Pressure instrument performance testing device and testing method

Abstract

The invention discloses a pressure instrument performance testing device and a testing method. The testing device comprises a pressure pipeline, a standard pressure source, constant temperature equipment, a gas buffer, a pressure generator, a high-temperature box, a high-temperature cavity, a pressure sensor, a pressure transmitter and a data acquisition module. The pressure pipeline comprises a first pipe section and a second pipe section, the first end of the first pipe section is connected with the standard pressure source, and the second end of the first pipe section is connected with the gas buffer after passing through the thermostatic equipment; the high-temperature cavity is arranged in the high-temperature box, and a closed isolation cavity is arranged between the high-temperature box and the high-temperature cavity; the first end of the second pipe section is connected with the gas buffer, and the second end of the second pipe section is connected with the high-temperature cavity; the pressure generator is connected with the gas buffer; the pressure sensor is arranged on the high-temperature cavity; the pressure transmitter is arranged in the isolation cavity and is connected with the pressure sensor; the data acquisition module is used for acquiring data. The technical effect of testing the metering performance of the pressure instrument under the high-temperature working condition is achieved.

Description

Technical Field

[0001] The present invention relates to the field of sensor detection technology, and in particular to a pressure instrument performance testing device and a testing method. Background Art

[0002] Pressure detection is actually the pressure detection in the physical concept, that is, the force acting vertically on a unit area. Pressure is one of the important parameters in industrial production. The accuracy of pressure detection in some key scenarios is a necessary condition to ensure safety. A large number of pressure instruments are used in aerospace, petroleum and petrochemical, automobile and other fields. Most of their actual working conditions are relatively harsh, especially high temperature environments are the most common. Taking the aerospace field as an example, it is used to monitor and evaluate its operating status. The combustion chamber outlet temperature reaches 500°C and the lubricating oil system temperature reaches 200°C; the temperature in the oil extraction industry reaches 200°C; the temperature in the thermal power and nuclear power fields reaches 600°C; the saturated steam temperature in the chemical industry reaches 250°C; the high-temperature sterilization temperature in medical and food reaches 150°C.

[0003] Normally, under high temperature conditions, the force sensor and the pressure transmitter are divided into two parts and connected by wires. The whole is collectively referred to as a pressure instrument below. As a pressure sensitive element, the pressure sensor has a pressure sensing surface that is directly in contact with the high temperature medium, converting the physical quantity of pressure into an electrical signal. The pressure transmitter processes the electrical signal converted by the pressure sensor and converts it into a standard analog signal commonly used in the industry, such as (4~20)mA, 0~5V, or a digital signal, for local display or remote transmission. Taking the measurement of the pressure in a high temperature pressure vessel as an example, the usual measurement method is to connect the pressure sensor to the pressure vessel through a thread or a pressure pipe. The pressure sensing surface of the pressure sensor is in direct contact with the high temperature medium in the pressure vessel, and the temperature reaches 500°C. The pressure sensor body and the transmitter are in the use environment, and the temperature is relatively low.

[0004] The pressure sensor is equipped with sensitive elements, which convert the pressure value into raw electrical signals and transmit them to the pressure transmitter. The pressure transmitter processes the electrical signals by methods and filtering, and then converts them into standard signals commonly used in the industry, such as (4~20)mA, 0~5V, etc. The final measurement result is output by the pressure transmitter as a standard signal.

[0005] Since the set value plays an important role in the output of the pressure instrument, in order to ensure the accurate measurement of the pressure sensor and transmitter, metrological calibration is an important means. At present, there is no official national standard or procedure specification and method for the evaluation method of the metrological performance of pressure instruments under high temperature conditions in China and abroad. The common problem with the detection method of pressure instruments used under high temperature conditions is "normal temperature detection, high temperature use". Due to the lack of a performance evaluation method for pressure instruments under working conditions, the performance of pressure instruments cannot be evaluated when it exceeds the scope of existing technical regulations. Summary of the invention

[0006] The main purpose of the present invention is to provide a pressure instrument performance testing device to solve the problem that the related technology lacks a pressure instrument performance evaluation method under working conditions and the metering performance of the pressure instrument cannot be evaluated under high temperature conditions.

[0007] In order to achieve the above-mentioned object, the present invention provides a pressure instrument performance test device, comprising: a pressure pipeline, a standard pressure source, a constant temperature device, a gas buffer, a pressure generator, a high temperature box, a high temperature chamber, a pressure sensor, a pressure transmitter and a data acquisition module; The pressure pipeline comprises a first pipe section and a second pipe section, the first end of the first pipe section is connected to the standard pressure source, and the second end of the first pipe section is connected to the gas buffer after passing through the constant temperature device; The high temperature chamber is arranged in the high temperature box, the temperature in the high temperature chamber is adjustable, and there is a closed isolation chamber between the high temperature box and the high temperature chamber, the temperature in the isolation chamber is adjustable; The first end of the second pipe segment is connected to the gas buffer, and the second end of the second pipe segment is connected to the high temperature chamber; The pressure generator is connected to the gas buffer; The pressure sensor is arranged on the high temperature chamber, and the pressure sensing surface of the pressure sensor is in contact with the medium in the high temperature chamber; The pressure transmitter is arranged in the isolation chamber and connected to the pressure sensor; The data acquisition module is used to collect data from the standard pressure source, the pressure generator and the pressure transmitter.

