Semiconductor circuit correction system and method

Abstract

The invention provides a semiconductor circuit correction system and method. The correction system comprises a plurality of redundant circuit units, a plurality of switch circuit units and a control circuit. The redundant circuit units are coupled to the semiconductor circuit. The switching circuit units are coupled to the redundant circuit units and a plurality of basic circuit units of the semiconductor circuit. The control circuit is coupled to the semiconductor circuit and the switching circuit units, and is used for obtaining a noise signal of the semiconductor circuit, judging whether the semiconductor circuit passes a noise test by identifying characteristics of the noise signal, and controlling the semiconductor circuit to pass the noise test when the semiconductor circuit does not pass the noise test. By controlling the switching circuit units, one of the redundant circuit units replaces one of the basic circuit units.

Description

Technical Field

[0001] The present disclosure relates to a system and a method, and more particularly to a correction system and a method for correcting a semiconductor circuit. Background Art

[0002] With the development of semiconductor technology, transistors and / or integrated circuits using transistors may have reduced performance due to the presence of random telegraph noise (RTN). Therefore, it is necessary to improve this problem. Summary of the invention

[0003] The present disclosure is a correction system. The correction system is used to correct a semiconductor circuit and includes a plurality of redundant circuit units, a plurality of switch circuit units, and a control circuit. The redundant circuit units are coupled to the semiconductor circuit. The switch circuit units are coupled to the redundant circuit units and a plurality of basic circuit units of the semiconductor circuit. The control circuit is coupled to the semiconductor circuit and the switch circuit units, and is used to obtain a noise signal of the semiconductor circuit, to determine whether the semiconductor circuit passes a noise test by identifying the characteristics of the noise signal, and to replace one of the basic circuit units with one of the redundant circuit units by controlling the switch circuit units if the semiconductor circuit fails the noise test.

[0004] Another aspect of the present disclosure is a calibration method. The calibration method is used to calibrate a semiconductor circuit. The semiconductor circuit includes a plurality of basic circuit units, a plurality of redundant circuit units coupled to the semiconductor circuit, and a plurality of switch circuit units coupled to the basic circuit units and the redundant circuit units. The calibration method includes: obtaining a noise signal of the semiconductor circuit; determining whether the semiconductor circuit passes a noise test by identifying a feature of the noise signal; and, if the semiconductor circuit fails the noise test, replacing one of the basic circuit units with one of the redundant circuit units by controlling the switch circuit units.

[0005] In summary, by setting redundant circuit units and switch circuit units in semiconductor circuits, the correction system and correction method of the present disclosure can replace basic circuit units with random telegraph noise problems with redundant circuit units, thereby having the advantage of improving the performance of semiconductor circuits. BRIEF DESCRIPTION OF THE DRAWINGS

[0006] Figure 1 Schematic diagram of a calibration system and a semiconductor circuit according to some embodiments of the present disclosure.

[0007] Figure 2A circuit diagram of a basic circuit unit, a redundant circuit unit, a switch circuit unit, and an output stage circuit according to some embodiments of the present disclosure is shown.

[0008] Figure 3 The present invention is a flow chart of a calibration method according to some embodiments of the present disclosure.

[0009] Figure 4A A waveform diagram of a noise signal is shown according to some embodiments of the present disclosure.

[0010] Figure 4B A waveform diagram of a noise signal is shown according to some embodiments of the present disclosure.

[0011] Figure 5 Schematic diagram of a calibration system and a semiconductor circuit according to some embodiments of the present disclosure. DETAILED DESCRIPTION

[0012] The following is a detailed description of the embodiments with the accompanying drawings, but the specific embodiments described are only used to explain the present case and are not used to limit the present case. The description of the structural operation is not used to limit the order of its execution. Any structure recombined by the components to produce a device with equal efficacy is within the scope of the present disclosure.

[0013] The terms used throughout the specification and claims generally have the ordinary meanings of each term used in the art, in the context of this disclosure and in the specific context, unless otherwise specified.

[0014] In addition, the terms “coupled” or “connected” used herein may refer to direct physical or electrical contact between two or more components, or indirect physical or electrical contact between two or more components, or may refer to mutual operation or movement between two or more components.

