Needle bed for testing integrated circuit

Abstract

The invention discloses a needle bed for testing an integrated circuit, and relates to the technical field of test needle beds. The device comprises a transverse plate, the top of the transverse plate is in sliding fit with a storage plate, the transverse plate is in sliding fit with a mounting plate, a plurality of elastic probes are mounted on the mounting plate, and each elastic probe comprises a fixed section and a pointed-cone-shaped movable section. During cleaning, the cleaning plate can be driven to be far away from the mounting plate, the driving mechanism synchronously drives the movable plates to be close to each other, and finally the driving part synchronously drives the movable section to rotate, so that the surface oxide layer of the test probe can be cleaned on the premise of not dismounting the test probe, and the test probe cleaning device is relatively convenient and easy to use.

Description

Technical Field

[0001] The present application relates to the technical field of testing needle beds, and in particular to a needle bed for integrated circuit testing. Background Art

[0002] Integrated circuits are miniature electronic devices. The use of this new type of semiconductor device has made a big step forward in the direction of miniaturization, intelligence and high reliability of electronic components. When integrated circuits are mass-produced, they need to be tested using a test bed of needles (a non-standard test auxiliary fixture that uses electrical properties to test online components to check for manufacturing defects and component failures). Different integrated circuits require dedicated beds of needles to be made. The test probes on the bed of needles are used to check the open, short circuit, welding, etc. of individual components and circuit networks on the integrated circuit. Only those that pass the test can be widely used in communications.

[0003] Most test probes are made of elastic copper rods with good conductivity, and the surface is gold-plated and silver-plated to achieve the purpose of low contact resistance and corrosion resistance. Since the silver-plated layer is cheaper than the gold-plated layer, the silver-plated test probe is widely used. However, during testing, that is, when a large current passes through the test probe, the temperature of the test probe rises, which aggravates the oxidation of the silver-plated layer on the surface of the test probe. In severe cases, the conductivity of the test probe is reduced and the test effect is affected. After the surface of the test probe is oxidized and blackened, it is mostly necessary to manually rub and clean the surface oxide layer, which is time-consuming, labor-intensive and inconvenient. In order to reasonably improve this problem, the present application proposes a needle bed for integrated circuit testing. Summary of the invention

[0004] The purpose of the present application is to solve the technical problem that most test probes are made of elastic copper rods with good conductivity, and the surface is gold-plated and silver-plated to achieve the purpose of low contact resistance and corrosion resistance. Since the silver-plated layer is cheaper than the gold-plated layer, the silver-plated test probe is widely used. However, during the test, that is, when a large current passes through the test probe, the temperature of the test probe rises, which aggravates the oxidation of the silver-plated layer on the surface of the test probe. In severe cases, the conductivity of the test probe is reduced and the test effect is affected. After the surface of the test probe is oxidized and blackened, it is mostly necessary to manually rub and clean the surface oxide layer, which is time-consuming, labor-intensive and inconvenient. The present application provides a needle bed for integrated circuit testing.

[0005] In order to achieve the above-mentioned purpose, this application specifically adopts the following technical solutions: A bed of nails for integrated circuit testing, comprising: A horizontal plate, the top of which is slidably matched with a storage plate, the horizontal plate is slidably matched with a mounting plate, a plurality of elastic probes are mounted on the mounting plate, the elastic probes include a fixed section and a cone-shaped movable section, the movable section is movably inserted in the fixed section, and is connected to the fixed section through a first compression spring; A mounting frame is vertically connected to the top of the horizontal plate, and a driving member is installed on the mounting frame, through which the mounting plate can be driven to slide vertically; A cleaning plate is slidably arranged at the bottom of the mounting plate, the cleaning plate is provided with a plurality of through holes, a plurality of movable sections respectively penetrate the plurality of through holes, a cleaning member is provided at the bottom of each through hole, the cleaning member comprises a plurality of movable plates slidably matched with the cleaning plate, a cleaning block is provided on the inner side of each movable plate, a plurality of cleaning blocks are in contact with and overlap the outer side of the movable section, a driving mechanism is provided on the cleaning plate, and a plurality of movable plates can be driven to approach each other through the driving mechanism; The driving part is arranged on the cleaning plate, and can drive the multiple movable sections to rotate.

