Infrared image delay test system and method

Abstract

The invention provides an infrared image delay test system and method, and the system comprises an infrared adjustment module which is used for installing an infrared device; the visible light calibration module is used for installing visible light equipment; the light combining module comprises an infrared channel, a visible light channel and a light combining element, the infrared channel is used for transmitting an infrared image light signal of the infrared equipment and enabling the infrared image light signal to enter the light combining element, and the visible light channel is used for transmitting a visible light image light signal of the visible light equipment and enabling the visible light image light signal to enter the light combining element; the light combining element is used for combining light of the infrared channel and the visible light channel and emitting the light through a light outlet; the high-speed camera is used for shooting corresponding to the light outlet to obtain to-be-detected image data; and the processing module is used for analyzing the to-be-detected image data and determining the infrared image delay time according to the imaging separation time difference of the infrared target and the visible light target in the to-be-detected image data.

Description

Technical Field

[0001] The present application relates to the field of infrared imaging technology, and in particular to an infrared image delay testing system and an infrared image delay testing method. Background Art

[0002] With the advancement of infrared technology, infrared is increasingly used in hunting, law enforcement, patrolling and search and rescue. The frame rate of corresponding infrared images is also constantly improving, which can effectively improve the observation of moving or high-frequency targets.

[0003] The determination of infrared image delay is essential for product design, user experience, or the quantification of indicators during the R&D process. However, there is currently no established infrared delay test solution or device that can directly test the image delay of infrared devices.

[0004] The inventor of the present application has learned in the research on how to accurately and efficiently obtain the test method of image delay of infrared equipment that the traditional ballistic calculation method can be used to perform infrared image delay test, by first recording the whole movement time of the horizontal moving target, and then recording the infrared movement time of the horizontal moving target, and then comparing the averages to achieve the purpose of infrared delay test. However, this method is complicated and repetitive to operate, and each target movement state needs to be recorded, and it needs to be repeated many times. The error in each movement process will also be recorded, which is very inconvenient to use and has low accuracy. Summary of the invention

[0005] In order to solve the existing technical problems, the present application provides an infrared image delay testing system and an infrared image delay testing method which have a simple structure and can stably test the infrared image delay of an infrared device faster and more accurately.

[0006] In a first aspect, an infrared image delay testing system is provided, comprising:

[0007] Infrared calibration module, used to install infrared equipment;

[0008] Visible light calibration module, used to install visible light equipment;

[0009] A light combining module, comprising an infrared channel, a visible light channel and a light combining element, wherein the infrared channel is used for transmitting the infrared image light signal of the infrared device and incident on the light combining element, and the visible light channel is used for transmitting the visible light image light signal of the visible light device and incident on the light combining element, and the light combining element combines the light of the infrared channel and the visible light channel and emits the light through a light outlet;

[0010] A high-speed camera, used for photographing the light outlet to obtain image data to be tested;

[0011] The processing module analyzes the image data to be measured, and determines the infrared image delay time according to the imaging separation time difference between the infrared target and the visible light target in the image data to be measured.

[0012] In a second aspect, an infrared image delay test method is provided, which is applied to the infrared image delay test system described in an embodiment of the present application, and the infrared image delay test method includes:

[0013] Acquire the image data to be tested that is obtained by fusing the image light signals of the infrared device and the visible light device;

[0014] The image data to be tested is detected to determine the imaging separation time difference between the infrared target and the visible light target in the image data to be tested, and the infrared image delay time is determined according to the imaging separation time difference.

[0015] The infrared image delay test system provided in the above embodiment is provided with a light combining module including an infrared channel, a visible light channel and a light combining element. The infrared channel is used for transmitting the infrared image light signal of the infrared device installed on the infrared calibration module and incident on the light combining element. The visible light channel is used for transmitting the visible light image light signal of the visible light device installed on the visible light calibration module and incident on the light combining element. The light of the infrared channel and the visible light channel are merged by the light combining element and then emitted through the light outlet. The image data to be tested is obtained by photographing at the corresponding light outlet with a high-speed camera. The image data to be tested is analyzed to determine the imaging separation time difference between the infrared target and the visible light target, thereby determining the infrared image delay time. The cooperation of the light combining module and the high-speed camera can obtain the image data to be tested that simultaneously records the state of the target from overlap to separation in the infrared image and the visible light image. The infrared image delay test system has a simple structure and can stably and quickly and accurately test the infrared image delay of the infrared device.

