SSD testing system and SSD testing method

Abstract

The present invention discloses an SSD test system, which includes a test host, an expansion board and a plurality of SSD test carrier boards connected in sequence, wherein the SSD test carrier board is used to install an SSD; the test host is used to send a test main signal corresponding to a function to be tested; the expansion board is used to receive the test main signal, parse the test main signal into a plurality of test sub-signals and send them to the SSD test carrier board; the SSD test carrier board is used to receive the test sub-signals in response to perform functional tests on a plurality of SSDs according to the test sub-signals. The SSD test system of the present invention can realize centralized testing of multiple functions of an SSD, simplify the SSD functional testing process, and improve the testing capability and testing efficiency. In addition, the present invention also discloses an SSD testing method.

Description

Technical Field

[0001] The present invention relates to the technical field of solid state drive testing, and in particular to an SSD testing system and an SSD testing method. Background Art

[0002] With the rapid development of the Internet, people's demand for data storage is also increasing. SSD (Solid State Drives), as a carrier for storing data information, has the characteristics of fast storage speed and low power consumption, and is widely used in many fields such as automotive, industrial control, video surveillance, network monitoring, etc.

[0003] At present, during the production process, SSDs need to undergo multiple tests, such as a card opening test, RDT bad block test, BIT in-machine self-test, and secondary card opening test, to verify the integrity of their functions. However, in the existing SSD testing system, each function of the SSD is tested with a corresponding test carrier, that is, it has a large number of test stations, and different test stations can test different functions of the SSD. Therefore, during the process of completing various functional tests of the SSD, multiple plug-in and power-on and power-off operations are required, and the testing process is cumbersome and the procedures are complicated. In addition, the test method adopted is a direct connection between the test host and the test terminal, and the number of SSDs tested at a single time is limited, the test capacity is insufficient, and the test efficiency is low. Summary of the invention

[0004] The present invention proposes an SSD testing system and an SSD testing method to solve the problems of the current SSD testing system, such as troublesome testing, insufficient testing capability and low testing efficiency.

[0005] Specifically, the present invention provides an SSD test system, which includes a test host, an expansion board, and a plurality of SSD test carriers connected in sequence, wherein the SSD test carrier is used to install an SSD;

[0006] The test host is used to send a test main signal corresponding to the function to be tested;

[0007] The expansion board is used to receive the test main signal, parse the test main signal into multiple test sub-signals and send them to the SSD test carrier board;

[0008] The SSD test carrier is used to receive the test sub-signals in response to perform functional tests on a plurality of SSDs according to the test sub-signals.

[0009] Preferably, the SSD test carrier board is provided with a plurality of SSD interfaces and a plurality of data interfaces, and each of the data interfaces corresponds to a plurality of the SSD interfaces.

[0010] Preferably, the expansion boards are in a plurality of pieces, and a plurality of the SSD test carrier boards form an SSD test carrier board group, and each of the SSD test carrier board groups corresponds to one expansion board.

[0011] Preferably, the SSD testing system further comprises a high temperature box for placing the SSD and capable of adjusting the testing temperature.

[0012] Preferably, the high temperature box is provided with a ventilation fan.

[0013] Preferably, the test host and the expansion board perform data exchange via an 8087 integrated data line or an 8642 integrated data line.

[0014] The present invention further provides an SSD testing method, wherein the SSD testing method comprises:

[0015] The test host receives the test operation instruction, generates a test main signal according to the test operation instruction and sends the test main signal to the expansion board;

[0016] The expansion board parses the test main signal into a plurality of test sub-signals, and sends the plurality of test sub-signals to a plurality of SSD test carrier boards accordingly;

[0017] The SSD test carrier performs a functional test on the SSD according to the test sub-signals.

[0018] Preferably, the test host receives the test operation instruction, generates a test main signal according to the test operation instruction, and sends the test main signal to the expansion board, including:

[0019] The test host receives the test operation instruction, generates a first SAS signal according to the test operation instruction, and sends the first SAS signal to the expansion board;

[0020] Then, the expansion board parses the test main signal into multiple test sub-signals, and sends the multiple test sub-signals to multiple SSD test carriers accordingly, including: the expansion board parses the first SAS signal to obtain multiple first SATA signals, and sends the multiple first SATA signals to the SSD test carriers accordingly.

