Optical measurement device and optical measurement method

Abstract

An optical measurement device for performing eccentricity measurement on a product to be subjected to measurement. The optical measurement device comprises a support bracket (11), a light emitting and receiving mechanism (12) and a polarizing device (13), wherein the support bracket (11) is used for supporting said product; the light emitting and receiving mechanism (12) is disposed above the support bracket (11); the polarizing device (13) is disposed between the support bracket (11) and the light emitting and receiving mechanism (12); and the polarization direction of the polarizing device (13) is perpendicular to the polarization direction of a linear polarizing film in said product. Further provided is an optical measurement method.

Description

An optical measuring device and optical measuring method Technical Field

[0001] This application relates to the field of optical measurement technology, and more specifically, to an optical measurement device and an optical measurement method. Background Technology

[0002] In optical testing, it is often necessary to measure the reflected image of each surface of an optical lens to detect optical axis eccentricity based on the position of the reflected image. For conventional products, there is usually only one reflected image per surface; however, for some optical devices, such as pancake optical paths in virtual reality devices, because two adjacent surfaces have the same radius of curvature or are attached together, multiple cross images may exist in the image plane during the measurement process, as shown in Figure 1'. The presence of multiple cross images will significantly affect the eccentricity measurement results, thereby greatly reducing the measurement accuracy.

[0003] In view of this, a new technical solution is needed to solve the above-mentioned technical problems. Summary of the Invention

[0004] One objective of this application is to provide a new technical solution for an optical measurement device and an optical measurement method.

[0005] According to a first aspect of this application, an optical measuring device is provided for performing eccentricity measurement on a product to be measured.

[0006] The optical measuring device includes:

[0007] A support bracket for supporting the product under test;

[0008] A light emitting and receiving mechanism is disposed above the support bracket;

[0009] A polarizing device is disposed between the support bracket and the light emitting and receiving mechanism; the polarization direction of the polarizing device is perpendicular to the polarization direction of the linear polarizing film in the product under test.

[0010] Optionally, the optical measuring device further includes a rotating stage, on which the support bracket and the polarizing device are both mounted, and the rotating stage is capable of rotating about a first direction.

[0011] Optionally, the optical measuring device further includes a four-position adjustment stage, which is mounted on the rotary table. The support bracket and the polarization device are mounted on the four-position adjustment stage. The four-position adjustment stage is capable of translating along the second direction and the third direction, and is also capable of rotating around the second direction and the third direction. The first direction, the second direction, and the third direction are perpendicular to each other.

[0012] Optionally, the optical measuring device further includes a first switching mechanism, the polarization device is mounted on the first switching mechanism, and the first switching mechanism is provided with a first light-transmitting hole; the polarization device and the first light-transmitting hole can move in the first switching mechanism to switch the positions of the polarization device and the first light-transmitting hole so that the polarization device or the first light-transmitting hole corresponds to the light emitting and receiving mechanism.

[0013] Optionally, the optical measuring device further includes a second switching mechanism, which is connected to the light emitting and receiving mechanism;

[0014] The second switching mechanism is provided with a second light-transmitting hole and at least one lens. The second light-transmitting hole and any of the lenses can move in the second switching mechanism to switch the positions of the second light-transmitting hole and the lens, so that the second light-transmitting hole or any of the lenses corresponds to the light emitting and receiving mechanism.

[0015] Optionally, the optical measuring device further includes a motion axis, the light emitting and receiving mechanism is mounted on the motion axis, and the motion axis can drive the light emitting and receiving mechanism to translate along a first direction.

[0016] Optionally, the light emitting and receiving mechanism is an autocollimator.

[0017] According to a second aspect of this application, an optical measurement method is provided, employing the optical measurement device as described in the first aspect, wherein the product under test includes at least a first lens and a second lens, the first lens having a first surface, the second lens having a second surface, the first surface and the second surface being disposed adjacent to each other and having the same curvature; a linear polarizing film is disposed on the first surface;

[0018] The optical measurement method includes:

[0019] The product to be tested is placed on the support bracket, and the first lens is positioned closer to the light emitting and receiving mechanism than the second lens;

[0020] The light emitting and receiving mechanism is controlled to emit outgoing light. After passing through the polarization device, the outgoing light is reflected by the product under test and generates reflected light, which is received by the light emitting and receiving mechanism.