[0016] The infrared image delay test method provided in the above embodiment belongs to the same concept as the corresponding infrared image delay test system embodiment, and thus has the same technical effect as the corresponding infrared image delay test system embodiment, which will not be described in detail here. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 Schematic diagram of the structure of an infrared image delay testing system in one embodiment.

[0018] Figure 2 FIG. 4 is a schematic diagram of the structure of an infrared image delay testing system in another embodiment.

[0019] Figure 3 Schematic diagram of the structure of the target motion module of the infrared image delay test system in one embodiment.

[0020] Figure 4 for Figure 3 Side view of the target motion module shown.

[0021] Figure 5 Schematic diagram of the process of an infrared image delay testing method in one embodiment.

[0022] Figure 6 FIG. 4 is a flow chart of an infrared image delay testing method in another embodiment.

[0023] Component Symbols

[0024] Light combining system platform 10, infrared calibration module 11, visible light calibration module 12, light combining module 13, infrared channel 131, visible light channel 132, light combining element 133, light outlet 134, reflector 135, light combining surface 136, high-speed camera 14, display module 15, fill light module 16, processing module 17;

[0025] Target motion module 20, motion target 21, visual target 22, light shielding plate 211, division mark 23, heating light source 24;

[0026] Infrared device 30;

[0027] Visible light device 40. DETAILED DESCRIPTION

[0028] The technical solution of the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments of the specification.

[0029] In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings. The described embodiments should not be regarded as limiting the present application. All other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of this application.

[0030] In the following description, the expression "some embodiments" is involved, which describes a subset of all possible embodiments. It should be noted that "some embodiments" may be the same subset or different subsets of all possible embodiments, and may be combined with each other without conflict.

[0031] It should also be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may also be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "inside", "outside", "left", "right" and similar expressions used herein are only for the purpose of explanation in conjunction with the embodiments of the accompanying drawings and do not represent the only implementation method.

[0032] Infrared image delay is indispensable for the product design, user experience, or quantification of performance indicators of infrared equipment during the R&D process. However, the traditional trajectory calculation method is complicated, with large errors and low accuracy. At present, there is no established infrared delay test solution or device that can directly test the image delay of infrared equipment.

[0033] In order to test the image delay of infrared equipment, the inventor of the present application proposed a technical idea of ​​using a light combining module to fuse the image light signals of the infrared equipment and the visible light equipment, and photographing the fused image with a high-speed camera to obtain image data to be tested that can judge the state of the infrared image and the visible light image from overlap to separation. Through the cooperation of the light combining module and the high-speed camera, a technical idea of ​​constructing an infrared image delay test system is proposed.

[0034] Please refer to Figure 1 and Figure 2 , an infrared image delay test system provided by an embodiment of the present application, includes an infrared calibration module 11, a visible light calibration module 12, a high-speed camera 14 and a processing module 17. The infrared calibration module 11 is used to install the infrared device 30. The visible light calibration module 12 is used to install the visible light device 40. The light combining module 13 includes an infrared channel 131, a visible light channel 132 and a light combining element 133. The infrared channel 131 is used for transmitting the infrared image light signal of the infrared device 30 and incident on the light combining element 133. The visible light channel 132 is used for transmitting the visible light image light signal of the visible light device 40 and incident on the light combining element 133. The light combining element 133 combines the light of the infrared channel 131 and the visible light channel 132, and emits the light through the light outlet 134. The high-speed camera 14 is used to capture the image data to be tested corresponding to the light outlet 134. The processing module 17 analyzes the image data to be measured, and determines the infrared image delay time according to the imaging separation time difference between the infrared target and the visible light target in the image data to be measured.