[0015] In the following embodiments, if only a component or signal symbol is used without specifying a numerical index of the component or signal symbol, it means that the component or signal symbol refers to any unspecified one of the component group or signal group to which it belongs. For example, the basic circuit unit 111 refers to one or more unspecified basic circuit units among the basic circuit units 111[1] to 111[6].

[0016] In some related technologies, transistors may have some lattice defects inside the oxide layer or at the junction due to some processes (for example, heavy ion implantation, surface contamination, etc.). These lattice defects will cause random capture (trap) and random release (detrap) of some charge carriers in the channel, which will have a significant impact on the transistor. For example, the operating current of the transistor will be significantly disturbed. Specifically, the disturbance phenomenon in the operating current has similar characteristics to a random telegraph signal (RTS), so this disturbance phenomenon in the operating current is often referred to as random telegraph noise (RTN).

[0017] See also Figure 1 , Figure 1 Schematic diagram of a semiconductor circuit 10 and a correction system 100 according to some embodiments of the present disclosure. In some embodiments, the semiconductor circuit 10 is implemented by a circuit composed of one or more transistors. Following the description of the above-mentioned related art, the semiconductor circuit 10 is likely to have a problem of reduced performance due to the presence of random telegraph noise. Accordingly, the semiconductor circuit 10 needs to be tested and / or screened to find out whether there is random telegraph noise in the semiconductor circuit 10. In some embodiments, when random telegraph noise exists in the semiconductor circuit 10, the correction system 100 can calibrate the semiconductor circuit 10 to avoid affecting the performance of the semiconductor circuit 10.

[0018] In some embodiments, the semiconductor circuit 10 is an operational amplifier. Figure 1 As shown, the semiconductor circuit 10 includes a first stage circuit 11 and an output stage circuit 12. Since the first stage circuit 11 is directly related to noise (eg, the aforementioned random telegraph noise), the calibration system 100 calibrates the semiconductor circuit 10 by calibrating the first stage circuit 11.

[0019] Following the above description on the correction of the first stage circuit 11, Figure 1In the embodiment of the present invention, a plurality of basic circuit units 111[1]-111[6] are provided in the first stage circuit 11, and the correction system 100 includes a control circuit 101, a plurality of redundant circuit units 102[1]-102[2], and a plurality of switch circuit units 103[1]-103[8]. The redundant circuit units 102[1]-102[2] are provided in the first stage circuit 11 of the semiconductor circuit 10. The switch circuit units 103[1]-103[8] are also provided in the first stage circuit 11 of the semiconductor circuit 10 to be respectively coupled to the redundant circuit units 102[1]-102[2] and the basic circuit units 111[1]-111[6]. In addition, the control circuit 101 is coupled to the switch circuit units 103[1]-103[8] to control the switch circuit units 103[1]-103[8]. It can be seen that the redundant circuit units 102 [ 1 ] ˜ 102 [ 2 ] of the calibration system 100 are coupled to the semiconductor circuit 10 .

[0020] In some further embodiments, Figure 1 As shown in FIG. 1 , the number of redundant circuit units 102 is less than the number of basic circuit units 111, and the number of switch circuit units 103 is the sum of the number of redundant circuit units 102 and the number of basic circuit units 111. It should be understood that the number of redundant circuit units 102, the number of switch circuit units 103, and the number of basic circuit units 111 are not based on Figure 1 Quantities shown are limited.

[0021] At Figure 1 In the embodiment of the present invention, the first stage circuit 11 and the resistor R1 are coupled to a node N1 (e.g., the inverting input terminal of the first stage circuit 11) to receive the input signal VIN through the resistor R1. The first stage circuit 11 receives a reference signal VREF (e.g., a ground signal) through a node N2 (e.g., the non-inverting input terminal of the first stage circuit 11). The first stage circuit 11 and the output stage circuit 12 are coupled to a node N3 (i.e., the node N3 is the output terminal of the first stage circuit 11 or the input terminal of the output stage circuit 12). The output stage circuit 12 and the resistor R2 are coupled to a node N4 (e.g., the output terminal of the output stage circuit 12), and the resistor R2 is coupled between the nodes N1 and N4, thereby forming a negative feedback path.

