Parameter determination method and apparatus for insulating material, device, and readable storage medium
Patent Information
- Application Number
- PCT/CN2025/120636
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-02-21
- Filing Date
- 2025-09-11
- Publication Date
- 2026-08-27
Smart Images
Figure CN2025120636_27082026_PF_FP_ABST
Abstract
Description
Method, device, equipment and readable storage medium for determining parameters of insulation material TECHNICAL FIELD
[0001] The present application relates to the technical field of cables, in particular to a method, device, equipment and readable storage medium for determining parameters of insulation material. BACKGROUND
[0002] In a power system, the insulation performance of a cable is a key factor to ensure safe and reliable operation of the system, and the insulation performance of the cable is often affected by related parameters of the insulation material, such as the thickness of the material, therefore, the thickness of the insulation material needs to be optimized to improve the insulation performance of the cable.
[0003] In the related art, the thickness of the insulation material is designed based on the dielectric strength and the design voltage under conventional test conditions.
[0004] However, the thickness of the insulation material obtained by the above method has the problem of poor reliability. SUMMARY
[0005] Therefore, it is necessary to provide a method, device, equipment and readable storage medium for determining parameters of insulation material to improve the reliability of the thickness of the material.
[0006] In a first aspect, the present application provides a method for determining parameters of insulation material, comprising:
[0007] obtaining a basic test parameter of a target insulation material under a basic test environment, and obtaining current time sequence change data of the target insulation material under different impact conditions;
[0008] obtaining an aging parameter of the target insulation material corresponding to each impact condition according to each current time sequence change data;
[0009] determining a thickness parameter of the target insulation material according to the aging parameter and the basic test parameter.
[0010] In one embodiment, the aging parameter of the target insulation material corresponding to each impact condition is obtained according to each current time sequence change data, comprising:
[0011] for each impact condition, obtaining a current parameter of the target insulation material under different polarization conditions according to the current time sequence change data, the current parameter comprising a trap density and a time constant of the target insulation material under the polarization condition, the time constant being used to represent a relaxation time;
[0012] determining the aging parameter corresponding to the impact condition according to each current parameter.
[0013] In one of the embodiments, the current parameters of the target insulation material under different polarization conditions are obtained according to the current time-varying data, including:
[0014] The capacitance model is determined according to the polarization conditions;
[0015] Based on the current time-varying data and the capacitance model, the current parameters are determined.
[0016] In one of the embodiments, the aging parameters corresponding to the impact conditions are determined according to the current parameters, including:
[0017] The aging parameters are obtained by substituting the current parameters into a preset aging parameter calculation formula.
[0018] In one of the embodiments, the thickness parameter of the target insulation material is determined according to the aging parameters and the basic test parameters, including:
[0019] The thickness parameter is obtained by substituting the basic test parameters and the aging parameters into a preset thickness optimization formula.
[0020] In one of the embodiments, the impact conditions include thermal impact conditions, electrical impact conditions, or no impact conditions, and the current time-varying data of the target insulation material under different impact conditions is obtained, including:
[0021] The target insulation material is subjected to thermal impact test to obtain a first target insulation material, and the first target insulation material is subjected to isothermal relaxation current test to obtain the current time-varying data under the thermal impact conditions;
[0022] The target insulation material is subjected to electrical impact test to obtain a second target insulation material, and the second target insulation material subjected to the electrical impact test is subjected to isothermal relaxation current test to obtain the second current time-varying data under the electrical impact conditions;
[0023] The target insulation material is subjected to isothermal relaxation current test to obtain third current time-varying data under no impact conditions.
[0024] In a second aspect, the application further provides a parameter determination device for insulation material, including:
[0025] The acquisition module is configured to acquire the basic test parameters of the target insulation material under a basic test environment, and to acquire the current time-varying data of the target insulation material under different impact conditions;
[0026] The aging module is configured to obtain the aging parameters of the target insulation material corresponding to the impact conditions according to the current time-varying data;
[0027] The optimization module is configured to determine the thickness parameter of the target insulation material according to the aging parameters and the basic test parameters.
[0028] In a third aspect, an embodiment of the present application provides a computer device, comprising a memory and a processor, the memory storing a computer program, and the processor implementing the steps of the method of the first aspect when executing the computer program.
