A multi-station equal line length contact module for ACIR testing

Abstract

A multi-station equal-line length contact module for ACIR testing includes a moving contact mechanism and a copper-clad base plate contact mechanism, each set of contact probe assemblies corresponds to a set of copper-clad base plate contact mechanisms, and the copper-clad base plate contact mechanisms are located directly below the contact probe assemblies and within the lifting stroke of the substrate; the moving contact mechanism includes a substrate, at least one set of contact probe assemblies, a needle plate connection block, a cylinder, a current and voltage adapter plate, and a cylinder connection block; the copper-clad base plate contact mechanism includes a copper bar, a seat, and a printed circuit board, the copper bar is covered on the printed circuit board, and the copper bar corresponds to the probe in the contact probe assembly one by one; the seat is welded on the printed circuit board and connected to the copper bar one by one, and the seat is connected to the battery pole ear fixture. The beneficial effects of the present invention are: reducing the influence of the winding and length differences between copper wires on the battery ACIR measurement accuracy; dividing the copper wire that must be movable into two parts, and performing a separate design, dividing it into a copper bar and a probe, to minimize the influence on the measurement accuracy.

Description

Technical Field

[0001] The invention relates to a multi-station equal-line-length contact module for ACIR testing, and belongs to the technical field of lithium battery testing equipment manufacturing. Background Art

[0002] In the production process of lithium batteries, after the lithium batteries are divided into capacities, they need to be tested for ACIR to obtain the AC internal resistance parameters of the lithium batteries, and thus select lithium batteries with large AC internal resistance to ensure the quality of lithium batteries with low internal resistance. In traditional equipment ACIR testing, most of them use copper wires to directly connect the test table of the test equipment to the positive and negative poles of the lithium battery. The direct connection method of copper wires has the following disadvantages: First, the copper wires are too long, resulting in more copper wire voltage and resistance consumption; second, the copper wires are bundled together, and multiple channels interfere with each other; third, during the operation of the equipment, the copper wires will move with the equipment, resulting in poor consistency of the ACIR test results, and thus the battery ACIR data cannot be accurately obtained, and the test data cannot reflect the battery intrinsic data. Summary of the invention

[0003] In order to solve the above problems, the present invention provides a multi-station equal-line length contact module that can be used on an ACIR test device, thereby ensuring the accuracy requirement of the ACIR test device and thus ensuring the accuracy of the battery ACIR test result.

[0004] The multi-station equal-line-length contact module for ACIR testing of the present invention is characterized by comprising a movable contact mechanism for contacting and connecting with a battery tab and a copper-clad base plate contact mechanism for docking with the movable contact mechanism, each set of contact probe assemblies corresponds to a set of copper-clad base plate contact mechanisms, and the copper-clad base plate contact mechanisms are located directly below the contact probe assemblies and within the lifting stroke of the substrate;

[0005] The motion contact mechanism comprises a base plate, at least one set of contact probe assembly, a needle plate connection block, a cylinder, a current-voltage adapter plate and a cylinder connection block. The cylinder connection block and the needle plate connection block are installed on the base plate. The telescopic end of the cylinder is connected to the cylinder connection block on the base plate, so that the base plate is lifted and lowered by the cylinder. The contact probe assembly is suspended under the base plate through the needle plate connection block, and the probes of the contact probe assembly are kept facing the copper-clad base plate contact mechanism. The current-voltage adapter plate is laid on the base plate, and the signal connection port of the current-voltage adapter plate is electrically connected to the signal transmission port of the contact probe assembly.

[0006] The copper-clad base plate contact mechanism includes a copper bar, a seat and a printed circuit board. The copper bar is covered on the printed circuit board. The copper bar corresponds one-to-one with the probes in the contact probe assembly and is used for contacting and connecting with the probes in the contact probe assembly. The seat is welded on the printed circuit board and connected one-to-one with the copper bar. The seat is connected to the battery tab fixture.

