Power amplifier testing device and method

Abstract

The invention provides a power amplifier test device and method, the device comprises a single-chip microcomputer and a relay, the single-chip microcomputer is used for receiving and analyzing a test instruction sent by an external computer and sending a corresponding control signal to the relay based on an analysis result, and the relay is used for controlling a corresponding external power amplifier to enter a test mode based on the control signal. And controlling the power amplifier to enter the target short circuit test. According to the application, the single-chip microcomputer receives and analyzes the test instruction sent by the external computer, and sends the corresponding control signal to the relay based on the analysis result, and the relay controls the corresponding external power amplifier to enter the test mode based on the control signal and controls the power amplifier to enter the target short-circuit test, so that the test does not depend on manual work any more; the test steps are simplified, the test efficiency is improved, the influence on the accuracy of the test result is reduced, meanwhile, long-time uninterrupted test can be coped, and the test range is widened.

Description

Technical Field

[0001] The present application relates to the field of vehicle computer technology, and more specifically, to a power amplifier testing device and method. Background Art

[0002] As the scope of automated testing of car screen navigation becomes wider and wider, functional testing of power amplifiers has become a necessary test item.

[0003] At present, power amplifier testing is mainly performed manually, wherein the short circuit and open circuit testing of the external power amplifier are performed manually by short-circuiting the power supply and the grounding of the equipment.

[0004] However, the current testing method is performed manually, the operation steps are cumbersome, and the testing efficiency is low. With the increase in the number of power amplifiers and the demand for stress testing, human work efficiency is affected, which will further affect the accuracy of the test results. At the same time, it is also difficult to cope with long-term uninterrupted testing. Summary of the invention

[0005] In view of this, the purpose of the present application is to provide a power amplifier testing device and method, which receives and parses the test instructions sent by an external computer through a single-chip microcomputer, and sends a corresponding control signal to a relay based on the parsing result, and controls the corresponding external power amplifier to enter a test mode based on the control signal through the relay, thereby controlling the power amplifier to enter a target short-circuit test, no longer relying on manual testing, simplifying the test steps, improving test efficiency, and reducing the impact on the accuracy of the test results. At the same time, it can cope with long-term uninterrupted testing and increase the test range.

[0006] In a first aspect, an embodiment of the present application provides a power amplifier testing device, the device comprising a single chip microcomputer and a relay; the single chip microcomputer is connected to the relay;

[0007] The single chip microcomputer is used to receive and analyze the test instructions sent by the external computer, and send corresponding control signals to the relay based on the analysis results;

[0008] The relay is used to control the corresponding external power amplifier to enter a test mode based on the control signal, and control the power amplifier to enter a target short circuit test; wherein the target short circuit test includes short circuiting a power supply or a ground.

[0009] In a possible implementation manner, the single-chip microcomputer is used to control the opening or closing of a general input / output interface on the single-chip microcomputer based on the analysis result to generate a corresponding control signal, and send the control signal to the relay.

[0010] In a possible implementation, the power amplifier testing device includes an optical coupler;

[0011] The single chip microcomputer is connected to the optical coupler, and is connected to the relay through the optical coupler;

[0012] The optical coupler is used for electrical isolation to improve the anti-interference capability of the power amplifier testing device.

[0013] In a possible implementation manner, the power amplifier testing device includes a Darlington tube;

[0014] The optical coupler is connected to the Darlington tube, and is connected to the relay through the Darlington tube;

[0015] The single chip microcomputer is used to send the control signal to the optical coupler;

[0016] The optical coupler is used to receive the control signal and send the control signal to the Darlington transistor;

[0017] The Darlington transistor is used to receive the control signal and control the relay based on the control signal.

[0018] In a possible implementation, the power amplifier testing device includes an internal power supply;

[0019] The internal power supply is connected to the Darlington tube and is used to supply power to the Darlington tube.