[0021] A first reflected image of the first surface is obtained based on the reflected light, and a first eccentricity of the first surface is obtained based on the first reflected image.

[0022] Optionally, the optical measuring device further includes a first switching mechanism, the polarization device is mounted on the first switching mechanism, and the first switching mechanism is provided with a first light-transmitting hole;

[0023] The optical measurement method further includes:

[0024] In the first switching mechanism, the positions of the polarization device and the first light-transmitting aperture are switched so that the first light-transmitting aperture corresponds to the light emitting and receiving mechanism;

[0025] The light emitting and receiving mechanism is controlled to emit outgoing light, which is reflected by the product under test to generate reflected light, which is then received by the light emitting and receiving mechanism.

[0026] The total reflected image of the first surface and the second surface is obtained based on the reflected light rays;

[0027] A second reflection image of the second surface is obtained based on the total reflection image and the first reflection image, and a second eccentricity of the second surface is obtained based on the second reflection image.

[0028] Optionally, obtaining the second reflection image of the second surface based on the total reflection image and the first reflection image includes:

[0029] The first reflected image is removed from the total reflected image, i.e., the second reflected image is obtained.

[0030] The optical measurement device provided in this application embodiment can perform eccentric measurement on the product under test with a folded optical path, and the measurement results are highly accurate.

[0031] Other features and advantages of this application will become clear from the following detailed description of exemplary embodiments with reference to the accompanying drawings. Attached Figure Description

[0032] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments of the present application and, together with their description, serve to explain the principles of the present application.

[0033] Figure 1' shows a schematic diagram of the ghosting phenomenon that occurs in eccentric measurement;

[0034] Figure 2' shows a schematic diagram of the structure of the product under test;

[0035] Figure 3' shows a schematic diagram of the structure of the product under test;

[0036] Figure 1 shows a schematic diagram of the structure of an optical measuring device according to this application.

[0037] Explanation of reference numerals in the attached figures:

[0038] 11. Support bracket; 12. Light emitting and receiving mechanism; 13. Polarizing device; 14. Rotary stage; 15. Four-position adjustment stage; 16. First switching mechanism; 17. Second switching mechanism; 170. Second light-transmitting aperture; 171. Lens; 18. Motion axis;

[0039] 01. First lens; 02. Second lens; 011. First surface; 021. Second surface; 012. Third surface; 022. Fourth surface; 03. Linear polarizing film; 04. Semi-transparent and semi-reflective film; 05. Quarter glass slide; 06. Reflective polarizing film. Detailed Implementation

[0040] Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. It should be noted that, unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the present application.

[0041] The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the scope of this application and its application or use.

[0042] Techniques, methods, and equipment known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and equipment should be considered part of the specification.

[0043] In all the examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values.

[0044] It should be noted that similar labels and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be discussed further in subsequent figures.

[0045] Referring to FIG1, according to an embodiment of this application, an optical measuring device is provided. The measuring device is used to perform eccentric measurement on a product under test. The product under test includes at least a first lens 01 and a second lens 02. The first lens 01 has a first surface 011, and the second lens 02 has a second surface 021. The first surface 011 and the second surface 021 are arranged adjacent to each other and have the same curvature. A linear polarizing film 03 is disposed on the first surface 011.

[0046] The optical measurement device includes a support bracket 11, a light emitting and receiving mechanism 12, and a polarizing device 13. The support bracket 11 is used to support the product under test and ensure the stability of the product under test during the measurement process. The light emitting and receiving mechanism 12 is disposed above the support bracket 11. The polarizing device 13 is disposed between the support bracket 11 and the light emitting and receiving mechanism 12. The polarization direction of the polarizing device 13 is perpendicular to the polarization direction of the linear polarizing film 03.