[0006] Furthermore, the driving mechanism includes a slide groove opened at the bottom of the cleaning plate, the slide groove is arranged in a polygonal ring shape, and multiple movable plates are slidably installed in the slide groove. An annular plate is rotatably installed at the bottom of the cleaning plate, and multiple waist holes are distributed in a ring shape on the annular plate. The movable plate is matched with a guide column, and the guide column is tangent to the waist hole in a sliding manner. The multiple annular plates are connected by a transmission assembly, and a power part is installed on the top of the cleaning plate, and one of the annular plates can be driven to rotate by the power part.

[0007] Furthermore, the driving part includes a plurality of sleeves connected to the top of the cleaning plate, a movable block is movably provided in the sleeve and is rotatably connected to the end of the fixed section, a threaded groove is provided on the inner side of the sleeve, a columnar block is cooperatingly constructed on the movable block, the columnar block slidably cooperates with the threaded groove, and the movable section slides through the movable block.

[0008] Furthermore, the number of the thread grooves is two and they are distributed on the sleeve in a ring shape.

[0009] Furthermore, the cross section of the movable section is a rounded rectangle, and planes are constructed on both sides of the movable section.

[0010] Furthermore, there is a distance between the movable block and the outer side of the movable segment.

[0011] Furthermore, a guide rod is constructed on the cleaning plate, the end of which passes through the mounting plate and is connected to the mounting plate via a second compression spring. A cam is rotatably mounted on the cleaning plate, and the cam is in contact with and overlaps the bottom of the mounting plate.

[0012] Furthermore, a rack is installed on the mounting frame, a spur gear is rotatably installed on the cleaning plate and meshes with the rack, the cam is coaxially connected to a first sprocket, a second sprocket is coaxially rotatably installed on the spur gear and is connected to the first sprocket through a first chain transmission, and the second sprocket is connected to the spur gear through a connecting piece.

[0013] Furthermore, the connecting member includes a cylindrical groove opened on the spur gear, a cylindrical suction block is rotatably installed in the cylindrical groove and is connected to the second sprocket, the second sprocket is constructed with a column, an electromagnetic coil is wound around the outside of the column, and a plurality of strong magnets are distributed in an annular manner on the inner wall of the cylindrical groove.

[0014] Furthermore, two collecting hoods are provided on both sides of the mounting frame, two tube bodies are vertically connected to the horizontal plate, a plurality of air outlet pipes are linearly distributed on the outside of the tube bodies, the two collecting hoods and the two tube bodies are rectangularly distributed at the four corners of the mounting plate, an air compressor is installed on the horizontal plate, the air inlet and outlet ends of the air compressor are respectively connected to the collecting hood and the tube body, and a dust blocking plate is movably inserted in the collecting hood.

[0015] The beneficial effects of this application are as follows: During cleaning, the present application can drive the cleaning plate away from the mounting plate, and synchronously drive multiple movable plates toward each other through the driving mechanism, and finally synchronously drive the movable section to rotate through the driving part, so that the oxide layer on the surface of the test probe can be cleaned without removing the test probe, which is more convenient and easy to use. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a three-dimensional structural diagram of this application; Figure 2 This application Figure 1 Schematic diagram of the local structure; Figure 3 It is a partial structural cross-sectional view of the mounting plate of the present application; Figure 4 This application Figure 3 A magnified image of point A; Figure 5 It is a partial structural diagram of the activity section of this application; Figure 6 This application Figure 5 A magnified view of point B; Figure 7 This application Figure 3 Bottom view of the bottom structure; Figure 8 It is a schematic diagram of the structural disassembly of the cleaning part of the present application; Fig. 9 It is another partial structural cross-sectional view of the mounting plate of the present application; Fig.10It is a structural schematic diagram of the connector of the present application; Fig.11 This application Figure 1 Another partial structural schematic diagram of ; Figure numerals: 1, horizontal plate; 2, storage plate; 3, mounting plate; 4, elastic probe; 401, fixed section; 402, movable section; 403, first compression spring; 5, mounting frame; 6, driving member; 7, cleaning plate; 8, through hole; 9, cleaning member; 10, movable plate; 11, cleaning block; 12, driving mechanism; 1201, slide groove; 1202, annular plate; 1203, waist hole; 1204, guide column; 1205, transmission assembly; 12051, third sprocket; 12052, second chain; 1206, power member; 13, driving part; 1301, sleeve; 1302 , movable block; 1303, threaded groove; 1304, cylindrical block; 14, plane; 15, guide rod; 16, second compression spring; 17, cam; 18, rack; 19, spur gear; 20, first sprocket; 21, second sprocket; 22, first chain; 23, connecting piece; 2301, cylindrical groove; 2302, cylindrical suction block; 2303, column; 2304, electromagnetic coil; 2305, strong magnet; 24, collecting cover; 25, tube body; 26, exhaust pipe; 27, air compressor; 28, dust shield; 29, guide rod; 30, connecting frame; 31, meshing gear. DETAILED DESCRIPTION

