Lamp intelligent aging test fault diagnosis method, system and equipment

Abstract

The invention discloses an intelligent aging test fault diagnosis method, system and equipment for a lamp. The intelligent aging test fault diagnosis method for the lamp comprises the following steps: acquiring information of a tested lamp to be subjected to an aging test; setting external conditions according to the use environment of the tested lamp to be subjected to aging test; the data monitoring module obtains input power supply parameters; collecting power supply data; the data communication module executes data communication; judging whether abnormal data exists in the data or not; summarizing the power supply data in the aging test time period; performing waveform drawing on all the power supply data in the aging test time period, and performing statistical analysis; judging whether the parameters of the tested lamp are abnormal or not; if the judgment result is normal, outputting a normal data analysis result, and executing data archiving; if the judgment result is abnormal, diagnosis of the corresponding fault type is executed; and outputting a fault type analysis result.

Description

Technical Field

[0001] The present invention relates to a method, system and equipment for performing fault diagnosis based on power supply data recorded during a lamp intelligent aging test. Background Art

[0002] At present, lamps mainly use LED (light-emitting diode) technology. Its structure is mainly composed of a substrate with LED lamp beads / chips welded on it, a power supply, and a shell. LED lamps have significant power saving effects and long service life and are widely used.

[0003] LED lamps contain many electronic components, such as LED lamp beads / chips, power supplies (voltage conversion, voltage stabilization circuits, components), and any minor damage to any electronic component may cause the entire LED lamp to fail. Therefore, important LED lamps need to undergo a certain period of aging testing after production and before leaving the factory. This is done by continuously powering on the lamps for several hours to detect the stability of the internal electronic components and eliminate potential faults before packaging and shipment.

[0004] However, the current conventional aging test for LED lamps is to simply pass 220V AC power to the LED lamps. After the aging time is up, the workers visually check whether the LED lamps are working normally. Those that can emit light normally are qualified products, while those that do not emit light or some of the lamp beads have attenuated brightness are unqualified products and need to be reworked and repaired before re-aging test. The defect is that for unqualified products, they can only be disassembled and the LED light board and power supply replaced and matched again, but it is difficult to count and analyze the specific model and specification of electronic components that cause damage, and even the probability of damage of this type of electronic components, how long it takes to work before it is easily damaged, etc., which leads to greater randomness in product quality. It is difficult to control and deal with the quality from the source of LED lamp production, and the selection, welding, and testing of internal electronic components. The reliability and stability of LED lamps are difficult to improve.

[0005] Therefore, it is necessary to improve the aging test process of LED lighting products. Summary of the invention

[0006] One of the purposes of the present invention is to provide a method, system and equipment for intelligent aging test fault diagnosis of lamps, which can provide intelligent aging test and can not only screen qualified products, but also perform fault diagnosis and analysis on unqualified products.

[0007] One of the purposes of the present invention is to provide a lamp intelligent aging test fault diagnosis method, system and equipment, which can improve the long-term quality reliability and stability of LED lamp products by using big data and artificial intelligence algorithms.

[0008] In order to achieve at least one of the inventive purposes of the present invention, the present invention provides a lamp intelligent aging test fault diagnosis method, comprising the following steps: Obtain information of the lamp to be tested for aging test; set external conditions according to the use environment of the lamp to be tested for aging test; The data monitoring module obtains input power supply parameters; Performing acquisition of power supply data; The data communication module performs data communication; Determine whether there are abnormal data in the data; If the judgment result is that there is abnormal data in the data, abnormal data analysis is performed and the abnormal data analysis result is output; if the judgment result is that there is no abnormal data in the data, data sampling is performed; Perform aggregation of power supply data during the aging test period; Perform waveform drawing and statistical analysis on all power supply data during the aging test period; Determine whether the parameters of the tested lamp are abnormal; if the judgment result is normal, output the normal data analysis result and perform data archiving; if the judgment result is abnormal, perform the diagnosis of the corresponding fault type through current, voltage, power, power factor, waveform, frequency data, combined with the time point, change curve, and luminous conditions during the aging test period; and Output fault type analysis results; Among them, the fault type analysis results are output to the remote data server. After obtaining the maintenance data of the lamps actually repaired fed back by the maintenance end of the remote data server, the diagnosis results are verified, and the diagnosis database is continuously updated and optimized; The lamp intelligent aging test fault diagnosis method further comprises the following steps of performing fault diagnosis: Retrieve the first output judgment parameter f1 and the camera output judgment parameter L mt Perform troubleshooting; When f1=1, or L mt =1, activate fault diagnosis; According to f1=1, or L mt =1, read the standard stable current I t , T=[t-t1, t+t2], where t1 is the time before the fault occurs, preferably 10 seconds; t2 is the time after the fault occurs, preferably 2 seconds; Get the current measured abnormal current minimum value I Tmin , and the current measured abnormal current maximum value I Tmax ; Calculate the current measured abnormal current minimum value ITmin With the standard stable current I t The ratio W min , the formula is: W min =I Tmin / I t ; Get the minimum value Cminti of the input current change over time t; Execute calculation W min / Cminti, when the calculation result is greater than or equal to 1, the output R=0, R is the fault diagnosis output judgment parameter corresponding to the minimum current; When W min / When Cminti is less than 1, output R=1; When it is detected that R is equal to 0, there is no output, and the fault type is recorded and fed back as a circuit breaker fault; When R is greater than 0, the fault type is recorded as LED chip failure, and the current maximum value of the measured abnormal current I is calculated. Tmax With the standard stable current I t The ratio W max , the formula is W max =I Tmax / I t ; Get the maximum value Cmaxti of the time t change of the input current; Execute calculation W max / Cmaxti, when the calculation result is less than or equal to 1, the output S=0, S is the fault diagnosis output judgment parameter corresponding to the maximum current; When W max / When Cmaxti is greater than 1, output S=1; Obtaining a preset comparison constant P and a fault diagnosis output judgment parameter S corresponding to the maximum output current; Calculate S / P. When S / P is less than or equal to 1, record and feedback the fault type as LED chip breakdown fault; When S / P is greater than 1, the fault type is recorded and fed back as a high voltage fault of the voltage stabilized power supply; When R>0 and S=0, the fault type is recorded and reported as LED chip internal resistance increase fault; When R>0 and S=1, the fault type is recorded and fed back as LED chip short circuit fault.

[0009] In some embodiments, the lamp intelligent aging test fault diagnosis method further includes the steps of: monitoring the camera device to record the light emission conditions; and performing light emission condition summary within the aging test time period.

