The second adjustment amount is determined based on the second set value and the number of steps.

[0032] Adjust the target key parameters in a direction that approaches the theoretical value according to the second adjustment amount;

[0033] Determine whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value;

[0034] If so, then stop adjusting the target key parameters;

[0035] If not, then based on the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, a third adjustment amount is determined and the target key parameter is adjusted again until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0036] In some embodiments, the method further includes: if the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to a second set value, then the target key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value of the target key parameter and the number of steps, until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0037] In some embodiments, before determining whether to trigger parameter adjustments to the mold system based on the associated influence value, the method further includes:

[0038] Each of the key parameters is independently adjusted. The absolute value of the difference between the theoretical and measured values ​​of each key parameter after independent adjustment is less than a fourth set value. That is, before adjusting the parameters of the mold system based on the correlation influence value, each key parameter is first independently adjusted. The absolute value of the difference between the theoretical and measured values ​​of each key parameter after independent adjustment is less than a certain value, which is also called the fourth set value for convenience of description.

[0039] In a second aspect, embodiments of the present invention provide a control device, comprising: at least one processor; and at least one memory communicatively connected to the processor, wherein: the memory stores program instructions executable by the processor, and the processor invokes the program instructions to perform the method described in the first aspect or any one thereof.

[0040] Thirdly, embodiments of the present invention provide a mold system, including: mold equipment, a sensing component for collecting measured values ​​of multiple key parameters of the mold equipment in the mold system; and a control device for receiving the measured values ​​of the multiple key parameters and executing the method described in the first aspect or any one of the first aspects based on the measured values ​​of the multiple key parameters.

[0041] Fourthly, embodiments of the present invention provide a computer-readable storage medium comprising a stored program, wherein, when the program is executed, it controls the device where the computer-readable storage medium is located to perform the method described in the first aspect or any one of the first aspects.

[0042] The mold system, parameter debugging method, and equipment of the present invention have at least the following beneficial effects:

[0043] After obtaining the measured values ​​of each key parameter in this embodiment of the invention, the deviation between the measured values ​​and the theoretical values ​​of each key parameter is determined. Based on the deviations of each key parameter, the correlation impact of each key parameter on stable production can be determined. Based on this correlation impact, it can be determined whether parameter debugging should be performed, and which key parameters should be debugged, thus providing a basis for parameter debugging. The method of this embodiment of the invention eliminates the need to blindly attempt to debug each parameter, avoiding the waste caused by debugging each parameter individually, reducing debugging time, and improving debugging efficiency. Attached Figure Description

[0044] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0045] Figure 1 is a schematic diagram of a mold system provided in an embodiment of the present invention;

[0046] Figure 2 is a flowchart of a method for debugging key parameters of a mold system according to an embodiment of the present invention;

[0047] Figure 3 is a flowchart of a method for parameter debugging based on the correlation between key parameters provided in an embodiment of the present invention;

[0048] Figure 4 is a schematic diagram of the structure of a control device provided in an embodiment of the present invention;

[0049] Figure 5 is a schematic diagram of the structure of a control device provided in an embodiment of the present invention. Detailed Implementation

[0050] To better understand the technical solution of this application, the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0051] It should be understood that the described embodiments are merely some, not all, of the embodiments in this application. All other embodiments obtained by those skilled in the art based on the embodiments in this application without inventive effort are within the scope of protection of this application.

[0052] The terminology used in the embodiments of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of this application. The singular forms “a,” “the,” and “the” used in the embodiments of this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise.

[0053] It should be understood that the term "and / or" used in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0054] Referring to Figure 1, a schematic diagram of a mold system provided in an embodiment of the present invention is shown. The mold system shown in Figure 1 can be a mold system for a vehicle production line. As shown in Figure 1, the mold system includes mold equipment, sensing components, and control equipment. The mold equipment may include product molds and stamping equipment, etc. The sensing components are deployed on the mold equipment to collect measured values ​​of key parameters of the product mold and / or stamping equipment. The sensing components transmit the collected measured values ​​of the key parameters of the product mold and / or stamping equipment to the control equipment. The control equipment executes a parameter adjustment strategy based on the measured values ​​of the key parameters of the product mold and / or stamping equipment.

