Test system, test method and storage medium

Abstract

The invention discloses a test system, a test method and a storage medium. The test system comprises a calibration device used for calibrating radio frequency transmit-receive parameters of a to-be-tested communication module; the final testing device is used for testing the radio frequency transceiving function of the communication module to be tested; the pin testing device is used for testing an interface function of the communication module to be tested; wherein the calibration device, the final test device and the pin test device sequentially execute corresponding functions according to a preset sequence. The communication module to be tested is correspondingly tested in sequence through the modularized calibration device, the final test device and the pin test device, so that the integrity of the function test is ensured, the mass production test of the communication module is realized, the throughput of a production line is improved, and the test efficiency is further improved; and meanwhile, the test of the communication module can be completed without a specific high-end instrument, so that the test cost is reduced.

Description

Technical Field

[0001] This application relates to the field of testing communication modules, and more particularly to a testing system, testing method and storage medium. Background Technology

[0002] Existing production line testing solutions for vehicle-to-everything (V2X) communication modules primarily rely on general-purpose instrument combinations. Especially when verifying Autotalks chip platforms, these solutions suffer from issues such as expensive testing equipment, complex test cases, and excessively long testing times, leading to high equipment costs and low testing efficiency in production line testing. Specifically, current technologies rely on specific high-end instruments like the Rohde Schwarz SMBV100B signal generator and CMW100B integrated tester for GNSS positioning, while conventional V2X module testing only requires a single CMW100 integrated tester. Furthermore, production line operators need to perform complex collaborative operations on multiple devices, and each test session is lengthy, severely impacting mass production capacity. Existing solutions fail to meet the intelligent connected vehicle industry's demand for "high-efficiency, low-cost, and high-volume" testing of V2X modules, severely hindering the commercialization of V2X technology. Summary of the Invention

[0003] This application provides a testing system, testing method, and storage medium to at least partially solve the above-mentioned technical problems.

[0004] On one hand, this application provides a testing system, including: a calibration device for calibrating the radio frequency transceiver parameters of a communication module under test; a final testing device for testing the radio frequency transceiver function of the communication module under test; and a pin testing device for testing the interface function of the communication module under test; wherein the calibration device, the final testing device, and the pin testing device perform their respective functions in a preset order.

[0005] Optionally, the calibration device, the final test device, and the pin test device all include a fixture and a terminal, with a test module mounted on the fixture; wherein, the terminal is used to send control commands to the corresponding test module, so that the test module performs a corresponding function on the communication module under test according to the control commands; the fixture is used to hold the communication module under test and provide a test interface.

[0006] Optionally, the calibration device includes: a first fixture, on which a first testing module and a first flash memory module are disposed; a first comprehensive tester, communicatively connected to the antenna of the communication module under test via a first radio frequency line; and a first terminal, communicatively connected to the first testing module via a first connector; wherein, the first terminal burns first test firmware into the first testing module, the first test firmware including a test program for calibrating the radio frequency transceiver parameters of the communication module under test; the first testing module burns first startup firmware into the first flash memory module, the first startup firmware including a startup program of the communication module under test; and the first terminal sends a first control command to the first testing module, so that the first testing module calibrates the radio frequency transceiver parameters of the communication module under test according to the first control command.

[0007] Optionally, the final testing device includes: a second fixture, on which a second testing module and a second flash memory module are mounted; a second comprehensive tester, communicatively connected to the antenna of the communication module under test via a second radio frequency line; a second terminal, communicatively connected to the second testing module via a second connector; a signal generator, used to generate a test pulse signal; and a frequency divider, used to receive the pulse signal and send it to the second comprehensive tester and the communication module under test; wherein, the second terminal burns a second test firmware into the second testing module, the second test firmware including a test program for testing the radio frequency transceiver function of the communication module under test; the second testing module burns a second startup firmware into the second flash memory module, the second startup firmware including a startup program for the communication module under test; and the second terminal sends a second control command to the second testing module, so that the second testing module tests the radio frequency transceiver function of the communication module under test according to the second control command.

[0008] Optionally, the pin testing device includes: a third fixture, on which a third testing module and a third flash memory module are mounted; a third terminal, communicatively connected to the third testing module via a third connector; wherein the third terminal burns third test firmware into the third testing module, the third test firmware including a test program for testing the interface function of the communication module under test; the third testing module burns third startup firmware into the third flash memory module, the third startup firmware including a startup program for the communication module under test; the third terminal sends a third control command to the third testing module, so that the third testing module tests the interface function of the communication module under test according to the third control command.

[0009] Optionally, the third fixture is further provided with a switching module for controlling channel switching. The channel includes a first channel and a second channel. The communication module under test is connected to the third testing module through the first channel and to the third terminal through the second channel.

[0010] Optionally, the third fixture is further provided with a main control module for controlling the switching of test modes of the third testing module. The test modes include a first test mode and a second test mode. The third control command controls the third testing module to switch to the first test mode when performing a first type of test and to switch to the second test mode when performing a second type of test. The first type of test includes GPIO interface testing; the second type of test includes SN number writing, current consumption testing, USB interface testing, and RESET function testing.

[0011] Optionally, the fixture is provided with a DIP switch, which is used to configure the operating mode of the testing module; wherein the operating mode includes: BOOT mode and USB mode.

[0012] Optionally, the communication module under test is a V2X module based on the Autotalks platform.

[0013] On the other hand, this application also provides a testing method applied to a testing system, the testing system including a calibration device, a final testing device, and a pin testing device; the method includes: calibrating the radio frequency transceiver parameters of the communication module under test using the calibration device; testing the radio frequency transceiver function of the communication module under test using the final testing device; and testing the interface function of the communication module under test using the pin testing device.

[0014] Optionally, the calibration device includes a first fixture and a first terminal, the final testing device includes a second fixture and a second terminal, and the pin testing device includes a third fixture and a third terminal. The calibration of the radio frequency (RF) transceiver parameters of the communication module under test (DUT) using the calibration device includes: placing the DUT into the first fixture of the calibration device and sending a corresponding first control command to a first testing module mounted on the first fixture via the first terminal to calibrate the RF transceiver parameters of the DUT. The testing of the RF transceiver function of the DUT using the final testing device includes: placing the DUT into the second fixture of the final testing device and sending a corresponding second control command to a second testing module mounted on the second fixture via the second terminal to test the RF transceiver function of the DUT. The testing of the interface function of the DUT using the pin testing device includes: placing the DUT into the third fixture of the pin testing device and sending a corresponding third control command to a third testing module mounted on the third fixture via the third terminal to test the interface function of the DUT.

[0015] Optionally, the first fixture is provided with the first test module and the first flash memory module; before placing the communication module under test into the first fixture of the calibration device, the method further includes: configuring the BOOT mode of the first test module to a forced download mode; after the first fixture is powered on, burning the first test firmware into the first test module; after the first fixture is powered off, configuring the BOOT mode of the first test module to a normal operation mode; after placing the communication module under test into the first fixture of the calibration device, the method further includes: after the first fixture is powered on and the first test module and the communication module under test are started, burning the first startup firmware into the first flash memory module; wherein, the first test firmware includes a test program for calibrating the radio frequency transceiver parameters of the communication module under test; the first startup firmware includes a startup program for the communication module under test.

[0016] Optionally, the second fixture is provided with a second testing module and a second flash memory module; before placing the communication module under test into the second fixture of the final testing device, the method further includes: configuring the BOOT mode of the second testing module to a forced download mode; after the second fixture is powered on, burning the second test firmware into the second testing module; after the second fixture is powered off, configuring the BOOT mode of the second testing module to a normal operation mode; after placing the communication module under test into the second fixture of the final testing device, the method further includes: after the second fixture is powered on and the second testing module and the communication module under test are started, burning the second startup firmware into the second flash memory module; wherein, the second test firmware includes a test program for testing the radio frequency transceiver function of the communication module under test; the second startup firmware includes a startup program for the communication module under test.