[0035] The infrared channel 131 refers to an optical path formed by the infrared image light signal of the infrared device 30 entering the light combining module 13 and transmitting through the light combining module 13. The visible light channel 132 refers to an optical path formed by the visible light image light signal of the visible light device 40 entering the light combining module 13 and transmitting through the light combining module 13. In an optional example, a corresponding infrared light inlet is provided on the side of the light combining module 13 facing the infrared device 30, and a corresponding visible light inlet is provided on the side facing the visible light device 40, the infrared channel 131 extends from the infrared light inlet toward the light combining element 133, and the visible light channel 132 extends from the visible light inlet toward the light combining element 133.

[0036] The design of the light combining module 13 is that the infrared channel 131 is used for transmitting the infrared image light signal of the infrared device 30 installed on the infrared calibration module 11 and incident on the light combining element 133, and the visible light channel 132 is used for transmitting the visible light image light signal of the visible light device 40 installed on the visible light calibration module 12 and incident on the light combining element 133. The light of the infrared channel 131 and the visible light channel 132 are combined by the light combining element 133 and then emitted through the light outlet 134. The high-speed camera 14 and the light combining module 13 are designed to cooperate with each other. The high-speed camera 14 is used to shoot the light outlet 134 of the light combining module 13 to obtain the image data to be tested. The image data to be tested can simultaneously record the position of the imaging target in the infrared image and the visible light image. The position of the imaging target in the infrared image and the visible light image can be used to intuitively judge the state from overlap to separation of the infrared image and the visible light image. In this way, by analyzing the image data to be tested, the imaging separation time difference of the infrared target and the visible light target can be determined, thereby determining the infrared image delay time.

[0037] In the above embodiment, the infrared image testing system can obtain the image data to be tested that simultaneously records the state of the target from overlap to separation in the infrared image and the visible light image through the cooperation of the light combining module 13 and the high-speed camera 14. The infrared image delay testing system has a simple structure and can stably and quickly and accurately test the infrared image delay of the infrared device 30.

[0038] In some embodiments, the infrared image delay test system includes a light combining system platform 10, which is used to install a light combining module 13, an infrared calibration module 11 and a visible light calibration module 12. The light combining system platform 10 is configured to provide installation and fixation of the light combining module 13, the infrared calibration module 11 and the visible light calibration module 12, thereby forming an integrated working platform. Among them, the infrared device 30 can be any infrared device to be tested for infrared image delay, which is used to receive and converge infrared radiation from a moving target 21 in the target field of view and to form an image, such as an infrared aiming device, an infrared thermal imager or an infrared thermal imaging device. The visible light device 40 is used to image the visible light reflected by the moving target 21 in the target field of view. When it is necessary to test the infrared image delay of a certain infrared device 30, it is only necessary to install the infrared device 30 in the infrared calibration module 11, and select any visible light device 40 for auxiliary testing to be installed in the visible light calibration module 12. The infrared image delay test system has a simple structure and can stably test the infrared image delay time of the infrared device 30 quickly and accurately.

[0039] Optionally, the infrared calibration module 11 includes a height adjustment component and an angle adjustment component, the height adjustment component is used to adjust the installation height of the infrared device 30, and the angle adjustment component is used to adjust the aiming angle and the parallelism of the optical axis of the infrared device 30. The infrared calibration module 11 can be a track structure arranged on the light combining system platform 10 for the infrared device 30 to be installed and fixed so as to adjust the height, aiming angle and parallelism of the optical axis of the infrared device 30, such as including a clamping part for clamping the infrared device 30, a vertical track along which the clamping part can be telescopically moved up and down, and a hinged part that hinges the clamping part to the vertical track. The visible light calibration module 12 is arranged on the light combining system platform 10 for the visible light device 40 to be installed and fixed so as to adjust the height, aiming angle and parallelism of the optical axis of the visible light device 40. Optionally, the visible light calibration module 12 includes a height adjustment component and an angle adjustment component, the height adjustment component is used to adjust the installation height of the visible light device 40, and the angle adjustment component is used to adjust the aiming angle and parallelism of the optical axis of the visible light device 40. The visible light calibration module 12 may have the same structure as the infrared calibration module 11 , and will not be described in detail herein.

