Infrared detector driving and adjusting circuit

Abstract

The invention provides an infrared detector driving and adjusting circuit, relates to the technical field of infrared detector driving, and constructs an infrared detector adjusting circuit to perform voltage adjustment, temperature judgment, power-on and power-off control and image signal generation on an infrared detector. Calculating an operation performance coefficient of each device, and calculating a device accumulation performance coefficient of each device according to the operation performance coefficient of each device; according to the device accumulation performance coefficient, accumulation adjustment labeling and performance parameter adjustment are carried out, and the infrared detector adjustment circuit has remarkable advantages in the aspect of solving the problems existing in a traditional infrared detector adjustment circuit and has great significance in improving the performance stability and reliability of an infrared detector.

Description

Technical Field

[0001] The invention provides an infrared detector driving and regulating circuit, and relates to the technical field of infrared detector driving. Background Art

[0002] Infrared detectors face many challenges in practical applications, including changes in ambient temperature, fluctuations in power supply voltage, and complex signal processing. These factors may affect the imaging quality and stability of infrared detectors.

[0003] Traditional infrared detector regulation circuits often suffer from issues such as inaccurate voltage regulation, unstable temperature control, untimely power-on and power-off control, and limited signal processing capabilities. These issues are particularly prominent in high-sensitivity and high-resolution infrared detection systems, seriously impacting overall system performance and reliability. Summary of the Invention

[0004] This invention provides an infrared detector drive and regulation circuit to address the problems often encountered in conventional infrared detector regulation circuits, such as inaccurate voltage regulation, unstable temperature control, untimely power-on and power-off control, and limited signal processing capabilities. These issues are particularly prominent in high-sensitivity and high-resolution infrared detection systems, seriously affecting the overall performance and reliability of the system.

[0005] The present invention provides an infrared detector drive adjustment circuit, the adjustment circuit comprising:

[0006] The driver building module is used to build the infrared detector adjustment circuit, perform voltage adjustment, temperature judgment, power-on and power-off control, and image signal generation for the infrared detector;

[0007] An operation performance monitoring and adjustment module is used to calculate the operation performance coefficient of each device and calculate the device cumulative performance coefficient of each device based on the operation performance coefficient of each device;

[0008] Accumulated adjustment marking and performance parameter adjustment are performed according to the cumulative performance coefficient of the device.

[0009] Furthermore, the driver building module includes:

[0010] A building block for constructing an infrared detector adjustment circuit using an infrared detector, a refrigeration temperature test circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA;

[0011] A voltage regulating module is used to output a power supply voltage to the infrared detector through the bias voltage control circuit and to regulate its bias voltage.

[0012] A temperature judgment module is used to connect the refrigeration temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source, obtain the temperature data inside the refrigeration temperature test circuit, judge the temperature data, obtain a temperature judgment result, and output the temperature judgment result to the FPGA;

[0013] The power-on and power-off control module is used to control the detector to power on or off according to the judgment result after the refrigeration temperature test circuit judges whether the internal temperature of the Dewar reaches the specified value. When the internal temperature of the Dewar reaches the specified value, the detector is powered on;

[0014] an analog signal processing module, configured to obtain an infrared radiation signal through the infrared detector and output a level signal to the analog signal processing circuit through the infrared detector;

[0015] After the level signal output by the infrared detector is converted into a specified level signal through the analog signal processing circuit, analog-to-digital conversion is performed to obtain a digital image signal;

[0016] The image generation and power-on control module is used to receive the digital signal through FPGA, perform digital processing, output image signal, output digital control pulse to the infrared detector, and perform power-on control on the bias voltage control circuit.

[0017] Furthermore, the analog signal processing module includes:

[0018] Drive the analog image signal output by the infrared detector, increase the output impedance, and obtain the improvement data;

[0019] After driving, it enters the subtractor, and then sets the low level of the analog image signal to start from 0V;

[0020] Amplify the analog image signal to the preset dynamic range of the ADC;

[0021] Perform analog-to-digital conversion through the ADC and output the analog image signal as a 14-bit parallel digital image signal;

[0022] Input digital image signals into FPGA;

[0023] One channel of image information is output through FPGA for storage and backup.

[0024] Furthermore, the image generation and power-on control module includes:

[0025] Get a 1mA constant current source;

[0026] When the temperature measuring diode of the infrared detector is characterized by a preset resistance characteristic, it is converted into a level signal after passing through a constant current source;

[0027] comparing the level signal with a reference level signal;

[0028] Generate power-on protection inside the FPGA, that is, when the level signal exceeds or equals the reference level signal, the infrared detector is powered on; when the level signal is lower than the reference level signal, the infrared detector is powered off;

[0029] Obtaining a reference level signal;

[0030] A potentiometer is set between the reference level signal and the ground line to adjust the intermediate level signal to obtain adjustment data;

[0031] The level signal is isolated and driven by an operational amplifier to obtain the input voltage.

[0032] Furthermore, the operation performance monitoring and adjustment module includes:

[0033] Acquiring operating status data of each device, and calculating an operating performance coefficient of each device based on the operating status data;

[0034] The calculation formula of the operating performance coefficient is:

[0035]

[0036] Among them, Y xn is the device's operating performance coefficient, e is the device's data monitoring type, SS i is the actual operating data of the i-th data monitoring type, MS i is the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category;

[0037] Performing operation adjustment marking on the device according to the operation performance coefficient, and adjusting operation parameters of the device with the operation adjustment marking to obtain adjustment data;

[0038] Calculating a device cumulative performance coefficient based on the operating performance coefficient;

[0039] The calculation formula of the cumulative performance coefficient of the device is:

[0040]

[0041] Among them, L xn is the cumulative performance coefficient of the device, d is the number of devices up to the current device, Y xna is the performance coefficient of the dth device, Y xna-1 is the performance coefficient of the d-1th device;

[0042] Accumulated adjustment marking is performed on the device according to the accumulated performance coefficient of the device, and performance parameters of the device with the accumulated adjustment marking are adjusted to obtain adjustment data.

[0043] Furthermore, the adjustment method includes:

[0044] Construct an infrared detector adjustment circuit to perform voltage adjustment, temperature judgment, power-on and power-off control, and image signal generation on the infrared detector;

[0045] Calculating an operating performance coefficient of each device, and calculating a device cumulative performance coefficient of each device based on the operating performance coefficient of each device;

[0046] Accumulated adjustment marking and performance parameter adjustment are performed according to the cumulative performance coefficient of the device.

[0047] Furthermore, the infrared detector adjustment circuit is constructed to adjust the voltage, determine the temperature, control power on and off, and generate image signals for the infrared detector, including:

[0048] The infrared detector adjustment circuit is constructed by using an infrared detector, a cooling temperature test circuit, a bias voltage control circuit, an analog signal processing circuit and an FPGA;

[0049] The bias voltage control circuit outputs a power supply voltage to the infrared detector and adjusts its bias voltage.

[0050] Connecting the refrigeration temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source to obtain the temperature data inside the circuit, judging the temperature data to obtain a temperature judgment result, and outputting the temperature judgment result to the FPGA;

[0051] The refrigeration temperature test circuit determines whether the internal temperature of the Dewar reaches the specified value, and controls the detector to be powered on or off according to the judgment result. When the internal temperature of the Dewar reaches the specified value, the detector is powered on;

[0052] Acquire an infrared radiation signal through the infrared detector, and output a level signal to the analog signal processing circuit through the infrared detector;

[0053] After the level signal output by the infrared detector is converted into a specified level signal through the analog signal processing circuit, analog-to-digital conversion is performed to obtain a digital image signal;

[0054] The digital signal is received by FPGA, digitally processed, and image signal is output. A digital control pulse is output to the infrared detector, and power-on control is performed on the bias voltage control circuit.