[0017] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application.

[0018] like Figure 1-Figure 11 As shown, an embodiment of the present application provides a bed of needles for integrated circuit testing, comprising: A horizontal plate 1, a storage plate 2 is slidably matched on the top of the horizontal plate 1, and when the storage plate 2 is pulled out, the integrated circuit can be fixed on it. A mounting plate 3 is slidably matched on the horizontal plate 1, and both sides of the top of the horizontal plate 1 are vertically connected with guide rods 29. The mounting plate 3 is slidably matched with the two guide rods 29 in the vertical direction. A plurality of elastic probes 4 are installed on the mounting plate 3, and the layout of the elastic probes 4 needs to be adjusted according to the actual integrated circuit to be tested. The elastic probe 4 includes a fixed section 401 and a movable section 402 in a pointed cone shape. The fixed section 401 is installed on the mounting plate 3, is cylindrical, and is connected with a wire. The movable section 402 is movably inserted in the fixed section 401 and is connected to the fixed section 401 through a first compression spring 403. The first compression spring 403 is used to provide a thrust forcing the movable section 402 to extend out of the fixed section 401; The mounting frame 5 is vertically connected to the top of the horizontal plate 1. A driving member 6 is installed on the mounting frame 5. The driving member 6 can drive the mounting plate 3 to slide vertically. The driving member 6 is specifically an electric push rod, and its output end is connected to the mounting plate 3 through the connecting frame 30. When the storage plate 2 slides to the bottom of the mounting plate 3, the mounting plate 3 can be driven to slide down by the driving member 6, and the integrated circuit can be tested through the elastic probe 4 thereon. It should be specifically explained here that the wire connected to the fixed section 401 of the elastic probe 4 can be accommodated by the connecting frame 30; The cleaning plate 7 is slidably arranged at the bottom of the mounting plate 3 and is parallel to the mounting plate 3. A plurality of through holes 8 are arranged on the cleaning plate 7. A plurality of movable sections 402 respectively penetrate through the plurality of through holes 8. The through holes 8 correspond to the elastic probes 4 one by one. A cleaning member 9 is arranged at the bottom of the through holes 8. The cleaning member 9 includes a plurality of movable plates 10 slidably matched with the cleaning plate 7. The movable plates 10 are slidably matched with the bottom of the cleaning plate 7. A cleaning block 11 is arranged on the inner side of the movable plates 10. The cleaning block 11 is made of a silver polishing cloth. The silver polishing cloth is a prior art. Its main components include silver powder, polishing powder and decontamination components. The combined effect of these components enables the silver polishing cloth to effectively remove oxides and stains on the surface of silverware. Specifically, the silver powder can help The silver ornaments are restored to their luster, while the polishing powder and decontamination ingredients can remove stains and oxides on the surface. Multiple cleaning blocks 11 are in contact with and overlap the outer side of the movable section 402. A driving mechanism 12 is provided on the cleaning plate 7. The driving mechanism 12 can drive multiple movable plates 10 to move closer to each other. When the cleaning plate 7 is slid away from the mounting plate 3, the driving mechanism 12 can drive multiple movable plates 10 to move closer together, that is, the cleaning block 11 is in contact with the movable section 402, and the spacing between the multiple movable plates 10 gradually decreases. At the same time, the movable section 402 of the elastic probe 4 is away from the cleaning plate 7. At this time, the cleaning block 11 can slide along the curved surface of the movable section 402 to clean the silver oxide on the outer side of the movable section 402. The driving part 13 is disposed on the cleaning plate 7. The driving part 13 can drive the plurality of movable segments 402 to rotate. When the movable segments 402 are cleaned by the cleaning block 11, the driving part 13 can drive the movable segments 402 to rotate, so as to improve the cleaning effect on the outer side of the movable segments 402. When in use, first pull out the storage plate 2, then fix the integrated circuit on it, then move it to the bottom of the mounting plate 3 through the storage plate 2, and then drive the mounting plate 3 to slide down through the driving member 6, and test the integrated circuit through the elastic probe 4 thereon. After a period of use, the cleaning plate 7 can be slid away from the mounting plate 3, and the multiple movable plates 10 can be driven to move closer through the driving mechanism 12, so that when the movable segment 402 moves, the silver oxide on the outside of the movable segment 402 can be cleaned by the cleaning blocks 11 that gradually move closer. This design can clean the tip of the movable segment 402, and when cleaning, the movable segment 402 can be driven to rotate through the driving part 13, so that the multiple cleaning blocks 11 can perform surrounding cleaning on the movable segment 402, and when driving the cleaning plate 7 to slide toward the mounting plate 3, the multiple movable plates 10 can be synchronously driven away from each other by the driving mechanism 12; During cleaning, the present application can drive the cleaning plate 7 away from the mounting plate 3, and synchronously drive multiple movable plates 10 to move closer to each other through the driving mechanism 12, and finally synchronously drive the movable section 402 to rotate through the driving part 13, so that the oxide layer on the surface of the test probe can be cleaned without removing the test probe, which is more convenient and easy to use.