[0017] Optionally, the third fixture is equipped with the third test module and the third flash memory module; before placing the communication module under test into the third fixture of the pin testing device, the method further includes: configuring the BOOT mode of the third test module to forced download mode and configuring the USB mode to slave mode; after switching the channel to the second channel and powering on the third fixture, burning the third test firmware into the third test module; after powering off the third fixture, configuring the BOOT mode of the third test module to normal operation mode and configuring the USB mode to master mode, and then... The channel is switched to the first channel; after the communication module under test is placed in the third fixture of the pin testing device, the method further includes: after the third fixture is powered on and the third testing module and the communication module under test are started, the third startup firmware is burned into the third flash memory module; wherein, the communication module under test is connected to the third testing module through the first channel and connected to the terminal through the second channel; the third test firmware includes a test program for testing the interface function of the communication module under test; the third startup firmware includes a startup program for the communication module under test.

[0018] On the other hand, embodiments of this application also provide a computer program product, including a computer program or instructions, which, when executed by a processor, implement the steps in any of the testing methods provided in embodiments of this application.

[0019] On the other hand, embodiments of this application also provide a computer-readable storage medium storing a computer program or instructions thereon, wherein the computer program or instructions, when executed by a processor, implement the steps in any of the test methods provided in embodiments of this application.

[0020] This application discloses a testing system, testing method, and storage medium. The testing system includes: a calibration device for calibrating the RF transceiver parameters of a communication module under test (DUT); a final testing device for testing the RF transceiver functions of the DUT; and a pin testing device for testing the interface functions of the DUT. The calibration device, the final testing device, and the pin testing device execute their respective functions sequentially according to a preset order. This application utilizes modular calibration, final testing, and pin testing devices to sequentially perform corresponding tests on the DUT, ensuring the completeness of functional testing, enabling mass production testing of communication modules, increasing production line throughput, and thus improving testing efficiency. Furthermore, it eliminates the need for specific high-end instruments to complete the testing of communication modules, reducing testing costs. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 This is a schematic diagram of the architecture of a testing system provided in an embodiment of this application;

[0023] Figure 2 This is a schematic diagram of the architecture of a calibration device provided in an embodiment of this application; Figure 3 This is a schematic diagram of the architecture of a final testing device provided in the embodiments of this application; Figure 4 This is a schematic diagram of the architecture of a pin testing device provided in an embodiment of this application; Figure 5 This is a flowchart illustrating an interface function test provided in an embodiment of this application. Figure 6 This is a flowchart illustrating a testing method provided in an embodiment of this application.

[0024] Explanation of reference numerals in the attached figures: 10. Test system; 100. Calibration device; 200. Final test device; 300. Pin test device; 11. DIP switch; 12. Communication module under test; 110. First fixture; 111. First test module; 112. First flash memory module; 120. First comprehensive tester; 121. First RF line; 130. First terminal; 131. First connector; 210. Second fixture; 211. Second test module; 212. Second flash memory module; 220. Second comprehensive tester; 221. Second RF line; 230. Second terminal; 231. Second connector; 240. Signal generator; 250. Frequency divider; 310. Third fixture; 311. Third test module; 312. Third flash memory module; 313. Switching module; 314. Main control module; 320. Third terminal; 321. Third connector. Detailed Implementation

[0025] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0026] In the following description, specific embodiments of the invention will be illustrated with reference to steps and symbols performed by one or more computers, unless otherwise stated. Therefore, these steps and operations will be referred to several times as being performed by a computer, and computer execution as referred to herein includes operations by a computer processing unit representing electronic signals of data in a structured format. This operation transforms the data or maintains it at a location in the computer's memory system, which can be reconfigured or otherwise alter the operation of the computer in a manner well known to those skilled in the art. The data structure maintained by the data is the physical location of the memory, which has specific characteristics defined by the data format. However, the principles of the invention described above are not intended to be limiting, and those skilled in the art will understand that many of the steps and operations described below can also be implemented in hardware.

[0027] The terms "module" or "unit" as used herein can be considered as software objects executing on the computing system. The various components, modules, engines, and services described herein can be considered as implementations on the computing system. The apparatus and methods described herein are preferably implemented in software, but can also be implemented in hardware, both of which are within the scope of this invention.

[0028] Those skilled in the art will understand that, unless specifically stated otherwise, the singular forms “a,” “an,” “the,” and “the” used herein may also include the plural forms. It should be further understood that the term “comprising” as used in this specification means the presence of the stated features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. It should be understood that when an element is “connected” or “coupled” to another element, it may be directly connected or coupled to the other element, or there may be intermediate elements. Furthermore, “connected” or “coupled” as used herein may include wireless connections or wireless coupling. The term “and / or” as used herein includes all or any units and all combinations of one or more associated listed items.

[0029] Before a communication module is put into market application, it needs to undergo production line testing to ensure that the communication module functions properly.

[0030] Based on this, according to the first aspect of this application, this application provides a testing system 10. Figure 1 This is a schematic diagram of the architecture of a test system 10 provided in an embodiment of this application. Please refer to... Figure 1 The test system 10 provided in this application embodiment may include: a calibration device 100, a final test device 200, and a pin test device 300.

[0031] The calibration device 100 is used to calibrate the RF transceiver parameters of the communication module under test 12; the final test device 200 is used to test the RF transceiver function of the communication module under test 12; and the pin test device 300 is used to test the interface function of the communication module under test 12. The calibration device 100, the final test device 200, and the pin test device 300 perform their respective functions sequentially according to a preset order.

[0032] In the production testing process of communication modules, the main production test stations involved include: Board Test (BT) station, Final Test (FT) station, and Pin Test (PT) station. The core of the BT station is to calibrate RF parameters. The device used to perform testing at the BT station is calibration device 100, which is used to calibrate the RF receiving and transmitting parameters of the communication module under test (DUT) 12, eliminating performance inconsistencies caused by differences in components such as RF chips and antenna matching circuits, or manufacturing process deviations. The FT station is the final test of RF functionality. The device used to perform testing at the FT station is final test device 200, which is used to test the RF receiving and transmitting functions of the DUT 12. This is a verification stage of the communication module's RF performance, verifying whether the communication module calibrated at the BT station meets the functional integrity requirements of actual communication scenarios, ensuring the consistency of mass-produced communication modules. The PT station is mainly used to test the General Purpose Input / Output (GPIO) interface, Universal Serial Bus (USB) interface, RESET function, current consumption, and write the serial number (SN) of the communication module under test 12. The device used to perform the test at the PT station is the pin test device 300, which verifies the integrity of the interface hardware connection and ensures that the interface function meets the design specifications.

[0033] During the production testing of communication modules, the communication module under test (BT) 12 is sequentially placed into the calibration device 100, the final test device 200, and the pin test device 300 to perform the functions of BT, FT, PT, and FT stations in sequence. This eliminates the need for expensive high-end instruments such as the Rohde & Schwarz SMBV100B signal generator and CMW100B comprehensive tester, reducing marginal costs and enabling mass production testing of the BT BT 12, thus increasing production line throughput. It should be understood that the testing order of BT, FT, and PT stations cannot be adjusted. Only after calibrating the RF transceiver parameters at the BT station can the RF transceiver function be further tested at the FT station. The calibration at the BT station provides reference parameters for subsequent functional tests, ensuring the accuracy and efficiency of batch testing.

[0034] In summary, the embodiments of this application use a modular calibration device 100, a final testing device 200, and a pin testing device 300 to sequentially perform corresponding tests on the communication module 12 under test, ensuring the integrity of the functional test, realizing mass production testing of the communication module, increasing the throughput of the production line, and thus improving testing efficiency; at the same time, the testing of the communication module can be completed without the need for specific high-end instruments, reducing testing costs.

