Check the probe block assembly of the display panel

Abstract

The probe block assembly for inspecting a display panel of the present invention is characterized in that it comprises: a plurality of probe blocks, which contact a plurality of electrode plates of a display panel moved to an inspection position by moving the position of a single panel so as to inspect whether there are defects, wherein one side of the single panel has at least one type of the display panel, and the display panel is deposited with an organic layer for forming an organic light-emitting layer, and a plurality of electrode plates are formed along the side of the display panel; and a probe unit, which supports the plurality of probe blocks; wherein the plurality of probe blocks respectively have probes respectively contacting the plurality of electrode plates, and in order to inspect the display panel, the probe blocks are selected from the probe blocks loaded on each probe block loading unit and then transported out, and can be installed at a predetermined position on the probe unit that exists at a position for inspecting whether the display panel has defects.

Description

Technical Field

[0001] The present invention relates to a probe block assembly for inspecting a display panel, a control method thereof, and a display panel inspection apparatus. Background Art

[0002] An organic light-emitting diode (OLED) used as a flat panel display device has advantages such as a wide viewing angle, excellent contrast, and a fast response speed, and thus has recently been widely used in smartphones, televisions, etc.

[0003] An organic light-emitting diode (OLED) deposits an organic material layer for forming an organic light-emitting layer on a panel serving as a substrate, and thus realizes pixels that emit light and colors through an electric signal.

[0004] Here, if pixels are realized by depositing an organic material layer on a panel serving as a substrate, it is necessary to inspect whether there are defects in the pixels before the encapsulation process.

[0005] In the past, in order to prevent contamination from scattered particles during inspection, etc., inspection was performed in a facedown manner, that is, inspection was performed with the side where the deposition part of the display panel to be inspected faced down.

[0006] Display panels can be manufactured in various sizes according to the intended use, and are provided on a single panel in the manufacturing process. The single panel can be a single type with multiple display panels of the same size or a mixed type that mixes and forms display panels of various sizes to improve the panel picking efficiency.

[0007] In the past, in order to inspect whether a display panel has defects, a display panel on a single panel with the side where the deposition part is located facing down was arranged on a fishbone-type platform module, and the fishbone-type platform module clamped the outer contour part where no deposition part was formed in the side where the deposition part faced down, and then moved into a chamber for inspection.

[0008] Then, the other side of the single panel where no deposition part exists is adsorbed by a vacuum panel, then moved to the position where the probe block of the probe unit is located, and then the contact pads of the display panel are brought into contact with the probe block, thereby performing the inspection.

[0009] However, the conventional inspection method is very useful for inspecting a display panel on a relatively small single panel, but serious problems occur when inspecting whether a display panel on a large single panel has defects by the facedown method, so the conventional inspection method is in a situation where it is difficult to apply.

[0010] That is to say, for a large single panel, if it is arranged on a Fishbone type platform module with the side where the deposition part is located facing downward, the Fishbone type platform module supports the outer contour part where the deposition part is not formed on the side where the deposition part is located. At this time, the center part of the large single panel sinks due to its own weight, so accurate inspection cannot be actually carried out.

[0011] In addition, the following problems occur in the conventional inspection method in addition to the above problems.

[0012] The probe unit can only install a probe block for inspecting whether a display panel of one type is defective. Therefore, when there are display panels of various sizes to be inspected on a single panel and the display panels to be inspected are different from each other, it is necessary to replace the matching new probe unit inevitably.

[0013] The replacement work of the probe unit is usually carried out manually by staff. Accordingly, the time required for the replacement work is long, so there is a problem of reduced production.

[0014] Moreover, there is a problem that staff injuries or electric shocks often occur when replacing the probe unit.

[0015] Accordingly, there is an urgent need to develop a device that can quickly and accurately inspect whether display panels of various types on a large single panel are defective by means of Face down to prevent contamination by scattered particles during inspection. Summary of the Invention

[0016] Problems to be Solved by the Invention

[0017] The object of the present invention is to provide a probe block assembly for inspecting a display panel, a control method thereof, and a display panel inspection device, which can inspect whether display panels of various sizes in a large or small single panel are defective without replacing the probe unit by means of Face down or Face up, thereby improving production and preventing safety accidents of staff.

[0018] Solutions to Solve the Problems

[0019] The probe block assembly for inspecting a display panel according to the present invention includes: a plurality of probe blocks that, by moving the position of a single panel, contact a plurality of electrode plates of the display panel that has moved to an inspection position to inspect for defects. One side of the single panel has at least one type of the display panel, and an organic layer for forming an organic light-emitting layer is deposited on the display panel, and a plurality of electrode plates are formed along the side of the display panel; and a probe unit that supports the plurality of probe blocks. Among them, each of the plurality of probe blocks has a probe that respectively contacts the plurality of electrode plates. In order to inspect the display panel, after selecting the probe block among the probe blocks loaded in each probe block loading unit, it is shipped out and can be installed at a predetermined position on the probe unit existing at a position for inspecting whether the display panel has defects.

[0020] After completing the inspection of the display panel, when it is not necessary or necessary to replace at least one of the plurality of probe blocks in order to inspect other display panels with different sizes, for the case of not needing or needing to replace the probe block, it is selected in the probe unit and then shipped out and loaded in the probe block loading unit.

[0021] After completing the inspection of the display panel, when an additional probe block is needed in order to inspect other display panels with different sizes, the additional probe unit is selected among the probe blocks loaded in the probe block loading unit and then shipped out, and an installation area for installing the additional probe unit is provided in the probe unit of the probe block assembly according to the present invention.

[0022] The probe unit of the probe block assembly according to the present invention has a plurality of installation areas for respectively and individually installing probe blocks, and the installation area for installing the probe block among the plurality of installation areas is selected based on the number and formation position of the electrode plates of the display panel to be inspected.

[0023] The plurality of installation areas of the probe block assembly according to the present invention have guide portions that interact with the position fixing portions formed on the probe blocks to respectively guide the positions of installing the probe blocks.

[0024] The probe unit of the probe block assembly according to the present invention further includes a power supply application portion that applies power to each probe block when the plurality of probe blocks are installed on the probe unit. The probe block may include: a plurality of probes; a main body that supports the plurality of probes; a connection terminal that applies the power to the plurality of probes by being electrically connected to the power supply application portion; and a circuit pattern portion for electrically connecting the plurality of probes and the connection terminal.

[0025] The connection terminals of the probe block assembly of the present invention are formed with the same number or fewer than the number of power supply application terminals, and the power supply is applied to the power supply application terminals by the power supply application unit; when the number of the plurality of probes is less than the number of the power supply application terminals, the circuit pattern unit only applies a part of the power applied to the power supply application terminals to the plurality of probes.