[0020] In a possible implementation manner, the power amplifier testing device includes a power amplifier interface;

[0021] One end of the power amplifier interface is connected to the power amplifier, and the other end is connected to the relay, and the power amplifier is connected through the power amplifier interface;

[0022] The power amplifier interface is used to access the power amplifier.

[0023] In a possible implementation manner, the power amplifier testing device includes at least one load resistor; wherein each load resistor corresponds to one of the power amplifiers;

[0024] The power amplifier is connected to the load resistor via the power amplifier interface, and the load resistor is connected to the relay;

[0025] The load resistor is used to replace the speaker of the power amplifier.

[0026] In a possible implementation manner, the single chip microcomputer is further used to periodically sample the load voltage of the corresponding load resistor, and control the relay to exit the test mode when the load voltage is greater than a limit value of the power amplifier.

[0027] In a second aspect, an embodiment of the present application further provides a power amplifier testing method, which is applied to the power amplifier testing device as described in the embodiment of the first aspect; the power amplifier testing device includes a single chip microcomputer and a relay; the method includes:

[0028] The single chip microcomputer receives and analyzes the test instructions sent by the external computer, and sends a corresponding control signal to the relay based on the analysis result;

[0029] The relay controls the corresponding external power amplifier to enter a test mode based on the control signal, and controls the power amplifier to enter a target short circuit test; wherein the target short circuit test includes short circuiting a power supply or a ground.

[0030] In a possible implementation manner, the power amplifier testing device includes at least one load resistor; wherein each load resistor corresponds to one power amplifier; and the method further includes:

[0031] The single chip microcomputer regularly samples the load voltage of the corresponding load resistor;

[0032] When the load voltage is greater than a limit value of the power amplifier, the relay is controlled to exit the test mode.

[0033] An embodiment of the present application provides a power amplifier testing device and method, the device includes a single-chip microcomputer and a relay, the single-chip microcomputer is used to receive and parse the test instructions sent by an external computer, and send a corresponding control signal to the relay based on the analysis result, and the relay is used to control the corresponding external power amplifier to enter the test mode based on the control signal, and control the power amplifier to enter the target short-circuit test. In the present application, the single-chip microcomputer receives and parses the test instructions sent by the external computer, and sends the corresponding control signal to the relay based on the analysis result, and controls the corresponding external power amplifier to enter the test mode based on the control signal through the relay, and controls the power amplifier to enter the target short-circuit test, no longer relying on manual testing, simplifying the test steps, improving the test efficiency, and reducing the impact on the accuracy of the test results. At the same time, it can cope with long-term uninterrupted testing and increase the test range.

[0034] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0036] Figure 1 is a structural schematic diagram of a power amplifier testing device provided according to an embodiment of the present application;

[0037] Figure 2 It is the hardware design structure diagram of the power amplifier test device;

[0038] Figure 3 This is an actual product picture of the power amplifier test device;

[0039] Figure 4 It is a flow chart of a power amplifier testing method provided according to another embodiment of the present application. DETAILED DESCRIPTION

[0040] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be understood that the drawings in the present application only serve the purpose of explanation and description and are not used to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn in real proportion. The flowchart used in this application shows the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowchart can be implemented out of sequence, and the steps without logical context can be reversed in order or implemented simultaneously. In addition, those skilled in the art can add one or more other operations to the flowchart under the guidance of the content of the present application, or remove one or more operations from the flowchart.

[0041] In addition, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0042] It should be noted that the term "comprising" will be used in the embodiments of the present application to indicate the existence of the features declared thereafter, but does not exclude the addition of other features.

[0043] Considering that the scope of automated testing of car screen navigation is becoming wider and wider, functional testing of power amplifiers has become a necessary test item.

[0044] At present, power amplifier testing is mainly done manually, where the short circuit and open circuit testing of external power amplifiers are done manually by short-circuiting the power supply and grounding of the equipment. However, the current testing method is done manually, with cumbersome steps and low testing efficiency. With the increase in the number of power amplifiers and the demand for stress testing, human work efficiency is affected, which will further affect the accuracy of the test results. At the same time, it is also difficult to cope with long-term uninterrupted testing.

