Method for operating an apparatus system

Abstract

The invention relates to a method for operating an apparatus system (100), comprising: - providing an apparatus system (100) having a first usage point (1) with a first quality requirement (2), a first apparatus (10) installed in the first usage point (1), an apparatus store (200) in which a second apparatus (20) with a second apparatus pass (21) and a third apparatus (30) with a third apparatus pass (31) are available and the second apparatus pass (21) comprises a second quality value (22) and the third apparatus pass (31) comprises a third quality value (32), wherein the second apparatus (20) is a purchased pre-owned apparatus and the third apparatus (30) is a purchased new apparatus, - checking the first apparatus (10) for a defect, - removing the first apparatus (10) from the first usage point (1) in the event of a defect, - comparing the first quality requirement (2) with the second quality value (22) and with the third quality value (32), - installing the second apparatus (20) in the first usage point (1) if the second quality value (22) corresponds to the first quality requirement (2), or installing the third apparatus (30) in the first usage point (1) if the second quality value (22) does not correspond to the first quality requirement (2) but the third quality value (32) does correspond to the first quality requirement (2).

Description

[0001] Method for operating an apparatus system

[0002] The invention relates to a method for operating an apparatus system.

[0003] In analytical measurement technology, particularly in water management, environmental analysis, and industrial sectors such as food technology, biotechnology, and pharmaceuticals, as well as for a wide variety of laboratory applications, field devices are used to monitor processes. Field devices are, for example, apparatus that are in contact with the process being monitored or located in its immediate vicinity. Depending on the process and environmental conditions, the apparatus is subject to wear and tear and must be replaced at regular intervals. It can also happen that the apparatus fails unexpectedly and must be replaced as quickly as possible to ensure uninterrupted process monitoring.

[0004] Due to the increasingly stringent regulations regarding the sustainability of products and their manufacturing steps, ever higher demands are also being placed on the equipment technology used in the manufacturing process of the products with regard to sustainability.

[0005] It is therefore an object of the invention to propose a method for using apparatus in analytical measurement technology in a particularly sustainable way.

[0006] This problem is solved according to the invention by a method for operating an apparatus system according to claim 1.

[0007] The method according to the invention comprises:

[0008] Providing an apparatus system with

[0009] a first deployment site with a first quality requirement, a first device installed at the first deployment site,

[0010] an apparatus storage facility in which a second apparatus with a second apparatus passport and a third apparatus with a third apparatus passport are available, and the second apparatus passport includes a second quality value and the third apparatus passport includes a third quality value, wherein the second apparatus is a purchased used apparatus and the third apparatus is a purchased new apparatus,

[0011] Checking the first device for defects,

[0012] Removing the first device from the first deployment site in case of a defect, comparing the first quality requirement with the second quality value and the third quality value,

[0013] Installing the second apparatus at the first deployment site if the second quality value meets the first quality requirement, or installing the third apparatus at the first deployment site if the second quality value does not meet the first quality requirement but the third quality value meets the first quality requirement.

[0014] The method according to the invention enables an apparatus system to be operated with minimal costs and maximum sustainability. Thanks to the method, it is possible to supply an apparatus system cost-effectively and ecologically using used and new equipment from an equipment depot.

[0015] Production losses due to defective sensors and waiting for ordered new sensors are also avoided through the optimized selection of used or new equipment.

[0016] Thanks to this method, it is possible to evaluate a device throughout its entire life cycle and beyond, and to provide transparent traceability of the device.

[0017] According to one embodiment of the invention, the second apparatus passport covers a second apparatus lifetime and the third apparatus passport covers a third apparatus lifetime.

[0018] where the second quality value depends on the second apparatus lifetime and the third quality value depends on the third apparatus lifetime.

[0019] According to a further embodiment of the invention, the second apparatus passport includes a second apparatus CO2 footprint value and the third apparatus passport includes a third apparatus CO2 footprint value.

[0020] where the second quality value depends on the second apparatus CO2 footprint value and the third quality value depends on the third apparatus CO2 footprint value.

[0021] According to one embodiment of the invention, the second device passport has a second usage history, and the second quality value depends on the second usage history.