[0007] The contact probe assembly includes a probe mounting plate and a probe. The probe mounting plate is suspended below the substrate through a needle plate connecting block, and a wire is arranged inside the probe mounting plate. One end of the wire is electrically connected to the probe, and the other end of the wire is electrically connected to the corresponding current and voltage adapter board on the substrate, so as to realize the conduction of the circuit between the probe and the current and voltage adapter board; the probe is embedded in the probe mounting plate, and the contact connection end of the probe is kept in the same direction, and is located directly above the copper bar of the copper-clad base plate contact mechanism, so that the probe mounting plate can be contacted and connected with the copper bar of the copper-clad base plate contact mechanism when it moves synchronously with the substrate.

[0008] The probe mounting plate is inlaid with a row of probes along the axial direction.

[0009] The substrate is a rectangular plate, and two sets of contact probe assemblies are installed in parallel below the long side of the substrate through a needle plate connecting block, and the probe mounting plate of the contact probe assembly is kept parallel to the substrate; a cylinder connecting block is provided at each short side of the substrate, and each cylinder connecting block corresponds to a set of vertically installed cylinders, that is, the telescopic direction of the telescopic end of the cylinder is perpendicular to the plane where the substrate is located.

[0010] Copper strips are arranged in parallel on the surface of the copper-clad base plate contact mechanism, wherein the copper strips correspond one-to-one to the probes on the probe mounting plate located directly above.

[0011] The printed circuit board is rectangular, and the printed circuit boards are arranged side by side on the same horizontal plane to form a printed circuit board group, and the surface of the printed circuit board is covered with copper strips; the seat is welded to the edge of the printed circuit board, the seat is arranged along the length direction of the printed circuit board group, and the copper strips are arranged along the width direction of the printed circuit board group. The arrangement direction of the printed circuit board is defined as the length direction of the printed circuit board group, and the width direction of the printed circuit board is defined as the width direction of the printed circuit board group.

[0012] The beneficial effects of the present invention are as follows: First, the traditional direct connection method of copper wires is abandoned and improved to a connection method of printed circuit boards with copper layers, that is, the movable copper wires are converted into copper strips fixed on the printed circuit boards. This new connection method can reduce the influence of the winding and length differences between the copper wires on the battery ACIR measurement accuracy. Second, the copper wires that must be movable are divided into two parts, and a separate design is performed, which is divided into copper strips and probes. The separate design allows the current and voltage wires to remain stationary when the device moves inside (the wires themselves will not bend). When the device moves into place, the moving contact mechanism components inside the device connect the separate design, thereby connecting the wires. It is ensured that the wires are in the same state during multiple measurements, and the influence on the measurement accuracy is minimized. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a schematic diagram of the structure of the multi-station equal-line length contact module for ACIR testing.

[0014] Figure 2 This is the main view of the multi-station equal-line length contact module for ACIR testing.

[0015] Figure 3 This is a top view of the multi-station equal-line length contact module tested by ACIR.

[0016] Figure 4 This is the left view of the multi-station equal-line length contact module for ACIR testing.

[0017] Figure 5 It is a structural schematic diagram of the moving contact mechanism components of the multi-station equal-line length contact module tested by ACIR.

[0018] Figure 6 It is a schematic diagram of the structure of the contact probe assembly of the multi-station equal line length contact module for ACIR testing.

[0019] Figure 7 It is a schematic diagram of the structure of the copper-clad baseboard assembly of the multi-station equal-line length contact module tested by ACIR. DETAILED DESCRIPTION

[0020] The present invention is further described below with reference to the accompanying drawings

[0021] Refer to the attached figure:

[0022] Embodiment 1 A multi-station equal-line length contact module for ACIR testing described in the present invention comprises a moving contact mechanism 1 for contacting and connecting with a battery tab and a copper-clad base plate contact mechanism 2 for docking with the moving contact mechanism, each set of contact probe assemblies of the moving contact mechanism corresponds to a set of copper-clad base plate contact mechanisms, and the copper-clad base plate contact mechanisms are located directly below the contact probe assemblies and within the lifting stroke of the substrate;