[0029] In a fourth aspect, an embodiment of the present application provides a computer readable storage medium, storing a computer program, and the computer program implementing the steps of the method of the first aspect when executed by a processor.
[0030] In a fifth aspect, the present application also provides a computer program product. The computer program product comprises a computer program, and the computer program implements the steps of the method of the first aspect when executed by a processor.
[0031] The parameter determination method, device, equipment and readable storage medium of the insulation material can obtain the aging parameters of the target insulation material corresponding to each impact condition according to each current time sequence change data by obtaining the basic test parameters of the target insulation material under the basic test environment and obtaining the current time sequence change data of the target insulation material under different impact conditions, and determine the thickness parameter of the target insulation material according to the aging parameters and the basic test parameters. In this way, by testing the target insulation material under different extreme impact conditions, the corresponding current time sequence change data is obtained, and the aging parameters of the target insulation material under different extreme impact conditions are obtained. The thickness parameter of the target insulation material is determined by comprehensively considering the basic test parameters and the aging parameters under the extreme impact conditions, which avoids the problem of poor reliability of the thickness parameter in the prior art, which is designed based on the test parameters under the conventional test conditions without considering the influence of the extreme impact conditions on the insulation material. The thickness parameter determined by the parameter determination method, device, equipment and readable storage medium of the insulation material provided by the technical solution can better cope with the extreme impact conditions and has higher reliability. BRIEF DESCRIPTION OF DRAWINGS
[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related art, the drawings needed to be used in the description of the embodiments of the present application or the related art will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other related drawings can also be obtained without creative labor.
[0033] FIG. 1 is a schematic diagram of an example overall model of a tunnel high-voltage DC cable;
[0034] FIG. 2 is an application environment diagram of the parameter determination method of the insulation material in an embodiment;
[0035] FIG. 3 is a flowchart of a method for determining parameters of an insulation material in an embodiment;
[0036] FIG. 4 is a thermal shock test device in another embodiment;
[0037] FIG. 5 is an electrical shock test device in another embodiment;
[0038] FIG. 6 is a flowchart of step 302 in another embodiment;
[0039] FIG. 7 is a structure diagram of a three-capacitance polarization model in another embodiment;
[0040] FIG. 8 is a structure block diagram of a parameter determination device for insulation material in an embodiment;
[0041] FIG. 9 is an internal structure diagram of a computer device in an embodiment. DETAILED DESCRIPTION
[0042] In order to make the purpose, technical scheme and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not to limit the present application.
[0043] With the continuous growth of global energy demand, the expansion and upgrading of power transmission networks become increasingly important. In this context, direct current transmission technology gradually attracts widespread attention due to its significant advantages in long-distance and large-capacity power transmission. Compared with traditional alternating current transmission, direct current transmission systems can effectively reduce line loss, reduce voltage level requirements, and improve the stability and reliability of power transmission. Therefore, direct current transmission technology has been widely used in cross-regional power grid interconnection, power delivery of large-scale renewable energy bases, etc.
[0044] In the direct current transmission system, the insulation performance of the cable is a key factor to ensure the safe and reliable operation of the system. The insulation layer of the direct current cable not only needs to have good electrical insulation performance, but also needs to maintain stable mechanical and thermal performance in complex and variable operating environments. Therefore, the insulation material of the cable insulation layer needs to be designed to have good insulation performance.
[0045] Referring to FIG. 1, it is an exemplary schematic diagram of a tunnel high-voltage direct current cable overall model. As can be seen, the cable is sequentially composed of a core conductor, a conductor shielding layer, an insulation layer, an insulation shielding layer, a water-blocking layer, a metal shielding layer, and a sheath from the inside to the outside.
[0046] In the conventional technology, the material thickness of the insulation material is usually designed based on the dielectric strength and design voltage under the conventional test condition. However, in actual operation, the cable is often subjected to different degrees of impact, such as thermal shock or electrical shock.
[0047] Therefore, the material thickness parameter of the insulation material designed based on the conventional test condition has poor reliability, and the cable insulation layer made based on the material thickness has certain safety hazards.
[0048] Therefore, the material thickness parameter of the insulation material designed based on the conventional test condition has poor reliability, and the cable insulation layer made based on the material thickness has certain safety hazards.
