Configuration data detection method, configuration data detection circuit, chip and electronic equipment

Abstract

The invention relates to the technical field of integrated circuits, in particular to a configuration data detection method, a configuration data detection circuit, a chip and electronic equipment, and the method comprises the steps: carrying out the error correction code verification of configuration data stored in a memory, and obtaining at least one error data frame; when the error data frame has the SEU error, determining the error level of the SEU error of the error data frame; generating SEU error data according to the error data frame and the error level; sending the SEU error data to a control module, so that the control module processes the error data frame according to the error level; by means of the mode, when the SEU error is detected, the error level of the SEU error of the error data frame is determined firstly, processing is carried out according to the error level, the detection and error correction time is shortened, the occupied time of normal operation of a system application is shortened, and the working efficiency of the system is improved.

Description

Technical Field

[0001] The present application relates to the field of integrated circuit technology, and in particular to a configuration data detection method, a configuration data detection circuit, a chip, and an electronic device. Background Art

[0002] Single Event Upset (SEU) is a bit flip in a storage unit caused by space particle radiation, where the data changes from 0 to 1, or from 1 to 0. The single event upset effect is transient and non-destructive, but it may change the RAM (Random Access Memory) configuration of the microelectronic circuit and have an adverse effect on the functions performed by the programmable electronic hardware.

[0003] At present, the SRAM memory in complex microcontroller products needs to be frequently tested during the application process in order to detect and correct new hard errors and soft errors generated in the SRAM memory. In the prior art, the same preset operation is performed for all detected errors, resulting in data detection and correction taking up a lot of time in actual application, resulting in a reduction in the normal operation time of the system application, which is not conducive to improving the work efficiency of the system. Summary of the invention

[0004] Based on this, the present application provides a configuration data detection method, a configuration data detection circuit, a chip and an electronic device to solve the technical problem in the prior art that data detection and correction take up a lot of time in actual applications, which is not conducive to improving system work efficiency.

[0005] In a first aspect, an embodiment of the present application provides a configuration data detection method, including:

[0006] Performing error correction code check on the configuration data stored in the memory to obtain at least one error data frame;

[0007] When the erroneous data frame has an SEU error, determining an error level of the SEU error of the erroneous data frame;

[0008] Generate SEU error data according to the error data frame and the error level;

[0009] The SEU error data is sent to a control module so that the control module processes the error data frame according to the error level.

[0010] Optionally, determining an error level of an SEU error of the erroneous data frame includes:

[0011] The error level is obtained by querying a preset error classification table according to the address information of the erroneous data frame, wherein the error classification table is used to store the data type of each data word in the configuration data, the data type is critical data that affects the normal operation of the system or non-critical data that does not affect the normal operation of the system, and the error level includes critical data errors corresponding to the critical data and non-critical data errors corresponding to the non-critical data.

[0012] Optionally, the configuration data includes application data and ECC data;

[0013] The step of performing error correction code checking on the configuration data stored in the memory to obtain at least one error data frame comprises:

[0014] According to the ECC data, an error correction code check is performed on the application data to obtain the error data frame.

[0015] Optionally, the processing the erroneous data frame according to the error level includes:

[0016] If the error level is a non-critical data error, continue to run the system application based on the configuration data stored in the memory, and correct the erroneous data frame;

[0017] If the error level is a critical data error, the system application based on the configuration data stored in the memory is stopped from running, a single event upset protection program is started, and the erroneous data frame is corrected.

[0018] Optionally, after generating SEU error data according to the error data frame and the error level, the method further includes:

[0019] The SEU error data is stored in an error tracking register.

[0020] Optionally, the processing the erroneous data frame according to the error level includes:

[0021] If the error level is a non-critical data error, continuing to run the system application based on the configuration data stored in the memory;

[0022] When the system application stops, at least one SEU error data with the error level of non-critical data error is obtained from the error tracking register, the error data frame of the obtained SEU error data is repaired, and the repaired configuration data frame is rewritten into the memory.

