Machining parameter determination method, machining device and system, and medium

Abstract

The present disclosure relates to the technical field of machining device control. Provided are a machining parameter determination method, a machining device and system, and a medium. The machining parameter determination method comprises: acquiring a machining area image corresponding to a work platform of a machining device, wherein the machining area image comprises a material to be machined; identifying the machining area image, and determining the material type of said material; and performing matching on the basis of the material type, so as to obtain a machining parameter group of said material. In this way, the technical problem of the machining effect being poor due to the fact that the degree of matching between machining parameters and materials is low is solved, and the technical effect of automatically recommending a machining parameter group on the basis of materials is achieved.

Description

Processing parameter determination method, processing equipment, system and medium

[0001] Related applications

[0002] The present disclosure claims priority to Chinese patent application No. 202411971530.0 filed on December 30, 2024, entitled “Method for determining processing parameters, processing equipment, system and medium”, priority to Chinese patent application No. 202410221268.1 filed on February 28, 2024, entitled “Equipment management method, control device and intelligent device”, priority to Chinese patent application No. 202411146500.6 filed on August 20, 2024, entitled “Data processing method, equipment, system and medium based on processing equipment”, and priority to Chinese patent application No. 202510540893.7 filed on April 27, 2025, entitled “Method for determining processing parameters, processing equipment, system, medium and program product”. The entire contents of the above Chinese patent applications are incorporated herein by reference in their entirety. Technical Field

[0003] The present application relates to the technical field of processing equipment control, and in particular to a method for determining processing parameters, processing equipment, system, and medium. Background Art

[0004] In existing technology, users of laser processing equipment must rely on previous experience or consult the equipment manual to determine the processing parameters for a specific type of material, and then manually set the processing parameters on the processing equipment. This current technical solution easily leads to a poor match between the processing parameters and the material, resulting in poor processing results. Summary of the Invention

[0005] The main purpose of this application is to provide a method for determining processing parameters, processing equipment, system and medium, aiming to solve the technical problem of low matching between processing parameters and materials, which leads to poor processing results.

[0006] To achieve the above objectives, the present application provides a method for determining processing parameters, the method comprising:

[0007] Acquire a processing width image corresponding to a supporting platform of a processing device, wherein the processing width image includes a material to be processed;

[0008] The processing format image is identified, and processing parameters of the material to be processed are determined.

[0009] In addition, to achieve the above-mentioned purpose, the present application also provides a processing equipment, which includes: a slide rail; a processing head, which is slidably set on the slide rail; a communication component, which is used to receive an execution control instruction generated by the processing parameters identified according to the method described in any one of the above items; and a controller, which controls the processing head to move on the slide rail for processing based on the received execution control instruction.

[0010] In addition, to achieve the above objectives, the present application also provides a processing system, comprising:

[0011] At least one processor; at least one non-transitory computer-readable medium; the at least one non-transitory computer-readable medium stores program instructions, which can be executed by at least one processor, so that the computing system is configured to perform the method for determining the processing parameters as described in any one of the above items.

[0012] In addition, to achieve the above-mentioned purpose, the present application also provides a storage medium, which is a computer-readable storage medium, and the computer-readable storage medium stores a program for implementing the method for determining processing parameters. The program for implementing the method for determining processing parameters is executed by a processor to implement the steps of the method for determining processing parameters as described above.

[0013] This application provides a method for determining processing parameters. This method obtains a processing width image corresponding to a processing equipment carrier, wherein the processing width image includes a material to be processed; identifies the processing width image, and determines the processing parameters of the material to be processed. Automatic recognition processing can be performed based on the processing width image to automatically obtain a corresponding processing parameter set. Without requiring manual user operation, accurate processing parameters matching the material to be processed can be obtained. This not only solves the problem of poor processing results caused by a poor match between processing parameters and materials, but also, because the process of obtaining processing parameters does not require user operation, improves the efficiency of obtaining processing parameters, thereby improving processing efficiency and achieving the technical effect of automatically recommending processing parameters based on the material. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0015] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0016] FIG1 is a schematic diagram of a process flow provided in an embodiment of a method for determining processing parameters of the present application;

[0017] FIG2 is a schematic diagram of obtaining a processing width image in an embodiment of a method for determining processing parameters of the present application;

[0018] FIG3 is a schematic diagram of obtaining a material type by identifying label information in an embodiment of a method for determining processing parameters of the present application;

[0019] FIG4 is a schematic diagram showing candidate material types in an embodiment of a method for determining processing parameters of the present application;

[0020] FIG5 is a schematic diagram of a material list control in an embodiment of a method for determining processing parameters of the present application;

[0021] FIG6 is a schematic diagram of intelligent recognition in an embodiment of a method for determining processing parameters of the present application;

[0022] FIG7 is a schematic diagram of a material list control displaying candidate material types in an embodiment of a method for determining processing parameters of the present application;

[0023] FIG8 is a schematic diagram showing a processing parameter array and a processing parameter group after identifying the material type in an embodiment of a method for determining processing parameters of the present application;

[0024] FIG9 is a simplified flow chart of the method for determining processing parameters of the present application;

[0025] FIG10 is a schematic diagram of a processing device according to an embodiment of the present application;

[0026] FIG11 is a schematic diagram of a processing system according to an embodiment of the present application;

[0027] FIG12 is a schematic diagram of the hardware structure of a terminal device in an embodiment of the present application;

[0028] FIG13 is a schematic diagram of a process flow diagram provided in Example 3 of the processing method of the present application;

[0029] FIG14 is a schematic diagram of a process flow diagram provided in Example 4 of the processing method of the present application;

[0030] FIG15 is an example diagram of a processing parameter array according to an embodiment of the present application;

[0031] FIG16 is another example diagram of a processing parameter array according to an embodiment of the present application;

[0032] FIG17 is a schematic diagram of an interface of a hovering operation scenario according to an embodiment of the present application;

[0033] FIG18 is a schematic diagram of an interactive interface according to an embodiment of the present application;

[0034] FIG19 is a schematic diagram of a process flow diagram of a fifth embodiment of the processing method of the present application;

[0035] FIG20 is another schematic diagram of an interactive interface according to an embodiment of the present application;

[0036] FIG21 is another schematic diagram of an interactive interface according to an embodiment of the present application;

[0037] FIG22 is a schematic diagram of an exemplary implementation environment of the present application;

[0038] FIG23 is a flow chart of a data processing method based on processing equipment shown in an exemplary embodiment of the present application;

[0039] FIG24 is a schematic diagram of a captured image according to an exemplary embodiment of the present application;

[0040] FIG25 is a flowchart of a data processing method based on a processing device shown in another exemplary embodiment of the present application;

[0041] FIG26A is a schematic diagram of a processing interface shown in an exemplary embodiment of the present application;

[0042] 26B and 26C are schematic diagrams of a shooting interface according to an exemplary embodiment of the present application;

[0043] FIG26D is a schematic diagram of an identification processing interface according to an exemplary embodiment of the present application;

[0044] FIG26E is a schematic diagram of a parameter group selection interface according to an exemplary embodiment of the present application;

[0045] FIG27A is a schematic diagram of a first sample image shown in an exemplary embodiment of the present application;

[0046] FIG27B is a schematic diagram of a second sample image shown in an exemplary embodiment of the present application;

[0047] FIG28 is a block diagram of a data processing device based on a processing device, shown in an exemplary embodiment of the present application;

[0048] FIG29 is a schematic diagram of the structure of a computer system suitable for implementing an electronic device according to an embodiment of the present application;

[0049] FIG30 is another schematic diagram of an interactive interface shown in an exemplary embodiment of the present application.

[0050] Explanation of the accompanying figures: 10. Processing platform; 11. Processing area; 12. Camera device; 20. Processing head; 30. Laser tube; 31. Reflector; 40. Slide rail; 50. Communication component; 60. Controller; 70. Upper shell; 71. Cover plate; 80. Bottom shell; 90. Housing; 201. Processing equipment; 202. Terminal equipment.

[0051] The purpose, features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0052] It should be understood that the specific embodiments described herein are merely used to explain the technical solutions of the present application and are not intended to limit the present application.

[0053] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0054] Currently, users of laser processing equipment must rely on previous experience or consult the equipment manual to determine processing parameters for specific types of materials, and then manually set these parameters on the processing equipment. This technical solution can easily lead to a poor match between the processing parameters and the material, resulting in poor processing results.

[0055] The main solution of this application is: obtaining a processing width image corresponding to the supporting platform of the processing equipment, wherein the processing width image contains the material to be processed; identifying at least a part of the processing width image, and determining the processing parameters of the material to be processed.

[0056] This application identifies the corresponding processing format image of the processing equipment carrier, analyzes the processing format image, and then obtains the processing parameters of the material to be processed, thereby achieving the technical effect of accurately pushing the processing parameters after the user inserts the material.

[0057] Specifically, the step of identifying at least a portion of the processing format image and determining the processing parameters of the material to be processed includes: identifying the processing format image and determining the material type of the material to be processed; and obtaining the processing parameters of the material to be processed based on the material type matching.

[0058] It should be noted that the execution subject of this embodiment can be a processing system, a computing service device with data processing, network communication, and program execution capabilities, such as a tablet computer, personal computer, or mobile phone, or a processing device capable of performing the aforementioned functions, or a terminal device connected to the processing device, and this embodiment does not specifically limit this. The following uses the processing system as an example to illustrate this embodiment and the following embodiments.

[0059] Based on this, an embodiment of the present application proposes a method for determining processing parameters. Referring to FIG. 1 , the method for determining processing parameters includes steps S10 to S30:

[0060] Step S10: obtaining a processing width image corresponding to the supporting platform of the processing equipment, wherein the processing width image includes the material to be processed.

[0061] In this embodiment, the processing equipment platform is a flat surface within the processing equipment used to place the material to be processed. The processing module of the processing equipment, such as a cutting head or laser head, performs processing operations on the material to be processed on the processing equipment platform. The processing image is an image captured of the processing equipment platform. The material to be processed is placed on the processing equipment platform and includes, but is not limited to, acrylic, leather, wood, and alloy materials.

[0062] As an optional implementation, a sensor for acquiring a processing format image is placed on the processing equipment. When the processing equipment detects that the material to be processed is placed on the processing equipment carrier, or the processing equipment receives an image acquisition instruction sent by the terminal device, the sensor is called to collect the processing format image corresponding to the processing equipment carrier, which contains the complete material to be processed, and then the processing format image is sent to the terminal device.

[0063] Step S20: Identify at least a portion of the processing format image to determine the material type of the material to be processed.

[0064] In this embodiment, the material type refers to the material properties of the material to be processed. Material types include, but are not limited to, acrylic, aluminum alloy, wood, and leather. Material types can also be further refined based on the above materials. For example, wood can be further categorized into poplar, elm, oak, walnut, boxwood, red sandalwood, rosewood, mahogany, etc. Leather can be further categorized into pigskin, cowhide, sheepskin, etc.

[0065] As an optional embodiment, the material to be processed is provided with label information. The terminal device identifies the processing format image and determines the label information in the processing format image. The label information is mapped to the material type of the material to be processed, and the material type of the material to be processed is obtained by parsing the label information. Alternatively, the label information is directly mapped to the processing parameters of the material to be processed, and the processing parameters of the material to be processed are obtained by parsing the label information.

[0066] As another optional implementation, feature recognition is performed on the processing format image based on the processing format image to extract feature information of the material to be processed, and then based on the feature information, a search is performed in the feature database, and the material with a matching degree higher than a threshold in the feature database is used as the identified material type.

[0067] Step S30: obtaining processing parameters of the material to be processed based on the material type matching.

[0068] In this embodiment, the processing parameter is a combination of at least one processing parameter, including but not limited to laser power, pulse frequency, pulse width, scanning speed, spot size, defocus amount, and processing times.

[0069] As an optional implementation, based on the material type, processing parameters associated with the material type are acquired.

[0070] As an optional implementation, at least two groups of processing parameters associated with the material type are obtained, and according to a user's selection instruction for any one of the at least two groups of processing parameters, the selected processing parameters are used as the processing parameters of the material to be processed.

[0071] As an optional embodiment, multiple reference processing parameters associated with a material type are obtained, and then a processing quality parameter is determined for each reference processing parameter. The processing quality parameter refers to the processing quality of the processing result obtained by processing a processing element on the material to be processed using the reference processing parameter. Then, based on the processing quality parameter, one of the reference processing parameters is determined as the processing parameter for the material to be processed.

[0072] For example, when a user places a material to be processed, such as a walnut veneer, on the loading platform of a processing device, the processing device automatically detects the material's presence and triggers a sensor to capture an image of the processing area. The sensor quickly captures a clear image of the entire walnut veneer and transmits the image data to the terminal device via a pre-set data transmission method. The terminal device is installed with specialized image recognition software. Upon receiving the processing area image, the software first attempts to determine the material type by identifying the small QR code label pre-attached to the walnut veneer. The software uses its built-in QR code decoding function to interpret the label and quickly and accurately determine the material type as "walnut." If the label is damaged or missing, or if no label information exists on the material to be processed, the material type cannot be determined based on the label information, and the software automatically switches to image feature recognition. It performs a detailed feature analysis of the processing area image, extracting walnut's unique texture, color, gloss, and other characteristic features, and then searches and matches them against its extensive built-in feature database. After complex algorithmic calculations, materials with a matching degree of extracted features exceeding a set threshold (e.g., 90%) are identified as "walnut."

[0073] Based on the identified material type of "walnut", the terminal device immediately accesses the locally stored processing parameter database. The database stores multiple sets of processing parameters for various material types. Each set of parameters includes the specific value of at least one parameter among laser power, pulse frequency, pulse width, scanning speed, spot size, and defocus. For example, the processing parameters include laser power and scanning speed. Or the processing parameters include laser power, scanning speed and pulse frequency. The combinations of processing parameters are not enumerated one by one. For walnut, three sets of recommended processing parameters are associated with the database, which are suitable for different processing requirements such as fine engraving, fast cutting and surface etching.

[0074] After viewing a brief description of the three parameter groups on the terminal device, the user selects the appropriate processing parameter set based on the intended process, such as a finely carved walnut pendant. This parameter set (laser power 80W, scanning speed 400mm / s) is then transmitted back to the laser processing device via the pre-set data transmission method. The device automatically completes the parameter settings and is ready to begin processing.

[0075] If the user is unsure which set of parameters to select, the terminal device can also automatically obtain the processing quality parameters corresponding to the three sets of reference processing parameters. The processing quality parameters are obtained by measuring and evaluating walnut samples processed with different processing parameters. For example, the processing quality parameters are determined from aspects such as the flatness of the engraved edge, the roughness of the cut surface, and the uniformity of the etching depth. Then, according to the preset quality priority rules, such as giving priority to the parameter group with the best edge flatness, the most suitable set of processing parameters is automatically determined and applied to the laser processing equipment.

[0076] This application automatically identifies and processes the processing format image to obtain the type of material, and automatically obtains the corresponding processing parameters based on the material type. Without manual operation by the user, the processing parameters that match the material type can be accurately obtained. This not only solves the problem of poor processing effect caused by the low degree of matching between the processing parameters and the material, but also improves the efficiency of obtaining the processing parameters because the process of obtaining the processing parameters does not require user operation, thereby improving the processing efficiency and achieving the technical effect of automatically recommending processing parameters based on the material.

[0077] Based on any embodiment, in a possible embodiment of the present application, step S20 includes: identifying label information in the processed format image to determine the material type.

[0078] As an optional implementation, the material to be processed is placed in the image acquisition area of ​​the processing equipment. When the processing system starts image acquisition, an image of the processing area is obtained. The system uses image recognition algorithms to quickly scan and analyze this image, specifically targeting and accurately identifying the pre-set label information area.

[0079] This tag information uses a specific encoding format, directly presenting the material type information in plain text. For example, when the tag is detected, the system uses optical character recognition (OCR) technology to clearly read the word "oak" directly on the label, quickly and accurately determining that the material type to be processed is oak. The entire process eliminates the need for complex conversion or secondary analysis, directly obtaining critical material type information from the label, greatly improving recognition efficiency and accuracy and providing a reliable basis for subsequent matching of processing parameters.

[0080] As another optional implementation, similarly, after acquiring the processing format image, the system searches for and locates the label information in the processing format image through intelligent image recognition technology. This label information stores a string of unique identification codes that are encrypted or generated according to specific rules, such as "ABC123". After the system extracts this string of identification codes, it immediately compares and queries it with the identification-material type mapping table pre-stored in the local database. In this mapping table, each identification has a one-to-one correspondence with a specific material type. When the system finds that the material type corresponding to "ABC123" is "rosewood", the type of material to be processed is successfully determined. This method can ensure the security and accuracy of information by establishing an indirect association between identification and material type, and can flexibly manage and update material type information to adapt to different production needs and changes in material types.

[0081] In this embodiment, by identifying the label information on the material to be processed, the material type of the material to be processed is quickly obtained, thereby improving the efficiency and accuracy of obtaining the material type, thereby facilitating the rapid matching of processing parameters according to the material type, and improving processing efficiency.

[0082] Based on any of the above embodiments, in a possible embodiment of the present application, step S20 includes steps S21-S22:

[0083] Step S21 : determining characteristic information of the material to be processed based on the processing width image.

[0084] In this embodiment, label information refers to an identifier (such as a QR code, barcode, or watermark) placed on the material to be processed, used to directly or indirectly identify the material type. Feature information refers to visual or physical characteristics of the material to be processed, including but not limited to texture, color, gloss, shape, and edge characteristics, and may also include at least one of spectral characteristics and speckle characteristics.

[0085] The terminal device analyzes the processed image and extracts characteristic information about the material being processed. For example, image processing algorithms can be used to extract the material's texture characteristics (such as the growth rings of wood or the pores of leather) and color characteristics (such as the transparency of acrylic or the reflectivity of metal).

[0086] Step S22: determining the material type based on the matching degree between the feature information and the features of each material in the set material feature database.

[0087] In this embodiment, a material feature database is set: a pre-established database that stores feature information of various material types. Matching degree: the degree of similarity between the feature information of the material to be processed and the material feature information in the database, usually expressed as a percentage or score.

[0088] The terminal device compares the extracted feature information with the material features in the specified material feature database and calculates the degree of match. Material types with a match degree exceeding a preset threshold are identified as the result. The preset threshold can be set to any value, such as 90%, 80%, 70%, 85%, 95%, 95%, etc., and is not limited in this embodiment.

[0089] For example, if the texture features of the material to be processed match the features of "walnut" in the database at a degree of matching of 95%, and the preset threshold is 90%, then the material type is determined to be "walnut".

[0090] For example, a user places a piece of wood to be processed on the processing equipment carrier of the laser processing equipment. After the processing equipment detects that the material has been placed, it automatically captures the processing area image and sends it to the terminal device. The terminal device attempts to identify the label information in the image, but does not detect any labels. Subsequently, the system switches to a feature recognition-based mode to determine the material type. The processing equipment calls the built-in camera to capture the processing area image containing the wood to be processed and transmits the image data to the terminal device. The terminal device analyzes the processing area image and extracts the characteristic information of the wood, including: Texture characteristics: clear annual ring patterns and fine wood fiber structure. Color characteristics: light brown with a slight gloss on the surface. Shape characteristics: square, flat edges, and no obvious burrs. The terminal device compares the extracted characteristic information with the material characteristics in the set material characteristic database: the matching degree with the "poplar" feature is 75%. The matching degree with the "walnut" feature is 95%. The matching degree with the "oak" feature is 85%. Because "walnut" has the highest match and is above the preset threshold (90%), the terminal device determines the material type to be "walnut." Based on the "walnut" material type, the terminal device retrieves the recommended processing parameters from the processing parameter database and sends them to the laser cutting machine, automatically completing the parameter settings.

[0091] Furthermore, if there are multiple candidate material types that are higher than a preset threshold, for example, the preset threshold is 80%, then both walnut and oak are higher than the preset threshold, then a candidate box is output, and a selection instruction of the candidate box is responded to to determine the material type.

[0092] This implementation solves the problem of being unable to determine material type when no label information is detected through feature extraction and database matching. This approach is applicable to scenarios where no label information is available or the label is damaged, expanding the system's application range. Feature matching ensures accurate material type identification and avoids human error. It supports feature recognition for a variety of materials, adapting to diverse processing requirements.

[0093] Furthermore, the material feature database is designed to support dynamic updates, allowing users to add feature information for new material types or optimize existing feature data to improve matching accuracy. The terminal device can simultaneously extract multiple feature information and use a weighted algorithm to calculate the overall matching degree, further improving recognition accuracy. After determining the material type, the terminal device displays the recognition results and matching degree to the user, who can manually confirm or adjust the material type to ensure reliable recognition.

[0094] This implementation describes in detail a method for determining material type through feature extraction and database matching when no tag information is detected. This method, combined with specific scenarios and steps, automates and accurately identifies material types, providing a reliable basis for matching processing parameters.

[0095] Optionally, the step of determining characteristic information of the material to be processed based on the processing width image includes:

[0096] Step S211 : determining first feature information of the material to be processed based on the processing width image, where the first feature information includes texture features, color features, and shape features.

[0097] In this embodiment, the first feature information includes texture features, color features, and shape features.

[0098] Texture Feature Extraction: First, the processed image is converted into a grayscale image. The gray-level co-occurrence matrix (GLCM) algorithm is then used to quantify texture features. GLCM calculates the joint distribution probability of pixel grayscale values ​​at specific distances and directions within the image, generating multiple statistics reflecting texture characteristics, such as contrast, correlation, energy, and entropy. For example, for a wood image with a distinct grain direction, the horizontal GLCM may yield high contrast, while correlation reflects the regularity of the texture. These statistics form part of the texture feature vector.

[0099] Color feature extraction: Quantitatively analyze the pixel colors in the processed image using an appropriate color space model, such as HSV (hue, saturation, value) or LAB color space. By calculating the histogram distribution of each color channel, color statistics can be obtained. For example, in the HSV color space, the hue value of a piece of red acrylic is concentrated in the red region, and the saturation and value also have a specific range. These color feature parameters are combined into a color feature vector.

[0100] Shape feature extraction: Edge detection algorithms, such as the Canny edge detection operator, are used to identify the contour edges of the material being processed in the image. Shape descriptors, such as Hu moments, are then calculated based on this edge information. Hu moments are invariant to translation, rotation, and scale, effectively describing the shape characteristics of an object. For regularly shaped materials, such as a round piece of metal, Hu moments accurately reflect its circular geometric characteristics. For irregularly shaped materials, such as a piece of natural leather, Hu moments can capture its unique contour shape information.

[0101] Step S212 , alternatively, determining second characteristic information of the material to be processed based on the processed width image, where the second characteristic information includes spectral characteristics and / or speckle characteristics.

[0102] In this embodiment, the second information includes spectral characteristics and / or speckle characteristics.

[0103] Using a spectrometer, aim its sensor at the material to be processed, placed on the processing equipment's support platform, and collect the material's reflection or transmission spectral data within a specific wavelength range. Different materials, due to differences in their chemical composition and physical structure, exhibit unique absorption and reflection characteristics for light of different wavelengths. For example, metals may have high reflectivity in the visible light range and specific absorption peaks in the infrared band, while some plastics have distinct absorption characteristics in the ultraviolet band. By analyzing parameters such as characteristic peak position, peak intensity, and peak width in the spectral data, the material's spectral characteristic vector can be determined and used to identify the material type.

[0104] When laser light is applied to the surface of a material to be processed, speckle is generated due to the material's surface roughness and internal structural heterogeneity. By capturing and analyzing the speckle pattern using a high-speed camera or light detector, its characteristics can be determined. For example, the speckle's particle size, contrast, and spatial distribution are closely related to the material's microstructure. For smooth materials, the speckle particles are relatively small and evenly distributed; for rough materials, the speckle appears larger and more irregularly distributed. These speckle characteristics can serve as supplementary features, working together with other features to improve material recognition accuracy.

[0105] The first characteristic information or second characteristic information obtained in the above manner can comprehensively and accurately describe the characteristics of the material to be processed, and provide rich data support for the subsequent matching of the characteristic information with the set material characteristic database and the determination of the material type, thereby realizing the intelligent recognition of different materials and automatic matching of processing parameters by laser processing equipment, thereby improving processing effects and quality.

[0106] Based on any embodiment, in a possible embodiment of the present application, step S30 includes: steps S31-S33:

[0107] Step S31: obtaining a plurality of reference processing parameters.

[0108] In this embodiment, the reference processing parameters refer to multiple sets of feasible processing parameter combinations pre-determined for different material types through extensive experimentation and accumulated experience. Each set of parameters includes at least one or two of the following key parameters in the laser processing process: laser power (determines the output intensity of the laser energy, measured in watts), pulse frequency (the number of laser pulses emitted per unit time, measured in hertz), pulse width (the duration of a single laser pulse, measured in nanoseconds, picoseconds, or femtoseconds), scanning speed (the speed at which the laser beam moves across the material surface, measured in mm / s or m / s), spot size (the diameter of the laser beam after it is focused on the material surface, measured in microns), and defocus (the distance between the laser beam focal point and the material surface).

[0109] Once the material type to be processed is determined, the processing system's control software automatically queries and extracts all reference processing parameters associated with that material type from a local database. For example, for aluminum alloy, the database may store five different sets of reference processing parameters, each designed to achieve different processing effects (such as fast cutting, fine engraving, surface polishing, line cutting, line engraving, fill engraving, and bitmap engraving).

[0110] As another optional embodiment, a material type is associated with a set of processing parameter arrays, and the processing parameter arrays are provided with multiple processing effect diagrams, each processing effect diagram corresponding to a processing preview effect of a different reference processing parameter. Then, multiple reference processing parameters are determined based on the processing parameter arrays.

[0111] Step S32: determining a processing quality parameter corresponding to each reference processing parameter based on the material type.

