Vibration test fixture

Abstract

The invention discloses a vibration test fixture, comprising a test base plate and two test fixtures arranged on the test base plate opposite to each other, wherein the test fixture is provided with a clamping slide groove recessed in a direction away from the other test fixture at the bottom of a side opposite to the other test fixture, and at least one test fixture is provided with an upper clamping plate extending in a direction close to the other test fixture at the top of a side opposite to the other test fixture; the invention uses the clamping slide grooves of the two test fixtures to clamp the two ends of a storage device carrier plate, and since the storage device to be tested is plugged into the storage device carrier plate, an upper clamping plate is provided at one end of the storage device to be tested away from the storage device carrier plate to resist the storage device to be tested, so that the storage device to be tested can be better clamped and fixed in the vibration test, and the falling phenomenon of the storage device to be tested in the vibration test can be avoided, thereby improving the test efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of memory testing, and in particular to a vibration testing fixture. Background Art

[0002] Solid-state drives have the characteristics of fast reading and writing, light weight, low energy consumption and small size that traditional mechanical hard drives do not have. They are widely used in many fields such as military, automotive, industrial control, video surveillance, network monitoring, network terminals, electricity, medical, aviation, navigation equipment, etc.

[0003] As the application scope of solid-state drives becomes wider and wider, in order to ensure the shipment quality of solid-state drives, reduce defective products, and prevent cold soldering on circuit boards in solid-state drives, solid-state drives will undergo corresponding vibration tests to verify the reliability of chip and electronic material welding.

[0004] In the existing vibration test, the solid-state hard disk is directly fixed on the vibration table with a clamp for vibration testing. However, during the vibration test, the solid-state hard disk is easy to fall off the clamp, affecting the test effect. At the same time, when the solid-state hard disk falls off, the vibration test needs to be stopped to prevent the solid-state hard disk from falling onto the vibration table and causing damage to the vibration table or the solid-state hard disk, thereby affecting the test efficiency. Summary of the invention

[0005] The technical problem to be solved by the present invention is to provide a vibration test fixture to improve the test efficiency.

[0006] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0007] A vibration test fixture, comprising a test base plate and two test fixtures arranged on the test base plate opposite to each other, wherein the test fixture is provided with a clamping groove recessed in a direction away from the other test fixture at the bottom of a side opposite to the other test fixture, and at least one of the test fixtures is provided with an upper clamping plate extending in a direction close to the other test fixture at the top of a side opposite to the other test fixture;

[0008] The clamping slide grooves of the two test fixtures are used to clamp the two ends of the storage device carrier, and the upper clamping plate is used to abut against an end of the storage device to be tested that is away from the storage device carrier.

[0009] The beneficial effects of the present invention are as follows: a vibration test fixture is used to clamp the two ends of a storage device carrier board through the clamping grooves of two test fixtures. Since the storage device to be tested is plugged into the storage device carrier board, an upper clamping plate is provided at one end of the storage device to be tested away from the storage device carrier board to abut against the storage device to be tested, thereby better clamping and fixing the storage device to be tested in the vibration test, avoiding the storage device to be tested from falling off in the vibration test, and improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 is a three-dimensional schematic diagram of a vibration test fixture according to an embodiment of the present invention;

[0011] Figure 2 It is a disassembly schematic diagram of a vibration test fixture according to an embodiment of the present invention;

[0012] Figure 3 for Figure 2 A magnified schematic diagram of the middle area A;

[0013] Figure 4 It is a side schematic diagram of a vibration test fixture according to an embodiment of the present invention.

[0014] Description of labels:

[0015] 1. Test the baseboard;

[0016] 2. Test fixture; 21. Clamping slide; 22. Fixture bottom plate; 221. First bottom plate; 222. Second bottom plate; 223. First adjustment through hole; 23. Fixture support plate; 231. Second adjustment through hole; 24. Side stopper;

[0017] 3. Upper splint; 31. Upper stopper;

[0018] 4. First adjusting screw; 5. Second adjusting screw; 6. Fixing screw. DETAILED DESCRIPTION

[0019] In order to explain the technical content, achieved objectives and effects of the present invention in detail, the following is an explanation in combination with the implementation modes and the accompanying drawings.

[0020] Please refer to Figures 1 to 4 The embodiment of the present invention provides a vibration test fixture, comprising a test base plate 1 and two test fixtures 2 arranged on the test base plate 1, wherein the test fixture 2 is provided with a clamping groove 21 recessed in a direction away from the other test fixture 2 at the bottom of a side opposite to the other test fixture 2, and at least one of the test fixtures 2 is provided with an upper clamping plate 3 extending in a direction close to the other test fixture 2 at the top of a side opposite to the other test fixture 2;

[0021] The clamping slots 21 of the two test fixtures 2 are used to clamp the two ends of the storage device carrier, and the upper clamping plate 3 is used to contact the end of the storage device to be tested that is away from the storage device carrier.