[0026] The probe block assembly of the present invention checks whether a display panel different from the display panel being inspected is defective by replacing at least one of the plurality of probe blocks installed at the predetermined position instead of replacing the probe unit.

[0027] Advantages of the Invention

[0028] By means of the face-down or face-up method, it is possible to check whether display panels of various sizes in large or small single panels are defective without replacing the probe unit, thereby improving production yield and preventing safety accidents of staff. Description of the Drawings

[0029] Figure 1 It is a diagram for explaining a display panel whose defect is checked by the display panel inspection device of the present invention.

[0030] Figure 2 It is a diagram for explaining various embodiments of combinations of display panels in single panels that can be installed on the platform module provided in the display panel inspection device of the present invention.

[0031] Figure 3 It is a structural block diagram for explaining the display panel inspection device of the present invention.

[0032] Figure 4 It is a diagram for explaining the display panel inspection device of the present invention.

[0033] Figure 5 and Figure 6 It is a diagram for explaining the air flow in the inspection process device provided in the display panel inspection device of the present invention; wherein, Figure 5 is Figure 4 a schematic sectional view taken along line AA of Figure 6 is Figure 4 a schematic sectional view taken along line BB of

[0034] Figure 7 It is a flowchart of the process of adsorbing a single panel by a vacuum adsorption module by the single panel conveying device provided in the display panel inspection device of the present invention.

[0035] Figure 8It is a diagram for explaining the state where a single panel is installed on the platform module of the single panel transportation device provided in the present invention in a normal state.

[0036] Figure 9 And Figure 10 It is for explaining Figure 8 a diagram of the state where the single panel in the normal state is transformed into the flipped state by the rotation of the platform module in the situation shown.

[0037] Figure 11 It is a diagram for explaining the state where the transportation module of the single panel transportation device provided in the present invention enters the platform module.

[0038] Figure 12 And Figure 13 It is a diagram for explaining the state where the transportation module of the single panel transportation device provided in the present invention adsorbs the single panel in the flipped state.

[0039] Figure 14 It is a diagram for explaining the state where the transportation module of the single panel transportation device provided in the present invention moves to the first position.

[0040] Figure 15 And Figure 16 It is a diagram for explaining the state where the pickup module of the single panel transportation device provided in the present invention descends to adsorb the single panel in the flipped state.

[0041] Figure 17 It is a diagram for explaining the state where the transportation module of the single panel transportation device provided in the present invention returns to the original position.

[0042] Figure 18 It is a diagram for explaining the state where the pickup module of the single panel transportation device provided in the present invention ascends to the second position.

[0043] Figure 19 It is a diagram for explaining the state where the pickup module of the single panel transportation device provided in the present invention ascends to the third position.

[0044] Figure 20 It is a diagram for explaining the display panel inspection device of the display panel inspection equipment provided in the present invention.

[0045] Figures 21 to 28 It is a diagram for explaining the situation where the display panel inspection device of the present invention inspects whether there are defects in the 65 - inch display panel and the 55 - inch display panel configured on the single panel.

[0046] Figure 29 It is a diagram for explaining another method of applying power to the probes provided on the probe block.

[0047] Figure 30 and Figure 31 is a diagram of a method for fixing or separating a probe block on a probe unit.

[0048] Description of reference numerals:

[0049] 100: Single-panel conveying device

[0050] 110: Platform module

[0051] 120: Conveying module

[0052] 130: Pickup module

[0053] 140: Vacuum adsorption module

[0054] 200: Display panel inspection device

[0055] 300: First space part

[0056] 400: Second space part

[0057] 1000: Display panel inspection equipment

[0058] 1100: Inspection process preparation equipment

[0059] 1200: Inspection process execution equipment. Detailed implementation manners

[0060] Hereinafter, specific embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the idea of the present invention is not limited to the proposed embodiments, but other inventions that can be easily proposed by those skilled in the art who understand the idea of the present invention through addition, change, deletion, etc. of other components within the same idea range, or other embodiments within the idea range of the present invention, but this is also included within the idea range of the original invention.

[0061] In addition, components having the same function within the same idea range shown in the drawings of each embodiment are described using the same reference numerals.

[0062] 1. Display panel and single panel

[0063] Figure 1 is a diagram for explaining a display panel inspected for defects by the display panel inspection equipment of the present invention; Figure 2 is a diagram for explaining various embodiments of the combination of display panels in single panels that can be installed on the platform module provided in the display panel inspection equipment of the present invention.

[0064] Refer to Figure 1, the display panel DP deposits an organic layer for forming an organic light-emitting layer on a panel serving as a substrate, which is implemented by pixels and can be, for example, an LCD or an OLED. Before the encapsulation process, it can be inspected for defects by the display panel inspection device 1000 of the present invention (refer to Figure 3 and Figure 4 ).

[0065] To inspect whether the pixels are defective, the display panel DP may have: a first electrode plate EP1 formed along a first side; a second electrode plate EP2 formed along a second side; a third electrode plate EP3 formed along a third side; and a fourth electrode plate EP4 formed along a fourth side.

[0066] However, the display panel DP may vary depending on the number and formation position of the panel characteristic electrode plates, etc.

[0067] In the manufacturing process, multiple display panels DP are formed on a single panel MP whose size depends on the size of the platform module 110 (refer to Figure 3 and Figure 4 ), and then it can be manufactured through processes such as cutting. The single panel MP can be a glass substrate serving as the basis for producing the display panel DP.

[0068] The single panel MP can be a single type with multiple display panels DP of the same size or a mixed type with various sizes of display panels DP to minimize the blank space and improve the efficiency of defect inspection, that is, improve the panel picking efficiency.

[0069] For example, as Figure 2 shown, the single panel MP can be a mixed type of 2 98-inch display panels as shown in (a) of Figure 2 , a mixed type of 3 65-inch display panels and 6 32-inch display panels as shown in (b) of Figure 2 , a single type of 18 31.5-inch display panels as shown in (c) of Figure 2 , a mixed type of 2 49-inch display panels and 2 75-inch display panels as shown in (d) of Figure 2 , and a mixed type of 3 65-inch display panels and 2 55-inch display panels as shown in (e) of Figure 2 , but it is not limited thereto, and can be a panel applicable to a mixed type of display panels of various sizes.