[0010] In some embodiments, the lamp intelligent aging test fault diagnosis method further includes the step of performing a lamp life prediction analysis.

[0011] In some embodiments, the lamp intelligent aging test fault diagnosis method further includes the steps of obtaining normal data analysis results of the lamp under test and performing archiving of normal data.

[0012] In some embodiments, the lamp intelligent aging test fault diagnosis method further includes the steps of: performing data analysis and improving the lamp usage database in combination with normal data archived during the aging test.

[0013] In some embodiments, it is characterized in that the lamp intelligent aging test fault diagnosis method also includes the steps of: determining the model specifications and adaptation status of the vulnerable components of the lamp under test, and updating the lamp electronic component selection database.

[0014] According to another aspect of the present invention, the present invention further provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the lamp intelligent aging test fault diagnosis method are executed.

[0015] According to another aspect of the present invention, the present invention also provides a lamp intelligent aging test fault diagnosis device, comprising: Memory, for storing software applications, The processor is used to execute the software application program, and each program of the software application program correspondingly executes each step of the lamp intelligent aging test fault diagnosis method.

[0016] According to another aspect of the present invention, the present invention also provides a lamp intelligent aging test fault diagnosis system, which applies the lamp intelligent aging test fault diagnosis method, and the lamp intelligent aging test fault diagnosis system includes an initial data processing module, a data monitoring module, a power data acquisition module, a data communication module, an abnormal data judgment module, a power data summary module, a power data analysis module, a lamp parameter abnormality judgment module and a fault type analysis result module; the initial data processing module obtains the information of the lamp to be tested for aging test, and sets external conditions according to the use environment of the lamp to be tested for aging test; the data monitoring module obtains the input power parameters; the power data acquisition module performs acquisition on the power data; the data communication module performs data communication; the abnormal data judgment module determines whether there is abnormal data in the data; the power data summary module is configured to execute: execute the summary of power data within the aging test time period; the power data analysis module is configured to execute: execute waveform drawing on all power data within the aging test time period, and perform statistical analysis; the lamp parameter abnormality judgment module determines whether the lamp parameter to be tested is abnormal; the fault type analysis result module outputs the fault type analysis result.

[0017] According to another aspect of the present invention, the present invention also provides an intelligent aging test fault diagnosis device for lamps, which applies the intelligent aging test fault diagnosis method for lamps and the intelligent aging test fault diagnosis system for lamps, and the intelligent aging test fault diagnosis device for lamps comprises an aging test control cabinet and an aging test rack, wherein the aging test rack is provided with a lamp grid for placing the lamps to be tested for aging test, and the aging test control cabinet performs the control of the aging test; the aging test rack is also provided with a monitoring device, and during the aging test process, the monitoring device locates the lamp grid and then identifies the luminous state of the lamps to be tested in the lamp grid; during the aging test process, when the lamp beads or chips of the lamps to be tested have an abnormal situation of luminous attenuation or reduced luminous intensity or are damaged and do not emit light, the abnormal situation is captured and recorded by the monitoring device; the aging test control cabinet is provided with a power supply parameter detection instrument to monitor the power supply parameters; the abnormal situation captured and recorded by the monitoring device and the information monitored and recorded by the power supply parameter detection instrument are synchronously sent to a remote data server to perform data storage and fault diagnosis analysis of the aging test.

[0018] The beneficial effects of the present invention include but are not limited to: 1. It can not only screen qualified products, but also perform fault diagnosis and analysis on unqualified products; 2. Improve the long-term quality reliability and stability of LED lighting products; 3. Provide intelligent aging test fault diagnosis for lamps, and be able to determine the service life of LED lamps based on the aging test process data; if the service life does not meet expectations, the electronic components can be replaced in advance; if the service life meets expectations, it will be delivered for use normally, and the maintenance and replacement intervals will be set according to the expected life during use. Under the premise of ensuring the lighting effect, the working time of LED lamps can be extended as much as possible, the replacement frequency can be reduced, and the maintenance costs can be saved; at the same time, it can ensure the lighting safety of the lighting venues and avoid emergency repairs caused by accidental damage; 4. Provide intelligent aging test fault diagnosis for lamps. According to the diagnosis database and lamp usage database, analyze the service life, failure frequency, and mutual matching of each electronic component, establish an electronic component option database, and provide data support for the subsequent design and production of lamps, so that the overall failure of LED lamps is reduced and the design life is consistent with the actual service life. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is an example of a flow chart of steps in a lamp intelligent aging test fault diagnosis method according to a preferred embodiment of the present invention.

[0020] Figure 2It is another step flow chart example of the lamp intelligent aging test fault diagnosis method according to the above preferred embodiment of the present invention.

[0021] Figure 3 It is a schematic diagram of the hardware structure implementation from one perspective of a lamp intelligent aging test fault diagnosis device applying a lamp intelligent aging test fault diagnosis system according to a preferred embodiment of the present invention.

[0022] Figure 4 It is a schematic diagram of the hardware structure implementation from another perspective of the intelligent aging test and fault diagnosis device for lamps according to the above preferred embodiment of the present invention.

[0023] Figure 5 1 is a schematic diagram of the structure of the intelligent aging test fault diagnosis device for lamps according to the above preferred embodiment of the present invention, illustrating a preferred implementation diagram of an aging test cabinet. DETAILED DESCRIPTION

[0024] The following description is used to disclose the present invention so that those skilled in the art can implement the present invention. The preferred embodiments described below are only examples, and those skilled in the art can think of other obvious variations. The basic principles of the present invention defined in the following description can be applied to other embodiments, variations, improvements, equivalents, and other technical solutions that do not deviate from the spirit and scope of the present invention.

[0025] It is to be understood that the term "one" should be understood as "at least one" or "one or more", that is, in one embodiment, the number of an element may be one, while in another embodiment, the number of the element may be multiple, and the term "one" should not be understood as a limitation on the quantity.

[0026] The present invention is an invention related to a computer program. Figure 1 The figure shows a flow chart of a lamp intelligent aging test fault diagnosis method based on the present invention, which explains a solution for solving the problem proposed by the present invention, based on the computer program processing flow, by executing a computer program compiled according to the above flow to control or process the external or internal objects of the computer. Through the lamp intelligent aging test fault diagnosis method of the present invention, it is possible to use a computer system to provide an intelligent aging test, which can not only screen qualified products, but also perform fault diagnosis and analysis on unqualified products, and can use big data and artificial intelligence algorithms to improve the long-term quality reliability and stability of LED lamp products. It can be understood that the "computer" referred to in the present invention not only refers to desktop computers, laptops, tablets and other devices, but also includes other intelligent electronic devices that can run according to programs and process data.

