Chip parameter self-adaption method based on regular card swiping and storage medium

Abstract

The invention provides a chip parameter self-adaption method based on regular card swiping and a storage medium, and relates to the technical field of computers. According to the method, card swiping detection is automatically carried out at the preset time interval, the frequency and time consumption of manual testing are reduced, and the data acquisition speed is increased; a preset monitoring program is used for automatically collecting card reading data, so that the requirement of manual intervention is further reduced, and rapid feedback of a detection result is realized; when a card reading error is detected, the chip parameters are automatically adjusted according to the preset parameter adjustment rule, so that the tedious process and time consumption of manual adaptation are avoided; through repeated and continuous detection and adjustment until the preset card reading condition is met, the accuracy and reliability of the test result are ensured, meanwhile, the test period is greatly shortened, the labor cost and the time cost are reduced, and therefore efficient and accurate chip testing is achieved.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a chip parameter self-adaptation method and storage medium based on timed card swiping. Background Art

[0002] In chip testing projects, due to the diversity of hardware solutions, there may be some interference with the antenna, resulting in instability in NFC card reading and writing, so the above problems often need to be corrected from the software. The NXP PN553 chip provides some parameters that developers can adapt. However, these parameters have a large range of values ​​and need to be manually adapted and then tested. This chip testing method requires engineers and testers to spend a lot of time, resulting in high labor and time costs for chip testing and low testing efficiency.

[0003] Therefore, how to improve chip testing efficiency has become a technical problem that needs to be solved urgently. Summary of the invention

[0004] The present application provides a chip parameter self-adaptation method and medium based on timed card swiping, aiming to improve chip testing efficiency.

[0005] In a first aspect, the present application provides a chip parameter self-adaptation method based on timed card swiping, the chip parameter self-adaptation method based on timed card swiping comprising the following steps:

[0006] Based on the preset time interval, the current chip parameters of the target chip are tested by swiping the card to obtain the chip reading data;

[0007] Based on a preset monitoring program, data monitoring is performed on the chip card reading data to obtain a card reading detection result;

[0008] If there is card reading error information in the card reading detection result, the current chip parameters are adjusted based on preset parameter adjustment rules to obtain adjusted chip parameters;

[0009] The adjusted chip parameters are subjected to card swiping detection and monitoring operations until the card reading detection result meets the preset card reading condition, and the adjusted chip parameters meeting the preset card reading condition are determined as the target chip parameters of the target chip.

[0010] In a second aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the steps of the chip parameter self-adaptation method based on timed card swiping as described above are implemented.

[0011] The present application provides a chip parameter self-adaptation method, device, computer equipment and storage medium based on timed card swiping. The method of the present application includes: based on a preset time interval, performing a card swiping detection on the current chip parameters of the target chip to obtain chip card reading data; based on a preset monitoring program, performing data monitoring on the chip card reading data to obtain a card reading detection result; if there is card reading error information in the card reading detection result, based on a preset parameter adjustment rule, adjusting the current chip parameters to obtain adjusted chip parameters; performing a card swiping detection and monitoring operation on the adjusted chip parameters until the card reading detection result meets the preset card reading condition, determining that the adjusted chip parameters that meet the preset card reading condition are the target chip parameters of the target chip. Through the above method, the present application automatically performs card swiping detection at preset time intervals, thereby reducing the frequency and time consumption of manual testing and speeding up data collection; using a preset monitoring program to automatically collect card reading data, further reducing the need for manual intervention and achieving rapid feedback on test results; when a card reading error is detected, the chip parameters are automatically adjusted according to preset parameter adjustment rules, avoiding the tedious process and time consumption of manual adaptation; through repeated and continuous detection and adjustment until the preset card reading conditions are met, the accuracy and reliability of the test results are ensured, while the test cycle is greatly shortened, labor costs and time costs are reduced, thereby achieving efficient and accurate chip testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0013] Figure 1 A flowchart of a first embodiment of a chip parameter self-adaptation method based on timed card swiping provided by the present application;

[0014] Figure 2 A schematic diagram of the structure of an NFC reader / writer card and a target chip installation method provided in this application;

[0015] Figure 3 A schematic diagram of a chip card reading data abnormal information identification process provided in an embodiment of the present application;

[0016] Figure 4 A schematic flow chart of a second embodiment of a chip parameter self-adaptation method based on timed card swiping provided by the present application;

[0017] Figure 5 It is a structural schematic diagram of a first embodiment of a chip parameter self-adaptation device based on timed card swiping provided by the present application;

[0018] Figure 6 It is a schematic block diagram of the structure of a computer device provided in an embodiment of the present application.

[0019] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0021] The flowcharts shown in the accompanying drawings are only examples and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps may also be decomposed, combined or partially merged, so the actual execution order may change according to actual conditions.

[0022] In conjunction with the accompanying drawings, some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0023] Please refer to Figure 1 , Figure 1 This is a flow chart of the first embodiment of a chip parameter self-adaptation method based on timed card swiping provided in the present application.