[0022] From the above description, it can be seen that the beneficial effect of the present invention is that the clamping grooves 21 of the two test fixtures 2 are used to clamp the two ends of the storage device carrier. Since the storage device to be tested is plugged into the storage device carrier, an upper clamping plate 3 is provided at the end of the storage device to be tested away from the storage device carrier to resist the storage device to be tested, thereby better clamping and fixing the storage device to be tested in the vibration test, avoiding the storage device to be tested from falling off during the vibration test, and improving the test efficiency.

[0023] Furthermore, the test base plate 1 is provided with a first buffer member between the two test fixtures 2, which is at the same height as the side of the clamping slot 21 close to the test base plate 1;

[0024] A second buffer is disposed on one side of the upper clamping plate 3 close to the test base plate 1 .

[0025] As can be seen from the above description, since the two ends of the storage device to be tested are in contact with the storage device carrier and the upper clamping plate 3, there is a downward resistance force for the storage device carrier, which is easy to break the storage device carrier. Therefore, the test base plate 1 is provided with a first buffer member between the two test fixtures 2, which is at the same height as the side of the clamping slot 21 close to the test base plate 1, that is, a first buffer member is padded under the storage device carrier to buffer the resistance force and ensure the service life of the storage device carrier; for the upper clamping plate 3, the storage device to be tested is easily damaged due to direct contact with the upper clamping plate 3. Therefore, a second buffer member is provided on the side of the upper clamping plate 3 close to the test base plate 1, so that the storage device to be tested is in contact with the second buffer member to prevent damage caused by the storage device to be tested directly contacting the upper clamping plate 3, thereby ensuring the safety of the test piece during the vibration test.

[0026] Furthermore, the first buffer component and the second buffer component are both made of plastic foam.

[0027] From the above description, it can be seen that the plastic foam is simple and practical, easy to realize, and will not cause damage when in contact with the storage device to be tested, and is safe and reliable.

[0028] Furthermore, a blocking member for limiting the sliding of the storage device carrier is provided at one end of the clamping slide groove 21 along the sliding direction.

[0029] From the above description, it can be known that the storage device carrier is inserted into the slide slot from the end without the blocking member and pushed until it reaches the blocking member at the other end, thereby realizing the rapid clamping and fixing of the storage device carrier.

[0030] Furthermore, the blocking member is a blocking screw which is threadedly connected to one end of the clamping slide groove 21 and one end of which is away from the test base plate 1 and is higher than the clamping slide groove 21;

[0031] Alternatively, the blocking member is a blocking plate fixed to one end of the clamping slot 21 and one end of which is away from the test base plate 1 and is higher than the clamping slot 21;

[0032] Alternatively, one end of the clamping slot 21 along the sliding direction is a closed structure to form the blocking member.

[0033] From the above description, it can be seen that both the blocking screw and the blocking plate play a role in limiting the sliding of the storage device carrier by blocking the opening at one end. At the same time, the two ends of the slide groove can also be opened at one end and not set at the other end, that is, a closed structure, which can also play a role in limiting the sliding of the storage device carrier.

[0034] Furthermore, an upper stopper 31 with an L-shaped angle is provided on one side of the upper clamping plate 3 away from the test base plate 1 , and one side of the upper stopper 31 forming the L-shaped angle is abutted and connected to the upper clamping plate 3 and the other side is abutted and connected to the corresponding test fixture 2 .

[0035] From the above description, it can be seen that one side of the upper stopper 31 with an L-shaped angle is abutted and connected with the upper clamping plate 3 and the other side is abutted and connected with the corresponding test fixture 2, so that the storage device to be tested is further fixed by the test fixture 2, the upper stopper 31 and the upper clamping plate 3 in sequence.

[0036] Furthermore, the test fixture 2 is provided with a vertically oriented limiting sliding groove on a side corresponding to the upper stopper 31 , and a side of the upper stopper 31 close to the test fixture 2 is in contact with the bottom of the limiting sliding groove.

[0037] It can be seen from the above description that a guiding effect is initiated for the up and down movement of the upper stopper 31 by means of the limiting slide groove.