[0022] According to one embodiment of the invention, the method comprises a step of selling the defective first apparatus to a repair service and a step of repairing the first apparatus, wherein the repair includes replacing defective components, testing the first apparatus and certifying the first apparatus.

[0023] According to one embodiment of the invention, the first apparatus has a first apparatus passport with a first quality value and a first apparatus CO2 footprint value, and the first quality value depends on the first apparatus CO2 footprint value, wherein the first apparatus CO2 footprint value is updated during repair.

[0024] According to one embodiment of the invention, a step involves purchasing the repaired first apparatus as a used apparatus for the apparatus warehouse. According to another embodiment of the invention, the method includes a step of purchasing a new apparatus for the apparatus warehouse once the third apparatus has been installed at the first deployment site.

[0025] According to one embodiment of the invention, the second apparatus comprises the second apparatus pass as a readable second data storage and the comparison comprises a readout of the second data storage, wherein the third apparatus comprises the third apparatus pass as a readable third data storage and the comparison comprises a readout of the third data storage.

[0026] According to one embodiment of the invention, the first deployment site has a deployment site CO2 footprint value, and the deployment site CO2 footprint value is influenced by the apparatus CO2 footprint value of the apparatus used at the first deployment site.

[0027] The invention is explained in more detail with reference to the following description of figures. The figures show:

[0028] Fig. 1 : a schematic representation of an apparatus system according to the invention with various apparatus.

[0029] The apparatus system 100 shown in Figure 1 comprises a first operating point 1 with a first quality requirement 2, a first apparatus 10 installed in the first operating point 1, and an apparatus storage area 200. Preferably, the apparatus system 100 comprises a second operating point 3 with a second quality requirement 4, wherein the second quality requirement 4 is lower than the first quality requirement 2. Naturally, the apparatus system 100 may have a plurality of further operating points with different quality requirements. These operating points could, for example, be measuring points for a sensor.

[0030] In equipment storage 200, at least one second device 20 and at least one third device 30 are available. For example, equipment storage 200 contains a large number of purchased used devices and purchased new devices. The devices are, for example, sensors such as pH sensors, conductivity sensors, flow sensors, etc. The second device 20 is a purchased used device, and the third device 30 is a purchased new device. This means that these devices were acquired commercially. The second device 20 was obtained, for example, from a used device dealer 400, who, for example, overhauled the second device 20 or replaced defective components. The used device dealer guarantees that the used device is fully functional again. For example, the used device dealer issues a corresponding certificate when selling the used device.The third apparatus 30, for example, was obtained from an apparatus manufacturer 500. The second apparatus 20 and the third apparatus 30 are ready in the apparatus depot 200 to replace the first apparatus 10, which is used at the first deployment site 1 (not shown).

[0031] For example, the equipment storage area 200 has an area where defective equipment that has been removed is stored.

[0032] Each device in the device system 100 and in the device storage 200 has a device pass. The device pass is, for example, an electrical storage device that contains information. The first device 10 therefore has a first device pass 11, the second device 20 has a second device pass 21, and the third device 30 has a third device pass 31, and so on, as long as further devices are used.

[0033] Each piece of equipment has a quality rating recorded in its equipment log. This rating reflects a recommendation regarding the equipment's suitability for a particular deployment location. The quality rating depends, for example, on the equipment's expected operating time. Therefore, the first equipment log (11) contains a first quality rating of 12, the second (21) contains a second quality rating of 22, the third (31) contains a third quality rating of 32, and so on.

[0034] Preferably, the equipment passport for each device also includes an equipment service life and / or an equipment CO2 footprint value and / or an operating history and / or so-called engineering and design information. The engineering and design information enables faster replacement of an equipment, as this information contains, for example, the original engineering requirements, such as specifications for the area of ​​application and standards met. Thus, thanks to this information, it is directly possible to determine whether the equipment is suitable for use in the food sector, for example, if a specific hygiene requirement is listed as "met" in the engineering and design information. The equipment passport also includes, for example, the production date, the location of use, the operating time, the commissioning date, a list of all error messages that occurred during operation of the equipment, the date of repair, and the name of the repair shop.The quality value of each device is further influenced by the device's lifespan and / or its CO2 footprint and / or its usage history.