[0019] like Figure 7-Figure 9As shown, in some embodiments, the driving mechanism 12 includes a slide groove 1201 opened at the bottom of the cleaning plate 7, and the slide groove 1201 is arranged in a polygonal ring. In the present application, the slide groove 1201 is a hexagonal ring. A plurality of movable plates 10 are slidably installed in the slide groove 1201. The number of movable plates 10 is consistent with the number of sides of the slide groove 1201, and the plurality of movable plates 10 are distributed in a ring shape in the slide groove 1201. A ring plate 1202 is rotatably installed at the bottom of the cleaning plate 7, and a plurality of movable plates 10 are distributed in a ring shape on the ring plate 1202. The movable plate 10 has a plurality of waist holes 1203, and a guide post 1204 is configured on the movable plate 10. The guide post 1204 slides tangent to the waist hole 1203. When the annular plate 1202 rotates forward, the inner walls of the plurality of waist holes 1203 respectively contact the plurality of guide posts 1204, and force the guide posts 1204 to move in the waist holes 1203, thereby driving the plurality of movable plates 10 to slide in the slide groove 1201 and first move closer to each other. At this time, the polygon formed by the plurality of cleaning blocks 11 contacts the outer side of the movable segment 402, and moves with the movable segment 402. As the segment 402 moves, the inner diameter of the polygon gradually decreases. At this time, the contact position between the cleaning block 11 and the curved surface of the movable segment 402 changes, and the cleaning block 11 can be effectively used. When the annular plate 1202 reverses, the multiple movable plates 10 can be driven to move away from each other. The multiple annular plates 1202 are connected by transmission assembly 1205. The transmission assembly 1205 includes a third sprocket 12051 constructed on the outer side of the annular plate 1202. The adjacent third sprockets 12051 are connected by a second chain 12052. A power piece 1206 is installed on the top of the cleaning plate 7. The power piece 1206 can drive one of the annular plates 1202 to rotate. The power piece 1206 is specifically a motor, and its output end is connected to one of the annular plates 1202 through two meshing gears 31. When the cleaning plate 7 slides, the motor can be driven to work, and through the cooperation of the two meshing gears 31 and the transmission assembly 1205, the multiple annular plates 1202 are driven to rotate forward and reverse synchronously.