[0038] Furthermore, the test fixture 2 includes a T-shaped fixture bottom plate 22 and a fixture support plate 23;

[0039] The first bottom plate 221 of the fixture bottom plate 22 located on the side of the fixture support plate 23 close to the other test fixture 2 is provided with the clamping slide groove 21;

[0040] The second bottom plate 222 on the fixture bottom plate 22, located on the side of the fixture support plate 23 away from the other test fixture 2, has a side block 24 with an L-shaped angle, and one side of the side block 24 forming the L-shaped angle is fixedly connected to the second bottom plate 222 and the other side is fixedly connected to the corresponding fixture support plate 23.

[0041] From the above description, it can be known that the fixed connection between the clamp bottom plate 22 and the clamp support plate 23 is achieved through the side block 24, and the side block also plays a role of supporting the clamp support plate 23 to better hold and fix the storage device carrier.

[0042] Furthermore, it also includes a first adjusting screw 4, the second bottom plate 222 is provided with a first strip-shaped adjusting through hole 223, the first adjusting screw 4 passes through the first adjusting through hole 223 and is threadedly connected to the test bottom plate 1;

[0043] The length of the first adjusting through hole 223 is greater than the diameter of the screw rod of the first adjusting screw 4 , and the width of the first adjusting through hole 223 is greater than the diameter of the screw rod of the first adjusting screw 4 and smaller than the diameter of the nut of the first adjusting screw 4 .

[0044] It can be known from the above description that the distance between the two test fixtures 2 can be adjusted within the length range of the first adjustment through hole 223 to adapt to storage device carriers of different widths.

[0045] Furthermore, it also includes a second adjusting screw 5, the clamp support plate 23 is provided with a strip-shaped second adjusting through hole 231, the second adjusting screw 5 passes through the second adjusting through hole 231 and is threadedly connected to the upper clamp plate 3;

[0046] The length of the second adjusting through hole 231 is greater than the diameter of the screw rod of the second adjusting screw 5 , and the width of the second adjusting through hole 231 is greater than the diameter of the screw rod of the second adjusting screw 5 and smaller than the diameter of the nut of the second adjusting screw 5 .

[0047] It can be known from the above description that the height of the upper clamping plate 3 can be adjusted within the length range of the second adjusting through hole 231 to accommodate memory devices to be tested of different widths.

[0048] The vibration test fixture of this application is mainly used in application scenarios where any memory needs to be tested, such as solid-state hard drives. The following is an explanation of the specific application scenarios:

[0049] Based on the above, combined with Figures 1 to 4 , Embodiment 1 of the present invention is:

[0050] A vibration test fixture comprises a test base plate 1 and two test fixtures 2 arranged opposite to each other on the test base plate 1, wherein the test fixture 2 is provided with a clamping groove 21 recessed in a direction away from the other test fixture 2 at the bottom of a side opposite to the other test fixture 2, and at least one of the test fixtures 2 is provided with an upper clamping plate 3 extending in a direction close to the other test fixture 2 at the top of a side opposite to the other test fixture 2.

[0051] In this embodiment, the storage device carrier is provided with two rows of connectors, each row of connectors is provided with multiple sockets, and multiple storage devices to be tested are connected to the multiple sockets one by one. Therefore, in this embodiment, the two test fixtures 2 are provided with upper clamping plates 3 to respectively contact the storage devices to be tested on both sides.

[0052] In this embodiment, if Figure 2 As shown, the test fixture 2 includes a T-shaped fixture base plate 22 and a fixture support plate 23; wherein, a first base plate 221 on the fixture base plate 22, which is located on the side of the fixture support plate 23 close to another test fixture 2, is provided with a clamping groove 21; a second base plate 222 on the fixture base plate 22, which is located on the side of the fixture support plate 23 away from another test fixture 2, has an L-shaped side stopper 24, and one side of the side stopper 24 forming the L-shaped angle is fixedly connected to the second base plate 222 and the other side is fixedly connected to the corresponding fixture support plate 23.

[0053] like Figure 2 As shown, an upper stopper 31 with an L-shaped angle is provided on one side of the upper clamping plate 3 away from the test base plate 1 , one side of the upper stopper 31 forming the L-shaped angle is in contact with the upper clamping plate 3 and the other side is in contact with the corresponding test fixture 2 .

[0054] In this embodiment, the fixing screw 6 passes through the second bottom plate 222 and is threadedly connected to the bottom of the side block 24, and the fixing screw 6 passes through the fixture support plate 23 and is threadedly connected to the side of the side block 24, thereby achieving the fixed connection between the fixture bottom plate 22, the side block 24 and the fixture support plate 23; then the fixing screw 6 passes through the upper clamping plate 3 and is threadedly connected to the upper block 31, thereby achieving the fixed connection between the upper clamping plate 3 and the upper block 31; finally, the fixture bottom plate 22 is detachably connected to the test bottom plate 1 and the upper clamping plate 3, respectively, thereby achieving the assembly of the entire test fixture.