[0022] As can be seen from the above description, the resistor R1 is coupled between the inverting input terminal of the first stage circuit 11 and the input signal VIN. The non-inverting input terminal of the first stage circuit 11 is coupled to the reference signal VREF. The output terminal of the first stage circuit 11 is coupled to the input terminal of the output stage circuit 12. The resistor R2 is coupled between the inverting input terminal of the first stage circuit 11 and the output terminal of the output stage circuit 12, so that the output terminal of the output stage circuit 12 is coupled to the inverting input terminal of the first stage circuit 11.

[0023] It should be understood that when the semiconductor circuit 10 is implemented by an operational amplifier, Figure 1 As shown, the semiconductor circuit 10 is connected with the resistor R1 and the resistor R2 to form an inverting amplifier. Accordingly, the semiconductor circuit 10 can generate an output signal VOUT according to the input signal VIN. For example, the output signal VOUT can be generated by amplifying the input signal VIN.

[0024] In some embodiments, the control circuit 101 can be coupled to the semiconductor circuit 10 (for example, coupled to the node N4) to receive the output signal VOUT, and can determine whether random telegraph noise exists in the semiconductor circuit 10 by analyzing the output signal VOUT, which will be further explained in the following paragraphs in conjunction with Figures 3 and 4.

[0025] Then match Figure 2 The redundant circuit unit 102, the switch circuit unit 103 and the basic circuit unit 111 are further described. Figure 2 , Figure 2 The basic circuit unit 111, the redundant circuit unit 102, the switch circuit unit 103 and the output stage circuit 12 are shown in the circuit diagram according to some embodiments of the present disclosure. In some embodiments, the basic circuit unit 111 [1] includes a plurality of transistors MB1 to MB5. Specifically, each of the transistors MB1 to MB3 is implemented by an N-type metal oxide semiconductor (NMOS) transistor, and each of the transistors MB4 to MB5 is implemented by a P-type metal oxide semiconductor (PMOS) transistor.

[0026] In some embodiments, such as Figure 2 As shown, the control terminal (e.g., gate terminal) of transistor MB1 is coupled to the first switch SWA[2] included in the switch circuit unit 103[2], so as to be coupled to the bias signal VB1 through the first switch SWA[2]. The first terminal (e.g., source terminal) of transistor MB1 is coupled to the power signal VDD. The second terminal (e.g., drain terminal) of transistor MB1 is coupled to the first terminal of transistor MB2 and the first terminal of transistor MB3.

[0027] The control terminal of transistor MB2 is coupled to node N1. The second terminal of transistor MB2 and the second terminal of transistor MB4 are coupled to node NA. The control terminal of transistor MB3 is coupled to node N2. The second terminal of transistor MB3 and the second terminal of transistor MB5 are coupled to node NB.

[0028] The control end of transistor MB4 and the control end of transistor MB5 are coupled to node NA. It can be seen that the control end of transistor MB4, the control end of transistor MB5, the second end of transistor MB2 and the second end of transistor MB4 are coupled together. The first end of transistor MB4 and the first end of transistor MB5 are both coupled to the ground signal GND.

[0029] In addition, one end of the second switch SWB[2] included in the switch circuit unit 103[2] is coupled to the node NA, and the other end of the second switch SWB[2] is coupled to the bias signal VB2. One end of the third switch SWC[2] included in the switch circuit unit 103[2] is coupled to the node NB, and the other end of the third switch SWC[2] is coupled to the node N3.

[0030] Figure 1 The remaining basic circuit units 111[2] to 111[6] have the same Figure 2 As the basic circuit unit 111[1] in the above description is the same or similar to the basic circuit unit 111[1], its description is omitted here. As can be seen from the above description of the basic circuit unit 111, one of the basic circuit units 111[1] to 111[6] is coupled to the bias signal VB1, the bias signal VB2 and the input end (i.e., the node N3) of the output stage circuit 12 via a corresponding switch circuit unit among the plurality of switch circuit units 103[1] to 103[8].

[0031] In some embodiments, the redundant circuit unit 102[1] includes a plurality of transistors MR1-MR5. Specifically, each of the transistors MR1-MR3 is implemented by an N-type metal oxide semiconductor transistor, and each of the transistors MR4-MR5 is implemented by a P-type metal oxide semiconductor transistor.

