Multi-mode integrated circuit chip performance evaluation system and method

Abstract

The invention provides a multi-mode integrated circuit chip performance evaluation system and method, and the method comprises the steps: dynamically controlling the temperature, power supply voltage and clock frequency parameters in a performance evaluation box environment where an integrated circuit chip is located according to the working mode of the integrated circuit chip; the performance evaluation box is used for detecting environmental parameters of the integrated circuit chip, sending the detected environmental parameter data to a performance evaluation management platform, and testing the power consumption, the data transmission rate, the clock precision and the optical transmittance of the integrated circuit chip when the environmental parameters in the performance evaluation box are adjusted; processing and analyzing the output power consumption, the data transmission rate, the clock precision and the optical transmissivity data, generating an evaluation report, sending the evaluation report to the performance evaluation management platform, and displaying the evaluation report to a user by the performance evaluation management platform; the system corresponding to the method comprises an environment parameter adjusting module, a testing module, a processing and analyzing module and a display module, and the performance of the multi-mode integrated circuit chip can be comprehensively and accurately evaluated through the method and the system.

Description

Technical Field

[0001] The invention provides a multi-mode integrated circuit chip performance evaluation system and method, belonging to the technical field of integrated circuit chip testing. Background Art

[0002] An integrated circuit (IC) is a miniature electronic device or component that uses a certain process to interconnect the transistors, resistors, capacitors, inductors and other components and wiring required in a circuit and install them on a silicon substrate to form an integrated integrated circuit chip.

[0003] After the integrated circuit chip is manufactured, it is necessary to conduct performance evaluation on the integrated circuit chip. The integrated circuit chip performance evaluation can help to test the performance of the chip, including reliability, power consumption, speed, etc. Through performance evaluation, it can be ensured that the chip meets the specified standards and requirements, thereby ensuring the quality of the chip product. The integrated circuit chip performance evaluation can discover defects and problems in the chip, make timely adjustments and improvements, and reduce the cost of later repairs. At the same time, performance evaluation can also provide chip designers with better feedback and guidance, so as to solve problems and improve performance as early as possible in the design stage.

[0004] Because integrated circuit chips have multiple operating modes, existing performance evaluation methods cannot comprehensively evaluate the performance of integrated circuit chips. Summary of the invention

[0005] The present invention provides a multi-mode integrated circuit chip performance evaluation system and method to solve the above-mentioned problems:

[0006] The present invention provides a multi-mode integrated circuit chip performance evaluation system and method, the method comprising:

[0007] Dynamically control the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and send the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform;

[0008] After the environmental parameters in the performance evaluation box are adjusted according to the working mode of the integrated circuit chip, various performances of the integrated circuit chip are tested, including power consumption, data transmission rate, clock accuracy and optical transmittance;

[0009] Processing and analyzing the output power consumption, data transmission rate, clock accuracy and optical transmittance data, generating an evaluation report, and then sending it to the performance evaluation management platform;

[0010] The performance evaluation management platform receives the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located and simultaneously receives the evaluation report.

[0011] Further, dynamically controlling the temperature, power supply voltage and clock frequency parameters in the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and sending the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform, including:

[0012] According to the chip working mode, design the corresponding control logic to realize the dynamic control of the box temperature, power supply voltage and clock frequency parameters;

[0013] Use temperature sensors, current sensors and timers to detect the temperature, power supply voltage and clock frequency in the performance evaluation box;

[0014] The detected temperature, supply voltage and clock frequency data are sent to the performance evaluation management platform.

[0015] Further, the environmental parameters in the performance evaluation box are adjusted according to the integrated circuit chip, and various performances of the integrated circuit chip, including power consumption, data transmission rate, clock accuracy and optical transmittance, are tested, including:

[0016] When the environmental parameters in the performance evaluation box are adjusted, the performance evaluation box starts timing, and triggers the logic analyzer test signal after three minutes to test the power consumption of the integrated circuit chip. When the logic analyzer tests multiple power consumption data P1, P2, ..., Pn, n ≥ 3 within 10 minutes and calculates P = (P1 + P2 + ... + Pn) / n, the digital signal processor test signal is triggered;

[0017] The digital signal processor generates digital signals of different frequencies, and the performance evaluation box monitors the corresponding output signals to evaluate the data transmission rate of the chip. When the performance evaluation box obtains multiple data transmission rate data D1, D2, ..., Dn, n ≥ 3 within 10 minutes and calculates D = (D1 + D2 + ... + Dn) / n, it triggers the frequency meter test signal to test the clock accuracy of the integrated circuit chip;

[0018] When the frequency meter tests multiple clock accuracy data T1, T2, ..., Tn, n ≥ 3 within 10 minutes and calculates T = (T1 + T2 + ... + Tn) / n, the optical projector test signal is triggered, and the optical projector starts to detect the optical transmittance O of the integrated circuit chip;

[0019] To test the optical transmittance, the laser wavelength can be adjusted according to the following rules:

[0020]

[0021] Among them, λ A represents the adjusted laser wavelength suitable for the test chip, λ0 represents the original laser wavelength before measurement, α represents the attenuation coefficient, d represents the chip thickness, n represents the refractive index of the chip, and θ represents the incident angle.

[0022] When the optical projector tests multiple optical transmittance data O1, O2, ..., On, n ≥ 3 within 10 minutes and calculates O = (O1 + O2 + ... + On) / n, all performance data are tested, and the performance evaluation box obtains all performance data and outputs them.