[0024] like Figure 1 As shown, the chip parameter self-adaptation method based on timed card swiping includes steps S101 to S104.

[0025] S101, based on a preset time interval, performing a card swiping test on the current chip parameters of the target chip to obtain chip card reading data;

[0026] The embodiments of the present application use the near field communication chip PN553 provided by NXP (hereinafter referred to as NXP PN553 chip) as the target chip for specific example description.

[0027] In one embodiment, in order to quickly identify a suitable parameter, the card is swiped at a fixed time by the rotation of the turntable. The motor drives the turntable to rotate at a fixed speed, and the NFC (near field communication) reader / writer card is set at a fixed position on the surface of the turntable, so that the NXP PN553 chip of the terminal can read the information of the NFC reader / writer card at a set time interval.

[0028] Specifically, the turntable is mounted on a fixed carrier, the NFC reader / writer card is fixed on another fixed carrier, and the NFC reader / writer card is fixedly mounted on the surface of the turntable, such as Figure 2 As shown, the NFC reader-writer card can be installed in a certain sector area with the center of the turntable as the vertex. The target chip can be installed on another fixed bracket. When the target chip is installed on the fixed bracket, the plane where the target chip is located remains parallel to the plane where the turntable surface is located, and a certain spacing distance is separated. The spacing distance can ensure that the NFC reader-writer card can clearly identify and scan the target chip. Preferably, during the rotation of the turntable, the center of the NFC reader-writer card can be vertically overlapped with the center of the target chip.

[0029] Understandably, Figure 2 a and Figure 2 b is an example diagram of two installation methods of the NFC card reader, turntable and target chip provided in the embodiments of the present application, and does not limit the actual implementation method. As long as the installation method can realize the above-mentioned card swiping function, it should be within the protection scope of the present application.

[0030] For example, the motor drives the turntable to rotate at a fixed speed, so that the target chip can scan the NFC reader-writer card at fixed time intervals and read the information in the NFC reader-writer card. Each time the card is swiped, the card reading data of the target chip is recorded, including the card reading time, the read content, etc. At the same time, the rotation time, rotation speed and number of rotations of the turntable are also recorded, so that the number of convergences of the NFC reader-writer card and the target chip (the number of card readings) can be calculated. For example, if the turntable speed is set to rotate once every 10 seconds, it means that the target chip should read the card once every 10 seconds; when the turntable rotates for one minute, the target chip should read the card 5 times or 6 times (determined by the initial card reading time). According to the card reading data of the target chip and the turntable rotation data, the chip card reading data is obtained.

[0031] S102, based on a preset monitoring program, monitoring the chip card reading data to obtain a card reading detection result;

[0032] In one embodiment, the collected chip card reading data can be monitored through a preset monitoring program to determine whether the target chip reads the card at a preset time interval. For example, if the turntable rotates once every 10 seconds, it means that the preset time interval for the target chip to read the card is 10 seconds, that is, the target chip should read the card once every 10 seconds starting from the first card reading.

[0033] Specifically, the card reading time and card reading data of each successful card reading of the target chip in the chip card reading data are identified, and then the card reading time and card reading data are identified according to the preset card reading judgment rule to obtain the card reading detection result.

[0034] The card reading data may include the register value read by the target chip, and the register value includes a gain value and a threshold value, etc.

[0035] For ease of understanding, the present application embodiment provides the following data to explain the card reading data of the target chip:

[0036] (1) The following are the register values ​​of PN553 for A card:

[0037] A0,0D,06,34,44,66,0B,

[0038] A0,0D,06,34,2D,DC,20,

[0039] "34,44" means the next digit is the gain value, and "34,2D" means the next 2 digits are the threshold value.

[0040] (2) The following are the register values ​​of PN553 for B card:

[0041] A0,0D,06,4C,44,66,0A,

[0042] A0,0D,06,4C,2D,15,30,

[0043] Among them, "4C,44" means that the next digit is the gain value, and "4C,2D" means that the next two digits are the threshold value.

[0044] (3) The following are the register values ​​of PN553 for F card:

[0045] A0,0D,06,5E,44,55,08,

[0046] A0,0D,06,5E,2D,0D,40,

[0047] "5E,44" means the next digit is the gain value, and "5E,2D" means the next two digits are the threshold value.

[0048] Generally, NXP allows registers for gain and threshold values ​​to be set. The gain value range is from 00 to FF, with 00, 11, 22, 33...EE, FF available. The threshold value range is from 10 to F0, with 10, 20, 30...E0, F0 available. The two can be combined freely, so there are 240 combinations. When the value is not appropriate, reading the card of this type is likely to result in no reading or short-term continuous reading, which is wrong. Therefore, the chip card reading data of the target chip (such as NXPPN553) can be tested according to the above rules to obtain the card reading test results.

[0049] Furthermore, based on the card reading detection result, the card reading frequency of the target chip is obtained, wherein the card reading frequency includes the number of card readings and the card reading time; when the card reading frequency does not meet the preset card reading frequency range, it is determined that the card reading error information exists in the card reading detection result.

