Parallelism detection jig and parallelism adjustment method

Abstract

The present invention relates to a parallelism detection jig and a parallelism adjustment method, the jig is used to detect whether a first surface and a second surface that are spaced apart are parallel, and comprises: a base that can be placed on the first surface; two light emitters that are spaced apart on the base and can simultaneously emit light beams to the second surface, wherein the light beams will be reflected by the second surface and finally projected onto the base; through the positional relationship between the two light emitters and the positional relationship between the projection positions of the two light beams on the base, it can be determined whether the first surface is parallel to the second surface. The jig can directly detect whether the first surface and the second surface are parallel, and further detect whether the parallelism between the first surface and the second surface meets the requirements, that is, through the jig, it is possible to directly detect whether the levelness between the resolution board and the camera module meets the requirements, thereby improving the detection accuracy and further improving the levelness between the resolution board and the camera module.

Description

Technical Field

[0001] The present invention relates to the technical field of camera modules, and in particular to a parallelism detection jig and a parallelism adjustment method. Background Art

[0002] like Figure 1 As shown, in the test of the camera module 200, the resolution detection of the camera module 200 is one of the must-test items. Among them, when detecting the resolution of the camera module 200, it is necessary to shoot the test surface 301 of the resolution board 300. The test surface 301 is the surface of the resolution board 300 with a Chart diagram, and the parallelism between the resolution board 300 and the camera module 200 has a great influence on the test effect. If the parallelism is too poor, it may directly lead to incomplete shooting of the content of the resolution test surface 301. If the parallelism between the test surface 301 of the resolution board 300 and the light incident surface 201 of the camera module 200 is too poor, it may directly lead to incomplete shooting of the content of the resolution test surface 301.

[0003] In order to adjust the parallelism between the test surface 301 and the light incident surface 201, it is usually necessary to first fix the camera module 200 with the help of a fixing device 400, and then measure the horizontality of the test surface 301 and the horizontality of the light incident surface 201 respectively through an angle level 500, and adjust the horizontality of the test surface 301 and the horizontality of the light incident surface 201 respectively according to the measurement results, so that the horizontality of the test surface 301 and the horizontality of the light incident surface 201 meet the requirements.

[0004] Among them, Figure 1 As shown, the fixture 400 is usually located above the resolution board 300, and the fixture 400 includes a lower surface 401 and an upper surface 402 that are arranged opposite to each other, wherein the lower surface 401 is opposite to the test surface of the resolution board 300. A concave structure 403 is provided on the lower surface 401, and the camera module 200 is installed on the bottom surface 404 of the concave structure 403, so that the light incident surface 201 and the test surface 301 are spaced and opposite to each other. Since the angle level 500 cannot be placed on the light incident surface 201, the angle level 500 is usually placed on the upper surface 402, and it is assumed that the upper surface 402 is parallel to the light incident surface 201, that is, it is assumed that the parallelism between the upper surface 402 and the test surface 301 is equal to the parallelism between the light incident surface 201 and the test surface 301.

[0005] However, in actual situations, it is difficult to make the light incident surface 201 and the upper surface 402 truly parallel, that is, it is difficult to make the parallelism between the light incident surface 201 and the upper surface 402 not equal to 0. Therefore, the above-mentioned adjustment method of the parallelism between the test surface 301 and the light incident surface 201 will cause the actual parallelism between the test surface 301 and the light incident surface 201 to deviate from the required parallelism, thereby affecting the detection effect of the resolution of the camera module 200. Summary of the invention

[0006] Based on this, it is necessary to provide a parallelism detection fixture and a parallelism adjustment method to address the problem of inaccurate adjustment of the existing method of adjusting the parallelism of the test surface of the resolution board and the incident surface of the camera module.

[0007] A parallelism detection jig is used to detect the parallelism between a first surface and a second surface that are spaced apart from each other, comprising: a base for being placed on the first surface; two light emitters that are spaced apart on the base and can simultaneously emit light beams to the second surface, wherein the light beams will be reflected by the second surface and finally projected onto the base.