[0008] Furthermore, it also includes a first temperature sensor, a second temperature sensor, a third temperature sensor, a fourth temperature sensor, a fifth temperature sensor and a sixth temperature sensor electrically connected to the data acquisition module; The first temperature sensor is used to detect the temperature of a portion of the first pipe segment located between the standard pressure source and the constant temperature device; The second temperature sensor is used to detect the temperature in the constant temperature device; The third temperature sensor is used to detect the temperature of the portion of the first pipe section located between the constant temperature device and the gas buffer; The fourth temperature sensor is used to detect the temperature of the portion of the second pipe section located between the gas buffer and the high temperature box; The fifth temperature sensor is used to detect the temperature in the isolation cavity; The sixth temperature sensor is used to detect the temperature in the high temperature chamber.

[0009] Furthermore, the first pipe section includes a bellows, and the bellows is located in the constant temperature device and is kept at a constant temperature by the constant temperature device.

[0010] Furthermore, the constant temperature device includes a constant temperature water tank, and the bellows section is located in the constant temperature water tank.

[0011] Furthermore, it also includes a control valve, which is arranged on the gas buffer, and the control valve is electrically connected to the data acquisition module, and the opening and closing of the control valve is controlled by the data acquisition module.

[0012] Furthermore, a first temperature control component is provided in the high temperature box, and the first temperature control component is used to control the temperature in the isolation cavity; A second temperature control component is arranged in the high temperature cavity, and the second temperature control component is used to control the temperature in the high temperature cavity.

[0013] According to another aspect of the present invention, a pressure instrument performance testing method is provided, which uses the above-mentioned pressure instrument performance testing device and includes the following steps: S100, controlling the temperature in the high temperature chamber to a first temperature value T 6 , the temperature in the isolation chamber is controlled at a second temperature value T 5 , where 200℃≤T 6 ≤500℃, 20℃≤T 5 ≤90℃; S200, setting a target pressure value, charging the gas medium to be measured into the gas buffer through the pressure generator, so that the first pipe section and the second pipe section are filled with the gas medium to be measured, and when the pressure values ​​in the first pipe section and the second pipe section are close to the target pressure value, closing the pressure generator; S300, controlling the temperature of the gas medium to be measured passing through the constant temperature device at T 2 , 15℃≤T 2 ≤25℃; S400, fine-tuning the pressure values ​​in the first pipe segment and the second pipe segment by using the standard pressure source, so that the pressure value obtained by the standard pressure source reaches the target pressure value; S500, obtaining a measured pressure value output by the pressure transmitter; S600: Determine an error value between the first measured pressure value and the target pressure value based on the target pressure value and the measured pressure value.

[0014] S700: Use the target pressure value, the first temperature value, and the second temperature value as unique variables of a test condition, respectively, to obtain an error value between the first measured pressure value and the target pressure value under multiple test conditions.

[0015] Furthermore, it also includes: S800: Determine whether the pressure sensor meets the measurement performance requirements according to the error value; if not, S900, performing curve fitting based on the measured pressure value and the target pressure value, and determining a correction method based on the curve fitting result; S1000. Correct the pressure transmitter based on the correction method so that the pressure value error output by the pressure transmitter meets the measurement performance requirement.

[0016] Furthermore, it also includes: S1100. Use the modified pressure transmitter to execute S100-S800. If yes, end the performance test.

[0017] Furthermore, before executing step S400, the method further includes: Acquire detection temperature values ​​detected by the first temperature sensor, the second temperature sensor, the third temperature sensor, the fourth temperature sensor, the fifth temperature sensor, and the sixth temperature sensor; Based on the detected temperature value, determine whether the temperature of each part of the test device meets the test requirements, and if so, execute step S400; If not, the test device is inspected and debugged.

