Adjusting mechanism for neutron optical paths of neutron reflectometer-horizontal sample geometry
A technology of adjusting mechanism and reflection spectrum, applied in the direction of material analysis, instruments, scientific instruments, etc. using wave/particle radiation, which can solve the problems of low neutron beam incident angle accuracy, low positioning accuracy, and low instrument resolution.
Inactive Publication Date: 2014-08-13
INST OF CHEM CHINESE ACAD OF SCI
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Problems solved by technology
In this spectrometer, the position change mechanism of the incident collimator and the incident neutron flight tube is composed of two lifting platforms, an arc sliding compensation module and a translation compensation module. The inherent backlash of the arc sliding compensation module makes the positioning accuracy The incident angle of the neutron beam is not high, resulting in low accuracy of the incident angle of the neutron beam; at the same time, the position changing mechanism of the reflecting collimator and the reflecting neutron flight tube is built on the position changing mechanism of the incident collimator and the incident neutron flight tube, causing neutron Beam reflection angle accuracy is low
The low positioning accuracy of the incident angle and reflection angle results in low resolution of the instrument
Method used
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[0078] See Figure 1~6 . The neutron optical path adjustment mechanism of the horizontal sample geometric neutron reflectance spectrometer includes an incident elevating mechanism 1 and a reflection elevating mechanism 2 fixedly installed on the platform 10 along the optical path direction of the incident neutron beam. The adjustment process of the incident angle and reflection angle of the neutron beam will be described below through the specific operation of the adjustment mechanism of the neutron optical path.
[0079] (1) The adjustment process where the incident angle of the neutron beam is 0°
[0080] The incident lifting mechanism 1 includes a first rod-end joint bearing pair 1100 with a sliding bearing structure capable of supporting and rotating, a main lifting platform 1200 and an auxiliary lifting platform 1300 vertically fixed on the platform 10, and a Y-shaped support arm 1400 (There are two support shafts at the Y-shaped bifurcated end, and the other end is a b...
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Abstract
The invention relates to an adjusting mechanism for the neutron optical paths of a neutron reflectometer-horizontal sample geometry. The adjusting mechanism includes an incident elevating mechanism and a reflecting elevating mechanism. Along the optical path direction of incident neutrons, a first incident slit seat, an incident neutron flight tube and a second incidence slit seat are sequentially installed on the incident elevating mechanism. Along the optical path direction of reflecting neutrons, a first reflecting slit seat, a reflecting neutron flight tube and a second reflecting slit seat are installed on the reflecting elevating mechanism. The adjusting mechanism of the invention can adjust positions of the slits and the neutron flight tubes with high precision, and can realize high accuracy change of the incident angle and the reflecting angle of a neutron beam so as to obtain a high-resolution scattering vector. And the incident angle of the neutron beam ranges from -5 degrees to 9 degrees, the reflecting angle of the neutron beam ranges from -5 degrees to 9 degrees, thus enlarging the range of the measured scattering vector. Meanwhile, in the ranges of the incident and reflecting angles, a sample can be always aligned with the neutron beam.
Description
technical field [0001] The invention relates to a neutron optical path adjustment mechanism in the field of neutron scattering, in particular to a neutron optical path adjustment mechanism of a horizontal sample geometry neutron reflectance spectrometer (Neutron reflectometer-horizontal sample geometry). Background technique [0002] Neutron reflection is a branch of neutron scattering developed in the early to mid-1980s. In the past two decades, neutron reflectance technology has become a powerful method for probing surface and interface structures in the range of 0.1nm to 100nm. Its applications include liquid surfaces and solid films, such as liquid crystal surfaces, polymer films, Biofilms and magnetic films, etc. The neutron reflection technique reflects the distribution of the scattering length density along the vertical film direction by measuring the relationship between the reflectivity of the film and the scattering vector Q in the vertical film direction, and obt...
Claims
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IPC IPC(8): G01N23/00
Inventor 张红霞袁光萃程贺韩志超
Owner INST OF CHEM CHINESE ACAD OF SCI