[0008] When using this jig to detect the parallelism between the camera module and the resolution board, the jig is placed on the test surface of the resolution board, and the camera module is fixed on the fixture so that the light incident surface of the camera module is opposite to the test surface of the resolution board, wherein the light incident surface of the camera module is the second surface, and the test surface of the resolution board is the first surface. Then the two light emitters on the jig are started to emit light beams to the light incident surface of the camera module so that the light beams can be reflected onto the base of the jig. Through the positional relationship between the two light emitters and the positional relationship between the projection positions of the two light beams on the base, it is determined whether the parallelism between the test surface of the resolution board and the light incident surface of the camera module meets the requirements. If not, the fixture and / or the resolution board are adjusted so that the positional relationship between the two emitters and the positional relationship between the projections of the two light beams on the base meet the predetermined requirements, thereby making the parallelism between the light incident surface of the camera module and the test surface of the resolution board meet the requirements. That is, the fixture provided by the present invention can directly detect whether the levelness between the test surface of the resolution board and the light incident surface of the camera module meets the requirements, so as to improve the levelness between the test surface of the resolution board and the light incident surface of the camera module.

[0009] Furthermore, at least one of the two light emitters can be rotated relative to the base to tilt toward the base, thereby adjusting the positional relationship between the light beams emitted by the two light emitters, so that the light beams emitted by the two light emitters can be projected onto the second surface at the same time, thereby improving the applicability of the fixture.

[0010] Furthermore, the axis around which the light emitter rotates relative to the base is parallel to the arrangement direction of the two light emitters, which makes it convenient to subsequently determine whether the parallelism between the first surface and the second surface meets the requirements. At the same time, through this setting, the present fixture can be used even when the area of ​​the second surface is small.

[0011] Furthermore, the fixture also includes a bracket for connecting the base and the light emitter; the bracket includes a supporting portion and a connecting portion, the supporting portion is arranged on the base, and the light emitter is installed on the connecting portion, wherein the connecting portion is rotatably installed on the supporting portion, and the connecting portion can be fixed relative to the supporting portion after being rotated to a predetermined position relative to the supporting portion.

[0012] Furthermore, the base includes: a first part, having a first bearing surface and a mounting surface arranged in parallel, and the two light emitters are both arranged on the mounting surface; a second part, connected to the first part, and the second part has a second bearing surface and a detection surface arranged in parallel; the second bearing surface is flush with the first bearing surface, and the second bearing surface and the first bearing surface are used to abut against the first surface, and the light emitted by the light emitter is finally projected on the detection surface after being reflected by the second surface; wherein, in the direction from the first bearing surface to the mounting surface, the height of the detection surface is greater than the height of the mounting surface. In this way, only a shorter detection surface is needed to project the light beams of the two light emitters on the detection surface, which is conducive to the miniaturization design of the fixture and reduces the material cost of the fixture.

[0013] Furthermore, the arrangement direction of the first part and the second part is consistent with the arrangement direction of the two light emitters; and / or the height of the detection surface is the same as the light source height of the light emitter, which can facilitate the subsequent judgment of whether the first surface and the second surface are parallel.

[0014] Furthermore, the area on the base used for projecting the light beams is provided with a mark to facilitate detection of the positional relationship between the two light beams on the detection surface, so as to facilitate judgment of whether the first surface and the second surface are parallel.

[0015] Furthermore, the markings are scale lines, and the arrangement direction of the scale lines is consistent with the arrangement direction of the two light emitters, so that the distance between the projection positions of the two light beams on the base can be judged more intuitively.

[0016] Furthermore, the light emitter is a line laser, which is more conducive to the user to judge the relationship between the projection positions of the two light beams on the base.

