Remaining life diagnosis control device of inverter, elevator system, and remaining life diagnosis method of inverter

Abstract

To provide a remaining life diagnostic control device on an inverter device capable of reducing the load on an elevator by a small amount and capable of improving remaining life estimation accuracy by measuring power semiconductor element temperature for each elevator run and by diagnosing a real time life diagnosis based on a simple calculation.SOLUTION: A remaining life diagnostic control device of an inverter measures the temperature of a power semiconductor element, presets the reference temperature difference for converting the temperature difference before and after temperature rise of the power semiconductor element generated during the elevator running to a constant value, calculates the remaining life of the power semiconductor element from the power cycle resistance curve, converts the power cycle number at the temperature difference during actual elevator operations to the power cycle number at the temperature difference reference value from the ratio of the power cycle life calculated during the actual elevator operations and the power cycle life at the set temperature difference reference value, accumulates the power cycle number based on the temperature difference reference value each time the elevator runs, stores the power cycles number accumulated in one year, assumes the estimated power cycle number in the next year, and calculates the remaining life from the accumulated power cycle accumulation value and from the calculated estimation power cycle number in the next year.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] Embodiments of the present invention relate to a remaining life diagnosis control device for an inverter device, an elevator system, and a method for diagnosing the remaining life of an inverter device.

Background Art

[0002] An inverter device for driving and controlling an electric motor is used in an elevator. Since the usage environment and conditions of the inverter device in a conventional elevator differ for each elevator, life prediction is not performed, and the replacement cycle is considered based on the manufacturer's guaranteed values and operating records of the components constituting the inverter device.

[0003] However, the power semiconductor elements of an elevator may be thermally deteriorated and damaged before replacement due to differences in the usage environment.

[0004] Conventionally, as a life prediction of an elevator inverter device, for example, there is an example in which a life curve is derived from the predicted operation amount of the elevator and the measured temperature value of the power semiconductor element, and the life consumption for each period is predicted.

[0005] Also, as a life prediction of a general inverter device, based on the output frequency command value and the output current value for the power semiconductor element, the peak value when the junction temperature of the power semiconductor element rises and the peak value when it falls are calculated, and the ratio to the power cycle tolerance curve is calculated for life prediction. In this example, the life is predicted based on the thermal deterioration of the solder under the silicon chip of the power semiconductor element.

Prior Art Documents

Patent Documents

[0006]

Patent Document 1

Patent Document 2

Summary of the Invention

Problems to be Solved by the Invention

[0007] However, in the conventional example where the temperature change is predicted from the predicted operation amount during a certain period of the elevator and the life curve for each period is calculated, if the errors between the predicted and measured operation amounts occurring within the period accumulate, there is a possibility that a deviation will occur in the calculated life curve. In addition, a complex model must be used for predicting the operation amount, which causes a problem of increased complexity in processing.

[0008] Further, in the conventional example where the life is predicted based on the thermal degradation of the solder under the silicon chip of the power semiconductor device, the temperature change of the solder under the silicon chip is very fast, and the difference ΔTj between the peak of the temperature difference and the peak of the temperature drop can be calculated in one cycle from the thermal resistance and loss. However, the temperature change of the solder under the insulating substrate of the power semiconductor device takes a relatively long time, and there are many uncertain factors due to degradation such as the thermal time constant, making the calculation difficult.

[0009] The present invention has been made in view of such problems, and for the life of the power semiconductor device due to the degradation of the solder under the insulating substrate, the temperature of the power semiconductor device is measured for each run of the elevator, and real-time life diagnosis is performed by simple calculation, so that the load on the elevator is small and the prediction accuracy of the remaining life is improved. The present invention proposes a remaining life diagnosis control device for an inverter device, an elevator system, and a method for diagnosing the remaining life of an inverter device.

Means for Solving the Problems

[0010] An embodiment for solving the above problems is a remaining life diagnosis control device for an inverter device in an elevator including a rotating machine driven by an inverter device equipped with a power semiconductor device, comprising a temperature difference reference value setting unit, a power cycle life calculation unit, a power cycle number conversion unit, a power cycle number integration unit, a power cycle number storage unit, and a remaining life diagnosis unit.