[0045] To address this problem, the present application provides a power amplifier testing device and method, which receives and parses test instructions sent by an external computer through a single-chip microcomputer, and sends a corresponding control signal to a relay based on the parsing result, and controls the corresponding external power amplifier to enter a test mode based on the control signal through the relay, thereby controlling the power amplifier to enter a target short-circuit test. It no longer relies on manual testing, simplifies the testing steps, improves testing efficiency, and reduces the impact on the accuracy of test results. At the same time, it can cope with long-term uninterrupted testing and increases the test range.

[0046] Figure 1 1 is a flow chart of a power amplifier testing device provided according to an embodiment of the present application. Figure 1 As shown, the power amplifier test device 100 of the embodiment of the present application includes a single chip microcomputer 1 and a relay 2. The single chip microcomputer 1 is connected to the relay 2. The single chip microcomputer 1 is an MCU (Microcontroller Unit). For example, Figure 2 The hardware design structure diagram of the power amplifier test device is as follows: Figure 2 As shown, MCU-stm32g030 in the figure represents microcontroller 1, and the computer is connected to the data cable via the USB-C port to connect to the entire power amplifier test device, specifically to the microcontroller 1.

[0047] The single-chip microcomputer 1 is used to receive and analyze the test instructions sent by the external computer, and send the corresponding control signal to the relay 2 based on the analysis result. Among them, the test instruction is the instruction for performing the power amplifier test, the analysis result is the result obtained by analyzing the test instruction, and the control signal is the signal for controlling the relay 2. Optionally, the computer sends the test instruction to the single-chip microcomputer 1 through a serial port tool.

[0048] Specifically, the single chip microcomputer 1 receives the test instruction sent by the computer and parses it to obtain the parsing result, determines the corresponding control signal based on the parsing result, and sends the control signal to the relay 2. For example, Figure 2 As shown, the computer is connected to the data cable via the USB-C port, and the computer sends test commands to CH340 (USB to serial port) through the serial port tool. CH340 and MCU exchange data through UART serial port communication, and MCU receives test commands through UART serial port communication between CH340.

[0049] Relay 2 is used to control the corresponding power amplifier to enter the test mode based on the control signal, and control the power amplifier to enter the target short circuit test. The power amplifier is the power amplifier to be tested, and the target short circuit test includes short circuiting the power supply or the ground. For example, Figure 2 As shown, K1-K4 represent the relay 2 of the present application.

[0050] It should be noted that the power amplifier testing device of the present application is suitable for testing any power amplifier device with short-circuit detection.

[0051] The power amplifier testing device 100 provided in the embodiment of the present application includes a single-chip microcomputer 1 and a relay 2. The single-chip microcomputer 1 is used to receive and parse the test instructions sent by the external computer, and send the corresponding control signal to the relay 2 based on the analysis result. The relay 2 is used to control the corresponding external power amplifier to enter the test mode based on the control signal, and control the power amplifier to enter the target short-circuit test. The power amplifier testing device of the present application receives and parses the test instructions sent by the external computer through the single-chip microcomputer 1, and sends the corresponding control signal to the relay 2 based on the analysis result, and controls the corresponding external power amplifier to enter the test mode based on the control signal through the relay 2, and controls the power amplifier to enter the target short-circuit test. It no longer relies on manual testing, simplifies the test steps, improves the test efficiency, and reduces the impact on the accuracy of the test results. At the same time, it can cope with long-term uninterrupted testing and increases the test range.

[0052] Furthermore, the single-chip microcomputer 1 is used to control the opening or closing of the general purpose input / output interface on the single-chip microcomputer 1 based on the analysis result to generate a corresponding control signal and send the control signal to the relay 2. The general purpose input / output interface is a GPIO port (General Purpose Input / Output). For example, Figure 2 As shown, the MCU controls the GPIO port to open or close based on the analysis result to generate a corresponding control signal, for example, Figure 2 IO_1 to IO_8 shown represent control signals, and represent a plurality of control signals.