[0070] The display panel inspection device 1000 of the present invention can separately inspect each of all the display panels of a single panel MP of a mixed type of the above various combinations for defects; hereinafter, the case where the single panel is of a mixed type formed by three 65-inch display panels and two 55-inch display panels will be described as a representative example.

[0071] 2. Display panel inspection device

[0072] Figure 3 is a structural block diagram for explaining the display panel inspection device of the present invention; Figure 4 is a diagram for explaining the display panel inspection device of the present invention.

[0073] Refer to Figure 3 and Figure 4 , the display panel inspection device 1000 of the present invention is an inspection device as follows: By the back adsorption method (i.e., the face-down method), without replacing the probe units PU1, PU2 (refer to Figure 20 ), it is also possible to inspect whether the display panels DP of various sizes included in the single panel MP are defective, and the accuracy and speed of the defect inspection can be maximized, and it can include an inspection process preparation device 1100 and an inspection process execution device 1200.

[0074] The inspection process preparation device 1100 can be a device as follows: If the other side of the single panel MP is adsorbed by the platform module 110 in a state where at least one type of display panel DP is arranged on one side and the one side of the single panel MP faces upward, the platform module 110 rotates to change the single panel MP from the normal state to a flipped state where the one side faces downward, and then the transport module 120 receives the single panel MP in the flipped state, holds the flipped state, and moves the single panel MP to the device for subsequent processes, where the organic material layer for forming the organic light-emitting layer is deposited on the display panel DP.

[0075] The inspection process execution device 1200 can be a device as follows: The other side of the single panel MP that enters through the transport module 120 is adsorbed by the pickup module 130, and then if the vacuum adsorption module 140 adsorbs the single panel MP in the flipped state by the position movement of the pickup module 130, the electrode plate of the display panel DP is brought into contact with the probe 3002 (refer to Figure 22 ) of the probe block PB (refer to Figure 22 ) of the display panel inspection device 200 by the position movement of the vacuum adsorption module 140, and whether the display panel DP is defective is inspected.

[0076] On the other hand, the display panel inspection device 1000 of the present invention is defined as a single panel conveying device 100 from mounting a single panel MP on the platform module 110 to the single panel MP being adsorbed by the vacuum adsorption module 140 via the conveying module 120 with the aid of the pickup module 130; the process of inspecting whether the display panel DP adsorbed by the vacuum adsorption module 140 via the single panel conveying device 100 is defective by the display panel inspection device 200 including the probe block assembly 2000 and the probe block loading unit 3000. Figures 20 to 28 Provide specific explanation.

[0077] Figure 5 and Figure 6 is a diagram for explaining the air flow in the inspection process of the display panel inspection device provided in the present invention; wherein, Figure 5 Yes Figure 4 's AA line schematic cross-section, Figure 6 Yes Figure 4 BB line schematic cross-sectional view.

[0078] and Figure 3 and Figure 4 See also Figure 5 and Figure 6 , the inspection process performing device 1200 may include: a first space portion 300, an electrode plate of the display panel DP and a probe block PB (refer to Figure 22 ) Probe 3002 (refer to Figure 22 ) contact, to check whether the display panel DP has defects; the second space part 400, a visual module 410 can be movably arranged, the visual module takes a picture of the display panel DP as the inspection object for defects, to confirm whether there are stains or scratches on the display panel DP; wherein the second space part 400 can be located at the lower part of the first space part 300.

[0079] Here, the visual module 410 may include four camera units, and the camera units determine the working distance (WD) according to the size of the display panel DP as the photographed object, so they can move upward or downward.

[0080] In addition, the four camera units should capture the entire area of ​​the display panel DP corresponding to the size of the display panel DP as the object of capture, and therefore should be located at the center of the 1 / 4 area of ​​the display panel DP as the object of capture, and can be moved forward or backward, left or right for this purpose. In addition, if necessary, in order to correspond to the rotation of the display panel DP as the object of capture, it can also be rotated forward or reverse.

[0081] ​​​On the other hand, the inspection for whether there are defects in the display panel DP in the inspection process preparation device 1100 and the inspection process execution device 1200 can be carried out in a nitrogen environment.

[0082] In particular, for the inspection process execution device 1200, the nitrogen gas should circulate stably in the first space portion 300 and the second space portion 400 without staying.

[0083] To this end, the inspection process execution device 1200 may include: a forced circulation module 310 located in the upper part of the first space portion 300; a first circulation pipeline module 320 for circulating the nitrogen gas in the first space portion 300 by connecting the upper and lower parts; and a second circulation pipeline module 420 connecting the first space portion 300 and the second space portion 400.

[0084] The second circulation pipeline module 420 can recycle the nitrogen gas that flows from the first space portion 300 into the second space portion 400 and then reflows into the first space portion 300. A forced suction module 430 may be provided on the second circulation pipeline module 420.

[0085] Here, the forced circulation module 310 and the forced suction module 430 are a kind of exhaust fan. The forced suction module 420 is located on the second circulation pipeline module 410, and after sucking the nitrogen gas that flows from the first space portion 300 into the second space portion 400, it discharges it into the first space portion 300.

[0086] Accordingly, the inspection process execution device 1200 will carry out the inspection process of the display panel in a uniform nitrogen environment.

[0087] On the other hand, when the inspection process preparation device 1100 and the inspection process execution device 1200 are maintained, staff need to enter the interior, so it can be converted into a clean dry air (CDA) environment.

[0088] 3. Single-panel transportation device

[0089] Figure 7 It is a flowchart of the process in which a single-panel transportation device provided in the display panel inspection device of the present invention adsorbs a single panel by a vacuum adsorption module.

[0090] First, referring to Figure 3 and Figure 4 , the single-panel transportation device 100 may include a platform module 110, a transportation module 120, a pickup module 130, a vacuum adsorption module 140, etc.

[0091] The platform module 110 is a component that adsorbs and fixes the other side of the single panel MP with one side of the single panel MP facing upward in the normal state. At least one type of display panel DP can be disposed on one side of the single panel MP, and an organic material layer for forming an organic light-emitting layer is deposited on the display panel DP.

[0092] Here, the entire other side of the single panel MP can be a non-deposited portion.

[0093] The platform module 110 can be rotated to inspect the display panel in a face-down manner. Therefore, the single panel MP adsorbed in the platform module 110 in the normal state can be in a flipped state with the one side facing downward.

[0094] The transport module 120 can be a component that adsorbs the other side of the single panel MP whose adsorption state on the platform module 110 changes from the normal state to the flipped state, and then moves the single panel MP to the first position for defect inspection while maintaining the flipped state.