[0040] In some embodiments, the light combining module 13 further includes a reflector 135 disposed in the infrared channel 131; the light combining element 133 includes a light combining surface 136 facing the reflector 135, and the reflector 135 is used to reflect the infrared image light signal in the infrared channel 131 toward the light combining surface 136, and the infrared image light signal and the visible light image light signal in the visible light channel 132 are merged when they are transmitted through the light combining surface 136. The reflector 135 is arranged obliquely relative to the infrared channel 131, and includes a reflective surface facing the infrared light inlet, and reflects the infrared image light signal entering from the infrared light inlet toward the light combining surface 136 of the light combining element 133. In this embodiment, the light combining module 13 uses the reflector 135 to change the transmission direction of the infrared image light signal in the infrared channel 131, so that it is emitted toward the light combining surface 136 to be merged with the visible light image light signal transmitted through the light combining surface 136, thereby forming a simple and stable light combining scheme for combining the light in the infrared channel 131 and the visible light channel 132.

[0041] Optionally, the light combining element 133 is a light combining prism, and the light combining prism includes a light incident surface perpendicular to the visible light channel 132 and a light combining surface 136 arranged obliquely relative to the visible light channel 132. Both the light incident surface and the light combining surface 136 are designed to allow visible light to pass through, and the light combining surface 136 is also designed to reflect infrared light. The infrared light reflected by the light combining surface 136 has the same transmission path as the visible light transmitted through, thereby achieving the purpose of two-way light combining. In this embodiment, the cross-section of the light combining prism is a right-angled triangular prism, and the light combining surface 136 is a surface corresponding to the hypotenuse. The projection of the light combining surface 136 on the cross section of the visible light channel 132 is the same shape and size as the cross section of the visible light channel 132; the reflector 135 is arranged obliquely in the infrared channel 131, and the projection of the reflector 135 on the cross section of the infrared channel 131 is the same shape and size as the cross section of the infrared channel 131. The infrared channel 131 and the visible light channel 132 are parallel, and the reflector 135 and the light combining surface 136 are parallel.

[0042] In some embodiments, a fill light module 16 is further provided on the light combining system platform 10, for providing fill light for the shooting of the high-speed camera 14. The fill light module 16 can be a fill light arranged near the light outlet 134 of the light combining module 13, which provides external light source fill light for the shooting of the high-speed camera 14, so as to obtain higher quality image data to be tested. Optionally, a display module 15 is further provided on the light combining system platform 10, for displaying the image data to be tested in real time. The display module 15 can be fixedly arranged on the light combining system platform 10, or it can be a display screen of an electronic device connected through a communication connection, which is more convenient for the observer to observe the position of the imaging target in the infrared image and the visible light image in the image data to be tested, so that the state change from overlap to separation of the infrared image and the visible light image can be intuitively observed.

[0043] In some embodiments, please refer to Figure 3 and Figure 4The infrared image delay test system also includes a target motion module 20, which provides an imaging scene of a moving target 21 and is located in the imaging field of view of the infrared device 30 and the visible light device 40. The target motion module 20 is fixedly installed at a certain position in front of the infrared device 30 and the visible light device 40, and provides a moving picture for the infrared image delay test system by specifying the motion trajectory of the moving target 21. The target motion module 20 is located in the imaging field of view of both the infrared device 30 and the visible light device 40, ensuring that after the infrared device 30 is installed in the infrared calibration module 11, it can smoothly receive infrared radiation from the moving target 21 and obtain an infrared image containing the complete motion trajectory of the moving target 21; at the same time, it ensures that after the visible light device 40 is installed in the visible light calibration module 12, it can smoothly receive visible light reflected from the moving target 21, which can be used to form a visible light image containing the complete motion trajectory of the moving target 21. It should be noted that the infrared calibration module 11 and the visible light calibration module 12 can respectively adjust the position and angle of the infrared device 30 and the visible light device 40 installed thereon, so as to ensure that the infrared radiation and visible light received by the infrared device 30 and the visible light device 40 can be simultaneously transmitted to the light combining module 13, and after the reflection and refraction of the optical lens group in the light combining module 13, the two paths of light are finally combined and output through the light outlet 134 of the light combining module 13, and the high-speed camera 14 takes pictures at the light outlet 134 to record every step of the complete motion trajectory of the moving target 21. Frame image, due to the delay of infrared image relative to visible light image, the high-speed camera 14 is aimed at the light outlet 134 of the light combining module 13, and the focal length of the objective lens of the high-speed camera 14 is adjusted to observe the fused image of appropriate size, and the picture output by the moving target 21 through the light combining module 13 is recorded. The image data to be tested is obtained by shooting at the light outlet 134, and the frame rate display difference between the infrared image and the visible light image can be analyzed. Then, by analyzing the number of frame rates that are different between the infrared image and the visible light image, the delay between the infrared image and the visible light image can be analyzed by shooting the frame rate speed with the high-speed camera 14.