[0023] In a second aspect, an embodiment of the present application provides a configuration data detection circuit, including: a memory, an ECC detection module and a control module;

[0024] The memory is used to store configuration data;

[0025] The ECC detection module is used to perform error correction code check on the configuration data stored in the memory to obtain at least one error data frame; when the error data frame has an SEU error, determine the error level of the SEU error of the error data frame; generate SEU error data according to the error data frame and the error level; and send the SEU error data to the control module;

[0026] The control module is used to process the erroneous data frame according to the error level.

[0027] Optionally, the configuration data detection circuit further comprises a first storage module, which is used to store an error classification table, wherein the error classification table is used to store a data type of each data word in the configuration data, and the data type is critical data that affects the normal operation of the system or non-critical data that does not affect the normal operation of the system;

[0028] The ECC detection module is used to query in a preset error classification table according to the address information of the erroneous data frame to obtain the error level, wherein the error level includes critical data errors corresponding to the critical data and non-critical data errors corresponding to the non-critical data.

[0029] In a third aspect, an embodiment of the present application provides a chip, comprising the above-mentioned configuration data detection circuit.

[0030] In a fourth aspect, an embodiment of the present application provides an electronic device, comprising the above-mentioned chip.

[0031] The configuration data detection method, configuration data detection circuit, chip and electronic device provided in the embodiments of the present application perform error correction code verification on the configuration data stored in the memory to obtain at least one error data frame; when the error data frame has an SEU error, determine the error level of the SEU error of the error data frame; generate SEU error data according to the error data frame and the error level; send the SEU error data to a control module so that the control module processes the error data frame according to the error level; through the above method, when an SEU error is detected, first determine the error level of the SEU error of the error data frame, and process it according to the error level, thereby reducing the detection and error correction time, which is beneficial to reducing the occupied time of normal operation of system applications and improving the work efficiency of the system. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1This is an application scenario diagram of the configuration data detection method provided in an embodiment of the present application.

[0033] Figure 2 Schematic diagram of a flow chart of a configuration data detection method according to an embodiment of the present application.

[0034] Figure 3 It is a structural diagram of a configuration data detection circuit according to an embodiment of the present application.

[0035] Figure 4 It is a structural diagram of a configuration data detection circuit according to an embodiment of the present application.

[0036] Figure 5 It is a structural diagram of a configuration data detection circuit according to an embodiment of the present application.

[0037] Figure 6 It is a schematic diagram of the structure of a chip according to an embodiment of the present application.

[0038] Figure 7 It is a structural schematic diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0039] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

[0040] In order to enable those skilled in the art to better understand the solutions of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the present application.

[0041] In the embodiments of the present application, it should be noted that, in this article, relational terms such as first and second, etc. are merely used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations.

[0042] Moreover, the terms "comprises," "comprising," or any other variation thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus that includes the element.

[0043] In the description of the embodiments of the present application, words such as "example" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "example" or "for example" in the embodiments of the present application is not to be interpreted as being more preferred or having more advantages than another embodiment or design. The use of words such as "example" or "for example" is intended to present relative concepts in a clear manner.

[0044] In addition, the "plurality" in the embodiments of the present application refers to two or more than two. In view of this, in the embodiments of the present application, "plurality" can also be understood as "at least two". "At least one" can be understood as one or more, for example, one, two or more. For example, including at least one means including one, two or more, and there is no limit on which ones are included. For example, including at least one of A, B and C, then A, B, C, A and B, A and C, B and C, or A, B and C can be included.

[0045] It should be noted that in the embodiments of the present application, "connection" can be understood as electrical connection, and the connection between two electrical components can be a direct or indirect connection between the two electrical components. For example, the connection between A and B can be either a direct connection between A and B or an indirect connection between A and B through one or more other electrical components.

[0046] The first pole / first end of each transistor used in the embodiments of the present application is one of the source and the drain, and the second pole / second end of each transistor is the other of the source and the drain. Since the source and drain of the transistor can be symmetrical in structure, the source and drain thereof can be structurally indistinguishable, that is, the first pole / first end and the second pole / second end of the transistor in the embodiments of the present application can be structurally indistinguishable. Exemplarily, in the case where the transistor is a P-type transistor, the first pole / first end of the transistor is the source, and the second pole / second end is the drain; exemplarily, in the case where the transistor is an N-type transistor, the first pole / first end of the transistor is the drain, and the second pole / second end is the source.

