Signal Path Calibration of Hardware Settings in Test and Measurement Instruments

Abstract

The present disclosure is directed to systems and methods related to test and measurement systems, and more particularly to signal path calibration in test and measurement instruments. A test and measurement instrument includes: a user interface configured to receive instructions for performing signal path calibration for user-specific settings received from a user; a memory configured to store signal path calibration data; and one or more processors that can determine an actual signal path hardware setting for the user-specific setting, determine an adjustment to adjust the actual signal path hardware setting to the user-specific setting, adjust the actual signal path hardware setting by the adjustment to accurately represent the user-specific setting, and store the user-specific setting and the adjusted signal path hardware setting in the signal path calibration data.

Description

[0001] Priority

[0002] This disclosure claims the benefit of U.S. Provisional Application No. 62 / 892,812, filed on August 28, 2019, entitled "POINT SIGNAL PATH CALIBRATION IN A TEST AND MEASUREMENT INSTRUMENT", which is hereby incorporated by reference in its entirety. Technical Field

[0003] This disclosure is directed to systems and methods related to test and measurement systems, and more particularly to signal path calibration in test and measurement instruments. Background Art

[0004] Signal path calibration (SPC) in test and measurement instruments is the process of characterizing how the hardware settings of a test and measurement instrument affect channel characteristics. Conventional signal path calibration in test and measurement instruments involves calibrating each channel using a predetermined set of hardware or register settings. The test and measurement instrument will measure signal path characteristics for each predetermined hardware or register setting to characterize the channel at those settings. These settings and the characterization of the channel at those settings can be stored in the memory of the test and measurement instrument. However, the predetermined set of settings does not characterize every available combination of specific hardware settings. When a user selects a specific setting, the test and measurement instrument interpolates or extrapolates from the stored settings and characterizations to determine which settings to use to achieve the requested user setting.

[0005] Since the user will rarely select a setting that exactly corresponds to the hardware settings that have been directly characterized or calibrated, interpolation can introduce some measurement error. Further, in conventional test and measurement instruments, signal path calibration can take an extended period of time, such as 30 minutes or more. Generally, as the input bandwidth of the test and measurement instrument increases, a greater amount of time is required to perform signal path calibration of the instrument. If the temperature of the device under test and / or the test and measurement instrument changes, or if the test and measurement instrument has not been calibrated for some period of time, the user may not want to wait 30 minutes or more to run calibration again, resulting in more errors in the measurements.

[0006] Embodiments of the present disclosure address these and other deficiencies of the prior art. Brief Description of the Drawings

[0007] Aspects, features, and advantages of embodiments of the present disclosure will become apparent from the following description of embodiments with reference to the accompanying drawings, in which:

[0008] Figure 1 is a block diagram of a test and measurement instrument according to an embodiment of the present disclosure;

[0009] Figure 2 is a flowchart illustrating an example operation for calibrating a signal path based on user-specified settings according to an embodiment of the present disclosure;

[0010] Figure 3 is a flowchart illustrating an example operation for alerting a user in the event of a temperature change in a test and measurement instrument according to an embodiment of the present disclosure;

[0011] Figure 4 is a flowchart illustrating an example operation for alerting a user when a temperature change in a test and measurement instrument results in an expected error greater than a threshold according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0012] Embodiments of the present disclosure allow a user to perform signal path calibration for a single specific setting selected by the user or a small set of specific settings selected by the user. This can allow for a significant improvement in channel gain and offset accuracy at the specific settings selected and used by the user. Further, calibration performed according to embodiments of the present disclosure can run much faster than conventional signal path calibration - such as in a few seconds as compared to 30 minutes or more for conventional SPC - so that the user can be able and want to perform calibration more often. This ability is particularly beneficial in situations where the device under test has a rapidly changing temperature, especially in a test environment (such as a temperature cycling chamber) where the test and measurement instrument experiences ambient temperature changes along with the device under test, because temperature can affect the performance of the hardware in the test and measurement instrument.