[0044] Optionally, the target motion module 20 includes a visual target 22 with a dividing mark 23 and a moving light shielding plate 211, and the moving light shielding plate 211 moves up and down along the visual target 22 at a preset speed, and the moving target 21 in the visible light image and the infrared image respectively reaches the designated position of the dividing mark 23 as the starting position and the ending position of the motion trajectory. For the moving target 21 in the infrared image delay test system, since the refresh rate of the infrared image is far less than the refresh rate of the visible light image in the visible light device 40, when designing the target motion module 20, it should be considered that the moving target 21 has good imaging capabilities in both the infrared image and the visible light image; and the moving speed of the moving target 21 in the infrared and visible light optical path systems should also be appropriate. If it is too fast, it will leave a trailing image in the infrared image system, and the starting and ending positions of the infrared image delay cannot be determined; if the moving target 21 is too slow, the complete motion trajectory (i.e., a full motion process) of the moving target 21 may not be captured within the shooting time specified by the high-speed camera 14. In this embodiment, a visual target 22 provided with a division mark 23 is used, and a moving light shielding plate 211 is moved up and down relative to the division mark 23. The division mark 23 is imaged by using an infrared device 30 and a visible light device 40 respectively, and the moving light shielding plate 211 in the visible light image and the infrared image moves to the designated position that blocks the division mark 23 as the starting position and the ending position of the motion trajectory.

[0045] Optionally, the division mark 23 is a light-transmitting slit of a preset division shape provided on the visual target 22, and the target motion module 20 further includes a heat source 24 provided behind the visual target 22. In this embodiment, the design of the moving target 21 in the target motion module 20 reflects the following design points: 1. The visual target 22 commonly used in the observation field of the infrared device 30 is used as the carrier of the moving target 21, and by setting up a cross-divided target surface and arranging a heat source 24 behind the target surface, an image can be formed in the infrared and visible light paths through the target slit; 2. A black light-shielding baffle 211 that can move up and down is placed in front of the visual target 22, and the speed of the light-shielding baffle 211 moving up and down can be controlled manually; 3. When the lower end of the light-shielding baffle 211 is seen in the visible light device 40 to just cover the horizontal light-transmitting slit, the timing starts; 4. Assuming that after n pictures, the light-transmitting slit just disappears in the infrared image, it means that the delay is n milliseconds. Among them, the high-speed camera 14 can collect pictures at equal intervals, such as collecting one picture every millisecond, and the timing can be directly started when the light shielding sheet 211 in the visible light image blocks the light-transmitting slit below the cross-scale, and the light shielding sheet 211 in the infrared image blocks the light-transmitting slit below the cross-scale as the end time. After the light shielding sheet 211 in the infrared image blocks the light-transmitting slit, the delay can be automatically calculated and displayed on the display module 15. Moreover, the error can also be analyzed and calculated. The width design of the light-transmitting slit in this target motion module 20 can be easily adjusted. The light-transmitting slit is designed to be very thin. For the multiple frames of pictures taken by the high-speed camera 14, it is easier to find the starting key frame frequency, which is also helpful for the error control of the infrared image delay test.

[0046] See also Figure 5 On the other hand, the embodiment of the present application further provides an infrared image delay test method, which can be applied to the infrared image delay test system described in the above embodiment. The infrared image delay test method includes:

[0047] S101, obtaining image data to be measured obtained by fusing image light signals of an infrared device and a visible light device;

[0048] S103, detecting the image data to be tested, determining the imaging separation time difference between the infrared target and the visible light target in the image data to be tested, and determining the infrared image delay time according to the imaging separation time difference.