[0018] In the embodiment of the present invention, a pressure pipeline, a standard pressure source, a constant temperature device, a gas buffer, a pressure generator, a high temperature box, a high temperature chamber, a pressure sensor, a pressure transmitter and a data acquisition module are provided; the pressure pipeline comprises a first pipe section and a second pipe section, the first end of the first pipe section is connected to the standard pressure source, and the second end of the first pipe section is connected to the gas buffer after passing through the constant temperature device; the high temperature chamber is arranged in the high temperature box, the temperature in the high temperature chamber is adjustable, and a closed isolation chamber is provided between the high temperature box and the high temperature chamber, and the temperature in the isolation chamber is adjustable; the first end of the second pipe section is connected to the gas buffer, and the second end of the second pipe section is connected to the high temperature chamber; the pressure generator is connected to the gas buffer; the pressure sensor is arranged on the high temperature chamber, and the pressure sensing surface of the pressure sensor is in contact with the medium in the high temperature chamber; the pressure transmitter It is arranged in the isolation cavity and connected to the pressure sensor; the data acquisition module is used to collect data from the standard pressure source, the pressure generator and the pressure transmitter, so as to control the temperature of the high-temperature cavity and the high-temperature box during the detection process, establish the test condition of the high-temperature medium for the pressure sensor and the pressure transmitter, and at the same time control the temperature of the constant temperature equipment to establish the test condition of the normal temperature medium for the standard pressure source, thereby realizing the technical effect of being able to compare the pressure value detected by the standard pressure source with the pressure value output by the pressure transmitter under the high-temperature medium condition to evaluate the metering performance of the pressure instrument under the high-temperature condition, thereby solving the problem in the related technology that there is a lack of a performance evaluation method for the pressure instrument under the working environment, and the metering performance of the pressure instrument cannot be evaluated under the high-temperature condition. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The accompanying drawings constituting a part of the present invention are used to provide a further understanding of the present invention, so that other features, purposes and advantages of the present invention become more obvious. The accompanying drawings of the exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the accompanying drawings: Figure 1 is a schematic diagram of the layout of a test device according to an embodiment of the present invention; Among them, 1 is the first pipe section, 2 is the gas buffer, 3 is the pressure generator, 4 is the high temperature box, 5 is the isolation chamber, 6 is the pressure sensor, 7 is the pressure transmitter, 8 is the control valve, 9 is the constant temperature device, 10 is the standard pressure source, 11 is the data acquisition module, 12 is the first temperature sensor, 13 is the second temperature sensor, 14 is the third temperature sensor, 15 is the fourth temperature sensor, 16 is the second pipe section, 17 is the fifth temperature sensor, 18 is the sixth temperature sensor, and 19 is the high temperature chamber. DETAILED DESCRIPTION

[0020] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0021] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged under appropriate circumstances to facilitate the embodiments of the present invention described herein.

[0022] In the present invention, the directions or positional relationships indicated by the terms "upper", "lower", "inner", etc. are based on the directions or positional relationships shown in the drawings. These terms are mainly used to better describe the present invention and its embodiments, and are not used to limit the indicated devices, elements or components to have a specific direction, or to be constructed and operated in a specific direction.

[0023] In addition, some of the above terms may be used to express other meanings in addition to indicating orientation or positional relationship. For example, the term "on" may also be used to express a certain dependency or connection relationship in some cases. For those skilled in the art, the specific meanings of these terms in the present invention can be understood according to specific circumstances.

[0024] In addition, the terms "disposed", "provided with", "connected", "fixed" and the like should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or an integral structure; it can be a mechanical connection, or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be an internal connection between two devices, elements or components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0025] In addition, the term "plurality" shall mean two or more.

[0026] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0027] To solve relevant technical problems, such as Figure 1As shown, an embodiment of the present invention provides a pressure instrument performance test device, including: a pressure pipeline, a standard pressure source 10, a constant temperature device 9, a gas buffer 2, a pressure generator 3, a high temperature box 4, a high temperature chamber 19, a pressure sensor 6, a pressure transmitter 7 and a data acquisition module 11; The pressure pipeline includes a first pipe section 1 and a second pipe section 16, wherein the first end of the first pipe section 1 is connected to a standard pressure source 10, and the second end of the first pipe section 1 is connected to a gas buffer 2 after passing through a constant temperature device 9; The high temperature chamber 19 is arranged in the high temperature box 4, the temperature in the high temperature chamber 19 is adjustable, and there is a closed isolation chamber 5 between the high temperature box 4 and the high temperature chamber 19, the temperature in the isolation chamber 5 is adjustable; A first end of the second pipe section 16 is connected to the gas buffer 2, and a second end of the second pipe section 16 is connected to the high temperature chamber 19; The pressure generator 3 is connected to the gas buffer 2; The pressure sensor 6 is disposed on the high temperature chamber 19, and the pressure sensing surface of the pressure sensor 6 is in contact with the medium in the high temperature chamber 19; The pressure transmitter 7 is arranged in the isolation chamber 5 and connected to the pressure sensor 6; The data acquisition module 11 is used to acquire data from the standard pressure source 10 , the pressure generator 3 and the pressure transmitter 7 .

[0028] like Figure 1 As shown, in this embodiment, the standard pressure source 10, the first pipe section 1, the gas buffer 2, the second pipe section 16 and the high temperature chamber 19 are connected in sequence, the high temperature chamber 19 is arranged in the high temperature box 4, the pressure generator 3 is connected to the gas buffer 2, the first pipe section 1 passes through the constant temperature device 9, the pressure sensor 6 is connected to the high temperature chamber 19, there is a closed isolation chamber 5 between the high temperature box 4 and the high temperature chamber 19, and the pressure transmitter 7 is placed in the isolation chamber 5. In this embodiment, the constant temperature device 9 as an independent temperature control device can control the temperature of the medium passing through the constant temperature device 9 at room temperature, the high temperature chamber 19 and the high temperature box 4 can both be independently temperature controlled, wherein the high temperature chamber 19 can pass the medium after being connected to the second pipe section 16, and the high temperature working condition can be simulated through the high temperature chamber 19, providing a high temperature environment for the pressure sensing surface of the pressure sensor 6.

