A method for detecting crack defects in polycrystalline silicon solar cell sheet EL test

Abstract

The EL test crack defect detection of polysilicon solar cells described in the present invention is applicable to the field of industrial production of solar cells. First, the collected images are preprocessed, and the global threshold segmentation and morphological opening and closing operations are performed to eliminate the interference of non-processing areas. ; Then carry out median filtering and guide filtering to eliminate image noise; extract the probe area through difference threshold and feature extraction, perform complement operation on the probe area and the area after threshold segmentation, exclude the probe area, and leave the area to be Detect the area; perform Fourier transform on the smoothed image; exclude the probe area and the area after Fourier transform to obtain the intersection to obtain the area to be detected, extract the lines of the area to be detected, and then judge whether the line is a crack according to the attributes of the line . The invention realizes non-contact detection, improves detection quality and efficiency, effectively reduces fragmentation rate in the detection process, and can effectively realize online automation of detection.

Description

technical field

[0001] The invention relates to the technical field of photovoltaic cell detection, and mainly relates to a method for detecting crack defects in EL testing of polycrystalline silicon solar cells. Background technique

[0002] With the development of our country's economy, the consumption and demand of resources continue to grow, and now our country's economy is facing a critical moment of economic transformation and upgrading, and the energy problem has become another major problem hindering the development of our country's national economy. As a new renewable clean energy, solar energy has become the fastest-growing and most dynamic research field in recent years because of its good availability. Polycrystalline silicon solar cells are widely used in photovoltaic power generation. The production process of the photovoltaic industry is complex, and there are often color differences or the produced cells will have defects such as broken grids, cracks, low ef...

Examples

Embodiment Construction

[0043]The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0044] refer to figure 1 as shown, figure 1 It is a flowchart of the detection method of the present invention.

[0045] A method for polycrystalline silicon solar cell EL test crack defect detection, the method includes three step units:

[0046] The first step, the image preprocessing unit

[0047] 1-1 Obtain grayscale image: convert the RGB image information collected by the industrial infrared camera into grayscale image information;

[0048] 1-2 Obtain...

technical field

[0001] The invention relates to the technical field of photovoltaic cell detection, and mainly relates to a method for detecting crack defects in EL testing of polycrystalline silicon solar cells. Background technique

[0002] With the development of our country's economy, the consumption and demand of resources continue to grow, and now our country's economy is facing a critical moment of economic transformation and upgrading, and the energy problem has become another major problem hindering the development of our country's national economy. As a new renewable clean energy, solar energy has become the fastest-growing and most dynamic research field in recent years because of its good availability. Polycrystalline silicon solar cells are widely used in photovoltaic power generation. The production process of the photovoltaic industry is complex, and there are often color differences or the produced cells will have defects such as broken grids, cracks, low ef...

Examples

Embodiment Construction

[0043]The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0044] refer to figure 1 as shown, figure 1 It is a flowchart of the detection method of the present invention.

[0045] A method for polycrystalline silicon solar cell EL test crack defect detection, the method includes three step units:

[0046] The first step, the image preprocessing unit

[0047] 1-1 Obtain grayscale image: convert the RGB image information collected by the industrial infrared camera into grayscale image information;

[0048] 1-2 Obtain...

Images