[0055] Furthermore, the analog signal processing circuit converts the level signal output by the infrared detector into a prescribed level signal, and then performs analog-to-digital conversion to obtain a digital image signal, including:

[0056] Drive the analog image signal output by the infrared detector, increase the output impedance, and obtain the improvement data;

[0057] After driving, it enters the subtractor, and then sets the low level of the analog image signal to start from 0V;

[0058] Amplify the analog image signal to the preset dynamic range of the ADC;

[0059] The analog image signal is converted into a 14-bit parallel digital image signal through the ADC.

[0060] Input digital image signals into FPGA;

[0061] One channel of image information is output through FPGA for storage and backup.

[0062] Furthermore, the method of powering the detector and adjusting the bias voltage control circuit when the internal temperature of the Dewar reaches a specified value includes:

[0063] Get a 1mA constant current source;

[0064] When the temperature measuring diode of the infrared detector is characterized by a preset resistance characteristic, it is converted into a level signal after passing through a constant current source;

[0065] comparing the level signal with a reference level signal;

[0066] Generate power-on protection inside the FPGA, that is, when the level signal exceeds or equals the reference level signal, the infrared detector is powered on; when the level signal is lower than the reference level signal, the infrared detector is powered off;

[0067] Obtaining a reference level signal;

[0068] A potentiometer is set between the reference level signal and the ground line to adjust the intermediate level signal to obtain adjustment data;

[0069] The level signal is isolated and driven by an operational amplifier to obtain the input voltage.

[0070] Furthermore, calculating the operating performance coefficient of each device, calculating the device cumulative performance coefficient of each device based on the operating performance coefficient of each device, and performing cumulative adjustment marking and performance parameter adjustment based on the device cumulative performance coefficient, including:

[0071] Acquiring operating status data of each device, and calculating an operating performance coefficient of each device based on the operating status data;

[0072] The calculation formula of the operating performance coefficient is:

[0073]

[0074] Among them, Y xn is the device's operating performance coefficient, e is the device's data monitoring type, SS i is the actual operating data of the i-th data monitoring type, MS i is the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category;

[0075] Performing operation adjustment marking on the device according to the operation performance coefficient, and adjusting operation parameters of the device with the operation adjustment marking to obtain adjustment data;

[0076] Calculating a device cumulative performance coefficient based on the operating performance coefficient;

[0077] The calculation formula of the cumulative performance coefficient of the device is:

[0078]

[0079] Among them, L xn is the cumulative performance coefficient of the device, d is the number of devices up to the current device, Y xna is the performance coefficient of the dth device, Y xna-1 is the performance coefficient of the d-1th device;

[0080] Accumulated adjustment marking is performed on the device according to the accumulated performance coefficient of the device, and performance parameters of the device with the accumulated adjustment marking are adjusted to obtain adjustment data.

[0081] Beneficial effects of the present invention: Through precise voltage regulation and temperature control, the infrared detector is ensured to operate in the optimal working state, thereby improving detection accuracy and stability. The operating status of each component of the system is monitored and adjusted in real time, potential problems are discovered and handled in a timely manner, and failures are effectively avoided, thereby enhancing the reliability and durability of the system. The automatic adjustment mechanism based on the cumulative performance coefficient of the device can accurately optimize the system performance bottleneck and improve the overall performance of the system. Through automated monitoring and adjustment functions, the need for manual intervention and regular inspections is reduced, thereby reducing the maintenance cost of the system. Stable detection performance and optimized system performance directly enhance the user experience, making the infrared detection system more efficient and convenient. BRIEF DESCRIPTION OF THE DRAWINGS

[0082] Figure 1 This is a schematic diagram of an infrared detector drive and adjustment circuit;

[0083] Figure 2 Schematic diagram of the drive adjustment method. DETAILED DESCRIPTION

[0084] The preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.

[0085] In one embodiment of the present invention, a driving and regulating circuit for an infrared detector is provided, wherein the regulating circuit includes:

[0086] The driver building module is used to build the infrared detector adjustment circuit, perform voltage adjustment, temperature judgment, power-on and power-off control, and image signal generation for the infrared detector;

[0087] An operation performance monitoring and adjustment module is used to calculate the operation performance coefficient of each device and calculate the device cumulative performance coefficient of each device based on the operation performance coefficient of each device;

[0088] Accumulated adjustment marking and performance parameter adjustment are performed according to the cumulative performance coefficient of the device.

[0089] The working principle of this technical solution is to provide a stable and adjustable voltage to the infrared detector, ensuring that the detector maintains optimal operating conditions under different operating environments. Voltage regulation is achieved through a sophisticated power management circuit, which can automatically adjust the output voltage according to the detector's needs. Because the performance of infrared detectors is significantly affected by temperature, the module's built-in temperature sensor monitors the temperature of the detector and the surrounding environment in real time and automatically adjusts or alarms based on preset temperature thresholds to ensure that the detector operates within the appropriate temperature range. Based on system instructions or preset conditions (such as abnormal temperature or unstable voltage), the module can control the power on and off of the infrared detector, achieving safe and reliable power management. The infrared radiation signal received by the detector is converted and further processed by the module to generate an image signal.

[0090] The module collects the operating parameters of the detector and its associated circuits (such as voltage, current, temperature, and signal strength) to calculate the operating performance coefficient of each device. These coefficients reflect the device's current operating status and performance. Based on the operating performance coefficient of each device, the module further calculates the cumulative performance coefficient of the entire system. This coefficient integrates the performance of all key components and provides a basis for evaluating the overall system performance. Based on the cumulative performance coefficient of each device, the module automatically performs cumulative adjustments and annotations, marking performance bottlenecks or potential problem points. Furthermore, the module can automatically adjust relevant performance parameters (such as voltage and temperature setpoints) as needed to optimize overall system performance.

[0091] After the output level of the detector is changed to the specified level, analog-to-digital conversion is performed to convert it into a digital image signal: when the internal temperature of the dewar reaches the specified value, the detector is powered on; the infrared detector is powered by a low-dropout linear regulator (LDO), and the bias voltage is supplied to the infrared detector through a low-noise voltage reference source; 4-channel digital control pulses of the infrared detector are generated through the FPGA, where the serial port can set the control word to control the infrared detector gain, DE and other parameters.

[0092] After the detector output level is changed to the specified level, analog-to-digital conversion is performed to convert it into a digital image signal, including:

[0093] The image signal output by the detector is first driven to increase the output impedance;

[0094] After driving, it enters the subtractor, making the image signal low level start from 0V;

[0095] Amplify the image signal to match the dynamic range of the ADC;

[0096] Perform analog-to-digital conversion through ADC and output a 14-bit parallel digital image signal;

[0097] Input the digital image signal to FPGA for further processing;

[0098] FPGA outputs one channel of image information.

[0099] In summary, the level information output by the infrared detector is converted into the original grayscale LVDS digital image signal.