[0023] Furthermore, the output power consumption, data transmission rate, clock accuracy and optical transmittance data are processed and analyzed, and an evaluation report is generated and sent to the performance evaluation management platform, including:

[0024] The output power consumption, data transmission rate, clock accuracy and optical transmittance data are processed and analyzed according to the performance evaluation rules. The performance evaluation rules are as follows:

[0025] Integrated circuit chips have multiple working modes, including normal mode, low power mode, standby mode, long delay mode and high performance mode. When the power consumption, data transmission rate, clock accuracy and optical transmittance data are tested according to the different working modes of the integrated circuit chip,

[0026]

[0027] Evaluate the overall performance of the integrated circuit chip, wherein C represents the overall evaluation performance of the integrated circuit chip, wherein Dt, Tt and Ot can be calculated according to the calculation formula of total data transmission rate, total clock accuracy and total optical transmittance, Dt represents the total data transmission rate, Tt represents the total clock accuracy, Ot represents the total optical transmittance, D- represents the average data transmission rate of the integrated circuit chip in various modes, T- represents the average clock accuracy of the integrated circuit chip in various modes, O- represents the average optical transmittance of the integrated circuit chip in various modes, P1 represents the normal mode power consumption, W1 represents the normal mode power consumption weight, P2 represents the low power mode power consumption, W2 represents the low power mode power consumption weight, P3 represents the standby mode power consumption, W3 represents the standby mode power consumption weight, P4 represents the long delay mode power consumption, W4 represents the long delay mode power consumption weight, P5 represents the high performance mode power consumption, W5 represents the high performance mode power consumption weight;

[0028] Then an evaluation report is generated based on the processed data and sent to the performance evaluation management platform.

[0029] Furthermore, D t , T t and O tIt can be calculated according to the total data transmission rate, total clock accuracy and total optical transmittance calculation formula. The total data transmission rate, total clock accuracy and total optical transmittance calculation formula are as follows:

[0030] Dt=DN*W1+DL*W2+DS*W3+DD*W4+DH*W5

[0031] Tt=TN*W1+TL*W2+TS*W3+TD*W4+TH*W5

[0032] Ot=ON*W1+OL*W2+OS*W3+OD*W4+OH*W5

[0033] Among them, D t represents the total data transmission rate, Tt represents the total clock accuracy, Ot represents the total optical transmittance, D N , T N and O N represent the data transmission rate, clock accuracy and optical transmittance in normal mode, respectively, and D L , T L and O L represent the data transmission rate, clock accuracy and optical transmittance in low power mode, respectively. S , T S and O S represent the data transmission rate, clock accuracy and optical transmittance in standby mode, respectively. D , T D and O D represent the data transmission rate, clock accuracy and optical transmittance in long delay mode, respectively. H , T H and O H represent the data transfer rate, clock accuracy, and optical transmittance in high-performance mode, respectively.

[0034] The multi-mode integrated circuit chip performance evaluation system proposed by the present invention comprises:

[0035] An environmental parameter adjustment module is used to dynamically control the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and send the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform;

[0036] A testing module, when the environmental parameters in the performance evaluation box are adjusted according to the working mode of the integrated circuit chip, tests various performances of the integrated circuit chip, including power consumption, data transmission rate, clock accuracy and optical transmittance;

[0037] A processing and analysis module processes and analyzes the output power consumption, data transmission rate, clock accuracy and optical transmittance data, generates an evaluation report, and then sends it to the performance evaluation management platform;

[0038] The display module and the performance evaluation management platform receive the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located, and simultaneously receive the evaluation report, and display it to the user.

[0039] Furthermore, the module for adjusting environmental parameters includes:

[0040] The dynamic control module is used to design the corresponding control logic according to the chip working mode to realize the dynamic control of the temperature, power supply voltage and clock frequency parameters in the box;

[0041] The detection module uses a temperature sensor, a current sensor and a timer to detect the temperature, the power supply voltage and the clock frequency in the performance evaluation box;

[0042] The communication module sends the detected temperature, power supply voltage and clock frequency data to the performance evaluation management platform.

[0043] Furthermore, the test module includes:

[0044] A power consumption test module is used for, when the environmental parameters in the performance evaluation box are adjusted, the performance evaluation box starts timing, triggers a logic analyzer test signal after three minutes, tests the power consumption of the integrated circuit chip, and triggers a digital signal processor test signal when the logic analyzer tests multiple power consumption data P1, P2, ..., Pn, n ≥ 3 within 10 minutes and calculates P = (P1 + P2 + ... + Pn) / n;

[0045] A data transmission rate test module is used for, when the digital signal processor generates digital signals of different frequencies, the performance evaluation box monitors the corresponding output signals to evaluate the data transmission rate of the chip, and when the performance evaluation box obtains multiple data transmission rate data D1, D2, ..., Dn, n ≥ 3 within 10 minutes and calculates D = (D1 + D2 + ... + Dn) / n, it triggers a frequency meter test signal to test the clock accuracy of the integrated circuit chip;

[0046] The clock accuracy test module is used to trigger the optical projector test signal when the frequency meter tests multiple clock accuracy data T1, T2, ..., Tn, n ≥ 3 within 10 minutes and calculates T = (T1 + T2 + ... + Tn) / n, and the optical projector starts to detect the optical transmittance O of the integrated circuit chip;

[0047] The optical transmittance testing module is used to test multiple optical transmittance data O1, O2, ..., On, n ≥ 3 within 10 minutes of the optical projector, and calculate O = (O1 + O2 + ... + On) / n. After that, all performance data are tested, and the performance evaluation box obtains all performance data and outputs them.

[0048] Furthermore, the processing and analysis module includes:

[0049] The performance evaluation module is used to process and analyze the output power consumption, data transmission rate, clock accuracy and optical transmittance data according to the performance evaluation rules. The performance evaluation rules are as follows:

[0050] Integrated circuit chips have multiple working modes, including normal mode, low power mode, standby mode, long delay mode and high performance mode. When the power consumption, data transmission rate, clock accuracy and optical transmittance data are tested according to the different working modes of the integrated circuit chip,

[0051]

[0052] Evaluate the overall performance of the integrated circuit chip, where C represents the overall evaluation performance of the integrated circuit chip, and D t 、T t and O t It can be calculated based on the total data transmission rate, total clock accuracy and total optical transmittance, D t Represents the total data transmission rate, T t Indicates the overall clock accuracy, O t represents the total optical transmittance, Indicates the average data transmission rate of integrated circuit chips in various modes. Indicates the average clock accuracy of the integrated circuit chip in various modes. represents the average optical transmittance of the integrated circuit chip in various modes, P1 represents the normal mode power consumption, W1 represents the normal mode power consumption weight, P2 represents the low power mode power consumption, W2 represents the low power mode power consumption weight, P3 represents the standby mode power consumption, W3 represents the standby mode power consumption weight, P4 represents the long delay mode power consumption, W4 represents the long delay mode power consumption weight, P5 represents the high performance mode power consumption, W5 represents the high performance mode power consumption weight;

[0053] The report generation module is used to generate an evaluation report based on the processed data and send it to the performance evaluation management platform.