[0020] like Figure 3-Figure 6As shown, in some embodiments, the driving part 13 includes a plurality of sleeves 1301 connected to the top of the cleaning plate 7, the sleeves 1301 are vertically connected to the cleaning plate 7 and correspond to the elastic probes 4 one by one, a movable block 1302 is movably provided in the sleeve 1301, and is rotatably connected to the end of the fixed section 401, a thread groove 1303 is provided on the inner side of the sleeve 1301, and a columnar block 1304 is cooperatingly constructed on the movable block 1302, and the columnar block 1304 is slidably matched with the thread groove 1303. Under the action of the columnar block 1304, the movable block 1302 can be moved along the thread groove 1303 in the sleeve 1301. The movable section 402 moves in the thread direction of the groove 1303, and slides through the movable block 1302. With this design, when the elastic probe 4 conflicts with the integrated circuit and the movable section 402 retracts into the fixed section 401, the columnar block 1304 will not interfere with the movement of the movable section 402. When the cleaning plate 7 is away from the mounting plate 3, the sleeve 1301 is away from the fixed section 401. At this time, the movable block 1302 cannot move together with the sleeve 1301, and will move along the thread of the thread groove 1303 under the action of the columnar block 1304, and drive the movable section 402 to rotate during the movement.

[0021] like Figure 3-Figure 5 As shown, in some embodiments, there are two thread grooves 1303 distributed in a ring shape on the sleeve 1301, and the number of columnar blocks 1304 is consistent with the thread grooves 1303. Such a design allows the movable block 1302 to maintain balance when moving, thereby reducing the friction resistance encountered by the movable block 1302 when moving in the sleeve 1301.

[0022] like Figure 4 and Figure 5 As shown, in some embodiments, the cross-section of the movable section 402 is a rounded rectangle, and planes 14 are constructed on both sides of the movable section 402. When the cylindrical block 1304 moves along the thread of the thread groove 1303, it will conflict with the plane 14, thereby driving the movable section 402 to rotate. This design makes the surface of the movable section 402 smoother and flatter, which is not only convenient for processing, but also convenient for cleaning.

[0023] like Figure 4 and Figure 5 As shown, in some embodiments, there is a distance between the movable block 1302 and the outer side of the movable section 402. By adopting a non-contact design, when the movable section 402 contracts during testing of the integrated circuit, its outer coating is not easily worn by the movable block 1302.

[0024] like Figure 2 , Figure 3 , Fig. 9 and Fig.10As shown, in some embodiments, a guide rod 15 is constructed on the cleaning plate 7, and the guide rod 15 is vertically connected to the cleaning plate 7. The end of the guide rod 15 passes through the mounting plate 3 and is connected to the mounting plate 3 by a second compression spring 16. The second compression spring 16 is used to provide a thrust forcing the cleaning plate 7 to slide toward the mounting plate 3. A cam 17 is rotatably installed on the cleaning plate 7, and the cam 17 is in contact with and overlaps the bottom of the mounting plate 3. When the protruding part of the cam 17 is in contact with the mounting plate 3, the cleaning plate 7 can slide in the direction away from the mounting plate 3, and when the protruding part of the cam 17 is separated from the mounting plate 3, the cleaning plate 7 can slide toward the mounting plate 3 under the action of the second compression spring 16. It should be specifically explained here that during the rotation of the cam 17, the mounting plate 3 always contacts the outer side of the cam 17.

[0025] like Figure 2 , Figure 3 , Fig. 9 and Fig.10 As shown, in some embodiments, a rack 18 is installed on the mounting frame 5, a spur gear 19 is rotatably installed on the cleaning plate 7 and meshes with the rack 18, the cam 17 is coaxially connected to the first sprocket 20, the spur gear 19 is coaxially rotatably installed with the second sprocket 21, and is transmission-connected to the first sprocket 20 through a first chain 22, the second sprocket 21 is connected to the spur gear 19 through a connecting piece 23, when the cleaning plate 7 slides with the mounting plate 3, under the action of the rack 18, the spur gear 19 will rotate, and when the connecting piece 23 is disconnected, the spur gear 19 will only idle, and after a period of use, when the mounting plate 3 and the cleaning plate 7 slide upward together, the second sprocket 21 and the spur gear 19 can be connected through the connecting piece 23, at this time, the second sprocket 21 will rotate along with the spur gear 19 The first sprocket 20 and the second sprocket 21 are driven by the first chain 22 to rotate, thereby driving the cam 17 to rotate, and synchronously controlling the motor to rotate forward, so that the movable section 402 of the elastic probe 4 can be cleaned during the upward sliding of the mounting plate 3, and when the mounting plate 3 slides downward, under the action of the connecting piece 23, the spur gear 19 can drive the cam 17 to rotate in the opposite direction. At this time, the mounting plate 3 and the cleaning plate 7 are close to each other. It should be specifically explained here that the second sprocket 21 is smaller than the first sprocket 20, and the first sprocket 20 and the second sprocket 21 are reduced speed transmissions, that is, after the cam 17 is driven by the spur gear 19 to rotate to the maximum angle, the protruding part of the cam 17 is perpendicular to the mounting plate 3, so that during the unidirectional sliding process of the mounting plate 3, the mounting plate 3 and the cleaning plate 7 will only move away from or approach each other.