[0013] Conventional signal path calibration involves characterizing how hardware settings (such as gain and offset registers) affect channel characteristics, which include, for example, the measured gain and offset of a channel. As described above, during conventional signal path calibration, the channel is characterized under a pre-determined set of register settings. The pre-determined set of register settings is pre-determined by the instrument manufacturer and cannot be changed by the user. Then, in normal operation, when the user selects a specific setting, the test and measurement instrument can interpolate or extrapolate from the characterized settings to determine the settings to achieve the requested user setting. However, interpolation and extrapolation can introduce errors. Further, if the temperature of the test and measurement instrument changes completely, the signal path calibration may be inaccurate. As discussed in more detail below, embodiments of the present disclosure allow signal path calibration to be performed at a single setting or a small set of specific settings. Performing signal path calibration at a single setting or a small set of specific settings may be referred to as "point SPC" in the present disclosure.

[0014] Figure 1is a block diagram of an example test and measurement instrument 100, such as an oscilloscope, for implementing the embodiments disclosed herein. The test and measurement instrument 100 includes one or more ports 102, which may also be referred to as signal paths, and which may be any electrical signal medium. The port 102 may include a plurality of hardware components, such as, but not limited to, receivers, transmitters, gain and offset registers, conditioning circuits, analog-to-digital converters, and / or other circuitry for converting the received signal into a waveform for further analysis. Each port 102 is a channel of the test and measurement instrument 100. The port 102 is coupled to one or more processors 116 to process signals and / or waveforms received at the port 102 from one or more devices under test. Although, for ease of illustration, only one processor 116 is shown in Figure 1 , as would be understood by those skilled in the art, multiple processors 116 of different types may be used in combination, rather than a single processor 116. The test and measurement instrument 100 may also include a temperature sensor 104, such as a thermometer, thermistor, thermocouple, etc., for determining the internal temperature of the test and measurement device 100. In some embodiments, the test and measurement instrument 100 may include multiple temperature sensors 104. Generally, one or more temperature sensors 104 are physically located close to the hardware components in the signal path that are most affected by temperature changes.

[0015] The port 102 may also be connected to a measurement unit in the test instrument 100, which is not shown for ease of illustration. Such a measurement unit may include any components capable of measuring aspects of the signal received via the port 102 (e.g., voltage, amperage, amplitude, etc.). The resulting waveform may then be stored in the memory 110 and displayed on the display 112. The port 102 may also be selectively connected to a reference signal source 118. The reference signal source 118 may be, for example, a signal generator that provides a calibration voltage reference signal. The reference signal 118 may be applied to the port and used to characterize the channel characteristics during signal path calibration.

[0016] One or more processors 116 may be configured to execute instructions from the memory 110 and may perform any method and / or associated steps indicated by such instructions, such as calibrating the port 102. The memory 110 may be implemented as a processor cache, random access memory (RAM), read-only memory (ROM), solid state memory, (one or more) hard disk drives, or any other memory type. The memory 110 serves as a medium for storing data, computer program products, and other instructions.

[0017] The user input 114 is coupled to the one or more processors 116. The user input 114 can include a keyboard, a mouse, a trackball, a touch screen, and / or any other controls that a user can use to interact with the GUI on the display 112. The display 112 can be a digital screen, a cathode ray tube-based display, or any other monitor that displays waveforms, measurements, and other data to the user. Although the components of the test instrument 100 are depicted as being integrated within the test and measurement instrument 100, those of ordinary skill in the art should understand that any of these components can be external to the test instrument 100 and can be coupled to the test instrument 100 in any conventional manner (e.g., wired and / or wireless communication media and / or mechanisms). For example, in some embodiments, the display 112 can be remote from the test and measurement instrument 100.

[0018] Figure 2 An example operation of the test and measurement instrument 100 is illustrated. In operation 200, the user sets the test and measurement instrument to a particular setting via the user input 114. The setting can be, for example, the vertical scale and offset. In operation 202, using the user input 114, the user can select to perform signal path calibration (SPC) for that particular setting. This can be labeled, for example, as "Spot SPC" on the display 112 of the test and measurement instrument 100 because the user is selecting a single point or setting to perform SPC. In some embodiments, the user can select a small set of settings rather than a single point.