[0095] The pickup module 130 can be a component that adsorbs the other side of the single panel MP moved to the first position by the transport module 120, and then moves to the second position while maintaining the flipped state. The second position is a position that rises based on the first position, and can enable the later-described plate-shaped vacuum adsorption module 140 to adsorb the single panel MP in the flipped state.

[0096] The vacuum adsorption module 140 can be a component that, when the single panel MP in the flipped state is moved to the second position by the transport module 120, can adsorb the single panel MP while maintaining smoothness in the flipped state, and then inspects whether the display panel DP is defective through the interaction between the probe 3002 of the probe block PB of the display panel inspection device 200.

[0097] If the single panel MP is adsorbed in the flipped state by the vacuum adsorption module 140, the vacuum adsorption module 140 moves the position to make the electrode plate of the display panel DP contact the probe 3002 of the probe block PB while maintaining the single panel MP in the flipped state, and thus can inspect whether the display panel DP is defective in the flipped state.

[0098] Here, the reason why the single panel MP is adsorbed by the vacuum adsorption module 140 while finally maintaining the flipped state is to accurately control the position of the display panel DP for inspecting whether the display panel DP has defects and to maintain the smoothness of the display panel DP. Moreover, there is also the following reason: If the display panel inspection device 200 is moved in a state where the single panel MP is adsorbed by other components instead of the vacuum adsorption module 140, problems will occur in terms of smoothness and accurate inspection of whether there are defects cannot be guaranteed.

[0099] Hereinafter, the process in which the single panel MP is adsorbed by the vacuum adsorption module 140 through the single panel transport device 100 of the present invention will be described.

[0100] Refer to Figure 7 , the process in which the single panel MP is adsorbed by the vacuum adsorption module through the single panel transport device 100 of the present invention includes: the first step S10, the single panel MP is arranged on the platform module 110 in a normal state; the second step S20, the platform module 110 is rotated; the third step S30, the transport module 120 enters and adsorbs the single panel MP; the fourth step S40, the transport module 120 moves to the first position; the fifth step S50, the pickup module 130 descends to adsorb the single panel MP; the sixth step S60, the transport module 120 returns; the seventh step S70, the pickup module 130 rises to the second position; the eighth step S80, the display panel DP is adsorbed by the vacuum adsorption module 140; the ninth step S90, the pickup module 130 rises and moves to the third position.

[0101] Hereinafter, refer to Figures 8 to 19 The above steps will be specifically described.

[0102] Figure 8 is a diagram for explaining the state in which a single panel is installed on the platform module of the single panel transport device of the present invention in a normal state.

[0103] Refer to Figure 8 , after the single panel MP is arranged on the platform module 110 in a normal state (S10), the single panel MP can be adsorbed.

[0104] Here, for the sake of convenience of explanation, the side of the single panel MP having at least one display panel DP is represented by shading.

[0105] On the other hand, the method of arranging the single panel MP on the platform module 110 is not particularly limited, but there are various methods, such as an automatic method with the help of a robot device in a nitrogen environment or a manual method with the help of a staff member, etc.

[0106] The platform module 110 may include a plurality of platform units 112 for adsorbing the other side SF2 of the single panel MP in the normal state; the plurality of platform units 112 are respectively arranged at intervals to form a first space S1 therebetween.

[0107] For example, as Figure 8 shown, nine such platform units 112 may be formed, but it is not limited thereto. As long as the single panel MP to be supported can be stably supported without the central part sinking due to its own weight, the number can be changed.

[0108] The platform unit 112 may have an adsorption tool 114 such as an adsorption pad for respectively adsorbing the single panel MP, and the number of the adsorption tools 114 is not limited.

[0109] Figure 9 And Figure 10 is a diagram for explaining the situation where the single panel in the normal state is transformed into the flipped state by the rotation of the platform module under the condition of Figure 8 the single panel in the normal state is transformed into the flipped state by the rotation of the platform module under the condition of

[0110] Referring to Figure 9 And Figure 10 , the platform module 110 can rotate R (S20) in the state of adsorbing the single panel MP in the normal state, and the rotation direction is not limited.

[0111] There is no special limitation on the driving method for rotating the platform module 110. For example, a known motor or the like can be used for rotation.

[0112] If the platform module 110 rotates, the state of the single panel MP adsorbed in the normal state is transformed into the flipped state where the side SF1 where the deposition part is located faces downward.

[0113] The single panel MP will continuously maintain the flipped state during the inspection for defects, so the display panel DP can be inspected for defects in the face-down manner.

[0114] Figure 11 is a diagram for explaining the state where the transport module provided in the single panel transport device of the present invention enters the platform module; Figure 12 And Figure 13 is a diagram for explaining the situation where the transport module provided in the single panel transport device of the present invention adsorbs the single panel in the flipped state.

[0115] Referring to Figures 11 to 13, if the rotating single panel MP of the platform module 110 is in a flipped state, the conveying module 120 adsorbs the single panel MP after entering the platform module 110 (S30).

[0116] The conveying module 120 may include a plurality of conveying units 122, and the plurality of conveying units 122 are inserted into a first space S1 provided by the platform unit 112 to adsorb the other side SF2 of the single panel MP configured in a flipped state.

[0117] Similar to the platform unit 112, the conveying units 122 may be arranged at intervals respectively.

[0118] For example, as shown in the figure, 8 such conveying units 122 may be formed, but it is not limited thereto.

[0119] After the conveying unit 122 enters the first space S1 provided by the single panel MP and the platform unit 112, it may adsorb the other side SF2 of the single panel MP, and if it is necessary to adsorb the single panel MP, it may move in the up and down direction without problem.

[0120] The conveying unit 122 may respectively have an adsorption tool 124 such as an adsorption pad for adsorbing the single panel MP, and the number of the adsorption tools 124 is not limited.

[0121] As described above, if the single panel MP is adsorbed by the conveying unit 122, the adsorption of the single panel MP by the platform unit 112 is released, so the single panel MP moves in linkage with the movement of the conveying unit 122.

[0122] Figure 14 It is a diagram for explaining the situation where the conveying module of the single panel conveying device provided in the present invention moves to the first position.

[0123] Refer to Figure 14 , while maintaining the flipped state, the conveying module 120 can move to the first position (S40) for checking for defects in the state of adsorbing the single panel MP in the flipped state.

[0124] Here, the first position may mean a position below the position where the single panel MP in the flipped state is arranged based on the vacuum adsorption module 140 and the pickup module 130. In the subsequent steps, the pickup module 130 can stably adsorb the single panel MP while maintaining the flipped state.