[0029] In one embodiment, the temperature range of the high temperature chamber 19 can be adjusted within the range of 50°C to 500°C. The high temperature box 4 can control the temperature in the isolation chamber 5, thereby simulating the actual working environment of the pressure instrument, wherein the pressure sensor 6, except for the pressure sensing surface which is in the high temperature working condition in the high temperature chamber 19, the rest of the pressure sensor 6 and the pressure transmitter 7 are in the environment simulated by the high temperature box 4 (i.e., in the isolation chamber 5). In one embodiment, the temperature of the isolation chamber 5 can be adjusted within the range of room temperature to 85°C.

[0030] In this embodiment, the test device can detect the metering performance of the pressure sensor 6 and the pressure transmitter 7 under high temperature conditions. Specifically, during the test process, the temperature of the high temperature chamber 19, the isolation chamber 5 and the constant temperature device 9 can be controlled at the set temperature by controlling the temperature of the high temperature chamber 19, the high temperature box 4 and the constant temperature device 9. For example, the temperature in the high temperature chamber 19 is controlled at 300°C, the temperature of the isolation chamber 5 is controlled at 50°C, and the temperature of the constant temperature device 9 is controlled at 20°C. Then, the gas medium is introduced into the gas buffer 2 through the pressure generator 3, and the gas medium enters the first pipe section 1 and the second pipe section 16 through the gas buffer 2. When the gas pressure value in the pipe section is close to the set target pressure value, the pressure generator 3 can be turned off, and the pressure value in the pipe section can be fine-tuned to the target pressure value, such as 6MPa, through the standard pressure source 10. At this time, the temperature of the medium in the high temperature chamber 19 is about 300°C, the temperature of the medium passing through the constant temperature device 9 is about 20°C, and the ambient temperature of the pressure transmitter 7 is about 50°C. The pressure value output by the pressure transmitter 7 and the pressure value output by the standard pressure source 10 can be read through the data acquisition module 11, and the metering performance of the pressure sensor 6 and the pressure transmitter 7 under the current working condition can be evaluated by comparing the two pressure values.

[0031] It is understandable that the above specific numerical descriptions of the high temperature chamber 19, the isolation chamber 5, the constant temperature device 9 and the target pressure value are not restrictive, and those skilled in the art can set them according to the actual detection standard. In addition, during the detection process, any one or more of the temperature in the high temperature chamber 19, the temperature in the isolation chamber 5 and the target pressure value can be detected as variables, so as to evaluate the metering performance of the pressure sensor 6 and the pressure transmitter 7 under various working conditions.

[0032] The present invention achieves the purpose of being able to control the temperature of the high-temperature chamber 19 and the high-temperature box 4 during the detection process, establish a high-temperature medium test condition for the pressure sensor 6 and the pressure transmitter 7, and at the same time be able to control the temperature of the constant temperature device 9 to establish a normal temperature medium test condition for the standard pressure source 10, so that the pressure value detected by the standard pressure source 10 can be compared with the pressure value output by the pressure transmitter 7 under the high-temperature medium condition to evaluate the metering performance of the pressure instrument under high-temperature conditions, thereby solving the problem in the related art that there is a lack of a pressure instrument performance evaluation method under working conditions, and the metering performance of the pressure instrument cannot be evaluated under high-temperature conditions.

[0033] In one embodiment, the constant temperature device 9 may be a constant temperature water tank, and the first pipe section 1 passes through the constant temperature water tank, so that the portion of the first pipe section 1 located in the constant temperature water tank can be kept at a normal temperature, so that the gas medium contacted by the standard pressure source 10 is a normal temperature medium. Of course, the constant temperature device 9 may also be of other types, such as a constant temperature box, and the space in the constant temperature box is kept at a constant temperature in a manner similar to air conditioning. The pressure generator 3 includes an air compressor, etc.

[0034] The purpose of setting the gas buffer 2 in this embodiment is to eliminate the influence of the gas volume expansion caused by temperature changes on the fluctuation of the detection results. Specifically, the volume of the entire pressure pipeline is increased by the setting of the gas buffer 2. When the gas medium in the high-temperature chamber 19 is affected by temperature and expands in volume, the gas buffer 2 with a larger volume can absorb the volume expansion of the gas to a certain extent, thereby reducing the influence of the gas expansion on the entire pressure pipeline, and further reducing the fluctuation of the pressure value detection. In addition, in this embodiment, the pressure generator 3 can quickly fill the gas buffer 2, which can significantly improve the experimental efficiency. Moreover, due to the presence of the gas buffer 2, the high-pressure gas output by the pressure generator 3 will not directly impact the pressure sensor 6, thereby reducing the influence on the pressure sensor 6.

[0035] In one embodiment, the data acquisition module 11 as a signal acquisition terminal can be electrically connected to the standard pressure source 10, the pressure generator 3 and the pressure transmitter 7 in a wired or wireless manner to collect corresponding data. In another embodiment, the data acquisition module 11 can also be used as a control terminal, which can control the pressure transmitter 7 to pass gas into the gas buffer 2, and control the standard pressure source 10 to adjust the gas pressure of the pressure pipeline.