[0049] The parameter determination method of the insulation material provided in the embodiments of the present application can be applied to an application environment as shown in FIG. 2. The data storage system can store data required to be processed by the server 201. The data storage system can be integrated on the server 201, or placed on a cloud or other network server. The server 201 can be a stand-alone physical server, or a server cluster or distributed system composed of multiple physical servers, or a cloud server providing cloud computing services.
[0050] In an exemplary embodiment, as shown in FIG. 3, a parameter determination method of an insulation material is provided, which is taken as an example to be applied to the server 201 in FIG. 2, and includes the following steps 301 to 303. Among them:
[0051] Step 301: Obtain a basic test parameter of a target insulation material under a basic test environment, and obtain current time sequence change data of the target insulation material under different impact conditions.
[0052] The target insulation material is the material whose parameters need to be determined in the present application. The target insulation material can be a material used for the outer insulation layer of a cable, such as a polypropylene material.
[0053] In the embodiment of the present application, the server can first perform an experiment on the target insulation material in a basic test environment to obtain corresponding basic test parameters.
[0054] The basic test environment can be a test environment for determining the thickness parameter of the target insulation material in a conventional manner. Based on the environment, the basic test parameters can be obtained, including the working voltage U, the working field intensity E, the safety factor k1, and the conventional aging factor k2 in the basic test environment.
[0055] Therefore, the formula for determining the basic thickness parameter of the target insulation material in the basic test environment can be referred to as follows:
[0056]
[0057] D1 represents the basic thickness parameter of the target insulation material determined in the basic test environment.
[0058] It can be understood that, since the target insulation material does not receive extreme impact such as thermal impact and electric impact in the basic test environment, the basic thickness parameter D1 obtained through the above process is unreliable. Therefore, it is necessary to perform impact tests on the target insulation material under different impact conditions to enable the server to obtain data, i.e., current time sequence change data, which can be used to determine the thickness parameter of the target insulation material under different impact conditions.
[0059] In the embodiment of the present application, in order to better obtain the aging state of the target insulation material after different impact tests, the current time sequence change data can be data obtained by performing isothermal relaxation current tests on different target insulation materials after the target insulation materials have undergone impact tests under different impact conditions.
[0060] In a possible implementation, the impact conditions include thermal impact conditions, electric impact conditions, or no impact conditions. Obtaining the current time sequence change data of the target insulation material under different impact conditions can include: performing a thermal impact test on the target insulation material to obtain a first target insulation material, and performing an isothermal relaxation current test on the first target insulation material to obtain the current time sequence change data under the thermal impact conditions; performing an electric impact test on the target insulation material to obtain a second target insulation material, and performing an isothermal relaxation current test on the second target insulation material after the electric impact test to obtain second current time sequence change data under the electric impact conditions; and performing an isothermal relaxation current test on the target insulation material to obtain third current time sequence change data under the no impact conditions.
[0061] In the embodiments of the present application, the impact conditions can include thermal impact conditions, electrical impact conditions, or no impact conditions, which can be set according to actual application scenarios, and the impact tests can include thermal impact tests, electrical impact tests, and no impact tests (in which no impact test is performed on the target insulation material).
[0062] In a possible implementation, the thermal impact test can be performed based on the device shown in FIG. 4. The insulation sample, i.e., the target insulation material, the lower hot plate and the upper hot plate can be heated to simulate the set thermal impact environment. Optionally, the lower hot plate can be kept at 110°C to simulate the external working stability of the target insulation material as a cable insulation layer, and the upper hot plate can be kept at 250°C to simulate the high temperature of the target insulation material as a cable insulation layer near the semiconductor during the cable short circuit process. The pressure gauge can simulate the preset pressure condition.
[0063] Based on the device shown in FIG. 4, the first target insulation material after the thermal impact test can be obtained, and the isothermal relaxation current test can be performed on the first target insulation material, so that the server can obtain the first current time sequence change data corresponding to the first target insulation material subjected to the thermal impact test.