[0011] The temperature difference reference value setting unit presets a reference temperature difference for converting the temperature difference before and after the temperature rise of the power semiconductor element generated during elevator operation into a fixed value.

[0012] The power cycle life calculation unit calculates the remaining life of the power semiconductor element from the temperature difference of the power semiconductor element during elevator operation measured by a temperature measurement unit that measures the temperature of the power semiconductor element, and a power cycle tolerance curve representing the relationship between the temperature difference of the power semiconductor element and the number of power cycles.

[0013] The power cycle number conversion unit converts the number of power cycles at the temperature difference of actual operation into the number of power cycles at the temperature difference reference value from the ratio between the power cycle life during actual operation calculated by the power cycle life calculation unit and the power cycle life at the temperature difference reference value set by the temperature difference reference value setting unit.

[0014] The power cycle number integration unit integrates the number of power cycles based on the temperature difference reference value each time the elevator runs.

[0015] The power cycle number storage unit stores the number of power cycles integrated by the power cycle number integration unit for a predetermined number of years (one year) and assumes it as the estimated number of power cycles for the next year.

[0016] The remaining life diagnosis unit calculates the remaining life from the integrated value of the power cycle number integrated by the power cycle number integration unit and the estimated number of power cycles for the next year calculated by the power cycle number storage unit.

Brief Description of Drawings

[0017]

Figure 1

Figure 2

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Figure 5B

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Figure 9A

Figure 9B

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Figure 11

Mode for Carrying Out the Invention

[0018] <First Embodiment> FIG. 1 shows a block diagram showing the configuration of an elevator system 1A according to the first embodiment.

[0019] As shown in FIG. 1, in the elevator control panel 20A in the elevator system 1A of the first embodiment, a three-phase AC power supply 10 is supplied, and the hoist 30 is driven and controlled. The elevator control panel 20A includes an inverter device 40 and a remaining life diagnosis control device 50A.

[0020] The inverter device 40 includes a converter section 41, a smoothing capacitor 42, an inverter section 43, and a temperature measurement section 44.

[0021] First, the power semiconductor element 60 that is the object of remaining life diagnosis in the embodiment of the present invention will be described with reference to FIG. 2.

[0022] As shown in FIG. 2, the power semiconductor device 60 that constitutes the inverter unit 43 includes a copper base 61, an insulating substrate 62, an under-insulating-substrate solder 63, a silicon chip 64, an under-silicon-chip solder 65, and an aluminum wire 66. The copper base 61 serves as the base body of the power semiconductor device 60 and is joined to the insulating substrate 62 via the under-insulating-substrate solder 63. Similarly, the insulating substrate 62 is joined to the silicon chip 64 via the under-silicon-chip solder 65. When the power semiconductor device 60 switches, losses occur, and when the silicon chip 64 generates heat, the heat is dissipated to the under-silicon-chip solder 65, the insulating substrate 62, the under-insulating-substrate solder 63, and the copper base 61. The temperature measurement unit 44 measures the temperature on the side surface of the copper base 61. The temperature measurement value is output from the temperature measurement unit 44 to the remaining life diagnosis control device 50A.

[0023] The remaining life diagnosis control device 50A includes a power cycle life calculation unit 51, a power cycle number conversion unit 52, a power cycle number integration unit 53, a remaining life diagnosis unit 54, a temperature difference reference value setting unit 55, a power cycle number storage unit 56, and an elevator control unit 57.

[0024] The power cycle life calculation unit 51 calculates the remaining life of the power semiconductor device 60 from the temperature difference before and after the temperature rise of the power semiconductor device 60 during elevator operation measured by the temperature measurement unit 44 that measures the temperature of the power semiconductor device 60 and the power cycle tolerance curve representing the relationship between the temperature difference of the power semiconductor device 60 and the number of power cycles.