[0017] A parallelism adjustment method, using a jig as described in any one of the above items to adjust the parallelism between a first surface and a second surface that are spaced relative to each other, comprising: fixing the jig on the first surface; using two light emitters of the jig to simultaneously emit light beams to the second surface so that the light beams can be reflected onto the base of the jig; adjusting the first surface and / or the second surface so that the positional relationship between the two emitters and the positional relationship between the projections of the two light beams on the base meet a predetermined position condition, thereby making the parallelism between the first surface and the second surface meet a predetermined parallelism condition. This jig can directly determine whether the parallelism between the two surfaces meets the requirements, and can improve the accuracy of the flatness adjustment between the first surface and the second surface.

[0018] Furthermore, in the step of emitting light beams to the second surface using the two light emitters of the fixture, the light emitters are adjusted so that the light beams emitted by the two light emitters are projected onto the same position of the second surface. This is more conducive to the subsequent judgment of whether the parallelism between the first surface and the second surface meets the requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic diagram of measuring the parallelism between a camera module and a resolution plate in an existing manner;

[0020] Figure 2 A schematic diagram of measuring the parallelism between a camera module and a resolution plate provided by an embodiment of the present invention;

[0021] Figure 3 A top view of a fixture provided in one embodiment of the present invention;

[0022] Figure 4 A top view of a fixture provided in another embodiment of the present invention;

[0023] Figure 5 A partial cross-sectional schematic diagram of the cooperation between a bracket of a fixture and a light emitter provided in one embodiment of the present invention;

[0024] Figure 6 A partial cross-sectional schematic diagram from another perspective of the cooperation between the bracket of the fixture and the light emitter provided in one embodiment of the present invention. DETAILED DESCRIPTION

[0025] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present invention, so the present invention is not limited by the specific implementation disclosed below.

[0026] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be an intermediate element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element at the same time.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used in the specification of the present invention herein are only for the purpose of describing specific embodiments and are not intended to limit the present invention.

[0028] like Figure 2 As shown, in this embodiment, the jig 100 is used to detect whether the first surface 10 and the second surface 20 that are spaced apart from each other are parallel. The user can use the jig 100 to detect whether the parallelism between the first surface 10 and the second surface 20 meets the requirements, so that the user can make corresponding adjustments to the first surface 10 and the second surface 20 to make the parallelism of the first surface 10 and the second surface 20 meet the requirements.

[0029] like Figures 2 to 4 As shown, in this embodiment, the fixture 100 includes a base 30 and two light emitters 40 spaced apart on the base 30. When in use, the base 30 is placed on the first surface 10, and in fact, the surface of the base 30 away from the light emitters 40 is connected to the first surface 10, and the two light emitters 40 are opposite to the second surface 20, and can emit light beams a to the second surface 20 respectively. The light beams a emitted by the two light emitters 40 will be reflected by the second surface 20 and finally projected onto the base 30.

[0030] like Figure 5 As shown, in this embodiment, the light emitter 40 includes a housing 1 and a light source 2 disposed in the housing 1, wherein the housing 1 is provided with a light outlet 3 so that the light emitted by the light source 2 can be emitted from the housing 1. At this time, the arrangement direction of the light sources 2 of the two light emitters 40 is the arrangement direction of the two light emitters 40.

[0031] In this embodiment, both light emitters 40 are laser emitters, which can make the light beam a more concentrated, thereby improving the detection effect. In addition, in this embodiment, the laser emitter is a line laser emitter, such as Figure 3 As shown, during use, the two laser emitters will emit parallel linear light beams a. At this time, the light beams a will form two linear light spots b after being projected on the base 30, which is more conducive to the user to judge the relationship between the projection positions of the two light beams a on the base 30. Of course, in other embodiments, the laser emitter can also be a point laser emitter, a cross-line laser emitter, etc.