[0050] In one embodiment, according to the card reading detection result of the NXP PN553 chip, it is possible to analyze whether there is error information in the card reading process. Card reading error information may include situations such as not reading the card or reading the card multiple times in a short period of time. These situations can be identified by detecting the card reading frequency and the card reading time.

[0051] Specifically, according to the card reading test result, the card reading time of each card reading of the target chip and the total number of card readings are extracted. By dividing the total card reading time by the preset time interval, the theoretical number of card readings of the target chip can be calculated. If the total number of card readings obtained by the card reading test result is inconsistent with the theoretical number of card readings, it means that the target chip has missed readings (the total number of card readings is less than the theoretical number of card readings) or continuous readings (the total number of card readings is greater than the theoretical number of card readings), that is, there is a card reading error message.

[0052] Specifically, the card reading time interval of the target chip can be calculated based on the card reading time of two adjacent card readings. If the card reading time interval of the target chip is inconsistent with the preset time interval and the time error is large, it can be determined that there is card reading error information in the card reading detection result.

[0053] Further, based on the card reading frequency, the card reading time interval between two adjacent card readings is determined; when the card reading time interval is less than the first time interval, it is determined that the card reading error information exists in the card reading detection result; when the card reading time interval is greater than the first time interval and no card reading operation is detected within a preset time range after the current card reading time, it is determined that the card reading error information exists in the card reading detection result.

[0054] like Figure 3 As shown, according to the card reading frequency, the card reading time interval between two adjacent card readings is calculated. If the card reading time interval is less than the first time interval (such as 2 seconds), it means that the card reading operation is too frequent. Then it can be determined that there is a continuous reading phenomenon in the target chip, that is, multiple consecutive card readings in a short period of time, and it is determined that there is card reading error information in the card reading detection result.

[0055] If the card reading time interval is greater than the first time interval, but there is no card reading data for a long time after a card reading (such as no card reading for 1 minute after a card reading), that is, a card reading operation is expected within a certain period of time, but it does not actually occur, which may mean that the card reading operation fails or the device fails to respond correctly, and it is determined that the target chip has a card reading failure phenomenon. Therefore, it can be determined that the card reading error information exists in the card reading test result. If there is no card reading for one minute or a short period of continuous card reading, adjust the parameters and continue the test until a set of reasonable parameters is obtained.

[0056] S103: if there is card reading error information in the card reading detection result, adjust the current chip parameters based on preset parameter adjustment rules to obtain adjusted chip parameters;

[0057] First, it is necessary to determine how to adjust the parameters of the NXP PN553 chip according to the preset parameter adjustment rules. The parameter adjustment rules may include the adjustment strategy of the gain value and the threshold value, and the circumstances under which the adjustment is required.

[0058] Under normal circumstances, the target chip (such as NXP PN553 chip) should read the card once at a preset time interval (10 seconds). If the card is read too many or too few times, it means that there is a problem with the matching of the terminal's NXP PN553 chip and the NFC card. This problem is a serious problem and the chip parameters can be modified directly.

[0059] Specifically, for serious problems, the gain value and threshold value can be modified randomly or sequentially, and the value taken needs to be different from the previous one to try to solve the matching problem. The settable gain value ranges from 00 to FF, and 00, 11, 22, 33...EE, FF are available respectively. The settable threshold value ranges from 10 to F0, and 10, 20, 30...E0, F0 are available respectively. The two can be freely combined.

[0060] When implementing parameter adjustments, you need to ensure that the adjusted parameter combination is valid and does not exceed the acceptable range of the chip. Specifically, you can refer to the technical documents and application notes provided by NXP to ensure the correctness of the parameter adjustments.

[0061] S104, performing card swiping detection and monitoring operations on the adjusted chip parameters until the card reading detection result meets the preset card reading condition, and determining the adjusted chip parameters that meet the preset card reading condition as the target chip parameters of the target chip.

[0062] After adjusting the parameters, a test is required to verify whether the card reading performance is improved, that is, repeating the card reading detection operation process from step S101 to step S103, including checking whether the number of card readings meets the preset time interval (for example, reading the card once every 10 seconds), and whether there is still any card reading error information, etc.

[0063] Generally, parameter adjustment is not a one-time process. It requires continuous monitoring of the card reading performance and further optimization based on actual conditions. For example, multiple adjustments and tests are performed until the best parameter settings are found as the target chip parameters of the target chip, that is, the best threshold value and gain value.

[0064] The present embodiment provides a chip parameter self-adaptation method based on timed card swiping. The present application method automatically performs card swiping detection at preset time intervals, thereby reducing the frequency and time consumption of manual testing and speeding up data collection. The preset monitoring program is used to automatically collect card reading data, further reducing the need for manual intervention and achieving rapid feedback on the test results. When a card reading error is detected, the chip parameters are automatically adjusted according to preset parameter adjustment rules, avoiding the tedious process and time consumption of manual adaptation. Through repeated and continuous detection and adjustment until the preset card reading conditions are met, the accuracy and reliability of the test results are ensured, while the test cycle is greatly shortened, and the labor cost and time cost are reduced, thereby achieving efficient and accurate chip testing.