[0125] Figure 15 and Figure 16It is a diagram for explaining the condition of a single panel when the pick-up module of the single-panel conveying device provided in the present invention is in the lowered, adsorbed, and flipped state; Figure 17 It is a diagram for explaining the condition when the conveying module of the single-panel conveying device provided in the present invention returns to the original position.

[0126] Refer to Figure 15 and Figure 16 , in the state where the pick-up module 130 is located at the third position, after descending and passing through the vacuum adsorption module 140, it can move to the first position, and can adsorb the single panel MP in the flipped state that has moved to the first position through the conveying module 120 (S50).

[0127] The pick-up module 130 may include a plurality of pick-up units 132 arranged at intervals to evenly adsorb the other side SF2 of the single panel MP, thereby preventing the single panel MP from sinking.

[0128] If the single panel MP is adsorbed by the pick-up module 130, then as Figure 17 shown, the conveying module 120 releases adsorption, separates from the single panel MP, and can move to the original position (S60).

[0129] The conveying module 120 that has moved to the original position operates to inspect other display panels arranged on other single panels.

[0130] Figure 18 It is a diagram for explaining the condition when the pick-up module of the single-panel conveying device provided in the present invention rises to the second position.

[0131] Refer to Figure 18 , after the pick-up module 130 adsorbs the single panel MP in the flipped state, it can move to the second position by rising (S70), so that the vacuum adsorption module 140 can adsorb the single panel MP (S80).

[0132] Here, the second position may be the position of the vacuum adsorption module 140 where the pick-up module 130 rises based on the first position, and the vacuum adsorption module 140 can stably adsorb the single panel MP in the flipped state through the pick-up module 130.

[0133] The vacuum adsorption module 140 may have a plurality of adsorption tools such as adsorption pads for adsorbing the single panel MP.

[0134] Figure 19 It is a diagram for explaining the condition when the pick-up module of the single-panel conveying device provided in the present invention rises to the third position.

[0135] Refer to Figure 19, if the other side SF2 of the single panel MP moved to the second position is adsorbed by the vacuum adsorption module 140, the pickup module 130 releases the adsorption, rises after separating from the single panel MP, and can return to the third position (S90).

[0136] Then, whether there are defects can be checked by interacting with the vacuum adsorption module 140 and the display panel inspection device 200.

[0137] Herein, the interaction may mean that the vacuum adsorption module 140 moves to achieve contact with the probe 3002 of the electrode plate and the probe block PB of the display panel DP disposed on the single panel MP, and then checks whether there are defects in the display panel DP.

[0138] Hereinafter, the process of checking whether there are defects in the display panel DP by the display panel inspection device 200 will be specifically described.

[0139] 4. Display Panel Inspection Device

[0140] Figure 20 It is a diagram for explaining the display panel inspection device of the display panel inspection equipment provided in the present invention.

[0141] Refer to Figure 20 , the display panel inspection device 200 is a device that can inspect LCDs, OLEDs, etc., and can be applied to all equipment that uses the probe units PU1, PU2 and the probe block PB to inspect the display panel.

[0142] That is, the display panel inspection device 200 can be applied not only to the equipment inspected in the face-down manner described with reference to Figures 1 to 19 but also to the equipment inspected in the face-up manner.

[0143] Hereinafter, an example of the situation where the display panel inspection device 200 is applied to the equipment inspected in the face-down manner described with reference to Figures 1 to 19 will be described.

[0144] The display panel inspection device 200 may include a probe block assembly 2000 and a probe block loading unit 3000.

[0145] The probe block assembly 2000 is a structure for inspecting whether a display panel DP that has been moved to an inspection position by the position movement of a vacuum adsorption module 140 in the flipped state is defective. The vacuum adsorption module 140 adsorbs the other side of a single panel MP in a flipped state with one side of the single panel MP facing downward. The probe block assembly 2000 may include: a probe block PB that contacts an electrode plate of the display panel DP; and probe units PU1 and PU2 that support the probe block PB.

[0146] Here, the probe block assembly 2000 may also be a structure for inspecting whether a display panel DP that has been moved to an inspection position by the position movement of a vacuum adsorption module that adsorbs a single panel MP is defective in a face-up manner.

[0147] The probe block loading unit 3000 is a structure for loading and storing various types of probe blocks PB, and can transport the loaded probe blocks PB in and out.

[0148] In order to inspect the display panel DP, after the probe block PB is loaded in the probe block loading unit 3000, the probe block PB is selected and transported out, and can be installed at a predetermined position on the probe units PU1 and PU2.

[0149] The probe units PU1 and PU2 may include: a first probe unit PU1 for inspecting the display panel DP; and a second probe unit PU2 for inspecting other display panels with different sizes after the inspection of the display panel DP is completed.

[0150] The first probe unit PU1 may include: a 1-1 probe unit PU1-1 arranged horizontally in D1, a 1-2 probe unit PU1-2 arranged vertically in D2, a 1-3 probe unit PU1-3 arranged vertically in D2, and a 1-4 probe unit PU1-4 arranged horizontally in D1.

[0151] The second probe unit PU2 may include: a 2-1 probe unit PU2-1 arranged horizontally in D1, a 2-2 probe unit PU2-2 arranged vertically in D2, a 2-3 probe unit PU2-3 arranged vertically in D2, and a 2-4 probe unit PU2-4 arranged horizontally in D1.

[0152] Here, as shown in the figure, the 1-1 probe unit PU1-1 and the 2-1 probe unit PU2-1 may also form a single unit.

[0153] The probe block PB loaded on the probe block loading unit 3000 can be shipped and installed on the probe units PU1 and PU2 based on the display panel DP to be inspected. The shipping and installation of the probe block PB can be achieved by a shipping and installation tool (not shown).

[0154] The shipping and installation tool can be various well-known tools such as a robotic arm and is not particularly limited. For example, it includes a conveyor belt or a track, etc.

[0155] Hereinafter, a process of inspecting whether a 65-inch display panel and a 55-inch display panel of a single panel MP are defective by the display panel inspection device 200 shown in Figure 20 will be described.

[0156] Figures 21 to 28 is a diagram for explaining a situation in which the display panel inspection device of the present invention inspects whether a 65-inch display panel and a 55-inch display panel configured on a single panel are defective.

[0157] First, it is assumed that a single panel MP includes 3 65-inch display panels and 2 55-inch display panels, and electrode plates of each display panel are provided on all sides. Moreover, it is assumed that the 65-inch display panels are preferentially inspected and the 55-inch display panels are inspected after all the 65-inch display panels have been inspected.

[0158] The display panel inspection device 200 of the present invention is such that an induction unit (not shown) senses that a single panel MP includes 3 65-inch display panels and 2 55-inch display panels.

