Metal particle trap capture test device and method

Abstract

The present invention relates to a metal particle trap capture test device and method, the metal particle trap capture test device comprises: a simulation cylinder, the inner wall of which is provided with a test position for supporting and placing a support insulator assembly equipped with a particle trap to be tested; a conductive rod, which is supported and assembled in the simulation cylinder by the support insulator assembly in the test position; a bushing assembly, which is assembled with the simulation cylinder to apply voltage to the conductive rod; a particle placement hole, which is arranged on the cylinder wall of the simulation cylinder and is located beside the test position, and is used to place metal particles in the simulation cylinder; a hole cover, which is arranged corresponding to the particle placement hole, and can be assembled on the cylinder wall of the simulation cylinder in an openable and closable manner to cover the particle placement hole. By testing the particle trap through the test device, the effectiveness of the particle trap can be verified, the pressurization procedure of the field aging test can be optimized, and an important test basis can be provided for the reliable operation of the GIL.

Description

Technical Field

[0001] The invention relates to a metal particle trap capture test device and method. Background Art

[0002] During the production, transportation, assembly, and operation of GIL / GIS, metal particle contaminants will inevitably be generated due to the existence of uncontrollable factors such as friction and collision between sliding parts, equipment vibration, and thermal expansion and contraction friction. Under the action of Coulomb force, electric field gradient force, gravity, gas viscosity, etc., metal particles will move inside the GIL / GIS and even adhere to the surface of the insulator, causing gas gap discharge or insulator surface flashover, resulting in a significant reduction in the equipment's withstand voltage.

[0003] At present, the main measure to suppress the movement of metal particles is to set a particle trap inside the GIL / GIS. For example, the Chinese patent with the authorization announcement number CN205384910U discloses a three-pillar insulator for a gas-insulated busbar, which includes a tubular base and a cylindrical particle catcher, and three radially extending insulating pillars are arranged on the outer peripheral wall of the base at intervals along the circumference of the base, and the particle catcher is connected to the insulating pillars. The particle catcher is provided with a circular hole in the bottom area, and the circular hole can collect pollutants such as metal particles generated by friction.

[0004] Although the above-mentioned particle collector can capture a certain amount of metal particles, due to the complex structure of GIL / GIS itself, conducting particle capture tests directly on GIL / GIS is not only inconvenient to operate, but also will cause pollution to the support insulators inside GIL / GIS, affecting the normal operation of GIL / GIS. Summary of the invention

[0005] The purpose of the present invention is to provide a metal particle trap capture test device to solve the technical problem that the particle capture test is directly performed on the GIL / GIS in the prior art, which will cause pollution to the post insulator inside the GIL / GIS and affect the normal operation of the GIL / GIS. The purpose of the present invention is also to provide a metal particle trap capture test method to solve the technical problem that the particle capture test is directly performed on the GIL / GIS in the prior art, which will cause pollution to the post insulator inside the GIL / GIS and affect the normal operation of the GIL / GIS.

[0006] To achieve the above-mentioned purpose, the technical solution of the metal particle trap test device of the present invention is:

[0007] A metal particle trap capture test device comprises: a simulation cylinder, a test position is provided on the inner wall of which, for supporting and placing a support insulator assembly equipped with a particle trap to be tested; a conductive rod, for being supported and assembled in the simulation cylinder by the support insulator assembly in the test position; a bushing assembly, assembled with the simulation cylinder to apply voltage to the conductive rod; a particle placement hole, arranged on the cylinder wall of the simulation cylinder, located beside the test position, for placing metal particles in the simulation cylinder; and a hole cover, arranged corresponding to the particle placement hole, the hole cover can be opened and closed and assembled on the cylinder wall of the simulation cylinder, for covering the particle placement hole.

[0008] The beneficial effect is: during the test, the support of the post insulator assembly equipped with the particle catcher to be tested is placed at the test position on the inner wall of the cylinder, the hole cover is opened, and metal particles are placed on the side of the test position of the simulated cylinder through the particle placement hole, and then the hole cover is closed, and the gas insulating medium is filled into the simulated cylinder and the bushing assembly. After the gas insulating medium is filled, a voltage of a certain amplitude is applied to the conductive rod through the bushing assembly, and the voltage amplitude is made greater than the lifting voltage of the metal particles. After a period of time, the voltage is removed to observe the capture effect of the particle catcher on the metal particles. By testing the particle catcher through this test device, the effectiveness of the particle catcher can be verified, the pressurization procedure of the field aging test can be optimized, and an important test basis for the reliable operation of the gas-insulated transmission line can be provided, which has guiding significance for engineering practice.