[0035] The CO2 footprint of the device and its duration of use are particularly relevant, as this makes it possible, for example, to relativize the CO2 footprint of the device during its use at an incident site, i.e., to put the CO2 footprint of the device in relation to the duration of use.

[0036] For example, a new appliance has a CO2 footprint of 100 CO2 units and a service life of 0 days. A used appliance of the same type but repaired, for example, has a CO2 footprint of 120 CO2 units and a service life of 10 years or 3652 days. The CO2 footprint of 120 is the sum of the initial CO2 footprint of 100 CO2 units, which corresponds to the CO2 footprint for the original manufacture of the used appliance, and the CO2 footprint of 20 CO2 units caused by the repair.

[0037] If the CO2 footprint value of the used apparatus and the new apparatus are compared during use, e.g. 1 year after their installation at an incident site, it quickly becomes apparent that the used apparatus performs better:

[0038] Used equipment = 120 / 11 = 10.9; New equipment = 100 / 1 = 100. It should be noted that the used equipment had already been in operation for 10 years, and this usage time is taken into account. This makes sense because the original CO2 footprint of 100 CO2 units required to manufacture the used equipment is also considered.

[0039] Therefore, it is advantageous to use a used device instead of a new one.

[0040] The first device passport 11 therefore includes a first device lifetime 13, a first device CO2 footprint value 14, and a first usage history 15. The second device passport 21 therefore includes a second device lifetime 23, a second device CO2 footprint value 24, and a second usage history 25. The third device passport 31 therefore includes a third device lifetime 33, a third device CO2 footprint value 34, and a third usage history 35. If further device passports exist for additional devices, the same applies to them.

[0041] Preferably, the device pass is readable as a data storage device on every device.

[0042] For example, the data storage is a writable RFID chip. Alternatively, the device's identification code is stored as a file in cloud storage. To access the cloud storage, a QR code containing the link to the cloud storage is displayed on the device.

[0043] Each deployment location is preferably assigned an individual deployment location CO2 footprint value. This makes it possible to quantify the deployment location's CO2 footprint during its operational lifetime. For example, if several devices at the deployment location wear out successively during the deployment location's operational lifetime, or are replaced by a new device before a device fails, the respective device CO2 footprint value is added to the deployment location CO2 footprint value for each device. Here, too, it is of course possible to evaluate the deployment location CO2 footprint value relative to the operational lifetime. The inventive method for operating a device system 100 is now described below.

[0044] First, the apparatus system 100 described above will be provided.

[0045] Then the first device 10 is checked for defects. This check is carried out regularly, for example, so that an automatic notification of a malfunction of the first device 10 is possible.

[0046] If it is detected that the first device 10 has a defect, i.e. no longer meets the first quality requirements 2 of the first deployment site 1, the first device 10 is removed from the first deployment site 1.

[0047] Next, the first quality requirement 2 of the first deployment site 1 is compared with the second quality value 22 of the second apparatus 20 and the third quality value 32 of the third apparatus 30. If further apparatuses are available in the apparatus storage facility 200, it is also possible to compare the respective quality values ​​of these apparatuses with the first quality requirement 2 of the first deployment site 1 in order to assess the suitability of the respective apparatuses for use in the first deployment site 1. If the apparatus is a sensor and the deployment site has a measuring point and the apparatus storage facility 200 contains different sensor types, then, of course, only those sensors suitable for the measuring point and the parameter to be measured there, e.g., pH or conductivity, etc., are used in the comparison.

[0048] The second apparatus 20 is then installed in the first deployment location 1 if the second quality value 22 of the second apparatus 20 corresponds to the first quality requirement 2 of the first deployment location 1.

[0049] If the second quality value 22 of the second device 20 does not meet the first quality requirement 2 of the first deployment location 1, but the third quality value 32 of the third device 30 meets the first quality requirement 2, the third device 30 is installed in the first deployment location 1. The first quality requirement 2 refers, for example, to measurement accuracy if the device is a sensor.