[0100] When the temperature inside the Dewar reaches the specified value, the detector is powered on, including:

[0101] Provide a 1mA constant current source;

[0102] The infrared detector temperature measuring diode is characterized by resistance characteristics, which will be converted into a level signal after passing through a constant current source;

[0103] The level signal is compared with a reference level signal;

[0104] When the level signal exceeds the comparison value, the detector is powered on;

[0105] A power-on protection is formed inside the FPGA, that is, power is immediately turned on when the voltage level reaches the power-on threshold; power is delayed and turned off when the voltage level falls below the power-on threshold.

[0106] Generate reference level through high-precision, low-noise voltage reference source;

[0107] Adding a potentiometer between the reference level and the ground wire can facilitate the adjustment of various intermediate levels;

[0108] The operational amplifier is used to isolate and drive the level and generate an adjustable input voltage.

[0109] The technical effects of the above technical solution are: through precise voltage regulation and temperature control, the infrared detector is ensured to operate in the optimal working state, thereby improving detection accuracy and stability. Real-time monitoring and adjustment of the operating status of each component in the system, timely detection and treatment of potential problems, effective avoidance of failures, and enhanced system reliability and durability. The automatic adjustment mechanism based on the cumulative performance coefficient of the device can accurately optimize system performance bottlenecks and improve the overall system performance. Through automated monitoring and adjustment functions, the need for manual intervention and regular inspections is reduced, thereby reducing system maintenance costs. Stable detection performance and optimized system performance directly enhance the user experience, making the infrared detection system more efficient and convenient.

[0110] In one embodiment of the present invention, the driver building module includes:

[0111] A building block for constructing an infrared detector adjustment circuit using an infrared detector, a refrigeration temperature test circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA;

[0112] A voltage regulating module is used to output a power supply voltage to the infrared detector through the bias voltage control circuit and to regulate its bias voltage.

[0113] A temperature judgment module is used to connect the refrigeration temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source, obtain the temperature data inside the refrigeration temperature test circuit, judge the temperature data, obtain a temperature judgment result, and output the temperature judgment result to the FPGA;

[0114] The power-on and power-off control module is used to control the detector to power on or off according to the judgment result after the refrigeration temperature test circuit judges whether the internal temperature of the Dewar reaches the specified value. When the internal temperature of the Dewar reaches the specified value, the detector is powered on;

[0115] an analog signal processing module, configured to obtain an infrared radiation signal through the infrared detector and output a level signal to the analog signal processing circuit through the infrared detector;

[0116] After the level signal output by the infrared detector is converted into a specified level signal through the analog signal processing circuit, analog-to-digital conversion is performed to obtain a digital image signal;

[0117] The image generation and power-up control module receives the digital signal via the FPGA, performs digital processing, outputs an image signal, and outputs digital control pulses to the infrared detector, controlling the power supply of the bias voltage control circuit. The bias voltage control circuit supplies power to the infrared detector via a low-dropout linear regulator (LDO) and provides bias voltage to the infrared detector via a low-noise voltage reference source. The FPGA generates four digital control pulses for the infrared detector, with control words set via the serial port to control parameters such as the infrared detector's gain and DE.

[0118] The working principle of the above technical solution is as follows: The building block forms the foundation of the entire regulation circuit. By integrating key components such as the infrared detector, cooling temperature test circuit, bias voltage control circuit, analog signal processing circuit, and FPGA (field programmable gate array), a complete infrared detector regulation circuit system is constructed. This system enables comprehensive control of the infrared detector, signal processing, and image generation. The voltage regulation module utilizes the bias voltage control circuit to provide a stable operating voltage for the infrared detector via a low-dropout linear regulator (LDO). This module also fine-tunes the bias voltage to adapt to different operating environments and detection requirements, ensuring the infrared detector operates at optimal performance. The temperature determination module, through the cooling temperature test circuit, connects to the infrared detector's built-in temperature measuring diode using a constant current source to acquire real-time temperature data within the detector. This data is fed into the FPGA for processing and compared with preset temperature thresholds to generate a temperature determination result. When the temperature reaches or exceeds the specified range, the temperature determination module generates a corresponding signal to trigger subsequent power-on and power-off control. The power-on and power-off control module controls the infrared detector's power-on and power-off operations based on the temperature determination module's output. Specifically, when the refrigeration temperature test circuit detects that the temperature inside the dewar reaches a specified value, the power-on / off control module sends a power-on signal to the infrared detector, activating it. Otherwise, a power-off signal is sent to protect the detector from overheating or other adverse conditions. The analog signal processing module receives the level signal output by the infrared detector and converts it to a specified level through a series of processing steps (such as signal amplification, filtering, and level conversion). This module then uses an analog-to-digital converter (ADC) to convert the analog signal into a digital image signal. The image generation and power-on control module receives the digital signal from the analog signal processing module via the FPGA and performs digital processing (such as image reconstruction, enhancement, and denoising) to ultimately output a high-quality image signal. This module also generates digital control pulses for the infrared detector via the FPGA, enabling power-on control of the bias voltage control circuit. These control pulses can be used to set control words via the serial port to adjust parameters such as the infrared detector's gain and DE, further optimizing detection performance and image quality.

[0119] An infrared detector is a device that converts incident infrared radiation into an electrical signal. Infrared radiation, with a wavelength between visible light and microwaves, is imperceptible to the human eye. Infrared detectors utilize principles such as the infrared thermal effect and the photoelectric effect to convert infrared radiation into an electrical signal. Infrared detectors are widely used in military reconnaissance, night vision devices, thermal imaging, and environmental monitoring. They are valued for their strong adaptability, concealment, and ability to detect camouflaged targets.

[0120] Refrigeration temperature test circuits are primarily used to monitor and control the operating temperature of infrared detectors. Because infrared detector performance is significantly affected by temperature, refrigeration technology is required to lower the operating temperature to a lower level to improve detection sensitivity and stability. Refrigeration temperature test circuits typically include a temperature sensor, a constant current source, and a signal processing circuit. These circuits acquire real-time temperature data from the infrared detector and adjust the temperature accordingly. When the temperature reaches a set point, the circuit shuts down the refrigeration unit to maintain the detector within the optimal operating temperature range.

[0121] The bias voltage control circuit provides a stable bias voltage for infrared detectors to ensure their proper operation. Bias voltage is a stable reference voltage level that plays an important role in electronic circuits, such as determining the operating point, eliminating DC offset, improving linearity, and stabilizing circuit operation. In infrared detectors, the bias voltage control circuit regulates the power supply voltage and current to provide the appropriate bias voltage for the detector, enabling it to output a stable electrical signal under optimal operating conditions.

[0122] Analog signal processing circuits are primarily used to amplify, filter, and perform analog-to-digital conversion on the analog signals output by infrared detectors. Because the signals from infrared detectors are typically weak and noisy, they require preprocessing by analog signal processing circuits to improve the signal-to-noise ratio and reliability. Analog signal processing circuits typically include amplifiers, filters, and analog-to-digital converters, converting analog signals into digital signals and outputting them to subsequent digital signal processing systems for further processing.

[0123] An FPGA is a field-programmable gate array, a type of programmable logic device (PLD). It allows users to configure and reconfigure it through software to achieve different functions. FPGAs offer advantages such as high flexibility, strong parallelism, and a short development cycle, making them widely used in fields such as communications, image processing, and embedded systems. In infrared detector adjustment circuits, FPGAs are often used to receive and process digital signals output by analog signal processing circuits, implementing functions such as image digitization and power-on control. FPGAs contain a large number of programmable logic cells and interconnect resources, enabling highly parallel computing and processing, thereby improving overall system performance and efficiency.

