Sampling inspection machine for chip manufacturing

Abstract

The utility model discloses a spot check machine for chip manufacturing, comprising a workbench, the top of the workbench is fixedly provided with an overturning assembly, the overturning assembly comprises a double-shaft cylinder and a moving frame, the double-shaft cylinder is fixedly installed on one side of the workbench, the moving frame is fixedly connected with the output end of the double-shaft cylinder, and the moving frame is fixedly connected with the output end of the double-shaft cylinder. An electric push rod is fixedly installed at the top of the movable frame, the output end of the electric push rod is fixedly connected with a toothed plate, one side of the movable frame is connected with a rotating shaft through a bearing, the side wall of the rotating shaft is fixedly connected with a first gear, and the first gear is connected with the toothed plate in a meshed mode. According to the sampling inspection machine for chip manufacturing, through the arranged overturning assembly, a chip can be overturned, so that the two faces of the chip can be detected, no omission exists in the detection process, the detection effect cannot be affected by omission, and the quality of a chip product is higher.

Description

Technical Field

[0001] This utility model relates to the field of chip manufacturing sampling inspection technology, specifically a sampling inspection machine for chip manufacturing. Background Technology

[0002] Sampling inspection is a crucial step in the chip manufacturing process. Here is a detailed introduction to sampling inspection in chip manufacturing: I. Purpose of Sampling Inspection: Ensuring Quality. As highly precise electronic components, the quality of chips directly affects the performance and reliability of electronic products. Sampling inspection allows for the timely detection of potential quality problems during production, such as chip functional defects and unstable electrical performance. This enables appropriate corrective measures to be taken, ensuring that the chip quality meets standard requirements. For example, in smartphones and other electronic devices, chip quality issues can lead to device crashes, lag, and reduced battery life, impacting user experience. Therefore, rigorous sampling inspection can improve chip quality and reduce the occurrence of these problems.

[0003] Patent publication number "CN218939607U" discloses "a sampling inspection machine for chip manufacturing, which includes a conveyor belt, chips, a worktable, a gantry frame, a vision inspection camera, a support frame, and a control system; the gantry frame is slidably mounted on the worktable, and a power mechanism for moving the gantry frame is provided on the worktable; the vision inspection camera is mounted on the gantry frame and faces the conveyor belt, the conveyor belt passes laterally through the worktable, and multiple groups of chips are placed side by side on the conveyor belt; a receiving groove is provided on one side of the conveyor belt exit end of the worktable, and a sweeping component is provided on the gantry frame to sweep unsuitable chips into the receiving groove; the support frame is located at the conveyor belt inlet end of the worktable, and a counting device for detecting the number of chips conveyed is provided on the support frame; the control system is located on the worktable. In this utility model, the conveyor belt does not need to stop conveying during the entire sampling inspection process, the chip manufacturing efficiency is high, and no manual operation is required, making sampling inspection simple and fast."

[0004] To address the aforementioned issues, existing sampling inspection machines can only inspect the top of the chip. In actual use, the bottom of the chip also needs to be inspected, which affects the sampling inspection results. Furthermore, they lack a good centering function, making it easy for the chip to be out of center, which also affects the sampling inspection results.

[0005] To address these issues, this invention provides a sampling inspection machine for chip manufacturing. Utility Model Content

[0006] To address the shortcomings of existing technologies, this invention provides a sampling inspection machine for chip manufacturing, which solves the problem that existing sampling inspection machines can only inspect the top of the chip, while the bottom of the chip also needs to be inspected in actual use, thus affecting the sampling inspection effect.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a chip manufacturing sampling inspection machine, comprising a worktable, a flipping assembly fixedly mounted on the top of the worktable, the flipping assembly comprising a dual-axis cylinder and a moving frame, the dual-axis cylinder fixedly mounted on one side of the worktable, the moving frame fixedly connected to the output end of the dual-axis cylinder, an electric push rod fixedly mounted on the top of the moving frame, a gear plate fixedly connected to the output end of the electric push rod, a rotating shaft connected to one side of the moving frame via a bearing, a gear fixedly connected to the side wall of the rotating shaft, the gear meshing with the gear plate, a rotating frame fixedly connected to one end of the rotating shaft, an electric slide rail provided on one side of the rotating frame, a clamping plate slidably connected to one side of the electric slide rail, and a detection assembly fixedly mounted on the top of the worktable.