[0032] like Figure 2 As shown, in this embodiment, the base 30 includes a first portion 4 and a second portion 5 connected in sequence, wherein the arrangement direction of the first portion 4 and the second portion 5 is consistent with the arrangement direction of the two light emitters 40. The first portion 4 has a first bearing surface 41 and a mounting surface 42 disposed opposite to each other, and the second portion 5 has a second bearing surface 51 and a detection surface 52 disposed opposite to each other, wherein the second bearing surface 51 is flush with the first bearing surface 41, and the second bearing surface 51 and the first bearing surface 41 form a supporting surface of the fixture 100, and the two light emitters 40 are both disposed on the mounting surface 42, and the light emitted by the two light emitters 40 is finally projected on the detection surface 52. In addition, the mounting surface 42, the detection surface 52 and the supporting surface are parallel to each other. When in use, the supporting surface is in contact with the first surface 10, so that the mounting surface 42 and the detection surface 52 are parallel to the first surface 10.

[0033] like Figure 2 As shown, in this embodiment, in the direction from the first bearing surface 41 to the mounting surface 42, the size of the detection surface 52 relative to the first surface 10 is greater than the size of the mounting surface 42 relative to the first surface 10. In this way, only a shorter detection surface 52 is needed to allow the light beams a of the two light emitters 40 to be projected on the detection surface 52, which is conducive to the miniaturization design of the fixture 100 and reduces the material cost of the fixture 100. Among them, the length of the detection surface 52 refers to the size of the detection surface 52 in the arrangement direction of the two light emitters 40.

[0034] like Figure 3 As shown, in this embodiment, the detection surface 52 is provided with scale lines 6 to facilitate the detection of the relationship between the projection positions of the two light beams a on the detection surface 52, wherein the arrangement direction of the scale lines 6 is consistent with the arrangement direction of the two light emitters 40. The setting of the scale lines 6 can not only facilitate the confirmation of the spacing between the two linear light spots b, but also facilitate the judgment of whether the two linear light spots b are parallel. It can be understood that in other embodiments, the scale lines 6 can also be other marks that can facilitate the detection and judgment of the positional relationship between the two light beams a on the detection surface 52, such as Figure 4 As shown, the scale marks 6 can be replaced by dot matrix marks 6a.

[0035] like Figure 5 As shown, in this embodiment, the fixture 100 further includes a bracket 50 for rotatably connecting the light emitter 40 and the base 30. There are two brackets 50, each of which is used to mount one of the light emitters 40 on the base 30.

[0036] In this embodiment, both light emitters 40 can rotate relative to the base 30, wherein the rotation of the two light emitters 40 relative to the base 30 is actually a tilting movement toward the base 30, so that the positional relationship between the light beams a emitted by the two light emitters 40 can be adjusted by adjusting the angles of the two light emitters 40 in different applications, so that the light beams a emitted by the two light emitters 40 can be simultaneously irradiated on the second surface 20. In addition, in this embodiment, the rotation axes around which the two emitters 40 rotate relative to the base 30 are parallel to each other and parallel to the first surface 10.

[0037] In addition, in the present embodiment, the axis around which the two light emitters 40 rotate relative to the base 30 is perpendicular to the arrangement direction of the two light sources 2, so that the light beams a emitted by the two light emitters 40 can be irradiated at the same position of the second surface 20 by adjusting the angles of the two light emitters 40, that is, the light beams a emitted by the two light emitters 40 overlap at the second surface 20, which can facilitate the subsequent judgment of whether the first surface 10 and the second surface 20 are parallel. At the same time, through this setting, the present fixture 100 can be used even if the area of ​​the second surface 20 is small.

[0038] like Figure 5 As shown, in this embodiment, the bracket 50 includes a supporting portion 7, a connecting portion 8 and a locking portion 9. The supporting portion 7 is fixed on the base 30, the connecting portion 8 is rotatably mounted on the supporting portion 7, the light emitter 40 is fixedly mounted on the connecting portion 8, and the locking portion 9 is used to lock the connecting portion 8 and the supporting portion 7 together after the connecting portion 8 is rotated relative to the supporting portion 7.