[0025] The power cycle number conversion unit 52 converts the number of power cycles at the temperature difference of the actual operation to the number of power cycles at the temperature difference reference value from the ratio between the power cycle life during actual operation calculated by the power cycle life calculation unit 51 and the power cycle life at the temperature difference reference value set by the temperature difference reference value setting unit 55.

[0026] The power cycle number integration unit 53 integrates the number of power cycles based on the temperature difference reference value each time the elevator runs.

[0027] The remaining life diagnosis unit 54 calculates the remaining life based on the power cycle integrated value integrated by the power cycle number integration unit 53 and the estimated power cycle number for the following year calculated by the power cycle number storage unit 56.

[0028] The temperature difference reference value setting unit 55 presets a reference temperature difference for converting the temperature difference of the power semiconductor element generated during elevator operation into a constant value.

[0029] The power cycle number storage unit 56 stores the power cycle number integrated by the power cycle number integration unit 53 for a predetermined number of years (one year) and assumes it as the estimated power cycle number for the following year.

[0030] The elevator control unit 57 controls the elevator in cooperation with the elevator control panel 20A and the remaining life diagnosis control device 50A.

[0031] The curve shown in FIG. 3 is an example of the power cycle tolerance curve specific to the power semiconductor element 60. The power cycle tolerance curve represents the relationship between the repeatedly occurring power cycles and the temperature difference ΔT before and after the temperature rise of the power semiconductor element 60, and indicates the available power cycle life. This power cycle tolerance curve can be expressed by the following formula.

[0032] PC.LIFE(ΔT)=A×ΔT -B Here, PC.LIFE is the power cycle life, ΔT is the temperature difference, and A and B are coefficients.

[0033] FIG. 4 is a flowchart showing the operation of the first embodiment of the present invention.

[0034] Before starting the elevator operation, the temperature difference reference value setting unit 55 sets a temperature difference reference value ΔT0 (S1). Since there is variation in the temperature difference generated during elevator operation, this temperature difference reference value ΔT0 serves as a reference value for converting the temperature difference to a constant value. After the elevator operation starts, the temperature measurement unit 44 measures the temperature difference ΔT of the power semiconductor element 60 that occurs when the elevator travels from a stopped state (S2). Next, the power cycle life calculation unit 51 calculates the power cycle life of the temperature difference ΔT and the power cycle life of the temperature difference reference value ΔT0 from the power cycle tolerance curve shown in FIG. 3 (S3).

[0035] Thereafter, the power cycle number conversion unit 52 compares the power cycle life of the temperature difference ΔT and the power cycle life of the temperature difference reference value ΔT0 (S4). Then, the power cycle number of the temperature difference ΔT is converted to the power cycle number of the temperature difference reference value ΔT0 (S5). This conversion is performed by substituting the temperature difference ΔT and the temperature difference reference value ΔT0 into the equation of the power cycle tolerance curve, calculating the ratio of the power cycle lives PC.LIFE(ΔT0) / PC.LIFE(ΔT), and converting this ratio to the power cycle number obtained by converting one cycle of ΔT to the temperature difference reference value ΔT0.

[0036] For example, when the equation of the power cycle tolerance curve of the power semiconductor element 60 is PC.LIFE(ΔT)=3×10^8×ΔT -2.721 and ΔT0 = 10K, ΔT = 8K, the power cycle life of the temperature difference reference value ΔT0 is 570,323 cycles, the power cycle life of the temperature difference ΔT is 1,046,678 cycles, and the ratio of the power cycle lives PC.LIFE(ΔT0) / PC.LIFE(ΔT) is 0.5445. Therefore, when an elevator with a temperature difference reference value ΔT0 set to 10K generates a temperature difference of 8K during travel, life diagnosis is performed as 0.5445 cycles.

[0037] Next, the power cycle number integration unit 53 integrates the power cycle number of the temperature difference reference value ΔT0 calculated each time the elevator runs (S6), and the remaining life diagnosis unit 54 calculates the remaining cycle number with respect to the power cycle life of the temperature difference reference value ΔT0 of the integrated power cycle number from the power cycle endurance curve (S7).