[0112] In this embodiment, the processing quality parameters are indicators used to quantitatively evaluate the quality of the processing results obtained after processing the material using specific reference processing parameters. These indicators may include processing accuracy (such as dimensional deviation, shape accuracy, etc., calculated by measuring the difference between the actual size of the processed product and the design size), surface roughness (reflecting the microscopic roughness of the processed surface, measured using a roughness measuring instrument, in microns), heat-affected zone size (the area where the material undergoes changes in structure and performance due to heat during laser processing, determined by metallographic analysis and other methods), material removal rate (the volume or weight of material removed per unit time, used to measure processing effect and material consumption), whether there is burn-through, etc. Different processing quality parameters have different importance weights for different processing requirements.

[0113] As an optional implementation, the processing quality parameter is a non-negative number. A processing effect image corresponding to each reference processing parameter is determined. Based on the processing effect image, processing equipment information, processing method, and processing elements, a processing prediction pattern corresponding to each reference processing parameter is determined using a graph-to-graph method. Defect recognition is then performed on the predicted processing image to determine whether defects exist in each predicted processing image. Each time a defect is identified, the processing quality parameter value is incremented by 1. If no defects are present in the predicted processing pattern, the processing quality parameter is recorded as 0.

[0114] As another optional implementation, for each extracted reference processing parameter, the processing system obtains the corresponding processing quality parameter by actually processing the sample material according to a pre-defined experimental plan and measurement method. For example, after cutting an aluminum alloy sample using the first set of reference processing parameters, the roughness and dimensional accuracy of the cut surface are measured using high-precision measuring instruments, the size of the heat-affected zone is determined through metallographic analysis, and the material removal rate is calculated. These measurement results are recorded as the processing quality parameter for that reference processing parameter. This process is repeated for all reference processing parameters to obtain the processing quality parameter corresponding to each parameter group.

[0115] Step S33 , screening the processing parameters from the plurality of reference processing parameters according to the processing quality parameters.

[0116] In this embodiment, a set of parameters most suitable for the current machining task is selected from multiple reference machining parameters based on specific screening rules and user requirements. The screening rules can be based on the user's priorities for different aspects of machining quality. For example, if the user prioritizes machining accuracy, this quality parameter will be given a higher weight during the screening process; if the user pursues high-efficiency machining, the weight of material removal rate will be increased accordingly. By performing a weighted calculation on each machining quality parameter, a comprehensive evaluation score is obtained for each reference machining parameter, and the parameter group with the highest score is selected as the final machining parameter.

[0117] The main demand of the user for processing aluminum alloy materials this time is to improve the processing effect as much as possible under the premise of ensuring a certain processing accuracy. According to this demand, the processing system sets weights of 0.4, 0.2, 0.2 and 0.2 for processing accuracy, surface roughness, heat affected zone size and material removal rate respectively. For the processing quality parameters of each reference processing parameter, processing quality parameter = 0.2* processing accuracy score + 0.2* surface roughness score + 0.2* heat affected zone score + 0.2* material removal rate score. The data referenced by the processing quality parameters in this application are not limited here, for example, it can also be a reference to whether burn-through. Among them, each score can be normalized according to the degree of proximity between the actual measured value and the ideal value. For example, the processing accuracy score can be obtained by calculating the deviation ratio between the actual processing accuracy and the preset ideal accuracy, and then performing reverse normalization (the smaller the deviation, the higher the score). By calculating and comparing the comprehensive scores of all reference processing parameters, the reference processing parameters with the highest scores are selected as the processing parameters ultimately used for this aluminum alloy material processing.

[0118] For example, when the user places the aluminum alloy plate on the carrier table of the laser processing equipment, the processing system determines that the material type is aluminum alloy through image recognition and feature analysis. Then, the system obtains five reference processing parameters for aluminum alloy from the database, marked as reference processing parameters A, B, C, D and E respectively. Then, the system performs actual processing tests on each parameter group. After cutting a piece of aluminum alloy sample of the same material using reference processing parameter A, the measurement shows that the processing accuracy is ±0.1mm (the full score is assumed to be ±0.05mm, and the score is 0.6 according to the deviation ratio), the surface roughness is Ra3.2μm (the full score is assumed to be Ra1.6μm, and the score is 0.5), the heat affected zone size is 0.5mm (the full score is assumed to be 0.3mm, and the score is 0.4), and the material removal rate is 5mm 3 / s(Full score is assumed to be 8mm 3 / s, score 0.625). The processing quality parameter of reference processing parameter A is calculated according to the set weight to be 0.545. Similarly, the reference processing parameters B, C, D and E are tested and the comprehensive scores are calculated, and the comprehensive score of reference processing parameter B is 0.61, the comprehensive score of reference processing parameter C is 0.58, the comprehensive score of reference processing parameter D is 0.49, and the comprehensive score of reference processing parameter E is 0.56. After comparing the comprehensive scores of all parameter groups, it is found that reference processing parameter B has the highest score. Therefore, the processing system finally selects reference processing parameter B (for example, laser power 1000W, pulse frequency 50kHz, pulse width 10ns, scanning speed 800mm / s, spot size 0.3mm, defocus amount -1mm) as the processing parameters for this aluminum alloy plate cutting process, and automatically applies these parameters to the laser processing equipment to perform accurate and efficient cutting of the aluminum alloy plate.

[0119] As another optional implementation, after determining the processing quality parameter corresponding to each reference processing parameter, the reference processing parameter corresponding to the processing quality parameter with the smallest value is used as the screened processing parameter.

[0120] Optionally, the processing parameters include processing parameters of at least one dimension, and after the step of determining the processing quality parameter corresponding to each reference processing parameter based on the material type, the method further includes:

[0121] Step S34 , determining two sets of reference processing parameters to be interpolated based on the processing quality parameters, and determining processing parameters to be interpolated.

[0122] In this embodiment, two reference processing parameter sets to be interpolated are selected from an existing reference processing parameter set. These sets differ in processing quality and offer reference and complementarity. For example, one set may excel in one quality metric but weak in others, while the other may not. These two sets are used to explore a more optimal parameter combination. Interpolated processing parameters: Within the two selected parameter sets, parameters that significantly impact processing quality and are adjustable are selected, such as P (laser power) and v (scanning speed) in laser processing. By varying these values, new candidate sets are generated to find a suitable parameter combination.

[0123] First, the machining quality parameters of all reference machining parameters are comprehensively analyzed and ranked. For example, based on the combined performance of machining accuracy and surface roughness, they are categorized into three levels: high, medium, and low. Next, two parameter groups are selected from different levels: Group A, which exhibits high accuracy but low material removal rates, and Group B, which exhibits low accuracy but high material removal rates. Data analysis determines that P significantly influences the difference in machining quality between these two groups, and therefore P is determined as the machining parameter to be interpolated.

[0124] Step S35 , keeping other processing parameters in the two groups of processing parameters except the processing parameters to be interpolated unchanged, performing interpolation processing on the processing parameters to be interpolated, and obtaining a plurality of candidate reference processing parameters.

[0125] In this embodiment, interpolation processing involves using a mathematical algorithm to interpolate intermediate values ​​between the values ​​of the processing parameter to be interpolated (e.g., P) in the two reference processing parameter sets to construct a new parameter combination. During this process, all parameters other than P (e.g., pulse frequency f, pulse width t, spot size d, defocus l, etc.) remain unchanged from the corresponding values ​​in the original two parameter sets. Only the P value is varied to generate multiple candidate reference processing parameters, filling the gaps between the original parameter sets and increasing the selection options.

[0126] Assume that the P value in parameter group A is P1 and the P value in parameter group B is P2. Calculate the difference ΔP = P2 - P1. Based on the desired number of interpolation values ​​n (e.g., n = 5), calculate the interpolation step size step = ΔP / (n + 1). Construct n candidate reference processing parameters sequentially. For the i-th candidate group, Pi = P1 + (i + 1) * step (i = 0, 1, 2, ..., n - 1). The other parameters are the same as those in groups A and B, resulting in n candidate groups with different P values.

[0127] Step S36 , screening the plurality of candidate reference processing parameters to obtain the processing parameter.

[0128] In this embodiment, the screening rule determines the final set of parameters from the interpolated candidate reference parameters, based on pre-defined rules and desired machining quality. This rule comprehensively considers all aspects of machining quality, assigning weights to machining quality parameters (such as machining accuracy, surface roughness, heat-affected zone size, and material removal rate) to measure the quality of the candidate set, thereby meeting the user's specific machining requirements and actual production requirements.

[0129] For each candidate reference processing parameter, the processing quality parameters are obtained by processing samples according to the previous method. Finally, the processing quality parameters of all candidate groups are compared, and the candidate with the highest score is selected as the final processing parameters for actual laser processing operations. This achieves optimized control of the processing process, improves processing quality and efficiency, and better adapts to the diverse needs of different materials and processing scenarios.

[0130] In this embodiment, multiple reference processing parameters are determined as a basis for screening based on the material type, and then the processing quality parameters corresponding to the results of the processing elements processed by the processing equipment on the material to be processed under each reference processing parameter are determined. Then, based on the processing quality parameters of each reference processing parameter, one of the reference processing parameters is selected as the processing parameter of the material to be processed, thereby improving the accuracy of the processing parameters and improving the processing effect.

[0131] Furthermore, among the reference processing parameters, based on the defects corresponding to the processing quality parameters, interpolation is performed between the two sets of reference processing parameters to obtain a richer set of candidate reference processing parameters, which further improves the matching degree between the processing parameters and the material to be processed and improves the processing effect.

[0132] Based on any of the above embodiments, in a possible embodiment of the present application, the step of determining the processing parameters of the material to be processed includes:

[0133] determining a corresponding processing parameter array according to the processing element information of the processing element, and determining a plurality of reference processing parameters based on the processing parameter array;

[0134] The processing parameter array is provided with a plurality of processing effect diagrams, each processing effect diagram is a processing effect diagram obtained by processing based on different array elements, and the array elements represent the reference processing parameters.

[0135] It can be understood that the processing element information can be any one of the material type, processing type and processing equipment type. Each type of processing element information corresponds to different processing parameters. The array elements include processing parameters corresponding to at least one processing element information or a combination of processing parameters corresponding to at least two different processing element information.

[0136] Specifically, the step of obtaining a plurality of reference processing parameters includes:

[0137] Step S311, determining a corresponding processing parameter array according to the material type, and determining a plurality of reference processing parameters based on the processing parameter array;

[0138] In step S312, the processing parameter array is provided with a plurality of processing effect diagrams, each processing effect diagram corresponding to a processing preview effect of a different reference processing parameter.

[0139] In this embodiment, the processing parameter array is a structured representation that integrates different reference processing parameters and their corresponding processing effects. It is presented as an array, where rows and columns represent different processing parameters (e.g., any two of laser power, pulse frequency, and scan speed). It also includes multiple processing effect graphs. These reference graphs visually demonstrate the potential effects of processing a material using specific reference processing parameters, providing a visual reference for selecting the appropriate parameter set.

[0140] A processing effect image is an image that reflects the processing results obtained by actually processing a material using a set of reference processing parameters. For example, when cutting metal materials, the processing effect image can clearly show visual characteristics such as the flatness of the cut surface, the smoothness of the edge, and the presence of a heat-affected zone, helping to determine whether the parameter set meets the expected processing requirements.

[0141] First, the processing system searches the local database for the corresponding processing parameter array based on the material type to be processed. This database pre-stores processing parameter arrays corresponding to various common material types and is constructed through extensive experiments and data accumulation. For example, for aluminum alloy materials, the system will locate the processing parameter array specifically for aluminum alloys. Next, the processing effect diagrams in the processing parameter array are analyzed. Each processing effect diagram is associated with a specific set of reference processing parameters. These parameter groups record the various processing parameters set during the processing test (such as the laser power set to a certain watt, the pulse frequency to a certain hertz, etc.). By sorting through multiple processing effect diagrams and their associated parameter groups, multiple different reference processing parameters can be extracted. For example, from a series of reference diagrams showing the cutting effects under different cutting speed and laser power combinations, five different sets of reference processing parameters were obtained. Each parameter group corresponds to a different processing effect and quality performance, providing basic data for further screening of the parameter group that is most suitable for the current processing task.

[0142] For example, when a user places an acrylic sheet on the carrier of a laser processing device, the processing system determines that the material type is acrylic through image recognition and other means. Subsequently, the system retrieves the processing parameter array corresponding to the acrylic material from the local database. This processing parameter array contains multiple processing effect diagrams, each of which shows the effect of engraving the acrylic material under the action of different reference processing parameters. For example, some processing effect diagrams show that the engraving lines are fine and the edges are smooth, but the engraving speed is relatively slow. The corresponding reference processing parameters may be a low laser power setting (such as 30W), a high pulse frequency (such as 80kHz), and a moderate scanning speed (such as 300mm / s) to ensure engraving accuracy; while some processing effect diagrams show that the engraving speed is very fast, but the line edges are slightly rough. The associated reference processing parameters may be a high laser power (such as 60W), a moderate pulse frequency (such as 50kHz), and a fast scanning speed (such as 600mm / s), which focuses more on processing efficiency. By analyzing these processing effect images and their corresponding reference processing parameters, the system extracted five different sets of reference processing parameters, labeled as reference processing parameters A, B, C, D, and E. These reference processing parameters cover different trade-offs between processing accuracy and efficiency. Based on these five sets of reference processing parameters, the system can then further determine the processing quality parameters corresponding to each reference processing parameter. Then, according to the corresponding screening rules (such as the user's emphasis on processing accuracy and efficiency), the final processing parameters that are most suitable for this acrylic sheet engraving task are selected. These parameters are then applied to the laser processing equipment to achieve high-quality and efficient engraving processing, meeting the requirements of handicraft production.

[0143] Optionally, step S32 includes:

[0144] Step S321 , determining a processing effect diagram corresponding to the reference processing parameters in the processing parameter array.

[0145] In this embodiment, after obtaining multiple reference processing parameters, the corresponding processing effect image for each reference processing parameter is accurately searched and determined in the processing parameter array based on their association with the processing parameter array. For example, if reference processing parameter A is present, the corresponding reference image showing the result of processing the material using parameter group A is found by following a pre-defined indexing rule in the processing parameter array (which can be based on a correspondence established by parameter group number, parameter characteristics, etc.). This reference image clearly shows the surface condition and shape of the material after this processing.

[0146] Step S322 : determining a processing prediction pattern corresponding to each of the reference processing parameters based on the processing effect diagram, processing equipment information, processing method, and processing elements.

[0147] In this embodiment, processing equipment information: includes various parameters and performance characteristics of the laser processing equipment itself, such as the maximum laser power range of the equipment, the minimum spot size accuracy, the accuracy and speed range of the scanning system, etc. This information reflects the processing capability limit and accuracy level that the equipment can achieve, and will have an impact on the actual processing effect. Processing method: refers to the specific operation type for processing materials, such as cutting, engraving, punching or surface etching and other different processing modes. Under different processing methods, the removal and deformation of materials vary greatly, which in turn affects the final processing quality and effect. Processing prediction pattern: is a final pattern that is predicted to be presented after processing using the corresponding reference processing parameters in the current actual processing scenario after comprehensively considering multiple factors such as the preliminary processing effect reflected in the processing effect diagram, the actual capabilities of the processing equipment, the specific processing method adopted, and the processing elements to be achieved. It is more in line with the actual processing situation than the processing effect diagram and is an important intermediate data for further analysis of processing quality.

[0148] For each reference processing parameter, the basic processing characteristics shown in the corresponding processing renderings are first extracted, such as the material surface texture and the smoothness of the cut edge. Then, based on the information of the currently used laser processing equipment, the system is considered to determine whether it can achieve the results shown in the reference renderings in actual processing. If the equipment's accuracy does not meet the level implied by the reference renderings, the results need to be adjusted accordingly. For example, if the equipment's minimum spot size accuracy is greater than the equipment accuracy on which the reference renderings are based, some fine textures may not be perfectly rendered in the predicted pattern, requiring appropriate blurring. Next, based on the intended processing method, if engraving is used, the complexity and depth requirements of the lines in the engraving pattern (processing element) are analyzed to ensure compatibility with the engraving results in the processing renderings. This allows for a reasonable estimate of the smoothness and depth of the lines in the predicted pattern. Similarly, for cutting, the appearance and smoothness of the cut in the predicted pattern are adjusted based on processing element requirements such as cut width, combined with the equipment's capabilities and the reference renderings. Through this comprehensive analysis and adjustment, the predicted pattern corresponding to each reference processing parameter is ultimately determined.

[0149] Step S323 , obtaining the processing quality parameter corresponding to each reference processing parameter based on the defect determination result of the processing prediction pattern corresponding to each reference processing parameter.

[0150] In this embodiment, defect determination results for the predicted machining pattern are quantitative or qualitative descriptions of any portions of the pattern that fail to meet ideal machining quality requirements, derived after analysis and evaluation of the predicted machining pattern. For example, issues such as surface roughness exceeding standard values, deviations from design requirements for the machined shape, and excessively large heat-affected zones are identified through specialized image analysis algorithms and dimensional measurement methods, thereby reflecting potential machining quality issues resulting from the reference machining parameters.

[0151] For each reference processing parameter corresponding to the processing prediction pattern, use image analysis software and related measurement tools to analyze its defects. For example, by calculating the height difference of different positions on the processing surface in the pattern, the surface roughness value is obtained through statistical analysis; using the dimension measurement algorithm, the deviation between the shape in the processing prediction pattern and the shape required by the design is compared to determine the processing accuracy; by identifying and calculating the area of ​​the heat-affected zone in the pattern, the size of the heat-affected zone is obtained. The results obtained from these analyses and measurements are sorted and recorded according to the corresponding processing quality parameter categories. For example, the specific value of the surface roughness is recorded as the value of the surface roughness processing quality parameter corresponding to the reference processing parameter, and the deviation of the processing accuracy is converted into a corresponding processing accuracy score, which can be determined based on the corresponding relationship between the set deviation range and the score. In this way, based on the defect determination results of the processing prediction pattern, a complete set of processing quality parameters corresponding to each reference processing parameter is obtained, providing data support for the subsequent screening of the optimal processing parameters.

[0152] For example, first, after the processing system identifies the material type as walnut, it retrieves the processing parameter array corresponding to the walnut material from the database and obtains five reference processing parameters based on the array, which are marked as parameter groups 1, 2, 3, 4, and 5. Then, for parameter group 1, the corresponding processing effect diagram is found in the processing parameter array. The diagram shows the approximate effect of engraving the walnut material using this parameter group, such as the pattern lines are relatively clear, but the edges of some lines are slightly rough, and the engraving depth is relatively shallow. Then, combined with the information of the currently used laser processing equipment (the laser power adjustment accuracy of the equipment, the scanning speed range, etc.), the processing method this time (fine engraving), and the processing elements to be achieved (the complex pattern required in the design drawing, with precise requirements for line thickness and depth), the processing effect diagram is adjusted to generate the processing prediction pattern corresponding to parameter group 1. During this process, the engraving depth was adjusted appropriately in the predicted pattern, considering the limited laser power adjustment accuracy of the equipment. This meant that the engraving depth might not be as ideal as in the reference image. Furthermore, based on the line accuracy requirements of the complex pattern in the design drawing and the equipment's scanning speed range, a more realistic estimate of line flow and edge smoothness was made, ultimately resulting in the predicted pattern for parameter set 1. The defect determination results for the predicted pattern for parameter set 1 were then analyzed. Image analysis software was used to measure the height difference at different locations on the pattern surface, and the surface roughness was calculated to be Ra 2.5μm (this corresponds to the surface roughness value of the corresponding processing quality parameter). Comparing the deviations between the pattern shape in the predicted pattern and the required design shape revealed that some lines deviated by 0.1mm. Based on the established processing accuracy scoring rules (full score for deviations within 0.05mm, with a proportional deduction for each additional 0.01mm), a specific processing accuracy score was assigned. The heat-affected zone (HAZ) in the pattern was then identified and its area calculated to determine other processing quality parameters, such as its size. Using the same method, the corresponding processing prediction patterns and processing quality parameters are determined for parameter groups 2, 3, 4, and 5. Finally, based on these processing quality parameters, according to pre-set weights (for example, if the user prioritizes processing accuracy and surface roughness, these two parameters will be given higher weights), a comprehensive evaluation score is calculated for each parameter group. The parameter group with the highest score is selected as the final processing parameters for the walnut board engraving process.

[0153] Based on any embodiment, in a possible embodiment of the present application, before the step of identifying the processing width image and determining the material type of the to-be-processed material, the method includes:

[0154] Step A10, in response to a selection instruction of a processing width image acquisition control in the interactive interface, displaying the acquired processing width image in the interactive interface;

[0155] Step A20 : When a processing element is displayed in the interactive interface, the processing element is integrated with the processing format image and displayed on the interactive interface, and the processing element is placed above the processing format image layer.

[0156] In this embodiment, the interactive interface serves as a visual platform for operator interaction with the laser processing system. It integrates various controls, display areas, and feedback mechanisms, presenting system status in a graphical and intuitive manner, accepting operator commands, and enabling convenient control of the entire laser processing process. Like an intelligent control center, it simplifies complex processing system operations into an easy-to-understand and user-friendly interface. The processing format image acquisition control, located as a dedicated button in the interactive interface's command area, serves as a key component for triggering the acquisition and display of processing format images. Its function is to send an image acquisition command to the processing equipment, initiating the entire image visualization process. By clicking this control, the operator, like pressing a camera shutter, initiates a "snapshot" of the processing site and brings the image into the interactive interface. The image display area is a core area of ​​the interactive interface, specifically dedicated to displaying the processing format image and any subsequent displays, such as processed identification images and process monitoring images. It serves as a "window" for the operator to observe the actual status of the processed material. The high-resolution, appropriately scaled image display helps the operator make accurate processing decisions, such as determining whether the material is correctly placed and whether label information is clearly visible.

[0157] In this embodiment, the overall interface of the interactive interface is divided into multiple functional areas, including an image display area, an operation instruction area, a parameter setting area, and a status feedback area. Among them, the image display area occupies a relatively large central position of the interface, and is used to present the processing format image and related image information in the subsequent processing process in real time, ensuring that the operator can clearly and intuitively observe the material status. A striking "Get Image" button is set in the operation instruction area. The button can be equipped with a simple and clear icon, such as a small icon representing a camera, to further strengthen its function prompt. Its function is to trigger the processing equipment to perform image acquisition action and transmit the acquired processing format image to the interactive interface for display.

[0158] Referring to Figure 2, when the operator clicks the "Get Image" button, the terminal device behind the interactive interface immediately monitors this operation event. The system's built-in event handler is then activated. The program first sends an image acquisition instruction to the processing equipment, which is accurately transmitted to the processing equipment through a pre-established communication link. After receiving the instruction, the processing equipment starts the image acquisition device (usually a high-definition camera) according to the established process and quickly captures the processing format image corresponding to the processing equipment's carrier. After the acquisition is completed, the built-in communication module is used to package the image data in a specific image format (such as JPEG or PNG) and transmit it back to the terminal device system where the interactive interface is located via the same communication link.

[0159] After receiving the image data, the terminal device system runs a special image parsing program. The program decodes, decompresses, and processes the incoming image data, converting it into a format that can be directly displayed in the image display area of ​​the interactive interface. Subsequently, referring to Figure 3, at a designated location in the image display area, the processing format image is fully presented with a suitable size (for example, covering 80% of the display area, retaining a certain border for displaying other auxiliary information) and a clear resolution. At this point, the operator can intuitively see the placement status, appearance characteristics, and possible label information of the material to be processed on the processing equipment carrier, providing a visual basis for subsequent processing operations.

[0160] In this embodiment, the processing element refers to the pattern content to be processed on the material via the laser processing process. It can be a variety of graphics or text combinations with specific shapes, colors, and functions. It is the visual representation of the final laser processing results on the material surface. Pre-designed or drawn on-site and processed, it is then fused with the processing format image for display, providing the operator with an intuitive preview of the processing effect. This fusion display utilizes specific image processing techniques and layer management mechanisms to overlay and combine the processing element pattern layer with the processing format image layer according to specific rules (such as coordinate alignment and transparency adjustment). The operator sees a single image on the interactive interface that not only displays the actual state of the material to be processed but also presents a preview of the pattern effect to be processed on the material, facilitating the operator's preview, confirmation, and necessary adjustments to the processing content.

[0161] As an optional implementation, the operator pre-designs the required pattern using professional graphic design software (such as Adobe Illustrator, CorelDRAW, etc.). These patterns can be brand logos, decorative patterns, functional logos, or hole outlines of specific shapes. The pattern is then saved as a specific graphic file format (such as SVG, DXF, etc., which can well preserve the vector information of the graphic and facilitate subsequent processing) and then imported into the terminal device software. Alternatively, the operator can directly draw on-site using the simple graphic drawing tools provided by the terminal device software. For example, simple geometric shapes can be drawn by clicking and dragging the mouse, or text content can be entered to form a text pattern, etc., to meet some temporary and simple processing pattern needs.

[0162] When the processing format image is displayed on the interactive interface, in order to accurately integrate the processing element pattern with it for display, image alignment and coordinate matching operations must be performed first. The terminal device system determines the actual coordinate position of the image in the interactive interface by identifying some reference features in the processing format image (such as fixed corner marks of the processing equipment carrier, preset positioning points, etc.), and at the same time aligns the coordinate system of the processing element pattern with the coordinate system of the processing format image to ensure that the pattern can be accurately "placed" on the corresponding material position. For example, if the processing element pattern is a circular mark located at the center of the material, through coordinate matching, its center of the circle in the interactive interface corresponds exactly to the pixel coordinate point of the center of the material in the processing format image, ensuring that the position is accurate during subsequent fusion display.

[0163] Based on any of the above embodiments, in a possible embodiment of the present application, the step of determining the material type based on the matching degree between the feature information and each material feature in a set material feature database includes:

[0164] In step B10, if at least one candidate material type is obtained by matching the feature information with the set material feature database, a material type determination control is displayed on the interactive interface. The material type determination control displays at least one candidate box, and each candidate box displays one of the candidate material types.