[0055] Therefore, when a vibration test is required, the storage device carrier is filled with the storage devices to be tested and then slid into the openings of the slide grooves on both sides, so that both ends of the storage device carrier are clamped by the slide grooves of the test fixture 2 on both sides, and the end of the storage device to be tested away from the storage device carrier is connected with the upper clamping plate 3, ensuring that the storage device to be tested is clamped and fixed during the vibration test, thereby improving the test efficiency.

[0056] Based on the above, combined with Figures 1 to 4 , Embodiment 2 of the present invention is:

[0057] A vibration test fixture, based on the above-mentioned embodiment 1, in this embodiment, what is not shown in the figure is that a first buffer member is provided between two test fixtures 2 and is at the same height as the side of the clamping groove 21 close to the test base plate 1, and a second buffer member is provided on the side of the upper clamping plate 3 close to the test base plate 1.

[0058] In this embodiment, the first buffer and the second buffer are both plastic foams, so that the storage device carrier is padded on one plastic foam, and one end of the storage device to be tested away from the storage device carrier contacts the other plastic foam, so as to ensure the safety of the test device during the vibration test.

[0059] Based on the above, combined with Figures 1 to 4 , Embodiment 3 of the present invention is:

[0060] A vibration test fixture is provided. Based on the above-mentioned first embodiment, in this embodiment, what is not shown in the figure is that a blocking member for limiting the sliding of a storage device carrier is provided at one end of the clamping slot 21 along the sliding direction.

[0061] In this embodiment, the specific implementation of the blocking member is not limited, for example, the blocking member is a blocking screw threadedly connected to one end of the clamping slot 21 and the end away from the test base plate 1 is higher than the clamping slot 21; or the blocking member is a blocking plate fixed to one end of the clamping slot 21 and the end away from the test base plate 1 is higher than the clamping slot 21; or one end of the clamping slot 21 along the sliding direction is a closed structure to form a blocking member. That is, it can block the sliding of the storage device carrier at one end of the slot.

[0062] Based on the above, combined with Figures 1 to 4 , Embodiment 4 of the present invention is:

[0063] A vibration test fixture, based on the above-mentioned embodiment 1, in this embodiment, further includes a first adjusting screw 4 and a second adjusting screw 5.

[0064] The test fixture 2 is provided with a vertically oriented limiting slide groove on one side corresponding to the upper stopper 31, and the side of the upper stopper 31 close to the test fixture 2 is in contact with the bottom of the limiting slide groove. The fixture support plate 23 is provided with a strip-shaped second adjustment through hole 231, and the second adjustment screw 5 passes through the second adjustment through hole 231 and is threadedly connected with the upper clamping plate 3; the length of the second adjustment through hole 231 is greater than the screw diameter of the second adjustment screw 5, so that the second adjustment screw 5 drives the upper clamping plate 3 to move up and down along the second adjustment through hole 231, and the width of the second adjustment through hole 231 is greater than the screw diameter of the second adjustment screw 5 and smaller than the nut diameter of the second adjustment screw 5, so that the nut of the second adjustment screw 5 can be locked on the side of the fixture support plate 23 away from the upper clamping plate 3.

[0065] Thus, the height of the upper clamping plate 3 can be adjusted according to the width of the memory device to be tested, that is, the height of the memory device to be tested after being inserted into the memory device carrier. After adjusting to a suitable height, the second adjusting screw 5 is screwed in toward the upper clamping plate 3 until it contacts the side of the clamp support plate 23 away from the upper clamping plate 3, thereby achieving a fixed connection between the upper clamping plate 3 and the clamp support plate 23.

[0066] Similarly, a first strip-shaped adjusting through hole 223 is provided on the second bottom plate 222, and the first adjusting screw 4 passes through the first adjusting through hole 223 and is threadedly connected to the test bottom plate 1; the length of the first adjusting through hole 223 is greater than the screw diameter of the first adjusting screw 4, and the width of the first adjusting through hole 223 is greater than the screw diameter of the first adjusting screw 4 and smaller than the nut diameter of the first adjusting screw 4. That is, the width between the two test fixtures 2 can be adjusted according to the width of the storage device carrier board to ensure that the two ends of the storage device carrier boards of different sizes can be clamped, so as to achieve the clamping and fixing of storage device carrier boards of different sizes.