[0035] In some embodiments, the calibration device 100, the final test device 200, and the pin test device 300 all include a fixture and a terminal, with a test module mounted on the fixture; wherein, the terminal is used to send control commands to the corresponding test module so that the test module performs the corresponding function of the communication module under test 12 according to the control commands; the fixture is used to hold the communication module under test 12 and provide a test interface.

[0036] In this embodiment, each device integrates a testing module that performs a corresponding function in its fixture. For example, the fixture of calibration device 100 integrates a testing module for RF transceiver parameter calibration, the final test device 200 integrates a testing module for RF transceiver function testing, and the pin test device 300 integrates a testing module for interface function testing. The terminal in each device can send control commands to its corresponding testing module. The testing module can then perform corresponding functions on the communication module under test 12 clamped in the fixture according to the control commands, thereby achieving functional testing of the communication module under test 12. For example, the terminal can be a PC, which can have a corresponding operation window. The operator can click "Start Test" on the operation page. In response to the operator's click, the PC sends a control command to the corresponding testing module. Upon receiving the control command, the testing module performs the corresponding function on the communication module under test 12 to complete the corresponding test, such as RF transceiver parameter calibration for BT stations or RF transceiver function testing for FT stations. Test results can be displayed directly on the operation page. For example, if the communication module under test 12 tests normally at the current station, it displays "PASS"; if the communication module under test 12 fails at the current station, it displays "Fail". When the operator sees the "PASS" result on the operation interface, the communication module can be placed in the device at the next station for the next test; if the operator sees the "Fail" result on the operation interface, the communication module can be filtered out. The operator can then perform further testing on the filtered abnormal communication modules. Since the communication module under test 12 is clamped in the fixture, and the test module is integrated on the fixture, it is no longer necessary to deploy high-end instruments such as the deSchwarz SMBV100B signal source and CMW100B comprehensive tester at the test station, reducing the space occupied by the test station and improving the space utilization of the test station; at the same time, production line operators do not need to perform complex multi-device collaborative operations, improving test efficiency.

[0037] In some embodiments, the terminal includes a centralized database for storing in real time the test results of each communication module under test 12 in the calibration device 100, the final test device 200, and the pin test device 300, respectively; wherein each communication module under test 12 has a unique identifier, and the terminals in the calibration device 100, the final test device 200, and the pin test device 300 manage the centralized database in a unified manner through a network connection, and the centralized database contains the test results of each communication module under test 12 in the calibration device 100, the final test device 200, and the pin test device 300, respectively.

[0038] To improve work efficiency and reduce the workload of operators manually screening abnormal communication modules 12 under test, a unique identifier (such as a barcode or QR code) can be assigned to each communication module 12 under test. This identifier can be centrally managed via a network of terminal PCs in each testing device, maintaining a centralized database that stores the test results of each communication module 12 at various stations (BT, FT, PT, etc.) in real time. The terminal PCs in each testing device can form a network connection via wired or wireless means to achieve unified management of the centralized database. For example, when a module is tested at the BT station in the calibration device 100, its test results are stored in the centralized database on the terminal of the calibration device 100 and synchronously transmitted via the network to the centralized databases on the terminals of the final testing device 200 and the pin testing device 300. This ensures that the centralized databases on the terminals of the calibration device 100, the final testing device 200, and the pin testing device 300 all store the same set of test results for each communication module 12 at each station. After each device completes its test on the communication module under test 12, it must immediately update the test results to the database. When the operator places the communication module under test 12 into the dedicated fixture at any station for testing, the system first scans the unique identifier of the communication module under test 12, queries the centralized database to obtain the test results of the module in all pre-tests (e.g., the FT station checks the test results of the BT station, and the PT station checks the test results of the BT and FT stations). If all pre-test results show PASS, the test process is started to continue subsequent tests; if any pre-test result shows FAIL, the test is stopped immediately, and the operator is warned through text, voice, animation, etc., such as displaying a prominent message on the PC screen such as "Module unqualified, please remove and reroute" accompanied by an audible and visual alarm, clearly instructing the operator to remove the module from the production line and send it to the unqualified area or rework area, etc., to avoid putting a module that has been found to be faulty in the pre-test into the next test station for further testing, which would waste resources and affect testing efficiency. With clear interface prompts and real-time status updates, operators are guided to perform correct module placement, scanning, and sorting operations, avoiding the blind circulation of unqualified modules in the production line. This effectively prevents downstream testing resources from being ineffectively occupied, shortens the identification cycle of unqualified products, and significantly improves the effective throughput and resource utilization of the entire production line.

[0039] In some embodiments, a DIP switch 11 is provided on the fixture, and the DIP switch 11 is used to configure the working mode of the testing module; wherein the working mode includes: BOOT mode and USB mode.

[0040] It should be understood that the fixtures of the calibration device 100, the final testing device 200, and the pin testing device 300 all integrate DIP switches 11. Exemplarily, the DIP switch 11 can be a mechanical configuration component, which can directly and precisely configure the BOOT mode and USB mode of the test module by switching physical positions, without relying on complex software programming or external configuration devices, thereby simplifying the operation process of production line testing and reducing human error.

[0041] BOOT mode is the core configuration mode when the test module powers on and starts up. It controls the firmware startup method and includes forced download mode and normal operation mode, which can be triggered by different positions of the DIP switch 11. Before production line testing of the communication module, firmware needs to be flashed onto the test module. At this time, the operator can switch the BOOT mode to forced download mode using the DIP switch 11. After the test module powers on, it receives the corresponding test firmware and completes the test firmware flashing. After the test firmware flashing is complete, the operator can also switch the BOOT mode to normal operation mode using the DIP switch 11. After the test module powers on, it will automatically load the flashed test firmware, establish a communication connection with the terminal and the communication module under test 12, and perform corresponding RF transceiver parameter calibration, RF transceiver function testing, interface function testing, etc. It should be understood that the BOOT mode switching must be performed when the test module is powered off. After the switching is completed, powering on again will take effect to ensure the stability of mode switching and avoid malfunctions that may be caused by switching while powered on. The power-on and power-off of the test module can be controlled by powering on and off the fixture via the power supply.

[0042] USB mode switching is only configured for the pin testing device 300's testing module, controlling the working role of the testing module's USB interface. It includes slave and master modes, which can be switched using different positions of the DIP switch 11. It should be understood that since the terminal and testing module in the PT station transmit corresponding programming commands via the MAIN UART connector, to avoid USB interface conflicts, the testing module's USB mode needs to be configured as slave mode using the DIP switch 11. This ensures the testing module passively receives power or other auxiliary signals from the USB interface without actively initiating data interaction, guaranteeing the uniqueness of the firmware programming link. After the test firmware programming at the PT station is completed, the operator can also switch the USB mode to master mode using the DIP switch 11. In this mode, the testing module's USB interface acts as the master device, actively recognizing the USB driver of the communication module under test 12 and establishing a data transmission link, thus completing the USB interface function test at the PT station. By switching the USB mode, it is ensured that the PT station's test firmware programming and the formal testing link do not conflict.

[0043] This application embodiment achieves fast mode switching through DIP switch 11, which is simple to operate and does not require traditional software configuration and external equipment coordination solutions, thus reducing costs. At the same time, the integrated design of DIP switch 11 and fixture achieves a high degree of integration of test system 10.

[0044] Figure 2 This is a schematic diagram of the architecture of a calibration device 100 provided in an embodiment of this application. Please refer to... Figure 2 In some embodiments, the calibration device 100 includes: a first fixture 110, on which a first testing module 111 and a first flash memory module 112 are disposed; a first comprehensive tester 120, which is communicatively connected to the antenna of the communication module under test 12 via a first radio frequency line 121; and a first terminal 130, which is communicatively connected to the first testing module 111 via a first connector 131. The first terminal 130 writes first test firmware into the first testing module 111, the first test firmware including a test program for calibrating the radio frequency transceiver parameters of the communication module under test 12; the first testing module 111 writes first startup firmware into the first flash memory module 112, the first startup firmware including a startup program for the communication module under test 12; and the first terminal 130 sends a first control command to the first testing module 111, so that the first testing module 111 calibrates the radio frequency transceiver parameters of the communication module under test 12 according to the first control command.

