Ram module detection method, device and storage medium based on single-chip microcomputer
By subdividing the RAM module into buffer, general-purpose, and stack areas and detecting them during the microcontroller's operation intervals, the problem of unsuitable detection frequency in existing technologies is solved, enabling real-time and continuous detection of the RAM module and improving device safety and reliability.
Patent Information
- Application Number
- CN202310070561.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-01-11
- Publication Date
- 2026-05-08
- Estimated Expiration
- 2043-01-11
AI Technical Summary
The current technology does not have an appropriate testing frequency for RAM modules, which cannot effectively guarantee the normal status of the air conditioner RAM modules after they are sold, thus posing a safety hazard.
The RAM module is divided into a buffer area, a general area, and a stack area. Based on the microcontroller's operating speed and the program runtime threshold, it is further subdivided into multiple sub-areas. These are then detected sequentially during the program's execution intervals, generating abnormal alarm information and stopping the detection.
It enables segmented, time-division, and cyclical continuous detection of RAM modules, increasing the detection frequency, ensuring device safety, and without increasing additional device hardware circuitry and configuration costs.