[0049] It should be noted that in the infrared image delay test system, through the cooperation of the light combining module and the high-speed camera, the high-speed camera can collect in real time the image data to be tested obtained by fusing the image light signals of the infrared device and the visible light device. The processing module that uses the image data to be tested taken by the high-speed camera for detection and analysis to determine the infrared image delay time can be an independent intelligent device with computing and storage functions, or it can be a processor integrated in the high-speed camera.

[0050] Optionally, step S103 includes:

[0051] Detecting the image data to be tested, determining that an imaging image frame of a visible light target in the image data to be tested is a first key frame, and an imaging image frame of an infrared target is a second key frame;

[0052] Based on the frame rate difference between the first key frame and the second key frame, the imaging separation time difference of the infrared target and the visible light target in the image data to be measured is determined, and the infrared image delay time is determined according to the imaging separation time difference.

[0053] The imaging separation time difference of the infrared target and the visible light target in the image data to be tested refers to the time difference when the moving target in the visible light image and the infrared image moves to the preset end position of the motion trajectory. Taking the target motion module designed as the light shielding plate moves to block the light-transmitting slit below the cross division as the end position of the motion trajectory as an example, the imaging separation time difference of the infrared target and the visible light target in the image data to be tested refers to the time difference of the key image frames corresponding to the light shielding plates in the visible light image and the infrared image moving to block the light-transmitting slit below the division mark.

[0054] In some embodiments, the infrared image delay testing method further includes:

[0055] Based on the adjustment of the visual magnification of the infrared device and / or based on the adjustment of the magnification of the visible light image, the infrared image of the infrared device and the visible light image of the visible light device are made to have the same size; and / or,

[0056] Based on the adjustment of the infrared calibration module, the center of the infrared image of the infrared device coincides with the optical axis of the infrared channel, and based on the adjustment of the visible light calibration module, the center of the visible light image of the visible light device coincides with the optical axis of the visible light channel.

[0057] In this embodiment, the infrared image delay test method first needs to complete the target motion module of the preset motion trajectory by building a moving target, and use the motion trajectory of the moving target as the observation target. The construction of a complete motion trajectory of the moving target in the target motion module can adopt automatic landing motion or track sliding motion, requiring that the moving target can have a complete and coherent motion trajectory within the field of view area, and can support imaging in the imaging field of both the infrared device and the visible light device.

[0058] For infrared devices with front-end function, according to the front-end field of view matching requirements, the infrared device should meet the magnification ratio By adjusting the focal length f of the infrared objective lens 物 , collimator focal length f 目, the infrared image can be clearly observed. In the observation window of the light combining module (the image window shot based on the light outlet), the size of the infrared image and the visible light image is 1:1.

[0059] For infrared devices without front-end functions, the visual magnification cannot be 1. The image of the visible light channel can be magnified to the same size as the infrared image by adjusting the magnification of the visible light device. In the observation window of the light-combining module, the infrared image and visible light image of the moving target are the same size.

[0060] The adjustment of the infrared calibration module and the visible light calibration module is used to achieve the overlap of the optical axis adjustment of the infrared device and the visible light device, so as to ensure that the two optical paths of the infrared path and the visible light path input to the light combining module can overlap when the light combining module outputs, and the infrared image and the visible light image are fused in visual effect. When adjusting, the infrared device and the visible light device are usually required to be adjusted synchronously. The infrared device can adjust the position of the infrared image on the display screen to achieve the adjustment of the infrared optical path; in addition, the installation position of the visible light device can be adjusted, and the adjustment of the visible light optical path can be achieved by fine-tuning the installation position; the installation position of the light combining module is also fine-tuned, so that the two optical paths are finally merged and output normally through the observation window.

[0061] The infrared image delay test method provided in the above embodiment adjusts the distance between the light combining system platform and the target motion module according to the imaging field of view of the infrared device, and then adjusts to the front mode by matching the focal length of the infrared objective lens, the focal length of the eyepiece collimator, and the diagonal size of the OLED display area, or using the front software function of the infrared device. The adjustment function provided by the front mode ensures that the optical system magnification is 1 as much as possible; the purpose is to coincide with the infrared image and the infrared channel optical axis in the light combining module, and synchronously adjust the visible light channel optical axis of the light combining module to be coaxial with the observation optical path of the moving target; through the light combining prism in the light combining module, the light of the infrared channel and the visible light channel are combined into one and visually fused; then, the collimator lens is set in the light combining module to transmit the fused light to the objective lens of the high-speed camera, and the frame frequency difference between the target imaged by the visible light channel and the target imaged by the infrared channel is obtained by shooting and recording with the high-speed camera, and then analyzing the video frame or frame picture, which is the delay time of the infrared image through conversion.