[0019] In some embodiments, the user can use multiple different settings to test a device. Instead of performing spot SPC for each setting individually, the user can select a small group of settings via the user input 114 to perform spot SPC. The settings can be multiple different settings selected by the user, or the settings can include a range of settings selected by the user. In some embodiments, the user can input an acceptable calibration time via the user input 114. The user-acceptable calibration time (e.g., 10 seconds, 30 seconds, 1 minute, etc.) is longer than the time required for spot SPC for the user-specified settings (e.g., within a few seconds) and can be shorter than the time required for a conventional or full SPC (e.g., 30 minutes or more). The processor 116 can then modify the user-specified setting(s) to include additional settings and thereby perform spot SPC for the group of modified settings. The processor 116 can determine the number of additional settings based on the acceptable calibration time and the user-specific settings. These additional settings can be within the range selected by the user or, alternatively, near the user-selected setting(s).

[0020] Determining the hardware settings for user-specified settings can include determining a specific gain for the requested vertical scale, or can include determining both the gain and the offset. In some embodiments, if only the vertical scale is calibrated, the offset control can be characterized separately from the gain setting of the vertical scale. This can allow the application of point SPC to the vertical scale, regardless of the offset set by the user. For example, if the vertical scale is set to 50 mV / div (division), the hardware settings can be characterized for that specific gain, and how the gain and offset interact, and this will apply any time 50 mV / div is used, regardless of the offset setting.

[0021] In other embodiments, point SPC can be performed for the exact gain and offset settings. This can be more restrictive for the user, as it requires the test and measurement instrument to be set to a specific vertical scale and offset, such as 50 mV / div and an offset of 500 mV for which the point SPC settings apply. If the user sets the test and measurement instrument to 50 mV / div and a different offset, such as an offset of 100 mV, the point SPC settings will not apply, and interpolation hardware settings based on conventional SPC will be used, or a new point SPC will need to be performed at that new offset.

[0022] To determine the hardware settings for user-specific settings in operation 204, the processor 116 can first characterize the current hardware settings. The processor 116 can characterize the current hardware settings by using the reference signal 118. For example, if the user has selected a vertical scale of 50 mV / div and point SPC is selected via user input 114, the processor 116 can apply the calibrated voltage reference signal 118 to the characterized port 102 and determine that the current hardware settings result in an actual gain of 50.5 mV / div.

[0023] The processor 116 can then determine what adjustment or actual setting of the gain register is needed to achieve the gain set by the user. In some embodiments, the processor 116 can have information stored in the memory 110 about the slope of the hardware gain control, which can be determined from the conventional SPC performed. Based on this known slope, the processor 116 can adjust the gain by an amount determined by the slope of the hardware gain control. In operation 206, the exact hardware settings can then be stored in the calibration table.

[0024] In other embodiments, alternatively, the processor 116 may adjust the amount of gain determined based on the slope of a hardware gain control and then re-measure the characteristics of the hardware settings to confirm that the actual user-specified settings have been achieved. If not, the processor 116 may continue to iterate until the desired accuracy is achieved. Alternatively, instead of using a known value such as the slope of a hardware gain control, the processor 116 may estimate how much to adjust the gain based on how far the hardware settings currently deviate. The processor 116 may then continue to iterate until the desired accuracy is achieved.

[0025] The same type of operation may also be used to characterize the offset. That is, the current hardware settings may be characterized and the offset may be adjusted by using a known hardware offset control slope or by estimating the amount of adjustment. The processor 116 may then iteratively measure and adjust the hardware settings until the channel is set with the desired accuracy. Although the above discussion uses examples of characterizing vertical gain and / or offset, embodiments of the present disclosure are not limited to characterizing only the channel characteristics for gain and offset settings. Instead, embodiments of the present disclosure include using point SPC to characterize any of a variety of channel characteristics, such as timing alignment, interleaving alignment, distortion correction, frequency response correction, and many other characteristics.

[0026] Once the adjustments and hardware settings are determined, in operation 206, the hardware settings and / or adjustments may be stored in the memory 110. The memory 110 may store a signal path calibration table. The processor 116 may instruct the memory 110 to store the specific hardware settings for the user-specified settings in the signal path calibration table. Thus, if the user selects that setting again for making a measurement, the processor 116 may directly extract the hardware settings and / or adjustments from the signal path calibration table in the memory 116. In some embodiments, the processor 116 may instruct the display 112 to indicate that the point SPC value is stored in the memory and is being used for that setting to alert the user of the enhanced accuracy of that setting. In some embodiments, the processor 116 may store the specific hardware settings in the memory 110. In other embodiments, the memory 110 may store the adjustment values for the hardware settings. In other embodiments, the memory 110 may store adjustment factors for the hardware settings, such as scale factors. Some embodiments may store a combination of specific hardware settings, adjustment values, and adjustment factors in the memory 110, and in the present disclosure, each combination may be referred to as an "adjusted signal path hardware setting".