[0032] like Figure 2 As shown, the control end of transistor MR1 is coupled to the first switch SWA[1] included in the switch circuit unit 103[1], so as to be coupled to the bias signal VB1 through the first switch SWA[1]. The first end of transistor MR1 is coupled to the power signal VDD. The second end of transistor MR1 is coupled to the first end of transistor MR2 and the first end of transistor MR3.

[0033] The control terminal of transistor MR2 is coupled to node N1. The second terminal of transistor MR2 and the second terminal of transistor MR4 are coupled to node NC. The control terminal of transistor MR3 is coupled to node N2. The second terminal of transistor MR3 and the second terminal of transistor MR5 are coupled to node ND.

[0034] The control end of transistor MR4 and the control end of transistor MR5 are coupled to node NC. It can be seen that the control end of transistor MR4, the control end of transistor MR5, the second end of transistor MR2 and the second end of transistor MR4 are coupled together. The first end of transistor MR4 and the first end of transistor MR5 are both coupled to the ground signal GND.

[0035] In addition, one end of the second switch SWB[1] included in the switch circuit unit 103[1] is coupled to the node NC, and the other end of the second switch SWB[1] is coupled to the bias signal VB2. One end of the third switch SWC[1] included in the switch circuit unit 103[1] is coupled to the node ND, and the other end of the third switch SWC[1] is coupled to the node N3.

[0036] Figure 1 The remaining redundant circuit cells 102[2] in Figure 2 As the redundant circuit unit 102[1] in the above description is the same as or similar to the redundant circuit unit 102[1], its description is omitted here. As can be seen from the above description of the redundant circuit unit 102, one of the redundant circuit units 102[1] to 102[2] is coupled to the bias signal VB1, the bias signal VB2 and the input end (i.e., the node N3) of the output stage circuit 12 via a corresponding one of the switch circuit units 103[1] to 103[8].

[0037] From the above description of the basic circuit unit 111 and the redundant circuit unit 102 , it can be seen that the redundant circuit unit 102 is substantially a replica circuit of the basic circuit unit 111 .

[0038] In some embodiments, the output stage circuit 12 includes a plurality of transistors MO1-MO2, a capacitor C1 and a resistor R3. Specifically, the transistor MO1 is implemented by an N-type metal oxide semiconductor transistor, and the transistor MO2 is implemented by a P-type metal oxide semiconductor transistor.

[0039] The control end of transistor MO1 is coupled to bias signal VB1, the first end of transistor MO1 is coupled to power signal VDD, and the second end of transistor MO1 is coupled to node N4. The control end of transistor MO2 is coupled to node N3, the first end of transistor MO2 is coupled to ground signal GND, and the second end of transistor MO2 is coupled to node N4. Furthermore, capacitor C1 and resistor R3 are coupled in series between node N3 and node N4.

[0040] Then match Figure 3 The operation of the calibration system 100 is further described. Figure 3 , Figure 3FIG. 3 is a flow chart of a calibration method 300 according to some embodiments of the present disclosure. In some embodiments, the calibration method 300 is applicable to Figure 1 That is, the correction method 300 is used to correct Figure 1 The semiconductor circuit 10. Figure 3 As shown, the calibration method 300 includes steps S301 - S303 .

[0041] In step S301 , the control circuit 101 in the calibration system 100 obtains a noise signal of the semiconductor circuit 10 , which will be further described in conjunction with FIGS. 1 and 2 in the following paragraphs.

[0042] In some embodiments, Figure 1 In the embodiment, the switch circuit units 103[2]-103[4] and 103[6]-103[8] are in the on state, and the switch circuit units 103[1] and 103[5] are in the off state. In this case, the basic circuit units 111[1]-111[6] receive the bias signals VB1 and VB2 and are connected to the input end of the output stage circuit 12, while the redundant circuit units 102[1]-102[2] do not receive the bias signals VB1 and VB2 and are disconnected from the input end of the output stage circuit 12. This is equivalent to the semiconductor circuit 10 operating with the basic circuit units 111[1]-111[6] (or, the semiconductor circuit 10 does not operate with the redundant circuit units 102[1]-102[2]).