[0045] The first clamp 110 serves as the core hardware integration of the calibration device 100, housing a first test module 111 and a first flash memory module 112. It also integrates a DIP switch 11 for configuring the BOOT mode of the first test module 111. The first clamp 110 stably holds the communication module under test (DUT) 12, providing physical fixation and test interface support, ensuring stable connection between the DUT 12 and the various test devices in the calibration device 100. For example, the first flash memory module 112 can be a Nor Flash module.

[0046] The first comprehensive test instrument 120 serves as the signal interaction core for RF transceiver parameter calibration, and connects to the dual antennas of the communication module under test 12 (e.g., ...) via two first RF lines 121. Figure 2 Antennas 1 and 2 (shown) establish a communication connection to transmit standard radio frequency (RF) signals, receive RF signals transmitted by the module, and monitor RF transceiver parameters such as frequency, power, and gain of the signals in real time. For example, the first RF line 121 can be an SMA RF line.

[0047] The first terminal 130 establishes bidirectional communication with the first testing module 111 through the first connector 131. For example, the first connector 131 is a USB connector, and the first terminal 130 can be an industrial-grade PC with BT station automated testing tools installed on it to realize visualized testing operations.

[0048] Before performing production line testing, the first test firmware of the first test module 111 in the calibration device 100 and the first boot firmware of the first flash memory module 112 need to be programmed and loaded. Only after the programming and loading are completed can the calibration of the BT station be performed. It should be understood that the programming process must follow the order of test module first and then Nor Flash.

[0049] The first terminal 130 writes the first test firmware into the first test module 111. The first test firmware includes a test program for calibrating the RF transceiver parameters of the communication module under test 12. For example, the operator configures the BOOT mode of the first test module 111 to forced download mode via the DIP switch 11 on the first fixture 110; the first terminal 130 transmits the first test firmware to the first test module 111 via a USB connector after powering on the first fixture 110. This firmware contains the core test program for calibrating the RF transceiver parameters of the communication module under test 12; after writing, the first fixture 110 is powered off, and the operator switches the BOOT mode of the first test module 111 to normal operating mode via the DIP switch 11, thus enabling the first test module 111 to calibrate RF parameters.

[0050] The first testing module 111 writes the first boot firmware into the first flash memory module 112. The first boot firmware includes the boot program for the communication module under test 12. For example, the first fixture 110 is powered on via a power control, and the first terminal 130 communicates with the first testing module 111 via a USB connector. After the first testing module 111 and the communication module under test 12 have booted up, the first terminal 130 sends a boot firmware writing command to the first testing module 111. Upon receiving the command, the first testing module 111 writes the first boot firmware into the Nor Flash module. This first boot firmware replaces the native boot program of the communication module under test 12. Booting via Nor Flash significantly shortens the power-on boot time of the communication module under test 12, reduces the production line testing time for a single module, and directly improves the throughput of batch testing on the production line.

[0051] After the firmware is burned, the calibration device 100 enters the calibration phase, which can be automatically controlled by the first terminal 130. For example, the first terminal 130 can open the BT station automated testing tool without manual intervention. Specifically, the first terminal 130 sends a first control command to the first testing module 111, so that the first testing module 111 calibrates the RF transceiver parameters of the communication module under test 12 according to the first control command. For example, the first terminal 130 sends the first control command to the first testing module 111 through a USB connector. After receiving the first control command, the first testing module 111 establishes a communication connection with the communication module under test 12, sends control signals to the communication module under test 12, and sends signals to the first comprehensive test instrument 120 through the antenna. At the same time, it receives the module transmission signal monitoring data fed back by the first comprehensive test instrument 120. The communication module under test 12 and the first testing module 111 exchange information and signals. The first testing module 111 calibrates the RF transceiver parameters of the communication module under test 12 according to the data fed back by the first comprehensive test instrument 120. After calibration, the first testing module 111 will send the calibration result back to the first terminal 130 via the USB connector, disconnect the power, and remove the communication module 12 under test. If the calibration result is qualified, the communication module 12 under test will be transferred to the next testing stage.

[0052] The calibration device 100 provided in this application embodiment can complete the calibration of radio frequency parameters using only a test module and a comprehensive tester, reducing equipment costs. Simultaneously, by booting the firmware through a Nor Flash module, the module's startup time is shortened, meeting the testing requirements of mass production lines. The radio frequency transceiver parameter calibration of the calibration device 100 provides a stable parameter benchmark for the subsequent collaborative operation of the final test device 200 and the pin test device 300.

[0053] Figure 3 This is a schematic diagram of the architecture of a final testing device 200 provided in an embodiment of this application. Please refer to... Figure 3In some embodiments, the final test device 200 includes: a second fixture 210, on which a second test module 211 and a second flash memory module 212 are disposed; a second comprehensive tester 220, which is communicatively connected to the antenna of the communication module under test 12 via a second radio frequency line 221; a second terminal 230, which is communicatively connected to the second test module 211 via a second connector 231; a signal generator 240, used to generate a pulse signal for testing; and a frequency divider 250, used to receive the pulse signal and send the pulse signal to the second comprehensive tester 220 and the communication module under test 12. The communication module 12 is configured such that: the second terminal 230 writes the second test firmware into the second testing module 211, which includes a test program for testing the radio frequency transceiver function of the communication module 12 under test; the second testing module 211 writes the second startup firmware into the second flash memory module 212, which includes a startup program for the communication module 12 under test; and the second terminal 230 sends a second control command to the second testing module 211, so that the second testing module 211 tests the radio frequency transceiver function of the communication module 12 under test according to the second control command.

[0054] The second clamp 210 serves as the core hardware integration of the final test device 200, housing a second test module 211 and a second flash memory module 212. It also integrates a DIP switch 11 for configuring the BOOT mode of the second test module 211. The second clamp 210 stably holds the communication module under test 12, providing physical fixation and test interface adaptation, ensuring stable connection between the communication module under test 12 and the various test devices in the final test device 200. For example, the second flash memory module 212 can be a Nor Flash module.

[0055] The second comprehensive test instrument 220 serves as the signal interaction core for RF transceiver function testing. It connects to the dual antennas of the communication module under test 12 (e.g., via two second RF lines 221) Figure 3 Antennas 1 and 2 (shown) establish a communication connection to simulate radio frequency signals in a real-world scenario, receive radio frequency signals transmitted by the module, and analyze signal sensitivity, power, frequency error, and other indicators in real time. For example, the second radio frequency line 221 can be an SMA radio frequency line.

[0056] The second terminal 230 establishes bidirectional communication with the second testing module 211 through the second connector 231. For example, the second connector 231 is a USB connector, and the second terminal 230 can be an industrial-grade PC equipped with FT station automation testing tools for realizing visualized testing operations.

[0057] Frequency divider 250, acting as a pulse signal distribution carrier, has one end connected to signal generator 240 and the other end connected to the second comprehensive tester 220 and the communication module under test 12 via SMA RF cables, ensuring that the pulse signals received by both are completely synchronized, simulating the time alignment state between the module and peripheral devices in a real-world scenario. For example, signal generator 240 is a 1PPS generator, and the pulse signal is a 1PPS signal.

[0058] Before performing production line testing, the second test firmware of the second testing module 211 in the final testing device 200 and the second boot firmware of the second flash memory module 212 need to be programmed and loaded. Functional testing of the FT station can only be performed after programming and loading are complete. It should be understood that the programming process must follow the order of testing module first, then Nor Flash. The firmware programming logic of the final testing device 200 is exactly the same as that of the calibration device 100.