[0047] The optical measurement device provided in this application embodiment can perform eccentric measurement on a test product with a folded optical path. Referring to Figures 2' and 3', a typical structure of a test product with a folded optical path is shown, which includes a first lens 01 and a second lens 02. The first lens 01 has a first surface 011 and a third surface 012, and the second lens 02 has a second surface 021 and a fourth surface 022. The curvature of the first surface 011 is the same as that of the second surface 021, and the two are arranged adjacent to each other. A semi-transparent and semi-reflective film 04 is provided on the fourth surface 022, a quarter-glass slide 05 is provided on the second surface 021, and a linear polarizing film 03 and a reflective polarizing film 06 are stacked on the first surface 011. When light is incident from above the second lens 02, the light passes sequentially through the semi-transparent and semi-reflective film 04, the fourth surface 022, the second lens 02, the second surface 021, the quarter-glass slide 05, the reflective polarizing film 06, the linear polarizing film 03, the first surface 011, the first lens 01, and the third surface 012 before exiting. Due to the presence of multiple functional films, light will fold once in the product under test. When performing eccentric measurement, it is necessary to measure the spherical center reflected image of each surface. When measuring the first surface 011 of the first lens 01 and the second surface 021 of the second lens 02, since the two are adjacent and have the same surface curvature, the spherical center of these two surfaces will be imaged simultaneously during the measurement. Since there is a certain angular deviation between these two surfaces, the double cross ghosting problem shown in Figure 1' will occur.

[0048] When performing measurements using the optical measuring device provided in this application embodiment, since the polarization direction of the polarization device 13 included in the measuring device is perpendicular to the polarization direction of the linear polarization film 03, when light is emitted from the light emitting and receiving mechanism 12 and then received by the product under test after passing through the polarization device 13, the light cannot continue to propagate after passing through the first lens 01. Therefore, the reflected light generated by the product under test only contains the reflected image of the first surface 011. Therefore, when performing measurements using the optical measuring device provided in this application embodiment, at least when performing eccentric measurements on the first surface 011 of the first lens 01, the influence of the second surface 021 of the second lens 02, which is adjacent to it and has the same curvature, can be eliminated, thereby improving the accuracy and precision of the measurement results.

[0049] When measuring, it should be noted that when the product to be measured is placed on the support bracket 11, the first lens 01 should be positioned closer to the light emitting and receiving mechanism 12 than the second lens 02.

[0050] Referring to FIG1, in one embodiment, the optical measuring device further includes a rotating stage 14, on which the support bracket 11 and the polarizing device 13 are both mounted, and the rotating stage 14 is capable of rotating about a first direction.

[0051] In this specific example, the product under test and the polarizing device 13 are driven to rotate synchronously around the first direction by the rotary stage 14, thereby ensuring that the linear polarizer 13 is always perpendicular to the vibration direction of the linear polarizing film 03 at any time, further improving the measurement accuracy and precision.

[0052] Referring to FIG1, in one embodiment, the optical measuring device further includes a four-position adjustment stage 15, which is mounted on the rotary stage 14. The support bracket 11 and the polarizing device 13 are mounted on the four-position adjustment stage 15. The four-position adjustment stage 15 is capable of translational movement along a second direction and a third direction, and is also capable of rotation around the second direction and the third direction. The first direction, the second direction, and the third direction are perpendicular to each other.

[0053] In this specific example, the four-position adjustment stage 15 can be used to adjust the translational and rotational positions of the product under test and the polarization device 13 along the second and third directions, thereby aligning the optical axis of the product under test with the optical axis of the light emitting and receiving mechanism 12, thus improving the measurement accuracy and precision.

[0054] Referring to Figure 1, the first direction is direction a in Figure 1, the second direction is direction b in Figure 1, and the third direction is direction c in Figure 1.