[0027] like Figure 1 and Figure 2 As shown, the lamp intelligent aging test fault diagnosis method includes the following steps: Obtain information about the LED lamp to be tested; set external conditions such as test temperature, humidity, and input power according to the use environment of the LED lamp to be tested; The data monitoring module obtains input power supply parameters; Collect power supply data such as current, voltage, power, power factor, waveform, frequency, etc. The data communication module performs data communication; Determine whether there are abnormal data in the data; If the judgment result is that there is abnormal data in the data, abnormal data analysis is performed and the abnormal data analysis result is output; If the judgment result is that there is no abnormal data in the data, data sampling is performed continuously, persistently, and at multiple time points; Summarize power supply data such as current, voltage, power, power factor, waveform, frequency, etc. during the aging test period; Perform waveform drawing and statistical analysis on all power supply data during the aging test period; Determine whether the parameters of LED lamps are abnormal; If the judgment result is normal, the normal data analysis result is output and data archiving is performed; If the result is abnormal, the corresponding fault type diagnosis is performed through the current, voltage, power, power factor, waveform, frequency data, combined with the time point, change curve, and light emission conditions during the aging test period; Output fault type analysis results.

[0028] More specifically, the lamp intelligent aging test fault diagnosis method further includes the following steps: According to the use environment of the LED lamp to be tested, set the test temperature, humidity, input power and other external conditions; Surveillance cameras record the light emission; Summary of luminescence during the aging test period; Execute the judgment whether the LED lamp is abnormal.

[0029] More specifically, the lamp intelligent aging test fault diagnosis method further includes the following steps: Obtain the output abnormal data analysis results, and adjust the previous processing modules and input data according to the abnormal data analysis results.

[0030] More specifically, the lamp intelligent aging test fault diagnosis method further includes the following steps: Obtain the diagnosis results of the fault type and feed them back to the maintenance end to perform maintenance on the LED lamps; Obtain maintenance data after maintenance at the maintenance end and verify the diagnosis results; Continuously update and optimize the diagnostic database; Execute the judgment whether the LED lamp is abnormal until it returns to normal state.

[0031] More specifically, the lamp intelligent aging test fault diagnosis method further includes the following steps: Output normal data analysis results of LED lamps and archived data of normal data; Perform predictive analysis on the service life of LED lamps and remind the maintenance department to perform maintenance and replacement in advance.

[0032] More specifically, the lamp intelligent aging test fault diagnosis method further includes the following steps: Obtain the failure data of LED lamps after use and the disassembly failure analysis data input by the maintenance end; Combined with the aging test data archiving analysis to improve the lamp usage data; Continuously update and optimize the lamp service life database.

[0033] More specifically, the lamp intelligent aging test fault diagnosis method further includes the following steps: Obtain the maintenance data of LED lamps performed by the maintenance end and combine it with the aging test data for archiving and analysis to improve the lamp usage data; determine and feedback the model specifications and adaptation data of vulnerable components; and update the LED lamp electronic component selection database.

[0034] More specifically, in other preferred embodiments of the present invention, the lamp intelligent aging test fault diagnosis method further includes the following steps: S100: Establishment of execution standard comparison database; S200: Execute real-time comparison of test data; S300: acquiring camera monitoring data, and performing comparison based on the camera monitoring data; S400: performing fault diagnosis; and S500: Execute estimation of the usage time of the LED lamp under test.

[0035] Furthermore, more specifically, in a preferred embodiment, the principle of step S100 of the lamp intelligent aging test fault diagnosis method is based on the input current parameter and the aging test duration. The LED lamp bead load will cause resistance changes over working time, thereby causing current parameter changes. When the heating power and heat dissipation power of the LED lamp bead are balanced, the resistance of the LED lamp bead is basically stable, and thus the current parameter is stable.

[0036] Specifically, the step S100 includes the following steps: Perform aging test and record the input current value I; Get the stable current value I st , calculate the time t change of input current, the formula is C t =I t / I st ; Obtain the measurement parameters in the long-term measurement parameter database, summarize the data regularly, and calculate the time t change C of the input current. t The value range of C t =[Cminti, Cmaxti], Take 10% of the minimum data in the i-th test volume N and perform the correction of the Cminti value. Cminti=AVERAGE(Cmini1+Cmini2+……+Cminin)×A n=10%×N, Where Cminti is the minimum C calculated based on the i-th test data. t Values, where Cmini1~Cminin are the actual values ​​of the minimum 10% of the data in the i-th test quantity N; Take 10% of the maximum data in the i-th test volume N and perform the correction of the Cmaxti value. Cmaxti=AVERAGE(Cmaxi1+Cmaxi2+……+Cmaxin)×B n=10%×N, Where Cmaxti is the maximum C calculated based on the i-th test data. t Values, where Cmaxi1~Cmaxin are the actual values ​​of 10% of the maximum data in the i-th test quantity N, Wherein, A and B are threshold correction constants. Preferably, A<98%, B>102%, and the threshold is appropriately expanded by about 2% to perform data accommodation.

[0037] Further, more specifically, in a preferred embodiment, the step S200 of the lamp intelligent aging test fault diagnosis method in a preferred embodiment performs data comparison on the input current in the LED lamp product aging test.

[0038] Specifically, the step S200 includes the following steps: Calculate the ratio of the measured input current to the standard stable current using the formula: K t =I int / I t , where K tis the current measured input current I int With the standard stable current I t The ratio of When K t Falls into C t =[Cminti, Cmaxti], the current parameters are considered normal and the output f1=0; and When K t Beyond C t When the current parameter is within the range, it is judged as abnormal, the LED lamp under test is judged to be abnormal, and the output f1=1; Among them, f1 is the first output judgment parameter.

[0039] Further, more specifically, in a preferred embodiment, the step S300 of the lamp intelligent aging test fault diagnosis method is implemented as follows: Send instructions to control the camera to take group photos of the LED lights in the test group and obtain the feedback camera data; calibrate the position of the lamps, for example, calibrate the number of the lamp in the current test group as m; record the LED lighting conditions; When the LED light is normal, the camera data output is L mt =0, where L mt Output judgment parameters for the camera; When the LED light is abnormal, if it is completely off or flickering, the camera captures the off-light moment and the camera data output is L mt =1.