[0124] The infrared detector, cooling temperature test circuit, bias voltage control circuit, analog signal processing circuit and FPGA each play an important role in the infrared detector adjustment circuit, working together to achieve stable operation and efficient processing of the infrared detector.

[0125] The technical effects of the above technical solution are as follows: through the coordinated work of the cooling temperature test circuit and the power-on and power-off control module, precise control of the internal temperature of the infrared detector is achieved, ensuring the stable operation of the detector at the optimal operating temperature. The voltage regulation module and the bias voltage control circuit provide the infrared detector with stable and adjustable operating voltage and bias voltage, effectively improving the signal-to-noise ratio and sensitivity of the detector. The integration of the analog signal processing module and the image generation and power-on control module realizes the efficient acquisition, processing and conversion of infrared radiation signals, generating high-quality image signals. Through the digital control pulses generated by the FPGA and the control words set by the serial port, the user can flexibly adjust the gain, DE and other parameters of the infrared detector to adapt to different detection requirements and environmental conditions. The entire adjustment circuit system adopts a modular design, and each module is relatively independent and easy to maintain and upgrade, which effectively improves the reliability and maintainability of the system.

[0126] In one embodiment of the present invention, the analog signal processing module includes:

[0127] Drive the analog image signal output by the infrared detector, increase the output impedance, and obtain the improvement data;

[0128] After driving, it enters the subtractor, and then sets the low level of the analog image signal to start from 0V;

[0129] Amplify the analog image signal to the preset dynamic range of the ADC;

[0130] The analog image signal is converted into a 14-bit parallel digital image signal through the ADC.

[0131] Input digital image signals into FPGA;

[0132] One channel of image information is output through FPGA for storage and backup.

[0133] In summary, the level information output by the infrared detector is converted into the original grayscale LVDS digital image signal.

[0134] The working principle of the above technical solution is to drive the analog image signal output by the infrared detector and increase its output impedance. This step aims to enhance signal stability and anti-interference capabilities, ensuring that the signal does not attenuate or reflect during transmission due to impedance mismatch. The analog image signal, after impedance increase, enters the subtractor. In the subtractor, by setting an appropriate reference level, the low level of the analog image signal can be adjusted from 0V. This step helps optimize the signal's dynamic range, making it more suitable for the ADC input requirements. The module amplifies the analog image signal to the ADC's preset dynamic range. This ensures that the signal fully utilizes the ADC's resolution during the analog-to-digital conversion process, thereby generating a higher-quality digital image signal. The amplification factor is determined by the ADC's performance parameters and the infrared detector's output characteristics. The amplified analog image signal is fed into the ADC for analog-to-digital conversion. The ADC converts the continuous analog signal into a discrete digital signal, namely a 14-bit parallel digital image signal. This step completes the signal conversion from the analog domain to the digital domain. The 14-bit parallel digital image signal is then input into the FPGA. FPGAs have powerful digital signal processing capabilities, enabling further digital processing of input digital image signals, such as filtering, enhancement, and denoising. The processed image information is then output through the FPGA as an image signal and stored for future use. This successfully generates and preserves the original grayscale LVDS digital image signal.

[0135] The technical effect of the above-mentioned technical solution is that, through steps such as output impedance enhancement, low-level setting, and signal amplification, the analog signal processing module effectively improves the quality of the analog image signal output by the infrared detector, reducing attenuation and noise interference during signal transmission. Amplifying the analog image signal to the preset dynamic range of the ADC ensures that the signal fully utilizes the ADC's resolution during the analog-to-digital conversion process, thereby generating a higher-quality digital image signal. The introduction of an FPGA makes digital image signal processing more flexible and efficient. Users can program the FPGA according to their actual needs to implement different image processing algorithms and functions. After converting the analog image signal to a digital image signal, it is easier to store and transmit. The digital image signal has the advantages of strong anti-interference capabilities and is easy to copy and process. As a key component of the infrared detector's control circuit, the improved performance of the analog signal processing module directly drives improvements in the overall performance of the entire system. By optimizing the signal processing process and improving signal quality, the detection accuracy and stability of the infrared detector can be further improved.

[0136] In one embodiment of the present invention, the image generation and power-on control module includes:

[0137] Get a 1mA constant current source;

[0138] When the temperature measuring diode of the infrared detector is characterized by a preset resistance characteristic, it is converted into a level signal after passing through a constant current source;

[0139] comparing the level signal with a reference level signal;

[0140] Generate power-on protection inside the FPGA, that is, when the level signal exceeds or equals the reference level signal, the infrared detector is powered on; when the level signal is lower than the reference level signal, the infrared detector is powered off;

[0141] Obtaining a reference level signal;

[0142] A potentiometer is set between the reference level signal and the ground line to adjust the intermediate level signal to obtain adjustment data;

[0143] The level signal is isolated and driven by an operational amplifier to obtain the input voltage.

[0144] The working principle of the above technical solution is as follows: a stable current source is required to drive the infrared detector's temperature-sensing diode. This constant current source is set to 1mA to ensure stable and predictable operation of the temperature-sensing diode. The design of the constant current source typically involves precision resistors, operational amplifiers, or dedicated constant current chips to provide a stable current output. The infrared detector's temperature-sensing diode exhibits a predetermined resistance characteristic at a specific temperature. When this temperature-sensing diode is connected to the 1mA constant current source, Ohm's law generates a temperature-dependent voltage drop (i.e., a voltage level signal) across its terminals. This voltage level signal reflects the temperature of the temperature-sensing diode and, indirectly, the temperature of the infrared detector or its surroundings. To control the power-on and power-off of the infrared detector, the voltage level signal generated by the temperature-sensing diode is compared with a preset reference voltage level signal. This comparison is typically implemented using a comparator circuit, which outputs a high or low signal depending on whether the input voltage level exceeds or equals the reference voltage level signal. After receiving the comparator's output signal, the FPGA (field programmable gate array) controls the infrared detector's power supply based on this signal. If the level signal exceeds or equals the reference level signal, the FPGA triggers the power-on logic to supply power to the infrared detector. If the level signal falls below the reference level signal, the FPGA triggers the power-off logic to cut off power to the infrared detector. This mechanism ensures that the infrared detector operates only under safe or suitable temperature conditions. To flexibly set the power-on and power-off temperature thresholds, a potentiometer can be placed between the reference level signal and ground. By adjusting the potentiometer's resistance, the reference level signal can be adjusted, thereby adjusting the intermediate level signal. This adjustment process allows users to customize the power-on and power-off conditions of the infrared detector. Before the level signal is fed into the comparator, it may be isolated and driven by an operational amplifier. The operational amplifier improves the signal's drive capability and provides electrical isolation, preventing external noise or interference from affecting the signal. This ensures that the comparator receives a clean and stable level signal.

[0145] The technical effect of the above-mentioned technical solution is as follows: through a constant current source and a precise resistance-to-voltage conversion mechanism, the level signal generated by the temperature measuring diode is ensured to be stable and reliable, thereby improving the stability of the entire system. By adjusting the potentiometer to change the magnitude of the reference level signal, the user can flexibly set the infrared detector's power-on and power-off temperature thresholds to adapt to different operating environments and requirements. The power-on protection logic within the FPGA ensures that the infrared detector only operates under safe or appropriate temperature conditions, avoiding damage or failure due to overheating or other adverse conditions. The use of operational amplifiers achieves isolation and drive of the level signal, improving the signal's anti-interference ability and drive capability, thereby enhancing signal quality. The entire system adopts a modular design, with each module relatively independent and easy to maintain and upgrade. At the same time, the programmability of the FPGA makes the system highly flexible and scalable.