[0054] Furthermore, the display module includes:

[0055] An information receiving module is used for the performance evaluation management platform to receive the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located and to synchronously receive the evaluation report;

[0056] The display module is used to display the received temperature, power supply voltage, clock frequency and evaluation report of the performance evaluation box where the integrated circuit chip is located to the user.

[0057] The beneficial effects of the present invention are as follows: according to the working mode of the integrated circuit chip, the parameters such as the temperature, power supply voltage and clock frequency in the performance evaluation box are dynamically adjusted to ensure that the environmental parameters used in the test process meet the actual working conditions of the chip, thereby improving the accuracy of the test data; by performing performance tests on the integrated circuit chip in terms of power consumption, data transmission rate, clock accuracy and optical transmittance, the working state and performance of the chip can be fully understood, and possible problems and defects can be detected so as to make timely adjustments and improvements; the present invention can realize automated testing of the performance of the integrated circuit chip, reduce manual intervention and errors, and greatly improve the test efficiency and accuracy; by processing and analyzing the output test data, a detailed evaluation report can be generated to provide better feedback and guidance for chip designers and manufacturers, so as to discover problems and improve performance as early as possible in the design stage, and reduce the cost of later repairs; by performing a comprehensive performance evaluation on the integrated circuit chip, it can be ensured that the chip meets the specified standards and requirements, improve the quality and reliability of the product, and enhance the market competitiveness of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0058] Figure 1 The multi-mode integrated circuit chip performance evaluation method of the present invention;

[0059] Figure 2 This is the multi-mode integrated circuit chip performance evaluation system described in the present invention. DETAILED DESCRIPTION

[0060] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.

[0061] One embodiment of the present invention is a multi-mode integrated circuit chip performance evaluation method, such as Figure 1 As shown, the method includes:

[0062] Dynamically control the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and send the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform;

[0063] After the environmental parameters in the performance evaluation box are adjusted according to the working mode of the integrated circuit chip, various performances of the integrated circuit chip are tested, including power consumption, data transmission rate, clock accuracy and optical transmittance;

[0064] Processing and analyzing the output power consumption, data transmission rate, clock accuracy and optical transmittance data, generating an evaluation report, and then sending it to the performance evaluation management platform;

[0065] The performance evaluation management platform receives the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located and simultaneously receives the evaluation report.

[0066] The working principle of the above technical solution is as follows: according to the working mode of the integrated circuit chip, the temperature, power supply voltage, clock frequency and other parameters in the performance evaluation box are dynamically controlled, and the detected temperature, power supply voltage, clock frequency and other data are sent to the performance evaluation management platform to ensure that the environmental parameters used in the test process meet the actual working conditions of the chip; according to the adjusted environmental parameters, the integrated circuit chip is subjected to performance tests in multiple aspects such as power consumption, data transmission rate, clock accuracy and optical transmittance to check the working status and performance of the chip, and the test results are output and sent to the performance evaluation management platform; the chip performance test results are processed and analyzed, and a detailed evaluation report is generated, including data in multiple aspects such as power consumption, data transmission rate, clock accuracy and optical transmittance, so as to provide better feedback and guidance for chip designers and manufacturers; the performance evaluation management platform receives parameter data such as temperature, power supply voltage and clock frequency in the performance evaluation box where the integrated circuit chip is located and evaluation report data, integrates them and displays them on a user-friendly interface, so that users can quickly understand the status and results of the chip performance evaluation.

[0067] The effects of the above technical scheme are as follows: according to the working mode of the integrated circuit chip, the temperature, power supply voltage, clock frequency and other parameters in the performance evaluation box are dynamically adjusted to ensure that the environmental parameters used in the test process meet the actual working conditions of the chip, thereby improving the accuracy of the test data; by performing performance tests on the integrated circuit chip in terms of power consumption, data transmission rate, clock accuracy and optical transmittance, the working state and performance of the chip can be fully understood, and possible problems and defects can be detected so as to make timely adjustments and improvements; the present invention can realize automated testing of the performance of the integrated circuit chip, reduce manual intervention and errors, and greatly improve the test efficiency and accuracy; by processing and analyzing the output test data, a detailed evaluation report can be generated to provide better feedback and guidance for chip designers and manufacturers, so as to find problems and improve performance as early as possible in the design stage, and reduce the cost of later repairs; by conducting a comprehensive performance evaluation of the integrated circuit chip, it can be ensured that the chip meets the specified standards and requirements, improve the quality and reliability of the product, and enhance the market competitiveness of the product.

[0068] The multi-mode integrated circuit chip performance evaluation method of this embodiment dynamically controls the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and sends the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform, including:

[0069] According to the chip working mode, design the corresponding control logic to realize the dynamic control of the box temperature, power supply voltage and clock frequency parameters;

[0070] Use temperature sensors, current sensors and timers to detect the temperature, power supply voltage and clock frequency in the performance evaluation box;

[0071] The detected temperature, supply voltage and clock frequency data are sent to the performance evaluation management platform.

[0072] The working principle of the above technical solution is as follows: according to the chip working mode, the corresponding control logic is designed to realize dynamic control of the temperature, power supply voltage and clock frequency parameters in the box. By adjusting the control logic, the test environment can more accurately reflect the actual working conditions of the chip; temperature sensors, current sensors, timers and other equipment are used to detect the temperature, power supply voltage and clock frequency in the performance evaluation box, and the detected data are saved in the embedded system; the embedded system sends the detected temperature, power supply voltage and clock frequency data to the performance evaluation management platform so that users can remotely monitor the performance of the chip and changes in environmental parameters.