[0064] In a possible implementation, the electrical impact test can be performed based on the circuit device shown in FIG. 5. The tested product, i.e., the target insulation material, has four stages of impact voltage generators in the electrical impact circuit, and the highest voltage of each stage is 100 kV, so that the impact voltage of 400 kV can be obtained. During the charging process, the inter-stage sphere gap is not broken down, and each stage of capacitor is charged in parallel. During the discharging process, a slight disturbance is applied to trigger the sphere gap discharge, so that each stage of capacitor is discharged in parallel. By changing the wave head and tail resistance, the time constant during the discharging process can be changed, and the wave head and tail time can be changed. In this way, a larger impact voltage can be applied to the target insulation material to complete the electrical impact test and obtain the second target insulation material.
[0065] Based on the electrical impact test device shown in FIG. 5, the second target insulation material after the electrical impact test can be obtained, and the isothermal relaxation current test can be performed on the second target insulation material, so that the server can obtain the second current time sequence change data corresponding to the second target insulation material subjected to the electrical impact test.
[0066] Under the no impact condition, no impact test is performed on the target insulation material, and the isothermal relaxation current test can be directly performed on the target insulation material, so that the server can obtain the third current time sequence change data corresponding to the target insulation material not subjected to the impact test.
[0067] In step 302, the aging parameters of the target insulation material corresponding to each impact condition are obtained according to each current time sequence change data.
[0068] In order to extract the feature parameters related to the aging state of the insulation material from the current time series variation data, so as to better determine the thickness parameter of the target insulation material, in the embodiment of the present application, the server can perform polarization fitting analysis on the current time series variation data, so as to obtain the aging parameters of the target insulation material corresponding to each impact condition. The aging parameters can reflect the aging state of the target insulation material after different impact tests. Taking the case where the impact conditions include thermal impact condition, electrical impact condition or no impact condition as an example, the aging parameters can include the aging parameter A0 of the target insulation material corresponding to the no impact condition, the aging parameter A1 of the target insulation material corresponding to the thermal impact condition, and the aging parameter A2 of the target insulation material corresponding to the electrical impact condition.
[0069] In the embodiment of the present application, the server can analyze the current time series variation data based on different polarization fitting models. Optionally, the polarization fitting model can be a double exponential decay model. Optionally, the polarization fitting model can be a logarithmic decay model. Optionally, the polarization fitting model can also be a three-capacitance polarization model.
[0070] In step 303, the thickness parameter of the target insulation material is determined according to the aging parameters and the basic test parameters.
[0071] After obtaining the aging parameters and the basic test parameters based on the above process, the server can obtain the final thickness parameter based on the two parameters.
[0072] In one possible implementation, the server can substitute the basic test parameters and the aging parameters into the preset thickness optimization formula to obtain the thickness parameter.
[0073] It can be understood that the basic thickness parameter formula corresponding to the above formula (1) cannot meet the current situation, and needs to be modified according to the obtained aging parameters to obtain the preset thickness optimization formula.
[0074] In the embodiment of the present application, when the aging parameters include the aging parameter A0 of the target insulation material corresponding to the no impact condition, the aging parameter A1 of the target insulation material corresponding to the thermal impact condition, and the aging parameter A2 of the target insulation material corresponding to the electrical impact condition, the preset thickness optimization formula can refer to the following formula (2):
[0075]
[0076] Wherein, D2 represents the finally determined thickness parameter. The server substitutes the basic test parameters and the aging parameters into the formula (2) to obtain the thickness parameter corresponding to the target insulation material.
[0077] In the above embodiment, by testing the target insulation material under different extreme impact conditions, corresponding current time sequence change data is obtained, and the aging parameters of the target insulation material under different extreme impact conditions are obtained. The thickness parameter of the target insulation material is determined by comprehensively considering the basic test parameters and the aging parameters under extreme impact conditions, thereby avoiding the problem of poor reliability of the thickness parameter in the prior art, which is designed based on the test parameters under the conventional test conditions without considering the influence of the extreme impact conditions on the insulation material. The thickness parameter determined by the parameter determination method of the insulation material provided by the technical solution can better cope with the extreme impact conditions and has higher reliability.
[0078] In one embodiment, based on the embodiment shown in FIG. 3, referring to FIG. 6, the present embodiment relates to a process of obtaining the aging parameters of the target insulation material corresponding to each impact condition according to each current time sequence change data. As shown in FIG. 6, step 302 can include step 601 and step 602.