[0065] Please refer to Figure 4 , Figure 4 A schematic flow chart of a second embodiment of a particle grid-based dynamic special effects rendering method provided in the present application.

[0066] In this embodiment, Figure 4 As shown, based on the above Figure 1 In the illustrated embodiment, after S102, the following further includes:

[0067] S201: when the card reading error information does not exist in the card reading detection result but abnormal feedback information exists, determining the abnormality type based on the abnormal feedback information;

[0068] The abnormal feedback information includes at least one preset abnormal code information, and the abnormal code information includes unstable antenna performance, chip current overload, abnormal chip restart and automatic gain control value detection;

[0069] In one embodiment, although the card is swiped successfully during the test, if the information fed back by the chip during the card swiping process contains errors, it is also judged as not meeting the standards.

[0070] The error information that may exist in the target chip card reading process can be collected in advance, including the abnormal code information, error name, error characteristics and other information that can be used to identify these errors, and then match and identify these error identification information in the collected card reading test results. If these error identification information are matched in the card reading test results, abnormal feedback information is generated. The abnormal feedback information may include abnormal code information, error type, error name and other information.

[0071] Specifically, the abnormal feedback information may include the following four types of error information:

[0072] a) 600701A1 error means that the antenna performance is not stable enough and the parameters are not suitable, so further adjustment is required. The current program determines that the current parameters do not meet the requirements if 600701A1 errors occur more than 5 times in one minute.

[0073] b) 600701E3 error means the chip current is overloaded and the parameters are not appropriate, so further adjustment is required.

[0074] c) AGC (Automatic Gain Control) value detection, the chip returns a data string starting with "6F13", for example "6F13042B812B01", detect the last 4 digits, if the current last 4 digits are 2B01, after flipping it is 012B, after converting to decimal it is 299. The AGC value needs to fall within 0-896, and it is better if it can fall within 500-800.

[0075] d) If the Nfc Service restarts abnormally, it is considered a serious error and it is determined once that the current parameters do not meet the requirements.

[0076] It can be understood that the above four error types are common error types of the target chip provided in the embodiment of the present application during the card swiping process. Those skilled in the art will know that the target chip may also have other error types during the card reading test process. The embodiment of the present application is not limited to this, and only uses the above four error types as examples for illustration, and other related error types should also be within the scope of protection of this application.

[0077] S202: Determine a parameter adjustment method for the current chip parameters based on the abnormality type;

[0078] It can be understood that different exception types represent different exception handling methods, that is, different exception types correspond to different parameter adjustment methods.

[0079] Further, when the abnormality type is the first abnormality type, the parameter adjustment mode is determined to be a first adjustment mode; wherein the first adjustment mode is to adjust the gain value and the threshold value of the current chip parameter.

[0080] Specifically, the first abnormal type is a serious error type. For the first abnormal type, the corresponding first adjustment method is to directly modify the gain value and threshold value in the current chip parameters. Among the four abnormal types shown above, errors a, b, and d are serious errors, and the chip parameters can be directly modified (randomly or sequentially modify the gain value and threshold value, and the value taken needs to be different from the previous one).

[0081] Further, when the abnormality type is the second abnormality type, the current detection value of the current chip parameter is determined; when the current detection value is outside the first detection range, the parameter adjustment method is determined to be the first adjustment method.

[0082] For the second abnormal type, i.e. the above-mentioned error c, the abnormal type can be classified: according to the abnormal feedback information, the current detection value (AGC (automatic gain control) value) of the target chip under the current chip parameters (current gain value and current threshold value) is obtained. When the AGC value is outside the first detection range, it can be considered that the current chip parameters do not meet the requirements, and the gain value and threshold value can be directly modified, that is, the current chip parameters are adjusted using the first adjustment method.

[0083] Specifically, according to the parameter specification of the target chip, the first detection range can be 0-896 (for NXP PN553 chip). If the current detection value (AGC value) falls outside 0-896, the chip parameters are directly modified, that is, the gain value and threshold value are modified randomly or sequentially;

[0084] Further, when the current detection value is within the first detection range and outside the second detection range, the parameter adjustment method is determined to be a second adjustment method; wherein the second adjustment method is to fix the threshold value and adjust the gain value.

[0085] If the detection value falls within 0-896 and outside 500-800, the threshold value is fixed and the gain value is continuously modified. For example, if the threshold value is set to 10, the gain value is continuously modified (the gain value around the initial parameter is detected first to prevent the AGC value from changing too much). For example, if the initial gain value is 33, the variable gain value can be set to 22.44.11.55.00, etc.

[0086] If all gain values ​​under a certain threshold value cannot make the AGC value reach 500-800, then directly select the threshold value with the smallest AGC value as the chip parameter, so that the AGC value can be fine-tuned, which can effectively avoid other serious errors in the adjustment process.