[0165] In this embodiment, in this embodiment, candidate material types: After the feature information of the material to be processed is matched and compared with the material features in the set material feature database, the types corresponding to the materials whose similarity with the features of the material to be processed reaches a certain threshold (the threshold is set based on experience and experiments) are listed as candidate material types. They are several guess results that may match the actual type of the material to be processed. Material type determination control: It is an interactive component on the interactive interface specifically used to assist users in determining the type of material to be processed. It is presented to users in a visual form to facilitate intuitive operation by users. It contains at least one candidate box, and each candidate box corresponds to a candidate material type, so that users can clearly see all possible material type options that are matched. Referring to Figure 4, at least one candidate material type is identified. The upper right corner of Figure 4 is an example of a material type determination control, which displays various candidate material types in a drop-down candidate box.

[0166] First, the processing system matches the extracted characteristic information of the material to be processed with a database of predefined material characteristics. This matching process involves complex algorithmic calculations. For example, for texture characteristics, quantitative indicators such as texture orientation and roughness are compared; for color characteristics, the numerical distribution of colors within a specific color space is compared. By comprehensively comparing the matching of various characteristics, the material types with the highest similarity are selected as candidate material types. Suppose that after matching, three candidate material types are obtained: "oak," "walnut," and "maple."

[0167] Then, a material type determination control is generated and displayed at an appropriate location on the interactive interface (generally near the main area for easy user attention and operation). The control is presented as a visual area containing at least one candidate box, the number of which is consistent with the number of candidate material types. In this example, three candidate boxes are generated, each of which clearly displays the words "oak", "walnut" and "maple" to clearly inform the user of all possible material type options currently matched, facilitating further confirmation by the user.

[0168] Step B20: In response to the selection instruction for the at least one candidate box, the candidate material type corresponding to the selected candidate box is determined as the material type of the material to be processed.

[0169] In this embodiment, the selection instruction refers to the action of the user selecting the candidate box in the material type determination control by clicking the mouse, operating the keyboard shortcut or touching the screen (if it is a device that supports touch interaction). This is the key interactive behavior for the user to clarify the final material type from the candidate material types based on his or her own understanding of the material, processing experience or other reference information.

[0170] After seeing the material type determination control displayed on the interactive interface, as well as the candidate box and the corresponding candidate material type, the user uses the mouse pointer to move to the candidate box that he thinks is correct based on his intuitive judgment of the material to be processed (such as the source of the material, appearance and feel, etc.) or past processing experience and other factors, and then clicks the left mouse button to select the instruction. For example, by observing the texture and color of the material, the user judges that the material is more like "walnut", so he clicks the candidate box showing the word "walnut". The system monitors the user's selection instruction in real time and immediately determines the candidate material type corresponding to the candidate box selected by the user (in this case, "walnut") as the final material type of the material to be processed. Afterwards, the system will automatically associate and display the corresponding processing parameter array and related specific processing parameters and other information in the parameter configuration control area on the right side of the interactive interface based on this determined material type, so that the user can further adjust and confirm the processing parameters and prepare for subsequent laser processing operations.

[0171] For example, a worker first places a piece of wood on the laser processing machine's platform. Then, using the controls above the interface, they click the "Processing Format Image Acquisition" button. This acquires a processing format image of the wood and displays it on the left side of the interface's main area. The system then automatically extracts the wood's characteristic features, including its unique surface texture, color depth, and shape, and matches them against a database of pre-defined material characteristics.

[0172] After performing matching calculations, the system identified three candidate material types: "pine," "fir," and "cypress," deeming the wood likely to be one of these. A control popped up on the interactive interface to determine the material type. This control appeared as a bordered area with three candidate boxes neatly arranged within it. Each candidate box clearly displayed the words "pine," "fir," and "cypress," allowing the worker to clearly see all possible material type options.

[0173] The staff carefully observed the texture of the wood and felt that its texture was relatively fine and uniform, which was more in line with the characteristics of "fir", so they used the mouse to click on the candidate box showing the word "fir". The system immediately received this selection instruction and then determined "fir" as the material type of this piece of material to be processed. Then, in the parameter configuration control area on the right side of the interactive interface, the processing parameter array corresponding to "fir" was automatically displayed. The array contained different processing effect diagrams and corresponding multiple sets of reference processing parameters. Some specific processing parameters (such as laser power, pulse frequency, etc.) and their corresponding parameter adjustment controls are also listed in detail below, which is convenient for the staff to further adjust and determine the final processing parameters according to the specific requirements of this engraving process.

[0174] Based on any of the above embodiments, in a possible embodiment of the present application, the method further includes:

[0175] Step C10, in response to a selection instruction of a material selection control in the interactive interface, a material list control is displayed above the editing area of ​​the interactive interface, wherein the material list control includes multiple material schematics, each of the material schematics corresponding to a material type, wherein the material schematics display at least one of the material, texture, color, and thickness information of the corresponding material type, and the multiple material schematics are arranged in rows and / or columns.

[0176] In this embodiment, referring to Figures 2 to 4, the interactive interface includes an editing area for editing the processing elements that are intended to be processed into the pattern on the material to be processed. For example, in Figures 2 to 4, "HELLO" can be understood as the processing element of the embodiment of this application. Material selection control: A button or function option located in the operation control area of ​​the interactive interface. Its main function is to allow the user to actively initiate the operation of selecting the material type. By clicking it, the subsequent process of displaying material-related information is triggered, making it convenient for users to search and select among many material types. It is the entry control for starting material type screening.

[0177] Material list control: After the user clicks the material selection control, the system pops up a visual control. The visual control is displayed above the editing area and presents various material-related information in an intuitive manner, including multiple material schematics, which are arranged in rows and / or columns. These schematics help users quickly identify different material types in a graphical form, covering various common processable materials, and provide a reference for users to further confirm the type of material to be processed. Referring to Figure 5, Figure 5 is an example of a material list control. The material list control displays multiple material types, and each material type is displayed through a material schematic and material name. The material schematic shows the material, texture, and color of the corresponding material type.

[0178] After the user opens the interactive interface corresponding to the laser processing equipment, he focuses his eyes on the operation control area at the top of the interface and finds the "material selection control" (the control may have a clear icon, such as a drop-down arrow with the word "material selection" marked next to it, which is convenient for users to identify). The user clicks on the "material selection control" with the mouse. After the system receives this operation instruction, it immediately pops up and displays the "material list control" at the appropriate location of the interactive interface (usually below or near the operation control for easy user viewing). The "material list control" appears as a scrollable area with multiple material schematics neatly arranged in it. Each schematic clearly shows the appearance characteristics of a material. For example, for wood materials, the schematic may show the texture, color and general shape of the wood; for metal materials, its gloss, color and other appearance characteristics are displayed, and each material schematic corresponds to a clear material type, such as oak, aluminum alloy, etc., which makes it easy for users to browse different material options intuitively.

[0179] Step C20 , in response to the selection instruction of the material identification control in the material list control, triggering the execution of the action of acquiring the processing format image corresponding to the processing equipment carrier and performing identification to determine at least one candidate material type.

[0180] In this embodiment, the material identification control is an action button within the material list control. When clicked, it initiates the image acquisition and identification process. Using the material to be processed, placed on the processing equipment's carrier, the process captures an image of the processing area. Based on the scheme described in the above embodiment, at least one candidate material is obtained from the processing area image. Figure 6 illustrates an example of the material identification control's identification process, specifically, a transitional animation during the material identification process.

[0181] After viewing the multiple material schematics displayed in the "Material List Control," the user locates the area corresponding to the material schematic based on their initial assessment of the appearance and other characteristics of the material to be processed, which will then be placed on the processing equipment's carrier. Within this area, the user finds the "Material Identification Control" (which may be labeled with a prompt such as "Identify this material"). The user clicks the "Material Identification Control" with their mouse, and the system triggers a series of background operations. First, the system controls an image acquisition device (such as a camera) mounted on the processing equipment to capture an image of the processing area corresponding to the processing equipment's carrier, capturing an image of the material to be processed placed on the carrier. Then, using the image recognition technology mentioned above, the system analyzes this processing area image, extracting material characteristics (such as texture, color, and shape). This information is then matched against a database of pre-defined material characteristics, selecting the most similar material type and identifying it as at least one candidate material. For example, if the user clicks the material identification control in the area corresponding to the "Acrylic" material schematic, the system captures the processing area image and, through identification analysis, identifies "Acrylic" and similar materials such as "Plexiglas" as candidate materials.

[0182] In step C30 , the material type determination control in the interactive interface displays at least one candidate box, each of which displays detailed information associated with a candidate material type, the detailed information including a material image and a material name.

[0183] In this embodiment, the material type determination control is an interactive component on the interactive interface used to assist the user in finally determining the type of material to be processed. It receives the candidate material information identified in the previous step and displays it to the user in the form of candidate boxes. Each candidate box presents detailed information of the corresponding candidate material, which is convenient for the user to compare and select, and ensures that the final determined material type is accurate. Referring to Figure 7, Figure 7 is an example of a material type determination control in a material list control. The material type determination control displays at least one identified candidate box, and each candidate box displays detailed information associated with a candidate material type. The detailed information includes a material image and a material name. Three candidate materials are shown in Figure 7. Detailed information: Contains key descriptions of the candidate materials, where the material image allows the user to visually confirm the material appearance characteristics again, and the material name clearly identifies the specific name of the material. The combination of the two helps users better judge and select the appropriate material type, avoiding misjudgment due to single factors such as simple text or images.

[0184] After the system identifies at least one candidate material through the preceding image recognition and matching operations, it generates and displays a "Material Type Determination Control" in an appropriate display area on the interactive interface (usually near the main area for easy user attention and operation). This control appears as a visual area containing at least one candidate box, the number of which matches the number of candidate materials.

[0185] For each candidate material, the system displays its associated detailed information within the corresponding candidate box. For example, for the candidate material "Acrylic," a clear image of the standard appearance of acrylic material will be displayed in its corresponding candidate box, allowing users to intuitively see the actual appearance of acrylic. The word "Acrylic" will also be clearly marked as the material name, so that users can clearly understand the specific name of the candidate material. This detailed information display allows users to accurately select the type of material that meets the actual processing requirements from multiple candidate materials.

[0186] Step C40 : In response to the selection instruction for the at least one candidate box, determining the candidate material type corresponding to the selected candidate box as the material type of the material to be processed.

[0187] In this embodiment, the user carefully examines the detailed information associated with each candidate material displayed in the "Material Type Determination Control." Based on their understanding of the actual material to be processed (such as its source, feel, and previous experience), they move the mouse pointer to the candidate box they believe best matches the desired material and then click the left mouse button to select it. For example, if the user sees that the material image displayed in one of the candidate boxes looks very similar to the actual material to be processed, and the material name also matches their expectations, they click that candidate box. The system monitors this user selection in real time and immediately determines the candidate material type corresponding to the selected candidate box as the final material type to be processed. Based on this determined material type, the system automatically associates and displays the corresponding processing parameter array, specific processing parameters, and related configuration controls in the corresponding area of ​​the interactive interface (such as the parameter configuration control area on the right), allowing the user to further adjust and confirm the processing parameters and fully prepare for subsequent laser processing operations. Referring to Figure 8, Figure 8 shows the interface displayed after the user selects a candidate material type as the material type to be processed, displaying the corresponding processing parameter array and processing parameters.

[0188] For example, a user opens the interactive interface for a laser processing device and sees a "Material Selection Control" (with a small downward-pointing arrow icon) in the top control area. They click it. Immediately below the control, a "Materials List Control" pops up, filled with diagrams of various materials. These include diagrams of various woods with clear grain, diagrams of metals with varying degrees of surface gloss, and diagrams of materials with varying appearances, such as plastics and glass. After a quick glance, the user decides that the transparent material they have picked up might resemble "acrylic" or "plexiglass." They then locate the area in the "Materials List Control" corresponding to the "acrylic" material diagram. Within this area, they see a "Material Identification Control" (with the words "Click to identify this material") and click it. Upon receiving the click, the system immediately controls the camera on the processing device to capture an image of the processing width of the transparent material placed on the carrier. The system then analyzes the image, extracting material characteristics such as texture, color, and transparency, and matches this information against a database of pre-defined material characteristics, ultimately identifying "acrylic" and "plexiglass" as candidate materials. Subsequently, a "material type determination control" appeared next to the main area of ​​the interactive interface, containing two candidate boxes. In the candidate box displaying the "acrylic" candidate material, a high-definition image of a standard acrylic material was displayed, clearly showing the clear, transparent and smooth surface of acrylic, and the word "acrylic" was clearly marked; in the other candidate box displaying the "plexiglass" candidate material, an image of the typical appearance of plexiglass was also displayed and the word "plexiglass" was marked. The user carefully compared the actual material with the material images in the two candidate boxes, and recalled the feeling of having come into contact with similar materials before. He felt that this material was more in line with the characteristics of "acrylic", so he clicked the candidate box displaying "acrylic" with the mouse. The system immediately recognized this selection instruction and determined "acrylic" as the material type of the material to be processed. Immediately afterwards, the parameter configuration control area on the right side of the interactive interface automatically displayed the processing parameter array corresponding to "acrylic", specific processing parameters (such as recommended values ​​for parameters such as laser power and pulse frequency) and corresponding parameter adjustment controls.

[0189] Based on any of the above embodiments, in a possible embodiment of the present application, after determining the material type, the method further includes:

[0190] Step D10: Displaying the material type of the material to be processed on the material type display control of the interactive interface; wherein the displaying the material type of the material to be processed includes displaying a material schematic diagram on the interactive interface, wherein the material schematic diagram displays the texture, material, and color of the corresponding material type;

[0191] In step D20 , the parameter configuration control of the interactive interface displays the processing parameter array corresponding to the material type.

[0192] Optionally, after step D20 , in response to a selection instruction for a processing effect diagram in the processing parameter array, final processing parameters are determined according to parameters of a target processing effect diagram corresponding to the selection instruction.

[0193] Building on the existing laser processing system interface, the layout has been further refined to create a dedicated information display area adjacent to the processing image display area, allowing operators to easily access key information while viewing the material image. This area is further divided into a material type display area and a parameter configuration display area, corresponding to the material type display control and parameter configuration control that will be presented, respectively.

[0194] Referring to Figure 8, a control in the form of a multi-level drop-down box is displayed in the material type display area. The parameter configuration display area is laid out in a table format as a parameter configuration control. The header part of the table displays the various processing parameter categories in bold font, such as laser power, laser pulse frequency, scanning speed, spot diameter, etc. Each row corresponds to a set of processing parameters. In addition to displaying specific parameter values ​​in the cell, a certain amount of space is reserved for displaying processing effect diagrams. These reference images are presented in the form of thumbnails with uniform size and appropriate resolution, which can show key details without taking up too much space. Initially, the table is filled with corresponding information based on the system preset or the default parameter group of the last processing, but the processing effect diagram is in an unloaded or default preview state.

[0195] Once the type of material to be processed is identified based on the tag information, the terminal system immediately retrieves this information and passes it as key data to the control logic module of the interactive interface. Upon receiving this information, the module triggers an update event for the material type display control. Based on the received trigger instruction, the material type display control populates the drop-down box with the type text of the material to be processed (e.g., "Walnut Sheet," "Acrylic Sheet (5mm Thickness)," etc.), in real time. This intuitively and clearly informs the operator of the specific type of material currently being processed, eliminating the need for complex operations to query the material type, allowing for a clear and intuitive view.

[0196] After learning the type of material to be processed, the terminal device quickly queries the local processing parameter database, and extracts multiple processing parameters that match the material type according to the preset screening rules and optimization algorithms to form a processing parameter array. These parameter groups cover optimization options under different working conditions. For example, for scenarios that pursue high-precision cutting, there is a set of parameters with low scanning speed, small spot diameter, high laser power and adaptive pulse frequency; for efficient batch processing, there is a set of parameters that focus on high scanning speed and appropriate power. For each extracted processing parameter, the corresponding processing effect diagram is obtained. These reference diagrams reflect the effects of processing surface quality, cutting edge status, engraving fineness, etc. that may be obtained by using different parameter groups in actual processing. According to the order of the parameter groups in the array, the processing effect diagrams are loaded into the corresponding positions in the table cells of the parameter configuration control.

[0197] The processing effect diagram is pre-generated. The terminal device uses the built-in simulation processing function module to perform virtual processing simulation according to the corresponding parameter set based on the digital model of the material to be processed (this model can be initially constructed based on the processing format image and material type information, including the material's basic physical properties, geometry, and other information). During the simulation, the physical model of the interaction between the laser and the material, such as the material's melting, vaporization, and heat conduction, is considered, and the processing effect diagram is finally generated.

[0198] Optionally, operators can intuitively see the array of processing parameters and a rich array of processing effect diagrams presented in the parameter configuration control on the interactive interface. They can hover the mouse over the reference diagram to view the enlarged details, compare the processing effects corresponding to different parameter groups, and select the most suitable set of parameters based on actual processing requirements (such as accuracy requirements, efficiency priority, etc.). When the operator clicks on the row where a parameter group is located, the parameter value corresponding to the row is highlighted to facilitate confirmation of the selection. At the same time, the system marks the selected parameter group as the current execution plan, ready to be applied to subsequent actual processing operations. The entire process realizes visual and interactive processing parameter optimization selection.

[0199] In a possible embodiment of the present application, a parameter configuration control is displayed in the interactive interface, the processing parameter array is in a picture format, and before the step of responding to an element selection operation on an array element in the processing parameter array and using processing parameter value information corresponding to the selected array element as a target processing parameter, the following steps are included:

[0200] Move the operation pointer to the parameter configuration control in the interactive interface, and the processing parameter array corresponding to the material type is displayed in the interactive interface when it is hovered;

[0201] The step of responding to a selection instruction for a processing effect diagram in the processing parameter array and using parameters of a target processing effect diagram corresponding to the selection instruction as final processing parameters includes:

[0202] In response to a hovering operation on the processing effect diagram of the processing parameter array, one of the processing effect diagrams in the hovered processing parameter array is clicked, and the array element corresponding to the selected processing effect diagram represents the reference processing parameter as the final processing parameter.

[0203] Furthermore, after the step of displaying the processing parameter array corresponding to the material type in the parameter configuration control of the interactive interface, it includes: responding to a selection instruction for the processing effect diagram in the processing parameter array, using the parameters of the target effect diagram corresponding to the selection instruction as the final processing parameters.

[0204] When the operator clicks on a processing effect diagram (i.e., the target effect diagram), the listener quickly captures this action, accurately locates the position of the clicked target effect diagram in the processing parameter array, and then extracts this set of parameters from the corresponding cell. For example, if the target effect diagram corresponds to a set of parameters designed to achieve fine engraving, where the laser power is 300W, the laser pulse frequency is 18kHz, the scanning speed is 500mm / s, and the spot diameter is 0.12mm, these values ​​are fully obtained. After extracting the parameters of the target effect diagram, the control logic module sets these parameters as the final processing parameters and updates the processing parameters in the system global state.

[0205] Furthermore, in order to let the operator know the current selection clearly, the following feedback measures are taken on the interactive interface: in the parameter configuration control area, the row where the selected target effect diagram is located is highlighted in a bright color (such as golden yellow) to make it stand out among the many parameter groups, and the parameter value corresponding to the row is displayed in a larger and more eye-catching font to facilitate reconfirmation. A brief confirmation message, such as "The processing parameters based on [target effect diagram] have been selected" is displayed in the status bar or dedicated prompt area of ​​the interactive interface to further enhance the operator's perception of selection. The final selected processing parameters are transmitted to the processing equipment in real time. The control system of the processing equipment receives and stores these parameters to prepare for the actual processing that is about to begin, ensuring that the processing process will be executed according to the operator's expected results.

[0206] Optionally, after determining the processing parameters, the method further includes:

[0207] In step D30 , the processing parameters are displayed in a parameter configuration control of the interactive interface. The processing parameters include a plurality of processing parameters, and a corresponding parameter adjustment control is displayed for each processing parameter in the parameter configuration control.

[0208] In this embodiment, the parameter adjustment control is an interactive element set in the parameter configuration control corresponding to each processing parameter, which is used by the user to conveniently change the numerical value of the processing parameter. It has various forms, such as a numerical input box, increase and decrease buttons, a sliding bar, etc. By operating these controls, the processing parameters can be adjusted intuitively to meet specific processing requirements.

[0209] After the system has determined the final processing parameters through a series of previous steps (such as material type identification, reference processing parameter screening, etc.), this set of processing parameters will be displayed in the parameter configuration control area on the right side of the interactive interface. For example, suppose the determined processing parameters include laser power of 50W, pulse frequency of 40kHz, scanning speed of 300mm / s, spot size of 0.15mm, and defocus of +1mm. In the parameter configuration control area, each processing parameter will have a corresponding display position and corresponding parameter adjustment controls. For the laser power parameter "50W", there may be a numerical input box next to it (the user can directly enter the desired value in the box), as well as "+" and "-" increase and decrease buttons (each click can increase or decrease the power value according to the preset step size); the pulse frequency "40kHz" may be paired with a slider control, and the user changes the frequency value by dragging the slider. At the same time, the current corresponding specific frequency value will be displayed in real time next to the slider; parameters such as scanning speed, spot size, and defocus are also equipped with corresponding appropriate parameter adjustment controls in a similar manner, so that users can clearly and intuitively see the current value of each processing parameter and perform subsequent adjustment operations.

[0210] Step D40 , in response to the adjustment operation on the parameter adjustment control, taking the adjusted processing parameters as the final processing parameters to determine the final processing parameters.

[0211] In this embodiment, adjustment operation refers to the behavior of the user operating the parameter adjustment control by clicking, dragging, keyboard input, etc. to change the original value of the processing parameter. This is an operation process of personalizing the determined processing parameters based on the user's specific requirements for the current processing task (such as pursuing higher processing accuracy, faster processing speed, etc.) and expectations for the processing effect.

[0212] Users can adjust the various parameter adjustment controls in the parameter configuration control according to the processing effect they want to achieve. For example, if the user wants to improve processing accuracy and feels that the current laser power may be slightly higher and affect the accuracy, they can click the "-" button corresponding to the laser power parameter or enter a slightly smaller value in the value input box (such as adjusting from 50W to 45W) to reduce the laser power. To speed up the processing, drag the scanning speed slider to increase the scanning speed value from 300mm / s to 400mm / s.

[0213] The system monitors every user action on the various parameter adjustment controls in real time. Once the user has made all necessary adjustments, the system recombines the adjusted values ​​of the various processing parameters to form a new set of processing parameters, which are then used as the final processing parameters. For example, after the above adjustments, the final processing parameters become: laser power 45W, pulse frequency 40kHz, scanning speed 400mm / s, spot size 0.15mm, and defocus distance +1mm. The system records this final set of processing parameters and uses it to control the laser processing equipment to perform actual processing operations, achieving the processing effect that meets the user's expectations.

[0214] For example, after the system identifies the specific type of plastic sheet through material type recognition, it then determines initial processing parameters through a series of screening operations, displaying these parameters in the parameter configuration area on the right side of the interactive interface. These initial processing parameters are set to 60W laser power, 30kHz pulse frequency, 500mm / s scan speed, 0.2mm spot size, and 0mm defocus. Within the parameter configuration area, each processing parameter has corresponding adjustment controls. Next to the "60W" laser power setting is a text box for entering a value and two small buttons, one labeled "+" and one labeled "-." Clicking "+" increases the power by 5W, while clicking "-" decreases it by 5W. The pulse frequency is represented by a slider labeled "Low" and "High." As you drag the slider, the corresponding frequency value is displayed in real time below. The scan speed is also adjusted using a slider, and the spot size and defocus each have their own parameter adjustment controls, each with a combination of input boxes and increase / decrease buttons. After reviewing the initial parameters, the staff member decided to reduce the laser power. The worker clicked the "-" button next to the laser power parameter twice, adjusting the laser power from 60W to 50W. At the same time, to maximize processing speed while maintaining accuracy, the worker dragged the scanning speed slider, increasing the scanning speed from 500mm / s to 600mm / s. The system captured the worker's manipulation of these parameter adjustment controls in real time and recorded the adjusted processing parameters of 50W laser power, 30kHz pulse frequency, 600mm / s scanning speed, 0.2mm spot size, and 0mm defocus as the final processing parameters. This final set of parameters was then used to control the laser processing equipment for the actual cutting operation.

[0215] Based on any of the above embodiments, in a possible embodiment of the present application, after the step of obtaining the processing parameters of the material to be processed based on the material type matching, the method includes:

[0216] Step S40, displaying a processing effect diagram corresponding to the processing parameters on an interactive interface;

[0217] Step S50 , in response to a selection instruction on the interactive interface for the processing effect diagram, executing a processing action on the material to be processed based on the processing parameters.

[0218] In this embodiment, the processing effect diagram is an image generated based on the determined processing parameters, either by simulating the processing process or by drawing on actual results from past processing of the same material using the same parameter set. It roughly illustrates the appearance of the material after processing using the current processing parameters. This allows users to intuitively understand the final processing results, including the processed shape, surface quality, and processing details, helping them determine whether the processing parameters meet their expectations.

[0219] After the system obtains the processing parameters of the material to be processed based on the material type matching, it immediately calls the pre-set processing effect simulation module or searches the past processing case library of the same parameter group and material (if any), and simulates the effect of the material to be processed based on the current processing parameters (such as the specific values ​​of parameters such as laser power, pulse frequency, scanning speed, spot size, defocus amount, etc.) or extracts the corresponding historical processing image data to generate the corresponding processing effect diagram. Then, the generated processing effect diagram is displayed in an appropriate position in the interactive interface, usually in a place in the main area that is convenient for users to view, such as near the display area for the processing format image and the processing element fusion display area, or below the parameter configuration control area, etc., in a conspicuous and logical position, with appropriate size and clarity, so that users can clearly observe the approximate effect after processing. For example, for engraving processing, the shape of the engraved pattern, line clarity, depth effect, etc. can be seen; for cutting processing, the flatness, width, etc. of the incision can be seen.