[0023] The motion contact mechanism 1 includes a base plate 16, two sets of contact probe assemblies 11, a needle plate connection block 12, a cylinder 13, a current-voltage adapter plate 15 and a cylinder connection block 14. The cylinder connection block 14 and the needle plate connection block 12 are installed on the base plate 16. The cylinder is installed on the ACIR test equipment. The telescopic end of the cylinder 13 is connected to the cylinder connection block on the base plate 16, so that the base plate 16 is lifted and lowered under the drive of the cylinder 13; the contact probe assembly 11 is suspended under the base plate 16 through the needle plate connection block 12, and the probes of the contact probe assembly 11 are kept facing the copper-clad base plate contact mechanism 2; the current-voltage adapter plate 15 is laid on the base plate 16, and the signal connection port of the current-voltage adapter plate 15 is electrically connected to the signal transmission port of the contact probe assembly 11;

[0024] The copper-clad baseboard contact mechanism 2 includes a copper bar 21, a seat 22 and a printed circuit board 23. The copper bar 21 is covered on the printed circuit board 23. The copper bar 21 corresponds one-to-one with the probes in the contact probe assembly 11 and is used for contacting and connecting with the probes in the contact probe assembly 11. The seat 22 is welded on the printed circuit board 23 and connected one-to-one with the copper bar 21. The seat 22 is connected to the battery tab fixture.

[0025] The contact probe assembly 11 includes a probe mounting plate 111 and a probe 112. The probe mounting plate 111 is suspended below the substrate 16 through a needle plate connecting block 12, and a wire is arranged inside the probe mounting plate 111. One end of the wire is electrically connected to the probe, and the other end of the wire is electrically connected to the corresponding current-voltage adapter plate 15 on the substrate 16, so as to realize the conduction of the circuit between the probe 112 and the current-voltage adapter plate 15; the probe 112 is embedded in the probe mounting plate 111, and the contact connection end of the probe 112 is kept in the same direction, both of which are located directly above the copper bar 21 of the copper-clad base plate contact mechanism 2, so that the probe mounting plate 111 can be in contact and connected with the copper bar 21 of the copper-clad base plate contact mechanism 2 when it moves synchronously with the substrate 16.

[0026] The probe mounting plate 111 is inlaid with a row of probes 112 along the axial direction.

[0027] The substrate 16 is a rectangular plate, and two sets of contact probe assemblies 11 are installed in parallel below the long side of the substrate 16 through a needle plate connecting block 12, and the probe mounting plate 111 of the contact probe assembly 11 is kept parallel to the substrate; a cylinder connecting block 14 is provided at each short side of the substrate 16, and each cylinder connecting block 14 corresponds to a set of vertically installed cylinders 13, that is, the telescopic direction of the telescopic end of the cylinder 13 is perpendicular to the plane where the substrate 16 is located.

[0028] Copper strips 21 are arranged in parallel on the surface of the copper-clad base plate contact mechanism 2 , wherein the copper strips 21 correspond one-to-one to the probes on the probe mounting plate 11 located directly above.

[0029] The printed circuit board 23 is rectangular, and the printed circuit boards 23 are arranged in parallel on the same horizontal plane to form a printed circuit board group. The surface of the printed circuit board 23 is covered with copper strips 21; the seat 22 is welded to the edge of the printed circuit board 23, the seat 22 is arranged along the length direction of the printed circuit board group, and the copper strips are arranged along the width direction of the printed circuit board group. The arrangement direction of the printed circuit board is defined as the length direction of the printed circuit board group, and the width direction of the printed circuit board is defined as the width direction of the printed circuit board group.

[0030] Embodiment 2 The present invention provides a multi-station equal-line length contact module for ACIR testing, which is composed of a moving contact mechanism component and a copper-clad base plate component.

[0031] The motion contact mechanism component is composed of a contact probe component, a needle plate connecting block, a cylinder, a cylinder connecting block, a current and voltage adapter plate and a base plate.