[0053] Furthermore, the power amplifier test device includes an optical coupler. The single chip microcomputer 1 is connected to the optical coupler, and is connected to the relay 2 through the optical coupler. For example, Figure 2 As shown, TLP521-4 represents an optocoupler, the MCU is connected to the optocoupler TLP521-4, and is connected to the relay 2 through the optocoupler TLP521-4.

[0054] Optocouplers are used for electrical isolation to improve the anti-interference ability of the power amplifier test device.

[0055] Furthermore, the power amplifier test device includes a Darlington tube. The optical coupler is connected to the Darlington tube, and is connected to the relay 2 through the Darlington tube. For example, Figure 2 As shown, ULN2003 represents a Darlington tube, the optocoupler TLP521-4 is connected to the Darlington tube ULN2003, and is connected to the relay 2 through the Darlington tube ULN2003.

[0056] The single chip microcomputer 1 is used to send the control signal to the optical coupler. Specifically, when the single chip microcomputer 1 sends the control signal to the relay 2, the control signal is first sent to the optical coupler. For example, Figure 2 As shown, the MCU sends a control signal to the optocoupler TLP521-4.

[0057] Optocoupler, used to receive the control signal and send the control signal to the Darlington transistor. Figure 2 As shown, the optocoupler TLP521-4 receives the control signal and sends the control signal to the Darlington tube ULN2003.

[0058] The Darlington transistor is used to receive the control signal and control the relay 2 based on the control signal. Figure 2 As shown, the Darlington transistor ULN2003 receives the control signal and controls the relay 2 based on the control signal.

[0059] Further, the power amplifier testing device includes an internal power supply.

[0060] The internal power supply is connected to the Darlington tube and is mainly used to power the Darlington tube. Figure 2 As shown, the 12V external power supply is used to power the Darlington tube ULN2003.

[0061] It should be noted that due to the characteristics of the Darlington tube, a dedicated power supply is required, while the other parts of the power amplifier test device can be powered by the computer through the USB port.

[0062] It should also be noted that, in addition to the power amplifier test device, there is also an external power supply (equipment power supply), which is connected to the power amplifier to supply power to the power amplifier. Figure 2 As shown, the device power supply supplies power to the amplifier.

[0063] Therefore, the present application adopts an independent power supply design, and the power supplies of the power amplifier to be tested and the power amplifier testing device are independent of each other to prevent interference.

[0064] Furthermore, the power amplifier testing device includes a power amplifier interface.

[0065] One end of the power amplifier interface is connected to the power amplifier, and the other end is connected to relay 2. The power amplifier is connected through the power amplifier interface. The power amplifier interface is used to connect to the power amplifier. For example, Figure 2As shown, the power amplifier is connected to the power amplifier test device through the power amplifier interface on the left side of the figure.

[0066] Furthermore, the power amplifier test device includes at least one load resistor. Each load resistor corresponds to a power amplifier. For example, Figure 2 As shown, four load resistors can be connected to four power amplifiers, corresponding to the eight IO signals IO_1-IO_8 sent by the MCU through the GPIO port, and also corresponding to the eight control signals Ctrl1-Ctrl8 sent by the Darlington tube, and also corresponding to K1-K4 and Relay1-Relay4 of relay 2.

[0067] The power amplifier is connected to the load resistor via the power amplifier interface, and the load resistor is connected to the relay 2. For example, Figure 2 As shown, each power amplifier is connected to a corresponding load resistor through a power amplifier interface.

[0068] Load resistors are used to replace the speakers of power amplifiers. Figure 2 As shown, that is, load resistors 1, 2, 3, and 4 replace the speakers in actual application scenarios.

[0069] Furthermore, the single chip microcomputer 1 is also used to periodically sample the load voltage of the corresponding load resistor, and control the relay 2 to exit the test mode when the load voltage is greater than the limit value of the power amplifier.