[0038] FIG. 5A and FIG. 5B graphically show the processes from step S3 to step S7.

[0039] At the same time, the power cycle number storage unit 56 stores the power cycle number for one year (S8) and sets it as the estimated power cycle number for the next year (S9).

[0040] The remaining life diagnosis unit 54 diagnoses the remaining life years of the power semiconductor element 60 from the remaining cycle number with respect to the power cycle life calculated and the predicted estimated power cycle number for the next year (S10).

[0041] For example, assume that the temperature difference reference value ΔT0 is 10K, the integrated power cycle number is 300,000 cycles, and the power cycle life is 570,323 cycles. In this case, the remaining power cycle number is 570,323 - 300,000 = 270,323 cycles. When the estimated power cycle number for the next year is 38,000 cycles, the remaining life years are approximately 7 years by 270,323 / 38,000.

[0042] If the inverter device 40 is not replaced (NO in S11), this remaining life diagnosis is performed for each run to monitor the remaining life in real time. If the inverter device 40 is replaced (YES in S11), the data integrated and stored at the time of replacement is reset (S12), and the process ends.

[0043] As described above, according to the first embodiment, by converting the temperature difference for each run into a preset temperature difference, the varying temperature differences are unified, and the accuracy of the remaining life diagnosis of the inverter device 40 can be improved by the real-time life diagnosis of integrating the power cycle number and the prediction of the estimated power cycle number updated annually.

[0044] <Second Embodiment> Next, the remaining life diagnosis of the inverter device 40 according to the second embodiment will be described. Since the configuration of the elevator system in the second embodiment is the same as that in FIG. 1, the illustration thereof is omitted.

[0045] FIG. 6 shows a flowchart showing the operation of the second embodiment. The basic operation is the same as that of the first embodiment, but the method of setting the temperature difference reference value is different, and the temperature difference reference value is set by a test run, which is a feature.

[0046] For the remaining life diagnosis of the inverter device 40 according to the second embodiment, a test run is performed from the top floor to the bottom floor in the down operation with no load in the car under the condition where the inverter device 40 is most loaded immediately after the elevator is installed (S13), and the temperature difference of the power semiconductor element 60 generated during the test run is measured by the temperature measurement unit 44 (S14). Since the temperature difference at this time is the temperature difference at the maximum load, it is the maximum value of the temperature difference generated in one run. The measured temperature difference of the test run is set as the temperature difference reference value ΔT0 by the temperature difference reference value setting unit 55 (S15).

[0047] Thus, according to the second embodiment, by measuring the temperature difference at the maximum load of the inverter device 40 at the time of elevator installation and setting the temperature difference reference value to the maximum value, it is possible to predict the remaining life when the temperature difference is the maximum value. Therefore, the maximum value of the temperature difference of each elevator can be known, and the actual value of how many times the run with the maximum temperature difference can be performed can be estimated.

[0048] <Third Embodiment> Next, the remaining life diagnosis of the inverter device 40 according to the third embodiment will be described. FIG. 7 shows a block diagram showing the configuration of the elevator system 1B according to the third embodiment. In FIG. 7, the description of the same parts as those in the first embodiment is omitted.

[0049] As shown in FIG. 7, in addition to the remaining life diagnosis control device 50A of the first embodiment, the remaining life diagnosis control device 50B of the third embodiment further includes a replacement recommended alarm reporting unit 58 and a life extension operation condition determination unit 59.

[0050] The replacement recommended alarm reporting unit 58 reports an alarm recommending replacement of the inverter device 40 when the remaining life of the inverter device 40 reaches a preset remaining life.

[0051] The life extension operation condition determination unit 59 automatically sets the running condition of the elevator by performing a test run while reducing the running speed of the elevator so that the maximum value of the temperature difference during elevator running becomes a temperature difference that can satisfy the remaining life after life extension, issues a command for life extension operation to the elevator control unit 57, and switches to life extension operation.