[0043] In some embodiments, when the semiconductor circuit 10 operates with the basic circuit units 111 [1] to 111 [6], the semiconductor circuit 10 may be Figure 1 The output signal VOUT is generated according to the input signal VIN.

[0044] It should be understood that common low-frequency noise includes the aforementioned random telegraph noise, thermal noise, flicker noise (or 1 / f noise), etc., and these low-frequency noises may appear simultaneously in a frequency range of, for example, about 0.1 to 1000 Hz. It is worth noting that the aforementioned random telegraph noise may dominate in an ultra-low frequency range of, for example, about 0.1 Hz.

[0045] Accordingly, in some embodiments, after receiving the output signal VOUT, the control circuit 101 performs a bandpass filtering process on the output signal VOUT to generate a noise signal of the semiconductor circuit 10. Specifically, the bandwidth of the bandpass filtering process can be 0.003-100 Hz, so that the generated noise signal can be mainly the aforementioned random telegraph noise. It can be seen that the noise signal of the semiconductor circuit 10 is obtained by the control circuit 101 when the semiconductor circuit 10 operates with the basic circuit units 111[1]-111[6].

[0046] In step S302, the control circuit 101 in the calibration system 100 determines whether the semiconductor circuit 10 passes the noise test by identifying the characteristics of the noise signal. Figure 4A , Figure 4A FIG. 1 is a waveform diagram of the noise signal NL1 according to some embodiments of the present disclosure. Figure 4A As shown, the noise signal NL1 exhibits the characteristics of random telegraph noise such as infrequency, high variability, etc.

[0047] In some embodiments, the control circuit 101 may calculate the standard deviation and / or the RMS value of the noise signal NL1, or may convert the noise signal NL1 from the time domain to the frequency domain by, for example, fast Fourier transform, to obtain the characteristics of the noise signal NL1. Then, the control circuit 101 may identify whether the characteristics of the noise signal NL1 include the characteristics of random telegraph noise to determine whether the semiconductor circuit 10 passes the noise test. The method of identifying whether the characteristics of the noise signal NL1 include the characteristics of random telegraph noise is well known to those having ordinary knowledge in the technical field to which the present disclosure belongs, and thus its description is omitted here.

[0048] In some embodiments, when the characteristics of the noise signal NL1 include random telegraph noise characteristics, the control circuit 101 determines that the semiconductor circuit 10 fails the noise test. Accordingly, step S303 is executed.

[0049] In step S303, the control circuit 101 in the calibration system 100 controls the plurality of switch circuit units 103[1]-103[8] to replace one of the plurality of basic circuit units 111[1]-111[6] with one of the plurality of redundant circuit units 102[1]-102[2]. Figure 2 For example, the control circuit 101 switches the switch circuit unit 103[2] to the disconnected state and switches the switch circuit unit 103[1] to the on state, so that the redundant circuit unit 102[1] replaces the basic circuit unit 111[1]. It should be understood that the multiple switch circuit units 103[3] to 103[4] and 103[6] to 103[8] are still controlled to be in the on state, and the switch circuit unit 103[5] is still controlled to be in the disconnected state.

[0050] After step S303, the redundant circuit unit 102[1] and the basic circuit units 111[2] to 111[6] receive the bias signals VB1 and VB2 and are connected to the input end of the output stage circuit 12, while the redundant circuit unit 102[2] and the basic circuit unit 111[1] do not receive the bias signals VB1 and VB2 and are disconnected from the input end of the output stage circuit 12. That is, at this time, the semiconductor circuit 10 operates with the redundant circuit unit 102[1] and the basic circuit units 111[2] to 111[6] (or, the semiconductor circuit 10 does not operate with the redundant circuit unit 102[2] and the basic circuit unit 111[1]).

[0051] In some embodiments, such as Figure 3 As shown, after step S303, step S301 and step S302 are executed again in sequence. It should be understood that when the semiconductor circuit 10 operates with the redundant circuit unit 102[1] and the basic circuit units 111[2] to 111[6], the semiconductor circuit 10 generates another output signal VOUT according to the input signal VIN. As described in the above steps S301 and S302, the control circuit 101 receives and processes (e.g., bandpass filtering, etc.) another output signal VOUT to obtain another noise signal of the semiconductor circuit 10. Then, the control circuit 101 identifies whether the characteristics of the other noise signal include the characteristics of random telegraph noise to determine again whether the semiconductor circuit 10 passes the noise test.