[0009] Furthermore, at least two test positions are arranged at intervals along the axial direction of the simulation cylinder.

[0010] The beneficial effect is that by setting at least two test positions, at least two particle traps can be tested simultaneously, which is conducive to comparing the capture effects of each particle trap, and then intuitively deriving the capture performance of particle traps with different structures.

[0011] Furthermore, the hole cover is an observation window.

[0012] The beneficial effect is that the observation window can not only cover the particle placement hole, but also can observe the capturing process of the particle trap.

[0013] Furthermore, the particle placement holes correspond one-to-one to the test positions.

[0014] The beneficial effect is that it is convenient to place the metal particles beside each test position.

[0015] Furthermore, the metal particle trap capture test device includes two adjusting screws, and the simulation cylinder and sleeve assembly are respectively fixed on the corresponding adjusting screws so that the simulation cylinder can be leveled by the adjusting screws.

[0016] The beneficial effect is that the simulated cylinder is leveled by adjusting the screw rod, so that the influence of the tilt of the simulated cylinder on the test result can be avoided.

[0017] To achieve the above-mentioned purpose, the technical solution of the metal particle trap capture test method of the present invention is:

[0018] The metal particle trap capture test method comprises the following steps: 1) placing metal particles into a simulated cylinder beside a corresponding particle catcher through a particle placement hole; 2) filling a gas insulating medium into the simulated cylinder and a bushing assembly; 3) applying a voltage to a conductive rod in the simulated cylinder through the bushing assembly, and making the applied voltage amplitude greater than the lifting voltage of the metal particles, removing the voltage after a set test time, and observing the capture effect of the particle catcher on the metal particles.

[0019] The beneficial effect is: during the test, the support of the post insulator assembly equipped with the particle catcher to be tested is placed at the test position on the inner wall of the cylinder, the hole cover is opened, and metal particles are placed on the side of the test position of the simulated cylinder through the particle placement hole, and then the hole cover is closed, and the gas insulation medium is filled into the simulated cylinder and the bushing assembly. After the gas insulation medium is filled, a voltage of a certain amplitude is applied to the conductive rod through the bushing assembly, and the voltage amplitude is made greater than the lifting voltage of the metal particles. After a period of time, the voltage is removed to observe the capture effect of the particle catcher on the metal particles. The particle catcher is tested by the test device to avoid contamination of the post insulator inside the GIL / GIS and affect the normal operation of the GIL / GIS.

[0020] Furthermore, in step 3), an AC or DC voltage is applied to the conductive rods in the simulation cylinder through the bushing assembly.

[0021] The beneficial effect is that by applying an AC or DC voltage to the conductive rod, the capturing effect of the particle trap under a single voltage can be obtained.

[0022] Furthermore, when testing more than two particle traps, in step 1), the same number of metal particles of the same specification are placed at the same distances beside each particle trap.

[0023] The beneficial effect is that by placing the same number of metal particles of the same specification at the same distance beside each particle trap, it is helpful to compare the capture effects of each particle trap.

[0024] Furthermore, in step 3), a pressurization program with different voltage amplitudes and different time is applied to the conductive rod through the sleeve assembly to obtain the capture effect of the particle trap under different pressurization programs.

[0025] The beneficial effect is that different capture effects can be obtained by applying different pressurization procedures, thereby providing an experimental basis for the design of particle traps.

[0026] Furthermore, in step 1), before placing the metal particles, the simulated cylinder is first leveled.