[0032] The contact probe assembly of the moving contact mechanism assembly consists of two parts, namely, a probe mounting plate and a probe. The moving mechanism assembly is used to control the copper-clad base plate assembly to dock with the contact probe assembly to achieve the purpose of connecting the circuit. The contact probe assembly of the moving mechanism assembly is mainly docked with the copper-clad base plate assembly to connect the circuit. The contact probe assembly consists of a probe embedded in a probe mounting plate. Among them, the probe mounting plate is a structural member used to install and fix the probe, and the probe is a structural member used to connect the circuit. The pin plate connecting block of the moving mechanism assembly is used to connect the contact probe assembly with the substrate. The cylinder of the moving mechanism assembly is used to provide power to the moving mechanism assembly so that the contact probe assembly on the moving mechanism assembly is fully in contact with the copper-clad base plate assembly to ensure the connectivity of the circuit. The cylinder connecting block of the moving mechanism assembly works together to connect the cylinder with the substrate. The current and voltage adapter board of the moving mechanism assembly uses a printed circuit board instead of a traditional copper wire to reduce the influence of the crossing, uneven length and winding of the copper wire on the test accuracy. The substrate of the moving mechanism assembly is a base used to connect the main body of each component.

[0033] The copper-clad baseboard assembly consists of three parts: a copper strip, a seat and a printed circuit board. The copper strip covers the printed circuit board, and the copper wires are arranged in parallel, which reduces the impact of copper wire crossing, uneven length and winding on the battery ACIR test accuracy; the copper strip corresponds one-to-one with the probes in the contact probe assembly, and one copper strip replaces one wire; the seat is welded on the printed circuit board and corresponds one-to-one with the copper strip, and is connected to the battery tab fixture.

[0034] Example 3 From Figure 1-4 It can be seen that the multi-station equal-line length contact module for ACIR testing described in the present invention is composed of a moving contact mechanism component 1 and a copper-clad base plate component 2.

[0035] from Figure 5It can be seen that the motion contact mechanism assembly 1 of a multi-station equal-line length contact module for ACIR testing described in the present invention is composed of a contact probe assembly 11, a needle plate connecting block 12, a cylinder 13, a cylinder connecting block 14, a current and voltage adapter plate 15 and a structural base plate 16.

[0036] from Figure 6 It can be seen that the contact probe assembly 11 of the moving contact mechanism assembly 1 of the multi-station equal-line length contact module for ACIR testing described in the present invention is composed of two parts, namely a probe mounting plate 111 and a probe 112 .

[0037] from Figure 7 It can be seen that the copper-clad base plate assembly 2 of the multi-station equal-line length contact module for ACIR testing described in the present invention is composed of three parts: a copper strip 21 , a seat 22 and a printed circuit board 23 .

[0038] Reference Figure 1-7 , the structure and action description of the multi-station equal line length contact module for ACIR test:

[0039] The moving contact mechanism assembly 1 of the multi-station equal-line length contact module of the ACIR test is used to control the docking of the copper-clad baseboard assembly 2 and the contact probe assembly 11 to achieve the purpose of connecting the circuit. The contact probe assembly 11 of the moving contact mechanism assembly 1 is mainly connected to the copper-clad baseboard assembly 2 to connect the circuit. It is composed of a probe 112 embedded in a probe mounting plate 111. Among them, the probe mounting plate 111 is a structural member used to install and fix the probe 112, and the probe 112 is a structural member used to connect the circuit. The pin plate connecting block 12 of the moving contact mechanism assembly 1 is used to connect the contact probe assembly 11 with the substrate 16. The cylinder 13 of the moving contact mechanism assembly 1 is used to provide power to the moving contact mechanism assembly 1 so that the contact probe assembly (11) on the moving contact mechanism assembly 1 is fully in contact with the copper-clad baseboard assembly (2) to ensure the connectivity of the circuit. The cylinder connecting block 1 (14) of the moving contact mechanism assembly 1 works together with the cylinder connecting block 2 (17) to connect the cylinder 13 with the substrate 16. The current and voltage adapter board 15 of the motion contact mechanism assembly 1 uses a printed circuit board instead of a traditional copper wire to reduce the impact of the crossing, uneven length and winding of the copper wire on the test accuracy. The substrate 16 of the motion contact mechanism assembly 1 is a base for connecting the main bodies of various components. The cylinder connection block 14 of the motion contact mechanism assembly 1 works together to connect the cylinder 13 and the substrate 16.

[0040] The copper-clad base plate assembly 2 of the multi-station equal-line length contact module for ACIR test has a copper strip 21 covering a printed circuit board 23, and the copper wires are arranged in parallel, thus reducing the influence of the crossing, uneven length and winding of the copper wires on the accuracy of the battery ACIR test; the copper strip 21 corresponds one-to-one with the probe 112 in the contact probe assembly 11, and one copper strip replaces one copper wire; the seat 22 is welded on the printed circuit board 23 and corresponds one-to-one with the copper strip 21, and is connected to the battery tab fixture.