[0087] S203, adjusting the current chip parameters based on the parameter adjustment method to obtain the adjusted chip parameters;

[0088] In one embodiment, the adjustment method of the current chip parameter of the target chip is determined according to different abnormality types. The first adjustment method adjusts the gain value and the threshold value, while the second adjustment method fixes the threshold value and only adjusts the gain value.

[0089] When the parameter adjustment mode is the first adjustment mode, the threshold value and gain value of the current chip parameter are modified, which may be a random modification or the threshold value and gain value may be modified according to the principle of nearest adjustment.

[0090] Among them, random modification means that new threshold and gain values ​​can be randomly selected for testing without clear guidance. This method is suitable for the initial exploration stage to quickly identify possible effective parameter ranges. The principle of nearby adjustment means that based on the current parameters, adjacent or close values ​​are selected for fine-tuning. This method is suitable for situations that are already close to the ideal parameter range and can be adjusted more finely to achieve optimal performance.

[0091] According to the card reading test results, gradually adjust the threshold value and gain value, test after each adjustment to evaluate the effect, and record the test results after each adjustment, including the card reading success rate, error type and frequency, etc., for subsequent analysis. Establish a feedback loop and continuously adjust the parameters according to the test results until the preset card reading conditions are met.

[0092] When the parameter adjustment mode is the second adjustment mode, the threshold value is fixed, and based on the principle of nearest adjustment, the gain value is adjusted to a gain value adjacent to the current gain value to obtain the adjusted chip parameter.

[0093] In one embodiment, under the condition of a fixed threshold value, the gain value is fine-tuned, and the adjacent value of the current gain value is selected as the adjustment target. This adjustment method helps to optimize chip performance by slightly adjusting the gain value while keeping the threshold value stable.

[0094] S204, performing card swiping detection and monitoring operations on the adjusted chip parameters until the card reading detection result meets the preset card reading condition, and determining the adjusted chip parameters that meet the preset card reading condition as the target chip parameters of the target chip.

[0095] In one embodiment, after the gain value is adjusted, continuous card reading detection and monitoring operations are performed to ensure that the adjusted parameters can work stably and meet the preset card reading conditions.

[0096] The verification process is to repeat the card reading test and monitoring operation to confirm whether the new parameter setting meets the preset card reading conditions. Analyze the card reading test results to determine whether the preset card reading conditions are met. If not, further adjustment of chip parameters is required. Before the preset card reading conditions are met, it may be necessary to adjust and optimize the chip parameters multiple times to find the best parameter settings.

[0097] When the parameter adjustment mode is the second adjustment mode, the threshold value is fixed, and the gain value is adjusted until the current detection value is within the second detection range, and the current gain value and the current threshold value are used as the target chip parameters.

[0098] Specifically, in the second adjustment mode, the threshold value is fixed, and the gain value needs to be adjusted until the AGC value falls within the second detection range. According to the current detection value, the gain value is gradually adjusted until the AGC value reaches the range of 500-800. Once the AGC value falls within the second detection range, the current gain value and threshold value are recorded. These parameters will be used as target chip parameters.

[0099] When the current detection value cannot be adjusted to within the second detection range, a gain value and a threshold value corresponding to when the current detection value is minimum are determined as the target chip parameters.

[0100] Specifically, if the AGC value cannot be adjusted to the second detection range, the gain value and threshold value that minimize the AGC value are selected as the target chip parameters. Even if the AGC value does not reach the ideal range, selecting the minimum value can ensure the best performance of the chip under the current conditions. These parameters are set as the final parameters of the target chip to ensure that the chip can still work in a relatively stable state when the optimal conditions cannot be reached.

[0101] This embodiment identifies and classifies error information during the card reading process, determines the abnormal type, and adjusts chip parameters (such as gain value and threshold value) accordingly to optimize card reading performance. Its beneficial effect is that it can systematically identify and solve common problems in the card reading process, improve chip stability and card reading success rate, ensure that chip parameters are adjusted to the best state, and thus improve overall card reading efficiency and reliability.

[0102] See also Figure 5 , Figure 5 It is a structural schematic diagram of the first embodiment of a chip parameter self-adaptation device based on timed card swiping provided in the present application. The chip parameter self-adaptation device based on timed card swiping is used to execute the aforementioned chip parameter self-adaptation method based on timed card swiping.

[0103] like Figure 5As shown, the chip parameter self-adaptation device 300 based on timed card swiping includes: a card reading detection module 301, a data monitoring module 302, a parameter adjustment module 303 and a parameter determination module 304.

[0104] The card reading detection module 301 is used to perform a card swiping detection on the current chip parameters of the target chip based on a preset time interval to obtain the chip card reading data;

[0105] The data monitoring module 302 is used to monitor the chip card reading data based on a preset monitoring program to obtain a card reading detection result;

[0106] A parameter adjustment module 303 is used to adjust the current chip parameters based on preset parameter adjustment rules to obtain adjusted chip parameters if there is card reading error information in the card reading detection result;

[0107] The parameter determination module 304 is used to perform card swiping detection and monitoring operations on the adjusted chip parameters until the card reading detection result meets the preset card reading condition, and determine the adjusted chip parameters that meet the preset card reading condition as the target chip parameters of the target chip.