[0220] After viewing the processing effect diagram displayed on the interactive interface, the user will carefully observe whether the processing effect presented in the diagram meets the requirements of his processing task, such as whether the processing accuracy is up to standard, whether the overall appearance meets the design expectations, etc. If the user thinks that the effect shown in the processing effect diagram is satisfactory, he will use the mouse pointer to move to the processing effect diagram, and then click the left mouse button (taking the common computer operation as an example) to select the instruction. The system monitors the user's selection instruction for the processing effect diagram in real time, immediately starts the laser processing equipment, and transmits the determined processing parameters (specific values ​​of each parameter) to the control system of the processing equipment, so that it controls the laser head (or other processing execution components) according to these parameter settings to perform corresponding processing actions on the processing material, such as adjusting the power, pulse frequency, mobile scanning speed of the laser head, and performing specific processing operations such as cutting and engraving on the material to be processed according to the set parameters such as spot size and defocus amount until the entire processing task is completed.

[0221] For example, after the previous steps, the system identified that the material type of the material to be processed is oak, and then obtained a set of processing parameters based on the characteristics of oak, including laser power 80W, pulse frequency 50kHz, scanning speed 300mm / s, spot size 0.15mm, and defocus amount +1mm. Subsequently, the system generated a corresponding processing effect diagram based on this set of processing parameters and actual case data of engraving processing of oak materials with the same parameters in the past. The processing effect diagram is displayed below the main area of ​​the interactive interface, and presents the effect after engraving the company logo pattern with a clear picture. The lines of the logo appear to be uniform in thickness and smooth in edges. The engraving depth of the overall pattern is also relatively appropriate, which can well highlight the three-dimensional sense of the logo. The staff can clearly see the approximate appearance after the engraving is completed. The staff carefully examined the processing effect diagram and felt that all aspects met the requirements of this customized gift, so they clicked on the processing effect diagram with the mouse. The system immediately receives this selection instruction and immediately controls the laser processing equipment to operate according to the previously determined processing parameters. The laser head outputs a laser beam at a laser power of 80W and a pulse frequency of 50kHz, moving on the oak veneer at a scanning speed of 300mm / s. The processing action is performed based on parameter settings such as 0.15mm spot size and +1mm defocus.

[0222] For example, to help understand the technical concept or technical principle of the method for determining processing parameters after combining this embodiment with the above-mentioned first and second embodiments, please refer to FIG9 , which provides a simplified flow chart of the method for determining processing parameters, as follows:

[0223] When a user clicks the "Get Image" control on the interactive interface, the terminal device sends a command to the processing device, instructing it to capture an image of the processing area at the processing platform. The processing device then sends the image to the terminal device. The terminal device then calls the QR code / code recognition module to identify whether the processed image contains label information. If so, the terminal device determines the material type of the material to be processed based on the label information. The material to be processed is the material placed on the processing platform. If the processed image does not contain label information, the terminal device calls the intelligent recognition module to identify the material type. If the recognition is incorrect, meaning no material type is identified, a prompt indicating the recognition error is displayed. If the recognition is correct, meaning at least one candidate material type is identified, candidate boxes are displayed on the interactive interface, each corresponding to a candidate material type. In response to the user's selection command for a candidate box, the terminal device determines the candidate material type of the selected candidate box as the material type of the material to be processed. After determining the material type, the terminal device matches the material type to obtain processing parameters corresponding to the material to be processed and assigns these processing parameters to the processing device, allowing the processing device to perform processing actions on the material to be processed based on the processing parameters.

[0224] The embodiment of the present application further provides a method for determining processing parameters, with reference to FIG13 , which is a flow chart of the third embodiment of the present application.

[0225] In this embodiment, when a processing element is displayed in the interactive interface, the number of the processing element is at least one, and the method for determining the processing parameter includes steps S60 to S90:

[0226] Step S60, setting the processing element information of the processing element;

[0227] It should be noted that the processing element information includes the element information for processing the material to be processed, that is, the processing element information refers to the processing element information of the processing elements that are about to be processed on the material to be processed, such as the material type of the material to be processed (such as material, color, thickness, etc.), the type of processing equipment used (such as laser processing equipment, CNC tool bed, 3D printing equipment, etc.), the type of processing method used (such as laser line engraving, laser line cutting, laser fill engraving, tool cutting, inkjet printing, etc.), etc.

[0228] This embodiment can receive user input data and, by parsing the user input data, obtain and set processing element information for the material to be processed. This embodiment can also communicate with connected processing equipment to obtain and set device information for the processing equipment and material information for the material to be processed placed within the processing equipment. Based on the device information and material information, the processing element information for the material to be processed is obtained and set.

[0229] In a possible embodiment of the present application, the processing element information includes a material type and a processing type. At least two different material types and at least two different processing types are preset in the interactive interface. Step S60 includes steps S61 to S63:

[0230] Step S61, displaying a processing element on the interactive interface, wherein the processing element is a pattern expected to be processed on the material to be processed;

[0231] Step S62, in response to a selection instruction in the interactive interface, setting the material type of the material to be processed;

[0232] Step S63 , in response to the selection instruction in the interactive interface, setting the processing type of the processing element.

[0233] It can be understood that in the interactive interface displayed by the terminal device, at least one processing element is displayed, and the processing element is a pattern expected to be processed on the material to be processed. The interactive interface includes a material list control, and the material list control is preset with a variety of different material types of the material to be processed, and the material type of the material to be processed is set by selecting instructions; the interactive interface displayed by the terminal device also includes a processing type control, and the processing type control is preset with a variety of different processing types of the processing element, and the processing type of the processing element is set by selecting instructions.

[0234] In one possible embodiment, a corresponding processing parameter array is obtained based on the material type of the material to be processed and the processing type of the processing element; wherein, when the material type of the material to be processed is the same, the display effect of the corresponding processing parameter array is different when the processing type of the processing element is different.

[0235] In a possible embodiment, when the interactive interface displays multiple processing elements, after step S63, step S64 may also be included: setting the processing type of each processing element, and obtaining the corresponding processing parameter array according to the processing type of each processing element, wherein the multiple processing elements include at least two processing types, and at least two processing types correspond to at least two processing parameter arrays with different display effects.

[0236] Through step S64, since the processing element is a pattern expected to be processed on the material to be processed, when there are multiple processing elements, the processing types of the processing elements can be set separately, and different processing elements can be set to different processing types, that is, multiple different processing types can be achieved on the same material to be processed.

[0237] It is understood that the processing parameter array includes multiple array elements, and the multiple array elements can be arranged in a variety of ways. In some embodiments, the multiple array elements are arranged in parallel rows and columns, and each array element represents processing parameter information; alternatively, the processing parameter array is arranged in a circular form, and the array elements closer to the center of the circle represent smaller processing parameters, and the array elements farther from the center of the circle represent larger processing parameters; alternatively, the processing parameter array is arranged in a spiral form, and the array elements closer to the center of the spiral represent smaller processing parameters, and the array elements farther from the center of the spiral represent larger processing parameters.

[0238] In a possible embodiment of the present application, when a plurality of processing elements are displayed above the layer of the processing format image, step S62 includes:

[0239] In response to a selection instruction in the interactive interface, at least one of the processing elements is selected, and a processing type of the at least one processing element is set.

[0240] In the embodiment of the present application, since there are multiple processing types, the target processing type of the processing element can be set by selecting at least one processing element.

[0241] In a possible embodiment, in response to a selection instruction in the interactive interface, the step of selecting at least one of the processing elements and setting a processing type of the at least one processing element includes:

[0242] In response to a selection instruction in the interactive interface, simultaneously selecting at least two of the processing elements and setting processing types of the at least two processing elements;

[0243] And / or, in response to a selection instruction in the interactive interface, at least two of the processing elements are simultaneously selected to execute a combination instruction, and a processing type is set for the at least two processing elements after the combination instruction is executed.

[0244] It is understandable that in the interactive interface of the terminal device, at least two processing elements can be selected simultaneously by operating the pointer, and the processing types of at least two processing elements can be set simultaneously, that is, the processing types of multiple processing elements can be set in batches.

[0245] It can be understood that in the interactive interface of the terminal device, at least two processing elements can be selected at the same time through the operation pointer to execute the combination instruction. At least two processing elements that execute the combination operation are on the same layer, which facilitates the selection operation of processing elements of the same processing type and the processing type.

[0246] Through the embodiments of the present application, the user's freedom to edit multiple processing elements in the interactive interface of the terminal device is improved.

[0247] Step S70: displaying at least one processing effect diagram according to the processing element information; the processing effect diagram is mapped to the processing parameters;

[0248] It should be noted that the processing effect diagram is a preview of the processing effect under the processing element information. In this embodiment, the database storing the processing effect diagram can be accessed through an embedded site or an external browser. It is understood that the types of processing effect diagrams can include effect diagrams corresponding to multiple fixed sets of processing parameters, or corresponding real-time effect diagrams generated based on real-time processing parameters.

[0249] It should also be noted that there is a mapping relationship between the processing effect diagram and the processing parameters. That is, under the same processing element information, different processing parameters correspond to different processing effect diagrams. The processing parameters include the processing parameter values ​​of the parameter items in the processing parameters of the processing equipment, such as 80% processing power and 10 mm / s processing speed.

[0250] As an example, taking the type of the processing effect diagram as the effect diagram corresponding to multiple fixed sets of processing parameters as an example, the processing effect diagram includes a processing effect diagram corresponding to the processing parameter array. This embodiment can obtain the corresponding processing parameter array based on the processing element information, and display the processing parameter array on the interactive interface, wherein the processing parameter array includes multiple array elements, each of which represents a processing parameter, thereby directly providing the user with available processing parameters, and the user can intuitively understand the processing effects under different processing parameters, so that the user can select appropriate processing parameters.

[0251] As another example, taking the type of the processing effect diagram as generating a corresponding real-time effect diagram based on real-time processing parameters as an example, the interactive interface of this embodiment also includes a parameter configuration control, and the parameter configuration control includes at least a parameter adjustment control for the processing parameters. Thus, in response to the adjustment operation on the parameter adjustment control, this embodiment can display the adjusted processing parameters on the interactive interface, and then generate a processing effect diagram corresponding to the material to be processed based on the adjusted processing parameters and the processing element information, and display the processing effect diagram on the interactive interface. In the case where fixed processing parameters are difficult to meet user needs, this embodiment can generate a corresponding real-time effect diagram based on real-time processing parameters, so that the user can intuitively understand the processing effects corresponding to different processing parameters, which not only facilitates the selection of processing parameters, but also helps users clearly obtain processing effects that meet their needs.

[0252] In a possible embodiment of the present application, the processing types include laser line engraving, laser fill engraving, and laser line engraving, and the step of setting processing element information of the processing element and displaying at least one processing effect diagram according to the processing element information further includes:

[0253] In response to a selection instruction in the interactive interface, the material type of the material to be processed is set; according to the set material type, a processing effect diagram corresponding to the set material type is displayed, and the background of the processing effect diagram is filled with a material schematic diagram corresponding to the material type, and the material schematic diagram displays at least two of the texture, material and color of the corresponding material type;

[0254] In response to a selection instruction in the interactive interface, the processing type of the processing element is set; according to the set processing type, a reference pattern corresponding to the set processing type is displayed on the layer of the material schematic diagram, and the processing effect diagrams displayed by the laser line engraving, the laser fill engraving and the laser line cutting are different.

[0255] Referring to Figure 18, in one possible embodiment of the present application, the processing parameter array includes multiple processing effect diagrams, each of which has a material diagram as the background. The user previews the currently selected material type by displaying two of the texture, material, and color displayed in the material diagram. Each processing effect diagram also includes a reference pattern set on the layer of the material diagram, and the user previews the effect diagram of the currently selected processing type through the reference pattern. For example, in Figure 18, the processing parameter array includes multiple processing effect diagrams, each of which has a material diagram as the background, and "X" represents a reference pattern.

[0256] In a possible embodiment of the present application, the step of displaying a reference pattern corresponding to the set processing type above the layer of the material schematic diagram according to the set processing type includes:

[0257] In response to a selection instruction in the interactive interface, the material type of the material to be processed is set to laser line engraving, and a plurality of different reference patterns are displayed on the material schematic diagram according to the set material type, wherein the reference patterns are composed of lines, and the greater the target processing parameter, the darker the line color of the reference pattern;

[0258] and / or, in response to a selection instruction in the interactive interface, setting the material type of the material to be processed to laser fill engraving, and displaying a plurality of different reference patterns on the material schematic diagram according to the set material type, wherein the reference patterns are filled color blocks, and the greater the target processing parameter, the darker the color of the filled color blocks of the reference patterns;

[0259] And / or, in response to a selection instruction in the interactive interface, the material type of the material to be processed is set to laser line cutting, and a plurality of different reference patterns are displayed on the material schematic diagram according to the set material type, wherein the reference pattern is composed of lines, and the larger the target processing parameter, the darker the color of the lines of the reference pattern. When the target processing parameter is sufficient to cut the material to be processed, the part enclosed by the lines of the reference pattern is displayed as a hollow pattern.

[0260] It is understood that the terminal device has preset material diagrams corresponding to each material type. The material diagrams can display the material's material, color, texture, etc. It is understood that the terminal device has preset reference patterns corresponding to each processing type. For example, when the processing type is laser line engraving, the reference pattern above the material diagram consists of lines, indicating that the surface of the material to be processed will be laser engraved along the lines during the actual processing; when the processing type is laser fill engraving, the reference pattern above the material diagram is a filled pattern, indicating that the surface of the material to be processed will be laser engraved during the actual processing; when the processing type is laser line cutting, the reference pattern above the material diagram is a hollowed pattern, indicating that the surface of the material to be processed will be laser cut along the lines during the actual processing. Users can select the corresponding material type in the terminal device based on the desired processing effect.

[0261] Step S80, in response to the selection instruction for the processing effect diagram, determining the processing parameters corresponding to the selection instruction, and using the processing parameters corresponding to the selection instruction as target processing parameters, wherein the target processing parameters are used to control the processing equipment to process the material to be processed.

[0262] After displaying the processing effect diagram, this embodiment can determine the processing parameters pointed to by the selection instruction in response to the selection instruction for the processing effect diagram, wherein the selection instruction includes but is not limited to single-click, double-click and other operation behaviors that represent the selection. Then, the processing parameters corresponding to the selection instruction can be used as target processing parameters, and the target processing parameters are used to control the processing equipment to process the material to be processed. It can be understood that after the target processing parameters are determined, they can be used directly for processing, shared with other users, and saved for subsequent use. Exemplarily, this embodiment can send the target processing parameters to the connected processing equipment so that the processing equipment can process the material to be processed according to the target processing parameters. Exemplarily, this embodiment can also send the selected target processing parameters as shared processing parameters to the target sharing object.

[0263] In one feasible embodiment, after step S80, the method for determining the processing parameters includes steps S90 to S100:

[0264] Step S90, generating a corresponding processing execution instruction in response to the parameter application instruction, wherein the processing execution instruction includes an execution instruction and a motion plan;

[0265] Step S100: sending the processing execution instruction to the processing equipment, so that the processing equipment processes the material to be processed according to the motion plan based on the execution instruction.

[0266] In this embodiment, after receiving the parameter application instruction, a corresponding processing execution instruction, such as a Gcode instruction, can be generated based on the target processing parameters. Therefore, after sending the processing execution instruction to the processing equipment, the processing equipment can execute the processing execution instruction to process the material to be processed according to the target processing parameters.

[0267] In a feasible embodiment, after step S80, the method for determining the processing parameters further includes steps S110 to S130:

[0268] Step S110 , displaying a parameter sharing interface, wherein the parameter sharing interface includes the target processing parameters;

[0269] Step S120 , in response to a sharing instruction on the displayed parameter sharing interface, taking the target processing parameter pointed to by the sharing instruction as the shared processing parameter, and taking the to-be-shared object pointed to by the sharing instruction as the target sharing object;

[0270] Step S130 : sending the shared processing parameters to the target sharing object.

[0271] It should be noted that the parameter sharing interface includes at least one set of target processing parameters.

[0272] This embodiment can display a parameter sharing interface, and the user can select the target processing parameters in the parameter sharing interface. Then, this embodiment can respond to the sharing instruction for the displayed parameter sharing interface and use the target processing parameters pointed to by the sharing instruction as the shared processing parameters. And the object to be shared pointed to by the sharing instruction is used as the target sharing object. The object to be shared can be a predetermined communication account (such as an account of various communication software or mailbox), or it can be a user account displayed on the parameter sharing interface. Then, the shared processing parameters can be sent to the target sharing object. It can be understood that the shared processing parameters can include one or more target processing parameters, and the target sharing object can include one or more objects to be shared.

[0273] This embodiment displays a parameter sharing interface, and in response to a sharing instruction for the displayed parameter sharing interface, uses the target processing parameter pointed to by the sharing instruction as the shared processing parameter, uses the object to be shared pointed to by the sharing instruction as the target sharing object, and then sends the shared processing parameter to the target sharing object, thereby realizing the sharing of the target processing parameter among users, which not only improves the interactivity between users in the processing scenario, but also facilitates other users to quickly obtain the corresponding processing parameter information.

[0274] One embodiment of the present application provides a method for determining processing parameters. The method obtains processing element information of a material to be processed, thereby obtaining the processing element information of the material to be processed. Furthermore, based on the processing element information, at least one processing effect diagram is displayed. The processing effect diagram is mapped to the processing parameters, providing corresponding processing effect diagrams for different processing parameters. Thus, a user can select a corresponding processing effect diagram based on different processing effect requirements. Therefore, in response to a selection instruction for the processing effect diagram, the present embodiment can determine the processing parameter corresponding to the selection instruction and use the processing parameter corresponding to the selection instruction as a target processing parameter. The target processing parameter is used to control a processing device to process the material to be processed. Compared to a method in which each processing parameter requires the user to adjust each one individually before obtaining the appropriate target processing parameter, the present application pre-displays processing effect diagrams related to the processing element information. After the user has learned about the effect examples related to the processing element information, the user can select a processing effect diagram that meets their requirements and use the processing parameters corresponding to the selected processing effect diagram as the target processing parameters. This allows the user to quickly determine processing parameters that match the workpiece being processed, effectively improving the efficiency of selecting processing parameters that meet the user's requirements and making it easier for the user to obtain a more satisfactory processing effect.

[0275] Based on the third embodiment of the present application, in the fourth embodiment of the present application, the same or similar contents as those in the third embodiment can be referred to above and will not be described in detail. On this basis, please refer to FIG. 14 , the processing effect diagram includes a processing effect diagram corresponding to the processing parameter array; step S70 also includes step M10:

[0276] Step M10: acquiring a corresponding processing parameter array based on the processing element information, and displaying the processing parameter array on an interactive interface, wherein the processing parameter array includes a plurality of array elements, each of which represents a processing parameter, and the processing effect graph includes a plurality of processing effect graphs corresponding to the array elements of the processing parameter array;

[0277] Step S80 includes step M20:

[0278] Step M20 , in response to an element selection instruction for an array element in the processing parameter array, taking the processing parameter corresponding to the selected array element as the target processing parameter.

[0279] It should be noted that the processing effect diagram includes a processing effect diagram corresponding to an array element of a processing parameter array, and the processing parameter array includes multiple array elements, each of which represents a processing parameter. As an example, an array element can represent a processing parameter of one dimension. For example, different array elements can differ only in the numerical value of the processing power, or different array elements can differ only in the numerical value of the processing speed. As an example, an array element can represent processing parameters of two dimensions. For example, an array element can represent numerical information of processing speed and processing power. As an example, an array element can also represent processing parameters of three or more dimensions.

[0280] The following is an example of an array element representing a processing parameter of two dimensions. See Figures 15 and 16, both of which are example diagrams of the processing parameter array involved in the embodiments of the present application. Figure 15 is the processing parameter array corresponding to the processing equipment using laser as the processing means, and Figure 16 is the processing parameter array corresponding to the processing equipment using tool as the processing means. The processing parameter array includes parameter items of the processing parameters and their numerical ranges. The processing rate, processing power and tool pressure are parameter items of the processing parameters. The processing power in Figure 15 is the laser power, and the tool pressure in Figure 16 is the cutting pressure of the tool. The "X"-shaped graphics in Figures 15 and 16 are array elements of the processing parameter array. Each array element corresponds to a processing parameter. For example, each array element in Figure 15 corresponds to a combination of a processing power value and a processing rate value (i.e., a processing parameter), and each array element in Figure 16 corresponds to a combination of a tool pressure value and a processing rate value (i.e., a processing parameter). The processing parameter array displayed in the interactive interface can also display information such as the material type and processing equipment type in the processing element information.

[0281] In this embodiment, there is a mapping relationship between the processing parameter array and the processing elements, so this embodiment can find the processing parameter array corresponding to the processing element information based on this mapping relationship. Furthermore, this embodiment can display the processing parameter array on an interactive interface, wherein the processing parameter array includes multiple array elements, each of which represents a processing parameter, so that the user can intuitively understand the processing effects under multiple sets of different processing parameters. Furthermore, the user can select an array element that meets the requirements from this processing parameter array, and this embodiment can respond to the element selection instruction for the array element in the processing parameter array and use the processing parameter corresponding to the selected array element as the target processing parameter.

[0282] This embodiment provides a processing parameter array composed of array elements corresponding to multiple groups of processing parameters for user selection, so that in the processing parameter array, there are multiple array elements, and the user can select array elements from the processing parameter array adapted to the material to be processed according to his or her own personalized needs, thereby using the processing parameter information corresponding to the array element as the target processing parameter. Compared with requiring the user to debug each processing parameter one by one to obtain the appropriate target processing parameter, this embodiment can effectively improve the efficiency of selecting processing parameters that meet the user's needs, and it is also more convenient for the user to obtain a more satisfactory processing effect.

[0283] It is understood that the processing effect diagram can be a processing effect diagram corresponding to the processing parameter array. As shown in Figure 18, the processing parameter array is provided with multiple processing effect diagrams, each of which has different preset processing parameters and processing element information, so as to respectively display simulation effect diagrams under different preset processing parameters and processing element information. Alternatively, the processing effect diagram can also be a processing effect diagram corresponding to the processing element. As shown in Figure 4, the background of the editing area of ​​the interactive interface is filled with a material schematic corresponding to the material type of the material to be processed, and the material schematic has a processing element "HELLO" on it. By adjusting the processing parameters, the processing effect of the processing element "HELLO" being processed into the material to be processed can be simulated.

[0284] In a feasible embodiment, the array element includes at least a first parameter item and a second parameter item. Before the step of obtaining the corresponding processing parameter array in step M10, steps N10 to N30 are included:

[0285] Step N10, determining a first sorting position of each array element in the first direction based on the processing parameter value of the first parameter item corresponding to each array element;

[0286] Step N20, determining a second sorting position of each array element in the second direction based on the processing parameter value of the second parameter item corresponding to each array element;

[0287] Step N30 , arranging each array element based on the first sorting position and the second sorting position of each array element to obtain the processing parameter array.

[0288] In this embodiment, the processing parameters include at least a first parameter item and a second parameter item as an example. It is understood that the processing parameters may include processing parameter values ​​for more or fewer parameter items. In the process of constructing the processing array parameters, this embodiment may determine a first sorting position for each array element in the first direction based on the processing parameter value of the first parameter item corresponding to each array element. The first sorting position may be determined in ascending order, i.e., the larger the processing parameter value of the first parameter item, the higher the first sorting position in the first direction. The first sorting position may also be determined in descending order, i.e., the larger the processing parameter value of the first parameter item, the lower the first sorting position in the first direction. The second sorting position for each array element in the second direction is determined based on the processing parameter value of the second parameter item corresponding to each array element. Similarly, the second sorting position may be determined in ascending order, i.e., the larger the processing parameter value of the second parameter item, the more to the right of the second sorting position in the second direction. The second sorting position may also be determined in descending order, i.e., the larger the processing parameter value of the second parameter item, the more to the left of the second sorting position in the second direction. Furthermore, each array element may be arranged based on the first sorting position and the second sorting position of each array element to obtain the processing parameter array.

[0289] In one embodiment, the processing parameter of the first parameter item is positively correlated with the arrangement order of the first sorting positions in the predetermined first direction; for example, the larger the processing parameter value of the first parameter item, the higher the first sorting position in the first direction;

[0290] The processing parameter of the second parameter item is positively correlated with the arrangement order of the second sorting position in the predetermined second direction; for example, the larger the processing parameter value of the second parameter item, the further to the right the second sorting position is in the second direction.

[0291] In one embodiment, the array element includes a reference pattern, which is a processing effect diagram generated based on processing parameters, and the reference pattern includes a pattern composed of lines.

[0292] In this embodiment, a processed image can be obtained after processing based on the processing parameters, and then the processed image can be intercepted according to a predetermined shape (such as X-shape, circle, rectangle, etc.) to obtain a processing effect diagram (i.e., a reference pattern), and then the reference pattern is used as an array element of the processing parameter array.

[0293] In a feasible embodiment, the processing parameter array also displays corresponding processing element information, and the processing element information includes at least one of material type, processing equipment type, and processing type.

[0294] In this embodiment, the processing parameter array also displays corresponding processing element information, including at least one of material type, processing equipment type, and processing type, so that the user can check whether the processing element information is correct when selecting an array element.

[0295] In a feasible embodiment, the processing parameter array is in a picture format, and steps O10 to O30 are included before step M20:

[0296] Step O10, in response to a hovering operation on the processing parameter array in the image format, obtaining a relative position of an operation position of the hovering operation with respect to the processing parameter array;

[0297] Step O20, determining, based on the relative position, the array element in the processing parameter array to which the hovering operation points, and the element position of the array element;

[0298] Step O30: Display a hovering identification image at the element position, wherein the hovering identification image includes an identification effect image matching the pattern size of the array element and processing parameters representing the array element.

[0299] It should be noted that the hover operation is to move the operation pointer to an object and temporarily stop there without clicking. The hover identification image is an effect image used to identify the hover operation, such as skinning, frame lines, etc.