[0040] Further, more specifically, in a preferred embodiment, the step S400 of the lamp intelligent aging test fault diagnosis method is implemented as follows: Retrieve the first output judgment parameter f1 and the camera output judgment parameter L mt Perform troubleshooting; When f1=1, or L mt =1, activate fault diagnosis; According to f1=1, or L mt =1, read the standard stable current I t , T=[t-t1, t+t2], where t1 is the time before the fault occurs, preferably 10 seconds; t2 is the time after the fault occurs, preferably 2 seconds; Get the current measured abnormal current minimum value I Tmin , and the current measured abnormal current maximum value I Tmax ; Calculate the current measured abnormal current minimum value I Tmin With the standard stable current I t The ratio W min, the formula is: W min =I Tmin / I t ; Get the minimum value Cminti of the input current change over time t; Execute calculation W min / Cminti, when the calculation result is greater than or equal to 1, the output R=0, R is the fault diagnosis output judgment parameter corresponding to the minimum current; When W min / When Cminti is less than 1, output R=1; When it is detected that R is equal to 0, there is no output, and the fault type is recorded and fed back as a circuit breaker fault; When R is greater than 0, the fault type is recorded as LED chip failure, and the current maximum value of the measured abnormal current I is calculated. Tmax With the standard stable current I t The ratio W max , the formula is W max =I Tmax / I t ; Get the maximum value Cmaxti of the time t change of the input current; Execute calculation W max / Cmaxti, when the calculation result is less than or equal to 1, the output S=0, S is the fault diagnosis output judgment parameter corresponding to the maximum current; When W max / When Cmaxti is greater than 1, output S=1; Obtaining a preset comparison constant P and a fault diagnosis output judgment parameter S corresponding to the maximum output current; Calculate S / P. When S / P is less than or equal to 1, record and feedback the fault type as LED chip breakdown fault; When S / P is greater than 1, the fault type is recorded and fed back as a high voltage fault of the voltage stabilized power supply; When R>0 and S=0, the fault type is recorded and reported as LED chip internal resistance increase fault; When R>0 and S=1, the fault type is recorded and fed back as LED chip short circuit fault.

[0041] Preferably, for example, the preset comparison constant P has a conventional value of 2. It can be understood by those skilled in the art that a breakdown failure of an LED chip often causes an increase in instantaneous current, and then one or more lamp beads go out, with current output but reduced current; a high voltage failure of a voltage-stabilized power supply often causes a very large instantaneous current, and then the entire lamp goes out, with no current output.

[0042] Further, more specifically, in a preferred embodiment, the step S500 of the lamp intelligent aging test fault diagnosis method is implemented as follows: Calculate the lamp usage time and estimate the adjustment parameter L m , the formula is: L m =LED working stable current I stm / Standard value I st ; Calculate the actual usage time N of the LED light m =N / L m ×C, where N is the standard usage time and C is the service life correction parameter.

[0043] When it is detected that the estimated lamp usage time has been reached, a reminder message to replace the lamp will be fed back.

[0044] It can be understood that the actual working stable current I of the mth lamp is stm Compared with standard value I st If it is large, the internal heat will be greater, which may lead to accelerated aging.

[0045] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided in the form of methods, systems or computer program products. Therefore, the present invention may take the form of an all-hardware embodiment, an all-software embodiment, or an embodiment combining software and hardware.

[0046] The present invention can be embedded in a computer program product, which includes all the features that enable the intelligent aging test fault diagnosis method for lamps described herein to be implemented. The computer program product is contained in one or more computer-readable storage media, and the computer-readable storage medium has a computer-readable program code contained therein. According to another aspect of the present invention, a computer-readable storage medium is also provided, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the intelligent aging test fault diagnosis method for lamps of the present invention can be executed. Computer storage media is a medium in a computer memory for storing a certain discontinuous physical quantity. Computer storage media include but are not limited to semiconductors, disk storage, magnetic cores, magnetic drums, magnetic tapes, laser disks, etc. It can be understood by those skilled in the art that computer storage media are not limited to the aforementioned examples, and the aforementioned examples are only used as examples and are not limited to the present invention.

[0047] According to another aspect of the present invention, there is also provided a lamp intelligent aging test fault diagnosis device, the lamp intelligent aging test fault diagnosis device comprising: a software application, a memory for storing the software application, and a processor for executing the software application. Each program of the software application can correspondingly execute the steps of the lamp intelligent aging test fault diagnosis method of the present invention.

[0048] A typical combination of hardware and software may be a general-purpose computer system with a computer program. When the program is loaded and executed, the computer system is controlled so that the intelligent aging test fault diagnosis method for lamps disclosed in the present invention can be executed.

[0049] It will be understood by those skilled in the art that the intelligent aging test fault diagnosis device for lamps can be embodied as a desktop computer, a notebook, a mobile smart device, etc., but the foregoing is only used as an example and also includes other intelligent fault diagnosis devices equipped with the software application of the present invention.

[0050] It will be understood by those skilled in the art that the intelligent aging test fault diagnosis method for lamps of the present invention can be implemented by hardware, software, or a combination of software and hardware. The present invention can be implemented in a centralized manner in at least one computer system, or in a decentralized manner by different parts distributed in several interconnected computer systems. Any computer system or other device that can implement the intelligent aging test fault diagnosis method for lamps is applicable. The combination of common software and hardware can be a general-purpose computer system with a computer program installed, and the computer system is controlled by installing and executing the program to operate according to the intelligent aging test fault diagnosis method for lamps.

[0051] Corresponding to the embodiment of the method of the present invention, according to another aspect of the present invention, a lamp intelligent aging test fault diagnosis system is also provided, which is the application of the lamp intelligent aging test fault diagnosis method of the present invention in the improvement of computer programs. Through the lamp intelligent aging test fault diagnosis system of the present invention, it is possible to use a computer system to provide intelligent aging tests, which can not only screen qualified products, but also perform fault diagnosis and analysis on unqualified products, and can use big data and artificial intelligence algorithms to improve the long-term quality reliability and stability of LED lamp products.

[0052] The intelligent aging test fault diagnosis system for lamps includes an initial data processing module, a data monitoring module, a power data acquisition module, a data communication module, an abnormal data judgment module, a power data summary module, a power data analysis module, an LED lamp parameter abnormality judgment module and a fault type analysis result module.