[0052] FIG. 8 is a flowchart showing the operation of the third embodiment. The basic operation is the same as that of the first embodiment, but it is different from the first embodiment in that when the inverter device 40 is not replaced when the remaining life of the inverter device 40 reaches a preset remaining life, the life extension operation of the elevator is performed.

[0053] Specifically, after the remaining life diagnosis of the first embodiment, if the remaining life of the power semiconductor element 60 has not reached the remaining life for which a preset alarm is reported (NO in S16), the remaining life diagnosis is repeated. When the remaining life of the power semiconductor element 60 reaches the number of years for which a preset alarm is reported (YES in S16), the replacement recommended alarm reporting unit 58 reports an alarm recommending replacement of the inverter device 40 (S17). When the inverter device 40 is not replaced (NO in S11), it automatically shifts to life extension operation after an arbitrarily set time has elapsed.

[0054] When shifting to life extension operation, the life extension operation condition determination unit 59 re-sets the remaining life after life extension (S18), and determines the temperature difference reference value ΔTe that can satisfy the remaining life after life extension from the power cycle tolerance curve (S19).

[0055] For example, the equation of the power cycle endurance curve of the power semiconductor device 60 is PC.LIFE(ΔT) = 3×10^8×ΔT -2.721 When the number of years of remaining life for which an alarm is issued in advance is set to 1 year, and the temperature difference reference value ΔT0 is 10 K, the power cycle life is 570,323 cycles. If the estimated number of power cycles per year is 38,000 cycles, the integrated number of power cycles when the remaining life is 1 year is 532,323 cycles, which is about 93% of the power cycle life. When the remaining life after life extension is set to 3 years, in a state where the number of power cycles of the temperature difference reference value ΔTe after life extension is integrated up to 93% of the power cycle life of the temperature difference reference value ΔT0, the temperature difference at which the remaining number of cycles is 114,000 cycles or more is 6 K. Therefore, the temperature difference reference value ΔTe after life extension is set to 6 K.

[0056] Next, in order to determine the running conditions of the elevator that satisfy the temperature difference reference value ΔTe after life extension, several test runs from the lowest floor to the highest floor are performed, and the running speed of the elevator is gradually decreased to determine the speed at which the temperature difference reference value ΔTe is achieved (S20).

[0057] FIG. 9A and FIG. 9B graphically show the processes of steps S19 and S20.

[0058] After determining the life extension operation conditions, a command for switching to the life extension operation is issued to the elevator control unit 57, and real-time life diagnosis is performed with the same control as before the life extension operation (S21). If the remaining life has not reached the remaining life set during the life extension operation (NO in S22), real-time life diagnosis is repeated. If the remaining life has reached the remaining life set during the life extension operation (YES in S22), the replacement recommendation alarm reporting unit 58 issues an alarm recommending replacement of the inverter device 40 (S17).

[0059] After issuing the replacement recommendation alarm, if the inverter device 40 is replaced (YES in S11), the data stored at the time of replacement is reset (S12), and the operation is switched from the life extension operation to the normal operation and terminated.

[0060] Thus, according to the third embodiment, by performing the life extension operation when the inverter device 40 is not replaced, it is possible to delay the life breakage of the inverter device 40. In addition, it is possible to increase the options for selecting the replacement priority of the inverter device 40 in each property.

[0061] <Fourth Embodiment> Next, the remaining life diagnosis of the inverter device 40 according to the fourth embodiment will be described. FIG. 10 shows the configuration of the fourth embodiment. FIG. 11 shows a flowchart of the operation of the fourth embodiment. In FIG. 10, the description of the same components as those in the first embodiment will be omitted.

[0062] The elevator system 1C that executes the remaining life diagnosis of the inverter device 40 shown in FIG. 10 assumes a case of two or more cars, and includes a remaining life comparison unit 71 and a call priority car determination unit 72 outside the other car control panel 80 and the elevator control panel. Note that the remaining life diagnosis control device 50C of the fourth embodiment is different from the remaining life diagnosis control device 50B of the third embodiment in that the remaining life diagnosis result of the remaining life diagnosis unit 54 is also output to the remaining life comparison unit 71.