[0079] In step 601, for each impact condition, the current parameters of the target insulation material under different polarization conditions are obtained according to the current time sequence change data.
[0080] In the embodiment of the present application, the current time sequence change data can be isothermal relaxation current data under different impact conditions. The server can perform polarization fitting analysis on the current time sequence change data corresponding to each impact condition, thereby determining the aging state of the target insulation material under different impact conditions.
[0081] In the embodiment of the present application, for each impact condition, the server can obtain the current parameters of the target insulation material under different polarization conditions, wherein the current parameters include the trap density and the time constant of the target insulation material under the polarization conditions, and the time constant is used to represent the relaxation time.
[0082] In the embodiment of the present application, the server can determine the current parameters of the target insulation material under different polarization conditions according to a preset polarization fitting model. The polarization fitting model can be a double exponential decay model or a three-capacitance polarization model.
[0083] The polarization conditions can be determined according to different polarization fitting models. For example, when the polarization fitting model is a three-capacitance polarization model, referring to FIG. 7, the capacitance circuit under three polarization conditions is divided into three types, wherein R1, C1 circuit represents the polarization condition of the insulator itself; R2, C2 circuit represents the polarization condition of the interface between amorphous and crystal regions; and R3, C3 circuit represents the polarization condition of impurity polarization introduced by aging factors.
[0084] As to the process of obtaining the current parameters under different polarization conditions by the server, in a possible implementation, the server can determine the capacitance model according to each polarization condition, and determine each current parameter based on the current time sequence change data and the capacitance model.
[0085] In the embodiments of the present application, according to different polarization conditions, a specific capacitance model can be determined. Referring to the three-capacitance polarization model in FIG. 7, the polarization conditions include three kinds, and the capacitance model determined according to each polarization condition can refer to the following formula:
[0086]
[0087] wherein I(t) is the fitted polarization current under three kinds of polarization conditions, I0 is the known steady-state conduction current, τ1 represents the time constant under the polarization condition of the insulation body self-polarization, and α1 represents the trap density under the polarization condition; τ2 represents the time constant under the polarization condition of the interface polarization between amorphous and crystal regions, and α2 represents the trap density under the polarization condition; τ3 represents the time constant under the polarization condition of the impurity polarization introduced by the aging factor, and α3 represents the trap density under the polarization condition.
[0088] In step 602, the aging parameter corresponding to the impact condition is determined according to each current parameter.
[0089] Based on the current parameters obtained by the above method, the server can determine the aging parameter corresponding to each impact condition. In a possible implementation, the server can input the current parameters corresponding to each polarization condition into the pre-trained aging analysis model, and the aging parameter corresponding to the current impact condition can be obtained.
[0090] In another possible implementation, the server can substitute each current parameter into the preset aging parameter calculation formula to obtain the aging parameter.
[0091] In a possible implementation, taking the three-capacitance polarization model in FIG. 7 as the polarization fitting model, and taking the polarization conditions including the insulation body self-polarization, the interface polarization between amorphous and crystal regions, and the impurity polarization introduced by the aging factor as examples, the aging parameter A can be calculated by the following formula:
[0092]
[0093] The higher the value of the aging parameter A is, the more serious the deterioration degree is.
[0094] Through the above formula, the aging parameter under different impact conditions can be obtained. Based on the aging parameters corresponding to these extreme impact conditions, the server can determine the thickness parameter of the target insulation material.
[0095] In one embodiment, an exemplary method for determining the parameters of an insulating material is provided. This method is used on a server and can be applied to the implementation environment shown in Figure 2.
[0096] Step a: Obtain the basic test parameters of the target insulation material under the basic test environment.
[0097] In this embodiment, the impact conditions include thermal shock conditions, electrical shock conditions, or no impact conditions.
[0098] Step b: Perform a thermal shock test on the target insulating material to obtain the first target insulating material, and perform an isothermal relaxation current test on the first target insulating material to obtain the current time series change data under thermal shock conditions.
[0099] Step c: Perform an electric impulse test on the target insulating material to obtain a second target insulating material, and perform an isothermal relaxation current test on the second target insulating material after the electric impulse test to obtain the second current time series change data under the electric impulse condition.
[0100] Step d: Perform isothermal relaxation current testing on the target insulating material to obtain the third current time series variation data under no-impact conditions.