[0146] In one embodiment of the present invention, the operation performance monitoring and adjustment module includes:

[0147] Acquiring operating status data of each device, and calculating an operating performance coefficient of each device based on the operating status data;

[0148] The calculation formula of the operating performance coefficient is:

[0149]

[0150] Among them, Y xn is the device's operating performance coefficient, e is the device's data monitoring type, SS i is the actual operating data of the i-th data monitoring type, MS i is the preset target data of the i-th data monitoring category, q i is the preset weight data for the i-th data monitoring type, and the value range of the weight data is 0-1, excluding 0 and 1; the data monitoring types include voltage regulation, temperature judgment, power-on and power-off control, and image signal data monitoring.

[0151] Performing operation adjustment marking on the device according to the operation performance coefficient, and adjusting operation parameters of the device with the operation adjustment marking to obtain adjustment data;

[0152] Calculating a device cumulative performance coefficient based on the operating performance coefficient;

[0153] The calculation formula of the cumulative performance coefficient of the device is:

[0154]

[0155] Among them, L xn is the cumulative performance coefficient of the device, d is the number of devices up to the current device, Y xnais the performance coefficient of the dth device, Y xna-1 is the performance coefficient of the d-1th device;

[0156] Accumulated adjustment marking is performed on the device according to the accumulated performance coefficient of the device, and performance parameters of the device with the accumulated adjustment marking are adjusted to obtain adjustment data.

[0157] The working principle of the above technical solution is as follows: the system needs to collect the operating status data of each device in real time or periodically. This data covers multiple data monitoring types such as voltage regulation, temperature judgment, power-on and power-off control, and image signals. Each data monitoring type corresponds to a key aspect of device operation and is an important basis for evaluating device performance. For the actual operating data (SS) collected for each data monitoring type, i ), the system compares it with the preset target data (MS i ) and combined with the preset weight data (qi) of each data monitoring type, the device's operating performance coefficient (Y xn ). This coefficient comprehensively reflects the performance of the device under the current operating state. Based on the calculated operating performance coefficient, the system will mark the device for operation adjustment. For devices with an operating performance coefficient higher than the preset standard, the system will mark them as devices that need to be adjusted, and automatically or prompt the user to adjust the operating parameters. After the adjustment, the system will collect data again and calculate a new operating performance coefficient to verify the adjustment effect. In order to more comprehensively evaluate the performance of the entire system, the system will also calculate the device cumulative performance coefficient (L xn This coefficient takes into account the operating performance coefficients of all components in the system and accumulates them according to a certain weight or order. By accumulating these performance coefficients, the system can evaluate the overall performance of the entire system. Based on the accumulated performance coefficients of each component, the system makes cumulative adjustments to the entire system. If the accumulated performance coefficient exceeds the preset standard, the system will mark the part of the system that requires adjustment and will automatically or prompt the user to adjust the performance parameters of the corresponding components. This adjustment aims to improve the overall performance of the entire system.

[0158] The technical effect of the above technical solution is: by collecting the operating status data of the device in real time and calculating the operating performance coefficient, the system can evaluate the performance of the device in real time, promptly identify potential problems and make adjustments. By making operation adjustment marks based on the operating performance coefficient, the system can accurately locate the devices and parameters that need to be adjusted, avoiding blind adjustments and waste of resources. By calculating the cumulative performance coefficient of the device and making cumulative adjustment marks, the system can optimize the overall performance of the entire system and improve the stability and reliability of the system. The entire process is automated and intelligent, reducing manual intervention and errors, and improving work efficiency and accuracy. The system supports the configuration of multiple data monitoring types and preset weight data, and can be flexibly adjusted and optimized according to different application scenarios and needs.

[0159] In one embodiment of the present invention, the adjustment method includes:

[0160] Construct an infrared detector adjustment circuit to perform voltage adjustment, temperature judgment, power-on and power-off control, and image signal generation on the infrared detector;

[0161] Calculating an operating performance coefficient of each device, and calculating a device cumulative performance coefficient of each device based on the operating performance coefficient of each device;

[0162] Accumulated adjustment marking and performance parameter adjustment are performed according to the cumulative performance coefficient of the device.

[0163] The working principle of this technical solution is to provide a stable and adjustable voltage to the infrared detector, ensuring that the detector maintains optimal operating conditions under different operating environments. Voltage regulation is achieved through a sophisticated power management circuit, which can automatically adjust the output voltage according to the detector's needs. Because the performance of infrared detectors is significantly affected by temperature, the module's built-in temperature sensor monitors the temperature of the detector and the surrounding environment in real time and automatically adjusts or alarms based on preset temperature thresholds to ensure that the detector operates within the appropriate temperature range. Based on system instructions or preset conditions (such as abnormal temperature or unstable voltage), the module can control the power on and off of the infrared detector, achieving safe and reliable power management. The infrared radiation signal received by the detector is converted and further processed by the module to generate an image signal.

[0164] The module collects the operating parameters of the detector and its associated circuits (such as voltage, current, temperature, and signal strength) to calculate the operating performance coefficient of each device. These coefficients reflect the device's current operating status and performance. Based on the operating performance coefficient of each device, the module further calculates the cumulative performance coefficient of the entire system. This coefficient integrates the performance of all key components and provides a basis for evaluating the overall system performance. Based on the cumulative performance coefficient of each device, the module automatically performs cumulative adjustments and annotations, marking performance bottlenecks or potential problem points. Furthermore, the module can automatically adjust relevant performance parameters (such as voltage and temperature setpoints) as needed to optimize overall system performance.

[0165] The technical effects of the above technical solution are: through precise voltage regulation and temperature control, the infrared detector is ensured to operate in the optimal working state, thereby improving detection accuracy and stability. Real-time monitoring and adjustment of the operating status of each component in the system, timely detection and treatment of potential problems, effective avoidance of failures, and enhanced system reliability and durability. The automatic adjustment mechanism based on the cumulative performance coefficient of the device can accurately optimize system performance bottlenecks and improve overall system performance. Through automated monitoring and adjustment functions, the need for manual intervention and regular inspections is reduced, thereby reducing system maintenance costs. Stable detection performance and optimized system performance directly enhance the user experience, making the infrared detection system more efficient and convenient.

[0166] In one embodiment of the present invention, the infrared detector adjustment circuit is constructed to adjust the voltage, determine the temperature, control power on and off, and generate image signals for the infrared detector, including:

[0167] The infrared detector adjustment circuit is constructed by using an infrared detector, a cooling temperature test circuit, a bias voltage control circuit, an analog signal processing circuit and an FPGA;

[0168] The bias voltage control circuit outputs a power supply voltage to the infrared detector and adjusts its bias voltage.

[0169] Connecting the refrigeration temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source to obtain the temperature data inside the circuit, judging the temperature data to obtain a temperature judgment result, and outputting the temperature judgment result to the FPGA;

[0170] The refrigeration temperature test circuit determines whether the internal temperature of the Dewar reaches the specified value, and controls the detector to be powered on or off according to the judgment result. When the internal temperature of the Dewar reaches the specified value, the detector is powered on;

[0171] Acquire an infrared radiation signal through the infrared detector, and output a level signal to the analog signal processing circuit through the infrared detector;

[0172] After the level signal output by the infrared detector is converted into a specified level signal through the analog signal processing circuit, analog-to-digital conversion is performed to obtain a digital image signal;

[0173] The FPGA receives the digital signal, performs digital processing, and outputs an image signal. It also sends digital control pulses to the infrared detector and powers the bias voltage control circuit. The bias voltage control circuit powers the infrared detector via a low-dropout linear regulator (LDO) and provides bias voltage to the infrared detector via a low-noise voltage reference source. The FPGA generates four digital control pulses for the infrared detector, with the serial port allowing for setting control words to control parameters such as the infrared detector's gain and DE.