[0052] See also Figure 4B , Figure 4B FIG. 4A and FIG. 4B are waveform diagrams of another noise signal NL2 according to some embodiments of the present disclosure. Figure 4A The noise signal NL1 in Figure 4B The other noise signal NL2 in FIG. 1 obviously does not exhibit the characteristics of random telegraph noise.

[0053] In some embodiments, such as Figure 3 As shown, when the characteristics of the other noise signal NL2 do not include the characteristics of random telegraph noise, the control circuit 101 determines that the semiconductor circuit 10 passes the noise test. Accordingly, the calibration method 300 ends. Further explanation, this also illustrates that the previously replaced basic circuit unit 111 [1] has the problem of random telegraph noise.

[0054] It should be understood that, in the case where the characteristics of the other noise signal still include the characteristics of random telegraph noise, step S303 will be executed again. For example, the control circuit 101 switches the switch circuit unit 103[3] to the off state, and switches the switch circuit unit 103[2] to the on state. The plurality of switch circuit units 103[1], 103[4] and 103[6] to 103[8] are still controlled to be in the on state, and the switch circuit unit 103[5] is still controlled to be in the off state. In this way, the semiconductor circuit 10 operates with the redundant circuit unit 102[1] and the basic circuit units 111[1] to 111[2] and 111[4] to 111[6], which is equivalent to replacing the basic circuit unit 111[3] with the redundant circuit unit 102[1] instead of the basic circuit unit 111[1].

[0055] As can be seen from the above description, by using the calibration method 300 , the basic circuit unit 111 having the random telegraph noise problem can be found and replaced with the redundant circuit unit 102 .

[0056] At Figure 1 In the embodiment, the semiconductor circuit 10 is connected as an inverting amplifier, but the present disclosure is not limited thereto. For example, in some embodiments, the node N1 (i.e., the inverting input terminal of the first stage circuit 11) is directly coupled to the node N4 (i.e., the output terminal of the output stage circuit 12) without passing through the resistor R2, and the node N2 (i.e., the non-inverting input terminal of the first stage circuit 11) is coupled to the input signal VIN. In other words, the semiconductor circuit 10 is connected as a voltage buffer. It should be understood that when the semiconductor circuit 10 is connected as a voltage buffer, the control circuit 101 can also receive the output signal generated by the semiconductor circuit 10 according to the input signal VIN from the node N4 to obtain the noise signal and determine whether the semiconductor circuit 10 passes the noise test.

[0057] In addition, Figure 1 In an embodiment, the control circuit 101 receives and processes the output signal VOUT generated by the semiconductor circuit 10 according to the input signal VIN to obtain a noise signal, but the present disclosure is not limited thereto. For example, in some embodiments, a resistor is coupled to the input signal VIN and the node N1, the node N2 is coupled to the reference signal VREF, and another resistor is coupled to the node N1 and the node N3. In other words, the first stage circuit 11 in the semiconductor circuit 10 forms an inverting amplifier by connecting to the aforementioned two resistors. If so configured, the control circuit 101 can be coupled to the node N3, and receive and process the signal generated by the first stage circuit 11 according to the input signal VIN to obtain a noise signal. The remaining operations are the same or similar to the aforementioned embodiments, so they are not repeated here.

[0058] The semiconductor circuit of the present disclosure is not limited to Figure 1For example, see Figure 5 , Figure 5 FIG. 1 is a schematic diagram of a calibration system 100 and another semiconductor circuit 50 according to some embodiments of the present disclosure. Figure 1 The semiconductor circuit 10 includes, in addition to the first stage circuit 11 and the output stage circuit 12, the semiconductor circuit 50 further includes a second stage circuit 13. Figure 5 As shown, the second stage circuit 13 is coupled to the first stage circuit 11 at a node N3 (i.e., the node N3 is the input terminal of the second stage circuit 13 or the output terminal of the first stage circuit 11), and the second stage circuit 13 is coupled to the output stage circuit 12 at a node N5 (i.e., the node N5 is the output terminal of the second stage circuit 13 or the input terminal of the output stage circuit 12). In other words, the second stage circuit 13 is coupled between the output terminal of the first stage circuit 11 and the input terminal of the output stage circuit 12. The rest of the configuration of the semiconductor circuit 50 is the same or similar to the above-mentioned embodiment, so it is not repeated here.