[0073] The effect of the above technical solution is: by designing the corresponding control logic according to the chip working mode, the temperature, power supply voltage and clock frequency parameters in the box can be dynamically controlled. This can more accurately reflect the actual working conditions of the chip and improve the accuracy of the test data; sending the detected temperature, power supply voltage and clock frequency data to the performance evaluation management platform helps users understand how the working performance of the chip changes with the change of environmental parameters, and can fully understand the working status and performance of the chip, detect possible problems and defects, so as to make timely adjustments and improvements.

[0074] The multi-mode integrated circuit chip performance evaluation method of this embodiment, when the environmental parameters in the performance evaluation box are adjusted according to the integrated circuit chip, various performances of the integrated circuit chip, including power consumption, data transmission rate, clock accuracy and optical transmittance, are tested, including:

[0075] When the environmental parameters in the performance evaluation box are adjusted, the performance evaluation box starts timing, and triggers the logic analyzer test signal after three minutes to test the power consumption of the integrated circuit chip. When the logic analyzer tests multiple power consumption data P1, P2, ..., Pn, n ≥ 3 within 10 minutes, and calculates P = (P1 + P2 + ... + Pn) / n (when an abnormal value is found, it is eliminated), the digital signal processor test signal is triggered;

[0076] The digital signal processor generates digital signals of different frequencies, and the performance evaluation box monitors the corresponding output signals to evaluate the data transmission rate of the chip. When the performance evaluation box obtains multiple data transmission rate data D1, D2, ..., Dn, n ≥ 3 within 10 minutes and calculates D = (D1 + D2 + ... + Dn) / n (when an abnormal value is found, it is eliminated), the frequency meter test signal is triggered to test the clock accuracy of the integrated circuit chip;

[0077] When the frequency meter tests multiple clock accuracy data T1, T2, ..., Tn, n ≥ 3 within 10 minutes and calculates T = (T1 + T2 + ... + Tn) / n (when an abnormal value is found, it is eliminated), the optical projector test signal is triggered, and the optical projector starts to detect the optical transmittance O of the integrated circuit chip;

[0078] The optical transmittance can be adjusted according to the following rules:

[0079]

[0080] Among them, λ A represents the adjusted laser wavelength suitable for the test chip, λ0 represents the original laser wavelength before measurement, α represents the attenuation coefficient, d represents the chip thickness, n represents the refractive index of the chip, and θ represents the incident angle.

[0081] When the optical projector tests multiple optical transmittance data O1, O2, ..., On, n ≥ 3 within 10 minutes and calculates O = (O1 + O2 + ... + On) / n (when abnormal values ​​are found, they are eliminated), all performance data are tested, and the performance evaluation box obtains all performance data and outputs them.

[0082] The working principle of the above technical solution is that the performance data of the integrated circuit chip tested by each instrument at a certain moment may fluctuate. Calculating the average value using multiple performance data detected can more accurately represent the performance of the integrated circuit chip. At the same time, after the previous instrument completes the detection, the next detection signal is automatically triggered, which can greatly free the hands of the tester.

[0083] The design of the above mathematical model is based on the calculation formula of optical transmittance, and combines the refractive index and thickness of the chip material and the laser incident angle and other parameters. The formula includes an exponential term exp(-αd) to describe the attenuation of light when it propagates inside the chip, where α represents the attenuation coefficient and d represents the thickness of the chip. By adjusting the laser wavelength, it can be better adapted to the characteristics of the chip and reduce the loss of light inside the chip, thereby improving the accuracy of the measurement.

[0084] In addition, the formula also includes a term n*cos(θ), where n represents the refractive index of the chip and θ represents the incident angle of the laser. This parameter is mainly used to correct the reflection and reflection loss of the laser on the chip surface and eliminate the influence of the incident angle on the measurement results. Therefore, by combining these two parameters, more accurate optical transmittance measurement results can be obtained.

[0085] The effects of the above technical solution are: by triggering different test signals, the automatic test of the performance of integrated circuit chips can be realized, manual intervention and errors can be reduced, and the test efficiency and accuracy can be greatly improved; by comprehensively evaluating various performances such as power consumption, data transmission rate, clock accuracy and optical transmittance, the working status and performance of the chip can be fully understood, and possible problems and defects can be detected; through the evaluation and feedback of chip performance, chip designers and manufacturers can be helped to find problems and make improvements early, improve product quality and reliability, and enhance product market competitiveness; by using automated test processes and parallel test technology, the chip performance evaluation can be completed quickly, and the test efficiency and accuracy can be improved. The adjusted laser wavelength can be obtained through the above mathematical model, so that the test results can be more accurate and reliable. In practical applications, by adjusting the laser wavelength to match the characteristics of the chip, the intensity of the transmission signal can be increased, and the reflection and scattering loss of light inside the chip can be reduced. Compared with lasers using only fixed wavelengths, the adjusted laser can better adapt to chips of different materials and structures, and improve the accuracy and reliability of measurements.

[0086] The multi-mode integrated circuit chip performance evaluation method of this embodiment processes and analyzes the output power consumption, data transmission rate, clock accuracy and optical transmittance data, generates an evaluation report, and then sends it to the performance evaluation management platform, including:

[0087] The output power consumption, data transmission rate, clock accuracy and optical transmittance data are processed and analyzed according to the performance evaluation rules. The performance evaluation rules are as follows:

[0088] Integrated circuit chips have multiple working modes, including normal mode, low power mode, standby mode, long delay mode and high performance mode. When the power consumption, data transmission rate, clock accuracy and optical transmittance data are tested according to the different working modes of the integrated circuit chip,

[0089]

[0090] Evaluate the overall performance of the integrated circuit chip, where C represents the overall evaluation performance of the integrated circuit chip, and D t 、T t and O t It can be calculated based on the total data transmission rate, total clock accuracy and total optical transmittance, D t Represents the total data transmission rate, T t Indicates the overall clock accuracy, O t represents the total optical transmittance, Indicates the average data transmission rate of integrated circuit chips in various modes. Indicates the average clock accuracy of the integrated circuit chip in various modes. represents the average optical transmittance of the integrated circuit chip in various modes, P1 represents the normal mode power consumption, W1 represents the normal mode power consumption weight, P2 represents the low power mode power consumption, W2 represents the low power mode power consumption weight, P3 represents the standby mode power consumption, W3 represents the standby mode power consumption weight, P4 represents the long delay mode power consumption, W4 represents the long delay mode power consumption weight, P5 represents the high performance mode power consumption, W5 represents the high performance mode power consumption weight;

[0091] Then an evaluation report is generated based on the processed data and sent to the performance evaluation management platform.