[0021] Preferably, the test host sends the test main signal to the expansion board including:

[0022] The test host sends the test main signal to the multiple expansion boards through multiple SAS cards.

[0023] Preferably, it is characterized in that the SSD testing method further comprises:

[0024] The SSD test carrier board receives the second SATA signal of the SSD completing the functional test, and sends the second SATA signal to the expansion board;

[0025] The expansion board processes the second SATA signal to obtain a second SAS signal, and sends the second SAS signal to the test host.

[0026] Compared with the prior art, the technical solution of the embodiment of the present application has the following beneficial effects: the present SSD test system is composed of a test host, an expansion board, and an SSD test carrier board, etc. The test host sends a test main signal corresponding to the function to be tested, and the expansion board parses the test main signal into multiple test sub-signals to be sent to multiple SSD test carrier boards accordingly, so that the SSD test carrier board performs functional tests on the SSD to which it is connected according to the test sub-signals. Among them, the expansion board is used to expand the test signal transmission path to connect multiple SSD test carrier boards, so that the number of SSD tests is greatly increased, and the test capacity and test efficiency are greatly improved; and the test host can send test main signals corresponding to different functions to be tested, so that the SSD test carrier board tests different functions of the SSD, and concentrates the originally scattered functional tests of the SSD on one SSD test carrier board, thereby avoiding multiple plug-in and power-on / off operations, and simplifying the test process and test procedures. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 A schematic diagram of the structure of an SSD testing system provided by an embodiment of the present invention;

[0028] Figure 2 A flow chart of an SSD testing method provided by an embodiment of the present invention;

[0029] Figure 3 A flow chart of an SSD testing method provided by another embodiment of the present invention;

[0030] Figure 4 A flow chart of an SSD testing method provided by another embodiment of the present invention;

[0031] Figure 5 The present invention is a flowchart of an SSD testing method provided by another embodiment of the present invention. DETAILED DESCRIPTION

[0032] The scheme in the embodiment of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiment of the present invention. Obviously, the described embodiment is only a part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0033] The embodiment of the present invention provides an SSD testing system, referring to Figures 1 to 3 , the SSD test system comprises a test host 10, an expansion board 20 and a plurality of SSD test carriers 30 connected in sequence, the SSD test carriers 30 being used to install the SSD;

[0034] The test host 10 is used to send a test main signal corresponding to the function to be tested;

[0035] The expansion board 20 is used to receive the main test signal, parse the main test signal into multiple test sub-signals and send them to the SSD test carrier board 30;

[0036] The SSD test carrier 30 is used for correspondingly receiving the test sub-signals to perform functional tests on a plurality of SSDs according to the test sub-signals.

[0037] The SSD test system involved in this embodiment is used to perform functional testing on the SSD, which can realize unified testing of multiple functions of the SSD, such as a card opening test, an RDT bad block test, a BIT in-machine self-test, and a secondary card opening test, etc. Specifically, the SSD test system is mainly composed of a test host 10, an expansion board 20, and an SSD test carrier board 30, etc. The test host 10, the expansion board 20, the SSD test carrier board 30, and the SSD are connected in sequence, and data is exchanged in this connection order, such as transmitting a test signal to perform a functional test on the SSD, or transmitting a test result. After the SSD completes the relevant functional test, the test result of the SSD is transmitted to the test host 10 through the SSD test carrier board 30 and the expansion board 20 in sequence for result analysis or judgment.

[0038] Among them, the function of the test host 10 is to send a test main signal corresponding to the function to be tested. The test host 10 can be a PC computer host or other, including but not limited to this, and those skilled in the art can choose according to actual conditions. The test host 10 can send a test main signal by receiving a test operation instruction issued manually, and different test operation instructions correspond to different functional tests of the SSD, and send different test main signals, which are realized by a control program pre-stored in the test host 10. Further, the test host 10 includes a test main board, a PCIE slot is provided on the test main board and a SAS (Serial Attached SCSI) card is correspondingly inserted, and a SAS interface for transmitting the test main signal is provided on the SAS card. The SAS card is compatible with and supports multiple SATA interfaces, and the test main signal is a SAS signal.