[0027] In some embodiments, the processor 116 may instruct the display 112 to display the calibration table memory. This may allow the user to see which specific settings have been calibrated and which settings were determined by interpolation or extrapolation. The user may also be able to select one or more specific settings in the calibration table memory via the user input 114 and instruct the processor 116 to perform point SPC for the selected settings. If the data is no longer needed, the user may also delete the settings from the calibration table stored in the memory 110.

[0028] In some embodiments, when performing point SPC, the processor 116 may log the temperature of the test and measurement instrument, as shown by optional operation 208 in Figure 2 Then, the hardware settings stored in the memory may flag or store the temperature at which the test and measurement instrument 100 was at during calibration of the signal path at that setting. That is, point SPC may be performed for a given setting at a specific temperature. In such an embodiment, point SPC is applied only when at a given setting and temperature plus or minus the threshold of the setting.

[0029] In some embodiments, when the user performs point SPC for a given setting, the test and measurement instrument 100 may automatically and periodically repeat point SPC via the processor 116 whenever that setting is selected or whenever the test and measurement temperature increases or decreases beyond a threshold. For example, if the internal temperature sensor on the test and measurement instrument 100 indicates that the temperature has changed by 10 degrees, the test and measurement instrument 100 may automatically perform point SPC again. However, embodiments of the present disclosure are not limited to a 10-degree threshold, and any threshold may be set. The threshold may be predetermined and stored in the memory 110, or the threshold may be set by the user via the user input 114.

[0030] Figure 3 Illustrated are example operations for alerting the user that the temperature in the test and measurement instrument 100 has changed since the last point SPC was performed. In operation 300, the temperature of the test and measurement instrument 100 is received from the temperature sensor 104. In operation 302, the processor 116 determines the temperature flagged or saved in the case of the point SPC settings in the memory 110.

[0031] In operation 304, the processor 116 determines whether the temperature change has exceeded a predetermined threshold for a given point SPC setting. That is, the processor 116 determines whether the temperature has increased or decreased beyond the threshold. In other words, the processor 116 determines whether the change in temperature is greater than the threshold. If so, in operation 306, the processor 116 may display an alert to the user on the display 112 to notify the user. If not, the processor 116 returns to operation 300 to monitor the temperature.

[0032] Although not shown in Figure 3 , in some embodiments, if the temperature change has exceeded a threshold, the processor 116 can automatically repeat the point SPC as mentioned above. This can, for example, alert the user in operation 306, or this can be performed in the context of the test and measurement instrument 100. In some embodiments, the user can determine whether to automatically repeat the point SPC if a temperature change occurs, or whether to only receive an alert.

[0033] Figure 4 An alternative example operation for alerting the user and / or automatically repeating the point SPC based on the measured temperature is illustrated. In Figure 4 , operations 400 and 402 are similar to Figure 3 operations 300 and 302 and will not be discussed further. In operation 403, the processor 116 calculates the expected error that will be caused by a change in temperature. The processor 116 can calculate the expected error caused by a change in temperature, such as a gain error, by using the known temperature performance data and characteristics of the components in the signal path. Then, in operation 404, the processor 116 determines whether the expected error is greater than a threshold. In some embodiments, the threshold can be user-configurable. If not, the processor 116 returns to operation 400. If so, in operation 406, the processor can display an alert to the user and / or optionally automatically repeat the point SPC as discussed above for operation 306. Thus, in Figure 4 embodiments, alerting the user and / or automatically repeating the point SPC is based on the expected error in the measured signal caused by a temperature change, rather than just based on the set temperature change threshold.