[0047] The configuration data detection method provided in this application can be applied to Figure 1In the FPGA chip 200 shown, the FPGA chip 200 includes an SRAM memory 201, and the SRAM memory 201 stores configuration data. The configuration data detection method is used to detect the configuration data in the SRAM memory 201 to identify errors in the configuration data in the SRAM memory 201 and process the errors.

[0048] like Figure 2 As shown, it is a process of a configuration data detection method according to an embodiment of the present application.

[0049] like Figure 2 As shown, the configuration data detection method includes the following steps S11 to S14:

[0050] Step S11: performing error correction code check on the configuration data stored in the memory to obtain at least one error data frame.

[0051] Among them, error correction code checking (Error Checking and Correcting, ECC) is used to detect and correct single-bit errors and / or multi-bit errors in data transmission or storage, thereby improving the security and reliability of data. The error correction code checking (ECC checking) method can adopt any ECC checking method in the prior art. Specifically, a single-bit error is also called an SEU (Single Event Upset) error, which refers to the phenomenon that a single particle incident causes one or more bits of data in the memory to flip. SEU errors are more common in digital circuits, which may cause changes in the logical state, thereby affecting the normal operation of the circuit. Multi-bit errors are also called MBU (Multiple Bits Upset) errors, which refers to the phenomenon that a single particle incident causes multiple bits in the memory to flip simultaneously. This error may cause multiple bits of stored data to change at the same time, thereby affecting the integrity and accuracy of the data. MBU errors are an important consideration in memory design because they may cause data errors or system failures.

[0052] Among them, the configuration data may include multiple configuration data frames. When checking, they can be read back frame by frame, and each configuration data frame can be checked for error correction codes in turn. If there is at least one erroneous data word in any configuration data frame (for example, a data word originally "1" is flipped to "0" or a data word originally "0" is flipped to "1"), then the configuration data frame is an erroneous data frame.

[0053] Step S12: When the erroneous data frame has an SEU error, determining the error level of the SEU error of the erroneous data frame.

[0054] Among them, the SEU error is an error that can be corrected or modified, and the MBU error is an error that cannot be corrected or modified. If the error data frame has an SEU error, the error level of the SEU error is determined. The error level of the SEU error can be preset. Before starting to detect the configuration data, the error levels of the SEU errors are divided in advance, and a judgment condition is set for each error level. The error level of the error data word of the error data frame is determined based on whether the error data word meets a certain judgment condition. The error level of the error data word is the error level of the error data frame.

[0055] Step S13: Generate SEU error data according to the error data frame and the error level.

[0056] Among them, after determining the error level of the erroneous data frame, SEU error data is generated according to the erroneous data frame and its corresponding error level. Exemplarily, the SEU error data may include address information of the erroneous data frame and the error level of the erroneous data frame, and the address information of the erroneous data frame is the storage address of the erroneous data frame in the memory; exemplarily, the SEU error data may include address information of erroneous data words in the erroneous data frame and the corresponding error level.

[0057] Step S14: Send the SEU error data to the control module so that the control module processes the error data frame according to the error level.

[0058] Wherein, the control module may be, for example, a processor (CPU) in a chip, and the control module processes the error data frame. Wherein, in the detection process of executing step S11 to step S14, the system application is run based on the configuration data stored in the memory, and the configuration data may be accessed by the system application during the operation of the system application as part of the program code of the system application or all or at least part of the configuration data. Exemplarily, if the error level affects the operation of the system application, the processing method may be to run a preset single particle upset protection program, and the single particle upset protection program may be, for example, to issue an alarm to notify the user, or to reset the system, or to perform a system-level switch; if the error level does not affect the operation of the system application, the processing method may be to flip the error data word in the error data frame, or the processing method may be to repair the error data frame, or the processing method may be to continue to run the system application.

[0059] In the detection method of the present embodiment, error correction code check is performed on the configuration data in the memory to obtain at least one erroneous data frame; when an SEU error exists, the error level of the SEU error of the erroneous data frame is determined; the erroneous data frame is processed according to the error level; through the above method, when an SEU error is detected, the error level of the SEU error of the erroneous data frame is first determined, and the data frame is processed according to the error level, thereby reducing the detection and error correction time, which is beneficial to reducing the occupied time of normal operation of the system application and improving the working efficiency of the system.