[0101] Step e: For each impact condition, determine the capacitance model based on the polarization conditions.
[0102] Step f: Determine each current parameter based on the current time-series variation data and the capacitance model.
[0103] Among them, the current parameters include the trap density of the target insulating material under polarization conditions and the time constant, which is used to characterize the relaxation time.
[0104] Step g: Substitute each current parameter into the preset aging parameter calculation formula to obtain the aging parameters.
[0105] Step h involves substituting the basic test parameters and aging parameters into the preset thickness optimization formula to obtain the thickness parameters.
[0106] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.
[0107] Based on the same inventive concept, this application also provides a parameter determination device for a type of insulating material to implement the parameter determination method for the type of insulating material described above. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the parameter determination device for a type of insulating material provided below can be found in the limitations of the parameter determination method for the type of insulating material described above, and will not be repeated here.
[0108] In an exemplary embodiment, as shown in FIG8, a parameter determination device for an insulating material is provided, comprising: an acquisition module 801, an aging module 802, and an optimization module 803, wherein:
[0109] The acquisition module 801 is used to acquire the basic test parameters of the target insulating material under the basic test environment, and to acquire the current time sequence change data of the target insulating material under different impact conditions;
[0110] The aging module 802 is used to obtain the aging parameters of the target insulating material and the impact conditions based on the current time-series change data.
[0111] The optimization module 803 is used to determine the thickness parameters of the target insulating material based on the aging parameters and the basic test parameters.
[0112] In one embodiment, the aging module 802 includes:
[0113] A polarization fitting unit is used to obtain the current parameters of the target insulating material under different polarization conditions based on the current time-series variation data for each impact condition. The current parameters include the trap density and time constant of the target insulating material under the polarization conditions, and the time constant is used to characterize the relaxation time.
[0114] An aging parameter determination unit is used to determine the aging parameters corresponding to the impact conditions based on the current parameters.
[0115] In one embodiment, the polarization fitting unit is specifically used to perform:
[0116] Determine the capacitance model based on the polarization conditions described above;
[0117] Based on the current time-series variation data and the capacitance model, each of the current parameters is determined.
[0118] In one embodiment, the aging parameter determination unit is specifically used to perform:
[0119] Substitute each of the current parameters into the preset aging parameter calculation formula to obtain the aging parameters.
[0120] In one embodiment, optimization module 803:
[0121] The thickness parameter determination unit is used to substitute the basic test parameters and the aging parameters into a preset thickness optimization formula to obtain the thickness parameters.
[0122] In one embodiment, the impact condition includes thermal shock, electrical shock, or no impact condition, and the acquisition module 801 includes:
[0123] A thermal shock unit is used to perform thermal shock testing on the target insulating material to obtain a first target insulating material, and to perform isothermal relaxation current testing on the first target insulating material to obtain the current time-series change data under the thermal shock conditions.
[0124] An electric shock unit is used to perform an electric shock test on the target insulating material to obtain a second target insulating material, and to perform an isothermal relaxation current test on the second target insulating material after the electric shock test to obtain second current time-series change data under the electric shock conditions.
[0125] The shock-free unit is used to perform isothermal relaxation current testing on the target insulating material to obtain the third current time-series change data under the shock-free conditions.
[0126] The various modules in the device for determining the parameters of the insulating material can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the operations corresponding to each module.
[0127] In an exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram is shown in Figure 9. The computer device includes a processor, memory, input / output interfaces (I / O), and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is connected to the system bus via the I / O interfaces. The processor of the computer device provides computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The database of the computer device stores parameter determination data for insulating materials. The I / O interfaces of the computer device are used for exchanging information between the processor and external devices. The communication interface of the computer device is used for communicating with external terminals via a network connection. When the computer program is executed by the processor, it implements a method for determining the parameters of insulating materials.
[0128] Those skilled in the art will understand that the structure shown in Figure 9 is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or may combine certain components, or may have different component arrangements.
[0129] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:
[0130] Obtain the basic test parameters of the target insulating material under the basic test environment, and obtain the current time series variation data of the target insulating material under different impact conditions;
[0131] Based on the current time-series change data, the aging parameters of the target insulating material corresponding to each impact condition are obtained.