[0008] Furthermore, a centering assembly is provided on one side of the workbench. The centering assembly includes a connecting frame and a bidirectional threaded rod. The connecting frame is fixedly installed at the bottom of the workbench. The bidirectional threaded rod is connected to the inner side wall of the connecting frame via a bearing. A gear is fixedly connected to the side wall of the bidirectional threaded rod. A movable plate is threadedly connected to the side wall of the bidirectional threaded rod. The movable plate is slidably connected to the workbench. A slide rod is fixedly installed on one side of the movable plate. A rectangular plate is fixedly installed on the top of the workbench. The slide rod is slidably connected to the rectangular plate. A centering plate is fixedly connected to one end of the slide rod. A power assembly is fixedly installed on one side of the connecting frame.

[0009] The above technical solution enables chip centering, and the centering process is simple and convenient.

[0010] Furthermore, there are two slide bars, and the two slide bars are arranged opposite to each other.

[0011] By adopting the above technical solution, it can be made to slide more stably.

[0012] Furthermore, the power assembly includes a motor and a third gear. The motor is fixedly mounted on one side of the connecting frame, the third gear is fixedly connected to the output end of the motor, and the third gear is meshed with the second gear.

[0013] The above technical solution can provide power to facilitate centering operations.

[0014] Furthermore, the detection component includes a mounting bracket, which is fixedly mounted on the top of the workbench, and an industrial camera is fixedly mounted on the top of the mounting bracket.

[0015] Using the above technical solution, chip testing can be performed, and the testing is simple and convenient.

[0016] Furthermore, a drive belt is provided on the top of the workbench, and the drive belt is located directly below the detection component and the flipping component.

[0017] Using the above technical solution, the chip can be transported in a simple and convenient way.

[0018] Furthermore, the flipping assembly also includes a soft pad disposed on one side of the clamp.

[0019] The above technical solution can prevent chip wear.

[0020] Beneficial effects

[0021] This invention provides a sampling inspection machine for chip manufacturing. Compared with the prior art, it has the following advantages:

[0022] 1. This chip manufacturing sampling inspection machine, through its set flipping component, can flip the chip so that both sides of the chip can be inspected. There will be no omissions during the inspection process, and omissions will not affect the inspection results, resulting in higher quality chip products and ensuring a better user experience.

[0023] 2. This chip manufacturing sampling inspection machine, through its centering and power components, can center the chips, resulting in better subsequent chip testing and a better user experience. The chip centering process is simple and convenient, with good centering performance, leading to a superior overall user experience and ensuring optimal results. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0025] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0026] Figure 2 This is a utility model Figure 1 Enlarged view of the structure at point A in the middle;

[0027] Figure 3 This is a first side view of the overall structure of this utility model;

[0028] Figure 4 This is a second side view of the overall structure of this utility model;

[0029] Figure 5 This is a utility model Figure 4 Enlarged view of the structure at point B.

[0030] In the diagram: 1. Workbench; 2. Transmission belt; 3. Tilting assembly; 31. Dual-axis cylinder; 32. Moving frame; 33. Electric push rod; 34. Gear plate; 35. Rotating shaft; 36. Gear one; 37. Rotating frame; 38. Electric slide rail; 39. Clamping plate; 310. Soft pad; 4. Detection assembly; 41. Fixed frame; 42. Industrial camera; 5. Centering assembly; 51. Connecting frame; 52. Bidirectional threaded rod; 53. Gear two; 54. Moving plate; 55. Slide rod; 56. Rectangular plate; 57. Centering plate; 6. Power assembly; 61. Motor; 62. Gear three. Detailed Implementation

[0031] It should be noted that in the description of the embodiments of this application, the terms "front," "rear," "left," "right," "up," "down," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. The terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two elements. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0032] The present application will be further described in detail below with reference to the accompanying drawings and embodiments.