[0039] The function of the expansion board 20 is to receive the test main signal sent by the test host, to parse the test main signal into multiple test sub-signals and send them down, that is, to expand the one port of the test host 10 used to connect to the SSD test carrier 30 for testing into multiple ports. Specifically, the expansion board 20 is provided with an input interface and several output interfaces, and its input interface is connected to the SAS interface of the test host 10 through a data line, and its several output interfaces are correspondingly connected to multiple SSD test carriers 30 through data lines; the expansion board 20 is also provided with a processor, which can parse the test main signal into multiple test sub-signals. The function of the SSD test carrier 30 is to receive the test sub-signals to perform functional tests on the SSD. The SSD test carrier 30 is provided with a test circuit, and the SSD test carrier 30 is provided with a data interface, an SSD interface and a power interface. The data interface is used to connect to the expansion board 20, the SSD interface is used to connect to the SSD to be tested, and the power interface is connected to the power supply through a power line to realize power-on testing. Among them, the SSD interface is a SATA interface, and the test sub-signals are SATA signals.

[0040] The testing principle of the present SSD testing system is as follows: testing instructions are issued according to the required testing functions of the SSD. After receiving the testing instructions, the testing host 10 issues a testing main signal corresponding to the function to be tested and transmits it to the expansion board 20. The expansion board 20 parses the received testing main signal into a plurality of testing sub-signals to be sent to a plurality of SSD testing carrier boards 30 accordingly. The SSD testing carrier board 30 performs functional testing on the SSD connected thereto according to the received testing sub-signals. Moreover, after the SSD testing is completed, the SSD testing carrier board 30 transmits a feedback signal indicating the testing result to the testing host 10 via the expansion board 20, so as to feed back the testing result to the testing host 10.

[0041] Furthermore, the test host 10 can receive a test instruction for the SSD function A to be tested, and transmit a test signal via the SAS card and parse and process the test signal via the expansion board 20, thereby uniformly testing function A for the SSDs connected to multiple SSD test carriers 30; in addition, the test host 10 can also simultaneously receive test instructions for multiple functions such as SSD functions A and B to be tested, and transmit different test signals as specified by the SAS card and parse and process the test signal via the expansion board 20, and respectively test functions A, B, etc. for the SSDs connected to multiple SSD test carriers 30.

[0042] Therefore, it is easy to understand that the SSD test system expands the test signal transmission path through the expansion board 20 to connect multiple SSD test carriers 30, thereby greatly increasing the number of SSD tests and greatly improving the test capacity and test efficiency; and the test host 10 can send test signals corresponding to different functions to be tested so that the SSD test carrier 30 tests different functions of the SSD, and concentrates the originally scattered functional tests of the SSD on one SSD test carrier 30, thereby avoiding multiple plug-in and unplug-out and power-on and power-off operations, and simplifying the test process and test procedures.

[0043] In a preferred embodiment, the SSD test carrier 30 is provided with a plurality of SSD interfaces and a plurality of data interfaces, and each data interface corresponds to a plurality of SSD interfaces. It is known that the SSD test carrier 30 is used to perform functional tests on the SSD to which it is connected. A plurality of data interfaces and a plurality of SSD interfaces are provided on the SSD test carrier 30, and a communication setting in which one data interface corresponds to a plurality of SSD interfaces is adopted, so as to increase the number of data interfaces and SSD interfaces on the SSD test carrier 10, thereby increasing the number of SSDs tested on the SSD test carrier 30, thereby further improving the test capacity and test efficiency. Specifically, the number of data interfaces may be 12, the number of SSD interfaces may be 48, and one data interface corresponds to four SSD interfaces. It should be noted that this is only exemplary and not restrictive. For the number setting and the corresponding relationship of the data interfaces and SSD interfaces, those skilled in the art may make a choice according to the actual situation.

