A crystal testing device

Abstract

The present invention discloses a crystal testing device, aiming to provide a crystal testing device capable of eliminating inherent quality risks of products. The present invention comprises a machine platform and a crystal loading module, on which a crystal transport module, a feeding module, a crystal electrical test module and a crystal knocking module are arranged, the crystal loading module is connected to the crystal transport module, the crystal transport module is connected to one side of the crystal transport module, the feeding module is connected to the other side of the crystal transport module, a crystal testing station is arranged on one side of the crystal transport module, the crystal electrical test module and the crystal knocking module are both matched with the crystal testing station, and the crystal knocking module is located below the crystal electrical test module. The present invention is applied to the technical field of quartz crystal testing devices.

Description

Technical Field

[0001] The invention relates to a crystal testing device. Background Art

[0002] The current quartz crystal performance test method is: after setting the frequency, resistance and other parameter ranges in the test machine software, the crystal to be tested is placed in the vibrating material tray. The crystals are automatically arranged one by one on the material tray track, with the leads facing upward and continuously entering the test track. The metal test probe set beside the track performs a pressure touch test on each passing crystal. The measured frequency, resistance and other electrical data are compared with the preset electrical parameters in the software, and qualified and unqualified products are automatically classified and placed. After qualified products are inspected and qualified, they are packaged and sent to customers for use;

[0003] Although the existing test machine measurement method can distinguish qualified and unqualified performance parameters such as frequency and resistance of crystals, there are some failure modes in the process of crystal resonators, such as defects in crystal materials, tiny cracks and breaks on the edges caused by wafer cutting and grinding, and the adhesion of conductive glue, which are recognized quality defects in the crystal industry. These defects are not easy to be found in the test. Even qualified products may have quality risks, which usually manifest themselves with the long-term operation of the components. The frequency may shift at the least, and the internal wafer may break or debond, causing the product to crash. In particular, our company's crystal products are mainly exported and used in automobiles, and their stability and safety are extremely important. Therefore, there is an urgent need for a testing device that can completely prevent the outflow of products with quality risks. Summary of the invention

[0004] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a crystal testing device capable of eliminating inherent quality risks of products.

[0005] The technical solution adopted by the present invention is: the present invention includes a machine and a crystal loading module, and the machine is provided with a crystal transport module, a unloading module, a crystal electrical testing module and a crystal knocking module, the crystal loading module is connected to the crystal transport module, the unloading module is connected to one side of the crystal transport module, a crystal testing station is arranged on one side of the crystal transport module, the crystal electrical testing module and the crystal knocking module are both coordinated with the crystal testing station, and the crystal knocking module is located below the crystal electrical testing module.

[0006] Furthermore, the crystal loading module includes a vibration plate, a lifting module and a crystal sensor. The lifting module and the crystal sensor are both located at the end of the vibration plate and on one side of the crystal transport module. The vibration plate and the crystal transport module are both coordinated with the lifting module.

[0007] Furthermore, the crystal transport module comprises a belt-driven circulating transport module, and a plurality of crystal carriers are arranged on the belt-driven circulating transport module.

[0008] Furthermore, the crystal electrical property test module is cooperatively arranged above the crystal test station, and the crystal knocking module is cooperatively arranged below the crystal test station.

[0009] Furthermore, the crystal knocking module includes a knocking support seat, a knocking motor and a knocking head, the knocking motor is arranged on the knocking support seat, the knocking head is arranged on the knocking motor, and the knocking head is arranged below the crystal testing station.

[0010] Furthermore, the unloading module includes several product unloading boxes arranged side by side, a unloading station is arranged on the other side of the crystal transport module, and several air blowing unloading mechanisms are arranged above the other side of the crystal transport module, and several of the air blowing unloading mechanisms are arranged one-to-one with several of the product unloading boxes.

[0011] The beneficial effect of the present invention is: compared with the conventional technology, there is a situation where it is impossible to prevent the outflow of products with quality hazards. In the present invention, when the crystal is transported to the crystal testing station, the crystal electrical testing module tests the crystal, and at the same time, the crystal knocking module knocks the crystal. The crystal knocking module continuously hits the outer shell surface of the crystal five times with a force of 1KG. At this time, the crystal with inherent defects will aggravate the expansion of the chip cracks until it breaks, and the conductive adhesive will be detached at the weakly bonded parts, which is enough to cause the crystal to fail to oscillate or the abnormal frequency resistance changes are measured, thereby achieving the purpose of eliminating products with inherent quality hazards. Therefore, the present invention has the advantage of being able to eliminate the inherent quality hazards of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a plan view of the present invention. DETAILED DESCRIPTION

[0013] like Figure 1As shown, in this embodiment, the present invention includes a machine 1 and a crystal loading module 2, the machine 1 is provided with a crystal transport module 3, a unloading module 4, a crystal electrical test module 5 and a crystal knocking module 6, the crystal loading module 2 is connected to the crystal transport module 3, the unloading module 4 is connected to one side of the crystal transport module 3, a crystal testing station is provided on one side of the crystal transport module 3, the crystal electrical test module 5 and the crystal knocking module 6 are both coordinated with the crystal testing station, and the crystal knocking module 6 is located below the crystal electrical test module 5. The crystal loading module 2 is configured to load the crystal, the crystal transport module 3 is configured to transport the crystal, the crystal electrical test module 5 is configured to test the conventional parameters of the crystal on the crystal transport module 3, the conventional parameters include resistance value, frequency, voltage, etc., the crystal knocking module 6 is configured to knock the crystal during the test of the crystal electrical test module 5, and the unloading module 4 is configured to unload the crystal after the test on the crystal transport module 3. Compared with the conventional technology, there is a situation that the outflow of products with quality risks cannot be prevented. In the present invention, When the crystal is transported to the crystal testing station, the crystal electrical testing module 5 tests the crystal, and at the same time the crystal knocking module 6 knocks the crystal. The crystal knocking module 6 knocks the outer surface of the crystal five times with a force of 1KG. At this time, the crystal with inherent defects will aggravate the expansion of the chip cracks until it breaks, and the conductive adhesive will be detached at the parts that are not firmly bonded, which is enough to cause the crystal to not vibrate or the abnormal frequency resistance change to be measured, thereby achieving the purpose of eliminating products with inherent quality risks, so that the present invention has the advantage of being able to eliminate the inherent quality risks of products.