[0159] The induction unit may include a photographing unit using a camera and / or various induction units, etc. After the single panel MP is installed on the platform module 110 and in a state where the single panel MP is adsorbed by the vacuum adsorption module 140, before or during the movement to the position where the probe units PU and PU2 are arranged, it senses the size of the display panel DP constituting the single panel MP, the number and formation positions of the electrode plates of the display panel DP, etc.

[0160] Of course, for the induction of the number and formation positions of the electrode plates of the display panel DP by the induction unit, there is no time limit if it is before the display panel inspection device 200 performs the inspection.

[0161] If the induction unit senses the size and / or type of the display panel DP constituting the single panel MP, the control unit determines which display panel to inspect first; hereinafter, as described above, a situation where it is determined that the 65-inch display panel is a priority inspection object over the 55-inch display panel will be exemplified.

[0162] The control unit senses the size and / or type of the display panel formed on a single panel MP. If it is preferable to inspect a 65-inch display panel among the sensed display panels, the control unit selects the probe block PB to be inspected from the probe blocks PB loaded in the probe block loading unit 3000 based on the number and formation position of the electrode plates of the 65-inch display panel sensed by the sensing unit, and selects and determines the installation region SR on the installation regions SR of the probe units PU1 and PU2 where the selected probe block should be installed.

[0163] Here, the installation regions SR are regions for individually installing the probe blocks PB. The probe units PU1 and PU2 may have multiple installation regions SR, and no probe block is installed in a specific installation region SR according to the type of the display to be inspected, the formation position and number of the electrode plates, etc.

[0164] On the other hand, if the above process is completed, the control unit controls the first probe unit PU1.

[0165] That is, the control unit moves at least one of the 1-2nd probe unit PU1-2, the 1-3rd probe unit PU1-3, and the 1-4th probe unit PU1-4 while fixing the 1-1st probe unit PU1-1, and configures the first probe unit PU1 to a position corresponding to the electrode plates of the 65-inch display panel.

[0166] For example, as Figure 21 shown, the control unit can move the positions of the 1-2nd probe unit PU1-2, the 1-3rd probe unit PU1-3, and the 1-4th probe unit PU1-4 on the support plate unit 210 while the 1-1st probe unit PU1-1 is fixed on the support plate unit 210, and the position movement can be a position movement by linear movement.

[0167] Here, the position movement can be achieved by using various known components such as linear motion guides, motors, ball screws, and ball nuts, but this is only an example, and various known movement methods can be applied to achieve it.

[0168] The 1-2nd probe unit PU1-2 and the 1-3rd probe unit PU1-3 can be approaching each other to a predetermined distance, and the 1-4th probe unit PU1-4 can approach the 1-1st probe unit PU1-1 to a predetermined distance.

[0169] Here, when the first to fourth probe units PU1-4 move linearly, they can move under the first to second probe units PU1-2 and the first to third probe units PU1-3 to prevent interference with the first to second probe units PU1-2 and the first to third probe units PU1-3.

[0170] As described above, if the position movement of the first probe unit PU1 is completed for inspecting a 65-inch display panel, the control unit controls the transport and installation tool to install the selected probe block PB on the set installation area SR on the first to first probe unit PU1-1, the set installation area SR on the first to second probe unit PU1-2, the set installation area SR on the first to third probe unit PU1-3, and the set installation area S on the first to fourth probe unit PU1-4 through the transport and installation tool.

[0171] As Figure 22 and Figure 23 shown, the installation of the probe block PB can be stably achieved through the interaction of the position fixing parts 3001, 3003 and the guiding parts 3005, 3007; the position fixing parts 3001, 3003 may include: a first position fixing part 3001 formed by recessing from the bottom surface of the probe block PB; and a second position fixing part 3003 formed by protruding from the bottom surface.

[0172] The guiding parts 3005, 3007 may include: a first guiding part 3005 formed by protruding from the upper surface of the probe units PU1, PU2; and a second guiding part 3007 formed by recessing from the upper surface.

[0173] The first position fixing part 3001 matches the first guiding part 3005 and the second position fixing part 3003 matches the second guiding part 3007, and thus the probe block PB can be stably installed on the installation area SR on the probe units PU1, PU2.

[0174] The installation area SR on the probe units PU1, PU2 may have guiding parts 3005, 3007, which interact with the position fixing parts 3001, 3003 formed on the probe block PB to guide the position of installing the probe block PB; other well-known methods may also be applicable to the method of stably installing the probe block PB on the probe units PU1, PU2 in addition to the above method.

[0175] On the other hand, when the probe block PB is transported out from the probe block loading unit 3000, if the transported probe block PB is installed on the installation area SR on the probe units PU1, PU2, then as Figure 22 and Figure 23The probe 3002 of the probe block PB shown can be powered by the electrical connection between the connection terminal 3006 and the power supply application unit 3009.

[0176] The power supply application unit 3009 can be a circuit board formed with a power supply application terminal to apply power to the probe block PB when the probe block PB is mounted on the probe units PU1 and PU2.

[0177] The probe block PB may include: a probe 3002 that contacts the electrode plate of the display panel; a main body 3004 that supports the probe 3002; a connection terminal 3006 that applies the power to the probe 3002 through electrical connection with the power supply application unit 3009; and a circuit pattern portion 3008 for electrically connecting the probe 3002 and the connection terminal 3006; wherein, the circuit pattern portion 3008 can be a printed circuit board.

[0178] Here, the connection terminal 3006 may be formed with the same or fewer numbers of power supply application terminals to which power is applied through the power supply application unit 3009, and the circuit pattern portion 3008 can be a printed circuit board that can apply only a part of the power applied to the power supply application terminals to the probe 3002 when the number of the probes 3002 is less than the number of the power supply application terminals.

[0179] On the other hand, among the probe blocks PB mounted on the first to fourth probe units PU1 - 4 that are shipped out from the probe block loading unit 3000 by the transportation installation tool, the probe blocks PB shipped out from the probe block loading unit 3000 are formed to extend more in the height direction D3 than the probe blocks PB mounted on the first to second probe units PU1 - 2 or the first to third probe units PU1 - 3, and thus can compensate for the position in the height direction D3 of the first to fourth probe units PU1 - 4 based on the first to second probe units PU1 - 2 and the first to third probe units PU1 - 3.

[0180] That is to say, the display panel DP to be inspected is kept in a horizontal state, and in this state, all the probes 3002 of the probe block PB should be at the same height in order to contact all the electrode plates.