[0060] As an implementation manner, in step S12, determining the error level of the SEU error of the erroneous data frame includes the following steps: querying a preset error classification table according to the address information of the erroneous data frame to obtain the error level.

[0061] Among them, the error classification table is used to store the data type of each data word in the configuration data. The data type is critical data that affects the normal operation of the system or non-critical data that does not affect the normal operation of the system. The error level includes critical data errors corresponding to critical data and non-critical data errors corresponding to non-critical data.

[0062] The error classification table is a query table stored in an off-chip flash generated by an integrated circuit software tool such as EDA (Electronic Design Automation) when generating a bit stream. Exemplarily, the preset error classification table can be a SEU error classification table generated by a layout and routing tool. The layout and routing tool will mark the corresponding bit as being used by the programmable logic according to the SRAM configuration used by the user resource logic, and its size is consistent with the bit stream size. By querying the SEU error classification table, it is determined whether the address of the error data word in the error data frame in the memory affects the normal operation of the system application. If the error data word in the error data frame affects the normal operation of the system application, the protection program for the occurrence of a single particle upset is still automatically started according to the user's system design. If the error data word in the error data frame does not affect the normal operation of the system, the system application is normally operated.

[0063] As an implementation mode, the configuration data includes application data and ECC data, and the ECC data can be directly derived from the application data based on a specific ECC code, for example, the ECC data can be obtained based on a symmetrical shortened HsiaoECC code. Step S11 specifically includes the following steps: according to the ECC data, an error correction code check is performed on the application data to obtain an error data frame.

[0064] As an implementation manner, in step S14, the erroneous data frame is processed according to the error level, specifically comprising the following steps:

[0065] S21, if the error level is a non-critical data error, continue to run the system application based on the configuration data stored in the memory, and correct the erroneous data frame.

[0066] The erroneous data word does not affect the normal operation of the system, and the system application can continue to run. The erroneous data word in the erroneous data frame is directly flipped to modify the erroneous data frame into a correct configuration data frame.

[0067] S22, if the error level is a critical data error, stopping running the system application based on the configuration data stored in the memory, starting a single event upset protection program and correcting the erroneous data frame.

[0068] Among them, the erroneous data word affects the normal operation of the system, and the system application cannot continue to run. After stopping the system application, the single-particle upset protection program is started, and then the erroneous data word in the erroneous data frame is flipped to modify the erroneous data frame into a correct configuration data frame.

[0069] In this embodiment, the error level is divided into two levels according to whether it affects the system operation. The two levels correspond to different processing methods, which is beneficial to reducing the occupied time of normal operation of system applications and improving the work efficiency of the system.

[0070] As an implementation manner, step S13 further includes the following steps:

[0071] S14', store the SEU error data into the error tracking register.

[0072] In this implementation, the SEU error data is stored to implement marking of error data frames or error data words.

[0073] In some implementations, the step S14 processes the erroneous data frame according to the error level, specifically comprising the following steps:

[0074] S31, if the error level is a non-critical data error, continue to run the system application based on the configuration data stored in the memory;

[0075] S32, when the system application stops, obtaining at least one SEU error data with an error level of non-critical data error from the error tracking register, repairing the error data frame of the obtained SEU error data, and rewriting the repaired configuration data frame into the memory.

[0076] In this embodiment, during the operation of the system application, non-critical data errors with error levels are not processed. After the system application stops, all data with error levels of non-critical data errors in the error tracking register are centrally repaired, which is beneficial to further reduce the time occupied by the normal operation of the system application and to further improve the work efficiency of the system.

[0077] An embodiment of the present application provides a configuration data detection circuit. Figure 3 As shown, the configuration data detection circuit 100 includes a memory 10 , an ECC detection module 20 and a control module 30 .

[0078] The memory 10 may be an on-chip storage unit, such as a SRAM (Static Random-Access Memory), and is used to store configuration data. The system needs to run system applications based on the configuration data stored in the memory 10, and the configuration data may be accessed by the system application as part of the program code of the system application or all or at least part of the configuration data during the operation of the system application.