[0300] In the case where the processing parameter array is in image format, when the user moves the operation pointer to a certain array element, the processing parameter array cannot provide feedback, so the user may find it difficult to intuitively understand whether the desired array element has been selected. Therefore, this embodiment can obtain the relative position of the operation position of the hovering operation relative to the processing parameter array in the image format in response to a hovering operation on the processing parameter array in the image format. Then, based on the relative position, it can be determined that the array element in the processing parameter array to which the hovering operation points and the element position of the array element can be determined. As shown in Figure 17, this embodiment can display a hovering identification image at the element position, and the hovering identification image includes an identification effect image that matches the pattern size of the array element (such as the green dotted box in Figure 17) and the processing parameters represented by the array element. Exemplarily, in order to ensure that the size of the hovering identification image always matches the selected array element, this embodiment can convert the original image of the hovering identification image into pixel form using the mmTOpx (millimeter to pixel) method to avoid the difficulty of matching the hovering identification image with the pattern size of the array element due to changes in screen specifications on different display devices. The expression of the mmTOpx method as a JavaScript function is as follows:

[0301] const mmtoPx=(mm:number,width:number)=>{

[0302] return `${mm*(width / 180)}px`

[0303] }

[0304] Wherein, mm represents the size of each hover mark, and width represents the size of the processing parameter array.

[0305] This embodiment, in response to a hover operation on the image-formatted processing parameter array, obtains the relative position of the hover operation position relative to the processing parameter array. Based on the relative position, it determines the array element in the processing parameter array to which the hover operation is directed, as well as the element position of the array element. A hover identification image is then displayed at the element position. The hover identification image includes an identification effect image that matches the pattern size of the array element, as well as the processing parameter represented by the array element. This provides intuitive feedback to users even for image-formatted processing parameter arrays, effectively improving the user's intuitiveness in selecting array elements.

[0306] In one feasible embodiment, the step of displaying the processing parameter array on the interactive interface in step M10 includes steps P10 to P20:

[0307] Step P10: displaying a parameter configuration control on the interactive interface, wherein the parameter configuration control at least includes the processing parameter array;

[0308] Step P20 , in response to a selection instruction for the processing parameter array, amplifying the processing parameter array and then displaying it on the interactive interface.

[0309] This embodiment can also display a parameter configuration control on the interactive interface, wherein the parameter configuration control includes at least the processing parameter array. Thus, the user can preview the processing parameter array on the parameter configuration control and, after confirming that the processing parameter array meets the requirements, click the processing parameter array on the parameter configuration control. Furthermore, this embodiment can respond to a selection instruction for the processing parameter array by enlarging the processing parameter array and displaying it on the interactive interface, thereby improving the display effect of the processing parameter array.

[0310] In one feasible embodiment, referring to FIG. 4 , a processing element is displayed in the editing area of ​​the interactive interface. The processing element is a pattern expected to be processed on the material to be processed, such as “HELLO” in the figure. The interactive interface also displays a parameter configuration control. The parameter configuration control includes at least a parameter adjustment control for the processing parameter.

[0311] After the step of using the processing parameters corresponding to the selected array elements as target processing parameters in step M20, the method for determining the processing parameters includes step E10:

[0312] Step E10 : In response to the adjustment operation on the parameter adjustment control, the adjusted processing parameters are used as new target processing parameters.

[0313] As shown in FIG18 , the interactive interface also displays a parameter configuration control, which includes at least a parameter adjustment control for a processing parameter. Thus, after a user responds to an element selection instruction for an array element in the processing parameter array and selects the processing parameter corresponding to the selected array element as a target processing parameter, the user can adjust the target processing parameter using the parameter adjustment control on the parameter configuration control. Furthermore, this embodiment can respond to an adjustment operation on the parameter adjustment control and use the adjusted processing parameter as the new target processing parameter. Thus, this embodiment not only provides users with a variety of processing parameters, but also supports users in making further adjustments based on the selected target processing parameters, making the target processing parameters more tailored to user needs.

[0314] In a feasible embodiment, please continue to refer to FIG. 4 , after step E10, the method further includes step E20:

[0315] Step E20: Based on the target processing parameters and the processing element information, generate a processing effect diagram corresponding to the processing element, and display the processing effect diagram corresponding to the processing element on the interactive interface, wherein the processing effect diagram corresponding to the processing element is the processing effect presented by the processing element under the target processing parameters and the processing element information.

[0316] Specifically, FIG4 shows an embodiment of a processing effect diagram corresponding to a material to be processed. In the editing area of ​​the interactive interface, the background of the editing area is filled with a material schematic diagram corresponding to the material type of the material to be processed. There is a processing element "HELLO" on the material schematic diagram. By adjusting the processing parameters, the processing effect of the processing element "HELLO" being processed onto the material to be processed can be simulated. For example, the processing parameters include laser processing power, and the material type of the material to be processed is "walnut". When the adjusted laser processing power parameter gradually increases, burn marks gradually appear around the processing element "HELLO". This simulation simulates that when the laser processing power is greater, the burn marks on the walnut surface are more obvious. Therefore, through the simulation processing effect of the embodiment of the present application, the processing effect diagram corresponding to the processing element under the current processing parameters can be previewed, and the corresponding processing effect diagram can be dynamically displayed according to the adjustment of the processing parameters, thereby improving the processing quality of the material to be processed by the user.

[0317] Although the processing parameter array includes processing effect diagrams corresponding to multiple fixed sets of processing parameters, if the adjusted processing parameters are different from the processing parameters represented by each array element in the processing parameter array, the processing effect diagram displayed by the processing parameter array cannot be adapted to the new target processing parameters. Therefore, after obtaining the new target processing parameters, this embodiment can generate a processing effect diagram of the processing element based on the target processing parameters and the processing element information. As an example, this embodiment can simulate the processing effect of the material to be processed based on the target processing parameters and the processing element information to generate a processing effect diagram corresponding to the material to be processed. For example, if the user expects to engrave a cat pattern on the material to be processed, and the cat is the processing element of this embodiment, this embodiment simulates the engraving effect of the cat pattern on the material to be processed under the target processing parameters and the processing element information. In addition, this embodiment can also only provide the effect image of the surface of the material to be processed after processing. For example, this embodiment can search for the processed image that matches the new target processing parameters and the processing element information from a predetermined processing effect image library, wherein the predetermined processing effect image library is a database that pre-stores processed images obtained by processing under different processing parameter values ​​and processing elements. This embodiment can intercept the processed image that matches the adjusted processing parameters and the processing element information according to a predetermined shape (such as an X shape, a circle, a rectangle, etc.) to obtain the processing effect image corresponding to the processing element. In addition, this embodiment can also use a simulation method to simulate the processed image of the adjusted processing parameters and the processing element information according to the adjusted processing parameters and the processing element information, and then intercept the processed image that matches the adjusted processing parameters and the processing element information according to a predetermined shape (such as an X shape, a circle, a rectangle, etc.) to obtain the processing effect image corresponding to the processing element, and then display the processing effect image on the interactive interface for the user to view. Therefore, this embodiment can generate corresponding processing effect diagrams in real time as the user adjusts the new target processing parameters, so that the user can intuitively understand the processing effect diagrams corresponding to the new target processing parameters. This can greatly improve the efficiency of selecting processing parameters that meet user needs and make it easier for users to obtain more satisfactory processing effects.

[0318] In a feasible embodiment, before the step of obtaining the corresponding processing parameter array in step M10, steps F10 to F40 are further included:

[0319] Step F10, selecting at least one processing parameter and its candidate value range;

[0320] Step F20, performing a processing test according to the at least one processing parameter and its candidate value range under the set processing element, to obtain a test result corresponding to the processing element, wherein the set processing element at least includes a material type of the specified material to be processed;

[0321] Step F30 , adjusting the candidate numerical range of the at least one processing parameter according to the test result to obtain a target numerical range of the at least one processing parameter corresponding to the processing element;

[0322] Step F40 , using the at least one processing parameter as a dimension of a processing parameter array, selecting processing parameters from the target numerical range as array elements of the processing parameter array, and obtaining a processing parameter array.

[0323] It should be noted that the set processing factors include at least the material type of the material to be processed, and may also include factors such as equipment type and processing type.

[0324] In this embodiment, at least one processing parameter (such as processing power, tool pressure, processing rate, etc.) and its candidate numerical range can be selected, and then under the set processing elements, a processing test is performed according to the at least one processing parameter and its candidate numerical range to obtain the test result corresponding to the processing element, wherein the test result is the workpiece performance of the workpiece obtained by processing under the set processing elements, and the workpiece performance at least includes the surface effect of the workpiece. Then, according to the test result, the candidate numerical range of the at least one processing parameter can be adjusted to obtain the target numerical range of the at least one processing parameter corresponding to the processing element, and the target numerical range is the candidate numerical range in which the test result meets the expectation, that is, the candidate numerical range with better workpiece surface effect. Subsequently, in this embodiment, the at least one processing parameter can be used as the dimension of the processing parameter array, and the processing parameter can be selected from the target numerical range as the array element of the processing parameter array to obtain the processing parameter array. Exemplarily, in this embodiment, the processing parameter value can be selected from the target numerical range of the processing parameter, and the processing parameter can be used as the array element of the processing parameter array, and the processing parameter includes at least one processing parameter value. The method of selecting the processing parameter values ​​may be random sampling, equal-interval sampling, sampling a predetermined number of processing parameter values ​​with the best surface effects, etc., which is not limited in this embodiment.

[0325] In a feasible embodiment, after the step of using the at least one processing parameter as a dimension of a processing parameter array and selecting processing parameters from the target numerical range as array elements of the processing parameter array to obtain the processing parameter array in step F40, the method further includes step F50:

[0326] Step F50 , storing the processing parameter array and the mapping relationship between the processing elements and the processing parameter array.

[0327] After constructing the processing parameter array, this embodiment can store the processing parameter array and the mapping relationship between the processing elements and the processing parameter array. Exemplarily, this embodiment can store the processing parameter array and the mapping relationship between the processing elements and the processing parameter array in a local database or a cloud database.

[0328] In one possible embodiment, step F40 includes steps G10 to G30:

[0329] Step G10, using the at least one processing parameter as a dimension of a processing parameter array, and selecting a processing parameter from the target value range;

[0330] Step G20, generating a corresponding processing effect diagram based on the selected processing parameters, and using the processing effect diagram as a reference pattern;

[0331] Step G30: Using the reference pattern as an array element of the processing parameter array to obtain a processing parameter array.

[0332] In this embodiment, the at least one processing parameter is used as a dimension of the processing parameter array, and the processing parameter is selected from the target numerical range. Furthermore, based on the selected processing parameters, the embodiment generates a corresponding processing effect diagram, and uses the processing effect diagram as a reference pattern. Exemplarily, if there is a processed image corresponding to the selected processing parameter in the test result, the processed image corresponding to the selected processing parameter can be directly intercepted in a predetermined shape (such as X-shaped, circular, rectangular, etc.) to obtain a processing effect diagram (i.e., a reference pattern). If there is a processed image corresponding to the selected processing parameter in the test result, it can be processed according to the selected processing parameter, or a simulation method can be used to obtain the processed image corresponding to the selected processing parameter, and then the processed image corresponding to the selected processing parameter can be intercepted in a predetermined shape (such as X-shaped, circular, rectangular, etc.) to obtain a processing effect diagram (i.e., a reference pattern). Furthermore, the reference pattern can be used as an array element of the processing parameter array to obtain a processing parameter array.

[0333] This embodiment directly uses the processing effect diagram as an array element of the processing parameter array, which helps users to more conveniently understand the processing effects that can be brought about by the processing parameters represented by each array element.

[0334] In a feasible embodiment, the processing element information includes at least the material type. The step of acquiring the corresponding processing parameter array according to the processing element information in step M10 includes steps H10 to H20:

[0335] Step H10: obtaining an element-array mapping table, wherein the element-array mapping table is used to describe the mapping relationship between the processing elements and the processing parameter arrays;

[0336] Step H20: query the element-array mapping table according to the material type to obtain a processing parameter array that matches the material type.

[0337] In this embodiment, the mapping relationship between the processing elements and the processing parameter array can be described in the form of a mapping table. Therefore, this embodiment can obtain an element-array mapping table, wherein the element-array mapping table is used to describe the mapping relationship between the processing elements and the processing parameter array. Then, according to the material type, the element-array mapping table can be queried to obtain a processing parameter array that matches the material type.

[0338] In one feasible embodiment, the processing element information further includes at least one of a processing equipment type and a processing type. The step of acquiring a corresponding processing parameter array based on the processing element information in step M10 further includes one of steps I10 to I30:

[0339] Step I10: query the element-array mapping table according to the material type and the processing equipment type to obtain a processing parameter array that matches the material type and the processing equipment type; or

[0340] Step I20: querying the element-array mapping table according to the material type and the processing type to obtain a processing parameter array that matches the material type and the processing type; or

[0341] Step I30: query the element-array mapping table according to the material type, the processing equipment type, and the processing type to obtain a processing parameter array that matches the material type, the processing equipment type, and the processing type.

[0342] Since the processing element information may also include at least one of the processing equipment type and the processing type, in this embodiment, if the processing element information includes the material type and the processing equipment type, the element-array mapping table may be queried based on the material type and the processing equipment type to obtain a processing parameter array that matches the material type and the processing equipment type. If the processing element information includes the material type and the processing type, the element-array mapping table may be queried based on the material type and the processing type to obtain a processing parameter array that matches the material type and the processing type. If the processing element information includes the material type, the processing equipment type, and the processing type, the element-array mapping table may be queried based on the material type, the processing equipment type, and the processing type to obtain a processing parameter array that matches the material type, the processing equipment type, and the processing type.

[0343] In a feasible embodiment, after step S60, the method for determining the processing parameters further includes steps J10 to J20:

[0344] Step J10, sending the processing element information to a setting server, so that the setting server matches a corresponding processing parameter array according to the processing element information and feeds back the processing parameter array;

[0345] Step J20 , displaying the received processing parameter array, and in response to an element selection instruction for an array element in the processing parameter array, using the processing parameter information value corresponding to the selected array element as the target processing parameter.

[0346] This embodiment can also have a preset server perform the matching of processing element information with a processing parameter array, thereby reducing the operational resource requirements of the terminal device and improving efficiency. This embodiment can send the processing element information to a configuration server, which then matches the corresponding processing parameter array based on the processing element information and returns the processing parameter array. The configuration server can be a cloud server or a physical server. The received processing parameter array is displayed, and in response to an element selection instruction for an array element in the processing parameter array, the processing parameter information value corresponding to the selected array element is used as the target processing parameter. As an example, this embodiment can access a database storing the processing effect diagram through an embedded site. After determining the target processing parameters, a 'webCommandMaterial' event is sent. When the processing device monitors the 'webCommandMaterial' event and successfully receives the 'webCommandMaterial' event, the processing device can call an interface to receive the target processing parameters and then process the material to be processed according to the target processing parameters. As another example, this embodiment can invoke the processing equipment through a custom protocol. After the processing equipment is started, the processing element information is loaded locally through the 'webCommandMaterial' event, and the database storing the processing effect diagram is accessed through an external browser to determine the target processing parameters corresponding to the processing element information.

[0347] Therefore, this embodiment effectively reduces the pressure on the terminal device of this embodiment and improves the efficiency of determining processing parameters by setting the server to store and implement the operation of matching processing element information with the processing parameter array.

[0348] Based on the third embodiment of the present application, in the fifth embodiment of the present application, the same or similar contents as those in the third and second embodiments above can be referred to above and will not be described in detail. On this basis, please refer to Figure 19, step S70 also includes steps K10 to K30:

[0349] Step K10: displaying an interactive interface, wherein the interactive interface further includes a parameter configuration control, and the parameter configuration control at least includes a parameter adjustment control for a processing parameter;

[0350] Step K20, in response to the adjustment operation on the parameter adjustment control, displaying the adjusted processing parameters on the interactive interface;

[0351] Step K30: generating a processing effect diagram corresponding to the material to be processed according to the adjusted processing parameters and the processing element information, and displaying the processing effect diagram on the interactive interface.

[0352] As shown in Figure 20, this embodiment can display an interactive interface, which also includes a parameter configuration control, and the parameter configuration control includes at least a parameter adjustment control for the processing parameters. The user can thereby adjust the processing parameters, and this embodiment can display the adjusted processing parameters on the interactive interface in response to the adjustment operation on the parameter adjustment control. Furthermore, this embodiment can generate a processing effect diagram corresponding to the material to be processed based on the adjusted processing parameters and the processing element information, and display the processing effect diagram on the interactive interface. As an example, this embodiment can simulate the processing effect of the material to be processed based on the adjusted processing parameters and the processing element information, and generate a processing effect diagram corresponding to the material to be processed. For example, if the user wishes to carve a cat pattern on the material to be processed, this embodiment simulates the carving effect of the cat pattern on the material to be processed under the adjusted processing parameters and the processing element information. In addition, this embodiment can also only provide the effect image of the surface of the material to be processed after processing. For example, the method of generating the processing effect image corresponding to the material to be processed in this embodiment can be by searching for a processed image that matches the adjusted processing parameters and the processing element information from a predetermined processing effect image library based on the adjusted processing parameters and the processing element information, wherein the predetermined processing effect image library is a database that pre-stores processed images obtained by processing under different processing parameter values ​​and processing elements. In this embodiment, the processed image that matches the adjusted processing parameters and the processing element information can be intercepted according to a predetermined shape (such as an X-shape, a circle, a rectangle, etc.) to obtain the processing effect image corresponding to the material to be processed. In addition, this embodiment can also use a simulation method to simulate the processed image after the adjusted processing parameters and the processing element information, and then intercept the processed image that matches the adjusted processing parameters and the processing element information according to a predetermined shape (such as an X-shape, a circle, a rectangle, etc.) to obtain the processing effect image corresponding to the material to be processed, and then display the processing effect image on the interactive interface for the user to view.

[0353] In one feasible embodiment, step S80 further includes steps L10 to L20:

[0354] Step L10, when no adjustment operation for the parameter adjustment control is received within a set time period, determining a processing effect image corresponding to the last adjustment operation;

[0355] Step L20 , in response to a selection instruction for the processing effect diagram corresponding to the last adjustment operation, taking the adjusted processing parameters corresponding to the last adjustment operation as target processing parameters.

[0356] In this embodiment, since the processing effect image changes in real time as the user adjusts the processing parameters, this embodiment can determine the processing effect image corresponding to the last adjustment operation when no adjustment operation is received for the parameter adjustment control within a set time period (such as 5 seconds, 8 seconds, 10 seconds, etc.). The user can then select the processing effect image corresponding to the last adjustment operation, and this embodiment can respond to the selection instruction for the processing effect image corresponding to the last adjustment operation and use the adjusted processing parameters corresponding to the last adjustment operation as the target processing parameters.

[0357] The fifth embodiment of the present application displays an interactive interface, which also includes parameter configuration controls, including at least parameter adjustment controls for processing parameters; in response to an adjustment operation on the parameter adjustment controls, the adjusted processing parameters are displayed on the interactive interface; based on the adjusted processing parameters and the processing element information, a processing effect diagram corresponding to the material to be processed is generated and displayed on the interactive interface. Thus, the processing effect diagram displayed in this embodiment changes in real time as the user adjusts the processing parameters, allowing the user to make selections based on the processing effect diagram. This can greatly improve the efficiency of selecting processing parameters that meet user needs and make it easier for users to obtain more satisfactory processing results.

[0358] As a feasible embodiment, the fourth and fifth embodiments of the processing parameter determination method of the present application can be combined. Specifically, after responding to an element selection instruction for an array element in the processing parameter array in step M10 and selecting the processing parameter corresponding to the selected array element as the target processing parameter, this embodiment executes step K10: displaying an interactive interface, wherein the interactive interface also includes parameter configuration controls, which include at least parameter adjustment controls for the processing parameters. Furthermore, in response to an adjustment operation on the parameter adjustment controls, the adjusted processing parameters are displayed on the interactive interface; and based on the adjusted processing parameters and the processing element information, a processing effect diagram corresponding to the material to be processed is generated and displayed on the interactive interface. Referring to FIG. 12 , this embodiment first presents a fixed processing parameter array corresponding to multiple sets of processing parameters for user selection. If the processing parameters represented by each array element in the processing parameter array do not meet the user's requirements, the user can adjust the processing parameters by using the parameter adjustment controls. This embodiment then generates a real-time processing effect diagram based on the adjusted processing parameters and the processing element information, displaying the processing effect of the adjusted processing parameters to the user.

[0359] Please refer to FIG23, which is a flowchart of a data processing method based on a processing device according to an embodiment of the present application. The data processing method based on the processing device can be executed by the terminal device 202. As shown in FIG23, the data processing method based on the processing device includes at least S201 to S204, which are described in detail as follows:

[0360] S201, based on the processing request, control the processing equipment to process the preset patterns onto the test material according to multiple processing parameter groups, and obtain the test processing material processed with multiple preset patterns. Each of the processing parameter groups includes at least two different processing parameters.

[0361] In the embodiment of the present application, a processing request refers to a request issued by a user to instruct a terminal device to perform a processing test.

[0362] In the embodiment of the present application, a processing parameter group refers to a combination of multiple (two or more, the same below) processing parameters, and a processing parameter refers to an operating parameter of a processing device used to process a material to be processed, which is usually related to the type of processing device. Taking the processing device as a laser processing device as an example, the processing parameters include but are not limited to at least one of laser power (Power), scan speed (Scan Speed), laser focus diameter (Beam Diameter), pulse frequency (Pulse Frequency), laser mode (Beam Mode), gas type and flow (Gas Type and Flow), focal length (Focal Length), and light source, etc. In actual application, the processing parameters can be flexibly adjusted according to the specific application scenario. It is understandable that the processing parameters have corresponding numerical values. In other words, the processing parameter group includes multiple parameter values.

[0363] In the embodiment of the present application, the test material refers to a material used for testing that is not filled with multiple preset patterns. Correspondingly, the test processed material refers to a material that has been processed to have multiple preset patterns.

[0364] In one embodiment of the present application, the process of controlling the processing equipment to process preset patterns onto the test material according to multiple processing parameter groups based on the processing request in S201 to obtain the test processed material having multiple preset patterns may include:

[0365] Get the preset pattern in the interactive interface;

[0366] In response to a request for generating a processing parameter test array for the preset pattern, generating and displaying a processing parameter test array corresponding to the preset pattern in an interactive interface;

[0367] In response to an input operation of property information corresponding to a test material, displaying a processing interface, the processing interface including a processing control;

[0368] receiving a trigger operation for the processing control and generating a processing request;

[0369] The processing request is sent to a processing device, so that the processing device processes the preset pattern onto a test material based on the processing parameter group of each preset pattern in the processing parameter test array, thereby obtaining a test processed material processed with multiple preset patterns.

[0370] Specifically, in some embodiments, it is first necessary to determine the preset pattern in the interactive interface. The user can upload the preset pattern or select a preset pattern in the interactive interface. According to the preset pattern uploaded or selected by the user, the preset pattern in the processing parameter test array is determined.

[0371] After obtaining the preset pattern, if it is detected that the user triggers a processing parameter test array generation request for the preset pattern, then based on the request, a processing parameter test array with multiple preset patterns is generated and displayed in the interactive interface. Here, after receiving the processing parameter test array generation request, the processing parameter test array can be generated directly based on the default processing parameter test array information. For example, by default, the processing parameter type, processing parameter maximum and minimum values, number of preset patterns, and intervals of preset patterns corresponding to the X-axis of the processing parameter test array are default settings, and the processing parameter type, processing parameter maximum and minimum values, number of preset patterns, and intervals of preset patterns corresponding to the Y-axis of the processing parameter test array are also default settings. By generating the processing parameter test array based on the default processing parameters, user operations can be simplified and the generation efficiency of the processing parameter test array can be improved. For example, referring to Figure 30, the user can click on the preset pattern (i.e., a small square pattern containing an X shape) in the interactive interface, select the preset pattern, and then click on the processing parameter test array generation control (i.e., Material test array control) in the interactive interface to directly generate a processing parameter test array (i.e., the array in the figure) based on the default processing parameter test array information. At this point, the default processing parameter type for the X-axis of the processing parameter test array is power, the default maximum value is 100, the default minimum value is 10, the default number of preset patterns is 5, and the default interval between preset patterns is 3mm. The same applies to the processing parameters for the Y-axis. Based on this default information, a corresponding 5*5 processing parameter test array is generated.

[0372] After determining the processing parameter test array corresponding to the preset pattern, the user can send an input operation for the attribute information corresponding to the test material to the terminal device. Accordingly, the terminal device receives the input operation for the attribute information corresponding to the test material, and displays a processing interface in response to the input operation for the attribute information corresponding to the test material, wherein the processing interface includes a processing control; then the user can send a trigger operation for the processing control to the terminal device. Accordingly, the terminal device receives the trigger operation for the processing control and generates a processing request; then the terminal device sends the processing request to the processing device. Accordingly, the processing device receives the processing request sent by the terminal device, and based on the processing parameter group corresponding to each preset pattern in the processing parameter test array, the preset pattern is processed onto the test material, thereby obtaining a test processing material processed with multiple preset patterns.

[0373] In the optional embodiment, the attribute information refers to basic information of the test material, which is used to identify and describe the test material, including but not limited to at least one of the name, type, size, and thickness of the test material.

[0374] In this way, by implementing the optional embodiment, after receiving the input operation for the attribute information corresponding to the test material, the terminal device displays a processing interface containing a processing control for the user to choose whether to trigger the processing control, and the human-computer interaction performance is good; and after the user chooses to trigger the processing control, the processing request is sent to the processing equipment, ensuring the timely processing of the test material, so that the test processing material processed with multiple preset patterns can be obtained in real time.

[0375] In some embodiments, in response to a request to generate a processing parameter test array for the preset pattern, generating and displaying a processing parameter test array corresponding to the preset pattern in an interactive interface can be achieved in the following manner: in response to a request to generate a processing parameter test array for the preset pattern, displaying a processing parameter test array information setting control in the interactive interface; the processing parameter test array information includes the processing parameter type of each dimension in the processing parameter test array, the processing parameter value, the row and column values ​​of the preset pattern in the processing parameter test array, and the interval between the preset patterns in the processing parameter test array; in response to a setting operation on the processing parameter test array information setting control, displaying the processing parameter test array corresponding to the preset pattern in the interactive interface based on the set processing parameter test array information.