[0181] For this reason, in the case of the first to fourth probe units PU1 - 4 located at a relatively lower position than the first to second probe units PU1 - 2 and the first to third probe units PU1 - 3, probe blocks PB that extend more in the height direction D3 than the probe blocks PB mounted on the first to second probe units PU1 - 2 and the first to third probe units PU1 - 3 should be installed.

[0182] Finally, when the probe block PB is to be installed on the 1st - 4th probe units PU1 - 4, the control unit shall select the probe block PB for compensating the position in the height direction D3.

[0183] Of course, the probe block PB to be installed on the 1st - 4th probe units PU1 - 4 can also be combined with other components such as spacers to be extended more in the height direction D3 than the probe blocks PB installed on the 1st - 2nd probe units PU1 - 2 and the 1st - 3rd probe units PU1 - 3.

[0184] In the above, it is described that after the first probe unit PU1 is configured at a position corresponding to the electrode plate of the 65 - inch display panel by the control unit, the probe block PB is installed on the first probe unit PU1. However, it is not limited thereto, but the first probe unit PU1 with the probe block PB installed thereon can also be configured at a position corresponding to the electrode plate of the 65 - inch display panel after the probe block PB is installed on the first probe unit PU1.

[0185] As Figure 24 shown, when the installation of the probe block PB for inspecting the 65 - inch display panel on the first probe unit PU1 is completed, as Figure 25 shown, the first probe unit PU1 rotates 180 degrees by the rotation R of the support plate unit 210.

[0186] When the rotation of the first probe unit PU1 is completed by the rotation of the support plate unit 210, the electrode plate of the 65 - inch display panel contacts the probe 3002 of the probe block PB installed on the first probe unit PU1 through the position movement of the vacuum adsorption module 140, and power is applied by the power supply application unit 3009 to check for defects.

[0187] On the other hand, as Figure 26 shown, during the inspection of the 65 - inch display panel for defects by the first probe unit PU1, the second probe unit PU2 prepares to inspect the 55 - inch display panel for defects by the control unit.

[0188] The control unit moves at least one of the 2nd - 2nd probe unit PU2 - 2, the 2nd - 3rd probe unit PU2 - 3, and the 2nd - 4th probe unit PU2 - 4 while fixing the 2nd - 1st probe unit PU2 - 1 to configure the second probe unit PU2 at a position corresponding to the electrode plate of the 55 - inch display panel.

[0189] For example, as Figure 26As shown, in a state where the 2-1 probe unit PU2-1 is fixed on the support plate unit 210, the control unit can move the positions of the 2-2 probe unit PU2-2, the 2-3 probe unit PU2-3, and the 2-4 probe unit PU2-4 on the support plate unit 210. The position movement can be a position movement by linear movement.

[0190] Here, the position movement can be realized by using various known components such as linear motion guides, motors, ball screws, and ball nuts. However, this is only an example, and various known moving methods can be applied to achieve it.

[0191] The 2-2 probe unit PU2-2 and the 2-3 probe unit PU2-3 can approach each other by a predetermined distance, and the 2-4 probe unit PU2-4 can approach the 2-1 probe unit PU2-1 by a predetermined distance.

[0192] Here, when the 2-4 probe unit PU2-4 moves linearly, it can move its position under the 2-2 probe unit PU2-2 and the 2-3 probe unit PU2-3 to prevent interference with the 2-2 probe unit PU2-2 and the 2-3 probe unit PU2-3.

[0193] As described above, if the position movement of the second probe unit PU2 is completed for inspecting a 55-inch display panel, the control unit controls the transport and installation tool to install the selected probe block PB on the set installation area SR on the 2-1 probe unit PU2-1, the set installation area SR on the 2-2 probe unit PU2-2, the set installation area SR on the 2-3 probe unit PU2-3, and the set installation area SR on the 2-4 probe unit PU2-4 through the transport and installation tool.

[0194] As a result, as Figure 27 shown, the installation of the probe block PB for inspecting the 55-inch display panel on the second probe unit PU2 is completed. If the inspection of all 65-inch display panels is completed through the first probe unit PU1, then as Figure 28 shown, the second probe unit PU2 also rotates 180 degrees through the rotation R of the support plate unit 210.

[0195] If the rotation of the second probe unit PU2 is completed through the rotation of the support plate unit 210, the electrode plate of the 55-inch display panel contacts the probe 3002 of the probe block PB installed on the second probe unit PU2 through the position movement of the vacuum adsorption module 140, and power is applied through the power supply application unit 3009 to check for defects.

[0196] Here, a preparation mode for a display panel for checking other dimensions is performed. For example, the probe block PB mounted on the first probe unit PU1 is moved to the probe block loading unit 3000 by a transport installation tool, and the above process is repeated.

[0197] On the other hand, in the above, it is illustrated by way of example that all the electrode plates of the display panel DP to be inspected are formed on four sides. However, the electrode plates of the display panel DP to be inspected may also be formed only on a part of the four sides. In this case, of course, only a part of the probe units required for inspection may be used.

[0198] The above is summarized as follows:

[0199] The display panel inspection device 200 of the present invention is a device that selectively mounts the probe blocks PB required for inspection on the probe units PU1 and PU2, inspects the display panel DP, and when inspecting another display panel DP, without replacing the probe units PU1 and PU2, the inspection work can be carried out more conveniently by replacing the probe blocks PB, and thus the production yield can be improved, etc.

[0200] To this end, the display panel inspection device 200 may include a probe block assembly 2000 and a probe block loading unit 3000. The probe block assembly 2000 may include: a plurality of probe blocks PB that come into contact with a plurality of electrode plates arranged on the side of the display panel DP; and probe units PU1 and PU2 that support the plurality of probe blocks PB.

[0201] Here, in order to inspect the display panel DP, after selecting the plurality of probe blocks PB from the probe blocks PB loaded in each of the probe block loading units 3000, they are shipped out and mounted at a predetermined position on the probe units PU1 and PU2 existing at a position for inspecting whether the display panel DP is defective.

[0202] The probe units PU1 and PU2 may each have a plurality of mounting areas SR for individually mounting the probe blocks PB. The mounting areas SR for mounting the probe blocks PB among the plurality of mounting areas SR are selected based on the number and formation positions of the electrode plates of the display panel DP to be inspected.

[0203] On the other hand, the probe units PU1 and PU2 may include a first probe unit PU1 and a second probe unit PU2. If the inspection of a specific display panel is completed through the first probe unit PU1 and the probe block PB mounted on the first probe unit PU1, for inspecting display panels with different sizes, it rotates so that the positions of the first probe unit PU1 and the second probe unit PU2 are exchanged with each other, and then the inspection of the other display panel is carried out through the second probe unit PU2 and the probe block PB mounted on the second probe unit PU2.