[0079] Among them, the ECC detection module 20 is used to perform error correction code verification on the configuration data stored in the memory 10 to obtain at least one error data frame; when there is an SEU error in the error data frame, determine the error level of the SEU error of the error data frame; generate SEU error data according to the error data frame and the error level; and send the SEU error data to the control module 30.

[0080] The ECC detection module 20 may be used to execute steps S11 to S13 in the above configuration data detection method. For details, please refer to the description of the above method embodiment and various implementation methods, which will not be described one by one here.

[0081] The control module 30 is used to process the error data frame according to the error level. For example, the control module 30 may be a processor in a chip, such as a processor provided in an SRAM-type FPGA.

[0082] The detection circuit of this embodiment performs error correction code check on the configuration data in the memory to obtain at least one error data frame; when an SEU error exists, the error level of the SEU error of the error data frame is determined; and the error data frame is processed according to the error level. Through the above method, when an SEU error is detected, the error level of the SEU error of the error data frame is first determined, and the error data frame is processed according to the error level, thereby reducing the detection and error correction time, which is beneficial to reducing the occupied time of normal operation of the system application and improving the working efficiency of the system.

[0083] As an implementation, see Figure 4 As shown, the configuration data detection circuit 100 also includes a first storage module 40 for storing an error classification table, wherein the error classification table is used to store the data type of each data word in the configuration data (each data word can be, for example, 0 or 1), and the data type is critical data that affects the normal operation of the system or non-critical data that does not affect the normal operation of the system. The generation method of the error classification table is specifically referred to the description of the above method embodiment and each implementation method, and will not be repeated here. The first storage module 40 can be an off-chip storage unit, and the first storage module 40 can be a non-volatile storage unit, for example, the first storage module 40 can be a flash memory.

[0084] The ECC detection module 20 is used to query the preset error classification table according to the address information of the error data frame to obtain the error level, wherein the error level includes the key data error corresponding to the key data and the non-key data error corresponding to the non-key data. Specifically, the ECC detection module 20 sends the address information of the error data frame or the address of the error data bit in the error data frame to the first storage module 40, and the first storage module 40 queries the address information or the data type corresponding to the address in the preset error classification table according to the address information of the error data frame or the address of the error data bit in the error data frame, determines the error level according to the data type, and feeds the error level back to the ECC detection module 20.

[0085] In this embodiment, the first storage module is used to store the preset error classification table, and the preset error classification table is not easily damaged, which is conducive to improving the accuracy of the query.

[0086] As an implementation, see Figure 5 As shown, the configuration data detection circuit 100 also includes an error tracking register 50, the ECC detection module 20 stores the SEU error data in the error tracking register 50, and the control module 30 is used to continue to run the system application based on the configuration data stored in the memory 10 if the error level is a non-critical data error; when the system application stops, at least one SEU error data with an error level of a non-critical data error is obtained from the error tracking register 50, the erroneous data frame of the obtained SEU error data is repaired, and the repaired configuration data frame is rewritten into the memory 10.

[0087] In this embodiment, during the operation of the system application, non-critical data errors with error levels are not processed. After the system application stops, all data with error levels of non-critical data errors in the error tracking register are centrally repaired, which is beneficial to further reduce the time occupied by the normal operation of the system application and to further improve the work efficiency of the system.

[0088] An embodiment of the present application provides a chip 300, see Figure 6 As shown, the chip 300 includes the above-mentioned configuration data detection circuit 100. An Integrated Circuit (IC) is also called a chip, and the chip may be, but is not limited to, a SOC (System on Chip) chip, a SIP (system in package) chip, or a FPGA (Field-Programmable Gate Array) chip.

[0089] The chip of this embodiment performs error correction code verification on the configuration data in the memory to obtain at least one erroneous data frame; when an SEU error exists, the error level of the SEU error of the erroneous data frame is determined; the erroneous data frame is processed according to the error level; through the above method, when an SEU error is detected, the error level of the SEU error of the erroneous data frame is first determined, and the data frame is processed according to the error level, thereby reducing the detection and error correction time, which is beneficial to reducing the occupied time of the normal operation of the system application and improving the work efficiency of the system.