[0053] The initial data processing module obtains the information of the LED lamp to be tested, and sets the external conditions such as the test temperature, humidity, and input power according to the use environment of the LED lamp to be tested. The data monitoring module obtains the input power parameters. The power data acquisition module performs acquisition of power data such as current, voltage, power, power factor, waveform, frequency, etc. The data communication module performs data communication.

[0054] Furthermore, the abnormal data judgment module judges whether there is abnormal data in the data; if the judgment result is that there is abnormal data in the data, abnormal data analysis is performed and the abnormal data analysis result is output; if the judgment result is that there is no abnormal data in the data, data sampling is performed continuously, persistently and at multiple time points.

[0055] The power data summary module is configured to perform: summarizing power data such as current, voltage, power, power factor, waveform, frequency, etc. within the aging test time period.

[0056] The power data analysis module is configured to perform: waveform drawing on all power data within the aging test period, and statistical analysis.

[0057] Furthermore, the LED lamp parameter abnormality judgment module judges whether the LED lamp parameter is abnormal.

[0058] Specifically, the LED lamp parameter abnormality judgment module is configured to perform: if the judgment result is normal, then output the normal data analysis result and perform data archiving; if the judgment result is abnormal, then perform the diagnosis of the corresponding fault type through current, voltage, power, power factor, waveform, frequency data, combined with the time point, change curve, and light emission conditions within the aging test period; The fault type analysis result module is configured to execute: outputting a fault type analysis result.

[0059] Furthermore, the intelligent aging test fault diagnosis system for lamps also includes a luminous condition processing unit, which is configured to perform: obtaining the use environment information of the LED lamp to be tested and the set test temperature, humidity, input power and other external condition information from the initial data processing module; monitoring the camera equipment to record the luminous condition; and summarizing the luminous condition during the aging test period.

[0060] Furthermore, the intelligent aging test fault diagnosis system for lamps also includes a data adjustment module, which obtains the abnormal data analysis result output by the LED lamp parameter abnormality judgment module, and adjusts the previous processing modules and input data according to the abnormal data analysis result.

[0061] Furthermore, the lamp intelligent aging test fault diagnosis system also includes a diagnostic database update optimization unit, which is configured to perform the following operations: obtaining the diagnostic result of the fault type of the fault type analysis result module, and feeding it back to the maintenance end to perform maintenance on the LED lamp; obtaining the maintenance data after maintenance by the maintenance end, and verifying the diagnostic result; and continuously updating and optimizing the diagnostic database.

[0062] Furthermore, the intelligent aging test fault diagnosis system for lamps also includes a normal data archiving module, which obtains the normal data analysis results of the LED lamps in the LED lamp parameter abnormality judgment module and performs archiving of the normal data.

[0063] Furthermore, the intelligent aging test fault diagnosis system for lamps also includes a service life prediction analysis module, which obtains the normal data analysis results of the LED lamps in the LED lamp parameter abnormality judgment module and the normal data in the normal data archiving module, performs service life prediction analysis of the LED lamps, and reminds the maintenance end to perform maintenance and replacement in advance.

[0064] Furthermore, the lamp intelligent aging test fault diagnosis system also includes a lamp usage data improvement module and a lamp service life database update optimization module. The lamp usage data improvement module obtains the LED lamp failure data after use and the disassembly fault analysis data input by the maintenance end, and improves the lamp usage data in combination with the aging test data archive analysis. The lamp service life database update optimization module performs update optimization of the lamp service life database based on the improved data of the lamp usage data improvement module, and continuously updates and optimizes the data in the updated and optimized lamp service life database and inputs it into the normal data archive module.

[0065] Furthermore, the intelligent aging test fault diagnosis system for lamps also includes an LED lamp electronic component selection database update unit, which is configured to execute: obtaining data on LED lamp maintenance performed by the maintenance end and archiving and analyzing the aging test data to improve the lamp usage data; determining and feeding back the model specifications and adaptation data of vulnerable components; and updating the LED lamp electronic component selection database.

[0066] It is worth mentioning that even for normal LED lamps, there will be certain power data fluctuations during the aging test process. Based on this, a database of lamp usage is established. In the subsequent use of LED lamps, the use time of the damaged lamps and the actual fault conditions after the lamps are disassembled are recorded, and the database of lamp usage is continuously updated and optimized. It is understandable that the service life of LED lamps can be judged based on the aging test process data of normal LED lamps leaving the factory. If the service life does not meet expectations, the electronic components can be replaced in advance. If the service life meets expectations, it will be delivered and used normally. During use, the maintenance and replacement intervals are set according to the expected life. Under the premise of ensuring the lighting effect, the working time of LED lamps is extended as much as possible, the replacement frequency is reduced, and the maintenance costs are saved. At the same time, the lighting safety of the lighting venue can be guaranteed to avoid emergency repairs caused by accidental damage. The replaced and disassembled LED lamps are returned to the factory for inspection to determine the aging of the internal electronic components, and compared with the previous report of the lamp usage database, and the lamp usage database is continuously updated and optimized.

[0067] It is worth mentioning that the diagnostic database and lamp usage database constructed according to the intelligent aging test fault diagnosis system for lamps can analyze the service life, failure frequency, and mutual matching of each electronic component, establish an option database for electronic components, and provide data support for the subsequent design and production of lamps, so that the overall failure of LED lamps is reduced and the design life is consistent with the actual service life.

[0068] Further, specifically, in other preferred embodiments of the present invention, the intelligent aging test fault diagnosis system for lamps also includes a standard comparison database unit, a test data real-time comparison unit, a monitoring data comparison unit, a fault diagnosis calculation and judgment unit, and a lamp use time estimation unit. The standard comparison database unit performs the establishment of a standard comparison database, the test data real-time comparison unit performs the real-time comparison of the test data, the monitoring data comparison unit obtains the camera monitoring data and performs comparison in combination with the camera monitoring data, the fault diagnosis calculation and judgment unit performs the calculation and judgment of the fault diagnosis, and the lamp use time estimation unit performs the estimation of the use time of the tested LED lamp.

