Non-marker far-field super-resolution microscopic system and method based on non-diffraction super-resolution beam illumination

A microscopic system and super-resolution technology, applied in the field of visible light microscopy, can solve the problems of limited practical application, short depth of focus, and difficulty in further improving the overall resolution of the system, and achieve strong illumination beam penetration, large working distance, The effect of spreading over a long distance

CN109188669AActive Publication Date: 2019-01-11CHONGQING UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Publication Date
2019-01-11

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Abstract

The invention relates to a non-marking far-field super-resolution microscopic system and method based on non-diffraction super-resolution beam illumination, which comprises a non-diffraction super-resolution beam illumination module, a sample two-dimensional scanning module, a microscopic optical module, and a super-resolution imaging module. The illumination light source adopts the non-diffraction super-resolution beam, and has the advantages that the working distance is large, the illumination beam propagation distance is far, the illumination beam penetration is strong, and the light beam transverse half-height full-width is smaller than the diffraction limit; a confocal mode is adopted to realize the far-field super-resolution imaging system and method without marking; and can realizethe three-dimensional tomographic imaging of the transparent sample, the transverse resolution is smaller than the diffraction limit, and is better than lambada / 5. The method can be applied to non-marking super-resolution microscopic imaging of biological samples and can also be applied to the fields of industrial related super-resolution microscopic detection and the like.
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Description

technical field

[0001] The invention belongs to the field of visible light microscopy technology, and in particular relates to a non-marking far-field super-resolution microscopy system and method based on non-diffraction super-resolution beam illumination. The system can realize non-marking, super-resolution resolution, Tomography can be applied to detection applications of biological samples, etc. Background technique

[0002] The existing microscopy techniques can be roughly divided into two categories: near-field microscopy and far-field microscopy. Near-field microscopy includes microsphere-assisted imaging, near-field scanning microscopy and other methods. Near-field microscopy can achieve super-resolution microscopy imaging, but its working distance is smaller than the working wavelength, which greatly limits its practical application; far-field super-resolution technology, with a large working distance, can overcome the shortcomings of near-field microscopy . Exist...

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Embodiment Construction

[0027] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings.

[0028] like figure 1 As shown, the non-marking far-field super-resolution microscopy system based on non-diffraction super-resolution beam illumination proposed by the present invention includes a non-diffraction super-resolution beam illumination module, a sample two-dimensional scanning module, a traditional micro-optical module, and a super-resolution imaging module. module. Its specific structure is as follows:

[0029] The non-diffraction super-resolution beam illumination module is used to generate a non-diffraction super-resolution beam, which includes a laser 1, a fiber coupler 2, an optical fiber 3, a fiber collimator 4, a super-diffraction lens 5, a five-dimensional adjustment mechanism 6, a one-dimensional Nano-displacement piezoelectric stage 7, two-dimensional pitch adjustment mechanism 8 and three-dimensional adjustment mechani...