[0033] Reference Figures 1 to 4 This application provides a chip manufacturing sampling inspection machine, including a workbench 1. A flipping assembly 3 is fixedly installed on the top of the workbench 1. The flipping assembly 3 includes a dual-axis cylinder 31 and a moving frame 32. The dual-axis cylinder 31 is fixedly installed on one side of the workbench 1. The moving frame 32 is fixedly connected to the output end of the dual-axis cylinder 31. An electric push rod 33 is fixedly installed on the top of the moving frame 32. A toothed plate 34 is fixedly connected to the output end of the electric push rod 33. A rotating shaft 35 is connected to one side of the moving frame 32 through a bearing. A gear 36 is fixedly connected to the side wall of the rotating shaft 35. The gear 36 meshes with the toothed plate 34. A rotating frame 37 is fixedly connected to one end of the rotating shaft 35. An electric slide rail 38 is provided on one side of the rotating frame 37. A clamping plate 39 is slidably connected to one side of the electric slide rail 38. The flipping assembly 3 also includes a soft pad 310, which is provided on one side of the clamping plate 39. A detection assembly 4 is fixedly installed on the top of the workbench 1.

[0034] In this embodiment, the electric slide rail 38 is activated to clamp the chip via the clamping plate 39. Then, the dual-axis cylinder 31 is activated to drive the moving frame 32 to rise. The industrial camera 42 is then turned on to inspect the chip. The electric push rod 33 is then activated to drive the toothed plate 34 to move, which in turn drives the gear 36 to rotate. This causes the rotating shaft 35 to rotate the rotating frame 37 by 180 degrees, allowing the industrial camera 42 to inspect the other side of the chip, thus achieving good inspection results on both sides.

[0035] Reference Figures 1 to 4 In one aspect of this embodiment, a centering assembly 5 is provided on one side of the workbench 1. The centering assembly 5 includes a connecting frame 51 and a bidirectional threaded rod 52. The connecting frame 51 is fixedly installed on the bottom of the workbench 1. The bidirectional threaded rod 52 is connected to the inner side wall of the connecting frame 51 via a bearing. A gear 53 is fixedly connected to the side wall of the bidirectional threaded rod 52. A movable plate 54 is threadedly connected to the side wall of the bidirectional threaded rod 52. The movable plate 54 is slidably connected to the workbench 1. A slide rod 55 is fixedly installed on one side of the movable plate 54. A rectangular plate 56 is fixedly installed on the top of the workbench 1. A slide rod 55 is slidably connected to the rectangular plate 56. A centering plate 57 is fixedly connected to one end of the slide rod 55. A power assembly 6 is fixedly installed on one side of the connecting frame 51. The power assembly 6 includes a motor 61 and a gear 62. The motor 61 is fixedly installed on one side of the connecting frame 51. The gear 62 is fixedly connected to the output end of the motor 61. The gear 62 is meshed with the gear 53. There are two slide rods 55, and the two slide rods 55 are arranged opposite each other.

[0036] In this embodiment, the chip is first placed on the top of the transmission belt 2, then the motor 61 is started to drive the gear 3 62 to rotate, then the gear 3 62 drives the 63 to rotate, and then the bidirectional threaded rod 52 drives the moving plate 54 to slide on one side of the rectangular plate 56 through the slide rod 55, so that the centering plate 57 can perform the centering work on the chip, and the centering is simple and convenient.

[0037] Reference Figures 1 to 4 In one aspect of this embodiment, the detection component 4 includes a mounting frame 41, which is fixedly mounted on the top of the workbench 1. An industrial camera 42 is fixedly mounted on the top of the mounting frame 41. A transmission belt 2 is provided on the top of the workbench 1, and the transmission belt 2 is located directly below the detection component 4 and the flipping component 3.

[0038] In this embodiment, turning on the industrial camera 42 allows for chip inspection, and any defects can be detected in a timely manner.