[0090] The present application embodiment also provides an electronic device 400, see Figure 7 As shown, the electronic device 400 includes a device body and a chip 300 as described above, which is arranged in the device body. The electronic device may be, but is not limited to, a display, a USB (Universal Serial Bus) docking station, a car, a smart wearable device, a mobile terminal, and a smart home device. Smart wearable devices include, but are not limited to, smart watches, smart bracelets, and cervical massagers. Mobile terminals include, but are not limited to, smart phones, laptops, tablet computers, and POS (point of sale terminals). Smart home devices include, but are not limited to, smart sockets, smart rice cookers, smart sweepers, and smart lights.

[0091] The electronic device of this embodiment performs error correction code check on the configuration data in the memory to obtain at least one erroneous data frame; when an SEU error exists, the error level of the SEU error of the erroneous data frame is determined; the erroneous data frame is processed according to the error level; through the above method, when an SEU error is detected, the error level of the SEU error of the erroneous data frame is first determined, and the data frame is processed according to the error level, thereby reducing the detection and error correction time, which is beneficial to reducing the occupied time of the normal operation of the system application and is beneficial to improving the working efficiency of the system.

[0092] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0093] The above embodiments only express the preferred implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for those of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A configuration data detection method, characterized in that ,include: Performing error correction code check on the configuration data stored in the memory to obtain at least one error data frame; When the erroneous data frame has an SEU error, determining an error level of the SEU error of the erroneous data frame; Generate SEU error data according to the error data frame and the error level; The SEU error data is sent to a control module so that the control module processes the error data frame according to the error level.

2. The configuration data detection method according to claim 1, characterized in that: The step of determining the error level of the SEU error of the erroneous data frame comprises: The error level is obtained by querying a preset error classification table according to the address information of the erroneous data frame, wherein the error classification table is used to store the data type of each data word in the configuration data, the data type is critical data that affects the normal operation of the system or non-critical data that does not affect the normal operation of the system, and the error level includes critical data errors corresponding to the critical data and non-critical data errors corresponding to the non-critical data.

3. The configuration data detection method according to claim 2, characterized in that: The configuration data includes application data and ECC data; The step of performing error correction code checking on the configuration data stored in the memory to obtain at least one error data frame comprises: According to the ECC data, an error correction code check is performed on the application data to obtain the error data frame.

4. The configuration data detection method according to claim 2, characterized in that: The processing of the erroneous data frame according to the error level includes: If the error level is a non-critical data error, continue to run the system application based on the configuration data stored in the memory, and correct the erroneous data frame; If the error level is a critical data error, the system application based on the configuration data stored in the memory is stopped from running, a single event upset protection program is started, and the erroneous data frame is corrected.

5. The configuration data detection method according to claim 2, characterized in that: After generating SEU error data according to the error data frame and the error level, the method further includes: The SEU error data is stored in an error tracking register.

6. The configuration data detection method according to claim 5, characterized in that: The processing of the erroneous data frame according to the error level includes: If the error level is a non-critical data error, continuing to run the system application based on the configuration data stored in the memory; When the system application stops, at least one SEU error data with the error level of non-critical data error is obtained from the error tracking register, the error data frame of the obtained SEU error data is repaired, and the repaired configuration data frame is rewritten into the memory.

7. A configuration data detection circuit, characterized in that , including: memory, ECC detection module and control module; The memory is used to store configuration data; The ECC detection module is used to perform error correction code check on the configuration data stored in the memory to obtain at least one error data frame; when the error data frame has an SEU error, determine the error level of the SEU error of the error data frame; generate SEU error data according to the error data frame and the error level; and send the SEU error data to the control module; The control module is used to process the erroneous data frame according to the error level.

8. The configuration data detection circuit according to claim 7, characterized in that: The configuration data detection circuit further comprises a first storage module for storing an error classification table, wherein the error classification table is used to store a data type of each data word in the configuration data, and the data type is critical data that affects the normal operation of the system or non-critical data that does not affect the normal operation of the system; The ECC detection module is used to query in a preset error classification table according to the address information of the erroneous data frame to obtain the error level, wherein the error level includes critical data errors corresponding to the critical data and non-critical data errors corresponding to the non-critical data.

9. A chip, characterized in that: Comprising the configuration data detection circuit as claimed in claim 7.

10. An electronic device, characterized in that: Comprising the chip as claimed in claim 9.

Images