[0069] More specifically, the standard comparison database unit is based on the input current parameters and the aging test duration. The LED lamp bead load will cause resistance changes as the working time progresses, thereby causing current parameters to change. When the heating power and heat dissipation power of the LED lamp bead are balanced, the resistance of the LED lamp bead is basically stable, and thus the current parameters are stable. More specifically, the standard comparison database unit also includes an input current recording module, a stable current processing module, a measurement parameter database module, an input current time variation calculation module, an input current time variation correction module, and a threshold correction constant module. The input current recording module is used to record the input current value data during the aging test. The measurement parameter database module is used to provide measurement parameters accumulated during long-term measurements. The threshold correction constant module is used to provide a threshold correction constant. More specifically, the stable current processing module is used to provide a stable current value I st The input current time variation calculation module obtains the stable current value and calculates the time variation of the input current. The calculation formula is C t =I t / I st The input current time variation correction module obtains measurement parameters from the long-term measurement parameter database, regularly summarizes the data, and corrects the input current time variation C t The value range of C t =[Cminti, Cmaxti]. More specifically, the input current time variation correction module is configured to perform: taking 10% of the minimum data in the i-th test quantity N, and performing the correction of the Cminti value, Cminti=AVERAGE(Cmini1+Cmini2+…+Cminin)×A n=10%×N, where Cminti is the minimum C calculated based on the i-th test data. t value, where Cmini1~Cminin are the actual values ​​of 10% of the minimum data in the i-th test quantity N; more specifically, the input current time variation correction module is configured to execute: take 10% of the maximum data in the i-th test quantity N, and perform the correction of the Cmaxti value, Cmaxti=AVERAGE(Cmaxi1+Cmaxi2+……+Cmaxin)×B n=10%×N, where Cmaxti is the maximum C calculated based on the i-th test data t Value, where Cmaxi1~Cmaxin, is the actual value of 10% of the maximum data in the i-th test quantity N, where A and B are the threshold correction constants provided by the threshold correction constant module. Preferably, A<98%, B>102%, and the threshold is appropriately expanded by about 2% to perform data accommodation.

[0070] More specifically, the test data real-time comparison unit includes an input current data ratio calculation module, a current parameter judgment module, and a judgment parameter output module. The input current data ratio calculation module calculates the ratio of the measured input current to the standard stable current, and the formula is: K t =I int / I t , where K t is the current measured input current I int With the standard stable current I t The current parameter judgment module is configured to obtain the calculation result of the input current data ratio calculation module and perform judgment: when K t Falls into C t =[Cminti, Cmaxti], the current parameters are considered normal; when K t Beyond C t When the current parameter is within the range, it is judged that the current parameter is abnormal, and the LED lamp under test is judged to be abnormal. The judgment parameter output module obtains the judgment result of the current parameter judgment module, and when the current parameter is normal, outputs f1=0, where f1 is the first output judgment parameter; when the current parameter is abnormal, outputs f1=1.

[0071] More specifically, the monitoring data comparison unit includes a data acquisition control module, a calibration module, a luminous recording module, a monitoring data comparison and judgment module, and a camera judgment parameter output module. The data acquisition control module is used to send instructions to control the camera to group-shoot each LED light in the test group and obtain feedback camera data. The calibration module controls the lamp position for calibration and obtains calibration information. The luminous recording module records the LED luminous conditions. The monitoring data comparison and judgment module obtains monitoring data from the data acquisition control module, and performs comparison and judgment in combination with the camera monitoring data. When the monitoring data comparison and judgment module determines that the LED light is normal, the camera judgment parameter output module executes the camera output judgment parameter L mt Output, output L mt =0; when the monitoring data comparison and judgment module determines that the LED light is abnormal, for example, it is completely off or flickering, and the camera captures the off-light moment, the camera judgment parameter output module executes the camera output judgment parameter L mt Output, output L mt =1.

[0072] More specifically, the fault diagnosis calculation and judgment unit includes a first output judgment parameter module, a camera output judgment parameter module, a fault diagnosis activation module, a time range current reading module, a minimum current corresponding fault diagnosis output judgment module, a maximum current corresponding fault diagnosis output judgment module, a fault record feedback module and a comprehensive judgment module.

[0073] The first output judgment parameter module calls the first output judgment parameter f1, and the camera output judgment parameter module calls the camera output judgment parameter L mt The fault diagnosis activation module is configured to: when the first output judgment parameter f1 of the first output judgment parameter module is 1 or the camera output judgment parameter L of the camera output judgment parameter module is mt When f1=1, the fault diagnosis is activated. The time range current reading module is configured as follows: when the fault diagnosis is activated, according to f1=1, or L mt =1, read the standard stable current I t , T=[t-t1, t+t2], where t1 is the time before the fault occurs, preferably 10 seconds; t2 is the time after the fault occurs, preferably 2 seconds.

[0074] The minimum current corresponding fault diagnosis output judgment module is configured to execute: Get the current measured abnormal current minimum value I Tmin , and the current measured abnormal current maximum value I Tmax ; Calculate the current measured abnormal current minimum value I Tmin With the standard stable current I t The ratio W min , the formula is: W min =I Tmin / I t ; Get the minimum value Cminti of the input current change over time t; Execute calculation W min / Cminti, when the calculation result is greater than or equal to 1, the output R=0, R is the fault diagnosis output judgment parameter corresponding to the minimum current; When W min / When Cminti is less than 1, output R=1; When it is detected that R is equal to 0, there is no output, and the fault record feedback module records and feeds back the fault type as a circuit breaker fault.

[0075] When the minimum current corresponding fault diagnosis output judgment parameter R in the minimum current corresponding fault diagnosis output judgment module is greater than 0, the fault record feedback module records the fault type as LED chip fault.

[0076] Further, when the minimum current corresponding fault diagnosis output judgment parameter R in the minimum current corresponding fault diagnosis output judgment module is greater than 0, the maximum current corresponding fault diagnosis output judgment module is started. The maximum current corresponding fault diagnosis output judgment module is configured to execute: Calculate the current maximum value of the measured abnormal current I Tmax With the standard stable current I t The ratio W max , the formula is W max =I Tmax / I t ; Get the maximum value Cmaxti of the time t change of the input current; Execute calculation W max / Cmaxti, when the calculation result is less than or equal to 1, the output S=0, S is the fault diagnosis output judgment parameter corresponding to the maximum current; When W max When / Cmaxti is greater than 1, output S=1.

[0077] Furthermore, the comprehensive judgment module is configured to execute: Obtaining a comparison constant P and a maximum current corresponding fault diagnosis output judgment parameter S in the maximum current corresponding fault diagnosis output judgment module; Calculate S / P, when S / P is less than or equal to 1, the fault record feedback module records and feedbacks the fault type as LED chip breakdown fault; When S / P is greater than 1, the fault record feedback module records and feedbacks the fault type as a high voltage fault of the voltage-stabilized power supply; When R>0 and S=0, the fault record feedback module records and feedbacks the fault type as an LED chip internal resistance increase fault; When R>0 and S=1, the fault record feedback module records and feeds back that the fault type is a short circuit fault of the LED chip.