[0039] The support portion 7 includes two support rods 71 ​​arranged at intervals, and the arrangement direction of the two support rods 71 ​​is perpendicular to the arrangement direction of the two light emitters 40. One end of the support rod 71 is connected to the base 30, and the other end is provided with a mounting hole 72, the axial direction of the mounting hole 72 is consistent with the arrangement direction of the two support rods 71, and the mounting holes 72 on the two support rods 71 ​​are coaxial and both penetrate the support rods 71 ​​where they are located.

[0040] like Figure 5 and Figure 6As shown, the connecting part 8 includes a rotating member 81, a fixing member 82 and a connecting member 83, wherein the two ends of the rotating member 81 are respectively provided with a rotating shaft 811 matching the mounting hole 72. After assembly, the two rotating shafts 811 are respectively penetrated in the two mounting holes 72 and can rotate in the mounting holes 72. In addition, after assembly, at least one rotating shaft 811 penetrates the mounting hole 72, and the rotating shaft 811 is provided with an external thread, which can be only provided on the part that penetrates the mounting hole 72, and the external thread is used to cooperate with the locking part 9, so as to be locked with the support rod 71 after the rotating member 81 is rotated to a predetermined position. Among them, in this embodiment, the locking part 9 can be a nut.

[0041] The middle part of the rotating member 81 has a first concave structure 812, and the first concave structure 812 penetrates the rotating member 81 in the radial direction of the rotating member 81. After the fixing member 82 is connected to the rotating member 81, the first concave structure 812 can be closed to form a locking ring, and the light emitter 40 is clamped and fixed in the locking ring. In some embodiments, the fixing member 82 is provided with a second concave structure 821, and the second concave structure 821 is opposite to the first concave structure 812 to increase the contact area between the locking ring and the light emitter 40, so that the light emitter 40 is fixed more firmly. In addition, in this embodiment, two first through holes 813 are provided on the rotating member 81, and the two first through holes 813 are respectively located on both sides of the first concave structure 812, and two second through holes 822 are provided on the fixing member 82, and the two second through holes 822 are respectively located on both sides of the second concave structure 821. The connecting member 83 includes a bolt 831 and a nut 832 . The rotating member 81 and the fixing member 82 can be connected together by passing the bolt 831 through the first through hole 813 and the corresponding second through hole 822 and then cooperating with the corresponding nut 832 .

[0042] It is understandable that in some embodiments, the locking portion 9 may not be provided. In this case, a larger static friction force may be provided between the support portion 7 and the connection portion 8 through corresponding settings, and the static friction force may be used to make the connection portion 8 stationary at any position relative to the support portion 7. For example, in the above embodiment, the above purpose may be achieved by setting the matching tolerance between the rotating shaft 811 and the mounting hole 72.

[0043] In this embodiment, the axis of the rotating shaft 811 is the axis around which the above-mentioned light emitter rotates relative to the base 30, and the height of the light source 2 is the same as the height of the axis of the rotating shaft 811. When the light emitter 40 rotates relative to the base 30, the height of the light source 2 can be ensured to remain unchanged, thereby facilitating subsequent detection and judgment. At the same time, in this embodiment, the height of the detection surface 52 is the same as the height of the light source 2.

[0044] In order to facilitate understanding of the fixture 100, a simple method for determining whether the first surface 10 and the second surface 20 are parallel is provided below: the height of the light source 2 of the two laser emitters 40 relative to the first surface 10 and the height of the detection surface 52 relative to the first surface 10 are the same. When the light beams a emitted by the two light emitters 40 are simultaneously irradiated on the same position of the second surface 20, if the two linear light spots b on the detection surface 52 are parallel and the spacing between the two linear light spots b is the same as the spacing between the two light emitters 40, then the first surface 10 and the second surface 20 are parallel. Among them, in this embodiment, the spacing between the two light emitters 40 actually refers to the spacing between the light sources 2 of the two light emitters 40. In actual products, after the light emitters 40 are installed on the base 30, the spacing between the light sources 2 of the two light emitters 40 is fixed, so when in use, it is sufficient to detect the two linear light spots b on the detection surface 52.