[0044] Further, refer to Figure 1 , the expansion board 20 is several pieces, and a plurality of SSD test carrier boards 30 form an SSD test carrier board group, and each SSD test carrier board 30 group corresponds to an expansion board 20. In this embodiment, the test mainboard of the test host 10 mentioned above can select a multi-way server mainboard or a multi-resource PCIE mainboard to set multiple SAS cards. Because one SAS card is connected to an expansion board 20, multiple SAS cards can be connected to multiple expansion boards 20. Because the expansion board 20 is connected to multiple SSD test carrier boards 30 for test signal transmission, the addition of the expansion board 20 increases the number of SSD tests exponentially, further improving the test capacity and test efficiency. Among them, the technical personnel in this field can select the number of SAS cards on the expansion board 20 and the test host 10 according to the actual situation, and it is not limited here.

[0045] In a preferred embodiment, referring to Figure 1The SSD test system also includes a high temperature box 40 for placing SSDs and capable of adjusting the test temperature. The high temperature box 40 can uniformly pack all the SSDs to be tested, and is used to provide a high temperature test environment and test space for the SSDs to be tested, so as to assist in their functional testing. A heater 41 is provided in the high temperature box 40, so that the temperature in the box can reach the temperature requirement of the SSD functional test through the heating of the heater 41, and when the SSD performs different functional tests, the temperature requirements are different, and the temperature in the box can be controlled by adjusting the heater 41. As a preferred design, the heater 41 is located on the inner top wall of the high temperature box 40.

[0046] Further, refer to Figure 1 , a ventilation fan 42 is provided on the high temperature box 40. Due to the heating of the heater 41 and the self-heating of the SSD during the test, a large amount of heat will be generated. The excessive heat in the box has nowhere to be dissipated and is easy to accumulate. The ventilation fan 42 can realize ventilation inside and outside the high temperature box 40, so that the temperature inside the high temperature box 40 is constant, and it is not easy to accumulate heat, thereby ensuring the stability of the SSD test. As a preferred design, multiple ventilation fans 42 can be provided, and they can be evenly distributed on the outer wall of the high temperature box 40.

[0047] In a preferred embodiment, the test host and the expansion board exchange data via the 8087 integrated data line or the 8642 integrated data line. The 8087 integrated data line or the 8643 integrated data line used can make the data signal transmission between the test host and the expansion board more stable, thereby improving the reliability of the test.

[0048] The present invention also proposes a SSD testing method, referring to Figure 2 , wherein the SSD testing method comprises:

[0049] Step S100: the test host 10 receives a test operation instruction, generates a test main signal according to the test operation instruction, and sends the test main signal to the expansion board 20;

[0050] Step S200: the expansion board 20 parses the test main signal into multiple test sub-signals, and sends the multiple test sub-signals to multiple SSD test carrier boards 30 accordingly;

[0051] Step S300: The SSD test carrier 30 performs a functional test on the SSD according to the test sub-signal.

[0052] In this implementation step, when a certain function test is to be performed on the SSD, first, the test host 10 receives the test operation instruction, generates a test main signal according to the test operation instruction, and sends the test main signal to the expansion board, wherein the test host 10 can be a PC computer host or other, including but not limited to this, and the technicians in this field can make a choice according to the actual situation. The test operation instruction received by the test host 10 can be issued manually, and different test operation instructions correspond to different functional tests of the SSD, and different test main signals are issued, which are realized by the control program pre-stored in the test host 10. Further, the test host 10 includes a test mainboard, a PCIE slot is provided on the test mainboard and a SAS (Serial Attached SCSI) card is correspondingly inserted, and a SAS interface for transmitting the test main signal is provided on the SAS card, and the SAS card is compatible with and supports multiple SATA interfaces, and the test main signal is a SAS signal.

[0053] Then, the expansion board 20 parses the test main signal into multiple test sub-signals, and sends the multiple test sub-signals to multiple SSD test carriers, that is, the one port of the test host 10 used to connect to the SSD test carrier 30 for testing is expanded to multiple ports. Specifically, the expansion board 20 is provided with an input interface and several output interfaces, and its input interface is connected to the SAS interface of the test host 10 through a data line, and its several output interfaces are connected to multiple SSD test carriers 30 through data lines. The expansion board 20 is also provided with a processor, which can parse the test main signal into multiple test sub-signals. Among them, the data line is preferably an 8087 or 8643 integrated data line, and the data signal transmission is stable and the test is reliable.