[0092] Suppose we need to evaluate the performance of an integrated circuit called "XYZ chip". The data transfer rate, clock accuracy, and optical transmittance of this chip in different modes are shown in the following table:

[0093] In addition, the power consumption (unit: W) and weight of the chip in different modes are shown in the following table:

[0094] model Power consumption (W) Weight Normal Mode 12 0.4 Low Power Mode 5 0.15 Standby mode 2 0.1 Long delay mode 6 0.15 High performance mode 18 0.2

[0095] According to the above data, calculate Finally, the performance index of "XYZ chip" can be obtained by substituting Dt, Tt, Ot and the performance weights of power consumption into the formula for calculation.

[0096] The working principle and effect of the above technical solution are as follows: The data transmission rate * clock accuracy * optical transmittance is used in the formula because these three indicators are important evaluation indicators for measuring chip performance, and comprehensive consideration can more comprehensively reflect the actual performance of the chip. At the same time, in many application scenarios, these three indicators are also the focus of user concern. The reason for dividing by the sum of power consumption parameters in the formula is that electronic devices usually need to switch between different modes during actual use, such as normal mode, low power mode, standby mode, long delay mode, and high performance mode. In each mode, the device consumes different power consumption. Therefore, by comprehensively calculating the power consumption values ​​in various modes and adjusting them according to the total power consumption weight, the energy efficiency performance and actual value of the chip in actual use can be more accurately reflected.

[0097] This formula is designed to comprehensively and accurately evaluate the performance index of integrated circuit chips, which takes into account the correlation and trade-offs between multiple performance indicators. The formula comprehensively considers multiple performance indicators such as data transmission rate, clock accuracy and optical transmittance, which can more comprehensively reflect the practical value and performance of the chip; the power consumption and weights in different modes are comprehensively considered in the formula to reflect the energy consumption and importance of the chip in actual use, so as to more accurately evaluate the performance of the chip; by unifying various indicators into one dimension and performing comprehensive calculations, it is more convenient to comprehensively analyze and compare chip performance, and at the same time avoid confusion and misunderstanding caused by different units of different indicators; by introducing weight parameters in different modes into the formula, it can be adjusted and optimized according to different application scenarios, needs and design goals, so as to better meet the needs and requirements of different users.

[0098] The multi-mode integrated circuit chip performance evaluation system of this embodiment is as follows: Figure 2 As shown, the system comprises:

[0099] An environmental parameter adjustment module is used to dynamically control the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and send the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform;

[0100] A testing module, when the environmental parameters in the performance evaluation box are adjusted according to the working mode of the integrated circuit chip, tests various performances of the integrated circuit chip, including power consumption, data transmission rate, clock accuracy and optical transmittance;

[0101] A processing and analysis module processes and analyzes the output power consumption, data transmission rate, clock accuracy and optical transmittance data, generates an evaluation report, and then sends it to the performance evaluation management platform;

[0102] The display module and the performance evaluation management platform receive the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located, and simultaneously receive the evaluation report, and display it to the user.

[0103] The working principle of the above technical solution is as follows: according to the working mode of the integrated circuit chip, the temperature, power supply voltage, clock frequency and other parameters in the performance evaluation box are dynamically controlled, and the detected temperature, power supply voltage, clock frequency and other data are sent to the performance evaluation management platform to ensure that the environmental parameters used in the test process meet the actual working conditions of the chip; according to the adjusted environmental parameters, the integrated circuit chip is subjected to performance tests in multiple aspects such as power consumption, data transmission rate, clock accuracy and optical transmittance to check the working status and performance of the chip, and the test results are output and sent to the performance evaluation management platform; the chip performance test results are processed and analyzed, and a detailed evaluation report is generated, including data in multiple aspects such as power consumption, data transmission rate, clock accuracy and optical transmittance, so as to provide better feedback and guidance for chip designers and manufacturers; the performance evaluation management platform receives parameter data such as temperature, power supply voltage and clock frequency in the performance evaluation box where the integrated circuit chip is located and evaluation report data, integrates them and displays them on a user-friendly interface, so that users can quickly understand the status and results of the chip performance evaluation.

[0104] The effects of the above technical scheme are as follows: according to the working mode of the integrated circuit chip, the temperature, power supply voltage, clock frequency and other parameters in the performance evaluation box are dynamically adjusted to ensure that the environmental parameters used in the test process meet the actual working conditions of the chip, thereby improving the accuracy of the test data; by performing performance tests on the integrated circuit chip in terms of power consumption, data transmission rate, clock accuracy and optical transmittance, the working state and performance of the chip can be fully understood, and possible problems and defects can be detected so as to make timely adjustments and improvements; the present invention can realize automated testing of the performance of the integrated circuit chip, reduce manual intervention and errors, and greatly improve the test efficiency and accuracy; by processing and analyzing the output test data, a detailed evaluation report can be generated to provide better feedback and guidance for chip designers and manufacturers, so as to find problems and improve performance as early as possible in the design stage, and reduce the cost of later repairs; by conducting a comprehensive performance evaluation of the integrated circuit chip, it can be ensured that the chip meets the specified standards and requirements, improve the quality and reliability of the product, and enhance the market competitiveness of the product.

[0105] In the multi-mode integrated circuit chip performance evaluation system of the present embodiment, the module for adjusting environmental parameters includes:

[0106] The dynamic control module is used to design the corresponding control logic according to the chip working mode to realize the dynamic control of the temperature, power supply voltage and clock frequency parameters in the box;

[0107] The detection module uses a temperature sensor, a current sensor and a timer to detect the temperature, the power supply voltage and the clock frequency in the performance evaluation box;

[0108] The communication module sends the detected temperature, power supply voltage and clock frequency data to the performance evaluation management platform.