[0045] An embodiment of the present invention also provides a method for adjusting parallelism, which uses the jig 100 described in any of the above embodiments. When performing resolution detection on the camera module 200, the method can be used to detect whether the horizontality between the resolution board 300 and the camera module 200 meets the requirements, and the horizontality between the resolution board 300 and the camera module 200 can be adjusted accordingly.

[0046] like Figure 2 As shown, when testing the resolution of the camera module 200, the camera module 200 needs to be fixed on a fixing device 400, and then the camera module 200 is used to shoot the test surface of the resolution plate 300 opposite to it, and finally the resolution of the camera module 200 is measured according to the shooting result of the camera module 200. In order to improve the detection accuracy of the resolution of the camera module 200, it is necessary to make the parallelism between the light incident surface of the camera module 200 and the test surface of the resolution plate 300 within 0.5°. At this time, it is necessary to use the above-mentioned fixture 100 to detect whether the parallelism between the light incident surface of the camera module 200 and the test surface of the resolution plate 300 meets the requirements. Among them, the light incident surface of the camera module 200 is perpendicular to the optical axis of the camera module 200.

[0047] In this embodiment, the test surface of the resolution plate 300 is the first surface 10, and the light incident surface of the camera module 200 is the second surface 20. During actual testing, the resolution plate 300 is usually placed horizontally, and the camera module 200 is placed directly above the resolution plate 300 so that the test surface of the resolution plate 300 is opposite to the light incident surface of the camera module 200.

[0048] The method comprises the following steps: step S1, fixing the fixture 100 on the test surface of the resolution board 300, and fixing the camera module 200 on the fixing device 400, wherein the light incident surface of the camera module 200 is spaced opposite to the test surface of the resolution board 300, and the fixture 100 is located between the light incident surface of the camera module 200 and the test surface of the resolution board 300; step S2, starting two light emitters 40 on the fixture 100, so that the two light emitters 40 simultaneously emit a light beam a to the light incident surface of the camera module 200, so that the light beam a can be reflected onto the base 30 of the fixture 100; step S3, adjusting the fixing device 400 and / or the resolution board 300, so that the positional relationship between the two emitters and the positional relationship of the projections of the two light beams a on the base 30 meet the predetermined position adjustment, thereby making the parallelism between the light incident surface and the test surface of the resolution board 300 meet the predetermined parallelism condition.

[0049] Among them, in step S1, since the base 30 of the fixture 100 is usually made of cast iron or steel and is heavy, when the fixture 100 is placed on the resolution board 300, the fixture 100 can be fixed to the resolution board 300 by its own gravity, so there is no need to use other locking parts to lock the fixture 100 and the resolution board 300, and the operation is simpler. At the same time, for the convenience of measurement, a sample module is usually fixed on the fixing device 400 first, wherein the shape and size of the sample module are exactly the same as those of the normal camera module 200. The difference between the sample module and the camera module 200 is that a reflective layer is provided on the light-entering surface of the sample module to improve the reflection effect of light. When the parallelism between the light incident surface of the sample module and the test surface of the resolution plate 300 meets the requirement, the relative position of the fixture 400 and the resolution plate 300 is kept fixed, so that the parallelism between the light incident surface of each subsequent camera module 200 installed on the fixture 400 and the test surface of the resolution plate 300 meets the requirement.

[0050] In addition, in step S2, for the convenience of subsequent detection, the light emitters 40 are usually adjusted so that the light beams a emitted by the two light emitters 40 are projected at the same position of the light incident surface of the camera module 200. In addition, in step S3, before adjusting the position of the fixture 400 and / or the resolution board 300, it is also necessary to first determine whether the parallelism between the light incident surface of the camera module 200 and the test surface of the resolution board 300 meets the requirements; if so, no adjustment is required; if not, the fixture 400 and / or the resolution board 300 are adjusted until the parallelism between the light incident surface of the camera module 200 and the test surface of the resolution board 300 meets the requirements, that is, the predetermined parallelism condition is met.