[0055] After the mold equipment is installed in the mold system shown in Figure 1, the theoretical values ​​of the production parameters of the mold equipment are set, such as the theoretical values ​​of various production parameters of the product mold and the stamping equipment, and then the mold system is run. During the operation of the mold system, the sensing components can collect the measured values ​​of key parameters among the various production parameters of the product mold and / or the stamping equipment at a certain sampling frequency. Inevitably, there may be deviations between the theoretical values ​​and the measured values ​​of the key parameters of the mold equipment. These deviations can form parameter chains, and these deviation parameter chains can have a correlated impact on the stable production of the product, thereby triggering parameter adjustments to the mold system. The parameter adjustment method of the present invention will be described in detail below with reference to embodiments.

[0056] After the mold equipment is installed, the theoretical values ​​of various production parameters of the mold equipment are set, as shown in Figure 1, and then the mold system is run. During the operation of the mold system, the sensing components collect the measured values ​​of several key parameters of the mold equipment. The sensing components send the measured values ​​of these key parameters to the control equipment. The control equipment can first independently adjust each key parameter, and the difference between the independently adjusted key parameters and the theoretical values ​​is within a controllable range. After independently adjusting each key parameter, the stable operation of the mold system can be ensured to a certain extent.

[0057] Referring to Figure 2, a flowchart of a method for adjusting key parameters of a mold system according to an embodiment of the present invention is shown. As shown in Figure 2, the processing steps of this method include:

[0058] 101. Obtain the measured values ​​of each key parameter.

[0059] 102. Determine the deviation between the measured and theoretical values ​​of each key parameter.

[0060] 103. Determine if the deviations of each key parameter are within the adjustable range. If the deviations are within the adjustable range, adjust the corresponding key parameter independently. If the deviations are less than the minimum boundary value of the adjustable range, no adjustment is needed. If the deviations are greater than the maximum boundary value of the adjustable range, the mold system needs to be shut down for maintenance.

[0061] The process of determining the deviation between the theoretical and measured values ​​of a key parameter includes: determining the difference between the theoretical and measured values ​​of the key parameter; and determining the difference rate of the key parameter based on the ratio between the difference and the theoretical value. This difference rate is used to represent the deviation between the measured and theoretical values ​​of the key parameter.

[0062] In one example, let Fs be the theoretical value of the key parameter, Fa be the measured value of the key parameter, and α be the variance rate. Then the formula for calculating the variance rate of the key parameter can be:

[0063] Formula 1: α=(Fs-Fa) / Fs*100%.

[0064] The mold system continues to operate when α < 0.05%; or, the mold system continues to operate when the absolute value of α < 0.05%.

[0065] When 0.05% ≤ α ≤ 0.1%, it is determined that the key parameters of the mold system need to be adjusted. Alternatively, when the absolute value of 0.05% ≤ α ≤ 0.1%, it is determined that the key parameters of the mold system need to be adjusted.

[0066] When α > 0.1%, the difference rate of the key parameter exceeds the adjustable range, and the mold system is shut down for maintenance. Alternatively, when the absolute value of α > 0.1%, the difference rate of the key parameter exceeds the adjustable range, and the mold system is shut down for maintenance.

[0067] In the above example, when the difference rate is [0.05%, 0.1%] or the absolute value of the difference rate is [0.05%, 0.1%], it indicates that the key parameter is within the adjustable range, and adjustment of the key parameter can be performed. When the difference rate or absolute value of the key parameter is less than the minimum boundary value of the adjustable range, adjustment of the key parameter is not required. When the difference rate or absolute value of the key parameter is greater than the maximum boundary value of the adjustable range, the mold system should be stopped for maintenance.