[0059] At Figure 5 In some embodiments, the semiconductor circuit 50 is connected as an inverting amplifier so that the control circuit 101 can obtain a noise signal from the output signal VOUT generated by the semiconductor circuit 50 according to the input signal VIN, but the present disclosure is not limited thereto. For example, in some embodiments, the first stage circuit 11 in the semiconductor circuit 50 can be connected as an inverting amplifier so that the control circuit 101 can obtain a noise signal from the signal generated by the first stage circuit 11 according to the input signal VIN. In some embodiments, the first stage circuit 11 and the second stage circuit 13 in the semiconductor circuit 50 can be connected as an inverting amplifier so that the control circuit 101 can obtain a noise signal from the signal generated by the first stage circuit 11 and the second stage circuit 13 according to the input signal VIN.

[0060] In addition, Figure 5 In some embodiments, the semiconductor circuit 50 is connected as an inverting amplifier, but the present disclosure is not limited thereto. For example, in some embodiments, the node N1 (i.e., the inverting input terminal of the first stage circuit 11) is directly coupled to the node N4 (i.e., the output terminal of the output stage circuit 12) without passing through the resistor R2, and the node N2 (i.e., the non-inverting input terminal of the first stage circuit 11) is coupled to the input signal VIN. In other words, the semiconductor circuit 50 is connected as a voltage buffer. It should be understood that when the semiconductor circuit 50 is connected as a voltage buffer, the control circuit 101 can also receive the output signal generated by the semiconductor circuit 50 according to the input signal VIN from the node N4 to obtain the noise signal and determine whether the semiconductor circuit 50 passes the noise test.

[0061] Based on the description of the above embodiments, at least the first-stage circuit 11 in the semiconductor circuit 10 / 50 can be connected to form a circuit such as an inverting amplifier, a voltage buffer, etc. to obtain the noise signal of the semiconductor circuit 10 / 50 and determine whether the semiconductor circuit 10 / 50 passes the noise test.

[0062] By setting up redundant circuit units and switching circuit units in the part of the semiconductor circuit that is directly related to noise (for example, the first-stage circuit 11), the correction system and correction method of the present disclosure can replace the basic circuit units with random telegraph noise problems with redundant circuit units, thereby having the advantage of improving the performance of the semiconductor circuit.

[0063] Although the present disclosure has been disclosed as above in the form of an implementation method, it is not intended to limit the present disclosure. A person skilled in the art may make various changes and modifications without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection of the present disclosure shall be determined by the scope of the attached patent application.

[0064] Reference numerals

[0065] 10,50: Semiconductor circuits

[0066] 11: First level circuit

[0067] 12: Output stage circuit

[0068] 13: Second level circuit

[0069] 100: Calibration system

[0070] 101: Control Circuit

[0071] 102[1]~102[2]: Redundant circuit unit

[0072] 103[1]~103[8]:Switch circuit unit

[0073] 111[1]~111[6]: Basic circuit unit

[0074] 300: Calibration method

[0075] C1: Capacitor

[0076] GND: Ground signal

[0077] MB1~MB5, MO1~MO2, MR1~MR5: transistors

[0078] N1, N2, N3, N4, N5, NA, NB, NC, ND: nodes

[0079] NL1, NL2: Noise signal

[0080] VB1, VB2: Bias signal

[0081] VIN: Input signal

[0082] VOUT: output signal

[0083] VREF: Reference signal

[0084] R1, R2, R3: resistors

[0085] SWA[1]~SWA[2]: First switch

[0086] SWB[1]~SWB[2]: Second switch

[0087] SWC[1]~SWC[2]: The third switch

[0088] S301~S303: Steps

Claims

1. A calibration system for calibrating a semiconductor circuit, comprising: A plurality of redundant circuit units coupled to the semiconductor circuit; a plurality of switch circuit units coupled to the plurality of redundant circuit units and the plurality of basic circuit units of the semiconductor circuit; and A control circuit is coupled to the semiconductor circuit and the plurality of switch circuit units, and is used to obtain a noise signal of the semiconductor circuit, to determine whether the semiconductor circuit passes a noise test by identifying characteristics of the noise signal, and to replace one of the plurality of basic circuit units with one of the plurality of redundant circuit units by controlling the plurality of switch circuit units when the semiconductor circuit fails the noise test.