[0070] It should be noted that the MCU samples the voltage of the current load resistor at regular intervals. When the sampled value is greater than the limit value of the device under test, the test mode is turned off, which can prevent damage to the power amplifier under test and improve the safety of the test.

[0071] In general, if Figure 2 As shown, 4 amplifiers are controlled to short the power supply and short the ground at the same time. The load resistors 1, 2, 3, and 4 are used to replace the speakers in the actual application scenario. When the test mode is not entered, the amplifier device to be tested is connected to the load resistor in the normal working mode. When the test mode is entered, the control relays 2K1, K2, K3, and K4 respectively make the corresponding amplifier device enter the test mode and short the power supply. In the test mode, the control relays 2Relay1, Relay2, Relay3, and Relay4 respectively make the corresponding amplifier enter the short-circuit power supply or short-circuit ground mode. If the test mode is exited, similarly, the control relays 2K1, K2, K3, and K4 respectively make the corresponding amplifier device exit the test mode.

[0072] It should also be noted that Figure 3 This is the actual product picture of the power amplifier test equipment, as shown below Figure 3 As shown, no further elaboration is given.

[0073] Therefore, the present application uses a load resistor to replace the original speaker, and controls relay 2 through the MCU to access different test scenarios, such as power supply or ground. When testing a short-circuit of the power amplifier, it is only necessary to connect the power amplifier to be tested to the power amplifier test device. The test scenario switching of power short circuit or ground short circuit can be realized without manually short-circuiting the power supply or ground, which provides a feasible solution for automated testing of power amplifiers.

[0074] Figure 4 1 is a flow chart of a power amplifier testing method provided according to an embodiment of the present application. The power amplifier testing device 100 is applied to the above embodiment. The power amplifier testing device 100 includes a single chip microcomputer 1 and a relay 2. The single chip microcomputer 1 is connected to the relay 2. The single chip microcomputer is an MCU.

[0075] like Figure 4 As shown, the power amplifier testing method of the embodiment of the present application may specifically include:

[0076] S401, the single chip microcomputer receives and analyzes the test instruction sent by the external computer, and sends the corresponding control signal to the relay based on the analysis result.

[0077] Specifically, the test instruction is an instruction for performing a power amplifier test, the parsing result is a result obtained by parsing the test instruction, and the control signal is a signal for controlling the relay 2. Optionally, the computer sends the test instruction to the single-chip microcomputer 1 through a serial port tool.

[0078] Specifically, the single chip microcomputer 1 receives the test instruction sent by the computer and parses it to obtain the parsing result, determines the corresponding control signal based on the parsing result, and sends the control signal to the relay 2. For example, Figure 2 As shown, the computer is connected to the data cable via the USB-C port, and the computer sends test commands to CH340 (USB to serial port) through the serial port tool. CH340 and MCU exchange data through UART serial port communication, and MCU receives test commands through UART serial port communication between CH340.

[0079] S402: The relay controls the corresponding external power amplifier to enter a test mode based on the control signal, and controls the power amplifier to enter a target short circuit test.

[0080] Specifically, the power amplifier is the power amplifier to be tested, and the target short-circuit test includes short-circuiting the power supply or the ground. Figure 2 As shown, K1-K4 represent the relay 2 of the present application.

[0081] It should be noted that the power amplifier testing device of the present application is suitable for testing any power amplifier device with short-circuit detection.

[0082] The power amplifier test method provided by the embodiment of the present application, the single-chip microcomputer receives and parses the test instructions sent by the external computer, and sends the corresponding control signal to the relay based on the analysis result, and the relay controls the corresponding external power amplifier to enter the test mode based on the control signal, and controls the power amplifier to enter the target short circuit test. The power amplifier test of the present application, through the single-chip microcomputer receives and parses the test instructions sent by the external computer, and sends the corresponding control signal to the relay based on the analysis result, and controls the corresponding external power amplifier to enter the test mode based on the control signal through the relay, and controls the power amplifier to enter the target short circuit test, no longer relies on manual testing, simplifies the test steps, improves the test efficiency, reduces the impact on the accuracy of the test results, and at the same time, can cope with long-term uninterrupted testing and increases the test range.