[0204] That is, the probe units PU1 and PU2 can inspect whether the specific display panel and the other display panel are defective without replacing with other probe units existing outside.

[0205] Of course, the first probe unit PU1 or the second unit PU2 do not need to exchange positions with each other, but only replace the probe block PB currently mounted for inspection, whereby it is possible to inspect whether a display panel with a different size from the display panel currently being inspected for defects is defective.

[0206] The probe block assembly 2000 described above is a component that can inspect the display panel DP by mounting a plurality of probe blocks PB required for inspecting the display panel DP on the probe unit as needed, and can be applied to all devices that inspect the display panel DP in a face-down or face-up manner.

[0207] At this time, the control method of the probe block assembly 2000 may include: a first step of sensing the number and formation positions of a plurality of electrode plates of a first display panel that needs to be inspected for defects among at least one type of display panel of a single panel MP, the display panel having a plurality of electrode plates formed along the side; a second step of selecting a probe block required for inspection from the probe blocks loaded in the probe block loading unit based on the sensing in the first step; a third step of selecting an installation area where the probe block should be installed in the installation area on the probe unit based on the sensing result in the first step; and a fourth step of transporting the selected probe block out of the probe block loading unit and installing it in the selected installation area.

[0208] Here, the fourth step may include the following steps: after completing the inspection of the first display panel, when it is necessary to replace at least one probe block that is not needed or needed among the probe blocks installed in the installation area for inspecting a second display panel with a different size, select the probe block that is not needed or needed and then transport it out of the probe block loading unit.

[0209] In addition, the fourth step may include the following steps: after completing the inspection of the first display panel, when it is necessary to add a probe block for inspecting a second display panel with a different size, select the additional probe block from the probe blocks loaded in the probe block loading unit, select the installation area where the additional probe block should be installed, and then install the selected additional probe block in the selected installation area.

[0210] Accordingly, the probe block assembly can inspect whether many types of display panels are defective due to the replacement of the probe block.

[0211] Figure 29 FIG. is a diagram for explaining another method of applying power to the probes provided in the probe block.

[0212] Refer to Figure 29 , the connection between the connection terminal 3106 of the probe block PB' and the power supply application unit 3109 can be achieved by means of a socket or the like.

[0213] Here, when the probe block PB' is shipped out from the probe block loading unit 3000, after the transportation installation tool clamping body 3104 and the connection terminal 3106 are clamped, the body 3104 is installed in the installation area on the probe unit while the connection terminal 3106 is inserted into the power supply application unit 3109 to achieve the electrical connection between the connection terminal 3106 and the power supply application unit 3109.

[0214] Figure 30 and Figure 31 FIG. is a diagram for the method of fixing or separating the probe block on the probe unit.

[0215] Refer to Figure 30 , the installation area of the probe unit can be partitioned by the partition wall W, and the probe block PB can be fixed and separated in position by the first fixing tool 3200 and the second fixing tool 3300.

[0216] The first fixing tool 3200 can move in the height direction D3. If it moves downward in the height direction D3, the second fixing tool 3300 rotates based on the hinge, and thus the probe block PB can be separated.

[0217] Refer to Figure 31 , the position of the probe block PB can be fixed and separated by the third fixing tool 3400, and the probe block PB can be separated by rotating the pressing tool 3500 that slides and presses the probe block PB by the third fixing tool 3400.

[0218] In the above, the structure and features of the present invention have been described based on the embodiments of the present invention. However, the present invention is not limited thereto, and various changes or modifications can be made within the scope of the idea of the present invention, which will be obvious to those skilled in the art to which the present invention pertains. Therefore, it is indicated that such changes or modifications fall within the scope of the claims.

Claims

1. A probe block assembly for inspecting a display panel, characterized in that: include: A plurality of probe blocks are moved by the position of a single panel to contact a plurality of electrode plates of a display panel moved to an inspection position to inspect whether there are defects, wherein one side of the single panel has at least one type of display panel, the display panel is deposited with an organic layer for forming an organic light-emitting layer, and a plurality of electrode plates are formed along the side of the display panel; and a probe unit supporting the plurality of probe blocks; The plurality of probe blocks respectively have probes respectively contacting the plurality of electrode plates. In order to inspect the display panel, the probe block is selected from the probe blocks loaded in the respective probe block loading units and then transported out and installed at a predetermined position on the probe unit at a position for inspecting whether the display panel is defective. After the inspection of the display panel is completed, in order to inspect other display panels of different sizes without or without replacing at least one of the plurality of probe blocks, For the probe block that does not need to be replaced or needs to be replaced, the probe block is selected in the probe unit and then transported out and loaded into the probe block loading unit. The probe block assembly for inspecting a display panel further comprises: a power supply applying section for applying power to each of the probe blocks when the plurality of probe blocks are mounted on the probe unit; The probe block includes: a plurality of probes; a main body supporting the plurality of probes; a connection terminal electrically connected to the power supply applying part to apply the power to the plurality of probes; and a circuit pattern part for electrically connecting the plurality of probes and the connection terminal. The connection terminals are formed with the same number or less number than the power supply application terminals, and the power supply application terminals are supplied with power by the power supply application unit; When the number of the plurality of probes is smaller than the number of the power application terminals, the circuit pattern portion applies only a portion of the power applied to the power application terminals to the plurality of probes.

2. The probe block assembly for inspecting a display panel according to claim 1, characterized in that: The probe unit, After the inspection of the display panel is completed, if an additional probe block is needed to inspect other display panels of different sizes, the additional probe unit is selected from the probe blocks loaded on the probe block loading unit and then transported out, and an installation area for installing the additional probe unit is provided.

3. The probe block assembly for inspecting a display panel according to claim 1, characterized in that: The probe unit has a plurality of mounting areas for mounting the probe blocks individually. The mounting region for mounting the probe block among the plurality of mounting regions is selected based on the number and formation positions of the electrode plates of the display panel to be inspected.

4. The probe block assembly for inspecting a display panel according to claim 3, characterized in that: The plurality of mounting areas have guide portions that interact with position fixing portions formed on the probe block to guide positions where the probe blocks are mounted, respectively.

5. The probe block assembly for inspecting a display panel according to claim 1, characterized in that: Without replacing the probe unit, at least one of the plurality of probe blocks installed at the predetermined position is replaced to inspect whether a display panel different from the display panel being inspected has a defect.

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