[0062] In order to have a more comprehensive understanding of the infrared image delay test method provided in the embodiment of the present application, please refer to Figure 6 ,by Figure 2 The structure of the infrared image delay test system shown in FIG. 1 is used as an example for explanation. The infrared image test method comprises the following steps:

[0063] S11, build a target motion module, and use the motion target to complete the preset motion trajectory as the observation target.

[0064] Among them, in the target motion module, the size of the moving target must meet the imaging field of view range of the infrared device and the visible light device.

[0065] S12, adjusting the distance between the light combining system platform and the target motion module according to the imaging field of view of the infrared device, and making the infrared image and the visible light image overlap by adjusting the magnification of the infrared device or the magnification of the visible light device.

[0066] S13, calibrate the position and / or angle of the infrared device so that the infrared image coincides with the optical axis of the infrared channel in the light combining module; synchronously calibrate the position and / or angle of the visible light device so that the moving target observation optical path identified by the visible light device coincides with the optical axis of the visible light channel in the light combining module.

[0067] S14, combining the light from the infrared channel and the visible light channel into one through a light combining element in the light combining module, and visually fusing the infrared image and the visible light image.

[0068] S15, the light combining module outputs the fused light through the light outlet, and the high-speed camera takes pictures and records at the corresponding light outlet to obtain the image data to be tested.

[0069] S16, analyzing the image data to be measured to obtain the frame rate difference between the target in the visible light channel and the target in the infrared channel, which is converted into the infrared image delay time.

[0070] The infrared image delay testing method provided in the above embodiment has at least the following characteristics:

[0071] First, the same moving target is observed by the infrared device and the visible light device under test, and the two paths of light of infrared image imaging and visible light image imaging are merged into one path through the light combining module. The infrared image and the visible light image are merged into one image, and then photographed through the light outlet of the light combining module corresponding to the high-speed camera. It can be observed that the moving target is slowly separated in the infrared image and the visible light image. By recording these picture frames, the delay size of the infrared image can be converted.

[0072] Second, the target motion module uses the commonly used visual target in the imaging field of infrared equipment to establish a cross-scale target surface. A heating light source is set behind the target surface, which can be imaged in the infrared and visible light paths through the target slits. A black light-shielding plate that can be moved up and down is placed in front of the visual target. The light-shielding plate can be manually controlled to move up and down. When the visible light sees that the lower end of the light-shielding plate just covers the horizontal light-transmitting slit, the timing starts. Assuming that after n pictures, the light-transmitting slit just disappears in the infrared image, it means that the delay is n milliseconds. In this way, the visible light image and the infrared image can be intuitively observed to change from overlapping to separated states, and the moving target does not need to repeat the movement. At the same time, recording the changes in the state of the moving target in the visible light image and the infrared image can allow the infrared image delay test system to obtain the desired delay results faster and more accurately.

[0073] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or device including the element.

[0074] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), including a number of instructions for a terminal (which can be a mobile phone, computer, server, vehicle-mounted equipment, etc.) to execute the methods of various embodiments of the present invention.

[0075] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. An infrared image delay test system, characterized in that: include: An infrared calibration module (11) for installing an infrared device (30); A visible light calibration module (12) used for installing a visible light device (40); A light combining module (13), comprising an infrared channel (131), a visible light channel (132) and a light combining element (133), wherein the infrared channel (131) is used for transmitting infrared image light signals of the infrared device (30) and incident on the light combining element (133), and the visible light channel (132) is used for transmitting visible light image light signals of the visible light device (40) and incident on the light combining element (133), and the light combining element (133) combines the light of the infrared channel (131) and the visible light channel (132), and emits the light through a light outlet (134); A high-speed camera (14) is used to photograph the light outlet (134) to obtain image data to be measured; The processing module (17) analyzes the image data to be measured, and determines the infrared image delay time according to the imaging separation time difference between the infrared target and the visible light target in the image data to be measured.