[0083] It should be noted here that the explanations and descriptions of the above-mentioned embodiments are also applicable to the power amplifier testing method of the embodiments of the present application, and the specific process will not be repeated here.

[0084] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, the specific working process of the system and device described above can refer to the corresponding process in the method embodiment, and will not be repeated in this application. In the several embodiments provided in this application, it should be understood that the disclosed system, device and method can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0085] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0086] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0087] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the deployment method described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard drives, ROM, RAM, magnetic disks, or optical disks.

[0088] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A power amplifier testing device, characterized in that: The device comprises a single chip microcomputer and a relay; the single chip microcomputer is connected to the relay; The single chip microcomputer is used to receive and analyze the test instructions sent by the external computer, and send corresponding control signals to the relay based on the analysis results; The relay is used to control the corresponding external power amplifier to enter a test mode based on the control signal, and control the power amplifier to enter a target short circuit test; wherein the target short circuit test includes short circuiting a power supply or a ground.

2. The device according to claim 1, characterized in that The single-chip microcomputer is used to control the opening or closing of the general input and output interface on the single-chip microcomputer based on the analysis result to generate a corresponding control signal, and send the control signal to the relay.

3. The device according to claim 1, characterized in that The power amplifier testing device comprises an optical coupler; The single chip microcomputer is connected to the optical coupler, and is connected to the relay through the optical coupler; The optical coupler is used for electrical isolation to improve the anti-interference capability of the power amplifier testing device.

4. The device according to claim 3, characterized in that The power amplifier test device includes a Darlington tube; The optical coupler is connected to the Darlington tube, and is connected to the relay through the Darlington tube; The single chip microcomputer is used to send the control signal to the optical coupler; The optical coupler is used to receive the control signal and send the control signal to the Darlington transistor; The Darlington transistor is used to receive the control signal and control the relay based on the control signal.

5. The device according to claim 4, characterized in that The power amplifier test device includes an internal power supply; The internal power supply is connected to the Darlington tube and is used to supply power to the Darlington tube.

6. The device according to claim 5, characterized in that The power amplifier testing device comprises a power amplifier interface; One end of the power amplifier interface is connected to the power amplifier, and the other end is connected to the relay, and the power amplifier is connected through the power amplifier interface; The power amplifier interface is used to access the power amplifier.

7. The device according to claim 6, characterized in that The power amplifier testing device comprises at least one load resistor; wherein each load resistor corresponds to one of the power amplifiers; The power amplifier is connected to the load resistor via the power amplifier interface, and the load resistor is connected to the relay; The load resistor is used to replace the speaker of the power amplifier.

8. The device according to claim 7, characterized in that The single chip microcomputer is also used to regularly sample the load voltage of the corresponding load resistor, and control the relay to exit the test mode when the load voltage is greater than the limit value of the power amplifier.

9. A power amplifier testing method, characterized in that: A power amplifier testing device applied to any one of claims 1 to 8; The power amplifier testing device comprises a single chip microcomputer and a relay; the method comprises: The single chip microcomputer receives and analyzes the test instructions sent by the external computer, and sends a corresponding control signal to the relay based on the analysis result; The relay controls the corresponding external power amplifier to enter a test mode based on the control signal, and controls the power amplifier to enter a target short circuit test; wherein the target short circuit test includes short circuiting a power supply or a ground.

10. The method according to claim 9, characterized in that The power amplifier testing device includes at least one load resistor; wherein each load resistor corresponds to one of the power amplifiers; and the method further includes: The single chip microcomputer regularly samples the load voltage of the corresponding load resistor; When the load voltage is greater than a limit value of the power amplifier, the relay is controlled to exit the test mode.

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