[0109] In the multi-mode integrated circuit chip performance evaluation system of this embodiment, the test module includes:

[0110] A power consumption test module is used for, when the environmental parameters in the performance evaluation box are adjusted, the performance evaluation box starts timing, triggers a logic analyzer test signal after three minutes, tests the power consumption of the integrated circuit chip, and triggers a digital signal processor test signal when the logic analyzer tests multiple power consumption data P1, P2, ..., Pn, n ≥ 3 within 10 minutes and calculates P = (P1 + P2 + ... + Pn) / n;

[0111] A data transmission rate test module is used for, when the digital signal processor generates digital signals of different frequencies, the performance evaluation box monitors the corresponding output signals to evaluate the data transmission rate of the chip, and when the performance evaluation box obtains multiple data transmission rate data D1, D2, ..., Dn, n ≥ 3 within 10 minutes and calculates D = (D1 + D2 + ... + Dn) / n, it triggers a frequency meter test signal to test the clock accuracy of the integrated circuit chip;

[0112] The clock accuracy test module is used to trigger the optical projector test signal when the frequency meter tests multiple clock accuracy data T1, T2, ..., Tn, n ≥ 3 within 10 minutes and calculates T = (T1 + T2 + ... + Tn) / n, and the optical projector starts to detect the optical transmittance O of the integrated circuit chip;

[0113] The optical transmittance testing module is used to test multiple optical transmittance data O1, O2, ..., On, n ≥ 3 within 10 minutes of the optical projector, and calculate O = (O1 + O2 + ... + On) / n. After that, all performance data are tested, and the performance evaluation box obtains all performance data and outputs them.

[0114] The working principle of the above technical solution is: the performance data of the integrated circuit chip tested by each instrument at a certain moment may fluctuate. Calculating the average value using multiple performance data detected can more accurately represent the performance of the integrated circuit chip. At the same time, after the previous instrument completes the detection, it automatically triggers the next detection signal, which can greatly free the hands of the tester.

[0115] The effects of the above technical solutions are as follows: by triggering different test signals, the automatic testing of integrated circuit chip performance can be realized, human intervention and errors can be reduced, and the test efficiency and accuracy can be greatly improved; by comprehensively evaluating various performances such as power consumption, data transmission rate, clock accuracy and optical transmittance, the working status and performance of the chip can be fully understood, and possible problems and defects can be detected; through the evaluation and feedback of chip performance, chip designers and manufacturers can be helped to discover problems early and make improvements, improve product quality and reliability, and enhance product market competitiveness; by using automated testing processes and parallel testing technology, the evaluation of chip performance can be completed quickly, and the test efficiency and accuracy can be improved.

[0116] In the multi-mode integrated circuit chip performance evaluation system of this embodiment, the processing and analysis module includes:

[0117] The performance evaluation module is used to process and analyze the output power consumption, data transmission rate, clock accuracy and optical transmittance data according to the performance evaluation rules. The performance evaluation rules are as follows:

[0118] Integrated circuit chips have multiple working modes, including normal mode, low power mode, standby mode, long delay mode and high performance mode. When the power consumption, data transmission rate, clock accuracy and optical transmittance data are tested according to the different working modes of the integrated circuit chip,

[0119]

[0120] Evaluate the overall performance of the integrated circuit chip, where C represents the overall evaluation performance of the integrated circuit chip, and D t , T t and O t It can be calculated based on the total data transmission rate, total clock accuracy and total optical transmittance, D t Represents the total data transmission rate, T t Indicates the overall clock accuracy, O t represents the total optical transmittance, Indicates the average data transmission rate of integrated circuit chips in various modes. Indicates the average clock accuracy of the integrated circuit chip in various modes. represents the average optical transmittance of the integrated circuit chip in various modes, P1 represents the normal mode power consumption, W1 represents the normal mode power consumption weight, P2 represents the low power mode power consumption, W2 represents the low power mode power consumption weight, P3 represents the standby mode power consumption, W3 represents the standby mode power consumption weight, P4 represents the long delay mode power consumption, W4 represents the long delay mode power consumption weight, P5 represents the high performance mode power consumption, W5 represents the high performance mode power consumption weight;

[0121] The report generation module is used to generate an evaluation report based on the processed data and send it to the performance evaluation management platform.

[0122] The working principle and effect of the above technical solution are as follows: The data transmission rate * clock accuracy * optical transmittance is used in the formula because these three indicators are important evaluation indicators for measuring chip performance, and comprehensive consideration can more comprehensively reflect the actual performance of the chip. At the same time, in many application scenarios, these three indicators are also the focus of user concern. The reason for dividing by the sum of power consumption parameters in the formula is that electronic devices usually need to switch between different modes during actual use, such as normal mode, low power mode, standby mode, long delay mode, and high performance mode. In each mode, the device consumes different power consumption. Therefore, by comprehensively calculating the power consumption values ​​in various modes and adjusting them according to the total power consumption weight, the energy efficiency performance and actual value of the chip in actual use can be more accurately reflected.

[0123] This formula is designed to comprehensively and accurately evaluate the performance index of integrated circuit chips, which takes into account the correlation and trade-offs between multiple performance indicators. The formula comprehensively considers multiple performance indicators such as data transmission rate, clock accuracy and optical transmittance, which can more comprehensively reflect the practical value and performance of the chip; the power consumption and weights in different modes are comprehensively considered in the formula to reflect the energy consumption and importance of the chip in actual use, so as to more accurately evaluate the performance of the chip; by unifying various indicators into one dimension and performing comprehensive calculations, it is more convenient to comprehensively analyze and compare chip performance, and at the same time avoid confusion and misunderstanding caused by different units of different indicators; by introducing weight parameters in different modes into the formula, it can be adjusted and optimized according to different application scenarios, needs and design goals, so as to better meet the needs and requirements of different users.