[0108] In one embodiment, the chip parameter self-adaptation device 300 based on timed card swiping further includes:

[0109] an abnormality type determination unit, configured to determine the abnormality type based on the abnormality feedback information when the card reading error information does not exist in the card reading detection result but the abnormality feedback information exists, wherein the abnormality feedback information includes at least one preset abnormality code information, and the abnormality code information includes unstable antenna performance, chip current overload, abnormal chip restart, and automatic gain control value detection;

[0110] A parameter adjustment mode determining unit, configured to determine a parameter adjustment mode of the current chip parameter based on the abnormality type;

[0111] A parameter adjustment unit, configured to adjust the current chip parameters based on the parameter adjustment method to obtain the adjusted chip parameters;

[0112] The parameter determination unit is used to perform card swiping detection and monitoring operations on the adjusted chip parameters until the card reading detection result meets the preset card reading condition, and determine the adjusted chip parameters that meet the preset card reading condition as the target chip parameters of the target chip.

[0113] In one embodiment, the parameter adjustment mode determination unit includes:

[0114] A first adjustment mode determining subunit, configured to determine that the parameter adjustment mode is the first adjustment mode when the abnormality type is the first abnormality type;

[0115] The first adjustment method is to adjust the gain value and threshold value of the current chip parameters.

[0116] In one embodiment, the parameter adjustment mode determination unit further includes:

[0117] a current detection value determination subunit, configured to determine a current detection value of the current chip parameter when the abnormality type is a second abnormality type;

[0118] The current detection value judgment subunit is used to determine that the parameter adjustment method is the first adjustment method when the current detection value is outside the first detection range.

[0119] In one embodiment, the parameter adjustment mode determination unit further includes:

[0120] A second adjustment mode determining subunit, configured to determine that the parameter adjustment mode is the second adjustment mode when the current detection value is within the first detection range and outside the second detection range;

[0121] The second adjustment method is to fix the threshold value and adjust the gain value.

[0122] In one embodiment, the parameter determination unit includes:

[0123] A second adjustment mode execution subunit is used for fixing the threshold value and adjusting the gain value when the parameter adjustment mode is the second adjustment mode, until the current detection value is within the second detection range, and using the current gain value and the current threshold value as the target chip parameter;

[0124] The parameter determination subunit is used to determine the gain value and threshold value corresponding to the minimum current detection value as the target chip parameter when the current detection value cannot be adjusted to the second detection range.

[0125] In one embodiment, the parameter adjustment unit includes:

[0126] The second parameter adjustment subunit is used to fix the threshold value when the parameter adjustment mode is the second adjustment mode, and adjust the gain value to the adjacent gain value of the current gain value based on the principle of nearest adjustment to obtain the adjusted chip parameter.

[0127] In one embodiment, the chip parameter self-adaptation device 300 based on timed card swiping further includes:

[0128] A card reading frequency acquisition unit, used to obtain the card reading frequency of the target chip based on the card reading detection result, wherein the card reading frequency includes the number of card readings and the card reading time;

[0129] The card reading error information determining unit is used to determine that the card reading error information exists in the card reading detection result when the card reading frequency does not meet the preset card reading frequency range.

[0130] In one embodiment, the card reading error information determining unit includes:

[0131] A card reading time interval calculation subunit, used for determining a card reading time interval between two adjacent card readings based on the card reading frequency;

[0132] An error information determination first subunit, configured to determine that the card reading error information exists in the card reading detection result when the card reading time interval is less than a first time interval;

[0133] The second error information determination subunit is used to determine that the card reading error information exists in the card reading detection result when the card reading time interval is greater than the first time interval and no card reading operation is detected within a preset time range after the current card reading time.

[0134] It should be noted that technical personnel in the relevant field can clearly understand that, for the convenience and simplicity of description, the specific working process of the above-described device and each module can refer to the corresponding process in the aforementioned chip parameter self-adaptation method embodiment based on timed card swiping, and will not be repeated here.

[0135] The apparatus provided in the above embodiment may be implemented in the form of a computer program. The computer program may be Figure 6 Runs on the computer device shown.

[0136] See also Figure 6 , Figure 6 1 is a schematic block diagram of a computer device provided in an embodiment of the present application. The computer device may be a server.

[0137] See also Figure 6 The computer device includes a processor, a memory and a network interface connected through a system bus, wherein the memory may include a non-volatile storage medium and an internal memory.

[0138] The non-volatile storage medium can store an operating system and a computer program. The computer program includes program instructions, and when the program instructions are executed, the processor can execute any chip parameter self-adaptation method based on timed card swiping.

[0139] The processor is used to provide computing and control capabilities and support the operation of the entire computer equipment.

[0140] The internal memory provides an environment for the operation of the computer program in the non-volatile storage medium. When the computer program is executed by the processor, the processor can execute any chip parameter self-adaptation method based on timed card swiping.