[0034] Aspects of the present disclosure may operate on specially created hardware, firmware, a digital signal processor, or on a specially programmed computer including a processor operating according to programming instructions. The term controller or processor as used herein is intended to include a microprocessor, a microcomputer, an application specific integrated circuit (ASIC), and a dedicated hardware controller. One or more aspects of the present disclosure may be embodied in computer-usable data and computer-executable instructions, such as embodied in one or more program modules executed by one or more computers (including a monitoring module) or other devices. Generally, program modules include routines, programs, objects, components, data structures, etc., which perform particular tasks or implement particular abstract data types when executed by a processor in a computer or other device. The computer-executable instructions may be stored on a computer-readable storage medium such as a hard disk, an optical disk, a removable storage medium, a solid state memory, a random access memory (RAM), etc. As will be appreciated by those skilled in the art, the functions of the program modules may be combined or distributed as desired in various aspects. Additionally, the functions may be embodied in whole or in part in firmware or hardware equivalents such as integrated circuits, FPGAs, etc. Particular data structures may be used to more effectively implement one or more aspects of the present disclosure, and such data structures are contemplated within the scope of the computer-executable instructions and computer-usable data described herein.

[0035] In some cases, the disclosed aspects may be implemented in hardware, firmware, software, or any combination thereof. The disclosed aspects may also be implemented as instructions carried or stored on one or more computer-readable storage media, which may be read and executed by one or more processors. Such instructions may be referred to as a computer program product. As discussed herein, a computer-readable medium refers to any medium that can be accessed by a computing device. By way of example and not limitation, a computer-readable medium may include computer storage media and communication media.

[0036] Computer storage media refers to any medium that can be used to store computer-readable information. By way of example and not limitation, computer storage media may include RAM, ROM, electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disk read-only memory (CD-ROM), digital video disk (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, and any other volatile or non-volatile, removable or non-removable media implemented in any technology. Computer storage media does not include signals per se and transient forms of signal transmission.

[0037] A communication medium refers to any medium that can be used for communication of computer-readable information. By way of example, and not limitation, a communication medium can include coaxial cables, fiber optic cables, air, or any other medium suitable for communication of electrical, optical, radio frequency (RF), infrared, acoustic, or other types of signals.

[0038] Example

[0039] Illustrative examples of the techniques disclosed herein are provided below. Embodiments of the techniques can include any one or more of the examples described below and any combination thereof.

[0040] Example 1, a test and measurement instrument, includes a user interface configured to receive instructions to perform signal path calibration for user-specific settings received from a user; a memory configured to store signal path calibration data; and one or more processors configured to determine an actual signal path hardware setting for the user-specific settings, determine an adjustment to adjust the actual signal path hardware setting to accurately represent the user-specific settings, adjust the actual signal path hardware setting by the adjustment, and store the user-specific settings and the adjusted signal path hardware setting in the signal path calibration data.

[0041] Example 2 is the test and measurement instrument of Example 1, wherein the actual signal path hardware setting includes a gain register, and the adjustment includes a gain adjustment for the gain register.

[0042] Example 3 is the test and measurement instrument of any one of Examples 1 or 2, wherein the actual signal path hardware setting includes an offset register, and the adjustment includes an offset adjustment for the offset register.

[0043] Example 4 is the test and measurement instrument of any one of Examples 1-3, further including a temperature sensor configured to determine the temperature of the test and measurement instrument, wherein the one or more processors are further configured to store the temperature when storing the user-specific settings and the adjusted signal path hardware setting in the signal path calibration data.

[0044] Example 5 is the test and measurement instrument of Example 4, wherein the temperature is a first temperature, and after storing the user-specific settings and the adjusted signal path hardware setting in the signal path calibration data, the one or more processors are further configured to: determine a second temperature of the test and measurement instrument, determine whether a difference between the first temperature and the second temperature is greater than a threshold, and display a reminder on a display when the difference between the first temperature and the second temperature is greater than the threshold.

[0045] Example 6 is a test and measurement of Example 4, where the temperature is a first temperature, and after storing the user-specific settings and the adjusted signal path hardware settings in the signal path calibration data, one or more processors are further configured to: determine a second temperature of the test and measurement instrument, determine whether a difference between the first temperature and the second temperature is greater than a threshold, and if the difference is greater than the threshold, then: determine the current hardware settings, if the current hardware settings no longer correspond to the user-specific settings with a predetermined accuracy, determine a second adjustment to the current hardware settings, adjust the current hardware settings by the second adjustment to accurately represent the user-specific settings, and store the user-specific settings, the newly adjusted signal path hardware settings, and the second temperature in the signal path calibration data.

[0046] Example 7 is a test and measurement instrument of any one of Examples 1-6, where the signal path calibration data includes a table stored in a memory, and the table includes each setting that has been calibrated.