[0068] When adjusting key parameters, to avoid damage to the mold equipment or waste of materials, the adjustment amount of each key parameter should not be too large. Specifically, the key parameter can be adjusted in multiple stages based on the difference between the theoretical and measured values.

[0069] Based on the difference between the theoretical and measured values ​​of the key parameters, determine the parameter adjustment amount and direction. Adjust the key parameters according to the adjustment amount and direction; the adjustment amount is less than the absolute value of the difference between the theoretical and measured values ​​of the key parameters; the adjustment direction is towards the theoretical value of the key parameters.

[0070] The adjustment amount for a key parameter is determined based on the difference between its theoretical and measured values. This includes: if the absolute value of the difference between the theoretical and measured values ​​is greater than a second set value, a first adjustment amount is determined. The key parameter is then adjusted towards the theoretical value according to the first adjustment amount, where the absolute value of the difference between the adjusted key parameter and the theoretical value is the second set value. Based on the second set value, the target key parameter is adjusted multiple times until the absolute value of the difference between the key parameter and the theoretical value is less than a third set value.

[0071] The process involves adjusting the key parameters multiple times based on the second set value until the absolute value of the difference between the key parameter and the theoretical value is less than the third set value. This includes: determining the second adjustment amount based on the second set value and the number of adjustments; adjusting the key parameter in a direction closer to the theoretical value according to the second adjustment amount; determining whether the absolute value of the difference between the adjusted key parameter and the theoretical value is less than the third set value; if so, stopping the adjustment of the key parameter; if not, determining the third adjustment amount based on the absolute value of the difference between the adjusted key parameter and the theoretical value and the number of adjustments, and continuing to adjust the key parameter until the absolute value of the difference between the key parameter and the theoretical value is less than the third set value.

[0072] Specifically, if the absolute value of the difference between the theoretical and measured values ​​of a key parameter is less than or equal to a second set value, the key parameter is adjusted multiple times based on the absolute value of the difference between the theoretical and measured values ​​and the number of steps, until the absolute value of the difference between the key parameter and the theoretical value is less than a third set value. It should be noted that this third set value is a preset value, which, for ease of description in different scenarios, may also be referred to as a fourth set value, a fifth set value, etc.

[0073] In one example, when the absolute value of the difference between the theoretical and measured values ​​of a key parameter is less than or equal to the second set value, the single adjustment amount αn of the key parameter can be determined according to Formula 2.

[0074] Formula 2: αn=(Fs-Fa) / n.

[0075] Here, n can be a fixed value. The magnitude of αn represents the single adjustment amount of the key parameter, and the sign of αn indicates the direction of adjustment. When αn is positive, it means that the measured value of the key parameter is less than the theoretical value, and the key parameter needs to be adjusted in the direction of increasing. When αn is negative, it means that the measured value of the key parameter is greater than the theoretical value, and the key parameter needs to be adjusted in the direction of decreasing.

[0076] In some examples, several key parameters of the mold system include one or more of the following: production tonnage (a), production cycle time (b), air cushion size (c), material flow rate (d), mold closing height (e), mold temperature (f), and mold wear (g). Those skilled in the art can derive other parameters from the listed parameters; methods for adjusting other parameters can be found in the methods for adjusting the already listed parameters.

[0077] In some examples, debugging of various key parameters includes:

[0078] Production tonnage (a): Increase or decrease the output tonnage of the equipment;

[0079] Production cycle time (b): Decrease or increase the cycle time;

[0080] Air cushion size (c): Increase or decrease the size of the air cushion output pressure source;

[0081] Material inflow (d): Increasing or decreasing the amount of material used;

[0082] Mold closing height (e): Decrease or increase the closing height;

[0083] Mold temperature (f): Increase or decrease the flow rate of the cooling medium to lower or increase the mold temperature;

[0084] Mold wear (g): The amount of friction that increases or decreases;

[0085] (g): Increase or decrease the magnitude of friction.