[0036] Since the present invention uses temperature control to simulate the metering performance of the pressure instrument at high temperature, it is important to detect the temperature of some areas in the test device. Figure 1 As shown, the test device in this embodiment further includes a first temperature sensor 12, a second temperature sensor 13, a third temperature sensor 14, a fourth temperature sensor 15, a fifth temperature sensor 17 and a sixth temperature sensor 18 electrically connected to the data acquisition module 11; The first temperature sensor 12 is used to detect the temperature of the portion of the first pipe section 1 between the standard pressure source 10 and the constant temperature device 9; The second temperature sensor 13 is used to detect the temperature inside the constant temperature device 9; The third temperature sensor 14 is used to detect the temperature of the portion of the first pipe section 1 between the constant temperature device 9 and the gas buffer 2; The fourth temperature sensor 15 is used to detect the temperature of the portion of the second pipe section 16 between the gas buffer 2 and the high temperature box 4; The fifth temperature sensor 17 is used to detect the temperature in the isolation cavity 5; The sixth temperature sensor 18 is used to detect the temperature in the high temperature chamber 19 .

[0037] Specifically, in this embodiment, the temperature of the gas medium in contact with the standard pressure source 10 is obtained by a first temperature sensor 12 disposed on the first pipe section 1 and located between the standard pressure source 10 and the constant temperature device 9, thereby ensuring that the temperature of the gas medium in contact with the standard pressure source 10 is the set normal temperature. The temperature in the constant temperature device 9 is detected by a second temperature sensor 13, thereby ensuring that the constant temperature controlled by the constant temperature device 9 is the set normal temperature. The temperature of the gas medium before entering the constant temperature device 9 is obtained by a third temperature sensor 14 disposed on the first pipe section 1 and located between the constant temperature device 9 and the gas buffer 2, thereby enabling the constant temperature device 9 to adjust the temperature of the constant temperature device 9 based on the temperature of the gas medium, so that the temperature of the gas medium in contact with the standard pressure source 10 is normal temperature.

[0038] The temperature of the gas medium before entering the high temperature box 4 is obtained by the fourth temperature sensor 15 disposed on the second pipe section 16 and located between the gas buffer 2 and the high temperature box 4, and the temperature in the isolation chamber 5 is detected by the fifth temperature sensor 17 disposed in the isolation chamber 5 to ensure that the ambient temperature of the pressure transmitter 7 and the pressure sensor 6 other than the pressure sensing surface is the set temperature. The gas medium temperature in the high temperature chamber 19 is also obtained by the sixth temperature sensor 18 disposed in the high temperature chamber 19 to ensure that the gas medium temperature is the temperature under the set high temperature working condition.

[0039] In this embodiment, the data acquisition module 11 is also electrically connected to the first temperature sensor 12, the second temperature sensor 13, the third temperature sensor 14, the fourth temperature sensor 15, the fifth temperature sensor 17 and the sixth temperature sensor 18, so that the temperatures detected by each temperature sensor can be centrally acquired, thereby facilitating the control of the entire testing device.

[0040] In one embodiment, Figure 1 As shown, the first pipe section 1 includes a bellows, and the bellows is located in a constant temperature device 9 and is kept at a constant temperature by the constant temperature device 9 .

[0041] Specifically, in this embodiment, the portion of the first pipe section 1 located in the constant temperature device 9 is configured as a bellows, which significantly increases the contact area between the first pipe section 1 and the constant temperature device 9. Taking the constant temperature device 9 as a constant temperature water tank as an example, the bellows on the first pipe section 1 is located in the constant temperature water tank, and the gas in the bellows can be kept at a set normal temperature state through a large contact area, which is beneficial for the standard pressure source 10 to detect the pressure of the gas at normal temperature.

[0042] To facilitate the pressure relief of the pressure pipeline after the test is completed, Figure 1 As shown, the test device in this embodiment further includes a control valve 8 , which is disposed on the gas buffer 2 . The control valve 8 is electrically connected to the data acquisition module 11 , and the opening and closing of the control valve 8 is controlled by the data acquisition module 11 .

[0043] After the control valve 8 is electrically connected to the data acquisition module 11, the data acquisition module 11 needs to first close the control valve 8 before starting the test. After the test is completed, the data acquisition module 11 can open the control valve 8 to relieve the pressure of the pressure pipeline. In this embodiment, the control valve 8 can be any kind of electrically controlled valve, such as a solenoid valve, a gate valve, etc.

[0044] In order to facilitate the control of the temperature in the high temperature box 4 and the high temperature cavity 19, a first temperature control component is provided in the high temperature box 4 in this embodiment, and the first temperature control component is used to control the temperature in the isolation cavity 5; A second temperature control component is disposed in the high temperature chamber 19 , and the second temperature control component is used to control the temperature in the high temperature chamber 19 .

[0045] Specifically, in one embodiment, the first temperature control component and the second temperature control component may be electric heating rods, electric heating wires, and the like.