2. The calibration system according to claim 1, wherein the control circuit is further used to obtain another noise signal of the semiconductor circuit when the semiconductor circuit operates with the redundant circuit unit of the plurality of redundant circuit units and the remaining basic circuit units of the plurality of basic circuit units, and to determine whether the semiconductor circuit passes the noise test by identifying a feature of the another noise signal; The noise signal is obtained by the control circuit when the semiconductor circuit operates with the plurality of basic circuit units.

3. The correction system according to claim 1, wherein the control circuit is further configured to determine that the semiconductor circuit has failed the noise test if the characteristic of the noise signal includes a random telegraph noise characteristic; The control circuit is further configured to determine that the semiconductor circuit has passed the noise test when the feature of the noise signal does not include the random telegraph noise feature. 4 . The calibration system according to claim 1 , wherein the control circuit is used to receive and process a signal from the semiconductor circuit to obtain the noise signal.

5. A correction system according to claim 4, wherein the semiconductor circuit includes a first-stage circuit and an output-stage circuit, the output end of the first-stage circuit is coupled to the input end of the output-stage circuit, the output end of the output-stage circuit is coupled to the inverting input end of the first-stage circuit, and the multiple switching circuit units, the multiple basic circuit units and the multiple redundant circuit units are all arranged in the first-stage circuit.

6. The correction system according to claim 5, wherein a first resistor is coupled between the inverting input terminal and an input signal, a second resistor is coupled between the inverting input terminal and the output terminal of the output stage circuit, a non-inverting input terminal of the first stage circuit is coupled to a reference signal, and the signal is an output signal generated by the semiconductor circuit according to the input signal.

7. A correction system according to claim 5, wherein the basic circuit unit among the multiple basic circuit units is coupled to the multiple bias signals and the input end of the output stage circuit via one switching circuit unit among the multiple switching circuit units, and the redundant circuit unit among the multiple redundant circuit units is coupled to the multiple bias signals and the input end of the output stage circuit via another switching circuit unit among the multiple switching circuit units, and the control circuit is used to switch the switching circuit unit among the multiple switching circuit units to an off state, and to switch the another switching circuit unit among the multiple switching circuit units to an on state, so that the redundant circuit unit among the multiple redundant circuit units replaces the basic circuit unit among the multiple basic circuit units.

8. A calibration method for calibrating a semiconductor circuit, wherein the semiconductor circuit comprises a plurality of basic circuit units, a plurality of redundant circuit units coupled to the semiconductor circuit, a plurality of switch circuit units coupled to the plurality of basic circuit units and the plurality of redundant circuit units, and the calibration method comprises: obtaining a noise signal of the semiconductor circuit; determining whether the semiconductor circuit passes a noise test by identifying characteristics of the noise signal; and In a case where the semiconductor circuit fails the noise test, one of the basic circuit units is replaced by one of the redundant circuit units by controlling the plurality of switch circuit units.

9. The calibration method according to claim 8, further comprising: obtaining another noise signal of the semiconductor circuit when the semiconductor circuit operates with the redundant circuit unit among the plurality of redundant circuit units and the remaining basic circuit units among the plurality of basic circuit units; as well as determining whether the semiconductor circuit passes the noise test by identifying a feature of the other noise signal; The noise signal is obtained when the semiconductor circuit operates with the plurality of basic circuit units.

10. The calibration method according to claim 8, wherein in the case where the characteristic of the noise signal includes a random telegraph noise characteristic, it is determined that the semiconductor circuit has failed the noise test; Wherein, when the feature of the noise signal does not include the random telegraph noise feature, it is determined that the semiconductor circuit has passed the noise test.

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