[0026] like Fig.10As shown, in some embodiments, the connecting member 23 includes a cylindrical groove 2301 opened on the spur gear 19, the cylindrical groove 2301 is coaxial with the spur gear 19, a cylindrical suction block 2302 is rotatably installed in the cylindrical groove 2301, and is connected to the second sprocket 21, the cylindrical suction block 2302 and the second sprocket 21 are both made of silicon steel, and a column 2303 is constructed on the second sprocket 21, and an electromagnetic coil 2304 is wound around the outer side of the column 2303. The structure here is similar to the strong electric magnet 2305, that is, when the electromagnetic coil 2304 is energized, a magnetic field is generated, and the column 2303, the second sprocket 21 and the cylindrical suction block are given. 2302 is magnetic, and a plurality of strong magnets 2305 are distributed in an annular manner on the inner wall of the cylindrical groove 2301. The spur gear 19 is made of demagnetized steel and will not be attracted by magnetic force. A plurality of strong magnets 2305 are arranged in an annular shape around the outer side of the cylindrical suction block 2302 and are magnetically attracted to the cylindrical suction block 2302. The structure here is similar to a magnetic coupler. When the electromagnetic coil 2304 is energized, under the magnetic force of the cylindrical suction block 2302 and the plurality of strong magnets 2305, the second sprocket 21 is connected to the spur gear 19. When the electromagnetic coil 2304 is deenergized, the cylindrical suction block 2302 is demagnetized, and the second sprocket 21 is disconnected from the spur gear 19.

[0027] like Figure 1 and Fig.11 As shown, in some embodiments, two collecting hoods 24 are provided on both sides of the mounting frame 5, two tube bodies 25 are vertically connected to the cross plate 1, and multiple air outlet pipes 26 are linearly distributed on the outside of the tube body 25. The two collecting hoods 24 and the two tube bodies 25 are rectangularly distributed at the four corners of the mounting plate 3, and the air intake direction of the two collecting hoods 24 and the air outlet direction of the air outlet pipes 26 on the two tube bodies 25 intersect at the central axis of the mounting plate 3. An air compressor 27 is installed on the cross plate 1, and the air inlet end and the air outlet end of the air compressor 27 are respectively connected to the collecting hood 24 and the tube body 25. When the air compressor 27 is working, the air flow is ejected from the air outlet pipe 26. On the one hand, the elastic probe 4 can be cooled to reduce its temperature and make it less prone to oxidation. On the other hand, the dust dropped during the friction cleaning of the cleaning block 11 can be cleaned and collected by the collecting hood 24. A dust blocking plate 28 is movably inserted in the collecting hood 24. The dust collected by the collecting hood 24 can be cleaned by taking out the dust blocking plate 28. The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A bed of nails for integrated circuit testing, characterized in that: include: A transverse plate (1), wherein a storage plate (2) is slidably engaged with the top of the transverse plate (1), a mounting plate (3) is slidably engaged with the transverse plate (1), a plurality of elastic probes (4) are mounted on the mounting plate (3), the elastic probes (4) comprising a fixed section (401) and a movable section (402) in a pointed cone shape, the movable section (402) being movably inserted into the fixed section (401) and connected to the fixed section (401) via a first compression spring (403); A mounting frame (5) is vertically connected to the top of the horizontal plate (1), and a driving member (6) is installed on the mounting frame (5), and the driving member (6) can drive the mounting plate (3) to slide vertically; A cleaning plate (7) is slidably arranged at the bottom of the mounting plate (3), the cleaning plate (7) is provided with a plurality of through holes (8), a plurality of movable sections (402) respectively penetrate the plurality of through holes (8), a cleaning member (9) is provided at the bottom of each of the through holes (8), the cleaning member (9) comprises a plurality of movable plates (10) slidably matched with the cleaning plate (7), a cleaning block (11) is provided on the inner side of each of the movable plates (10), the plurality of cleaning blocks (11) are in contact and overlap with the outer side of the movable section (402), a driving mechanism (12) is provided on the cleaning plate (7), and the plurality of movable plates (10) can be driven to move closer to each other by the driving mechanism (12); The driving part (13) is arranged on the cleaning plate (7), and the driving part (13) can drive the plurality of movable segments (402) to rotate.