[0046] According to another aspect of the present invention, a pressure instrument performance testing method is provided, which uses the above-mentioned pressure instrument performance testing device and includes the following steps: S100, control the temperature in the high temperature chamber 19 at a first temperature value T6, and control the temperature in the isolation chamber 5 at a second temperature value T5, wherein 200°C≤T6≤500°C, 20°C≤T5≤90°C; in a specific implementation, according to different side-view working conditions, the first temperature value T6 and the second temperature value T5 can select a specific value within the corresponding range.

[0047] S200, set the target pressure value, fill the gas medium to be measured into the gas buffer 2 through the pressure generator 3, and fill the first pipe section 1 and the second pipe section 16 with the gas medium to be measured. When the pressure value in the first pipe section 1 and the second pipe section 16 is close to the target pressure value, turn off the pressure generator 3; in a specific implementation, according to different test conditions, the target pressure value also has different options, and the target pressure value under the corresponding test condition can be determined according to the test specification.

[0048] S300, control the temperature of the gas medium to be measured passing through the constant temperature device 9 at T2, 15°C≤T2≤25°C through the constant temperature device 9; in a specific implementation, the constant temperature device 9 is used to control the temperature of the gas medium to be measured at room temperature, generally needs to be controlled at (20±2)°C.

[0049] S400, fine-tuning the pressure values ​​in the first pipe segment 1 and the second pipe segment 16 by means of the standard pressure source 10, so that the pressure value obtained by the standard pressure source 10 reaches the target pressure value; S500, obtaining the measured pressure value output by the pressure transmitter 7; S600: Determine an error value between the first measured pressure value and the target pressure value based on the target pressure value and the measured pressure value.

[0050] S700, taking the target pressure value, the first temperature value, and the second temperature value as the only variables of the test conditions, respectively, and obtaining the error value between the first measured pressure value and the target pressure value under multiple test conditions.

[0051] In the present invention, through this testing method, the metering performance of the pressure instrument under different test conditions can be tested and evaluated, which solves the problem in the related technology that there is a lack of pressure instrument performance evaluation method under working conditions, and the metering performance of the pressure instrument cannot be evaluated under high temperature conditions.

[0052] In this embodiment, three variables need to be controlled during the performance test of the pressure instrument, namely, the target pressure value in the pressure pipeline, the first temperature value in the high temperature chamber 19 and the second temperature value in the isolation chamber 5 of the high temperature box 4.

[0053] In a specific implementation, a pressure meter with an accuracy of level 0.5 is used as the test object, the pressure measurement range is 0-6MPa, and the temperature range of the measurement medium is 50°C-500°C.

[0054] According to the existing calibration regulations JJG875 digital pressure gauge, it is necessary to calibrate at (20±2)℃, ignoring the effect of actual temperature on the pressure measurement value. Usually, the pressure instrument to be tested needs to be measured at six points: 0, 2MPa, 3MPa, 4MPa, 5MPa, and 6MPa, and the qualified requirement is that the maximum allowable error is ±0.5%.

[0055] The maximum allowable error calculation formula is: , During the test: : Maximum allowable error; : Forward and reverse stroke indication of measuring point; : Standard value of measuring point; : Maximum measured value.

[0056] Table 1 Error of the pressure instrument under standard environment (20±2)℃ As shown in Table 1, the pressure instrument under test fully meets the requirements when calibrated under standard environment.

[0057] In order to test the metering performance of the pressure instrument under high temperature conditions, the following tests are carried out: Test condition 1: The first temperature value T6 in the high temperature chamber 19 is set at 300°C, and the second temperature value T5 in the isolation chamber is set at (50±2)°C. The temperature of the gas medium to be measured passing through the constant temperature device is controlled at T2 at (20±2)°C by the constant temperature device. The target pressure value is set at five measurement points, namely 2MPa, 3MPa, 4MPa, 5MPa, and 6MPa. The test results are shown in Table 2: Table 2 Error of the pressure instrument under high temperature Measured value measuring point Standard value (MPa) Positive stroke indication (MPa) Reverse stroke indication (MPa) error(%) 2MPa 2.002 2.15 2.14 2.47 3MPa 3.004 3.18 3.16 2.93 4Mpa 4.001 4.15 4.18 2.98 5Mpa 5.002 5.17 5.19 3.13 6Mpa 6.003 6.19 6.21 3.45 Table 2 shows that the error of the pressure instrument under the test condition is significantly different from that under the standard condition.

[0058] Test condition 2: The target pressure value is set to 6MPa, the second temperature value T5 in the isolation chamber is set to (50±2)°C, and the temperature of the gas medium to be measured passing through the constant temperature device is controlled at T2 at (20±2)°C by the constant temperature device. The first temperature value T6 in the high temperature chamber 19 is used as a variable to measure the measured pressure values ​​at 50°C, 100°C, 200°C, 400°C, and 600°C in sequence, and the results are shown in Table 3: Table 3 Error of the measured pressure instrument at high temperature Measured value measuring point Standard value (MPa) Positive stroke indication (MPa) Reverse stroke indication (MPa) error(%) T6(℃) 6MPa 6.005 6.02 6.02 0.25 50 6MPa 6.004 6.08 6.09 1.43 100 6Mpa 6.005 6.15 6.14 2.41 200 6Mpa 6.003 6.24 6.22 3.95 400 6Mpa 6.002 6.35 6.38 6.3 600 Table 3 shows that under the same pressure conditions, the measurement error of the pressure instrument changes with the temperature of the measured medium, and the measurement error changes significantly compared with that under the standard environment.