[0086] Example 1:

[0087] The theoretical value of the mold closing height is 1000mm. During production, a slight change in the closing height causes it to decrease to 999mm. Under these conditions, the produced products exhibit cracking defects, with a difference rate α = (1000-999) / 1000 = 0.1%. The value of α is within the adjustable range. Adjusting the mold closing height using control equipment includes:

[0088] Scenario 1: The difference between the theoretical and measured values ​​of the mold closing height is 1mm, which is less than the set value of 2mm. In this case, the mold closing height should be adjusted multiple times as follows:

[0089] The difference between the theoretical and measured values ​​of the mold closing height is 1mm, meaning the total adjustment value is 1mm. With n = 5 adjustments made in steps, the adjustment amount for each step is:

[0090] The initial adjustment was α1 = (1000 - 999) / 5 = 0.2 mm;

[0091] The second adjustment was α2 = (1000 - 999.2) / 5 = 0.16 mm;

[0092] The third adjustment amount is α3 = (1000 - 999.36) / 5 = 0.128 mm;

[0093] When the absolute value of the difference between the adjusted mold closing height and the theoretical value, i.e. the total adjustment value, is less than 0.1mm, the adjustment of the mold closing height is stopped.

[0094] Scenario 2: If the difference between the theoretical and measured values ​​of the mold closing height is greater than the set value by 2mm, a rapid adjustment of the mold closing height is allowed. The absolute value of the difference between the adjusted mold closing height and the theoretical value is 2mm. Then, the mold closing height is adjusted step-by-step multiple times according to Scenario 1.

[0095] Scenario 3: The theoretical value of the mold closing height is less than the measured value. For example, if the theoretical value is 1000mm and the measured value is 1001mm, then the adjustment direction is opposite to the adjustment direction mentioned above.

[0096] Example 2:

[0097] The theoretical production tonnage is 2000 tons, while the actual measured value is 1800 tons. Insufficient pressure may cause wrinkling or stacking of the product. In this case, the difference rate α = (2000-1800) / 2000 = 10%, and the machine should be stopped for maintenance. If the actual measured value is 1998 tons, the difference rate α = (2000-1998) / 2000 = 0.1%. In this case, the production tonnage parameters should be adjusted according to Formula 2. The adjustment method can be found in Example 1.

[0098] After each key parameter is independently adjusted so that the absolute value of the difference between each key parameter and the theoretical value is within the third set value (also known as within a certain value), the control equipment can superimpose each key parameter to calculate the correlation between each key parameter, and then adjust the mold system according to the correlation between each key parameter.

[0099] Referring to Figure 3, a flowchart of a method for parameter debugging based on the correlation between key parameters provided by an embodiment of the present invention is shown. As shown in Figure 3, the processing steps of this method include:

[0100] 201. Obtain the measured values ​​of several key parameters of the mold system.

[0101] 202, determine the deviation between the measured and theoretical values ​​of several key parameters.

[0102] 203. Based on the deviations of multiple key parameters, determine the correlation impact values ​​of multiple key parameters on stable production.

[0103] 204. Based on the associated influence value, determine whether to trigger the adjustment of mold system parameters.

[0104] 205. If it is determined that parameter debugging of the mold system is triggered, then select the target key parameter from multiple key parameters.

[0105] 206. Parameter adjustment of key target parameters.

[0106] The aforementioned key parameters may include one or more of the following: production tonnage (a), production cycle time (b), air cushion size (c), material inflow rate (d), mold closing height (e), mold temperature (f), and mold wear (g). Those skilled in the art can obtain other parameters based on the listed parameters; the adjustment methods for other parameters can be found in the adjustment methods for the already-trained parameters.

[0107] The aforementioned key parameters can have a correlated impact on the stable production of the mold system. After obtaining the measured values ​​of these key parameters, their correlated impact on stable production can be calculated based on these measured values.