[0059] The second terminal 230 writes the second test firmware into the second test module 211. The second test firmware includes a test program for testing the radio frequency transceiver function of the communication module under test 12. For example, the operator configures the BOOT mode of the second test module 211 to forced download mode via the DIP switch 11 on the second fixture 210; the second terminal 230 transmits the second test firmware to the second test module 211 via a USB connector after powering on the second fixture 210. This firmware contains the core test program for testing the radio frequency transceiver function of the communication module under test 12; after writing, the second fixture 210 is powered off, and the operator switches the BOOT mode of the second test module 211 to normal operating mode via the DIP switch 11, enabling the second test module 211 to perform radio frequency transceiver testing.

[0060] The second testing module 211 writes the second boot firmware into the second flash memory module 212. The second boot firmware includes the boot program for the communication module under test 12. For example, the second fixture 210 is powered on via a power control, and the second terminal 230 communicates with the second testing module 211 via a USB connector. After the second testing module 211 and the communication module under test 12 have booted up, the second terminal 230 sends a boot firmware writing command to the second testing module 211. Upon receiving the command, the second testing module 211 writes the second boot firmware into the Nor Flash module. This second boot firmware replaces the original boot program of the communication module under test 12. Booting via Nor Flash significantly shortens the power-on boot time of the communication module under test 12, reduces the production line testing time for a single module, and directly improves the throughput of batch testing on the production line.

[0061] After firmware burning is complete, the final test device 200 enters the functional testing phase, which can be automatically controlled by the second terminal 230. The second terminal 230 opens the FT station automated test tool without manual intervention. Specifically, the second terminal 230 sends a second control command to the second test module 211, so that the second test module 211 tests the RF transceiver function of the communication module under test 12 according to the second control command. For example, the second terminal 230 sends the second control command to the second test module 211 through a USB connector to control the communication module under test 12 to enter the FT station test. After receiving the second control command, the second test module 211 establishes a communication connection with the communication module under test 12, sends control signals to the communication module under test 12, and completes initialization coordination with the second comprehensive test instrument 220 and the signal generator 240. The signal generator 240 can generate a 1PPS pulse signal, which is synchronously distributed to the second comprehensive test instrument 220 and the communication module under test 12 via the frequency divider 250. The communication module under test (DUT) 12 and the second testing module 211 exchange information and signals, and perform functional tests sequentially according to the test cases preset in the second test firmware, such as receiver sensitivity test, transmit power verification, and anti-interference test. After the functional tests are completed, the second testing module 211 will feed back the calibration results to the second terminal 230 via the USB connector, disconnect the power, and remove the DUT 12. If the calibration result is qualified, the DUT 12 will proceed to the next testing stage.

[0062] The final test device 200 provided in this application embodiment can complete the testing of RF transceiver functions using only a test module and a comprehensive tester, reducing equipment costs. Simultaneously, by booting the firmware through a Nor Flash module, the module's startup time is shortened, meeting the testing requirements of mass production lines.

[0063] Figure 4 This is a schematic diagram of the architecture of a pin testing device 300 provided in an embodiment of this application. Please refer to... Figure 4 In some embodiments, the pin testing device 300 includes: a third fixture 310, on which a third testing module 311 and a third flash memory module 312 are disposed; a third terminal 320, which is communicatively connected to the third testing module 311 via a third connector 321; wherein the third terminal 320 burns third test firmware into the third testing module 311, the third test firmware including a test program for testing the interface function of the communication module under test 12; the third testing module 311 burns third startup firmware into the third flash memory module 312, the third startup firmware including a startup program of the communication module under test 12; the third terminal 320 sends a third control command to the third testing module 311, so that the third testing module 311 tests the interface function of the communication module under test 12 according to the third control command.

[0064] The third clamp 310 serves as the core hardware integration of the pin testing device 300, housing a third testing module 311 and a third flash memory module 312. It also integrates a DIP switch 11 for configuring the second testing module 211 in BOOT and USB modes. The third clamp 310 stably holds the communication module under test (DUT) 12, providing physical fixation and test interface adaptation, ensuring stable signal transmission between the DUT 12 and the various test devices in the pin testing device 300. For example, the third flash memory module 312 can be a Nor Flash module.

[0065] The third terminal 320 establishes bidirectional communication with the third testing module 311 through the third connector 321. For example, the third connector 321 is a MAIN UART connector, and the third terminal 320 can be an industrial-grade PC equipped with PT station automated testing tools for realizing visualized testing operations.

[0066] like Figure 4 As shown, in some embodiments, the third fixture 310 is also provided with a switching module 313 for controlling channel switching. The channels include a first channel and a second channel. The communication module under test 12 is connected to the third testing module 311 through the first channel and to the third terminal 320 through the second channel.

[0067] The switching module 313 is a dedicated component of the PT station, integrated into the third fixture 310. It controls channel switching via the DIP switch 11 and is used to switch the connection link of the USB interface of the communication module under test 12.

[0068] like Figure 4 As shown, in some embodiments, the third fixture 310 is further provided with a main control module 314 for controlling the switching of the test modes of the third testing module 311. The test modes include a first test mode and a second test mode. The third control command controls the third testing module 311 to switch to the first test mode when performing the first type of test and to switch to the second test mode when performing the second type of test. The first type of test includes: GPIO interface test; the second type of test includes: SN number writing, current consumption test, USB interface test and RESET function test.

[0069] The main control module 314 (MCU) is also a dedicated component of the PT station, integrated within the third fixture 310. It communicates with both the communication module under test 12 and the third test module 311, controlling the switching of the test modes of the third test module 311. It is also responsible for reading GPIO interface levels, performing module reset operations, and providing feedback on interface status data. It is a crucial intermediate carrier for interface function verification in the pin testing device 300. For example, the first test mode is PIN TEST mode, and the second test mode is AT mode.

[0070] Before performing production line testing, the third test firmware of the third configuration module 311 in the pin testing device 300 and the third boot firmware of the third flash memory module 312 need to be programmed and loaded. Only after programming and loading are completed can the interface function test of the PT station be performed. It should be understood that the programming process must follow the order of configuring the test module first and then the Nor Flash. The firmware programming of the pin testing device 300 needs to coordinate the configuration of the BOOT mode and USB mode of the third configuration module.

[0071] The third terminal 320 burns the third test firmware into the third testing module 311. The third test firmware includes a test program for testing the interface function of the communication module under test 12. For example, the operator configures the BOOT mode of the third testing module 311 to forced download mode using the DIP switch 11 on the third fixture 310. The USB mode also needs to be configured to slave mode simultaneously, and the switching channel is switched to the second channel to avoid USB interface conflicts. The third fixture 310 is powered on via power control, and the third terminal 320 transmits the third test firmware to the third testing module 311 via the MAIN UART connector. This firmware includes built-in interface function test programs, such as GPIO level control, USB driver identification, RESET triggering, SN number writing, current consumption detection, and switching programs between PIN TEST mode and AT mode, as well as SPI interface communication protocol parsing programs. After the test firmware is burned, the third fixture 310 is powered off via power control, and the operator switches the BOOT mode of the third testing module 311 to normal working mode using the DIP switch 11, switching the USB analog-to-digital converter to master mode. Simultaneously, the switching module 313 is controlled to switch the channel to the first channel, thus enabling the third testing module 311 to have interface test control capabilities.