[0067] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0068] In summary, the present invention provides a vibration test fixture, which uses the clamping grooves of two test fixtures to clamp the two ends of the storage device carrier, and pads plastic foam under the storage device carrier for buffering, and is provided with an upper clamping plate and a side of the upper clamping plate close to the test base plate is also provided with plastic foam to resist the storage device to be tested, so that the storage device to be tested can be better clamped and fixed during the vibration test, avoiding the falling phenomenon of the storage device to be tested during the vibration test, and can also ensure the safety of the test piece during the vibration test process and improve the test efficiency; at the same time, through the first adjusting screw, the distance between the two test fixtures can be adjusted within the length range of the first adjusting through hole to adapt to storage device carriers of different widths; and through the second adjusting screw, the height of the upper clamping plate can be adjusted within the length range of the second adjusting through hole to adapt to storage devices to be tested of different widths, so that different models of storage devices to be tested and corresponding storage device carriers can be used to ensure the versatility of the test fixture.

[0069] The above descriptions are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent transformations made using the contents of the present invention's specification and drawings, or directly or indirectly applied in related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A vibration test fixture, characterized in that: It comprises a test base plate and two test fixtures arranged on the test base plate opposite to each other, wherein the test fixture is provided with a clamping groove recessed in a direction away from the other test fixture at the bottom of a side opposite to the other test fixture, and at least one of the test fixtures is provided with an upper clamping plate extending in a direction close to the other test fixture at the top of a side opposite to the other test fixture; The clamping slide grooves of the two test fixtures are used to clamp the two ends of the storage device carrier, and the upper clamping plate is used to contact the end of the storage device to be tested away from the storage device carrier; An upper stopper with an L-shaped angle is arranged on one side of the upper clamping plate away from the test base plate, one side of the upper stopper forming the L-shaped angle is in contact with the upper clamping plate and the other side is in contact with the corresponding test fixture.

2. The vibration test fixture according to claim 1, characterized in that: The test base plate is provided with a first buffer member between the two test fixtures, which is at the same height as the side of the clamping slide groove close to the test base plate; A second buffer is provided on one side of the upper clamping plate close to the test base plate.

3. The vibration test fixture according to claim 2, characterized in that: The first buffer component and the second buffer component are both made of plastic foam.

4. The vibration test fixture according to claim 1, characterized in that: A blocking member for limiting the sliding of the storage device carrier is arranged at one end of the clamping slide groove along the sliding direction.

5. The vibration test fixture according to claim 4, characterized in that: The blocking member is a blocking screw threadedly connected to one end of the clamping slide slot and having an end away from the test base plate higher than the clamping slide slot; Alternatively, the blocking member is a blocking plate fixed to one end of the clamping slide groove and one end of which is away from the test base plate and is higher than the clamping slide groove; Alternatively, one end of the clamping slide groove along the sliding direction is a closed structure to form the blocking member.

6. The vibration test fixture according to claim 1, characterized in that: The test fixture is provided with a vertically oriented limiting sliding groove on one side corresponding to the upper stopper, and one side of the upper stopper close to the test fixture is in contact with the bottom of the limiting sliding groove.

7. The vibration test fixture according to any one of claims 1 to 6, characterized in that: The test fixture comprises a T-shaped fixture bottom plate and a fixture support plate; The first bottom plate of the fixture bottom plate located on the side of the fixture support plate close to the other test fixture is provided with the clamping slide groove; The second bottom plate of the fixture bottom plate located on the side of the fixture support plate away from the other test fixture has a side block with an L-shaped angle, one side of the side block forming the L-shaped angle is fixedly connected to the second bottom plate and the other side is fixedly connected to the corresponding fixture support plate.

8. The vibration test fixture according to claim 7, characterized in that: It also includes a first adjusting screw, the second bottom plate is provided with a first strip-shaped adjusting through hole, the first adjusting screw passes through the first adjusting through hole and is threadedly connected to the test bottom plate; The length of the first adjusting through hole is greater than the diameter of the screw rod of the first adjusting screw, and the width of the first adjusting through hole is greater than the diameter of the screw rod of the first adjusting screw and smaller than the diameter of the nut of the first adjusting screw.

9. The vibration test fixture according to claim 7, characterized in that: It also includes a second adjusting screw, the clamp support plate is provided with a strip-shaped second adjusting through hole, the second adjusting screw passes through the second adjusting through hole and is threadedly connected to the upper clamp plate; The length of the second adjusting through hole is greater than the diameter of the screw rod of the second adjusting screw, and the width of the second adjusting through hole is greater than the diameter of the screw rod of the second adjusting screw and smaller than the diameter of the nut of the second adjusting screw.

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