[0376] Specifically, in some cases, after receiving a request to generate a processing parameter test array for the preset pattern, the processing parameter test array information setting controls can be first displayed in the interactive interface, such as the processing parameter type corresponding to the X / Y axis of the processing parameter test array, the maximum and minimum values ​​of the processing parameters, the number of preset patterns, and the interval of the preset patterns displayed on the left interface of Figure 30. The user can flexibly adjust and set this information according to their needs. Then, based on the set processing parameter test array information, the processing parameter test array corresponding to the preset pattern can be displayed in the interactive interface. For example, if the user sets the number of preset patterns for both the X-axis and the Y-axis to 3, a 3*3 processing parameter test array will be displayed in the interactive interface. In this way, it is convenient for users to determine the processing parameter test array according to their own needs, thereby improving the flexibility of the processing parameter test array.

[0377] S202: Acquire a photographic image of the test processing material.

[0378] In the embodiment of the present application, the terminal device obtains a test processing material processed with multiple preset patterns, and then can obtain a captured image of the test processing material.

[0379] In the embodiment of the present application, the captured images of the test processed materials refer to images obtained by photographing the test processed materials, wherein the number of images obtained by photographing can be one or more, and they can be captured by at least one of the processing equipment, terminal equipment, and other external devices. In actual applications, the number of images and the shooting equipment can be flexibly adjusted according to the specific application scenario.

[0380] In one embodiment of the present application, the process of obtaining the captured image of the test processing material in S202 may include:

[0381] After the processing equipment completes processing, a shooting interface is displayed, where the shooting interface includes shooting controls;

[0382] If a trigger operation for the shooting control is received, the test processing material is shot to obtain a shot image of the test processing material.

[0383] That is, in an optional embodiment, the terminal device displays a shooting interface after the processing equipment completes processing, and the shooting interface includes a shooting control. The user can then issue a trigger operation for the shooting control to the terminal device. Accordingly, the terminal device receives the trigger operation for the shooting control and shoots the test processing material, thereby obtaining a shot image of the test processing material.

[0384] Among them, after the shooting control contained in the shooting interface in the optional embodiment is triggered, the terminal device can call the camera to shoot the test processing material, and can store and / or display the shot image for the user to view.

[0385] In this way, by implementing the optional embodiment, the terminal device displays a shooting interface containing a shooting control after the processing equipment is completed, so that the user can choose whether to trigger the shooting control, and the human-computer interaction performance is good; and after the user chooses to trigger the shooting control, shooting is performed, and the captured images of the test processing materials can be obtained in real time, thereby improving the user experience.

[0386] S203 , obtaining a processing parameter group corresponding to each preset pattern in the captured image according to a recognition processing result of the captured image, wherein the preset pattern includes at least one of a line pattern, a fill pattern, and a hollow pattern.

[0387] In the embodiment of the present application, the terminal device obtains a captured image of the test processing material, and then obtains a processing parameter group corresponding to each preset pattern in the captured image based on the recognition processing result of the captured image.

[0388] It is understandable that since the captured image is captured for the test processing material, and the test processing material is processed with multiple preset patterns, the captured image is recognized and processed to obtain the processing parameter group corresponding to each preset pattern in the captured image.

[0389] Please refer to Figure 24, which is a schematic diagram of a captured image. As shown in Figure 24, the captured image includes nine preset patterns X = {X11, X12, X13, X21, X22, X23, X31, X32, X33}, where i in Xij represents the number of rows and j represents the number of columns. It will be appreciated that the processing parameter set corresponding to the preset patterns shown in Figure 24 includes laser power and scan speed.

[0390] In one embodiment of the present application, the process of obtaining the processing parameter group corresponding to each preset pattern in the captured image according to the recognition processing result of the captured image in S203 may include:

[0391] Preprocessing the captured image, the preprocessing including at least one of cropping and tilt correction;

[0392] The pre-processed captured image is subjected to recognition processing to obtain a processing parameter group corresponding to each preset pattern in the pre-processed captured image.

[0393] That is, in an optional embodiment, the terminal device can first preprocess the captured image to obtain a preprocessed captured image, and then perform recognition processing on the preprocessed captured image to obtain a processing parameter group corresponding to each preset pattern in the preprocessed captured image.

[0394] In the optional embodiments, the preprocessing includes but is not limited to at least one of cropping and tilt correction. Cropping refers to adjusting the boundaries or size of a captured image to remove unnecessary portions, thereby enabling better recognition processing of the captured image; tilt correction refers to adjusting a tilted or distorted captured image to align it horizontally or vertically, thereby improving the visual effect and image quality of the captured image, thereby enabling better recognition processing of the captured image.

[0395] In this way, by implementing the optional embodiment, the captured image is preprocessed so that the image quality of the preprocessed captured image is better and can meet the requirements of the recognition processing, and then the recognition processing is performed on the preprocessed captured image, thereby improving the accuracy and efficiency of the recognition processing.

[0396] In one embodiment of the present application, the process of obtaining the processing parameter group corresponding to each preset pattern in the captured image according to the recognition processing result of the captured image in S203 may include:

[0397] Identify the position of the pattern in the captured image to obtain the position information of each preset pattern in the captured image;

[0398] The preset pattern corresponding to each position information is identified with respect to the processing parameter group to obtain the processing parameter group of each preset pattern in the captured image.

[0399] That is, in an optional embodiment, the terminal device identifies the pattern position in the captured image, thereby obtaining the position information of each preset pattern in the captured image, and identifies the processing parameter group for the preset pattern corresponding to each position information, thereby obtaining the processing parameter group for each preset pattern in the captured image.

[0400] In an optional embodiment, the position information of the preset pattern on the captured image can be represented by coordinates, for example (x, y), where x represents the horizontal coordinate and y represents the vertical coordinate. For example, the preset pattern can be framed by a regular border, and the position information of the preset pattern on the captured image can be represented by the coordinates of the upper left corner of the regular border and the coordinates of the lower right corner of the regular border.

[0401] In this way, by implementing the optional embodiment, the terminal device first identifies the position of each preset pattern in the captured image, and then identifies the processing parameter group after clarifying the position of each preset pattern on the captured image, thereby avoiding phenomena such as incorrect recognition and missed recognition, and improving the accuracy of the recognition processing.

[0402] In one embodiment of the present application, the captured image includes a plurality of preset patterns and a plurality of processing parameter groups. Please refer to Figure 24 again, the horizontal axis corresponds to the laser power, which is 80%, 90%, and 100% from left to right, and the vertical axis corresponds to the scanning speed, which is 5mm / s, 10mm / s, and 15mm / s from bottom to top. It can be understood that any combination of 80%, 90%, and 100% of the laser power and any combination of 5mm / s, 10mm / s, and 15mm / s of the scanning speed is a processing parameter group, of which there are a total of 9 processing parameter groups PPG = {PPG11, PPG12, PPG13, PPG21, PPG22, PPG23, PPG31, PPG32, PPG33}; specifically, PPG11 = [80%, 15mm m / s], PPG12=[80%, 10mm / s], PPG13=[80%, 5mm / s], PPG21=[90%, 15mm / s], PPG22=[90%, 10mm / s ], PPG23=[90%, 5mm / s], PPG31=[100%, 15mm / s], PPG32=[100%, 10mm / s], PPG33=[100%, 5mm / s].

[0403] Accordingly, the process of identifying the processing parameter group for the preset pattern corresponding to each position information to obtain the processing parameter group for each preset pattern in the captured image may include:

[0404] A processing parameter group associated with a preset pattern corresponding to each position information is identified from a plurality of processing parameter groups to obtain a processing parameter group for each preset pattern in the captured image.

[0405] That is, in an optional embodiment, the terminal device associates / maps the preset pattern corresponding to each position information with the corresponding processing parameter group, thereby obtaining the processing parameter group of each preset pattern in the captured image.

[0406] For example, following the example of Figure 24 above, by performing recognition processing on the captured image, the processing parameter group corresponding to each preset pattern in the captured image can be obtained, where m in PPGmn corresponds to i in Xij, and n in PPGmn corresponds to j in Xij. For example, the processing parameter group corresponding to X11 is PPG11, and the processing parameter group corresponding to X12 is PPG12, and so on.

[0407] In this way, by implementing the optional embodiment, the terminal device can easily and accurately associate / map the preset patterns with the corresponding processing parameter groups, and obtain the processing parameter group of each preset pattern in the captured image.

[0408] In one embodiment of the present application, the process of identifying a pattern position in a captured image to obtain position information of each preset pattern in the captured image, identifying a processing parameter group for each preset pattern corresponding to each position information, and obtaining a processing parameter group for each preset pattern in the captured image may include:

[0409] Inputting the captured image into the recognition processing model to identify each preset pattern in the captured image with respect to the pattern position and the processing parameter group through the recognition processing model;

[0410] The position information of each preset pattern in the captured image output by the recognition processing model and the processing parameter group of each preset pattern in the captured image are obtained.

[0411] That is, in an optional embodiment, the terminal device inputs the captured image into the recognition processing model, and then uses the recognition processing model to identify the pattern position and processing parameter group of each preset pattern in the captured image. Accordingly, the recognition processing model outputs the recognition processing result, that is, the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image, thereby obtaining the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image.

[0412] In this way, by implementing the optional embodiment, the terminal device uses the recognition processing model to realize the recognition of each preset pattern in the captured image with respect to the pattern position and processing parameter group, which has a high degree of intelligence and improves the accuracy and efficiency of the recognition processing.

[0413] In one embodiment of the present application, the process of obtaining the processing parameter group corresponding to each preset pattern in the captured image according to the recognition processing result of the captured image in S203 may include:

[0414] The captured image is identified and processed by the server or terminal device to obtain the position information of each preset pattern in the captured image and the processing parameter group of each preset pattern in the captured image.

[0415] It is understood that both the server and the terminal device can perform recognition processing on the captured image, but due to the limited computing resources of the terminal device, it is more efficient to perform recognition processing on the server. That is, in an optional embodiment, the server performs recognition processing on the captured image to obtain the position information of each preset pattern in the captured image and the processing parameter set for each preset pattern in the captured image.

[0416] In this way, by implementing the optional embodiment, the server realizes the recognition processing of the captured image, which reduces the processing pressure of the terminal device and saves the computing resources of the terminal device. The computing resources on the server side are relatively more than those on the terminal device side, thereby improving the efficiency of the recognition processing.

[0417] In one embodiment of the present application, the process of performing recognition processing on a captured image by a server or a terminal device to obtain position information of each preset pattern in the captured image and a processing parameter group for each preset pattern in the captured image may include:

[0418] The server or terminal device identifies the pattern position of the captured image to obtain the position information of each preset pattern in the captured image, and identifies the processing parameter group of the preset pattern corresponding to each position information to obtain the processing parameter group of each preset pattern in the captured image.

[0419] That is, in an optional embodiment, the captured image is identified for pattern position by a server or terminal device, thereby obtaining the position information of each preset pattern in the captured image, and the preset pattern corresponding to each position information is identified for the processing parameter group, thereby obtaining the processing parameter group of each preset pattern in the captured image.

[0420] In this way, by implementing the optional embodiment, the server or terminal device first identifies the position of each preset pattern in the captured image, and then identifies the processing parameter group after clarifying the position of each preset pattern on the captured image, thereby avoiding phenomena such as incorrect recognition and missed recognition, and improving the accuracy of the recognition processing.

[0421] In one embodiment of the present application, the process of performing recognition processing on a captured image by a server or a terminal device to obtain position information of each preset pattern in the captured image and a processing parameter group for each preset pattern in the captured image may include:

[0422] Sending the captured image to a server or terminal device so that the server or terminal device can identify each preset pattern in the captured image with respect to the pattern position and processing parameter group through a recognition processing model;

[0423] The position information of each preset pattern in the captured image output by the recognition processing model and the processing parameter group of each preset pattern in the captured image are obtained.

[0424] That is, in an optional embodiment, the server or terminal device inputs the captured image into the recognition processing model, and then uses the recognition processing model to identify the pattern position and processing parameter group of each preset pattern in the captured image. Accordingly, the recognition processing model outputs the recognition processing result, that is, the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image, thereby obtaining the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image.

[0425] The terminal device inputs the captured image into the recognition processing model, and then uses the recognition processing model to identify the pattern position and processing parameter group of each preset pattern in the captured image. Accordingly, the recognition processing model outputs the recognition processing result, that is, the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image, thereby obtaining the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image.

[0426] In this way, by implementing the optional embodiment, the server or terminal device uses the recognition processing model to realize the recognition of each preset pattern in the captured image with respect to the pattern position and processing parameter group, which has a high degree of intelligence and improves the accuracy and efficiency of the recognition processing.

[0427] In one embodiment of the present application, the process of sending the captured image to the server or terminal device may include:

[0428] If an upload operation for the captured image is received, the captured image is sent to the server or terminal device;

[0429] Accordingly, the process of obtaining the position information of each preset pattern in the captured image output by the recognition processing model and the processing parameter group of each preset pattern in the captured image may include:

[0430] Receiving the position information of each preset pattern in the captured image output by the recognition processing model and the processing parameter group of each preset pattern in the captured image from the server or the terminal device;

[0431] The position information of each preset pattern in the captured image and the processing parameter group of each preset pattern in the captured image are displayed.

[0432] That is, in an optional embodiment, the user can issue an upload operation for the captured image to the terminal device. Accordingly, the terminal device receives the upload operation for the captured image and sends the captured image to the server or terminal device in response to the upload operation for the captured image. Thereafter, the server or terminal device identifies the pattern position and processing parameter group for each preset pattern in the captured image through the recognition processing model, obtains the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image, and sends the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image to the terminal device; accordingly, the terminal device receives the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image, and displays the position information of each preset pattern in the captured image on the captured image, and the processing parameter group of each preset pattern in the captured image for the user to view.

[0433] In this way, by implementing the optional embodiment, the terminal device displays the position information of each preset pattern in the captured image and the processing parameter group of each preset pattern in the captured image for the user to view, with good human-computer interaction performance and improved user experience.

[0434] In one embodiment of the present application, the training process of the aforementioned recognition processing model may include:

[0435] Obtaining a training sample group, the training sample group including a first sample image and a second sample image, the first sample image and the second sample image being obtained by photographing a training processing material including a plurality of sample patterns, the training processing material being processed by a processing device according to a plurality of processing parameter sets, the second sample image having a label relative to the first sample image;

[0436] Inputting the first sample image into the model to be trained to obtain a recognition processing sample result of the first sample image;

[0437] According to the loss value between the recognition processing sample result and the second sample image, the training model is iteratively trained until the loss value is less than the set value, thereby obtaining the recognition processing model.

[0438] That is, the training process of the recognition processing model in the optional embodiment is to first obtain a training sample group containing a first sample image and a second sample image, and then input the first sample image into the model to be trained to obtain a recognition processing sample result of the first sample image, and then iteratively train the model to be trained according to the loss value between the recognition processing sample result and the second sample image until the loss value is less than the set value, thereby training to obtain the recognition processing model.

[0439] In the optional embodiment, the first sample image and the second sample image both refer to images obtained by photographing the training processing material, and the training processing material refers to the material processed with multiple sample patterns obtained by processing the sample patterns onto the training material according to multiple processing parameter groups; the training material refers to the material used for training that is not filled with multiple preset patterns, and accordingly, the training processing material refers to the material processed with multiple preset patterns after the training material is processed.

[0440] It can be understood that the first sample image and the second sample image are similar to the process of the captured image in the above embodiment. The difference is that the first sample image and the second sample image are used to train the model to be trained, while the captured image is used to test and obtain the target processing parameter group. The materials involved in the two processes (the training process is for

[0441] The training materials and training processing materials, the testing process is for the test materials and test processing materials), the processing parameter group, and the pattern (the training process is for the sample pattern, and the testing process is for the preset pattern) can be the same or different. In actual applications, they can be flexibly adjusted according to the specific application scenarios.

[0442] It should be clear that the second sample image has a label relative to the first sample image, so the training model can be iteratively trained according to the loss value between the recognition processing sample result and the second sample image until the loss value is less than the set value.

[0443] In the optional embodiment, the number of training sample groups may be one or more, usually multiple, training sample groups, thereby improving the training accuracy of the recognition processing model.

[0444] In one embodiment of the present application, the recognition processing sample result of the first sample image includes the first position sample information of each sample pattern in the first sample image, and the first processing parameter sample group of each sample pattern in the first sample image. The first position sample information of the sample pattern refers to the position information of the sample pattern on the first sample image. Similarly, the position information of the sample pattern on the first sample image can be represented by coordinates, such as (x, y), where x represents the horizontal coordinate and y represents the vertical coordinate. For example, the sample pattern can be framed by a regular border, and the position information of the sample pattern on the first sample image can be represented by the coordinates of the upper left corner of the regular border and the coordinates of the lower right corner of the regular border; the first processing parameter sample group of the sample pattern refers to the processing parameter group corresponding to the sample pattern.

[0445] In one embodiment of the present application, the label of the second sample image includes the second position sample information of each sample pattern in the second sample image, and the second processing parameter sample group of each sample pattern in the second sample image. The second position sample information of the sample pattern refers to the position information of the sample pattern on the second sample image. Similarly, the position information of the sample pattern on the second sample image can be represented by coordinates, such as (x, y), where x represents the horizontal coordinate and y represents the vertical coordinate. For example, the sample pattern can be framed by a regular border, and the position information of the sample pattern on the second sample image can be represented by the coordinates of the upper left corner of the regular border and the coordinates of the lower right corner of the regular border; the second processing parameter sample group of the sample pattern refers to the processing parameter group corresponding to the sample pattern.

[0446] Accordingly, according to the loss value between the recognition processing sample result and the second sample image, the to-be-trained model is iteratively trained until the loss value is less than a set value, and the process of obtaining the recognition processing model may include:

[0447] According to the loss value between the first position sample information and the second position sample information, and the loss value between the first processing parameter sample group and the second processing parameter sample group, the training model is iteratively trained until the loss value is less than the set value to obtain the recognition processing model.

[0448] That is, in an optional embodiment, the model to be trained is iteratively trained based on the loss value between the first position sample information (i.e., the identified position information) and the second position sample information (i.e., the actual position information), as well as the loss value between the first processing parameter sample group (i.e., the identified processing parameter group) and the second processing parameter sample group (i.e., the actual processing parameter group) until the loss value (i.e., the loss value between the first position sample information and the second position sample information, as well as the loss value between the first processing parameter sample group and the second processing parameter sample group) is less than the set value, thereby training a recognition processing model.

[0449] In this way, by implementing the optional embodiment, the recognition processing model can be trained simply and accurately, thereby providing strong support for the recognition processing of the captured images during the test process.

[0450] In one embodiment of the present application, after obtaining the processing parameter group corresponding to each preset pattern in the captured image according to the recognition processing result of the captured image in S203, the following steps may be further included:

[0451] Displaying a parameter group selection interface, the parameter group selection interface including a plurality of preset patterns of captured images;

[0452] If a selection instruction for a plurality of preset patterns in the captured image is received, a processing parameter group corresponding to the preset pattern selected by the selection instruction is displayed.

[0453] That is, in an optional embodiment, the terminal device obtains the processing parameter group corresponding to each preset pattern in the captured image, and then can display the parameter group selection interface, the parameter group selection interface includes the captured image, and then the user can send selection instructions for multiple preset patterns in the captured image to the terminal device. Accordingly, the terminal device receives the selection instructions for multiple preset patterns in the captured image, and displays the processing parameter group corresponding to the preset pattern selected by the selection instruction.

[0454] In this way, by implementing the optional embodiment, after obtaining the processing parameter group corresponding to each preset pattern in the captured image, the terminal device displays a parameter group selection interface containing the captured image, so that the user can choose whether to trigger selection instructions for multiple preset patterns in the captured image, and the human-computer interaction performance is good; and after the user selects an instruction for a certain preset pattern, the processing parameter group corresponding to the certain preset pattern can be displayed in real time, thereby improving the user experience.

[0455] In one embodiment of the present application, the process of displaying the parameter group selection interface may include:

[0456] Obtaining a processing parameter group corresponding to each preset pattern in the captured image, the processing parameter group including a first parameter value and a second parameter value;

[0457] Determine the position of each preset pattern in the first direction based on a first parameter value corresponding to each preset pattern, where a larger first parameter value indicates an upper position in the first direction; and determine the position of each preset pattern in the second direction based on a second parameter value corresponding to each preset pattern, where a larger second parameter value indicates an upper position in the second direction;

[0458] Based on the position of each preset pattern in the first direction and the position of each preset pattern in the second direction, each preset pattern is arranged to display each preset pattern on the parameter group selection interface.

[0459] That is, in an optional embodiment, the terminal device arranges multiple preset patterns according to a preset arrangement rule, thereby displaying a parameter group selection interface; specifically, for each preset pattern, the preset arrangement rule can be to determine the position of each preset pattern in the first direction and the position in the second direction, and arrange each preset pattern at a position corresponding to the first direction and the position corresponding to the second direction, ultimately forming a plurality of preset patterns arranged in an array form. The position of each preset pattern in the first direction can be determined by its first parameter value, and optionally, the larger the first parameter value corresponding to the preset pattern, the higher the position of the preset pattern in the first direction, and the position of each preset pattern in the second direction can be determined by its second parameter value, and optionally, the larger the second parameter value corresponding to the preset pattern, the more to the right the position of the preset pattern in the second direction.

[0460] Among them, in an optional embodiment, the first parameter value and the second parameter value corresponding to each preset pattern can also be displayed on the parameter group selection interface; specifically, the first parameter values ​​are arranged from small to large from bottom to top in the first direction (that is, the larger the first parameter value corresponding to the preset pattern, the higher the position of the preset pattern in the first direction), and the second parameter values ​​are arranged from small to large from left to right in the second direction (that is, the larger the second parameter value corresponding to the preset pattern, the more to the right the position of the preset pattern in the second direction).

[0461] In an optional embodiment, the first direction may be a vertical direction (ie, a longitudinal axis direction, also called a Y-axis direction), and the second direction may be a horizontal direction (ie, a transverse axis direction, also called an X-axis direction).

[0462] In the optional embodiment, the first parameter value includes but is not limited to a scanning speed value, and the second parameter value includes but is not limited to a laser power value.

[0463] In actual applications, the preset arrangement rule, the first direction, the second direction, the first parameter value, and the second parameter value can be flexibly adjusted according to specific application scenarios.

[0464] In this way, the parameter group selection interface is displayed by multiple preset patterns arranged in an array form, which is highly intuitive and further enhances the user experience.

[0465] In one embodiment of the present application, the parameter group selection interface further includes a confirmation control; accordingly, after displaying the process of the processing parameter group corresponding to the preset pattern selected by the selection instruction, it may also include:

[0466] If a trigger operation for the confirmation control is received, the preset pattern selected by the selection instruction is used as the designated preset pattern, and it is determined that a confirmation operation for the processing parameter group corresponding to the designated preset pattern is received;

[0467] If no trigger operation for the confirmation control is received, it is determined that no confirmation operation for the processing parameter group corresponding to the specified preset pattern is received.

[0468] That is, in an optional embodiment, the terminal device displays the processing parameter group corresponding to the preset pattern selected by the selection instruction, as well as a confirmation control, wherein:

[0469] If the user issues a trigger operation for a confirmation control to the terminal device, and accordingly, the terminal device receives the trigger operation for the confirmation control, then the preset pattern selected by the selection instruction is used as the designated preset pattern, and it is determined that a confirmation operation for the processing parameter group corresponding to the designated preset pattern is received, then the processing parameter group corresponding to the designated preset pattern is the target processing parameter group.

[0470] If the user does not send a trigger operation for the confirmation control to the terminal device, and accordingly, the terminal device does not receive the trigger operation for the confirmation control, then it is determined that the confirmation operation for the processing parameter group corresponding to the specified preset pattern has not been received, then the processing parameter group corresponding to the specified preset pattern is not the target processing parameter group.

[0471] In this way, by implementing the optional embodiment, the parameter group selection interface includes a confirmation control, and based on whether the confirmation control is triggered, it is determined whether the processing parameter group corresponding to the selected preset pattern is the target processing parameter group, thereby avoiding phenomena such as erroneous operations and improving the accuracy of determining the target processing parameter group.

[0472] S204 : Based on the preset pattern and the processing parameter group, obtaining a processing parameter array corresponding to the test processing material.

[0473] After step S204, the processing equipment can also be controlled to perform processing based on the identified processing parameter group. In the embodiment of the present application, the terminal device obtains the processing parameter group corresponding to each preset pattern in the test processing material in the captured image, and can then use the identified processing parameter group to control the processing equipment to perform processing, thereby achieving processing control.

[0474] In one embodiment of the present application, the process of controlling the processing equipment to perform processing based on the identified processing parameter group may include:

[0475] If a confirmation operation is received for a processing parameter group corresponding to a specified preset pattern in the captured image, the processing parameter group confirmed by the confirmation operation is determined as a target processing parameter group;

[0476] The processing equipment is controlled to perform processing based on the target processing parameter group.

[0477] That is, in an optional embodiment, if a confirmation operation is received for a processing parameter group corresponding to a specified preset pattern in a captured image, the processing parameter group confirmed by the confirmation operation can be determined as a target processing parameter group, and then the target processing parameter group is used to control the processing equipment for processing.

[0478] In the optional embodiment, the target processing parameter group refers to a processing parameter group used to process a material to be processed of the same or similar type as the test material, which can be one of the multiple processing parameter groups in the aforementioned embodiments.

[0479] Optionally, the target processing parameter group may also be some (ie, multiple) of the multiple processing parameter groups in the aforementioned embodiment. When there are multiple target processing parameter groups, all of the multiple target processing parameter groups are candidates.

[0480] In this way, by implementing the optional embodiment, the determination of the target processing parameter group is achieved simply and accurately, thereby providing strong support for processing control.

[0481] In one embodiment of the present application, the process of controlling the processing equipment to perform processing based on the target processing parameter group may include:

[0482] The processing equipment is controlled to process the pattern to be processed onto the material to be processed of the same or similar type as the test material according to the target processing parameter group.