[0072] The third testing module 311 writes the third boot firmware into the third flash memory module 312. The third boot firmware includes the boot program for the communication module under test 12. For example, the third fixture 310 is powered on via a power control, and the third terminal 320 communicates with the third testing module 311 via a MAIN UART connector. After the third testing module 311 and the communication module under test 12 have booted up, the third terminal 320 sends a boot firmware writing command to the third testing module 311. Upon receiving the command, the third testing module 311 writes the third boot firmware into the Nor Flash module. This third boot firmware replaces the original boot program of the communication module under test 12. Booting via Nor Flash significantly shortens the power-on boot time of the communication module under test 12, reduces the production line testing time for a single module, and directly improves the throughput of batch testing on the production line.

[0073] After the firmware is burned, the final test device 200 enters the interface function testing phase, which can be automatically controlled by the third terminal 320. The third terminal 320 opens the PT station automated testing tool without manual intervention. Specifically, the third terminal 320 sends a third control command to the third testing module 311, so that the third testing module 311 tests the interface function of the communication module under test 12 according to the third control command.

[0074] For example, the third terminal 320 sends a third control command to the third testing module 311 via the MAIN UART connector to control the communication module under test 12 to enter the PT station for testing. After receiving the third control command, the third testing module 311 establishes a communication connection with the communication module under test 12 via the SPI interface to complete the interface function test of the communication module under test 12.

[0075] As a concrete example, Figure 5 This is a flowchart illustrating an interface function test provided in an embodiment of this application. Please refer to [link / reference]. Figure 5 As shown, the communication module under test 12 is placed in the pin testing device 300 to begin the interface function test of the PT station. The interface function test process includes the following steps (steps S500 to S505): Step S500: Execute the PT station automation tool; Step S501: GPIO interface test; Step S502: Write the SN number; Step S503: Current consumption test; Step S504: USB interface test; Step S505: RESET function test.

[0076] Before executing the PT station automation tool in step S500, the operator places the communication module under test 12 into the third fixture 310 of the pin testing device 300 at the PT station. The communication module under test 12 is connected to the third testing module 311 and the third terminal 320 in the third fixture 310 via a MAIN UART connector. Simultaneously, the USB module of the third testing module 311 is configured to master mode via DIP switch 11 to ensure it can communicate normally with the communication module under test 12.

[0077] Power is supplied to the third test module 311, the communication module under test 12, and the main control module 314 on the third fixture 310. The third terminal 320 starts the PT station automated test tool. After all the devices are powered on and stabilized, the tool begins to execute the test process.

[0078] In the GPIO interface test in step S501, the PT station automation tool of the third terminal 320 sends a PIN TEST command to the third testing module 311. The third testing module 311 forwards the PIN TEST command to the communication module under test 12 via the SPI interface, controlling the GPIO interface of the communication module under test 12 to output a high or low level. The main control module 314 directly reads the actual level of the GPIO interface of the communication module under test 12 and transmits the read level information to the third terminal 320. The third terminal 320 compares the preset expected GPIO level value with the actual read value to determine whether the GPIO interface function is normal.

[0079] After the GPIO interface test is completed, the main control module 314 controls the third testing module 311 to restart and switches its test mode to AT mode. In the SN number writing process of step S502, the third terminal 320 sends an AT command to the third testing module 311 via an automated tool. This command contains the SN number to be written. The third testing module 311 forwards the AT command and SN number to the communication module under test 12 via the SPI interface. The communication module under test 12 writes the SN number into the electrically erasable programmable read-only memory (EEPROM) inside the module. After writing is complete, the third terminal 320 can confirm whether the SN number has been successfully written using the AT command. EEPROM is a non-volatile memory that ensures the SN number is permanently stored and not lost even after the communication module under test 12 is powered off.

[0080] After the SN number is written, the third terminal 320 initiates the current consumption test of the communication module under test 12 via AT commands, executing step S503. The third testing module 311 can monitor the current consumption of the communication module under test 12 and feed the data back to the third terminal 320. The third terminal 320 determines whether the power consumption of the communication module under test 12 is normal based on the preset current consumption range.

[0081] After the current consumption test is completed, the USB interface test in step S504 is performed. The USB interface of the communication module under test 12 is connected to the USB interface of the third testing module 311 through the switching module 313. The third terminal 320 identifies the USB driver status of the communication module under test 12 through the third testing module 311, and determines whether the USB interface function is normal based on whether the USB driver is successfully identified.

[0082] After the USB interface test is completed, the RESET function test in step S505 is executed. The third terminal 320 sends the corresponding AT command to the third testing module 311. After receiving the AT command, the main control module 314 controls the communication module under test 12 to perform a reset operation. After the communication module under test 12 completes the reset, it sends the reset string, which is transmitted to the third testing module 311 through the UART interface. The third testing module 311 then transmits the recognized string information to the third terminal 320. The third terminal 320 determines whether the RESET function is normal by recognizing this string.

[0083] After all the above tests are completed, the PT station automation tool can display the test results, such as PASS or FAIL, on the test interface of the third terminal 320. If the test passes, the communication module under test 12 will be removed for subsequent packaging; if the test fails, the module will be screened out and not shipped.

[0084] The pin testing device 300 provided in this application integrates the functions of a testing module, a main control module 314, and a switching module 313 within a fixture, reducing equipment costs. Simultaneously, the startup firmware of the Nor Flash module shortens the module's startup time, meeting the testing requirements of mass production lines. Efficient and accurate batch testing is achieved through the control of the entire interface function testing process by automated testing tools on the terminal.

[0085] It should be understood that the production line testing process for communication modules includes not only BT, FT, and PT stations, but also other testing items or production stages such as laser engraving stations, check stations, and collection stations. The laser engraving station involves laser engraving the communication module 12 under test before testing to write information such as the product serial number, OC (Order Code), and PN (Part Number), ensuring that the product has a unique identifier and traceability from the initial stage of production, providing a foundation for subsequent quality management and logistics. The check station, after the core tests are completed, performs a double check to ensure that the communication module 12 under test has undergone and passed all tests at the BT, FT, and PT stations, preventing communication modules that have not been adequately tested or have failed tests from entering the next stage or being shipped, thereby improving the rigor of product quality control. The collection station collects and packages the communication modules that have completed all tests, optimizing the end-of-line process of the production line and improving shipping efficiency. By optimizing each station in the production and testing process of communication modules, the entire production line of communication modules has become more complete and efficient, realizing full-process automation and quality assurance from product identification, functional testing, quality verification to final packaging.

[0086] In some embodiments, the communication module under test 12 is a V2X module based on the Autotalks platform.

[0087] The V2X (Vehicle-to-Everything) communication module is a core component that enables low-latency, high-reliability data interaction between intelligent connected vehicles and their external environment (such as vehicles, roadside equipment, pedestrians, etc.). By integrating a dedicated RF front-end chip, baseband processor, automotive-grade power management module, and security encryption unit (such as the SECTON & PLUTON2 series from the AUTOTALKS platform), it supports both DSRC (IEEE 802.11p) and C-V2X (3GPP R14 / 15) dual-mode communication protocols, enabling key vehicle-to-everything (V2X) functions such as speed perception, collision warning, and collaborative driving.

[0088] This application discloses a test system 10, a test method, and a storage medium. The test system 10 includes: a calibration device 100 for calibrating the radio frequency (RF) transceiver parameters of a communication module under test (DUT) 12; a final test device 200 for testing the RF transceiver functions of the DUT 12; and a pin test device 300 for testing the interface functions of the DUT 12. The calibration device 100, the final test device 200, and the pin test device 300 execute their respective functions sequentially according to a preset order. This application utilizes modular calibration devices 100, final test devices 200, and pin test devices 300 to sequentially perform corresponding tests on the DUT 12, ensuring the completeness of functional testing, enabling mass production testing of communication modules, increasing production line throughput, and thus improving testing efficiency. Furthermore, it eliminates the need for specific high-end instruments to complete the testing of communication modules, reducing testing costs.