[0141] The network interface is used for network communication, such as sending assigned tasks, etc. Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0142] It should be understood that the processor may be a central processing unit (CPU), and the processor may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0143] In one embodiment, the processor is used to run a computer program stored in the memory to implement the following steps:

[0144] Based on the preset time interval, the current chip parameters of the target chip are tested by swiping the card to obtain the chip reading data;

[0145] Based on a preset monitoring program, data monitoring is performed on the chip card reading data to obtain a card reading detection result;

[0146] If there is card reading error information in the card reading detection result, the current chip parameters are adjusted based on preset parameter adjustment rules to obtain adjusted chip parameters;

[0147] The adjusted chip parameters are subjected to card swiping detection and monitoring operations until the card reading detection result meets the preset card reading condition, and the adjusted chip parameters meeting the preset card reading condition are determined as the target chip parameters of the target chip.

[0148] In one embodiment, after the processor implements the data monitoring of the chip card reading data based on the preset monitoring program and obtains the card reading detection result, it is also used to implement:

[0149] When the card reading error information does not exist in the card reading detection result but abnormal feedback information exists, determining the abnormal type based on the abnormal feedback information, wherein the abnormal feedback information includes at least one preset abnormal code information, and the abnormal code information includes unstable antenna performance, chip current overload, abnormal chip restart, and automatic gain control value detection;

[0150] Based on the abnormality type, determining a parameter adjustment method of the current chip parameter;

[0151] Based on the parameter adjustment method, the current chip parameters are adjusted to obtain the adjusted chip parameters;

[0152] The adjusted chip parameters are subjected to card swiping detection and monitoring operations until the card reading detection result meets the preset card reading condition, and the adjusted chip parameters meeting the preset card reading condition are determined as the target chip parameters of the target chip.

[0153] In one embodiment, when the processor implements the step of determining the parameter adjustment mode of the current chip parameter based on the exception type, the processor is configured to implement:

[0154] When the abnormality type is the first abnormality type, determining the parameter adjustment mode to be the first adjustment mode;

[0155] The first adjustment method is to adjust the gain value and threshold value of the current chip parameters.

[0156] In one embodiment, when the processor implements the step of determining the parameter adjustment mode of the current chip parameter based on the exception type, the processor is further configured to implement:

[0157] When the abnormality type is the second abnormality type, determining a current detection value of the current chip parameter;

[0158] When the current detection value is outside the first detection range, the parameter adjustment method is determined to be the first adjustment method.

[0159] In one embodiment, after the processor determines the current detection value of the current chip parameter when the exception type is the second exception type, it is further configured to implement:

[0160] When the current detection value is within the first detection range and outside the second detection range, determining that the parameter adjustment mode is the second adjustment mode;

[0161] The second adjustment method is to fix the threshold value and adjust the gain value.

[0162] In one embodiment, the processor, when performing the card swiping detection and monitoring operation on the adjusted chip parameters until the card reading detection result meets the preset card reading condition, determines that the adjusted chip parameters meeting the preset card reading condition are the target chip parameters of the target chip, is used to implement:

[0163] When the parameter adjustment mode is the second adjustment mode, the threshold value is fixed, and the gain value is adjusted until the current detection value is within the second detection range, and the current gain value and the current threshold value are used as the target chip parameters;

[0164] When the current detection value cannot be adjusted to within the second detection range, a gain value and a threshold value corresponding to when the current detection value is minimum are determined as the target chip parameters.

[0165] In one embodiment, when the processor adjusts the current chip parameters based on the parameter adjustment method to obtain the adjusted chip parameters, it is further configured to implement:

[0166] When the parameter adjustment mode is the second adjustment mode, the threshold value is fixed, and based on the principle of nearest adjustment, the gain value is adjusted to a gain value adjacent to the current gain value to obtain the adjusted chip parameter.

[0167] In one embodiment, before the processor realizes that there is card reading error information in the card reading detection result, adjusts the current chip parameters based on preset parameter adjustment rules, and obtains the adjusted chip parameters, it is also used to realize:

[0168] Based on the card reading detection result, obtaining the card reading frequency of the target chip, wherein the card reading frequency includes the number of card readings and the card reading time;

[0169] When the card reading frequency does not conform to the preset card reading frequency range, it is determined that the card reading error information exists in the card reading detection result.

[0170] In one embodiment, when the processor determines that the card reading error information exists in the card reading detection result when the card reading frequency does not meet the preset card reading frequency range, it is used to implement:

[0171] Based on the card reading frequency, determining a card reading time interval between two adjacent card readings;

[0172] When the card reading time interval is less than the first time interval, determining that the card reading error information exists in the card reading detection result;

[0173] When the card reading time interval is greater than the first time interval and no card reading operation is detected within a preset time range after the current card reading time, it is determined that the card reading error information exists in the card reading detection result.

[0174] A computer-readable storage medium is also provided in an embodiment of the present application, wherein the computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and the processor executes the program instructions to implement any chip parameter self-adaptation method based on timed card swiping provided in an embodiment of the present application.