[0108] In some embodiments, a functional relationship f(a, b, c, d, e, f, g) between the correlation impact value β and the aforementioned multiple key parameters can be preset. After obtaining the measured values ​​of the multiple key parameters, substituting them into the aforementioned functional relationship f(a, b, c, d, e, f, g) yields the correlation impact value β.

[0109] In some embodiments, each key parameter has its own theoretical value. After obtaining the measured values ​​of each key parameter, the difference between the theoretical and measured values ​​can be determined. Based on the ratio between the difference of each key parameter and its corresponding theoretical value, the difference rate of each key parameter can be determined, whereby the difference rate represents the deviation between the measured and theoretical values ​​of the key parameter. The calculation method for the difference rate of each key parameter can be found in Formula 1.

[0110] In some embodiments, the difference rates of the aforementioned key parameters are weighted to obtain the correlation impact values ​​of the key parameters on stable production. In one example, the correlation impact value β can be calculated according to Formula 3 below.

[0111] Formula 3: β = a + b + c + d + e + f + g. a, b, c, d, e, f, and g are the difference rates of the key parameters (a), (b), (c), (d), (e), (f), and (g), respectively. In Formula 3, the values ​​of a, b, c, d, e, f, and g can be positive or negative.

[0112] In some embodiments, if the associated influence value is greater than a first preset value, then parameter adjustment of the mold system is triggered. For example, when the β value is ≤ 0.3, it indicates that the mold system is producing stably and parameter adjustment is not required; when the β value is > 0.3, it indicates that the mold system is producing unstably and parameter adjustment of the mold system is required. Optionally, the absolute value of the associated influence value can be taken, and then it can be determined whether the absolute value of the associated influence value is greater than the first preset value. If it is greater, then parameter adjustment of the mold system is triggered. For example, when the absolute value of β is ≤ 0.3, it indicates that the mold system is producing stably and parameter adjustment is not required; when the absolute value of β is > 0.3, it indicates that the mold system is producing unstably and parameter adjustment of the mold system is required.

[0113] After determining the trigger for parameter debugging of the mold system based on the associated influence value β, it is not to directly debug all key parameters, but to select the target key parameter from multiple key parameters for debugging.

[0114] One method for selecting a target key parameter from multiple key parameters may be to select a key parameter whose deviation between the measured value and the theoretical value is within an adjustable range as the target key parameter.

[0115] Specifically, the difference rate of each key parameter can be calculated according to Formula 1, and the target key parameter can be selected according to the rules corresponding to Formula 1, and the target key parameter can be adjusted.

[0116] The adjustment of the target key parameters includes: determining the parameter adjustment amount and direction based on the difference between the theoretical and measured values ​​of the target key parameters; adjusting the target key parameters according to the parameter adjustment amount and direction; wherein the parameter adjustment amount is less than the absolute value of the difference between the theoretical and measured values ​​of the target key parameters; and the adjustment direction is to approach the theoretical value of the target key parameters.

[0117] The step of determining the parameter adjustment amount based on the difference between the theoretical and measured values ​​of the target key parameter includes: if the absolute value of the difference between the theoretical and measured values ​​of the target key parameter is greater than a second set value, then determining a first adjustment amount; adjusting the target key parameter in a direction approaching the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value; and continuing to adjust the target key parameter multiple times based on the second set value until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value.

[0118] The step of adjusting the target key parameter multiple times based on the second set value until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value includes: determining a second adjustment amount based on the second set value and the number of steps; adjusting the target key parameter in a direction closer to the theoretical value according to the second adjustment amount; determining whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value; if yes, stopping the adjustment of the target key parameter; if no, determining a third adjustment amount based on the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, and continuing to adjust the target key parameter until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0119] If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to the second set value, then the target key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value and the number of steps, until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0120] The debugging methods for the key parameters of the target can be found in the description above.

[0121] Corresponding to the parameter debugging method of the above-mentioned mold system, this embodiment of the invention also provides a structural schematic diagram of a control device. As shown in Figure 4, the control device includes:

[0122] The acquisition module 301 is used to acquire the measured values ​​of multiple key parameters of the mold system.