[0089] Based on the same inventive concept, and according to a second aspect of this application, embodiments of this application also provide a testing method. Figure 6 This is a flowchart illustrating a testing method provided in an embodiment of this application. Please refer to [link / reference]. Figure 6 This testing method can be applied to Figure 1 In the test system 10 shown, for example, the test method can be provided by... Figure 1 The calibration device 100, final test device 200, and pin test device 300 in the test system 10 shown interact with each other. For example... Figure 6 As shown, the test method includes the following steps (steps S110 to S130): Step S110: Calibrate the radio frequency transceiver parameters of the communication module under test using a calibration device; Step S120: Test the radio frequency transceiver function of the communication module under test using the final test device; Step S130: Test the interface function of the communication module under test using a pin testing device.

[0090] The above steps in the embodiments of this application enable the corresponding tests to be performed on the communication module under test by means of a calibration device, a final test device, and a pin test device, respectively, ensuring the integrity of the functional test, realizing mass production testing of the communication module, improving the throughput of the production line, and thus improving the testing efficiency; at the same time, the testing of the communication module can be completed without the need for specific high-end instruments, reducing the testing cost.

[0091] In some embodiments, the calibration device includes a first clamp and a first terminal, the final testing device includes a second clamp and a second terminal, and the pin testing device includes a third clamp and a third terminal.

[0092] Step S110 above may include step S111: placing the communication module under test into the first fixture of the calibration device, and sending a corresponding first control command to the corresponding first test module through the corresponding first terminal to calibrate the radio frequency transceiver parameters of the communication module under test.

[0093] Step S120 above may include step S121: placing the communication module under test into the second fixture of the final test device, and sending the corresponding second control command to the corresponding second test module through the corresponding second terminal to test the radio frequency transceiver function of the communication module under test.

[0094] Step S130 above may include step S131: placing the communication module under test into the third fixture of the pin testing device, and sending the corresponding third control command to the corresponding third testing module through the corresponding third terminal to test the interface function of the communication module under test.

[0095] Through the above steps, the communication module under test is clamped in the corresponding fixture, and the test module is also integrated on the fixture. Therefore, it is no longer necessary to deploy high-end instruments such as the deSchwarz SMBV100B signal generator and CMW100B comprehensive tester at the test station at the same time, which reduces the space occupied by the test station and improves the space utilization of the test station. At the same time, production line operators do not need to perform complex multi-device collaborative operations, which improves test efficiency.

[0096] Before the communication module under test (DUT) undergoes the corresponding calibration or testing through steps S111 to S131, the corresponding test program needs to be burned into the corresponding test module, and the startup firmware of the DUT needs to be burned into the NorFlash module to shorten the module's startup time, reduce production line testing time, and thus increase production capacity. Specifically, before placing the DUT into the calibration device to perform RF transceiver parameter calibration, firmware burning needs to be performed first to burn the corresponding test program into the corresponding test module. Simultaneously, the corresponding startup firmware can also be burned into the corresponding NorFlash module to shorten the DUT's startup time. Based on this, in some embodiments, a first test module and a first flash memory module are provided on the first fixture. Before placing the DUT into the first fixture of the calibration device, the above testing method further includes: Configure the BOOT mode of the first test module to forced download mode; after the first fixture is powered on, burn the first test firmware into the first test module; after the first fixture is powered off, configure the BOOT mode of the first test module to normal working mode; wherein, the first test firmware includes a test program for calibrating the RF transceiver parameters of the communication module under test.

[0097] After placing the communication module under test into the first fixture of the calibration device, the above test method also includes: After the first fixture is powered on and the first testing module and the communication module under test are started, the first startup firmware is burned into the first flash memory module; wherein, the first startup firmware includes the startup program of the communication module under test.

[0098] The above steps complete the preparatory work for the BT station calibration device before production line testing, laying the foundation for subsequent large-scale module production line testing.

[0099] Before placing the communication module under test (DUT) into the final test device to perform RF transceiver function testing, firmware flashing is required to burn the corresponding test program into the corresponding test module. Simultaneously, the corresponding startup firmware can also be burned into the corresponding Nor Flash module to shorten the startup time of the DUT. Based on this, in some embodiments, a second test module and a second flash module are provided on the second fixture. Before placing the DUT into the second fixture of the final test device, the above testing method further includes: Configure the BOOT mode of the second test module to forced download mode; after the second fixture is powered on, burn the second test firmware into the second test module; after the second fixture is powered off, configure the BOOT mode of the second test module to normal working mode; wherein, the second test firmware includes a test program for testing the radio frequency transceiver function of the communication module under test.

[0100] After placing the communication module under test into the second fixture of the final testing device, the above testing method further includes: After the second fixture is powered on and the second test module and the communication module under test are started, the second startup firmware is burned into the second flash memory module; wherein, the second startup firmware includes the startup program of the communication module under test.

[0101] The above steps complete the preparatory work for the FT station final testing device before production line testing, laying the foundation for subsequent large-scale module production line testing.

[0102] Before placing the communication module under test (DUT) into the pin testing device to perform interface function testing, firmware flashing is required to burn the corresponding test program into the corresponding test module. Simultaneously, the corresponding startup firmware can also be burned into the corresponding Nor Flash module to shorten the startup time of the DUT. Based on this, in some embodiments, a third test module and a third flash module are provided on the third fixture. Before placing the DUT into the third fixture of the pin testing device, the above testing method further includes: Configure the BOOT mode of the third test module to forced download mode and the USB mode to slave mode; after switching the channel to the second channel and powering on the third fixture, burn the third test firmware into the third test module; after powering off the third fixture, configure the BOOT mode of the third test module to normal operation mode and the USB mode to master mode, and switch the channel to the first channel; wherein, the communication module under test communicates with the third test module through the first channel and communicates with the terminal through the second channel; the third test firmware includes a test program for testing the interface function of the communication module under test.

[0103] After placing the communication module under test into the third fixture of the pin testing device, the above testing method also includes: After the third fixture is powered on and the third test module and the communication module under test are started, the third startup firmware is burned into the third flash memory module; wherein, the third startup firmware includes the startup program of the communication module under test.

[0104] The above steps complete the preparatory work for the PT station pin testing device before production line testing, laying the foundation for subsequent large-scale module production line testing.

[0105] This application embodiment performs corresponding firmware burning for the calibration device, final testing device, and pin testing device, as well as firmware burning for the Nor Flash module, before production line testing. This preparatory work lays the foundation for subsequent mass testing of the communication module. It should be understood that this application does not limit the execution order of firmware burning for the calibration device, final testing device, and pin testing device; the three devices can perform their respective pre-test preparations independently or simultaneously. However, during the subsequent testing of the communication module under test, the corresponding tests must be performed strictly in the order of BT station, FT station, and PT station.

[0106] Since the above-described test method can be executed by the above-described test system 10, for further description of the various steps in the above-described test method and their beneficial effects, please refer to the embodiments of the above-described test system 10, which will not be elaborated here.

[0107] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be performed by instructions, or by instructions controlling related hardware. These instructions can be stored in a computer-readable storage medium and loaded and executed by a processor.

[0108] Therefore, according to a third aspect of this application, embodiments of this application provide a computer-readable storage medium storing a computer program thereon, the computer program being loaded by a processor to perform the steps described in the above-described method embodiments of this application. For example, the computer program being loaded by a processor can perform the following steps: The radio frequency (RF) transceiver parameters of the communication module under test (DUT) are calibrated using a calibration device; the RF transceiver function of the DUT is tested using a final test device; and the interface function of the DUT is tested using a pin test device.

[0109] For details on the implementation of each of the above operations / steps, please refer to the previous examples, which will not be repeated here.

[0110] The computer-readable storage medium may include: read-only memory (ROM), random access memory (RAM), disk or optical disk, etc.

[0111] Since the computer program stored in the computer-readable storage medium can execute the steps in any of the above method embodiments provided in the embodiments of this application, the beneficial effects that the methods described in any of the above method embodiments can achieve can be realized, as detailed in the preceding embodiments, and will not be repeated here.