[0047] Example 8 is a test and measurement instrument of Example 7, where a user can select a setting in the table to update the signal path calibration.

[0048] Example 9 is a test and measurement instrument of any one of Examples 1-8, where the user-specific settings include more than one setting.

[0049] Example 10 is a test and measurement instrument of any one of Examples 1-9, where the user-specific settings include a range of settings.

[0050] Example 11 is a method for performing signal path calibration for user-specified settings, including receiving user-specified settings at a user input; determining an actual signal path hardware setting for the user-specific settings; determining an adjustment for setting the actual signal path hardware setting to the user-specific settings; adjusting the actual signal path hardware setting by the adjustment to accurately achieve the user-specific settings; and storing the user-specific settings and the adjusted signal path hardware settings in the signal path calibration data in a memory.

[0051] Example 12 is the method of Example 11, where the actual signal path hardware setting includes a gain register, and the adjustment includes a gain adjustment for the gain register.

[0052] Example 13 is the method of any one of Examples 10 or 11, where the actual signal path hardware setting includes an offset register, and the adjustment includes an offset adjustment for the offset register.

[0053] Example 14 is the method of any one of Examples 11 - 13, further comprising measuring the temperature of the test and the measuring instrument, and storing the temperature when the user - specific settings and the adjusted signal - path hardware settings are stored in the signal - path calibration data.

[0054] Example 15 is the method of any one of Examples 11 - 14, wherein the signal - path calibration data includes a table stored in a memory, and the table includes each setting that has been calibrated.

[0055] Example 16 is the method of any one of Examples 11 - 15, wherein the user - specific settings include more than one setting.

[0056] Example 17 is the method of any one of Examples 11 - 16, wherein the user - specific settings include a range of settings.

[0057] Example 18 is one or more non - transitory computer - readable storage media including instructions that, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to determine an actual signal - path hardware setting of a signal path for a user - specific setting; determine an adjustment to set the actual signal - path hardware setting to the user - specific setting; and adjust the actual signal - path hardware setting by the adjustment to precisely represent the user - specific setting.

[0058] Example 19 is the one or more non - transitory computer - readable storage media of Example 18, further including instructions that cause the test and measurement instrument to determine whether the adjusted signal - path hardware setting precisely represents the user - specific setting, and when the adjusted signal - path hardware setting does not precisely represent the user - specific setting, adjust the adjusted signal - path hardware setting by another adjustment to precisely represent the user - specific setting.

[0059] Example 20 is the one or more non - transitory computer - readable storage media of any one of Examples 18 or 19, further including instructions that cause the test and measurement instrument to store the user - specific setting and the adjusted signal - path hardware setting in signal - path calibration data in a memory.

[0060] The previously described versions of the disclosed subject matter have many advantages, which have either been described or are obvious to one of ordinary skill in the art. Even so, these advantages or features are not required in all versions of the disclosed apparatus, system, or method.

[0061] In addition, the written description refers to specific features. It should be understood that the disclosure in this specification includes all possible combinations of these specific features. Where a specific feature is disclosed in the context of a particular aspect or example, that feature can also be used, to the extent possible, in the context of other aspects and examples.

[0062] In addition, when a method having two or more defined steps or operations is referred to in this application, the defined steps or operations can be performed in any order or simultaneously, unless the context excludes those possibilities.

[0063] While specific examples of the invention have been illustrated and described for purposes of explanation, it should be understood that various modifications can be made without departing from the spirit and scope of the invention. Accordingly, the invention should not be limited except as by the appended claims.

Claims

1. A test and measurement instrument, comprising: A user interface, configured to receive an instruction to perform signal path calibration for a single setting or a small specific set of settings received from a user; A memory, configured to store signal path calibration data; and One or more processors, configured to: Determine an actual signal path hardware setting for the single setting or the small specific set of settings, Determine an adjustment to adjust the actual signal path hardware setting to precisely represent the single setting or the small specific set of settings, Adjust the actual signal path hardware setting by the adjustment, and Store the single setting or the small specific set of settings and the adjusted signal path hardware setting in the signal path calibration data.

2. The test and measurement instrument according to claim 1, wherein the actual signal path hardware settings include a gain register, and the adjustment includes a gain adjustment for the gain register.