[0123] The determination module 302 is used to determine the deviation between the measured values ​​and theoretical values ​​of the multiple key parameters; and to determine the correlation impact value of the multiple key parameters on stable production based on the deviation of the multiple key parameters.

[0124] The judgment module 303 is used to determine whether to trigger parameter debugging of the mold system based on the associated influence value.

[0125] The debugging module 304 is used to select a target key parameter from the plurality of key parameters when it is determined that parameter debugging of the mold system is triggered; and to perform parameter debugging on the target key parameter.

[0126] The control device of this invention can execute the parameter debugging method of the embodiments shown above. For parts not described in detail in this embodiment, please refer to the relevant descriptions of the method embodiments. The execution process and technical effects of this technical solution are described in the embodiments shown in the method, and will not be repeated here.

[0127] Referring to Figure 5, a schematic diagram of a control device provided in an embodiment of the present invention is shown. The control device shown in Figure 5 is implemented in the form of a computer. As shown in Figure 5, the control device 400 may include: a processor 401, a memory 402, and a communication unit 403. These components communicate through one or more buses. Those skilled in the art will understand that the structure of the control device shown in the figure does not constitute a limitation on the embodiments of this application. It may be a bus topology, a star topology, and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0128] The communication unit 403 is used to establish a communication channel, enabling the control device to communicate with other devices. It receives user data from other devices or sends user data to other devices.

[0129] The processor 401 serves as the control center of the control device, connecting various parts of the control device via various interfaces and lines. It executes software programs, instructions, and / or modules stored in the memory 402, and calls data stored in the memory to perform various functions of the control device and / or process data. The processor can be composed of integrated circuits (ICs), such as a single packaged IC or multiple packaged ICs with the same or different functions connected together. For example, the processor 401 may only include a central processing unit (CPU). In this embodiment, the CPU may have a single processing core or include multiple processing cores.

[0130] The memory 402 is used to store the execution instructions of the processor 401. The memory 402 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk or optical disk.

[0131] When the execution instructions in memory 402 are executed by processor 401, the control device 400 is able to perform some or all of the steps of the parameter debugging method of the mold system in the embodiment shown in FIG1.

[0132] In a specific implementation, this application also provides a computer storage medium, wherein the computer storage medium may store a program, which, when executed, may include some or all of the steps of the printing method of the image forming apparatus provided in this application. The storage medium may be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0133] In a specific implementation, this application also provides a computer program product, wherein the computer program product includes executable instructions, which, when executed on a computer, cause the computer to perform some or all of the steps in various embodiments of the parameter debugging method for the mold system provided in this application.

[0134] This application also provides a non-transitory computer-readable storage medium that stores computer instructions that cause the computer to execute the method provided in this application.

[0135] The aforementioned non-transitory computer-readable storage medium may take any combination of one or more computer-readable media. A computer-readable medium may be a computer-readable signal medium or a computer-readable storage medium. A computer-readable storage medium may be, for example,—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of computer-readable storage media (a non-exhaustive list) include: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), or flash memory, optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium may be any tangible medium containing or storing a program that may be used by or in connection with an instruction execution system, apparatus, or device.

[0136] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including—but not limited to—electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of transmitting, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device.

[0137] The program code contained on a computer-readable medium may be transmitted using any suitable medium, including—but not limited to—wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0138] Those skilled in the art will clearly understand that the techniques in the embodiments of this application can be implemented using software plus necessary general-purpose hardware platforms. Based on this understanding, the technical solutions in the embodiments of this application, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application or some parts of the embodiments.

[0139] The same or similar parts between the various embodiments in this specification can be referred to mutually. In particular, the device embodiments and terminal embodiments are basically similar to the method embodiments, so the description is relatively simple, and the relevant parts can be referred to the description in the method embodiments.