[0112] According to a fourth aspect of this application, embodiments of this application also provide a computer program product or computer program, which includes computer instructions stored in a computer-readable storage medium. A processor of an electronic device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the electronic device to perform the methods provided in the various optional implementations of the above embodiments.

[0113] The above provides a detailed description of the testing system 10, testing method, and storage medium provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A testing system, characterized in that, include: A calibration device used to calibrate the radio frequency transceiver parameters of a communication module under test. The final test device is used to test the radio frequency transceiver function of the communication module under test. A pin testing device is used to test the interface functions of the communication module under test; The calibration device, the final test device, and the pin test device perform their respective functions in a preset order.

2. The testing system according to claim 1, characterized in that, The calibration device, the final test device, and the pin test device all include a fixture and a terminal, and the fixture is equipped with a test module. The terminal is used to send control commands to the corresponding test module, so that the test module performs corresponding functions on the communication module under test according to the control commands; the fixture is used to hold the communication module under test and provide a test interface.

3. The testing system according to claim 2, characterized in that, The calibration device includes: A first fixture, wherein a first testing module and a first flash memory module are disposed on the first fixture; The first comprehensive test instrument is communicatively connected to the antenna of the communication module under test via a first radio frequency line; The first terminal is communicatively connected to the first testing module via a first connector; Specifically, the first terminal burns a first test firmware into the first testing module, the first test firmware including a test program for calibrating the radio frequency transceiver parameters of the communication module under test; the first testing module burns a first startup firmware into the first flash memory module, the first startup firmware including a startup program of the communication module under test; the first terminal sends a first control command to the first testing module, so that the first testing module calibrates the radio frequency transceiver parameters of the communication module under test according to the first control command.

4. The testing system according to claim 2, characterized in that, The final measurement device includes: The second fixture is provided with a second testing module and a second flash memory module. The second comprehensive test instrument is communicatively connected to the antenna of the communication module under test via a second radio frequency line; The second terminal is communicatively connected to the second testing module via a second connector. A signal generator, used to generate pulse signals for testing; A frequency divider is used to receive the pulse signal and send the pulse signal to the second comprehensive test instrument and the communication module under test. Specifically, the second terminal burns the second test firmware into the second testing module, the second test firmware including a test program for testing the radio frequency transceiver function of the communication module under test; the second testing module burns the second startup firmware into the second flash memory module, the second startup firmware including a startup program for the communication module under test; the second terminal sends a second control command to the second testing module, so that the second testing module tests the radio frequency transceiver function of the communication module under test according to the second control command.

5. The testing system according to claim 2, characterized in that, The pin testing device includes: The third fixture is provided with a third testing module and a third flash memory module; The third terminal is communicatively connected to the third testing module via a third connector. The third terminal burns a third test firmware into the third testing module, the third test firmware including a test program for testing the interface function of the communication module under test; the third testing module burns a third boot firmware into the third flash memory module, the third boot firmware including a boot program for the communication module under test; the third terminal sends a third control command to the third testing module, so that the third testing module tests the interface function of the communication module under test according to the third control command.

6. The testing system according to claim 5, characterized in that, The third fixture is also equipped with a switching module for controlling channel switching. The channel includes a first channel and a second channel. The communication module under test communicates with the third testing module through the first channel and with the third terminal through the second channel.

7. The testing system according to claim 6, characterized in that, The third fixture is also equipped with a main control module for controlling the switching of the test modes of the third testing module. The test modes include a first test mode and a second test mode. The third control command controls the third testing module to switch to the first test mode when performing the first type of test, and to switch to the second test mode when performing the second type of test; The first type of test includes GPIO interface testing; the second type of test includes SN number writing, current consumption testing, USB interface testing, and RESET function testing.

8. The testing system according to any one of claims 2 to 7, characterized in that, The fixture is equipped with a DIP switch, which is used to configure the working mode of the testing module. The operating modes include: BOOT mode and USB mode.

9. The testing system according to claim 1, characterized in that, The communication module under test is a V2X module based on the Autotalks platform.

10. A testing method, characterized in that, The method is applied to a testing system, which includes a calibration device, a final testing device, and a pin testing device; the testing system includes: The radio frequency transceiver parameters of the communication module under test are calibrated using the calibration device. The radio frequency transceiver function of the communication module under test is tested using the final testing device. The interface function of the communication module under test is tested using the pin testing device.

11. The method according to claim 10, characterized in that, The calibration device includes a first clamp and a first terminal; the final testing device includes a second clamp and a second terminal; and the pin testing device includes a third clamp and a third terminal. The step of calibrating the radio frequency transceiver parameters of the communication module under test using the calibration device includes: placing the communication module under test into the first fixture of the calibration device, and sending a corresponding first control command to the first test module set on the first fixture through the first terminal to calibrate the radio frequency transceiver parameters of the communication module under test; The step of testing the radio frequency transceiver function of the communication module under test through the final test device includes: placing the communication module under test into the second fixture of the final test device, and sending a corresponding second control command to the second matching module set on the second fixture through the second terminal to test the radio frequency transceiver function of the communication module under test; The step of testing the interface function of the communication module under test using the pin testing device includes: placing the communication module under test into the third fixture of the pin testing device, and sending a corresponding third control command to the third testing module set on the third fixture through the third terminal to test the interface function of the communication module under test.

12. The method according to claim 11, characterized in that, The first fixture is equipped with the first testing module and the first flash memory module; Before placing the communication module under test into the first fixture of the calibration device, the method further includes: configuring the BOOT mode of the first test module to a forced download mode; burning the first test firmware into the first test module after the first fixture is powered on; and configuring the BOOT mode of the first test module to a normal working mode after the first fixture is powered off. After placing the communication module under test into the first fixture of the calibration device, the method further includes: after the first fixture is powered on and the first testing module and the communication module under test are started, burning the first startup firmware into the first flash memory module; The first test firmware includes a test program for calibrating the radio frequency transceiver parameters of the communication module under test; the first startup firmware includes a startup program for the communication module under test.

13. The method according to claim 11, characterized in that, The second fixture is equipped with the second testing module and the second flash memory module; Before placing the communication module under test into the second fixture of the final test device, the method further includes: configuring the BOOT mode of the second test module to a forced download mode; burning the second test firmware into the second test module after the second fixture is powered on; and configuring the BOOT mode of the second test module to a normal working mode after the second fixture is powered off. After placing the communication module under test into the second fixture of the final testing device, the method further includes: after the second fixture is powered on and the second testing module and the communication module under test are started, burning the second startup firmware into the second flash memory module; The second test firmware includes a test program for testing the radio frequency transceiver function of the communication module under test; the second startup firmware includes a startup program for the communication module under test.

14. The method according to claim 11, characterized in that, The third fixture is equipped with the third testing module and the third flash memory module; Before placing the communication module under test into the third fixture of the pin testing device, the method further includes: configuring the BOOT mode of the third test module to forced download mode and configuring the USB mode to slave mode; after switching the channel to the second channel and powering on the third fixture, burning the third test firmware into the third test module; after powering off the third fixture, configuring the BOOT mode of the third test module to normal operation mode and configuring the USB mode to master mode, and switching the channel to the first channel. After placing the communication module under test into the third fixture of the pin testing device, the method further includes: after the third fixture is powered on and the third testing module and the communication module under test are started, burning the third startup firmware into the third flash memory module; The communication module under test is connected to the third testing module via the first channel and to the terminal via the second channel; the third test firmware includes a test program for testing the interface functions of the communication module under test; and the third startup firmware includes a startup program for the communication module under test.

15. A computer-readable storage medium, characterized in that, It stores a computer program or instructions thereon, which, when executed by a processor, implement the steps of the test method as described in any one of claims 10 to 14.

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