[0174] The working principle of the above technical solution is as follows: By integrating key components such as an infrared detector, a cooling temperature test circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA (field programmable gate array), a complete infrared detector adjustment circuit system is constructed. This system enables comprehensive control of the infrared detector, signal processing, and image generation. The bias voltage control circuit uses a low-dropout linear regulator (LDO) to provide a stable operating voltage for the infrared detector. Furthermore, the bias voltage can be finely adjusted to adapt to different operating environments and detection requirements, ensuring that the infrared detector operates at optimal performance. Through the cooling temperature test circuit, a constant current source is connected to the infrared detector's built-in temperature measuring diode to obtain real-time temperature data within the detector. This data is fed into the FPGA for processing and compared with preset temperature thresholds to generate a temperature determination result. When the temperature reaches or exceeds the specified range, the temperature determination module generates a corresponding signal to trigger subsequent power-on and power-off control. The power-on and power-off control module controls the infrared detector's power-on and power-off operations based on the output of the temperature determination module. Specifically, when the refrigeration temperature test circuit detects that the internal temperature of the dewar reaches a specified value, the power-on / off control module sends a power-on signal to the infrared detector to activate it. Otherwise, a power-off signal is sent to protect the detector from overheating or other adverse conditions. The infrared detector outputs a level signal and converts it to a specified level through a series of processing steps (such as signal amplification, filtering, and level conversion). An analog-to-digital converter (ADC) then converts the analog signal into a digital image signal. The FPGA receives the digital signal from the analog signal processing module and performs digital processing (such as image reconstruction, enhancement, and denoising) to ultimately output a high-quality image signal. The FPGA also generates digital control pulses for the infrared detector, enabling power-on control of the bias voltage control circuit. These control pulses can be used to set control words via the serial port to adjust parameters such as the infrared detector's gain and DE, further optimizing detection performance and image quality.

[0175] The technical effects of the above technical solution are as follows: through the coordinated work of the cooling temperature test circuit and the power-on and power-off control module, precise control of the internal temperature of the infrared detector is achieved, ensuring the stable operation of the detector at the optimal operating temperature. The voltage regulation module and the bias voltage control circuit provide the infrared detector with stable and adjustable operating voltage and bias voltage, effectively improving the signal-to-noise ratio and sensitivity of the detector. The integration of the analog signal processing module and the image generation and power-on control module realizes the efficient acquisition, processing and conversion of infrared radiation signals, generating high-quality image signals. Through the digital control pulses generated by the FPGA and the control words set by the serial port, the user can flexibly adjust the gain, DE and other parameters of the infrared detector to adapt to different detection requirements and environmental conditions. The entire adjustment circuit system adopts a modular design, and each module is relatively independent and easy to maintain and upgrade, which effectively improves the reliability and maintainability of the system.

[0176] In one embodiment of the present invention, the step of converting the level signal output by the infrared detector into a predetermined level signal by an analog signal processing circuit and then performing analog-to-digital conversion to obtain a digital image signal includes:

[0177] Drive the analog image signal output by the infrared detector, increase the output impedance, and obtain the improvement data;

[0178] After driving, it enters the subtractor, and then sets the low level of the analog image signal to start from 0V;

[0179] Amplify the analog image signal to the preset dynamic range of the ADC;

[0180] The analog image signal is converted into a 14-bit parallel digital image signal through the ADC.

[0181] Input digital image signals into FPGA;

[0182] One channel of image information is output through FPGA for storage and backup.

[0183] In summary, the level information output by the infrared detector is converted into the original grayscale LVDS digital image signal.

[0184] The working principle of the above technical solution is to drive the analog image signal output by the infrared detector and increase its output impedance. This step aims to enhance signal stability and anti-interference capabilities, ensuring that the signal does not attenuate or reflect during transmission due to impedance mismatch. The analog image signal, after impedance increase, enters the subtractor. In the subtractor, by setting an appropriate reference level, the low level of the analog image signal can be adjusted from 0V. This step helps optimize the signal's dynamic range, making it more suitable for the ADC input requirements. The module amplifies the analog image signal to the ADC's preset dynamic range. This ensures that the signal fully utilizes the ADC's resolution during the analog-to-digital conversion process, thereby generating a higher-quality digital image signal. The amplification factor is determined by the ADC's performance parameters and the infrared detector's output characteristics. The amplified analog image signal is fed into the ADC for analog-to-digital conversion. The ADC converts the continuous analog signal into a discrete digital signal, namely a 14-bit parallel digital image signal. This step completes the signal conversion from the analog domain to the digital domain. The 14-bit parallel digital image signal is then input into the FPGA. FPGAs have powerful digital signal processing capabilities, enabling further digital processing of input digital image signals, such as filtering, enhancement, and denoising. The processed image information is then output through the FPGA as an image signal and stored for future use. This successfully generates and preserves the original grayscale LVDS digital image signal.

[0185] The technical effect of the above-mentioned technical solution is that, through steps such as output impedance enhancement, low-level setting, and signal amplification, the analog signal processing module effectively improves the quality of the analog image signal output by the infrared detector, reducing attenuation and noise interference during signal transmission. Amplifying the analog image signal to the preset dynamic range of the ADC ensures that the signal fully utilizes the ADC's resolution during the analog-to-digital conversion process, thereby generating a higher-quality digital image signal. The introduction of an FPGA makes digital image signal processing more flexible and efficient. Users can program the FPGA according to their actual needs to implement different image processing algorithms and functions. After converting the analog image signal to a digital image signal, it is easier to store and transmit. The digital image signal has the advantages of strong anti-interference capabilities and is easy to copy and process. As a key component of the infrared detector's control circuit, the improved performance of the analog signal processing module directly drives improvements in the overall performance of the entire system. By optimizing the signal processing process and improving signal quality, the detection accuracy and stability of the infrared detector can be further improved.

[0186] In one embodiment of the present invention, the method of powering the detector and adjusting the bias voltage control circuit when the internal temperature of the dewar reaches a specified value includes:

[0187] Get a 1mA constant current source;

[0188] When the temperature measuring diode of the infrared detector is characterized by a preset resistance characteristic, it is converted into a level signal after passing through a constant current source;

[0189] comparing the level signal with a reference level signal;

[0190] Generate power-on protection inside the FPGA, that is, when the level signal exceeds or equals the reference level signal, the infrared detector is powered on; when the level signal is lower than the reference level signal, the infrared detector is powered off;

[0191] Obtaining a reference level signal;

[0192] A potentiometer is set between the reference level signal and the ground line to adjust the intermediate level signal to obtain adjustment data;

[0193] The level signal is isolated and driven by an operational amplifier to obtain the input voltage.