Claims

1. A method for adjusting parameters of a mold system, characterized in that, include: Obtain the measured values ​​of several key parameters of the mold system; Determine the deviations between the measured and theoretical values ​​of the multiple key parameters; Based on the deviations of the multiple key parameters, determine the correlation impact values ​​of the multiple key parameters on stable production; Based on the associated impact value, determine whether to trigger parameter adjustment of the mold system; If it is determined that parameter debugging of the mold system is triggered, then the target key parameter is selected from the plurality of key parameters; The key parameters of the target are adjusted.

2. The method according to claim 1, characterized in that, The determination of the deviation between the measured and theoretical values ​​of the multiple key parameters includes: Determine the differences between the theoretical and measured values ​​of the multiple key parameters respectively; Based on the ratio of the difference between the multiple key parameters to the corresponding theoretical value, the difference rate of each of the multiple key parameters is determined. The difference rate is used to represent the deviation between the measured value and the theoretical value of the key parameter.

3. The method according to claim 2, characterized in that, The step of determining the correlation impact values ​​of the multiple key parameters on stable production based on the deviations of the multiple key parameters includes: The correlation impact value is obtained by weighting the difference rates of the multiple key parameters.

4. The method according to claim 1, characterized in that, The step of determining whether to trigger parameter adjustments to the mold system based on the associated influence value includes: If the associated influence value is greater than the first set value, then it is determined that parameter adjustment of the mold system will be triggered.

5. The method according to claim 1, characterized in that, If it is determined that parameter debugging of the mold system is triggered, a target key parameter is selected from the plurality of key parameters, including: The key parameter whose deviation is within a preset adjustable range is selected as the target key parameter.

6. The method according to claim 1 or 5, characterized in that, The parameter tuning of the target key parameters includes: Based on the difference between the theoretical and measured values ​​of the target key parameters, determine the parameter adjustment amount and direction; Based on the parameter adjustment amount and direction, the target key parameters are adjusted; wherein... The parameter adjustment amount is less than the absolute value of the difference between the theoretical value and the measured value of the target key parameter; The adjustment direction is to approach the theoretical value of the target key parameter.

7. The method according to claim 6, characterized in that, The step of determining the parameter adjustment amount based on the difference between the theoretical and measured values ​​of the target key parameters includes: If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than the second set value, then the first adjustment amount is determined; The target key parameter is adjusted in a direction that approaches the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value; Based on the second set value, the target key parameter is adjusted multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

8. The method according to claim 7, characterized in that, Based on the second set value, the target key parameter is adjusted multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value, including: The second adjustment amount is determined based on the second set value and the number of steps. Adjust the target key parameters in a direction that approaches the theoretical value according to the second adjustment amount; Determine whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value; If so, then stop adjusting the target key parameters; If not, then based on the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, a third adjustment amount is determined and the target key parameter is adjusted again until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

9. The method according to claim 7, characterized in that, The method further includes: If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to the second set value, then the target key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value and the number of steps, until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

10. The method according to claim 1, characterized in that, Before determining whether to trigger parameter adjustment of the mold system based on the associated influence value, the method further includes: Each of the key parameters was independently adjusted, and the absolute value of the difference between the theoretical value and the measured value of each key parameter after independent adjustment was less than the fourth set value.

11. A control device, characterized in that, include: At least one processor; as well as At least one memory communicatively connected to the processor, wherein: The memory stores program instructions that can be executed by the processor, which invokes the program instructions to perform the method as described in any one of claims 1 to 10.

12. A mold system, characterized in that, include: Mold equipment; Sensing components are used to collect measured values ​​of multiple key parameters of the mold equipment in the mold system; A control device is configured to receive measured values ​​of the plurality of key parameters and execute the method of any one of claims 1 to 10 based on the measured values ​​of the plurality of key parameters.

13. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored program, wherein, when the program is executed, it controls the device on which the computer-readable storage medium is located to perform the method of any one of claims 1 to 10.

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