[0054] Finally, the SSD test carrier 30 performs a functional test on the SSD connected thereto according to the test sub-signal. The SSD test carrier 30 is provided with a test circuit, and is provided with a data interface, an SSD interface, and a power interface. The data interface is used to connect to the expansion board 20, the SSD interface is used to connect to the SSD to be tested, and the power interface is connected to the power supply through a power line to implement a power-on test. Among them, the SSD interface is a SATA interface, and the test sub-signal is a SATA signal.

[0055] In addition, it should be noted that the test host 10 used can receive test instructions for multiple functions of the SSD to be tested, such as functions A and B, and transmit different test main signals through the specified allocation of the SAS card and parse and process the test main signals through the expansion board 20, so that the SSD test carrier board 30 receives different test sub-signals to perform function A, function B and other functional tests on the different SSDs connected to it.

[0056] Of course, in addition to this, the test host 10 can also receive the test instruction of the SSD function A to be tested, and transmit the test signal through the SAS card and the expansion board 20 to analyze and process, and uniformly test the function A of the SSD connected to the SSD test carrier board 30.

[0057] That is, in the present SSD testing method, a test instruction is issued according to the required test function of the SSD. After receiving the test instruction, the test host 10 transmits a test main signal corresponding to the function to be tested to the expansion board 20. The expansion board 20 parses the received test main signal into multiple test sub-signals to send them to multiple SSD test carriers 30 accordingly. The SSD test carrier 30 performs functional testing on the SSD connected thereto according to the received test sub-signals, thereby greatly increasing the number of SSD tests, greatly improving the test capability and test efficiency, and centralizing the originally scattered functional tests of the SSD, thereby simplifying the test process and test procedures.

[0058] In a preferred embodiment, referring to Figure 3 , step S100 includes:

[0059] Step S110: the test host 10 receives the test operation instruction, generates a first SAS signal according to the test operation instruction, and sends the first SAS signal to the expansion board 20;

[0060] Then, step 200 includes: step S210: the expansion board 20 analyzes the first SAS signal to obtain multiple first SATA signals, and sends the multiple first SATA signals to the SSD test carrier board 30 accordingly.

[0061] Specifically, in this implementation step, the test host 10 sends a group of first SAS signals (i.e., two first SAS signals) to the expansion board 20, and the expansion board 20 parses and processes the group of first SAS signals to obtain three groups of first SATA signals (i.e., six first SATA signals), and sends the six first SATA signals to the SSD test carrier board accordingly. The SSD carrier board is provided with multiple SSD interfaces, and each first SATA signal corresponds to four SSD interfaces, that is, functional tests of four SSDs are implemented accordingly.

[0062] Of course, in practical applications, the SATA signals of other numbers can be parsed according to actual needs, and one first SATA signal can correspond to other numbers of SSD interfaces, which is not limited here.

[0063] In this implementation step, multiple SSD interfaces can be set on the SSD test carrier 30 used to connect with multiple SSDs, that is, the SSD test carrier 30 receives a test signal and can perform functional tests on multiple SSDs, which can increase the number of SSD tests and improve test capabilities and test efficiency.

[0064] In a preferred embodiment, referring to Figure 4 , step S100 includes:

[0065] Step S120: the test host sends the test main signal to the multiple expansion boards through the multiple SAS cards.

[0066] Specifically, in this implementation step, the test mainboard of the test host 10 can be selected as a multi-way server mainboard or a multi-resource PCIE mainboard, so that multiple SAS cards can be set. Because one SAS card is connected to an expansion board 20, multiple SAS cards can be connected to multiple expansion boards 20. Because the expansion board 20 is connected to multiple SSD test carriers 30 for test signal transmission, the test host 10 sends the test main signal to multiple expansion boards 20, so that the number of SSD tests is multiplied, further improving the test capacity and test efficiency. Among them, the number of SAS cards on the expansion board 20 and the test host 10 can be selected by those skilled in the art according to actual conditions, and is not limited here.

[0067] In a preferred embodiment, referring to Figure 5 , SSD testing methods also include:

[0068] Step S400: The SSD test carrier board 30 receives the second SATA signal indicating that the SSD has completed the functional test, and sends the second SATA signal to the expansion board 20;

[0069] Step S500 : the expansion board 20 processes the second SATA signal to obtain a second SAS signal, and sends the second SAS signal to the test host 10 .