[0194] The working principle of the above technical solution is as follows: a stable current source is required to drive the infrared detector's temperature-sensing diode. This constant current source is set to 1mA to ensure stable and predictable operation of the temperature-sensing diode. The design of the constant current source typically involves precision resistors, operational amplifiers, or dedicated constant current chips to provide a stable current output. The infrared detector's temperature-sensing diode exhibits a predetermined resistance characteristic at a specific temperature. When this temperature-sensing diode is connected to the 1mA constant current source, Ohm's law generates a temperature-dependent voltage drop (i.e., a voltage level signal) across its terminals. This voltage level signal reflects the temperature of the temperature-sensing diode and, indirectly, the temperature of the infrared detector or its surroundings. To control the power-on and power-off of the infrared detector, the voltage level signal generated by the temperature-sensing diode is compared with a preset reference voltage level signal. This comparison is typically implemented using a comparator circuit, which outputs a high or low signal depending on whether the input voltage level exceeds or equals the reference voltage level signal. After receiving the comparator's output signal, the FPGA (field programmable gate array) controls the infrared detector's power supply based on this signal. If the level signal exceeds or equals the reference level signal, the FPGA triggers the power-on logic to supply power to the infrared detector. If the level signal falls below the reference level signal, the FPGA triggers the power-off logic to cut off power to the infrared detector. This mechanism ensures that the infrared detector operates only under safe or suitable temperature conditions. To flexibly set the power-on and power-off temperature thresholds, a potentiometer can be placed between the reference level signal and ground. By adjusting the potentiometer's resistance, the reference level signal can be adjusted, thereby adjusting the intermediate level signal. This adjustment process allows users to customize the power-on and power-off conditions of the infrared detector. Before the level signal is fed into the comparator, it may be isolated and driven by an operational amplifier. The operational amplifier improves the signal's drive capability and provides electrical isolation, preventing external noise or interference from affecting the signal. This ensures that the comparator receives a clean and stable level signal.

[0195] The technical effect of the above-mentioned technical solution is as follows: through a constant current source and a precise resistance-to-voltage conversion mechanism, the level signal generated by the temperature measuring diode is ensured to be stable and reliable, thereby improving the stability of the entire system. By adjusting the potentiometer to change the magnitude of the reference level signal, the user can flexibly set the infrared detector's power-on and power-off temperature thresholds to adapt to different operating environments and requirements. The power-on protection logic within the FPGA ensures that the infrared detector only operates under safe or appropriate temperature conditions, avoiding damage or failure due to overheating or other adverse conditions. The use of operational amplifiers achieves isolation and drive of the level signal, improving the signal's anti-interference ability and drive capability, thereby enhancing signal quality. The entire system adopts a modular design, with each module relatively independent and easy to maintain and upgrade. At the same time, the programmability of the FPGA makes the system highly flexible and scalable.

[0196] In one embodiment of the present invention, an operating performance coefficient of each device is calculated, a device cumulative performance coefficient of each device is calculated based on the operating performance coefficient of each device, and cumulative adjustment marking and performance parameter adjustment are performed based on the device cumulative performance coefficient, including:

[0197] Acquiring operating status data of each device, and calculating an operating performance coefficient of each device based on the operating status data;

[0198] The calculation formula of the operating performance coefficient is:

[0199]

[0200] Among them, Y xn is the device's operating performance coefficient, e is the device's data monitoring type, SS i is the actual operating data of the i-th data monitoring type, MS i is the preset target data of the i-th data monitoring category, q i is the preset weight data of the i-th data monitoring category; the data monitoring categories include voltage regulation, temperature judgment, power-on and power-off control, and image signal data monitoring.

[0201] Performing operation adjustment marking on the device according to the operation performance coefficient, and adjusting operation parameters of the device with the operation adjustment marking to obtain adjustment data;

[0202] Calculating a device cumulative performance coefficient based on the operating performance coefficient;

[0203] The calculation formula of the cumulative performance coefficient of the device is:

[0204]

[0205] Among them, L xnis the cumulative performance coefficient of the device, d is the number of devices up to the current device, Y xna is the performance coefficient of the dth device, Y xna-1 is the performance coefficient of the d-1th device;

[0206] Accumulated adjustment marking is performed on the device according to the accumulated performance coefficient of the device, and performance parameters of the device with the accumulated adjustment marking are adjusted to obtain adjustment data.

[0207] The working principle of the above technical solution is as follows: the system needs to collect the operating status data of each device in real time or periodically. This data covers multiple data monitoring types such as voltage regulation, temperature judgment, power-on and power-off control, and image signals. Each data monitoring type corresponds to a key aspect of device operation and is an important basis for evaluating device performance. For the actual operating data (SS) collected for each data monitoring type, i ), the system compares it with the preset target data (MS i ) and combined with the preset weight data (qi) of each data monitoring type to calculate the device's operating performance coefficient (Y xn ). This coefficient comprehensively reflects the performance of the device under the current operating state. Based on the calculated operating performance coefficient, the system will mark the device for operation adjustment. For devices with an operating performance coefficient higher than the preset standard, the system will mark them as devices that need to be adjusted, and automatically or prompt the user to adjust the operating parameters. After the adjustment, the system will collect data again and calculate a new operating performance coefficient to verify the adjustment effect. In order to more comprehensively evaluate the performance of the entire system, the system will also calculate the device cumulative performance coefficient (L xn This coefficient takes into account the operating performance coefficients of all components in the system and accumulates them according to a certain weight or order. By accumulating these performance coefficients, the system can evaluate the overall performance of the entire system. Based on the accumulated performance coefficients of each component, the system makes cumulative adjustments to the entire system. If the accumulated performance coefficient exceeds the preset standard, the system will mark the part of the system that requires adjustment and will automatically or prompt the user to adjust the performance parameters of the corresponding components. This adjustment aims to improve the overall performance of the entire system.

[0208] The technical effect of the above technical solution is: by collecting the operating status data of the device in real time and calculating the operating performance coefficient, the system can evaluate the performance of the device in real time, promptly identify potential problems and make adjustments. By making operation adjustment marks based on the operating performance coefficient, the system can accurately locate the devices and parameters that need to be adjusted, avoiding blind adjustments and waste of resources. By calculating the cumulative performance coefficient of the device and making cumulative adjustment marks, the system can optimize the overall performance of the entire system and improve the stability and reliability of the system. The entire process is automated and intelligent, reducing manual intervention and errors, and improving work efficiency and accuracy. The system supports the configuration of multiple data monitoring types and preset weight data, and can be flexibly adjusted and optimized according to different application scenarios and needs.

[0209] Obviously, those skilled in the art may make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if such changes and modifications fall within the scope of the claims and their equivalents, the present invention is intended to include such changes and modifications.

Claims

1. An infrared detector drive adjustment circuit, characterized in that: The regulating circuit comprises: The driver building module is used to build the infrared detector adjustment circuit, perform voltage adjustment, temperature judgment, power-on and power-off control, and image signal generation for the infrared detector; An operation performance monitoring and adjustment module is used to calculate the operation performance coefficient of each device and calculate the device cumulative performance coefficient of each device based on the operation performance coefficient of each device; Accumulated adjustment marking and performance parameter adjustment are performed according to the cumulative performance coefficient of the device.