[0059] Test condition three: The target pressure value is set to 6MPa, the first temperature value T6 in the high temperature chamber 19 is set to 300°C, and the temperature of the gas medium to be measured passing through the constant temperature device is controlled at T2 at (20±2)°C by the constant temperature device. The second temperature value T5 in the isolation chamber is set as a variable, and the variable is measured at the measured pressure values ​​at 25°C, 50°C, and 80°C in turn. The test results are shown in Table 4: Table 4 Error of the pressure instrument under high temperature Measured value measuring point Standard value (MPa) Positive stroke indication (MPa) Reverse stroke indication (MPa) error(%) T5(℃) 6MPa 6.001 6.19 6.18 3.15 25 6MPa 6.006 6.21 6.22 3.56 50 6Mpa 6.003 6.24 6.23 3.95 80 According to the above test method, the pressure measurement value and error value of the pressure instrument under different high temperature test conditions can be obtained. In order to enable the pressure instrument under test to output accurate pressure measurement values ​​under high temperature conditions, it is necessary to correct the pressure instrument according to the test results so that the pressure instrument can output pressure measurement values ​​with error values ​​within the allowable range based on the current test environment.

[0060] Specifically, the pressure instrument mainly includes a pressure sensor 6 and a pressure transmitter 7, wherein the pressure sensor 6 is equipped with a sensitive element, which converts the pressure value into an original electrical signal and transmits it to the pressure transmitter 7. The pressure transmitter 7 processes the electrical signal by methods, filtering, etc., and then converts it into a standard signal commonly used in the industry, such as (4~20)mA, 0~5V, etc. The final measurement result is output by the pressure transmitter 7 as a standard signal.

[0061] Usually, each pressure sensor 6 has its own characteristics. During the measurement process, the original signal output by the sensor needs to be processed by a fixed value before it can be used normally. The fixed value process is called calibration. The fixed value work is completed by the pressure transmitter 7. At present, a microprocessor is generally included in the pressure transmitter 7. The fixed value process can compare the measured value with the standard value, correct the error in the processor using a mathematical algorithm, and output the correct pressure value. Since temperature has a certain influence on the measured value of the pressure sensor 6, only by correcting the information output by the pressure sensor 6 under the actual temperature environment conditions can the pressure value under the working condition be accurately obtained.

[0062] In one embodiment, the data obtained by the test method can be used to perform curve fitting. Specifically, the curve fitting can be performed by using methods such as interpolation. A pressure correction equation algorithm is formulated based on the fitting result, and the pressure correction equation algorithm is built into the processor of the pressure transmitter 7 to correct the pressure measurement result and output the correct measured pressure value. After using the above test device and test method, the combination of the working environment temperature, the measurement medium temperature and the target pressure measurement value can be adjusted as needed, and finally a suitable correction equation is formed to calibrate the pressure instrument under test, so as to ensure the accuracy of the measurement result under the expected working conditions of the pressure instrument under test.

[0063] Based on this, the testing method in this embodiment also includes: S800, judging whether the pressure sensor 6 meets the measurement performance requirements according to the error value, if not, S900, performing curve fitting based on the measured pressure value and the target pressure value, and determining a correction method based on the curve fitting result; S1000, correcting the pressure transmitter 7 based on the correction method, so that the pressure value error output by the pressure transmitter 7 meets the measurement performance requirement.

[0064] To further verify the modified pressure transmitter 7, the test method in this embodiment further includes: S1100. Use the corrected pressure transmitter 7 to execute S100-S800. If yes, end the performance test.

[0065] In other words, in this embodiment, the corrected pressure transmitter 7 is tested again, and the metering performance of the corrected pressure transmitter 7 is evaluated according to the measured pressure values ​​and error values ​​under different test conditions. After the evaluation shows that the metering performance requirements are met, the pressure instrument can output accurate measured pressure values ​​when applied to different environmental conditions.

[0066] Since it is necessary to test the metering performance of the pressure instrument under high temperature conditions, the temperature values ​​of the test device at various key positions need to be strictly controlled to ensure the accuracy of the test results. To this end, before executing step S400, this embodiment also includes: Acquire the detected temperature values ​​detected by the first temperature sensor 12, the second temperature sensor 13, the third temperature sensor 14, the fourth temperature sensor 15, the fifth temperature sensor 17 and the sixth temperature sensor 18; in a specific implementation, the corresponding detected temperature values ​​are acquired by the data acquisition module 11 in a wired or wireless manner; Based on the detected temperature value, determine whether the temperature of each part of the test device meets the test requirements. If yes, execute step S400; If not satisfied, check and debug the test device.

[0067] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Within the spirit and principle of the present invention, any modification, equivalent replacement, improvement, etc. made shall be included in the protection scope of the present invention.