[0132] The thickness parameters of the target insulating material are determined based on the aging parameters and the basic test parameters.
[0133] In one embodiment, the processor, when executing a computer program, also performs the following steps:
[0134] For each of the aforementioned impact conditions, the current parameters of the target insulating material under different polarization conditions are obtained based on the current time-series variation data. The current parameters include the trap density and time constant of the target insulating material under the polarization conditions, and the time constant is used to characterize the relaxation time.
[0135] The aging parameters corresponding to the impact conditions are determined based on the current parameters.
[0136] In one embodiment, the processor, when executing a computer program, also performs the following steps:
[0137] Determine the capacitance model based on the polarization conditions described above;
[0138] Based on the current time-series variation data and the capacitance model, each of the current parameters is determined.
[0139] In one embodiment, the processor, when executing a computer program, also performs the following steps:
[0140] Substitute each of the current parameters into the preset aging parameter calculation formula to obtain the aging parameters.
[0141] In one embodiment, the processor, when executing a computer program, also performs the following steps:
[0142] The thickness parameters are obtained by substituting the basic test parameters and the aging parameters into the preset thickness optimization formula.
[0143] In one embodiment, the impact condition includes thermal shock, electrical shock, or no impact condition, and the processor, when executing the computer program, further implements the following steps:
[0144] The target insulating material is subjected to thermal shock test to obtain a first target insulating material, and the first target insulating material is subjected to isothermal relaxation current test to obtain the current time series change data under the thermal shock condition;
[0145] An electrical impulse test is performed on the target insulating material to obtain a second target insulating material. An isothermal relaxation current test is then performed on the second target insulating material after the electrical impulse test to obtain second current time-series change data under the electrical impulse conditions.
[0146] The target insulating material was subjected to isothermal relaxation current testing to obtain the third current time-series variation data under the no-impact condition.
[0147] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, the computer program performing the following steps when executed by a processor:
[0148] Obtain the basic test parameters of the target insulating material under the basic test environment, and obtain the current time series variation data of the target insulating material under different impact conditions;
[0149] Based on the current time-series change data, the aging parameters of the target insulating material corresponding to each impact condition are obtained.
[0150] The thickness parameters of the target insulating material are determined based on the aging parameters and the basic test parameters.
[0151] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0152] For each of the aforementioned impact conditions, the current parameters of the target insulating material under different polarization conditions are obtained based on the current time-series variation data. The current parameters include the trap density and time constant of the target insulating material under the polarization conditions, and the time constant is used to characterize the relaxation time.
[0153] The aging parameters corresponding to the impact conditions are determined based on the current parameters.
[0154] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0155] Determine the capacitance model based on the polarization conditions described above;
[0156] Based on the current time-series variation data and the capacitance model, each of the current parameters is determined.
[0157] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0158] Substitute each of the current parameters into the preset aging parameter calculation formula to obtain the aging parameters.
[0159] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0160] The thickness parameters are obtained by substituting the basic test parameters and the aging parameters into the preset thickness optimization formula.
[0161] In one embodiment, the impact condition includes thermal shock, electrical shock, or no impact condition, and the computer program, when executed by the processor, further implements the following steps:
[0162] The target insulating material is subjected to thermal shock test to obtain a first target insulating material, and the first target insulating material is subjected to isothermal relaxation current test to obtain the current time series change data under the thermal shock condition;
[0163] An electrical impulse test is performed on the target insulating material to obtain a second target insulating material. An isothermal relaxation current test is then performed on the second target insulating material after the electrical impulse test to obtain second current time-series change data under the electrical impulse conditions.
[0164] The target insulating material was subjected to isothermal relaxation current testing to obtain the third current time-series variation data under the no-impact condition.
[0165] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, performs the following steps:
[0166] Obtain the basic test parameters of the target insulating material under the basic test environment, and obtain the current time series variation data of the target insulating material under different impact conditions;
[0167] Based on the current time-series change data, the aging parameters of the target insulating material corresponding to each impact condition are obtained.
[0168] The thickness parameters of the target insulating material are determined based on the aging parameters and the basic test parameters.
[0169] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0170] For each of the aforementioned impact conditions, the current parameters of the target insulating material under different polarization conditions are obtained based on the current time-series variation data. The current parameters include the trap density and time constant of the target insulating material under the polarization conditions, and the time constant is used to characterize the relaxation time.