2. The infrared detector driving and regulating circuit according to claim 1, characterized in that: The driver building module includes: A building block for constructing an infrared detector adjustment circuit using an infrared detector, a refrigeration temperature test circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA; A voltage regulating module is used to output a power supply voltage to the infrared detector through the bias voltage control circuit and to regulate its bias voltage. A temperature judgment module is used to connect the refrigeration temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source, obtain the temperature data inside the refrigeration temperature test circuit, judge the temperature data, obtain a temperature judgment result, and output the temperature judgment result to the FPGA; The power-on and power-off control module is used to control the detector to power on or off according to the judgment result after the refrigeration temperature test circuit judges whether the internal temperature of the Dewar reaches the specified value. When the internal temperature of the Dewar reaches the specified value, the detector is powered on; an analog signal processing module, configured to obtain an infrared radiation signal through the infrared detector and output a level signal to the analog signal processing circuit through the infrared detector; After the level signal output by the infrared detector is converted into a specified level signal through the analog signal processing circuit, analog-to-digital conversion is performed to obtain a digital image signal; The image generation and power-on control module is used to receive the digital signal through FPGA, perform digital processing, output image signal, output digital control pulse to the infrared detector, and perform power-on control on the bias voltage control circuit.

3. The infrared detector driving and regulating circuit according to claim 2, characterized in that: The analog signal processing module includes: Drive the analog image signal output by the infrared detector, increase the output impedance, and obtain the improvement data; After driving, it enters the subtractor, and then sets the low level of the analog image signal to start from 0V; Amplify the analog image signal to the preset dynamic range of the ADC; The analog image signal is converted into a 14-bit parallel digital image signal through the ADC. Input digital image signals into FPGA; One channel of image information is output through FPGA for storage and backup.

4. The infrared detector driving and regulating circuit according to claim 2, characterized in that: The image generation and power-on control module includes: Get a 1mA constant current source; When the temperature measuring diode of the infrared detector is characterized by a preset resistance characteristic, it is converted into a level signal after passing through a constant current source; comparing the level signal with a reference level signal; Generate power-on protection inside the FPGA, that is, when the level signal exceeds or equals the reference level signal, the infrared detector is powered on; when the level signal is lower than the reference level signal, the infrared detector is powered off; Obtaining a reference level signal; A potentiometer is set between the reference level signal and the ground line to adjust the intermediate level signal to obtain adjustment data; The level signal is isolated and driven by an operational amplifier to obtain the input voltage.

5. The infrared detector driving and regulating circuit according to claim 1, characterized in that: The operation performance monitoring and adjustment module includes: Acquiring operating status data of each device, and calculating an operating performance coefficient of each device based on the operating status data; The calculation formula of the operating performance coefficient is: Among them, Y xn is the device's operating performance coefficient, e is the device's data monitoring type, SS i is the actual operating data of the i-th data monitoring type, MS i is the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category; Performing operation adjustment marking on the device according to the operation performance coefficient, and adjusting operation parameters of the device with the operation adjustment marking to obtain adjustment data; Calculating a device cumulative performance coefficient based on the operating performance coefficient; The calculation formula of the cumulative performance coefficient of the device is: Among them, L xn is the cumulative performance coefficient of the device, d is the number of devices up to the current device, Y xna is the performance coefficient of the dth device, Y xna-1 is the performance coefficient of the d-1th device; Accumulated adjustment marking is performed on the device according to the accumulated performance coefficient of the device, and performance parameters of the device with the accumulated adjustment marking are adjusted to obtain adjustment data.

6. A method for implementing the infrared detector drive adjustment circuit according to claim 1, characterized in that: The adjustment method comprises: Construct an infrared detector adjustment circuit to perform voltage adjustment, temperature judgment, power-on and power-off control, and image signal generation on the infrared detector; Calculating an operating performance coefficient of each device, and calculating a device cumulative performance coefficient of each device based on the operating performance coefficient of each device; Accumulated adjustment marking and performance parameter adjustment are performed according to the cumulative performance coefficient of the device.

7. The method for adjusting an infrared detector driving adjustment circuit according to claim 6, characterized in that: The infrared detector adjustment circuit is constructed to adjust the voltage, determine the temperature, control power on and off, and generate image signals for the infrared detector, including: The infrared detector adjustment circuit is constructed by using an infrared detector, a cooling temperature test circuit, a bias voltage control circuit, an analog signal processing circuit and an FPGA; The bias voltage control circuit outputs a power supply voltage to the infrared detector and adjusts its bias voltage. Connecting the refrigeration temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source to obtain the temperature data inside the circuit, judging the temperature data to obtain a temperature judgment result, and outputting the temperature judgment result to the FPGA; The refrigeration temperature test circuit determines whether the internal temperature of the Dewar reaches the specified value, and controls the detector to be powered on or off according to the judgment result. When the internal temperature of the Dewar reaches the specified value, the detector is powered on; Acquire an infrared radiation signal through the infrared detector, and output a level signal to the analog signal processing circuit through the infrared detector; After the level signal output by the infrared detector is converted into a specified level signal through the analog signal processing circuit, analog-to-digital conversion is performed to obtain a digital image signal; The digital signal is received by FPGA, digitally processed, and image signal is output. A digital control pulse is output to the infrared detector, and power-on control is performed on the bias voltage control circuit.

8. The method for adjusting an infrared detector driving adjustment circuit according to claim 7, characterized in that: The analog signal processing circuit converts the level signal output by the infrared detector into a prescribed level signal, and then performs analog-to-digital conversion to obtain a digital image signal, including: Drive the analog image signal output by the infrared detector, increase the output impedance, and obtain the improvement data; After driving, it enters the subtractor, and then sets the low level of the analog image signal to start from 0V; Amplify the analog image signal to the preset dynamic range of the ADC; The analog image signal is converted into a 14-bit parallel digital image signal through the ADC. Input digital image signals into FPGA; One channel of image information is output through FPGA for storage and backup.

9. The method for adjusting an infrared detector driving adjustment circuit according to claim 7, characterized in that: The method of powering the detector and adjusting the bias voltage control circuit when the internal temperature of the dewar reaches a specified value includes: Get a 1mA constant current source; When the temperature measuring diode of the infrared detector is characterized by a preset resistance characteristic, it is converted into a level signal after passing through a constant current source; comparing the level signal with a reference level signal; Generate power-on protection inside the FPGA, that is, when the level signal exceeds or equals the reference level signal, the infrared detector is powered on; when the level signal is lower than the reference level signal, the infrared detector is powered off; Obtaining a reference level signal; A potentiometer is set between the reference level signal and the ground line to adjust the intermediate level signal to obtain adjustment data; The level signal is isolated and driven by an operational amplifier to obtain the input voltage.

10. The method for adjusting an infrared detector driving adjustment circuit according to claim 6, characterized in that: Calculating the operating performance coefficient of each device, calculating the device cumulative performance coefficient of each device based on the operating performance coefficient of each device, and performing cumulative adjustment marking and performance parameter adjustment based on the device cumulative performance coefficient, including: Acquiring operating status data of each device, and calculating an operating performance coefficient of each device based on the operating status data; The calculation formula of the operating performance coefficient is: Among them, Y xn is the device's operating performance coefficient, e is the device's data monitoring type, SS i is the actual operating data of the i-th data monitoring type, MS i is the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category; Performing operation adjustment marking on the device according to the operation performance coefficient, and adjusting operation parameters of the device with the operation adjustment marking to obtain adjustment data; Calculating a device cumulative performance coefficient based on the operating performance coefficient; The calculation formula of the cumulative performance coefficient of the device is: Among them, L xn is the cumulative performance coefficient of the device, d is the number of devices up to the current device, Y xna is the performance coefficient of the dth device, Y xna-1 is the performance coefficient of the d-1th device; Accumulated adjustment marking is performed on the device according to the accumulated performance coefficient of the device, and performance parameters of the device with the accumulated adjustment marking are adjusted to obtain adjustment data.

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