Claims

1. A pressure instrument performance testing device, characterized in that: include: Pressure pipeline, standard pressure source, constant temperature equipment, gas buffer, pressure generator, high temperature box, high temperature chamber, pressure sensor, pressure transmitter and data acquisition module; The pressure pipeline comprises a first pipe section and a second pipe section, the first end of the first pipe section is connected to the standard pressure source, and the second end of the first pipe section is connected to the gas buffer after passing through the constant temperature device; The high temperature chamber is arranged in the high temperature box, the temperature in the high temperature chamber is adjustable, and there is a closed isolation chamber between the high temperature box and the high temperature chamber, the temperature in the isolation chamber is adjustable; The first end of the second pipe segment is connected to the gas buffer, and the second end of the second pipe segment is connected to the high temperature chamber; The pressure generator is connected to the gas buffer; The pressure sensor is arranged on the high temperature chamber, and the pressure sensing surface of the pressure sensor is in contact with the medium in the high temperature chamber; The pressure transmitter is arranged in the isolation chamber and connected to the pressure sensor; The data acquisition module is used to collect data from the standard pressure source, the pressure generator and the pressure transmitter.

2. The pressure instrument performance testing device according to claim 1, characterized in that: Also included are a first temperature sensor, a second temperature sensor, a third temperature sensor, a fourth temperature sensor, a fifth temperature sensor and a sixth temperature sensor electrically connected to the data acquisition module; The first temperature sensor is used to detect the temperature of a portion of the first pipe segment located between the standard pressure source and the constant temperature device; The second temperature sensor is used to detect the temperature in the constant temperature device; The third temperature sensor is used to detect the temperature of the portion of the first pipe section located between the constant temperature device and the gas buffer; The fourth temperature sensor is used to detect the temperature of the portion of the second pipe section located between the gas buffer and the high temperature box; The fifth temperature sensor is used to detect the temperature in the isolation cavity; The sixth temperature sensor is used to detect the temperature in the high temperature chamber.

3. The pressure instrument performance testing device according to claim 1, characterized in that: The first pipe section includes a bellows, and the bellows is located in the constant temperature device and is kept at a constant temperature by the constant temperature device.

4. The pressure instrument performance testing device according to claim 3, characterized in that: The constant temperature device comprises a constant temperature water tank, and the bellows section is located in the constant temperature water tank.

5. The pressure instrument performance testing device according to claim 1, characterized in that: It also includes a control valve, which is arranged on the gas buffer. The control valve is electrically connected to the data acquisition module, and the opening and closing of the control valve is controlled by the data acquisition module.

6. The pressure instrument performance testing device according to claim 1, characterized in that: A first temperature control component is provided in the high temperature box, and the first temperature control component is used to control the temperature in the isolation cavity; A second temperature control component is arranged in the high temperature cavity, and the second temperature control component is used to control the temperature in the high temperature cavity.

7. A pressure instrument performance testing method, characterized in that: A pressure instrument performance testing device as claimed in any one of claims 2 to 6 is used, and comprises the following steps: S100, controlling the temperature in the high temperature chamber to a first temperature value T6, and controlling the temperature in the isolation chamber to a second temperature value T5, wherein 200°C≤T6≤500°C, and 20°C≤T5≤90°C; S200, setting a target pressure value, charging the gas medium to be measured into the gas buffer through the pressure generator, so that the first pipe section and the second pipe section are filled with the gas medium to be measured, and when the pressure values ​​in the first pipe section and the second pipe section are close to the target pressure value, closing the pressure generator; S300, controlling the temperature of the gas medium to be measured passing through the constant temperature device at T2, 15° C. ≤ T2 ≤ 25° C. by the constant temperature device; S400, fine-tuning the pressure values ​​in the first pipe segment and the second pipe segment by using the standard pressure source, so that the pressure value obtained by the standard pressure source reaches the target pressure value; S500, obtaining a measured pressure value output by the pressure transmitter; S600, determining an error value between the first measured pressure value and the target pressure value based on the target pressure value and the measured pressure value; S700: Use the target pressure value, the first temperature value, and the second temperature value as unique variables of a test condition, respectively, to obtain an error value between the first measured pressure value and the target pressure value under multiple test conditions.

8. The pressure instrument performance testing method according to claim 7, characterized in that: Also includes: S800: Determine whether the pressure sensor meets the measurement performance requirements according to the error value; if not, S900, performing curve fitting based on the measured pressure value and the target pressure value, and determining a correction method based on the curve fitting result; S1000. Correct the pressure transmitter based on the correction method so that the pressure value error output by the pressure transmitter meets the measurement performance requirement.

9. The pressure instrument performance testing method according to claim 8, characterized in that: Also includes: S1100. Use the modified pressure transmitter to execute S100-S800. If yes, end the performance test.

10. The pressure instrument performance testing method according to claim 8, characterized in that: Before executing step S400, the method further includes: Acquire detection temperature values ​​detected by the first temperature sensor, the second temperature sensor, the third temperature sensor, the fourth temperature sensor, the fifth temperature sensor, and the sixth temperature sensor; Based on the detected temperature value, determine whether the temperature of each part of the test device meets the test requirements, and if so, execute step S400; If not, the test device is inspected and debugged.

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