[0171] The aging parameters corresponding to the impact conditions are determined based on the current parameters.
[0172] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0173] Determine the capacitance model based on the polarization conditions described above;
[0174] Based on the current time-series variation data and the capacitance model, each of the current parameters is determined.
[0175] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0176] Substitute each of the current parameters into the preset aging parameter calculation formula to obtain the aging parameters.
[0177] In one embodiment, when the computer program is executed by a processor, it further performs the following steps:
[0178] The thickness parameters are obtained by substituting the basic test parameters and the aging parameters into the preset thickness optimization formula.
[0179] In one embodiment, the impact condition includes thermal shock, electrical shock, or no impact condition, and the computer program, when executed by the processor, further implements the following steps:
[0180] The target insulating material is subjected to thermal shock test to obtain a first target insulating material, and the first target insulating material is subjected to isothermal relaxation current test to obtain the current time series change data under the thermal shock condition;
[0181] An electrical impulse test is performed on the target insulating material to obtain a second target insulating material. An isothermal relaxation current test is then performed on the second target insulating material after the electrical impulse test to obtain second current time-series change data under the electrical impulse conditions.
[0182] The target insulating material was subjected to isothermal relaxation current testing to obtain the third current time-series variation data under the no-impact condition.
[0183] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.
[0184] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.
[0185] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.
[0186] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.
Claims
1. A method for determining the parameters of an insulating material, characterized in that, The method includes: Obtain the basic test parameters of the target insulating material under the basic test environment, and obtain the current time series variation data of the target insulating material under different impact conditions; Based on the current time-series change data, the aging parameters of the target insulating material corresponding to each impact condition are obtained. The thickness parameters of the target insulating material are determined based on the aging parameters and the basic test parameters.
2. The method according to claim 1, characterized in that, The step of obtaining the aging parameters of the target insulating material corresponding to each impact condition based on the current time-series change data includes: For each of the aforementioned impact conditions, the current parameters of the target insulating material under different polarization conditions are obtained based on the current time-series variation data. The current parameters include the trap density and time constant of the target insulating material under the polarization conditions, and the time constant is used to characterize the relaxation time. The aging parameters corresponding to the impact conditions are determined based on the current parameters.
3. The method according to claim 2, characterized in that, The step of obtaining the current parameters of the target insulating material under different polarization conditions based on the current time-series variation data includes: Determine the capacitance model based on the polarization conditions described above; Based on the current time-series variation data and the capacitance model, each of the current parameters is determined.
4. The method according to claim 2, characterized in that, The step of determining the aging parameters corresponding to the impact conditions based on the current parameters includes: Substitute each of the current parameters into the preset aging parameter calculation formula to obtain the aging parameters.
5. The method according to claim 1, characterized in that, The step of determining the thickness parameter of the target insulating material based on the aging parameters and the basic test parameters includes: The thickness parameters are obtained by substituting the basic test parameters and the aging parameters into the preset thickness optimization formula.
6. The method according to claim 1, characterized in that, The impact conditions include thermal impact conditions, electrical impact conditions, or no impact conditions. The step of obtaining the current time-series change data of the target insulating material under different impact conditions includes: performing a thermal shock test on the target insulating material to obtain a first target insulating material, and performing an isothermal relaxation current test on the first target insulating material to obtain the current time-series change data under the thermal shock conditions. An electrical impulse test is performed on the target insulating material to obtain a second target insulating material. An isothermal relaxation current test is then performed on the second target insulating material after the electrical impulse test to obtain second current time-series change data under the electrical impulse conditions. The target insulating material was subjected to isothermal relaxation current testing to obtain the third current time-series variation data under the no-impact condition.
7. A device for determining the parameters of an insulating material, characterized in that, The device includes: The acquisition module is used to acquire the basic test parameters of the target insulating material under the basic test environment, and to acquire the current time series change data of the target insulating material under different impact conditions; An aging module is used to obtain aging parameters of the target insulating material and each impact condition based on the current time-series change data. The optimization module is used to determine the thickness parameters of the target insulating material based on the aging parameters and the basic test parameters.
8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.
9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.
10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.