[0078] In a preferred embodiment, the conventional value of the contrast constant P is 2.

[0079] More specifically, the lamp usage time estimation unit is configured to execute: Calculate the lamp usage time and estimate the adjustment parameter L m , the formula is: L m =LED working stable current I stm / Standard value I st ; Calculate the actual usage time N of the LED light m =N / L m×C, where N is the standard usage time and C is the service life correction parameter; and When it is detected that the estimated lamp usage time has been reached, a reminder message to replace the lamp will be fed back.

[0080] It can be understood by those skilled in the art that the actual working stable current I of the m-th lamp is stm Compared with standard value I st If it is large, the internal heat will be greater, which may lead to accelerated aging.

[0081] like Figure 3-5 As shown, according to another aspect of the present invention, in another preferred embodiment of the present invention, a specific implementation of a lamp intelligent aging test fault diagnosis device that applies the lamp intelligent aging test fault diagnosis method and the lamp intelligent aging test fault diagnosis system of the present invention is also explained. The lamp intelligent aging test fault diagnosis method and the lamp intelligent aging test fault diagnosis system of the present invention can both be applied to the lamp intelligent aging test fault diagnosis device. Specifically, preferably, the lamp intelligent aging test fault diagnosis device includes an aging test control cabinet 1 and an aging test rack 2. A plurality of lamp grids 21 are distributed on the aging test rack 2, with lamp grids 21 on both sides. A terminal 22 is provided at the mouth of each lamp grid 21. The lamp to be tested for aging is placed individually in the lamp grid 21, and then the wire is connected to the terminal 22. The power supply is turned on to start the aging test. The detection instrument in the aging test control cabinet 1 monitors the single-channel power supply parameters and sends the data to the data server 4 through the communication module; the aging test control cabinet 1 is connected to the 220V power supply through the power supply cable 16 to provide input power for the aging test control cabinet 1; the 220V power supply is then divided and passed through each power supply parameter detection instrument, and then connected to each terminal 22 on the aging test rack 2 through the output cable 17; the communication module in the aging test control cabinet 1 sends the collected data to the data server 4 through the communication cable 18.

[0082] Furthermore, the aging test control cabinet 1 also has a built-in display control module 11, which can operate and control the internal detection instruments, and can also access the data server 4 to view the aging test process data of the LED lamp in the specific lamp grid 21, and the fault diagnosis report.

[0083] Furthermore, a monitoring camera 3 is installed on the outside of the aging test frame 2. When the LED lamp is undergoing an aging test, the luminous surface faces the monitoring camera 3. The monitoring camera 3 positions the lamp grid 21 and then identifies the luminous state of the LED lamp. Normal luminescence is the normal state. When the LED lamp is undergoing an aging test and the luminescence of individual LED lamp beads / chips decays, the luminous intensity is reduced. Even when individual LED lamp beads / chips are damaged, they will no longer emit light. This abnormal situation will be captured by the monitoring camera 3, and the information will be recorded and sent to the data server 4 for storage and analysis simultaneously with the information recorded by the power supply parameter detection instrument. If a power failure occurs, all LED lamp beads / chips of a single LED lamp will decay or stop emitting light. This abnormal situation will also be captured by the monitoring camera 3, and the information will be recorded.

[0084] Furthermore, the monitoring personnel can remotely log in to the data server 4 through a terminal such as a computer 5 to view the monitoring data, update the diagnosis database, adjust the diagnosis parameters, etc.

[0085] Furthermore, the aging test control cabinet 1 is provided with a UPS power supply 12 to stabilize the input 220V power; a PLC 13 is provided to provide overall control; the 220V power supply inputs an electrical parameter measuring instrument 14, and then is branched to form an output cable 17 connected to each terminal 22 on the aging test rack 2.

[0086] Furthermore, the communication module 15 stores the parameters collected by the electrical parameter measuring instrument 14 and then sends them to the data server 4 via the communication cable 18; the display control module 11 is connected to the PLC 13 and is connected to the communication module 15 via a communication cable to view the current monitoring data and also access the data server 4.

[0087] Preferably, for example, in a specific preferred embodiment, the intelligent aging test fault diagnosis system for lamps is configured to perform: data collection of the aging process of LED lamps; setting the environmental parameters of the test room, or the aging test rack 2, or the lamp grid 21 according to the use environment of the LED lamp product; for some parts that need to be used in special environments, special test environments can also be constructed, such as low temperature, high temperature, high humidity, etc.; then the aging test of the LED lamp is started; the aging test control cabinet 1 and the monitoring camera 3 work together to collect power supply data and camera monitoring data, store and send them to the data server 4, and use the data to jointly judge whether the LED lamp is abnormal. If normal, it indicates that it can be arranged for shipment and delivery for use. If abnormal, fault diagnosis is performed, and finally the LED lamp is repaired.

[0088] It will be appreciated by those skilled in the art that the present invention has been described with reference to the flowcharts and / or block diagrams of the methods, systems and computer program products according to the present invention. Each box in the flowchart and / or block diagram, and the combination of boxes in the flowchart and / or block diagram, can obviously be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to produce a machine, so that the instructions (the instructions are passed through the processor of the computer or other programmable data processing device) generate a device for implementing the functions specified in one or more boxes in the flowchart and / or block diagram.

[0089] It should be understood by those skilled in the art that the embodiments of the present invention described above and shown in the accompanying drawings are only examples and do not limit the present invention. The purpose of the present invention has been fully and effectively achieved. The functional and structural principles of the present invention have been demonstrated and explained in the embodiments, and the embodiments of the present invention may be deformed or modified in any way without departing from the principles.