[0483] That is, in an optional embodiment, the terminal device obtains a target processing parameter group, and then in the actual processing process, the processing equipment can be controlled to be in a working state corresponding to the target processing parameter group to process the pattern to be processed onto a material to be processed of the same or similar type as the test material.

[0484] Among them, the difference between the material to be processed and the test material in the optional embodiment is that the test material is used for testing to obtain the target processing parameter group, and the material to be processed is used for actual processing to obtain the desired product.

[0485] It can be understood that when there is only one target processing parameter group, the terminal device controls the processing equipment to process the pattern to be processed onto the material to be processed of the same or similar type as the test material according to the target processing parameter group; when there are multiple target processing parameter groups, the terminal device can control the processing equipment to process the pattern to be processed onto the material to be processed of the same or similar type as the test material according to the target processing parameter group selected by the selection instruction based on the user's selection instructions for multiple target processing parameter groups.

[0486] Optionally, when there are multiple target processing parameter groups, the usage frequency or number of times each target processing parameter group is used can be counted after a period of time, and the multiple target processing parameter groups can be sorted according to the usage frequency or number of times each target processing parameter group is used to display the sorted multiple target processing parameter groups, provide guidance for user selection, etc., thereby further improving the user experience.

[0487] The embodiments of the present application achieve simple and accurate processing control, avoid the waste of materials and time caused by cognitive bias in the treatment of processing materials and the artificial setting of target processing parameter groups, improve processing efficiency and accuracy, can meet product manufacturing needs, and have high reliability in data processing based on processing equipment.

[0488] The following describes in detail the specific scenarios of the embodiments of this application:

[0489] Please refer to Figure 25, which is a flow chart of a data processing method based on a processing device according to an embodiment of the present application. As shown in Figure 25, the data processing method based on the processing device includes at least S401 to S408, which are described in detail as follows:

[0490] S401, the terminal device displays a processing interface containing processing controls in response to an input operation for attribute information corresponding to a test material, generates a processing request after receiving a trigger operation for the processing control, and sends the processing request to a processing device.

[0491] It is understandable that the user needs to first place the test material in the processing area on the processing equipment carrier, and enter the attribute information corresponding to the test material, such as the name and type of the test material. Accordingly, the terminal device receives the attribute information corresponding to the test material and displays the processing interface containing processing controls.

[0492] Please refer to Figure 26A for a schematic diagram of a processing interface. As shown in Figure 26A, the processing interface displays a processing control "Processing" 501. Optionally, the processing interface may also display a border control and some additional information (such as corresponding operation guidance information and warning information). In actual applications, the user interface (UI) design of the processing interface can be flexibly adjusted.

[0493] S402, the processing equipment receives the processing request, and according to the processing request, is in the working state corresponding to each processing parameter group, processes the preset pattern onto the test material, and obtains the test processed material processed with multiple preset patterns.

[0494] S403, after the processing equipment completes the processing, the terminal device displays a shooting interface containing a shooting control, and after receiving a trigger operation for the shooting control, shoots the test processing material to obtain a shot image of the test processing material, and sends the shot image to the server.

[0495] Please refer to Figure 26B for a schematic diagram of a shooting interface. As shown in Figure 26B, the shooting interface displays a shooting control "Camera" 502; optionally, the shooting interface may also display an image selection control and some additional information (such as corresponding operation guidance information). In actual applications, the UI design of the shooting interface can also be flexibly adjusted.

[0496] Please refer to Figure 26C, which is a schematic diagram of another shooting interface. As shown in Figure 26C, the captured image is imported successfully, and the import reminder message "Import completed!" 503 is displayed.

[0497] S404, the server or terminal device receives the captured image and inputs the captured image into the recognition processing model to identify the pattern position and processing parameter group of each preset pattern in the captured image through the recognition processing model, and obtains the position information of each preset pattern in the captured image on the captured image and the processing parameter group of each preset pattern in the captured image output by the recognition processing model, and sends the position information of each preset pattern in the captured image on the captured image and the processing parameter group of each preset pattern in the captured image to the terminal device.

[0498] In one embodiment of the present application, the training process of the recognition processing model includes: obtaining a training sample group, the training sample group includes a first sample image and a second sample image, the first sample image and the second sample image are obtained by photographing a training processing material including multiple sample patterns processed by a processing device according to multiple processing parameter groups; the second sample image has a label relative to the first sample image, wherein the label of the second sample image includes second position sample information of each sample pattern in the second sample image, and a second processing parameter sample group for each sample pattern in the second sample image.

[0499] Please refer to Figure 27A, which is a schematic diagram of a first sample image. As shown in Figure 27A, the first sample image includes 9 sample patterns X.

[0500] Please refer to FIG27B , which is a schematic diagram of a second sample image. As shown in FIG27B , the second sample image includes nine sample patterns X, each of which is framed by a rectangular frame to represent the position information of each sample pattern X (i.e., second position sample information). Furthermore, each sample pattern X is associated with a specific laser power and scanning speed to represent the processing parameter set for each sample pattern X (i.e., second processing parameter sample set).

[0501] Afterwards, the first sample image is input into the model to be trained to obtain the recognition processing sample results of the first sample image, wherein the recognition processing sample results of the first sample image include the first position sample information of each sample pattern in the first sample image, and the first processing parameter sample group of each sample pattern in the first sample image.

[0502] Afterwards, the model to be trained is iteratively trained according to the loss value between the first position sample information and the second position sample information, as well as the loss value between the first processing parameter sample group and the second processing parameter sample group, until the loss value is less than the set value, thereby obtaining the recognition processing model.

[0503] In one embodiment of the present application, during the process of performing recognition processing on the captured image, the terminal device can display a recognition processing interface so that the user can clearly understand that the recognition processing of the captured image is being performed at this time.

[0504] Please refer to FIG26D for a schematic diagram of a recognition processing interface. As shown in FIG26D , the recognition processing interface displays an alignment reminder message "Please wait, intelligent alignment correction in progress!" 504. Optionally, the recognition processing interface may also display an import control, etc. In actual applications, the UI design of the recognition processing interface can also be flexibly adjusted.

[0505] In one embodiment of the present application, after obtaining the position information of each preset pattern in the captured image and the processing parameter group of each preset pattern in the captured image, the server can encapsulate them into a certain data exchange format such as JSON (JavaScript Object Notation) format (a lightweight data exchange format) and send them to the terminal device.

[0506] S405, the terminal device receives the position information of each preset pattern in the captured image on the captured image, as well as the processing parameter group of each preset pattern in the captured image, displays a parameter group selection interface containing the captured image and a confirmation control, and after receiving a selection instruction for multiple preset patterns in the captured image, displays the processing parameter group corresponding to the preset pattern selected by the selection instruction.

[0507] Please refer to Figure 26E for a schematic diagram of a parameter group selection interface. As shown in Figure 26E, the user issues a selection instruction for multiple preset patterns in the captured image. The user selects the boxed preset pattern. Accordingly, the processing parameter group corresponding to the boxed preset pattern is displayed in the upper area of ​​the parameter group selection interface. Specifically, the laser power is 80% and the scanning speed is 5 mm / s. In actual applications, the UI design of the parameter group selection interface can also be flexibly adjusted.

[0508] S406, after receiving the trigger operation for the confirmation control, the terminal device selects the preset pattern selected by the selection instruction as the designated preset pattern, and determines that a confirmation operation for the processing parameter group corresponding to the designated preset pattern is received, and determines the processing parameter group confirmed by the confirmation operation as the target processing parameter group.

[0509] Please refer to FIG. 26E again, the parameter group selection interface displays a confirmation control “Confirm” 505 .

[0510] At this point, the process of test machining to obtain the target machining parameter set is completed.

[0511] S407 , the terminal device responds to the processing request for the material to be processed and sends the processing request to the processing device.

[0512] It is understood that the material to be processed is usually the same type or a similar type of material as the test material.

[0513] S408 , the processing equipment receives the processing request and processes the pattern to be processed onto the material to be processed in a working state corresponding to the target processing parameter group according to the processing request to obtain the target processing material processed with the pattern to be processed.

[0514] At this point, the actual processing to obtain the desired product ends.

[0515] In the embodiment of the present application, through the interaction between the terminal device, the processing equipment, and the server, the target processing parameter group can be determined efficiently and accurately, and the target processing equipment is used to realize the processing of the material to be processed, thereby avoiding the waste of materials and time caused by the artificial setting of the target processing parameter group due to cognitive bias of the material to be processed, thereby improving the processing efficiency and accuracy, meeting the product manufacturing needs, improving the user experience, and increasing the stickiness between the processing equipment and the user.

[0516] FIG28 is a block diagram of a data processing device based on a processing device, shown in an exemplary embodiment of the present application. The device includes:

[0517] The processing module 701 is configured to control the processing equipment to process the preset patterns onto the test material according to multiple processing parameter groups based on the processing request, thereby obtaining a test processed material processed with multiple preset patterns;

[0518] An acquisition module 702 is configured to acquire a photographic image of the test processing material;

[0519] The recognition processing module 703 is configured to obtain a processing parameter group corresponding to each preset pattern in the captured image according to the recognition processing result of the captured image;

[0520] The processing module is further configured to control the processing equipment to perform processing based on the identified processing parameter group.

[0521] In one embodiment of the present application, based on the above solution, the identification processing module 703 is specifically configured as follows:

[0522] Performing pattern position recognition on the captured image to obtain position information of each preset pattern in the captured image;

[0523] The preset pattern corresponding to each position information is identified with respect to the processing parameter group to obtain the processing parameter group of each preset pattern in the captured image.

[0524] In one embodiment of the present application, based on the above solution, the captured image includes multiple preset patterns and multiple processing parameter groups; the recognition processing module 703 is further specifically configured to:

[0525] A processing parameter group associated with a preset pattern corresponding to each position information is identified from the plurality of processing parameter groups to obtain a processing parameter group for each preset pattern in the captured image.

[0526] In one embodiment of the present application, based on the above solution, the identification processing module 703 is further specifically configured as follows:

[0527] Inputting the captured image into a recognition processing model to identify each preset pattern in the captured image with respect to a pattern position and a processing parameter group through the recognition processing model;

[0528] The position information of each preset pattern in the photographed image output by the recognition processing model and the processing parameter group of each preset pattern in the photographed image are obtained.

[0529] In one embodiment of the present application, based on the above solution, the identification processing module 703 is specifically configured as follows:

[0530] The captured image is identified and processed by a server or a terminal device to obtain position information of each preset pattern in the captured image and a processing parameter group of each preset pattern in the captured image.

[0531] In one embodiment of the present application, based on the above solution, the identification processing module 703 is further specifically configured as follows:

[0532] Sending the captured image to a server or terminal device, so that the server or terminal device recognizes each preset pattern in the captured image with respect to a pattern position and a processing parameter group through a recognition processing model;

[0533] The position information of each preset pattern in the photographed image output by the recognition processing model and the processing parameter group of each preset pattern in the photographed image are obtained.

[0534] In one embodiment of the present application, based on the above solution, the identification processing module 703 is further specifically configured as follows:

[0535] If an upload operation for the captured image is received, the captured image is sent to a server or a terminal device;

[0536] receiving, from the server or terminal device, position information of each preset pattern in the captured image output by the recognition processing model and a processing parameter group of each preset pattern in the captured image;

[0537] Position information of each preset pattern in the photographed image and a processing parameter group of each preset pattern in the photographed image are displayed.

[0538] In one embodiment of the present application, based on the above solution, the apparatus further includes a training module configured to:

[0539] Obtaining a training sample group, the training sample group including a first sample image and a second sample image, the first sample image and the second sample image being obtained by photographing a training processing material including a plurality of sample patterns, the training processing material being processed by the processing equipment according to a plurality of processing parameter sets, the second sample image having a label relative to the first sample image;

[0540] Inputting the first sample image into the model to be trained to obtain a recognition processing sample result of the first sample image;

[0541] According to the loss value between the recognition processing sample result and the second sample image, the model to be trained is iteratively trained until the loss value is less than a set value, thereby obtaining a recognition processing model.

[0542] In one embodiment of the present application, based on the aforementioned solution, the recognition processing sample result of the first sample image includes first position sample information of each sample pattern in the first sample image, and a first processing parameter sample group of each sample pattern in the first sample image; the label of the second sample image includes second position sample information of each sample pattern in the second sample image, and a second processing parameter sample group of each sample pattern in the second sample image;

[0543] The training module is specifically configured as follows:

[0544] According to the loss value between the first position sample information and the second position sample information, and the loss value between the first processing parameter sample group and the second processing parameter sample group, the model to be trained is iteratively trained until the loss value is less than the set value, thereby obtaining a recognition processing model.

[0545] In one embodiment of the present application, based on the above solution, the processing module 701 is specifically configured as follows:

[0546] In response to an input operation of property information corresponding to a test material, displaying a processing interface, the processing interface including a processing control;

[0547] If a trigger operation for the processing control is received, a processing request is generated;

[0548] The processing request is sent to the processing equipment, so that the processing equipment is in the working state corresponding to each processing parameter group according to the processing request, and the preset pattern is processed onto the test material to obtain a test processed material with multiple preset patterns.

[0549] In one embodiment of the present application, based on the above solution, the device further includes a display module configured as follows:

[0550] displaying a parameter group selection interface, wherein the parameter group selection interface includes a plurality of preset patterns of the captured image;

[0551] If a selection instruction for a plurality of preset patterns in the captured image is received, at least one parameter value of the processing parameter group corresponding to the selected preset pattern is displayed.

[0552] In one embodiment of the present application, based on the above solution, the display module is specifically configured as follows:

[0553] Acquire a processing parameter group corresponding to each preset pattern in the captured image, the processing parameter group including a first parameter value and a second parameter value;

[0554] Determining a position of each preset pattern in a first direction based on a first parameter value corresponding to each preset pattern, wherein a larger first parameter value indicates a higher position in the first direction; and determining a position of each preset pattern in a second direction based on a second parameter value corresponding to each preset pattern, wherein a larger second parameter value indicates a higher position in the second direction;

[0555] Based on the position of each preset pattern in the first direction and the position of each preset pattern in the second direction, each preset pattern is arranged to be displayed on the parameter group selection interface.

[0556] In one embodiment of the present application, based on the above solution, the parameter group selection interface further includes a confirmation control; the device further includes a confirmation module configured to:

[0557] If a trigger operation for the confirmation control is received, the preset pattern selected by the selection instruction is used as the designated preset pattern, and it is determined that a confirmation operation for the processing parameter group corresponding to the designated preset pattern is received.

[0558] In one embodiment of the present application, based on the above solution, the processing module 701 is specifically configured as follows:

[0559] If a confirmation operation is received for a processing parameter group corresponding to a specified preset pattern in the captured image, the processing parameter group confirmed by the confirmation operation is determined as a target processing parameter group;

[0560] The processing equipment is controlled to perform processing based on the target processing parameter group.

[0561] In one embodiment of the present application, based on the above solution, the processing module 701 is further specifically configured as follows:

[0562] The processing equipment is controlled to process the pattern to be processed onto a material to be processed that is the same or similar type as the test material according to the target processing parameter group.

[0563] It should be noted that the data processing device based on processing equipment provided in the above embodiment and the data processing method based on processing equipment provided in the above embodiment belong to the same concept, and the specific way in which each module and unit performs operations has been described in detail in the method embodiment and will not be repeated here.

[0564] An embodiment of the present application also provides an electronic device, comprising: one or more processors; a memory for storing one or more programs, wherein when the one or more programs are executed by the one or more processors, the electronic device implements the data processing method based on processing equipment provided in the above-mentioned embodiments.

[0565] Figure 29 is a schematic diagram of the structure of a computer system of an electronic device suitable for implementing an embodiment of the present application. It should be noted that the computer system 800 of the electronic device shown in Figure 29 is only an example and should not bring any limitation to the functions and scope of use of the embodiment of the present application.

[0566] As shown in Figure 29, the computer system 800 includes a central processing unit (CPU) 801, which can perform various appropriate actions and processes according to the program stored in the read-only memory (ROM) 802 or the program loaded from the storage part 808 into the random access memory (RAM) 803, such as the method described in the above embodiment. Various programs and data required for system operation are also stored in the RAM 803. The CPU 801, ROM 802 and RAM 803 are connected to each other via a bus 804. An input / output (I / O) interface 805 is also connected to the bus 804.

[0567] The following components are connected to the I / O interface 805: an input section 806 including a keyboard, a mouse, and the like; an output section 807 including devices such as a cathode ray tube (CRT), a liquid crystal display (LCD), and a speaker; a storage section 808 including a hard disk; and a communication section 809 including a network interface card such as a local area network (LAN) card or a modem. The communication section 809 performs communication processing via a network such as the Internet. A drive 810 is also connected to the I / O interface 805 as needed. Removable media 811, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, and the like, is installed in the drive 810 as needed, so that computer programs read therefrom can be installed into the storage section 808 as needed.

[0568] In particular, according to an embodiment of the present application, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present application includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a computer program for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 809, and / or installed from a removable medium 811. When the computer program is executed by the central processing unit (CPU) 801, the various functions defined in the system of the present application are executed.

[0569] Based on this, an embodiment of the present application provides a processing device, which includes:

[0570] Slide rails;

[0571] a processing head, the processing head being slidably disposed on the slide rail;

[0572] a communication component for receiving an execution control instruction generated by the processing parameters obtained according to the processing method of the present application;

[0573] A controller is used to control the machining head to move on the slide rail to perform machining based on the execution control instruction.

[0574] In this embodiment, the processing equipment is a device that uses a tool such as a laser or a cutting tool to perform subtractive manufacturing such as cutting and engraving, or additive manufacturing such as printing, for materials, such as laser processing equipment using a laser as a processing means, a CNC machine tool using a cutting tool as a processing means, additive manufacturing equipment, etc. The processing equipment communicates with a terminal device (such as one or more devices marked by 202 in Figures 2 and 21), and the processing control device is used to perform data processing operations of the processing equipment (such as the data processing of the processing method of this application).

[0575] The hardware structure of the processing equipment is schematically illustrated in Figure 10, taking a laser processing device as an example. The processing equipment includes a housing 90, a processing platform 10, a processing head 20, a laser tube 30, a slide rail 40, a communication component 50, and a controller 60. The housing 90 includes an upper shell 70 and a bottom shell 80. The processing platform 10 includes a processing area 11 for placing the material to be processed. The processing head 20 is slidably mounted on the slide rail 40 and is configured to move within the processing area to perform processing. The communication component 50 is configured to receive target processing parameters obtained by the steps of the method provided in the embodiments of this application. Based on the target processing parameters, the controller 60 controls the movement of the processing head 50 on the slide rail 80 to process the material to be processed. The communication component 50 and the controller 60 are mounted inside the back panel of the laser tube 30. Due to the lack of visibility in the figure, they are shown as connected blocks with dashed lines. In one embodiment, a reflector 21 is positioned between the processing head 20 and the laser tube 30. The light beam generated by the laser tube 30 is reflected by the reflector 21 to the processing head 20, where it is then reflected, focused, and emitted to process the workpiece. In one embodiment, the processing head 20 can generate a light spot. In another embodiment, the light spot can be generated by other components, such as the laser tube 30 of a carbon dioxide laser tube, and enter the beam output device through the reflector 21, and finally pass through the processing head 20 and then be emitted to process the workpiece. The processing head can emit laser light, but it is not limited to emitting laser light.

[0576] In a feasible embodiment, the processing equipment includes a slide rail 40 and a processing head 20. The processing head 20 is slidably disposed on the slide rail 40. The processing head 20 is used to perform at least one of laser processing, cutting processing or printing processing on the material to be processed.

[0577] In this embodiment, during the process of processing the material to be processed based on the processing execution instruction, the processing equipment includes a slide 40 and a processing head 20, and the processing head 20 is slidably disposed on the slide 40. Exemplarily, the slide 40 can be an X-axis guide rail, and the X-axis guide rail can be a linear guide rail, or a guide rail in which an optical axis and rollers slide together, etc., and only needs to be able to drive the processing head 20 to move along the X-axis and Y-axis for processing. The processing head 20 can also be provided with a Z-axis movement track for moving in the Z-axis direction for focusing before and / or during processing. In this way, the processing head 20 can be moved within the range covered by the slide 40 with the help of the slide 40. In addition, the processing head 20 is used to perform at least one of laser processing, cutting, or printing on the material to be processed. Due to the different processing equipment used, the processing heads 20 configured on the processing equipment will also be different. For example, for processing equipment that uses laser as a processing means, its processing head 20 will be configured with a laser component for emitting laser to perform laser processing on the material to be processed; for processing equipment that uses cutting tools as a processing means, its processing head 20 will be configured with cutting tools to perform mechanical cutting on the material to be processed; for processing equipment that uses additive manufacturing as a processing means, its processing head 20 will be configured with an additive manufacturing component to print the material to be processed to achieve additive manufacturing.

[0578] In a feasible embodiment, the processing equipment also includes a processing platform 10, which includes a processing area 11 for placing the material to be processed. The processing head 20 moves on the processing area 11 to perform at least one of laser processing, cutting processing or printing processing on the material to be processed.

[0579] In this embodiment, the processing equipment also includes a processing platform 10, which includes a processing area 11 for placing the material to be processed, so that the processing head 20 can move on the processing area 11 with the help of a slide rail 40. At the same time, during the movement of the processing head 20 on the processing area 11, the material to be processed can be processed by at least one of laser processing, cutting processing or printing processing.

[0580] In a feasible embodiment, the processing equipment includes a shell 90 and a cover plate 71, which enclose an internal space for accommodating the material to be processed. The shell 90 has an opening connected to the internal space. The cover plate 71 is connected to the shell 90 to open or close the opening. The cover plate 71 includes a light-transmitting window. The slide rail 40, the processing head 20 and the processing platform 10 are located in the internal space, and a camera device 12 is also provided in the internal space.

[0581] In this embodiment, the housing 90 can be an integrally formed housing 90 or a split housing 90, for example, including a housing 90 and a bottom housing that are detachably connected or fixedly connected, and are used to enclose together with the cover plate 71 to form an internal space for accommodating the material to be processed. Through the blocking and / or filtering effect of the upper housing 70 and the bottom housing 80, it is possible to prevent the laser emitted by the processing head 20 from spilling out during operation and causing personal injury to the operator. The housing 90 has an opening that communicates with the internal space, and the cover plate 71 is connected to the housing 90 to open or close the opening. For example, the cover plate 71 can be connected to the housing 90 by a hinge (i.e., a hinge is installed between the cover plate 71 and the housing 90 so that the cover plate 71 can be opened and closed like a door), a slide rail 40 connection (i.e., a slide rail 40 is provided between the cover plate 71 and the housing 90, and the cover plate 71 moves relative to the housing 90 along the slide rail 40, and opens and closes by sliding in and out), etc. The operator can open or close the cover 71 to open or close the opening, opening or closing the interior space for loading or unloading materials. The cover 71 includes a light-transmitting window through which the operator can observe the processing status within the interior space. The slide rail 40, processing head 20, and processing platform 10 are located within the interior space. A camera device 12 is also located within the interior space to capture the processing of the materials within the interior space.

[0582] The present application provides a processing system, comprising: a processing device, wherein the processing device includes a processing device carrier and a processing head, the processing device carrier includes a processing area for placing materials, and the processing head is used to move on the processing area; and a terminal device that communicates with the processing device, wherein the terminal device is used to execute the method for determining the processing parameters as described in any of the above embodiments.

[0583] The present application also provides a processing system, comprising: at least one processor; at least one non-transitory computer-readable medium; the at least one non-transitory computer-readable medium stores program instructions, which can be executed by at least one processor, so that the computing system is configured to execute the method for determining processing parameters as described in any of the above embodiments.

[0584] Please refer to Figure 11, which is a schematic diagram of the processing system of the present application. With the development of processing equipment, processing equipment has gradually become intelligent and convenient. Users can conveniently use the processing equipment to process the material to be processed by controlling the host computer software installed on the terminal device. As shown in Figure 11, the host computer software of the processing equipment 202 is installed on the terminal device 201. The host computer software provides a device control interface. The user can use the processing equipment to process the material to be processed by performing relevant trigger operations on the device control interface.

[0585] In one embodiment of the present application, the processing parameter determination can be performed by the terminal device 101. Specifically: the processing equipment 202 obtains a processing width image corresponding to the processing equipment carrier; the processing width image contains the material to be processed, and the processing width image is sent to the terminal device 101. When the terminal device 101 determines that the processing width image contains label information, it performs identification processing based on the label information to determine the type of the material to be processed; based on the type of the material to be processed, the processing parameters matching the type are determined.

[0586] It should be clear that the terminal device 101 includes but is not limited to smart phones, computers (tablets, laptops, desktop computers, etc.), smart wearable devices (bracelets, watches, etc.), etc.

[0587] It should be clear that the processing equipment 102 can be any processing equipment. For example, it can be a laser processing equipment, where the laser processing equipment is a device that uses a laser beam for processing, and can use a laser beam to cut, punch, engrave, and other processing on various materials such as metal, plastic, wood, glass, textiles, etc., including but not limited to laser engraving machines, laser cutting machines, laser printers, etc.

[0588] The embodiments of the present application achieve simple and accurate processing control, avoid the waste of materials and time caused by cognitive bias in the treatment of processing materials and artificial setting of processing parameters, improve the processing effect and accuracy, and can meet product manufacturing needs.

[0589] It should be noted that the number of terminal devices 101 and processing devices 102 is only illustrative, and any number of terminal devices 101 and processing devices 102 may be provided according to actual needs.

[0590] It is understandable that in the specific implementation of this application, user-related data is involved. When the embodiments of this application are applied to specific products or technologies, user permission or consent is required, and the collection, use and processing of relevant data must comply with relevant laws, regulations and standards of relevant countries and regions.

[0591] The present application provides a terminal device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the method for determining the processing parameters in the above-mentioned embodiment one.