[0055] Referring to FIG1, in one embodiment, the optical measuring device further includes a first switching mechanism 16, the polarizing device 13 is mounted on the first switching mechanism 16, and the first switching mechanism 16 is provided with a first light-transmitting hole; the polarizing device 13 and the first light-transmitting hole can move in the first switching mechanism 16 to switch the positions of the polarizing device 13 and the first light-transmitting hole, so that the polarizing device 13 or the first light-transmitting hole corresponds to the light emitting and receiving mechanism 12.

[0056] In this specific example, the positions of the polarizing device 13 and the first light-transmitting aperture can be switched by the first switching mechanism 16, so that the polarizing device 13 or the first light-transmitting aperture is located in the measurement system; when the first light-transmitting aperture is located in the measurement system, the second surface 021 of the second lens 02 can be eccentrically measured.

[0057] Referring to FIG1, in one embodiment, the optical measuring device further includes a second switching mechanism 17, which is connected to the light emitting and receiving mechanism 12;

[0058] The second switching mechanism 17 is provided with a second light-transmitting hole 170 and at least one lens 171. The second light-transmitting hole 170 and any of the lenses 171 can move in the second switching mechanism 17 to switch the positions of the second light-transmitting hole 170 and the lens 171 so that the second light-transmitting hole 170 or any of the lenses 171 corresponds to the light emitting and receiving mechanism 12.

[0059] In this specific example, the second switching mechanism 17 can switch the positions of the second light-transmitting aperture 170 and the lens 171 so that the second light-transmitting aperture 170 or either lens 171 is located in the measurement system to accommodate products under test with different parameters.

[0060] Referring to FIG1, in one embodiment, the optical measuring device further includes a motion axis 18, the light emitting and receiving mechanism 12 is mounted on the motion axis 18, and the motion axis 18 can drive the light emitting and receiving mechanism 12 to translate along a first direction.

[0061] In this specific example, the light emitting and receiving mechanism 12 can be translated along the first direction via the motion axis 18 as needed for measurement; for example, when measuring the first surface 011 of the first lens 01, the light emitting and receiving mechanism 12 is located at one position on the motion axis 18; when measuring the second surface 021 of the second lens 02, the light emitting and receiving mechanism 12 is located at another position on the motion axis 18.

[0062] Referring to FIG1, in one embodiment, the light emitting and receiving mechanism 12 is an autocollimator.

[0063] In this specific example, the light emitting and receiving mechanism 12 is responsible not only for emitting outgoing light rays, but also for receiving reflected light rays; the light emitting and receiving mechanism 12 can be, for example, an autocollimator, which has high-precision light emitting and receiving capabilities.

[0064] In addition, the polarization device 13 can be, for example, a linear polarizer, or a micro / nano optical device or a diffractive optical device.

[0065] According to another embodiment of this application, an optical measurement method is provided, which employs the optical measurement device described above, characterized in that the optical measurement method includes:

[0066] S101. The product to be tested is placed on the support bracket 11, and the first lens 01 is positioned closer to the light emitting and receiving mechanism 12 than the second lens 02.

[0067] S102. Control the light emitting and receiving mechanism 12 to emit outgoing light. After passing through the polarization device 13, the outgoing light is reflected by the product under test and generates reflected light. The reflected light is received by the light emitting and receiving mechanism 12.

[0068] S103. Obtain a first reflected image of the first surface 011 based on the reflected light, and obtain a first eccentricity of the first surface 011 based on the first reflected image.

[0069] In the optical measurement method provided in this application embodiment, in step S101, the product to be tested is placed on the support bracket 11 with the first lens 01 closer to the light emitting and receiving mechanism 12.