2. The needle bed for integrated circuit testing according to claim 1, characterized in that: The driving mechanism (12) comprises a slide groove (1201) provided at the bottom of the cleaning plate (7), the slide groove (1201) being arranged in a polygonal ring shape, a plurality of movable plates (10) being slidably mounted in the slide groove (1201), a ring plate (1202) being rotatably mounted at the bottom of the cleaning plate (7), a plurality of waist holes (1203) being distributed in a ring shape on the ring plate (1202), a guide column (1204) being cooperatingly constructed on the movable plate (10), the guide column (1204) being tangentially slidably mounted to the waist holes (1203), the plurality of ring plates (1202) being connected in transmission via a transmission assembly (1205), a power member (1206) being mounted on the top of the cleaning plate (7), and one of the ring plates (1202) being driven to rotate via the power member (1206).

3. The needle bed for integrated circuit testing according to claim 1, characterized in that: The driving part (13) comprises a plurality of sleeves (1301) connected to the top of the cleaning plate (7); a movable block (1302) is movably provided inside the sleeve (1301) and is rotatably connected to the end of the fixed section (401); a thread groove (1303) is provided inside the sleeve (1301); a columnar block (1304) is cooperatingly constructed on the movable block (1302); the columnar block (1304) and the thread groove (1303) are slidably matched; and the movable section (402) slides through the movable block (1302).

4. The needle bed for integrated circuit testing according to claim 3, characterized in that: The number of the thread grooves (1303) is two, and they are distributed in an annular shape on the sleeve (1301).

5. The needle bed for integrated circuit testing according to claim 3, characterized in that: The cross section of the movable section (402) is in the shape of a rounded rectangle, and planes (14) are formed on both sides of the movable section (402).

6. The needle bed for integrated circuit testing according to claim 5, characterized in that: There is a distance between the movable block (1302) and the outer side of the movable section (402).

7. The needle bed for integrated circuit testing according to claim 3, characterized in that: The cleaning plate (7) is provided with a guide rod (15), the end of which passes through the mounting plate (3) and is connected to the mounting plate (3) via a second compression spring (16). A cam (17) is rotatably mounted on the cleaning plate (7), the cam (17) being in contact and overlapped with the bottom of the mounting plate (3).

8. The needle bed for integrated circuit testing according to claim 7, characterized in that: A rack (18) is mounted on the mounting frame (5); a spur gear (19) is rotatably mounted on the cleaning plate (7) and meshes with the rack (18); a first sprocket (20) is coaxially connected to the cam (17); a second sprocket (21) is rotatably mounted on the spur gear (19) and is transmission-connected to the first sprocket (20) via a first chain (22); and the second sprocket (21) is connected to the spur gear (19) via a connecting member (23).

9. The needle bed for integrated circuit testing according to claim 8, characterized in that: The connecting member (23) comprises a cylindrical groove (2301) formed on the spur gear (19), a cylindrical suction block (2302) being rotatably mounted in the cylindrical groove (2301) and connected to the second sprocket (21), a column (2303) being constructed on the second sprocket (21), an electromagnetic coil (2304) being wound around the outer side of the column (2303), and a plurality of strong magnets (2305) being distributed in an annular manner on the inner wall of the cylindrical groove (2301).

10. The bed of nails for integrated circuit testing according to claim 1, characterized in that: Two collecting hoods (24) are provided on both sides of the mounting frame (5); two tube bodies (25) are vertically connected to the transverse plate (1); a plurality of air outlet pipes (26) are linearly distributed outside the tube bodies (25); the two collecting hoods (24) and the two tube bodies (25) are distributed in a rectangular shape at four corners of the mounting plate (3); an air compressor (27) is installed on the transverse plate (1); an air inlet end and an air outlet end of the air compressor (27) are respectively connected to the collecting hood (24) and the tube body (25); and a dust blocking plate (28) is movably inserted in the collecting hood (24).

Images