[0063] The remaining life comparison unit 71 inputs the remaining life diagnosis results of the other car control panels 80 in the case of the operation control of a plurality of cars, and compares the remaining lives of the inverter devices 40 of each car.

[0064] The call priority car determination unit 72 preferentially operates the car with a longer remaining life for each call to the floors, and adjusts the remaining lives of the inverter devices of each car.

[0065] FIG. 11 is a flowchart showing the operation of the fourth embodiment. The basic operation is the same as that of the first embodiment, but it is different from the first embodiment in that when the inverter device 40 is not replaced when the remaining life of the inverter device 40 reaches the preset remaining life, the elevator of the other car with a longer remaining life is preferentially operated to perform the life extension operation.

[0066] Specifically, after the remaining life diagnosis of the first embodiment, if the remaining life of the power semiconductor device 60 is not the preset remaining life (NO in S16), the remaining life diagnosis is repeated. When the remaining life of the power semiconductor device 60 reaches the preset remaining life (YES in S16), without replacing the inverter device 40 (NO in S11), after a certain period of time has elapsed, the remaining life comparison unit 71 compares the remaining lives of the inverter devices 40 of each unit (S23). As a result of comparing the remaining lives of each unit, the unit with the longest remaining life is preferentially operated for each floor call (S24).

[0067] For example, if the nearest unit to each floor call operates before the remaining life comparison, after the remaining life comparison, if the units with a longer remaining life on the upper and lower two floors are stopped for each floor call, they are preferentially operated. At this time, even if there are units with a shorter remaining life on the upper and lower one floors, the units with a shorter remaining life are not operated, and the units with a longer remaining life are preferentially operated.

[0068] After determining the unit to be prioritized for each unit, real-time life diagnosis is performed with the same control as before the life extension operation (S25). If the remaining life of the unit that is preferentially operating has not reached the set remaining life (NO in S26), the real-time life diagnosis is repeated. When the remaining life of the unit that is preferentially operating reaches the set remaining life (YES in S26), if the inverter device 40 is not replaced (NO in S11), the remaining lives of each unit are compared again. When the inverter device 40 is replaced (YES in S11), the data stored at the time of replacement is reset (S12) and the process ends.

[0069] Thus, according to the fourth embodiment, by comparing the remaining lives of two or more properties and preferentially operating the unit with the longer remaining life, it is possible to delay the life breakage of the inverter device 40 of the unit with the shorter remaining life, and since the remaining lives of each unit can be adjusted equally, the inverter devices 40 can be replaced simultaneously.

[0070] As described above, some embodiments of the present invention have been explained. However, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the gist of the invention. These embodiments and their modifications are included in the scope and gist of the invention, and are also included in the invention described in the claims and the equivalent scope thereof.

Explanation of Signs

[0071] 1A, 1B, 1C... elevator system, 10... three-phase AC power supply, 20A, 20B, 20C... elevator control panel, 30... hoist, 40... inverter device, 41... converter section, 42... smoothing capacitor, 43... inverter section, 44... temperature measurement section, 50A, 50B, 50C... remaining life diagnosis control device, 51... power cycle life calculation section, 52... power cycle number conversion section, 53... power cycle number integration section, 54... remaining life diagnosis section, 55... temperature difference reference value setting section, 56... power cycle number storage section, 57... elevator control section, 58... replacement recommendation alarm reporting section, 59... extended life operation condition determination section, 60... power semiconductor element, 61... copper base, 62... insulating substrate, 63... underfill solder of insulating substrate, 64... silicon chip, 65... underfill solder of silicon chip, 66... aluminum wire, 71... remaining life comparison section, 72... call priority number machine determination section, 80... control panel of other machines