[0592] Reference is now made to Figure 12, which illustrates a schematic diagram of the structure of a terminal device suitable for implementing embodiments of the present application. The terminal device in the embodiments of the present application may include, but is not limited to, a mobile phone, a laptop computer, and a tablet computer. The terminal device illustrated in Figure 12 is merely an example and should not limit the functionality or scope of use of the embodiments of the present application.

[0593] As shown in Figure 12, the terminal device may include a processing device 1001 (e.g., a central processing unit, a graphics processing unit, etc.), which can perform various appropriate actions and processes based on programs stored in a read-only memory (ROM) 1002 or programs loaded from a storage device 1003 into a random access memory (RAM) 1004. RAM 1004 also stores various programs and data required for the operation of the terminal device. Processing device 1001, ROM 1002, and RAM 1004 are interconnected via a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Typically, the following systems can be connected to I / O interface 1006: input devices 1007 including, for example, a touch screen, touchpad, keyboard, mouse, image sensor, microphone, accelerometer, gyroscope, etc.; output devices 1008 including, for example, a liquid crystal display (LCD), speaker, vibrator, etc.; storage device 1003 including, for example, a magnetic tape, hard disk, etc.; and communication device 1009. The communication device 1009 can allow the terminal device to communicate with other devices wirelessly or wired to exchange data. Although the figure shows a terminal device with various systems, it should be understood that it is not required to implement or have all the systems shown. More or fewer systems can be implemented or provided instead.

[0594] In particular, according to the embodiments disclosed in the present application, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, the embodiments disclosed in the present application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program comprising program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network via a communication device, or installed from a storage device 1003, or installed from a ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present application are executed.

[0595] The terminal device provided in this application utilizes the method for determining processing parameters in the above-described embodiment to resolve the technical problem of poor matching between processing parameters and materials, which in turn leads to poor processing results. Compared to the prior art, the terminal device provided in this application achieves the same beneficial effects as those provided in the above-described embodiment, and the other technical features of this terminal device are the same as those disclosed in the method of the above-described embodiment, and are not further described here.

[0596] It should be understood that the various parts disclosed in this application can be implemented using hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials, or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0597] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

[0598] The present application provides a computer-readable storage medium having computer-readable program instructions (ie, a computer program) stored thereon, wherein the computer-readable program instructions are used to execute the method for determining the processing parameters in the above-mentioned embodiment.

[0599] The computer-readable storage medium provided in this application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, system or device. The program code contained on the computer-readable storage medium can be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency), etc., or any suitable combination thereof.

[0600] The computer-readable storage medium may be included in the processing equipment, or may exist independently without being assembled into the processing equipment.

[0601] The above-mentioned computer-readable storage medium carries one or more programs. When the above-mentioned one or more programs are executed by the processing equipment, the processing equipment: obtains a processing width image corresponding to the processing equipment carrier table, and the processing width image contains the material to be processed; identifies the processing width image and determines the material type of the material to be processed; and obtains the processing parameters of the material to be processed based on the material type matching.

[0602] The computer program code for performing the operations of the present application can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving a remote computer, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (for example, using an Internet service provider to connect through the Internet).

[0603] The flow charts and block diagrams in the accompanying drawings illustrate the possible architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present application. In this regard, each box in the flow chart or block diagram can represent a module, program segment or a part of code, and the module, program segment or a part of code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order than that marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flow chart, and the combination of the boxes in the block diagram and / or flow chart can be implemented by a dedicated hardware-based system that performs the specified function or operation, or can be implemented by a combination of dedicated hardware and computer instructions.

[0604] The modules described in the embodiments of the present application may be implemented in software or hardware, wherein the name of a module does not necessarily limit the unit itself.

[0605] The computer-readable storage medium provided in this application is a computer-readable storage medium that stores computer-readable program instructions (i.e., a computer program) for executing the above-described method for determining processing parameters. This computer-readable storage medium can address the technical problem of poor matching between processing parameters and materials, which in turn leads to poor processing results. Compared to the prior art, the beneficial effects of the computer-readable storage medium provided in this application are the same as those of the method for determining processing parameters provided in the above-described embodiments, and are not further elaborated here.

[0606] An embodiment of the present application provides a computer program product, including a computer program, which implements the steps of the above-mentioned method for determining processing parameters when executed by a processor.

[0607] The computer program product provided in this application can address the technical problem of poor matching between processing parameters and materials, which in turn leads to poor processing results. Compared to the prior art, the beneficial effects of the computer program product provided in the embodiments of this application are the same as those of the method for determining processing parameters provided in the above embodiments, and are not further elaborated here.

[0608] The above are only preferred embodiments of the present application and do not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent processing scope of the present application.

Claims

1. A method for determining processing parameters, characterized in that: The method for determining the processing parameters includes: Acquire a processing width image corresponding to the processing equipment, wherein the processing width image includes the material to be processed; At least a portion of the processing format image is identified to determine processing parameters of the material to be processed.

2. The method for determining processing parameters according to claim 1, wherein: The step of identifying the processing width image and determining the processing parameters of the material to be processed includes: Identifying at least a portion of the processing format image to determine the material type of the material to be processed; The processing parameters of the material to be processed are obtained based on the material type matching.

3. The method for determining processing parameters according to claim 2, wherein: The step of identifying the processing format image and determining the material type of the material to be processed includes: Identify label information in the processing format image to determine the material type; or determine feature information of the material to be processed based on the processing format image; determine the material type based on the matching degree between the feature information and the features of each material in a set material feature database.

4. The method for determining processing parameters according to claim 3, wherein: The step of determining the characteristic information of the material to be processed based on the processing width image includes: Determine first feature information of the material to be processed based on the processing width image, where the first feature information includes texture feature, color feature and shape feature; or Second characteristic information of the material to be processed is determined based on the processing width image, where the second characteristic information includes spectral characteristics and / or speckle characteristics.

5. The method for determining processing parameters according to claim 2, wherein: The step of obtaining the processing parameters of the material to be processed based on the material type matching includes: Obtain multiple reference processing parameters; determining a processing quality parameter corresponding to each of the reference processing parameters based on the material type; According to the processing quality parameter, the processing parameter is obtained by screening from a plurality of reference processing parameters; The processing parameters include processing parameters of at least one dimension. After the step of determining the processing quality parameter corresponding to each reference processing parameter based on the material type, the method further includes: determining two sets of reference processing parameters to be interpolated based on the processing quality parameter, and determining a processing parameter to be interpolated; Keeping other processing parameters in the two groups of processing parameters except the processing parameters to be interpolated unchanged, performing interpolation processing on the processing parameters to be interpolated to obtain a plurality of candidate reference processing parameters; The processing parameter is obtained by screening the plurality of candidate reference processing parameters.

6. The method for determining processing parameters according to claim 2, wherein: Before the step of identifying the processing width image and determining the material type of the material to be processed, the method includes: In response to a selection instruction of a processing width image acquisition control in the interactive interface, displaying the acquired processing width image in the interactive interface; In the case where a processing element is displayed in the interactive interface, the processing element and the processing format image are displayed on the interactive interface, and the processing element is placed above the layer of the processing format image.

7. The method for determining processing parameters according to claim 2, wherein: The step of obtaining the processing parameters of the material to be processed based on the material type matching includes: determining a corresponding processing parameter array according to the material type, and determining a plurality of reference processing parameters based on the processing parameter array; The processing parameter array is provided with a plurality of processing effect diagrams, and each processing effect diagram corresponds to a processing preview effect of a different reference processing parameter.

8. The method for determining processing parameters according to claim 3, wherein: The step of determining the material type based on the matching degree between the characteristic information and the characteristics of each material in the set material characteristic database includes: At least one candidate material type is obtained by matching the feature information with a set material feature database, and a material type determination control is displayed on an interactive interface, wherein the material type determination control displays at least one candidate box, and each candidate box displays one of the candidate material types; In response to a selection instruction for the at least one candidate box, the candidate material type corresponding to the selected candidate box is determined as the material type of the material to be processed.

9. The method for determining processing parameters according to claim 1, wherein: The method further comprises: In response to a selection instruction of a material selection control in the interactive interface, a material list control is displayed above the editing area of ​​the interactive interface, wherein the material list control includes a plurality of material diagrams, each of the material diagrams corresponding to a material type, wherein the material diagrams display at least one of the material type, texture, color, and thickness information of the corresponding material type, and the plurality of material diagrams are arranged in rows and / or columns; In response to a selection instruction of a material identification control in the material list control, triggering the execution of the action of acquiring a processing width image corresponding to the processing equipment carrier and performing identification to determine at least one candidate material type; Displaying at least one candidate box in the material type determination control in the interactive interface, each candidate box displays detailed information associated with a candidate material type, the detailed information including a material image and a material name; In response to a selection instruction for the at least one candidate box, determining the candidate material type corresponding to the selected candidate box as the material type of the material to be processed; And / or, the step of determining the processing parameters of the material to be processed includes: The processing parameters are displayed in a parameter configuration control of the interactive interface, wherein the processing parameters include at least two, and each processing parameter in the parameter configuration control is displayed with a corresponding parameter adjustment control; In response to the adjustment operation on the parameter adjustment control, the adjusted processing parameters are used as final processing parameters to determine the final processing parameters.

10. The method for determining processing parameters according to claim 3, wherein: After the step of determining the material type, the method further comprises: A material type display control on the interactive interface displays the material type of the material to be processed; wherein the display of the material type of the material to be processed includes displaying a material schematic diagram on the interactive interface, the material schematic diagram displaying at least two of the texture, material, and color of the corresponding material type; A parameter configuration control on the interactive interface displays an array of processing parameters corresponding to the material type; In response to a selection instruction for a processing effect diagram in the processing parameter array, final processing parameters are determined according to parameters of a target processing effect diagram corresponding to the selection instruction.

11. The method for determining processing parameters according to claim 1, wherein: The step of identifying at least a portion of the processing width image and determining the processing parameters of the material to be processed includes: When label information is detected in the processing width image, the label information is decoded to obtain target processing parameters corresponding to the material to be processed.

12. The method for determining processing parameters according to claim 1, wherein: The method for determining the processing parameters further includes: Setting processing element information of the material to be processed; Displaying at least one processing effect diagram according to the processing element information; wherein the processing effect diagram is mapped to the processing parameters; In response to a selection instruction for the processing effect diagram, a processing parameter corresponding to the selection instruction is determined, and the processing parameter corresponding to the selection instruction is used as a target processing parameter, and the target processing parameter is used to control a processing device to process the material to be processed.

13. The method for determining processing parameters according to claim 12, wherein: The step of displaying at least one processing effect diagram according to the processing element information includes: According to the processing element information, a corresponding processing parameter array is obtained, and the processing parameter array is displayed on an interactive interface, wherein the processing parameter array includes a plurality of array elements, each of the array elements represents a processing parameter, and the processing effect diagram includes a plurality of processing effect diagrams corresponding to the array elements of the processing parameter array; The step of determining, in response to a selection instruction for the processing effect diagram, processing parameters corresponding to the selection instruction and using the processing parameters corresponding to the selection instruction as target processing parameters includes: In response to an element selection instruction for an array element in the processing parameter array, a processing parameter corresponding to the selected array element is used as a target processing parameter.

14. The method for determining processing parameters according to claim 13, wherein: The processing element information includes a material type and a processing type. The interactive interface is preset with at least two different material types and at least two different processing types. The step of setting the processing element information of the material to be processed includes: Displaying a processing element on an interactive interface, wherein the processing element is a pattern expected to be processed on the material to be processed; In response to a selection instruction in the interactive interface, setting the material type of the material to be processed; In response to a selection instruction in the interactive interface, setting a processing type of the processing element; When the interactive interface displays a processing element, a corresponding processing parameter array is obtained based on the material type of the material to be processed and the processing type of the processing element; wherein, when the material type of the material to be processed is the same, the display effect of the corresponding processing parameter array is different when the processing type of the processing element is different; and / or, When the interactive interface displays multiple processing elements, a processing type is set for each processing element, and a corresponding processing parameter array is obtained according to the processing type of each processing element, wherein the multiple processing elements include at least two processing types, and the at least two processing types correspond to at least two processing parameter arrays with different display effects.

15. The method for determining processing parameters according to claim 14, wherein: When the interactive interface displays a plurality of the processing elements, the step of selecting the processing element in response to a selection instruction in the interactive interface and setting the processing type of the processing element includes: In response to a selection instruction in the interactive interface, at least one of the processing elements is selected, and a processing type of the at least one processing element is set.

16. The method for determining processing parameters according to claim 15, wherein: The step of selecting at least one of the processing elements and setting the processing type of at least one of the processing elements in response to the selection instruction in the interactive interface includes: In response to a selection instruction in the interactive interface, simultaneously selecting at least two of the processing elements and setting processing types of the at least two processing elements; And / or, in response to a selection instruction in the interactive interface, at least two of the processing elements are simultaneously selected to execute a combination instruction, and a processing type is set for the at least two processing elements after the combination instruction is executed.

17. The method for determining processing parameters according to claim 14, wherein: The processing types include laser line engraving, laser fill engraving, and laser line engraving. The step of setting processing element information of the processing element and displaying at least one processing effect diagram according to the processing element information includes: In response to a selection instruction in the interactive interface, the material type of the material to be processed is set; according to the set material type, a processing effect diagram corresponding to the set material type is displayed, and the background of the processing effect diagram is filled with a material schematic diagram corresponding to the material type, and the material schematic diagram displays at least two of the texture, material and color of the corresponding material type; In response to a selection instruction in the interactive interface, the processing type of the processing element is set; according to the set processing type, a reference pattern corresponding to the set processing type is displayed above the layer of the material schematic diagram, and the processing effect diagrams displayed by the laser line engraving, the laser fill engraving and the laser line cutting are different.

18. The method for determining processing parameters according to claim 17, wherein: The step of displaying a reference pattern corresponding to the set processing type above the layer of the material schematic diagram according to the set processing type includes: In response to a selection instruction in the interactive interface, the material type of the material to be processed is set to laser line engraving, and a plurality of different reference patterns are displayed on the material schematic diagram according to the set material type, wherein the reference patterns are composed of lines, and the greater the target processing parameter, the darker the line color of the reference pattern; and / or, in response to a selection instruction in the interactive interface, setting the material type of the material to be processed to laser fill engraving, and displaying a plurality of different reference patterns on the material schematic diagram according to the set material type, wherein the reference patterns are filled color blocks, and the greater the target processing parameter, the darker the color of the filled color blocks of the reference patterns; And / or, in response to a selection instruction in the interactive interface, the material type of the material to be processed is set to laser line cutting, and a plurality of different reference patterns are displayed on the material schematic diagram according to the set material type, wherein the reference pattern is composed of lines, and the larger the target processing parameter, the darker the color of the lines of the reference pattern. When the target processing parameter is sufficient to cut the material to be processed, the part enclosed by the lines of the reference pattern is displayed as a hollow pattern.

19. The method for determining processing parameters according to claim 13, wherein: The array element includes at least a first parameter item and a second parameter item, and the step of determining the corresponding processing parameter array according to the processing element information of the processing element includes: determining a first sorting position of each array element in the first direction based on a processing parameter of a first parameter item corresponding to each array element; determining a second sorting position of each array element in the second direction based on a processing parameter of the second parameter item corresponding to each array element; Arranging each array element based on the first sorting position and the second sorting position of each array element to obtain the processing parameter array; The processing parameter of the first parameter item is positively correlated with the arrangement order of the first sorting positions in the predetermined first direction; The processing parameters of the second parameter item are positively correlated with the arrangement order of the second sorting position in the predetermined second direction; the array element includes a reference pattern, which is a processing effect diagram generated based on the processing parameters, and the reference pattern includes a pattern composed of lines.

20. The method for determining processing parameters according to claim 13, wherein: The interactive interface displays a parameter configuration control, the processing parameter array is in a picture format, and before the step of responding to an element selection operation on an array element in the processing parameter array and using processing parameter value information corresponding to the selected array element as a target processing parameter, the method includes: Move the operation pointer to the parameter configuration control in the interactive interface, and the interactive interface will hover to display the processing parameter array corresponding to the material type; The step of responding to a selection instruction for a processing effect diagram in the processing parameter array and using parameters of a target processing effect diagram corresponding to the selection instruction as final processing parameters includes: In response to a hovering operation on the processing effect diagram of the processing parameter array, one of the processing effect diagrams in the hovered processing parameter array is clicked, and the array element corresponding to the selected processing effect diagram represents the reference processing parameter as the final processing parameter.

21. The method for determining processing parameters according to claim 13, wherein: A processing element is displayed in the editing area of ​​the interactive interface, wherein the processing element is a pattern expected to be processed on the material to be processed, the processing effect diagram includes a processing effect diagram corresponding to the processing element, and the parameter configuration control of the interactive interface includes at least a parameter adjustment control for the processing parameter. After the step of using the processing parameters corresponding to the selected array elements as target processing parameters, the method includes: In response to an adjustment operation on the parameter adjustment control, taking the adjusted processing parameter as a new target processing parameter; Based on the target processing parameters and the processing element information, a processing effect diagram corresponding to the processing element is generated, and the processing effect diagram corresponding to the processing element is displayed on the interactive interface, wherein the processing effect diagram corresponding to the processing element is a processing effect presented by the processing element under the target processing parameters and the processing element information.

22. The method for determining processing parameters according to claim 13, wherein: The processing element information includes at least a material type, and the step of acquiring a corresponding processing parameter array according to the processing element information includes: Obtaining an element-array mapping table, wherein the element-array mapping table is used to describe a mapping relationship between processing elements and processing parameter arrays; According to the material type, the element-array mapping table is queried to obtain a processing parameter array that matches the material type.

23. The method for determining processing parameters according to claim 12, wherein: The step of displaying at least one processing effect diagram according to the processing element information includes: Displaying an interactive interface, wherein the interactive interface further includes a parameter configuration control, wherein the parameter configuration control at least includes a parameter adjustment control for a processing parameter; In response to an adjustment operation on the parameter adjustment control, displaying the adjusted processing parameters on the interactive interface; generating a processing effect diagram corresponding to the material to be processed according to the adjusted processing parameters and the processing element information, and displaying the processing effect diagram on the interactive interface; The step of determining, in response to a selection instruction for the processing preview effect image, processing parameters corresponding to the selection instruction and using the processing parameters corresponding to the selection instruction as target processing parameters includes: When no adjustment operation for the parameter adjustment control is received within a set time period, determining a processing effect image corresponding to the last adjustment operation; In response to a selection instruction for the processing effect diagram corresponding to the last adjustment operation, the adjusted processing parameters corresponding to the last adjustment operation are used as target processing parameters.

24. The method for determining processing parameters according to claim 12, wherein: After the step of using the processing parameters corresponding to the selection instruction as target processing parameters, the method further includes: Displaying a parameter sharing interface, wherein the parameter sharing interface includes the target processing parameters; In response to a sharing instruction on the displayed parameter sharing interface, the target processing parameter pointed to by the sharing instruction is used as the shared processing parameter, and the to-be-shared object pointed to by the sharing instruction is used as the target sharing object; The shared processing parameters are sent to the target sharing object.

25. The method for determining processing parameters according to claim 7, wherein: Before the step of determining a corresponding processing parameter array according to the processing element information of the processing element, the method further includes: Controlling the processing equipment to process preset patterns onto the test material according to a plurality of processing parameter groups based on the processing request, thereby obtaining a test processed material processed with a plurality of preset patterns, wherein each of the processing parameter groups includes at least two different processing parameters; Acquire a photographic image of the test processed material; Obtaining, based on a recognition processing result of the captured image, a processing parameter group corresponding to each preset pattern in the captured image, wherein the preset pattern includes at least one of a line pattern, a fill pattern, and a hollow pattern; Based on the preset pattern and the processing parameter group, a processing parameter array corresponding to the test processing material is obtained.

26. The method for determining processing parameters according to claim 25, wherein: The processing parameters include at least two of laser power, pulse frequency, pulse width, scanning speed, processing speed, spot size, defocus amount, and processing times. The processing parameter group corresponding to each preset pattern in the captured image is obtained based on the recognition processing result of the captured image, including: Performing pattern position recognition on the captured image to obtain position information of each preset pattern in the captured image; The preset pattern corresponding to each position information is identified with respect to the processing parameter group to obtain the processing parameter group of each preset pattern in the captured image.

27. The method according to claim 26, wherein The captured image includes a plurality of preset patterns and a plurality of processing parameter groups; The identifying of the processing parameter group for the preset pattern corresponding to each position information to obtain the processing parameter group for each preset pattern in the captured image includes: A processing parameter group associated with a preset pattern corresponding to each position information is identified from the plurality of processing parameter groups to obtain a processing parameter group for each preset pattern in the captured image.

28. The method for determining processing parameters according to claim 25, wherein: The step of identifying a pattern position on the captured image to obtain position information of each preset pattern in the captured image, and identifying a processing parameter group for each preset pattern corresponding to each position information to obtain a processing parameter group for each preset pattern in the captured image includes: Inputting the captured image into a recognition processing model to identify each preset pattern in the captured image with respect to a pattern position and a processing parameter group through the recognition processing model; The position information of each preset pattern in the photographed image output by the recognition processing model and the processing parameter group of each preset pattern in the photographed image are obtained.

29. The method for determining processing parameters according to claim 25, wherein: The step of obtaining a processing parameter group corresponding to each preset pattern in the captured image according to the recognition processing result of the captured image includes: Obtaining position information of each preset pattern in the photographed image and a processing parameter group of each preset pattern in the photographed image by performing recognition processing on the photographed image; The step of obtaining position information of each preset pattern in the captured image and a processing parameter group of each preset pattern in the captured image by performing recognition processing on the captured image includes: Sending the captured image to a server or a terminal device, so that the server or the terminal device recognizes each preset pattern in the captured image with respect to a pattern position and a processing parameter group through a recognition processing model; The position information of each preset pattern in the photographed image output by the recognition processing model and the processing parameter group of each preset pattern in the photographed image are obtained.

30. The method for determining processing parameters according to claim 29, wherein: The sending of the captured image to a server or a terminal device includes: If an upload operation for the captured image is received, the captured image is sent to a server or a terminal device; The acquiring of the position information of each preset pattern in the captured image output by the recognition processing model and the processing parameter group of each preset pattern in the captured image includes: receiving, from the server or terminal, position information of each preset pattern in the captured image output by the recognition processing model on the captured image, and a processing parameter group of each preset pattern in the captured image; Position information of each preset pattern in the photographed image and a processing parameter group of each preset pattern in the photographed image are displayed.

31. The method for determining processing parameters according to claim 25, wherein: The method of controlling the processing equipment based on the processing request to process the preset patterns onto the test material according to the multiple processing parameter groups to obtain the test processed material processed with the multiple preset patterns includes: Get the preset pattern in the interactive interface; In response to a request for generating a processing parameter test array for the preset pattern, generating and displaying a processing parameter test array corresponding to the preset pattern in an interactive interface; In response to an input operation of property information corresponding to a test material, displaying a processing interface, the processing interface including a processing control; receiving a trigger operation for the processing control and generating a processing request; Sending the processing request to a processing device, so that the processing device processes the preset pattern onto a test material based on the processing parameter group of each preset pattern in the processing parameter test array, to obtain a test processed material processed with multiple preset patterns; and / or, After obtaining a processing parameter group corresponding to each preset pattern in the captured image based on the recognition processing result of the captured image, the method further includes: A parameter group selection interface is displayed, wherein the parameter group selection interface includes multiple preset patterns of the captured image; if a selection instruction for multiple preset patterns in the captured image is received, at least one parameter value of the processing parameter group corresponding to the selected preset pattern is displayed.

32. The method for determining processing parameters according to claim 31, wherein: The step of generating and displaying the processing parameter test array corresponding to the preset pattern in the interactive interface in response to the request for generating the processing parameter test array for the preset pattern includes: In response to a request to generate a processing parameter test array for the preset pattern, a processing parameter test array information setting control is displayed in an interactive interface; the processing parameter test array information includes a processing parameter type for each dimension in the processing parameter test array, a processing parameter value, row and column values ​​of the preset pattern in the processing parameter test array, and an interval between the preset patterns in the processing parameter test array; In response to a setting operation on the processing parameter test array information setting control, the processing parameter test array corresponding to the preset pattern is displayed in the interactive interface based on the set processing parameter test array information.

33. The method for determining processing parameters according to any one of claims 1 to 32, characterized in that: After the step of determining the processing parameters of the material to be processed, the method further includes: In response to the parameter application instruction, a corresponding processing execution instruction is generated, wherein the processing execution instruction includes an execution instruction and a motion plan; and the processing execution instruction is sent to the processing equipment so that the processing equipment processes the material to be processed according to the motion plan based on the execution instruction. The processing equipment includes a slide rail and a processing head, wherein the processing head is slidably arranged on the slide rail, and the processing head is used to perform at least one of laser processing, cutting processing or printing processing on the material to be processed; The processing equipment includes a processing platform, the processing platform includes a processing area for placing the material to be processed, and the processing head moves on the processing area to perform at least one of laser processing, cutting processing or printing processing on the material to be processed; The processing equipment includes a shell and a cover plate, which enclose an internal space for accommodating the material to be processed. The shell has an opening connected to the internal space. The cover plate is connected to the shell to open or close the opening. The cover plate includes a light-transmitting window. The slide rail, the processing head and the processing platform are located in the internal space. A camera device is also provided in the internal space.

34. A processing equipment, characterized in that include: Slide rails; a processing head, the processing head being slidably disposed on the slide rail; a communication component for receiving an execution control instruction generated by the processing parameters obtained by the method according to any one of claims 1 to 33; A controller is provided for controlling the machining head to move on the slide rail to perform machining based on the received execution control instruction.

35. A computing system, characterized in that include: at least one processor; at least one non-transitory computer-readable medium; The at least one non-transitory computer-readable medium stores program instructions, which can be executed by at least one processor, so as to configure the computing system to perform the method for determining the processing parameters according to any one of claims 1 to 33.

36. A storage medium, characterized in that The storage medium is a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the method for determining the processing parameters according to any one of claims 1 to 33 are implemented.

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