[0070] In this implementation step, when the functional test of the SSD is completed, the SSD test carrier board 30 receives the second SATA signal of the SSD completing the functional test and sends it to the expansion board 20. The expansion board 20 processes the second SATA signal to obtain a second SAS signal, and sends the second SAS signal to the test host 10 to feed back the test result to the test host 10.

[0071] The above description is only a partial or preferred embodiment of the present invention. Neither the text nor the drawings can limit the scope of protection of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the overall concept of the present invention, or direct / indirect application in other related technical fields are included in the scope of protection of the present invention.

Claims

1. An SSD testing system, characterized in that: It includes a test host, an expansion board and a plurality of SSD test carrier boards connected in sequence, wherein the SSD test carrier board is used to install the SSD; The test host is used to send a test main signal corresponding to the function to be tested; The expansion board is used to receive the test main signal, parse the test main signal into multiple test sub-signals and send them to the SSD test carrier board; The SSD test carrier is used to receive the test sub-signals in response to perform functional tests on multiple SSDs according to the test sub-signals; There are several expansion boards, and a plurality of the SSD test carrier boards form an SSD test carrier board group, and each of the SSD test carrier board groups corresponds to one expansion board; Among them, the test host is used to send down the test main signal corresponding to the function to be tested, including: the test host sends down the test main signal corresponding to different functions to be tested, so that the SSD test carrier board tests different functions of the SSD, and the tests of different functions include at least two of the primary card opening test, RDT bad block test, BIT in-machine self-test and secondary card opening test.

2. The SSD testing system according to claim 1, characterized in that: The SSD test carrier is provided with a plurality of SSD interfaces and a plurality of data interfaces, and each of the data interfaces corresponds to a plurality of the SSD interfaces.

3. The SSD testing system according to claim 1, characterized in that: It also includes a high temperature box for placing SSDs and adjusting the test temperature.

4. The SSD testing system according to claim 3, characterized in that: The high temperature box is provided with a ventilation fan.

5. The SSD testing system according to claim 1, characterized in that: The test host and the expansion board perform data exchange via the 8087 integrated data line or the 8642 integrated data line.

6. A SSD testing method, characterized in that: include: The test host receives the test operation instruction, generates a test main signal according to the test operation instruction and sends the test main signal to the expansion board; The expansion board parses the test main signal into a plurality of test sub-signals, and sends the plurality of test sub-signals to a plurality of SSD test carrier boards accordingly; The SSD test carrier performs a functional test on the SSD according to the test sub-signal; There are several expansion boards, and a plurality of the SSD test carrier boards form an SSD test carrier board group, and each of the SSD test carrier board groups corresponds to one expansion board; Among them, the test host receives the test operation instruction, generates a test main signal according to the test operation instruction and sends the test main signal to the expansion board, including: the test host sends down the test main signal corresponding to different functions to be tested, so that the SSD test carrier board performs different function tests on the SSD, and the tests of different functions include at least two of the primary card opening test, RDT bad block test, BIT in-machine self-test and secondary card opening test.

7. The SSD testing method according to claim 6, characterized in that: The test host receives the test operation instruction, generates a test main signal according to the test operation instruction, and sends the test main signal to the expansion board, comprising: The test host receives the test operation instruction, generates a first SAS signal according to the test operation instruction, and sends the first SAS signal to the expansion board; Then, the expansion board parses the test main signal into a plurality of test sub-signals, and sends the plurality of test sub-signals to a plurality of SSD test carrier boards accordingly, including: The expansion board analyzes the first SAS signal to obtain multiple first SATA signals, and sends the multiple first SATA signals to the SSD test carrier board accordingly.

8. The SSD testing method according to claim 7, characterized in that: The test host sends the test main signal to the expansion board, including: The test host sends the test main signal to the multiple expansion boards through multiple SAS cards.

9. The SSD testing method according to any one of claims 6 to 8, characterized in that: The SSD testing method further includes: The SSD test carrier board receives the second SATA signal of the SSD completing the functional test, and sends the second SATA signal to the expansion board; The expansion board processes the second SATA signal to obtain a second SAS signal, and sends the second SAS signal to the test host.

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