[0124] In the multi-mode integrated circuit chip performance evaluation system of this embodiment, the display module includes:

[0125] An information receiving module is used for the performance evaluation management platform to receive the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located and to synchronously receive the evaluation report;

[0126] The display module is used to display the received temperature, power supply voltage, clock frequency and evaluation report of the performance evaluation box where the integrated circuit chip is located to the user.

[0127] The above technical solution is a performance evaluation management platform, which is used to receive the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located, and synchronously receive the evaluation report. The solution includes an information receiving module and a display module. Its working principle is as follows: the integrated circuit chip is placed in the performance evaluation box for testing, and the temperature, power supply voltage and clock frequency and other parameters of the chip are measured during the test; the information receiving module monitors the temperature, power supply voltage and clock frequency and other parameters in real time through sensors or other related equipment, and transmits these parameters to the performance evaluation management platform; at the same time, the evaluation report will also be transmitted to the performance evaluation management platform; the display module displays the received temperature, power supply voltage and clock frequency as well as the evaluation report to the user, and the user can view and analyze the performance data and evaluation report of the integrated circuit chip at any time.

[0128] The effects of this technical solution are: real-time monitoring of chip parameters such as temperature, power supply voltage and clock frequency to ensure the accuracy of test data; timely collection of evaluation reports, comprehensive evaluation of chip performance, and providing users with the most intuitive chip performance data; the display module can display the chip's performance parameters and evaluation reports to users, facilitating users to conduct comparative analysis and improve the accuracy and reliability of chip performance evaluation.

[0129] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A multi-mode integrated circuit chip performance evaluation method, characterized in that: The method comprises: Dynamically control the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and send the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform; After the environmental parameters in the performance evaluation box are adjusted according to the working mode of the integrated circuit chip, various performances of the integrated circuit chip are tested, including power consumption, data transmission rate, clock accuracy and optical transmittance; Processing and analyzing the output power consumption, data transmission rate, clock accuracy and optical transmittance data, generating an evaluation report, and then sending it to the performance evaluation management platform; The performance evaluation management platform receives the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located, and simultaneously receives the evaluation report, and displays it to the user.

2. The multi-mode integrated circuit chip performance evaluation method according to claim 1, characterized in that: Dynamically control the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and send the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform, including: According to the chip working mode, design the corresponding control logic to realize the dynamic control of the box temperature, power supply voltage and clock frequency parameters; Use temperature sensors, current sensors and timers to detect the temperature, power supply voltage and clock frequency in the performance evaluation box; The detected temperature, supply voltage and clock frequency data are sent to the performance evaluation management platform.

3. The multi-mode integrated circuit chip performance evaluation method according to claim 1, characterized in that: When the environmental parameters in the performance evaluation box are adjusted according to the integrated circuit chip, various performances of the integrated circuit chip, including power consumption, data transmission rate, clock accuracy and optical transmittance, are tested, including: When the environmental parameters in the performance evaluation box are adjusted, the performance evaluation box starts timing, and triggers the logic analyzer test signal after three minutes to test the power consumption of the integrated circuit chip. When the logic analyzer tests multiple power consumption data P1, P2, ..., Pn, n ≥ 3 within 10 minutes, and calculates After that, trigger the digital signal processor test signal; The digital signal processor generates digital signals of different frequencies, and the performance evaluation box monitors the corresponding output signals to evaluate the data transmission rate of the chip. When the performance evaluation box obtains multiple data transmission rate data D1, D2, ..., Dn, n ≥ 3 within 10 minutes, and calculates After that, the frequency meter test signal is triggered to test the clock accuracy of the integrated circuit chip; When the frequency meter tests multiple clock accuracy data T1, T2, ..., Tn, n ≥ 3 within 10 minutes, and calculates After that, the optical projector test signal is triggered, and the optical projector starts to detect the optical transmittance O of the integrated circuit chip. To test the optical transmittance, adjust the laser wavelength according to the following rules: Among them, λ A represents the adjusted laser wavelength suitable for the test chip, λ0 represents the original laser wavelength before measurement, α represents the attenuation coefficient, d represents the chip thickness, n represents the refractive index of the chip, and θ represents the laser incident angle; When the optical projector tests multiple optical transmittance data O1, O2, ..., On, n ≥ 3 within 10 minutes and calculates O = (O1 + O2 + ... + On) / n, all performance data are tested, and the performance evaluation box obtains all performance data and outputs them.

4. The multi-mode integrated circuit chip performance evaluation method according to claim 1, characterized in that: Processing and analyzing the output power consumption, data transmission rate, clock accuracy and optical transmittance data, and generating an evaluation report, which is then sent to the performance evaluation management platform, including: The output power consumption, data transmission rate, clock accuracy and optical transmittance data are processed and analyzed according to the performance evaluation rules. The performance evaluation rules are as follows: Integrated circuit chips have multiple working modes, including normal mode, low power mode, standby mode, long delay mode and high performance mode. When the power consumption, data transmission rate, clock accuracy and optical transmittance data are tested according to the different working modes of the integrated circuit chip, Evaluate the overall performance of the integrated circuit chip, where C represents the overall evaluation performance of the integrated circuit chip, and D t , T t and O t It can be calculated based on the total data transmission rate, total clock accuracy and total optical transmittance, D t Represents the total data transmission rate, T t Indicates the overall clock accuracy, O t represents the total optical transmittance, Indicates the average data transmission rate of integrated circuit chips in various modes. Indicates the average clock accuracy of the integrated circuit chip in various modes. represents the average optical transmittance of the integrated circuit chip in various modes, P1 represents the normal mode power consumption, W1 represents the normal mode power consumption weight, P2 represents the low power mode power consumption, W2 represents the low power mode power consumption weight, P3 represents the standby mode power consumption, W3 represents the standby mode power consumption weight, P4 represents the long delay mode power consumption, W4 represents the long delay mode power consumption weight, P5 represents the high performance mode power consumption, W5 represents the high performance mode power consumption weight; Then an evaluation report is generated based on the processed data and sent to the performance evaluation management platform.