[0070] In steps S102 and S103, the light source of the light emitting and receiving mechanism 12 is turned on to emit outgoing light. The outgoing light first passes through the polarizing device 13 and is then received by the product under test. Since the polarization direction of the polarizing device 13 is perpendicular to the polarization direction of the linear polarizing film 03 disposed on the first surface 011 of the first lens 01 in the product under test, the outgoing light cannot continue to propagate after passing through the first lens 01. Therefore, the reflected light generated by the product under test only contains the first reflected image of the first surface 011. The first eccentricity of the first surface 011 can be obtained from this first reflected image. Therefore, when using the optical measurement method provided in this application embodiment for measurement, at least when measuring the eccentricity of the first surface 011 of the first lens 01, the influence of the second surface 021 of the second lens 02, which is adjacent to it and has the same curvature, can be eliminated, thereby improving the accuracy and precision of the measurement results.

[0071] The light emitting and receiving mechanism 12 is responsible not only for emitting the emitted light rays but also for receiving the reflected light rays. The light emitting and receiving mechanism 12 can be, for example, an autocollimator.

[0072] Referring to FIG1, in one embodiment, the optical measuring device further includes a first switching mechanism 16, the polarization device 13 is mounted on the first switching mechanism 16, and the first switching mechanism 16 is provided with a first light-transmitting hole;

[0073] The optical measurement method further includes:

[0074] In the first switching mechanism 16, the positions of the polarization device 13 and the first light-transmitting aperture are switched so that the first light-transmitting aperture corresponds to the light emitting and receiving mechanism 12.

[0075] The light emitting and receiving mechanism 12 is controlled to emit outgoing light, which is reflected by the product under test to generate reflected light, and the reflected light is received by the light emitting and receiving mechanism 12.

[0076] The total reflected image of the first surface 011 and the second surface 021 is obtained based on the reflected light rays;

[0077] A second reflection image of the second surface 021 is obtained based on the total reflection image and the first reflection image, and a second eccentricity of the second surface 021 is obtained based on the second reflection image.

[0078] In this specific example, the purpose of the measurement is to perform an eccentricity measurement on the second surface 021 of the second lens 02. This requires that the outgoing light not only passes through the first lens 01 but also enters the second lens 02. Therefore, by adjusting the first switching mechanism 16, the positions of the first light-transmitting aperture and the polarizing device 13 are exchanged, so that the first light-transmitting aperture corresponds to the light emitting and receiving mechanism 12. Thus, the outgoing light emitted by the light emitting and receiving mechanism 12 will not pass through the polarizing device 13, but will directly enter the product under test through the first light-transmitting aperture. The outgoing light is reflected not only by the first surface 011 but also by the second surface 021. Therefore, the reflected light obtained is the total reflection image of the first surface 011 and the second surface 021. By combining the first reflection image of the first surface 011 alone, the second reflection image of the second surface 021 alone can be obtained. Based on this second reflection image, the second eccentricity of the second surface 021 can be obtained.

[0079] Further, obtaining the second reflection image of the second surface 021 based on the total reflection image and the first reflection image includes:

[0080] The first reflected image is removed from the total reflected image, i.e., the second reflected image is obtained.

[0081] In this specific example, the second reflected image is obtained through image processing; for example, region recognition is performed on the first reflected image to obtain the position of the first reflected image; the first reflected image is determined in the total reflected image based on its position, and then the grayscale of the first reflected image is removed from the total reflected image to obtain the separate second reflected image.

[0082] While specific embodiments of this application have been described in detail by way of examples, those skilled in the art should understand that the above examples are for illustrative purposes only and are not intended to limit the scope of this application. Those skilled in the art should understand that modifications can be made to the above embodiments without departing from the scope and spirit of this application. The scope of this application is defined by the appended claims.

Claims

1. An optical measuring device, characterized in that, The optical measuring device is used to perform eccentricity measurement on the product to be measured; the optical measuring device includes: A support bracket (11) is used to support the product to be tested; A light emitting and receiving mechanism (12) is disposed above the support bracket (11); A polarizing device (13) is disposed between the support bracket (11) and the light emitting and receiving mechanism (12); the polarization direction of the polarizing device (13) is perpendicular to the polarization direction of the linear polarizing film in the product under test.

2. The optical measuring device according to claim 1, characterized in that, The optical measuring device further includes a rotating stage (14), on which the support bracket (11) and the polarizing device (13) are mounted, and the rotating stage (14) is capable of rotating about a first direction.