[0050] As explained above, the quality rating of a device also depends, for example, on its CO2 footprint. If, for instance, the CO2 footprint of a used device is lower than that of a new device, the used device might be better suited for use at the site. As mentioned above, the device's lifespan and / or usage history are also preferably taken into account when assessing its quality rating. For example, a device's usage history might preclude its use at a particular site. This is especially clear in the example where the site is a measuring point in food production and the device is a used sensor that was previously used in an unhygienic environment.

[0051] If, for example, the deployment location is a non-critical measuring point, i.e., with low required measurement accuracy, as represented by the stars at the second deployment point 3 in Figure 1, then a used device, i.e., a used sensor, is particularly suitable here. The solid stars shown in Figure 1 represent the required measurement accuracy.

[0052] Quality requirements. The first deployment site 1, with three full stars as the first quality requirement 2, exhibits the maximum possible measurement accuracy. The second deployment site 3, with one full star as the second quality requirement 4, exhibits a lower measurement accuracy than the first deployment site 1.

[0053] Furthermore, it is also conceivable that a used piece of equipment could be deployed at a site for a limited period, e.g., a few days, until a higher-quality piece of equipment can be obtained and installed. This is particularly relevant if, for example, a high-quality new piece of equipment can only be received and installed after a predetermined delivery time, e.g., one week. Thus, the used equipment helps to minimize disruption to the process at the site.

[0054] As an optional step, the procedure further includes selling the defective first device 10 to a repair service 300 and a step involving the repair of the first device 10. Repair service 300 is, for example, a service provider certified by the manufacturer of the device to be repaired. This means that repair service 300 has been qualified by the manufacturer. For example, repair service 300 has received training from the manufacturer to perform repairs. If repair service 300 performs a repair on device 10, a certificate is recorded in the device's logbook confirming that the repair was carried out by a certified repair service 300. If the repair is performed by a repair service 300 that is not qualified by the manufacturer, this repair is marked in the device's logbook as having been carried out by a non-certified repair service 300.Alternatively, the repair service 300 is part of the manufacturer who originally produced the device to be repaired. Alternatively, the repair service 300 is, for example, an intermediary.

[0055] Repairing the device includes replacing defective components, testing the first device 10, and certifying it. Testing includes, for example, calibrating the device. Certification includes, for example, issuing an operating warranty and confirming the device's quality. Preferably, the repair process also includes updating the device's CO2 footprint. For example, the device's CO2 footprint is increased by the difference resulting from the repair.

[0056] If, for example, a device or sensor with an initial device CO2 footprint value of FP1 is removed and repaired, and the repair results in a CO2 footprint value of FP2, then the updated device CO2 footprint value for this device will be FP1+FP2. Naturally, a repair only makes sense if it requires less cost and less CO2 emissions.

[0057] In this case of device repair (here, the sensor), the CO2 footprint value for the incident site (here, the measuring point) where the repaired device is reused is naturally updated. The cumulative CO2 footprint value for the incident site would then be FP1+FP2.

[0058] However, if the sensor at the measuring point were not repaired but replaced by a new sensor with an apparatus CO2 footprint value of FP3, the updated operational CO2 footprint value for this measuring point would be FP1+FP3.

[0059] Preferably, after repair by the repair service 300, a step is taken to purchase the repaired first apparatus 10 as a used apparatus for the apparatus warehouse 200.

[0060] According to an optional step, the procedure further involves purchasing a new apparatus 30' for the apparatus storage 200 when the third apparatus 30 has been installed in the first deployment location 1.

[0061] According to an optional step, the second apparatus 20 includes the second apparatus pass 21 as a readable second data memory, and the third apparatus 30 includes the third apparatus pass 31 as a readable third data memory. In this case, the comparison involves reading the second data memory and the third data memory.