Claims

1. A lamp intelligent aging test fault diagnosis method, characterized in that: The lamp intelligent aging test fault diagnosis method comprises the following steps: Obtain information of the lamp to be tested for aging test; set external conditions according to the use environment of the lamp to be tested for aging test; The data monitoring module obtains input power supply parameters; Performing acquisition of power supply data; The data communication module performs data communication; Determine whether there are abnormal data in the data; If the judgment result is that there is abnormal data in the data, abnormal data analysis is performed and the abnormal data analysis result is output; if the judgment result is that there is no abnormal data in the data, data sampling is performed; Perform aggregation of power supply data during the aging test period; Perform waveform drawing and statistical analysis on all power supply data during the aging test period; Determine whether the parameters of the tested lamp are abnormal; if the judgment result is normal, output the normal data analysis result and perform data archiving; if the judgment result is abnormal, perform the diagnosis of the corresponding fault type through the current, voltage, power, power factor, waveform, frequency data, combined with the time point, change curve, and luminous conditions during the aging test period; and output the fault type analysis result; Among them, the fault type analysis results are output to the remote data server. After obtaining the maintenance data of the lamps actually repaired fed back by the maintenance end of the remote data server, the diagnosis results are verified, and the diagnosis database is continuously updated and optimized; The lamp intelligent aging test fault diagnosis method further comprises the following steps of performing fault diagnosis: Retrieve the first output judgment parameter f1 and the camera output judgment parameter L mt Perform troubleshooting; When f1=1, or L mt =1, activate fault diagnosis; According to f1=1, or L mt =1, read the standard stable current I t , T=[t-t1, t+t2], where t1 is the time before the fault occurs and t2 is the time after the fault occurs; Get the current measured abnormal current minimum value I Tmin , and the current measured abnormal current maximum value I Tmax ; Calculate the current measured abnormal current minimum value I Tmin With the standard stable current I t The ratio W min , the formula is: W min =I Tmin / I t ; Get the minimum value Cminti of the input current change over time t; Execute calculation W min / Cminti, when the calculation result is greater than or equal to 1, the output R=0, R is the fault diagnosis output judgment parameter corresponding to the minimum current; When W min / When Cminti is less than 1, output R=1; When it is detected that R is equal to 0, there is no output, and the fault type is recorded and fed back as a circuit breaker fault; When R is greater than 0, the fault type is recorded as LED chip failure, and the current maximum value of the measured abnormal current I is calculated. Tmax With the standard stable current I t The ratio W max , the formula is W max =I Tmax / I t ; Get the maximum value Cmaxti of the time t change of the input current; Execute calculation W max / Cmaxti, when the calculation result is less than or equal to 1, the output S=0, S is the fault diagnosis output judgment parameter corresponding to the maximum current; When W max / When Cmaxti is greater than 1, output S=1; Obtaining a preset comparison constant P and a fault diagnosis output judgment parameter S corresponding to the maximum output current; Calculate S / P. When S / P is less than or equal to 1, record and feedback the fault type as LED chip breakdown fault; When S / P is greater than 1, the fault type is recorded and fed back as a high voltage fault of the voltage stabilized power supply; When R>0 and S=0, the fault type is recorded and reported as LED chip internal resistance increase fault; When R>0 and S=1, the fault type is recorded and fed back as LED chip short circuit fault.

2. The intelligent aging test fault diagnosis method for lamps as claimed in claim 1, characterized in that: The lamp intelligent aging test fault diagnosis method also includes the steps of: monitoring the camera device to record the light emission situation; and summarizing the light emission situation within the aging test time period.

3. The intelligent aging test fault diagnosis method for lamps as claimed in claim 1, characterized in that: The lamp intelligent aging test fault diagnosis method also includes the step of performing a lamp life prediction analysis.

4. The intelligent aging test fault diagnosis method for lamps as claimed in claim 1, characterized in that: The lamp intelligent aging test fault diagnosis method also includes the steps of obtaining normal data analysis results of the lamp under test and performing archiving of normal data.

5. The lamp intelligent aging test fault diagnosis method as claimed in claim 4, characterized in that: The lamp intelligent aging test fault diagnosis method also includes the steps of: performing data analysis and improving the lamp usage database in combination with normal data archived during the aging test.

6. The intelligent aging test fault diagnosis method for lamps as claimed in any one of claims 1 to 5, characterized in that: The lamp intelligent aging test fault diagnosis method also includes the steps of determining the model specifications and adaptation status of vulnerable components of the lamp under test, and updating the lamp electronic component selection database.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the lamp intelligent aging test fault diagnosis method described in any one of claims 1 to 6 are performed.

8. A lamp intelligent aging test fault diagnosis device, characterized in that: include: Memory, for storing software applications, A processor is used to execute the software application, and each program of the software application correspondingly executes each step of the lamp intelligent aging test fault diagnosis method described in any one of claims 1 to 6.

9. A lamp intelligent aging test fault diagnosis system, using the lamp intelligent aging test fault diagnosis method as claimed in any one of claims 1 to 6, characterized in that: The lamp intelligent aging test fault diagnosis system includes an initial data processing module, a data monitoring module, a power data acquisition module, a data communication module, an abnormal data judgment module, a power data summary module, a power data analysis module, a lamp parameter abnormality judgment module and a fault type analysis result module; The initial data processing module obtains the information of the lamp to be tested for aging test, and sets external conditions according to the use environment of the lamp to be tested for aging test; the data monitoring module obtains the input power supply parameters; The power supply data acquisition module acquires power supply data; the data communication module performs data communication; the abnormal data judgment module judges whether there is abnormal data in the data; the power supply data summary module is configured to execute: summarizing the power supply data within the aging test time period; the power supply data analysis module is configured to execute: waveform drawing and statistical analysis of all power supply data within the aging test time period; the lamp parameter abnormality judgment module judges whether the parameters of the lamp under test are abnormal; the fault type analysis result module outputs the fault type analysis result.

10. A lamp intelligent aging test fault diagnosis device, using the lamp intelligent aging test fault diagnosis method as claimed in any one of claims 1 to 6 and the lamp intelligent aging test fault diagnosis system as claimed in claim 9, characterized in that: The intelligent aging test fault diagnosis equipment for lamps comprises an aging test control cabinet and an aging test rack, wherein the aging test rack is provided with a lamp grid for placing the lamps to be tested by the aging test, and the aging test control cabinet performs the control of the aging test; the aging test rack is also provided with a monitoring device, and during the aging test process, the monitoring device locates the lamp grid and then identifies the luminous state of the lamp under test in the lamp grid; during the aging test process, when the lamp bead or chip of the lamp under test has an abnormal situation of luminous attenuation or reduced luminous intensity or is damaged and does not emit light, the abnormal situation is captured and recorded by the monitoring device; the aging test control cabinet is provided with a power supply parameter detection instrument to monitor the power supply parameters; the abnormal situation captured and recorded by the monitoring device and the information monitored and recorded by the power supply parameter detection instrument are synchronously sent to the remote data server to perform data storage and fault diagnosis analysis of the aging test.

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