3. The optical measuring device according to claim 2, characterized in that, The optical measuring device further includes a four-position adjustment stage (15), which is mounted on the rotary table (14). The support bracket (11) and the polarization device (13) are mounted on the four-position adjustment stage (15). The four-position adjustment stage (15) is capable of translational movement along the second direction and the third direction, and the four-position adjustment stage (15) is capable of rotation around the second direction and the third direction. The first direction, the second direction, and the third direction are perpendicular to each other.

4. The optical measuring device according to claim 1 or 3, characterized in that, The optical measuring device further includes a first switching mechanism (16), the polarizing device (13) is mounted on the first switching mechanism (16), and the first switching mechanism (16) is provided with a first light-transmitting hole; the polarizing device (13) and the first light-transmitting hole can move in the first switching mechanism (16) to switch the positions of the polarizing device (13) and the first light-transmitting hole so that the polarizing device (13) or the first light-transmitting hole corresponds to the light emitting and receiving mechanism (12).

5. The optical measuring device according to claim 1, characterized in that, The optical measuring device further includes a second switching mechanism (17), which is connected to the light emitting and receiving mechanism (12); The second switching mechanism (17) is provided with a second light-transmitting hole (170) and at least one lens (171). The second light-transmitting hole (170) and any of the lenses (171) can move in the second switching mechanism (17) to switch the positions of the second light-transmitting hole (170) and the lens (171) so that the second light-transmitting hole (170) or any of the lenses (171) corresponds to the light emitting and receiving mechanism (12).

6. The optical measuring device according to claim 1 or 5, characterized in that, The optical measuring device also includes a motion axis (18), and the light emitting and receiving mechanism (12) is mounted on the motion axis (18). The motion axis (18) can drive the light emitting and receiving mechanism (12) to translate along a first direction.

7. The optical measuring device according to claim 1, characterized in that, The light emitting and receiving mechanism (12) is an autocollimator.

8. An optical measurement method, characterized in that, Using the optical measuring device as described in any one of claims 1-7, the product under test includes at least a first lens (01) and a second lens (02), the first lens (01) having a first surface (011), the second lens (02) having a second surface (021), the first surface (011) and the second surface (021) being arranged adjacent to each other and having the same curvature; a linear polarizing film (03) is provided on the first surface (011); The optical measurement method includes: The product to be tested is placed on the support bracket (11), and the first lens (01) is positioned closer to the light emitting and receiving mechanism (12) than the second lens (02); The light emitting and receiving mechanism (12) is controlled to emit outgoing light. After passing through the polarization device (13), the outgoing light is reflected by the product under test and generates reflected light. The reflected light is received by the light emitting and receiving mechanism (12). A first reflected image of the first surface (011) is obtained based on the reflected light, and a first eccentricity of the first surface (011) is obtained based on the first reflected image.

9. The optical measurement method according to claim 8, characterized in that, The optical measuring device further includes a first switching mechanism (16), the polarization device (13) is mounted on the first switching mechanism (16), and the first switching mechanism (16) is provided with a first light-transmitting hole; The optical measurement method further includes: In the first switching mechanism (16), the positions of the polarization device (13) and the first light-transmitting hole are switched so that the first light-transmitting hole corresponds to the light emitting and receiving mechanism (12); The light emitting and receiving mechanism (12) is controlled to emit outgoing light, which is reflected by the product under test and generates reflected light, which is received by the light emitting and receiving mechanism (12). The total reflected image of the first surface (011) and the second surface (021) is obtained based on the reflected light; A second reflection image of the second surface (021) is obtained based on the total reflection image and the first reflection image, and a second eccentricity of the second surface (021) is obtained based on the second reflection image.

10. The optical measurement method according to claim 9, characterized in that, The step of obtaining the second reflection image of the second surface (021) based on the total reflection image and the first reflection image includes: The first reflected image is removed from the total reflected image, i.e., the second reflected image is obtained.

Images