[0039] Working principle: First, the chip is placed on the top of the transmission belt 2. Then, the motor 61 is started to drive the gear 3 62 to rotate. Then, the gear 3 62 drives the 63 to rotate. Then, the bidirectional threaded rod 52 drives the moving plate 54 to slide on one side of the rectangular plate 56 through the slide rod 55, so that the centering plate 57 can center the chip.

[0040] Then, the electric slide rail 38 is activated to clamp the chip via the clamping plate 39. Then, the dual-axis cylinder 31 is activated to drive the moving frame 32 to rise. Then, the industrial camera 42 is turned on to inspect the chip. Then, the electric push rod 33 is activated to drive the toothed plate 34 to move, so that the toothed plate 34 can drive the gear 36 to rotate, so that the rotating shaft 35 can drive the rotating frame 37 to rotate 180 degrees, so that the industrial camera 42 can inspect the other side of the chip.

[0041] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0042] Although embodiments of this application have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A sampling inspection machine for chip manufacturing, comprising a worktable (1), characterized in that: A tilting assembly (3) is fixedly installed on the top of the workbench (1). The tilting assembly (3) includes a dual-axis cylinder (31) and a moving frame (32). The dual-axis cylinder (31) is fixedly installed on one side of the workbench (1). The moving frame (32) is fixedly connected to the output end of the dual-axis cylinder (31). An electric push rod (33) is fixedly installed on the top of the moving frame (32). A toothed plate (34) is fixedly connected to the output end of the electric push rod (33). A rotating shaft (35) is connected to one side of the workbench (32) via a bearing. A gear (36) is fixedly connected to the side wall of the rotating shaft (35). The gear (36) meshes with the gear plate (34). A rotating frame (37) is fixedly connected to one end of the rotating shaft (35). An electric slide rail (38) is provided on one side of the rotating frame (37). A clamping plate (39) is slidably connected to one side of the electric slide rail (38). A detection component (4) is fixedly installed on the top of the workbench (1).

2. The sampling inspection machine for chip manufacturing according to claim 1, characterized in that: A centering assembly (5) is provided on one side of the workbench (1). The centering assembly (5) includes a connecting frame (51) and a bidirectional threaded rod (52). The connecting frame (51) is fixedly installed at the bottom of the workbench (1). The bidirectional threaded rod (52) is connected to the inner side wall of the connecting frame (51) through a bearing. A gear (53) is fixedly connected to the side wall of the bidirectional threaded rod (52). A movable plate (54) is threadedly connected to the side wall of the bidirectional threaded rod (52). The movable plate (54) is slidably connected to the workbench (1). A slide rod (55) is fixedly installed on one side of the movable plate (54). A rectangular plate (56) is fixedly installed on the top of the workbench (1). The slide rod (55) is slidably connected to the rectangular plate (56). A centering plate (57) is fixedly connected to one end of the slide rod (55). A power assembly (6) is fixedly installed on one side of the connecting frame (51).

3. The sampling inspection machine for chip manufacturing according to claim 2, characterized in that: The number of the slide bars (55) is two, and the two slide bars (55) are arranged opposite to each other.

4. A sampling inspection machine for chip manufacturing according to claim 2, characterized in that: The power assembly (6) includes a motor (61) and a gear three (62). The motor (61) is fixedly installed on one side of the connecting frame (51). The gear three (62) is fixedly connected to the output end of the motor (61). The gear three (62) is meshed with the gear two (53).

5. A sampling inspection machine for chip manufacturing according to claim 1, characterized in that: The detection component (4) includes a mounting bracket (41), which is fixedly installed on the top of the workbench (1), and an industrial camera (42) is fixedly installed on the top of the mounting bracket (41).

6. A sampling inspection machine for chip manufacturing according to claim 1, characterized in that: A transmission belt (2) is provided on the top of the workbench (1), and the transmission belt (2) is located directly below the detection component (4) and the flipping component (3).

7. A sampling inspection machine for chip manufacturing according to claim 1, characterized in that: The flipping assembly (3) also includes a pad (310) disposed on one side of the clamp (39).

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