[0062] According to a step not shown, if the device cannot be repaired by the repair service 300, it may be sent to a waste management organization so that, for example, the device can be dismantled and the various materials recycled. Reference list

[0063] 1 first deployment location

[0064] 2. First quality requirement

[0065] 3 second deployment location

[0066] 4. Second quality requirement

[0067] 10 first apparatus

[0068] 11 first device pass

[0069] 12 first quality value

[0070] 13 first apparatus lifetime

[0071] 14 first apparatus CO2 footprint value

[0072] 20 second apparatus

[0073] 21 second apparatus pass

[0074] 22 second quality value

[0075] 23 second apparatus lifespan

[0076] 24 second apparatus CO2 footprint value 25 second deployment history

[0077] 30 third apparatus

[0078] 31 third apparatus pass

[0079] 32 third quality value

[0080] 33 third apparatus lifespan

[0081] 34 third apparatus CO2 footprint value 35 third deployment history

[0082] 100 apparatus systems

[0083] 200 equipment storage

[0084] 300 repair service

[0085] 400 used equipment dealers

[0086] 500 equipment manufacturers

Claims

Patent claims 1. Method for operating an apparatus system (100) comprising: Providing an apparatus system (100) with o a first deployment site (1 ) with a first quality requirement (2), o a first apparatus (10) installed in the first deployment site (1), o an apparatus storage facility (200) in which a second apparatus (20) with a second apparatus passport (21) and a third apparatus (30) with a third apparatus passport (31) are available and the second apparatus passport (21) includes a second quality value (22) and the third apparatus passport (31) includes a third quality value (32), wherein the second apparatus (20) is a purchased used apparatus and the third apparatus (30) is a purchased new apparatus, Checking the first apparatus (10) for defects, Removing the first apparatus (10) from the first deployment location (1) in case of defect, comparing the first quality requirement (2) with the second quality value (22) and the third quality value (32), Installing the second apparatus (20) in the first deployment location (1) if the second quality value (22) meets the first quality requirement (2) or installing the third apparatus (30) in the first deployment location (1) if the second quality value (22) does not meet the first quality requirement (2) but the third quality value (32) meets the first quality requirement (2).

2. Method according to claim 1, wherein the second apparatus pass (21) comprises a second apparatus lifetime (23) and the third apparatus pass (31) comprises a third apparatus lifetime (33), where the second quality value (22) depends on the second apparatus lifetime (23) and the third quality value (32) depends on the third apparatus lifetime (33).

3. Method according to claim 1 or 2, wherein the second apparatus passport (21) comprises a second apparatus CO2 footprint value (24) and the third apparatus passport (31) comprises a third apparatus CO2 footprint value (34), where the second quality value (22) depends on the second apparatus CO2 footprint value (24) and the third quality value (32) depends on the third apparatus CO2 footprint value (34).

4. Method according to one of the preceding claims, wherein the second apparatus pass (21) has a second usage history (25), and the second quality value (22) depends on the second usage history (25).

5. Method according to one of the preceding claims, wherein the method comprises a step of selling the defective first apparatus (10) to a repair service (300) and a step of repairing the first apparatus (10), wherein the repair comprises replacing defective components, testing the first apparatus (10) and certifying the first apparatus (10).

6. Method according to claim 5, wherein the first apparatus (10) has a first apparatus passport (11) with a first quality value (12) and a first apparatus CO2 footprint value (14) and the first quality value (12) depends on the first apparatus CO2 footprint value, where the first apparatus CO2 footprint value (12) is updated during repair.

7. Method according to claim 5 or 6, wherein a step of purchasing the repaired first apparatus (10') as a used apparatus is carried out in the apparatus warehouse (200).

8. Method according to one of the preceding claims, wherein the method comprises a step of purchasing a new apparatus (30') for the apparatus warehouse (200) when the third apparatus (30) has been installed in the first deployment location (1).

9. Method according to one of the preceding claims, wherein the second apparatus (20) comprises the second apparatus pass (21) as a readable second data storage and the comparison comprises a readout of the second data storage, wherein the third apparatus (30) comprises the third apparatus pass (31) as a readable third data storage and the comparison comprises a readout of the third data storage.

10. Method according to claim 3, wherein the first deployment site (1) has a deployment site CO2 footprint value and the deployment site CO2 footprint value is influenced by the apparatus CO2 footprint value of the apparatus used at the first deployment site (1).

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