3. The test and measurement instrument according to claim 1, wherein the actual signal path hardware settings include an offset register, and the adjustment includes an offset adjustment for the offset register.

4. The test and measurement instrument according to claim 1, further comprising a temperature sensor for determining the temperature of the test and measurement instrument, wherein the one or more processors are further configured to store the temperature when the single setting or small set of specific settings and the adjusted signal path hardware settings are stored in the signal path calibration data.

5. The test and measurement instrument according to claim 4, wherein the temperature is a first temperature, and after storing the single setting or small set of specific settings and the adjusted signal path hardware settings in the signal path calibration data, the one or more processors are further configured to: Determine a second temperature of the test and measurement instrument, Determine whether the difference between the first temperature and the second temperature is greater than a threshold, and When the difference between the first temperature and the second temperature is greater than the threshold, display a reminder on a display.

6. The test and measurement instrument according to claim 4, wherein the temperature is a first temperature, and after storing the single setting or small set of specific settings and the adjusted signal path hardware settings in the signal path calibration data, the one or more processors are further configured to: Determine a second temperature of the test and measurement instrument, Determine whether the difference between the first temperature and the second temperature is greater than a threshold, and If the difference is greater than the threshold: Then determine the current hardware settings, If the current hardware settings no longer correspond to a single setting or a small set of specific settings with a predetermined precision, determine a second adjustment to the current hardware settings, Adjust the current hardware settings by the second adjustment to precisely represent a single setting or a small set of specific settings, and Store the single setting or small set of specific settings, the newly adjusted signal path hardware settings, and the second temperature in the signal path calibration data.

7. The test and measurement instrument according to claim 1, wherein the signal path calibration data includes a table stored in a memory, the table including each setting that has been calibrated.

8. The test and measurement instrument according to claim 7, wherein a user selects a setting in the table to update the signal path calibration.

9. The test and measurement instrument according to claim 1, wherein the single setting or small set of specific settings includes more than one setting.

10. The test and measurement instrument according to claim 1, wherein the single setting or small set of specific settings includes a range of settings.

11. A method for performing signal path calibration for user-specified settings, comprising: Receive a user-specified setting at a user input; Determine an actual signal path hardware setting for a single setting or a small specific set of settings; Determine an adjustment to set the actual signal path hardware setting to a single setting or a small specific set of settings; Adjust the actual signal path hardware setting by the adjustment to precisely achieve a single setting or a small specific set of settings; and Store the single setting or the small specific set of settings and the adjusted signal path hardware setting in the signal path calibration data in the memory.

12. The method according to claim 11, wherein the actual signal path hardware settings include a gain register, and the adjustment includes a gain adjustment for the gain register.

13. The method according to claim 11, wherein the actual signal path hardware settings include an offset register, and the adjustment includes an offset adjustment for the offset register.

14. The method according to claim 11, further comprising measuring the temperature of the test and measurement instrument and storing the temperature when storing the single setting or small set of specific settings and the adjusted signal path hardware settings in the signal path calibration data.

15. The method according to claim 11, wherein the signal path calibration data includes a table stored in a memory, the table including each setting that has been calibrated.

16. The method according to claim 11, wherein the single setting or small set of specific settings includes more than one setting.

17. The method according to claim 11, wherein the single setting or small set of specific settings includes a range of settings.

18. One or more non - transitory computer - readable storage media, comprising instructions that, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to: Determine an actual signal path hardware setting of a signal path for a single setting or small set of specific settings; Determine an adjustment for setting the actual signal path hardware setting to the single setting or small set of specific settings; Adjust the actual signal path hardware setting by the adjustment to precisely represent the single setting or small set of specific settings.

19. The one or more non - transitory computer - readable storage media according to claim 18, further comprising instructions to cause the test and measurement instrument to determine whether the adjusted signal path hardware setting precisely represents the single setting or small set of specific settings, and when the adjusted signal path hardware setting does not precisely represent the single setting or small set of specific settings, adjust the adjusted signal path hardware setting by another adjustment to precisely represent the single setting or small set of specific settings.

20. The one or more non - transitory computer - readable storage media according to claim 18, further comprising instructions to cause the test and measurement instrument to store the single setting or small set of specific settings and the adjusted signal path hardware setting in signal path calibration data in a memory.

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