5. The multi-mode integrated circuit chip performance evaluation method according to claim 4, characterized in that: D t , T t and O t It can be calculated according to the total data transmission rate, total clock accuracy and total optical transmittance calculation formula. The total data transmission rate, total clock accuracy and total optical transmittance calculation formula are as follows: D t =D N *W1+D L *W2+D S *W3+D D *W4+D H *W5 T t =T N *W1+T L *W2+T S *W3+T D *W4+T H *W5 O t＝ O N *W1+O L *W2+O S *W3+O D *W4+O H *W5 Among them, D t represents the total data transmission rate, Tt represents the total clock accuracy, Ot represents the total optical transmittance, D N , T N and O N represent the data transmission rate, clock accuracy and optical transmittance in normal mode, respectively, and D L , T L and O L represent the data transmission rate, clock accuracy and optical transmittance in low power mode, respectively. S , T S and O S represent the data transmission rate, clock accuracy and optical transmittance in standby mode, respectively. D , T D and O D represent the data transmission rate, clock accuracy and optical transmittance in long delay mode, respectively. H , T H and O H represent the data transfer rate, clock accuracy, and optical transmittance in high-performance mode, respectively.

6. A multi-mode integrated circuit chip performance evaluation system, characterized in that: The system comprises: An environmental parameter adjustment module is used to dynamically control the temperature, power supply voltage and clock frequency parameters of the performance evaluation box environment where the integrated circuit chip is located according to the working mode of the integrated circuit chip, and send the detected temperature, power supply voltage and clock frequency in the performance evaluation box to the performance evaluation management platform; A testing module, when the environmental parameters in the performance evaluation box are adjusted according to the working mode of the integrated circuit chip, tests various performances of the integrated circuit chip, including power consumption, data transmission rate, clock accuracy and optical transmittance; A processing and analysis module processes and analyzes the output power consumption, data transmission rate, clock accuracy and optical transmittance data, generates an evaluation report, and then sends it to the performance evaluation management platform; The display module and the performance evaluation management platform receive the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located, and simultaneously receive the evaluation report, and display it to the user.

7. The multi-mode integrated circuit chip performance evaluation system according to claim 6, characterized in that: The environmental parameter adjustment module includes: The dynamic control module is used to design the corresponding control logic according to the chip working mode to realize the dynamic control of the temperature, power supply voltage and clock frequency parameters in the box; The detection module uses a temperature sensor, a current sensor and a timer to detect the temperature, the power supply voltage and the clock frequency in the performance evaluation box; The communication module sends the detected temperature, power supply voltage and clock frequency data to the performance evaluation management platform.

8. The multi-mode integrated circuit chip performance evaluation system according to claim 6, characterized in that: The test module includes: A power consumption test module is used for, when the environmental parameters in the performance evaluation box are adjusted, the performance evaluation box starts timing, triggers a logic analyzer test signal after three minutes, tests the power consumption of the integrated circuit chip, and triggers a digital signal processor test signal when the logic analyzer tests multiple power consumption data P1, P2, ..., Pn, n ≥ 3 within 10 minutes and calculates P = (P1 + P2 + ... + Pn) / n; A data transmission rate test module is used for, when the digital signal processor generates digital signals of different frequencies, the performance evaluation box monitors the corresponding output signals to evaluate the data transmission rate of the chip, and when the performance evaluation box obtains multiple data transmission rate data D1, D2, ..., Dn, n ≥ 3 within 10 minutes and calculates D = (D1 + D2 + ... + Dn) / n, it triggers a frequency meter test signal to test the clock accuracy of the integrated circuit chip; The clock accuracy test module is used to trigger the optical projector test signal when the frequency meter tests multiple clock accuracy data T1, T2, ..., Tn, n ≥ 3 within 10 minutes and calculates T = (T1 + T2 + ... + Tn) / n, and the optical projector starts to detect the optical transmittance O of the integrated circuit chip; The optical transmittance testing module is used to test multiple optical transmittance data O1, O2, ..., On, n ≥ 3 within 10 minutes of the optical projector, and calculate O = (O1 + O2 + ... + On) / n. After that, all performance data are tested, and the performance evaluation box obtains all performance data and outputs them.

9. The multi-mode integrated circuit chip performance evaluation system according to claim 6, characterized in that: The processing and analysis module comprises: The performance evaluation module is used to process and analyze the output power consumption, data transmission rate, clock accuracy and optical transmittance data according to the performance evaluation rules. The performance evaluation rules are as follows: Integrated circuit chips have multiple working modes, including normal mode, low power mode, standby mode, long delay mode and high performance mode. When the power consumption, data transmission rate, clock accuracy and optical transmittance data are tested according to the different working modes of the integrated circuit chip, Evaluate the overall performance of the integrated circuit chip, where C represents the overall evaluation performance of the integrated circuit chip, and D t , T t and O t It can be calculated based on the total data transmission rate, total clock accuracy and total optical transmittance, D t Represents the total data transmission rate, T t Indicates the overall clock accuracy, O t represents the total optical transmittance, Indicates the average data transmission rate of integrated circuit chips in various modes. Indicates the average clock accuracy of the integrated circuit chip in various modes. represents the average optical transmittance of the integrated circuit chip in various modes, P1 represents the normal mode power consumption, W1 represents the normal mode power consumption weight, P2 represents the low power mode power consumption, W2 represents the low power mode power consumption weight, P3 represents the standby mode power consumption, W3 represents the standby mode power consumption weight, P4 represents the long delay mode power consumption, W4 represents the long delay mode power consumption weight, P5 represents the high performance mode power consumption, W5 represents the high performance mode power consumption weight; The report generation module is used to generate an evaluation report based on the processed data and send it to the performance evaluation management platform.

10. The multi-mode integrated circuit chip performance evaluation system according to claim 6, characterized in that: The display module comprises: An information receiving module is used for the performance evaluation management platform to receive the temperature, power supply voltage and clock frequency parameters in the performance evaluation box where the integrated circuit chip is located and to synchronously receive the evaluation report; The display module is used to display the received temperature, power supply voltage, clock frequency and evaluation report of the performance evaluation box where the integrated circuit chip is located to the user.

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