[0175] The computer-readable storage medium may be an internal storage unit of the computer device described in the foregoing embodiment, such as a hard disk or memory of the computer device. The computer-readable storage medium may also be an external storage device of the computer device, such as a plug-in hard disk, a smart memory card (SmartMedia Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc., equipped on the computer device.

[0176] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A chip parameter self-adaptation method based on timed card swiping, characterized in that: The method comprises: Based on the preset time interval, the current chip parameters of the target chip are tested by swiping the card to obtain the chip reading data; Based on a preset monitoring program, data monitoring is performed on the chip card reading data to obtain a card reading detection result; If there is card reading error information in the card reading detection result, the current chip parameters are adjusted based on preset parameter adjustment rules to obtain adjusted chip parameters; The adjusted chip parameters are subjected to card swiping detection and monitoring operations until the card reading detection result meets the preset card reading condition, and the adjusted chip parameters meeting the preset card reading condition are determined as the target chip parameters of the target chip.

2. The chip parameter self-adaptation method based on timed card swiping according to claim 1 is characterized in that: After the chip card reading data is monitored based on the preset monitoring program and the card reading detection result is obtained, the method further includes: When the card reading error information does not exist in the card reading detection result but abnormal feedback information exists, determining the abnormal type based on the abnormal feedback information, wherein the abnormal feedback information includes at least one preset abnormal code information, and the abnormal code information includes unstable antenna performance, chip current overload, abnormal chip restart, and automatic gain control value detection; Based on the abnormality type, determining a parameter adjustment method of the current chip parameter; Based on the parameter adjustment method, the current chip parameters are adjusted to obtain the adjusted chip parameters; The adjusted chip parameters are subjected to card swiping detection and monitoring operations until the card reading detection result meets the preset card reading condition, and the adjusted chip parameters meeting the preset card reading condition are determined as the target chip parameters of the target chip.

3. The chip parameter self-adaptation method based on timed card swiping according to claim 2 is characterized in that: The determining, based on the abnormality type, a parameter adjustment method of the current chip parameter includes: When the abnormality type is the first abnormality type, determining the parameter adjustment mode to be the first adjustment mode; The first adjustment method is to adjust the gain value and threshold value of the current chip parameters.

4. The chip parameter self-adaptation method based on timed card swiping according to claim 3 is characterized in that: The determining, based on the abnormality type, a parameter adjustment method of the current chip parameter further includes: When the abnormality type is the second abnormality type, determining a current detection value of the current chip parameter; When the current detection value is outside the first detection range, the parameter adjustment method is determined to be the first adjustment method.

5. The chip parameter self-adaptation method based on timed card swiping according to claim 4 is characterized in that: When the abnormality type is the second abnormality type, after determining the current detection value of the current chip parameter, the method further includes: When the current detection value is within the first detection range and outside the second detection range, determining that the parameter adjustment mode is the second adjustment mode; The second adjustment method is to fix the threshold value and adjust the gain value.

6. The chip parameter self-adaptation method based on timed card swiping according to claim 5 is characterized in that: The step of performing card swiping detection and monitoring operations on the adjusted chip parameters until the card reading detection result meets the preset card reading condition, and determining the adjusted chip parameters meeting the preset card reading condition as the target chip parameters of the target chip, comprises: When the parameter adjustment mode is the second adjustment mode, the threshold value is fixed, and the gain value is adjusted until the current detection value is within the second detection range, and the current gain value and the current threshold value are used as the target chip parameters; When the current detection value cannot be adjusted to within the second detection range, a gain value and a threshold value corresponding to when the current detection value is minimum are determined as the target chip parameters.

7. The chip parameter self-adaptation method based on timed card swiping according to claim 5 is characterized in that: The step of adjusting the current chip parameters based on the parameter adjustment method to obtain the adjusted chip parameters further includes: When the parameter adjustment mode is the second adjustment mode, the threshold value is fixed, and based on the principle of nearest adjustment, the gain value is adjusted to a gain value adjacent to the current gain value to obtain the adjusted chip parameter.

8. The chip parameter self-adaptation method based on timed card swiping according to claim 1, characterized in that: If there is card reading error information in the card reading detection result, the current chip parameters are adjusted based on preset parameter adjustment rules, and before obtaining the adjusted chip parameters, the method further includes: Based on the card reading detection result, obtaining the card reading frequency of the target chip, wherein the card reading frequency includes the number of card readings and the card reading time; When the card reading frequency does not conform to the preset card reading frequency range, it is determined that the card reading error information exists in the card reading detection result.

9. The chip parameter self-adaptation method based on timed card swiping according to claim 8, characterized in that: When the card reading frequency does not meet the preset card reading frequency range, determining that the card reading error information exists in the card reading detection result includes: Based on the card reading frequency, determining a card reading time interval between two adjacent card readings; When the card reading time interval is less than the first time interval, determining that the card reading error information exists in the card reading detection result; When the card reading time interval is greater than the first time interval and no card reading operation is detected within a preset time range after the current card reading time, it is determined that the card reading error information exists in the card reading detection result.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, the steps of the chip parameter self-adaptation method based on timed card swiping as described in any one of claims 1 to 9 are implemented.

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