[0014] In this embodiment, the crystal loading module 2 includes a vibration plate 201, a lifting module 202 and a crystal sensor 203. The lifting module 202 and the crystal sensor 203 are both located at the end of the vibration plate 201 and on one side of the crystal transport module 3. The vibration plate 201 and the crystal transport module 3 are both matched with the lifting module 202. When the crystal is transported to the end of the vibration plate 201, the crystal sensor 203 will sense the crystal, so that the lifting module 202 is lifted and the crystal is further transported to the lifting module 202. Further, the lifting module 202 is lowered, so that the crystal is transported to the crystal transport module 3 for further transportation.

[0015] In this embodiment, the crystal transport module 3 includes a belt-driven circulating transport module 301, and a plurality of crystal carriers are arranged on the belt-driven circulating transport module 301. The crystal carriers are configured to load crystals.

[0016] In this embodiment, the crystal electrical property test module 5 is cooperatively arranged above the crystal test station, and the crystal knocking module 6 is cooperatively arranged below the crystal test station.

[0017] In this embodiment, the crystal knocking module 6 includes a knocking support seat, a knocking motor and a knocking head. The knocking motor is arranged on the knocking support seat, and the knocking head is arranged on the knocking motor. The knocking head is arranged below the crystal testing station.

[0018] In this embodiment, the unloading module 4 includes a plurality of product unloading boxes 401 arranged side by side, an unloading station is arranged on the other side of the crystal transport module 3, and a plurality of air blowing unloading mechanisms 402 are arranged above the other side of the crystal transport module 3, and the plurality of air blowing unloading mechanisms 402 are arranged in one-to-one correspondence with the plurality of product unloading boxes 401. Among the plurality of product unloading boxes 401, one of the product unloading boxes 401 located on one side is an OK box, and the rest are NG boxes. When in use, the plurality of NG boxes are respectively configured to load crystals with different problems, such as no insulation, crystal not vibrating, weak glue, abnormal frequency, abnormal resistance, crystal breakage, etc. The air blowing unloading mechanism 402 is configured to blow the corresponding crystal on the crystal transport module 3 into the product unloading box 401.

[0019] Although the embodiments of the present invention are described with practical solutions, they do not constitute limitations on the meaning of the present invention. For those skilled in the art, it is obvious to modify the implementation scheme and combine it with other solutions based on this description.

Claims

1. A crystal testing device, characterized in that: The invention comprises a machine platform (1) and a crystal loading module (2); the machine platform (1) is provided with a crystal transport module (3), a material unloading module (4), a crystal electrical property test module (5) and a crystal knocking module (6); the crystal loading module (2) is connected to the crystal transport module (3); the material unloading module (4) is connected to one side of the crystal transport module (3); a crystal testing station is provided on one side of the crystal transport module (3); the crystal electrical property test module (5) and the crystal knocking module (6) are both matched with the crystal testing station; the crystal knocking module (6) is located below the crystal electrical property test module (5); the crystal electrical property test module (5) is matched with the crystal electrical property test module (5) and is arranged on the crystal electrical property test module (5); The crystal knocking module (6) is arranged above the crystal testing station; the crystal knocking module (6) comprises a knocking support seat, a knocking motor and a knocking head; the knocking motor is arranged on the knocking support seat; the knocking head is arranged on the knocking motor; the knocking head is arranged below the crystal testing station; the crystal electrical test module (5) tests the crystal, and the crystal knocking module (6) knocks the crystal at the same time; the crystal knocking module (6) continuously strikes the outer shell surface of the crystal five times with a force of 1KG, at which time the crystal with internal defects will aggravate the expansion of the chip cracks during the impact until it breaks, and the conductive adhesive will be loosened.

2. A crystal testing device according to claim 1, characterized in that: The crystal loading module (2) comprises a vibration plate (201), a lifting module (202) and a crystal sensor (203); the lifting module (202) and the crystal sensor (203) are both located at the end of the vibration plate (201) and are both located on one side of the crystal transport module (3); the vibration plate (201) and the crystal transport module (3) are both coordinated with the lifting module (202).

3. A crystal testing device according to claim 1, characterized in that: The crystal transport module (3) comprises a belt-driven circulating transport module (301), and a plurality of crystal carriers are arranged on the belt-driven circulating transport module (301).

4. A crystal testing device according to claim 1, characterized in that: The unloading module (4) comprises a plurality of product unloading boxes (401) arranged side by side, a unloading station is arranged on the other side of the crystal transport module (3), and a plurality of air blowing unloading mechanisms (402) are arranged above the other side of the crystal transport module (3), and the plurality of air blowing unloading mechanisms (402) are arranged in one-to-one correspondence with the plurality of product unloading boxes (401).

Images