Claims

1. A remaining life diagnosis control device for an inverter device in an elevator equipped with a rotating machine driven by an inverter device mounted with a power semiconductor element, comprising a temperature difference reference value setting unit, a power cycle life calculation unit, a power cycle number conversion unit, a power cycle number integration unit, a power cycle number storage unit, and a remaining life diagnosis unit, The temperature difference reference value setting unit presets a temperature difference serving as a reference for converting the temperature difference before and after the temperature rise of the power semiconductor element generated during elevator travel into a constant value, The power cycle life calculation unit calculates the remaining life of the power semiconductor element from the temperature difference of the power semiconductor element during elevator travel measured by a temperature measurement unit that measures the temperature of the power semiconductor element and a power cycle tolerance curve representing the relationship between the temperature difference of the power semiconductor element and the number of power cycles, The power cycle number conversion unit converts the number of power cycles at the temperature difference during actual operation into the number of power cycles at the temperature difference reference value from the ratio between the power cycle life during actual operation calculated by the power cycle life calculation unit and the power cycle life at the temperature difference reference value set by the temperature difference reference value setting unit, The power cycle number integration unit integrates the number of power cycles based on the temperature difference reference value each time the elevator travels, The power cycle number storage unit stores the number of power cycles integrated by the power cycle number integration unit for a predetermined number of years (one year), and assumes it as the estimated number of power cycles for the next year, The remaining life diagnosis unit calculates the remaining life from the power cycle integrated value integrated by the power cycle number integration unit and the estimated number of power cycles for the next year calculated by the power cycle number storage unit. A remaining life diagnosis control device for an inverter device.

2. The temperature difference reference value setting unit acquires the temperature difference when a test run is performed during elevator installation, and sets the acquired temperature difference as the temperature difference reference value. The remaining life diagnosis control device for an inverter device according to claim 1.

3. Further comprising an exchange recommendation alarm reporting unit and a life extension operation condition determination unit, The exchange recommendation alarm reporting unit reports an alarm recommending the replacement of the inverter device when the remaining life of the inverter device reaches a preset remaining life, The life extension operation condition determination unit automatically sets the running conditions of the elevator by performing a test run while reducing the running speed of the elevator so that the maximum value of the temperature difference during elevator running becomes a temperature difference that can satisfy the remaining life after life extension, issues a command for life extension operation to the elevator control unit, and switches to life extension operation. The remaining life diagnosis control device for an inverter device according to claim 1.

4. An elevator system having a remaining life comparison unit that inputs the remaining life diagnosis result from the remaining life diagnosis unit according to claim 1 and the remaining life diagnosis result of the inverter device from the elevator control panel of another machine, and a call priority machine determination unit, The remaining life comparison unit compares the remaining lives of the inverter devices of each machine in the case of operation control of multiple machines, The call priority machine determination unit preferentially operates the machine with the longer remaining life for each call to each floor and adjusts the remaining life of the inverter device of each machine.

5. A remaining life diagnosis method in a remaining life diagnosis control device for diagnosing the remaining life of an inverter device equipped with a power semiconductor element driven by a three-phase AC power supply, Measuring the temperature of the power semiconductor element, Presetting a reference temperature difference for converting the temperature difference before and after the temperature rise of the power semiconductor element generated during elevator running into a constant value, Calculating the remaining life of the power semiconductor element from a power cycle tolerance curve representing the relationship between the measured temperature difference of the power semiconductor element during elevator running and the number of power cycles with respect to the temperature difference of the power semiconductor element, Converting the number of power cycles at the actual running temperature difference to the number of power cycles at the temperature difference reference value from the ratio of the power cycle life during actual running calculated and the power cycle life at the set temperature difference reference value, The elevator accumulates the number of power cycles based on the temperature difference reference value each time it runs, stores the accumulated number of power cycles for one year, assumes it as the estimated number of power cycles for the next year, A method for diagnosing the remaining life of an inverter device used in an elevator, which calculates the remaining life from the accumulated value of the power cycle integration and the estimated number of power cycles for the next year calculated.

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