2. The infrared image delay test system according to claim 1, characterized in that: It also includes a light combining system platform (10) for installing the light combining module (13), the infrared calibration module (11) and the visible light calibration module (12); The infrared calibration module (11) comprises a height adjustment component and an angle adjustment component, wherein the height adjustment component is used to adjust the installation height of the infrared device (30), and the angle adjustment component is used to adjust the aiming angle and optical axis parallelism of the infrared device (30); The visible light calibration module (12) comprises a height adjustment component and an angle adjustment component, the height adjustment component is used to adjust the installation height of the visible light device (40), and the angle adjustment component is used to adjust the aiming angle and optical axis parallelism of the visible light device (40).

3. The infrared image delay test system according to claim 2, characterized in that: The light combining system platform (10) is further provided with a fill light module (16) for providing fill light for the shooting of the high-speed camera (14); and / or, The light combining system platform (10) is also provided with a display module (15) for displaying the image data to be measured in real time.

4. The infrared image delay test system according to any one of claims 1 to 3, characterized in that: It also includes a target motion module (20) that provides an imaging scene of a moving target (21) and is located within the imaging field of view of the infrared device (30) and the visible light device (40); The target motion module (20) comprises a visual target (22) provided with a dividing mark (23) and a moving light shielding plate (211), wherein the moving light shielding plate (211) moves up and down along the visual target (22) at a preset speed, and the positions where the moving light shielding plate (211) reaches the dividing mark (23) in the visible light image and the infrared image are respectively used as the starting position and the ending position of the motion trajectory.

5. The infrared image delay test system according to claim 4, characterized in that: The graduation mark (23) is a light-transmitting slit in a preset graduation shape provided on the visual target (22), and the target motion module (20) further comprises a heat-generating light source (24) provided behind the visual target (22).

6. The infrared image delay test system according to any one of claims 1 to 3, characterized in that: The light combining module (13) further comprises a reflecting mirror (135) arranged in the infrared channel (131); The light combining element (133) comprises a light combining surface (136) facing the reflector (135), and the reflector (135) is used to reflect the infrared image light signal in the infrared channel (131) toward the light combining surface (136), and the infrared image light signal and the visible light image light signal in the visible light channel (132) are fused when they are transmitted through the light combining surface (136).

7. The infrared image delay test system according to claim 6, characterized in that: The light combining element (133) is a light combining prism, and the light combining prism comprises a light incident surface perpendicular to the visible light channel (132) and a light combining surface (136) arranged obliquely relative to the visible light channel (132).

8. An infrared image delay test method, applied to the infrared image delay test system according to any one of claims 1 to 7, characterized in that: include: Acquire the image data to be tested that is obtained by fusing the image light signals of the infrared device and the visible light device; The image data to be tested is detected to determine the imaging separation time difference between the infrared target and the visible light target in the image data to be tested, and the infrared image delay time is determined according to the imaging separation time difference.

9. The infrared image delay testing method according to claim 8, characterized in that: The detecting the image data to be tested, determining the imaging separation time difference between the infrared target and the visible light target in the image data to be tested, and determining the infrared image delay time according to the imaging separation time difference, comprises: Detecting the image data to be tested, determining that an imaging image frame of a visible light target in the image data to be tested is a first key frame, and an imaging image frame of an infrared target is a second key frame; Based on the frame rate difference between the first key frame and the second key frame, the imaging separation time difference of the infrared target and the visible light target in the image data to be measured is determined, and the infrared image delay time is determined according to the imaging separation time difference.

10. The infrared image delay testing method according to claim 9, characterized in that: Also includes: Based on the adjustment of the visual magnification of the infrared device and / or based on the adjustment of the magnification of the visible light image, the infrared image of the infrared device and the visible light image of the visible light device are made to have the same size; and / or, Based on the adjustment of the infrared calibration module, the center of the infrared image of the infrared device coincides with the optical axis of the infrared channel, and based on the adjustment of the visible light calibration module, the center of the visible light image of the visible light device coincides with the optical axis of the visible light channel.

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