[0041] The contents described in the embodiments of this specification are merely an enumeration of implementation forms of the inventive concept. The protection scope of the present invention should not be regarded as limited to the specific forms described in the embodiments. The protection scope of the present invention also includes equivalent technical means that can be thought of by those skilled in the art based on the inventive concept.

Claims

1. A multi-station equal line length contact module for ACIR testing, characterized in that: It includes a moving contact mechanism for contacting and connecting with the battery tab and a copper-clad base plate contact mechanism for docking with the moving mechanism. Each set of contact probe assemblies corresponds to a set of copper-clad base plate contact mechanisms. The copper-clad base plate contact mechanisms are located directly below the contact probe assemblies and within the lifting stroke of the substrate. The motion contact mechanism comprises a base plate, at least one set of contact probe assembly, a needle plate connection block, a cylinder, a current-voltage adapter plate and a cylinder connection block. The cylinder connection block and the needle plate connection block are installed on the base plate. The telescopic end of the cylinder is connected to the cylinder connection block on the base plate, so that the base plate is lifted and lowered by the cylinder. The contact probe assembly is suspended under the base plate through the needle plate connection block, and the probes of the contact probe assembly are kept facing the copper-clad base plate contact mechanism. The current-voltage adapter plate is laid on the base plate, and the signal connection port of the current-voltage adapter plate is electrically connected to the signal transmission port of the contact probe assembly. The copper-clad base plate contact mechanism includes a copper strip, a seat and a printed circuit board. The copper strip is covered on the printed circuit board. The copper strip corresponds to the probes in the contact probe assembly one by one and is used for contacting and connecting with the probes in the contact probe assembly. The seat is welded on the printed circuit board and connected to the copper strip one by one. The seat is connected to the battery tab fixture. The contact probe assembly includes a probe mounting plate and a probe, wherein the probe mounting plate is suspended below the substrate through a needle plate connecting block, and a wire is arranged in the probe mounting plate, one end of the wire is electrically connected to the probe, and the other end of the wire is electrically connected to a corresponding current-voltage adapter plate on the substrate, so as to realize the conduction of the circuit between the probe and the current-voltage adapter plate; The probes are embedded in the probe mounting plate, and the contact connection ends of the probes are kept in the same direction and are located directly above the copper strip of the contact mechanism of the copper-clad base plate, so that the probe mounting plate can be contacted and connected with the copper strip of the contact mechanism of the copper-clad base plate when the probe mounting plate moves synchronously with the base plate; Copper strips are arranged in parallel on the surface of the copper-clad base plate contact mechanism, wherein the copper strips correspond one-to-one to the probes on the probe mounting plate located directly above.

2. A multi-station equal line length contact module for ACIR testing as claimed in claim 1, characterized in that: The probe mounting plate is inlaid with a row of probes along the axial direction.

3. A multi-station equal line length contact module for ACIR testing as claimed in claim 2, characterized in that: The substrate is a rectangular plate, and two sets of contact probe assemblies are installed in parallel below the long side of the substrate through a needle plate connecting block, and the probe mounting plate of the contact probe assembly is kept parallel to the substrate; a cylinder connecting block is provided at each short side of the substrate, and each cylinder connecting block corresponds to a set of vertically installed cylinders, that is, the telescopic direction of the telescopic end of the cylinder is perpendicular to the plane where the substrate is located.

4. A multi-station equal line length contact module for ACIR testing as claimed in claim 1, characterized in that: The printed circuit board is rectangular, and the printed circuit boards are arranged side by side on the same horizontal plane to form a printed circuit board group, and the surface of the printed circuit board is covered with copper strips; the seat is welded to the edge of the printed circuit board, the seat is arranged along the length direction of the printed circuit board group, and the copper strips are arranged along the width direction of the printed circuit board group. The arrangement direction of the printed circuit board is defined as the length direction of the printed circuit board group, and the width direction of the printed circuit board is defined as the width direction of the printed circuit board group.

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