[0051] In order to achieve a better parallelism adjustment effect, the jig 100 can be used to perform two or more tests on whether the light incident surface of the camera module 200 and the test surface of the resolution board 300 are parallel, wherein the orientation of the jig 100 is adjusted during each test, and the orientation of the jig 100 is consistent with the arrangement direction of the two light emitters of the jig. For example, when performing two inspections, the orientations of the jig 100 can be perpendicular to each other.

[0052] It can be understood that the above method can also be applied to other occasions to adjust the parallelism between two opposite surfaces of two objects.

[0053] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0054] The above-mentioned embodiments only express several implementation methods of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the scope of the invention patent. It should be pointed out that for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be based on the attached claims.

Claims

1. A parallelism detection jig for detecting the parallelism between a first surface and a second surface that are spaced opposite to each other, characterized in that: include: A base, used to be placed on the first surface, the base comprising: The first part has a first bearing surface and a mounting surface arranged in parallel, and the two light emitters are arranged on the mounting surface; A second part connected to the first part, the second part having a second bearing surface and a detection surface arranged in parallel; the arrangement direction of the first part and the second part is consistent with the arrangement direction of the two light emitters; The height of the detection surface is the same as the light source height of the light emitter; two light emitters, arranged at intervals on the base, capable of simultaneously emitting light beams toward the second surface, wherein the light beams are reflected by the second surface and finally projected onto the base; At least one of the two light emitters can rotate relative to the base to tilt toward the base, thereby adjusting the positional relationship between the light beams emitted by the two light emitters so that the light beams emitted by the two light emitters can be projected onto the second surface simultaneously.

2. The parallelism detection jig according to claim 1, characterized in that: The axis around which the light emitter rotates relative to the base is perpendicular to the arrangement direction of the two light emitters; and / or The fixture also includes a bracket for connecting the base and the light emitter; the bracket includes a supporting portion and a connecting portion, the supporting portion is arranged on the base, and the light emitter is installed on the connecting portion, wherein the connecting portion is rotatably installed on the supporting portion, and the connecting portion can be fixed relative to the supporting portion after being rotated to a predetermined position relative to the supporting portion.

3. The parallelism detection jig according to claim 1, characterized in that: The second bearing surface is flush with the first bearing surface, and the second bearing surface and the first bearing surface are used to abut against the first surface, and the light emitted by the light emitter is reflected by the second surface and finally projected onto the detection surface; wherein, in the direction from the first bearing surface to the mounting surface, the height of the detection surface is greater than the height of the mounting surface.

4. The parallelism detection jig according to claim 1, characterized in that: The area on the base used for projecting the light beams is provided with a mark to facilitate detection of the positional relationship between the two light beams on the detection surface.

5. The parallelism detection jig according to claim 4, characterized in that: The markings are scale lines, and the arrangement direction of the scale lines is consistent with the arrangement direction of the two light emitters.

6. The parallelism detection jig according to claim 1, characterized in that: The light emitter is a word-line laser emitter.

7. A method for adjusting parallelism, using the jig according to any one of claims 1 to 6 to adjust the parallelism between a first surface and a second surface that are spaced apart and opposite to each other, characterized in that: include: fixing the jig on the first surface; Using two light emitters of the fixture to simultaneously emit light beams to the second surface so that the light beams can be reflected onto the base of the fixture; The first surface and / or the second surface are adjusted so that the positional relationship between the two emitters and the positional relationship between the projections of the two light beams on the base meet a predetermined positional condition, thereby making the parallelism between the first surface and the second surface meet a predetermined parallelism condition.

8. The parallelism adjustment method according to claim 7, characterized in that: The step of emitting light beams to the second surface using the two light emitters of the jig includes adjusting the light emitters so that the light beams emitted by the two light emitters are projected onto the same position of the second surface.

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