[0027] The beneficial effect is that before the test, the simulation cylinder is leveled first, which can avoid the influence of the tilt of the simulation cylinder on the test result. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a structural schematic diagram of Example 1 of the metal particle trapping test device of the present invention;

[0029] Figure 2 for Figure 1 Schematic diagram of the structure of the simulated cylinder;

[0030] Figure 3 for Figure 2 A partial schematic diagram of the first particle trap in the middle;

[0031] Figure 4 for Figure 2 A partial schematic diagram of the second particle trap in the direction of B;

[0032] Figure 5 for Figure 2 A partial schematic diagram of the third particle trap in the direction of C;

[0033] Figure 6 It is a schematic diagram of the first pressurization procedure of the metal particle trap capture test method of the present invention;

[0034] Figure 7 A schematic diagram of a second pressurization procedure of the metal particle trapping test method of the present invention;

[0035] In the figure: 1- bushing assembly; 2- simulated cylinder; 3- support insulator; 4- conductive rod; 5- third particle catcher; 51- circumferential long hole; 6- observation window; 7- second particle catcher; 71- axial long hole; 8- first particle catcher; 81- circular hole; 9- I-beam; 10- adjusting screw; 11- particle placement hole. DETAILED DESCRIPTION

[0036] In order to make the purpose, technical scheme and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention, that is, the embodiments described are only part of the embodiments of the present invention, rather than all of the embodiments. The components of the embodiments of the present invention described and shown in the drawings herein can be arranged and designed in various different configurations.

[0037] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the present invention.

[0038] It should be noted that relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0039] The features and performance of the present invention are further described in detail below in conjunction with the embodiments.

[0040] Example 1 of the metal particle trapping test device of the present invention:

[0041] like Figure 1 As shown, the metal particle trap capture test device includes a sleeve assembly 1 and a simulation cylinder 2, and the sleeve assembly 1 and the simulation cylinder 2 are assembled together. There are three test positions on the inner wall of the simulation cylinder 2, and the three test positions are arranged at intervals along the axial direction of the simulation cylinder 2. By setting up three test positions, three particle traps can be tested at the same time, which is conducive to comparing the capture effect of each particle trap, and then intuitively deriving the capture performance of particle traps with different structures. Among them, the sleeve assembly 1 is used to apply voltage to the conductive rod 4 in the simulation cylinder 2. It should be noted that the sleeve assembly applying voltage to the conductive rod is a prior art.

[0042] like Figure 1 and Figure 2As shown, a conductive rod 4 is provided in the simulated cylinder 2, and the conductive rod 4 is supported and assembled in the simulated cylinder 2 by three post insulator assemblies, and each post insulator assembly is located at a corresponding test position. Specifically, the three post insulator assemblies are respectively a first post insulator assembly, a second post insulator assembly and a third post insulator assembly; the first post insulator assembly includes a post insulator 3 and a first particle trap 8 assembled on the post insulator 3, the second post insulator assembly includes a post insulator 3 and a second particle trap 7 assembled on the post insulator 3, and the third post insulator assembly includes a post insulator 3 and a third particle trap 5 assembled on the post insulator 3. Among them, the post insulator 3 is a three-post insulator in the prior art. It should be noted that before each post insulator is assembled into the simulated cylinder 2, the particle trap is first fixedly assembled on the corresponding post insulator.

[0043] like Figure 2 As shown, a particle placement hole 11 is also provided on the cylinder wall of the simulation cylinder 2. The particle placement hole 11 is located beside the test position, that is, beside the corresponding particle trap, and metal particles are placed into the simulation cylinder 2 through the particle placement hole 11. An observation window 6 is provided at the position corresponding to the particle placement hole 11. The observation window 6 constitutes a hole cover. The observation window 6 can be assembled on the cylinder wall of the simulation cylinder 2 to cover the particle placement hole 11.

[0044] In this embodiment, there are three particle placement holes 11, which correspond to each test position one by one. The particle placement holes 11 are arranged on the lower side of the simulation cylinder 2. Of course, in other embodiments, the particle placement holes can be arranged on the upper side, front side or rear side of the simulation cylinder.

[0045] like Figure 1 As shown, the metal particle trap capture test device also includes a support base, which includes two I-beams 9, on which are respectively provided adjustment screws 10, and the simulated cylinder 2 and the sleeve assembly 1 are respectively fixed on the corresponding adjustment screws 10, and the horizontality of the cylinder is adjusted by adjusting the screws 10 to avoid the influence of the tilt of the simulated cylinder 2 on the test results.

[0046] In this embodiment, the upper and lower ends of the adjusting screw 10 are respectively threadedly connected with two nuts, and the two nuts at the lower end are respectively located at the upper and lower sides of the upper flange of the I-beam 9, and an L-shaped plate is fixed on the simulated cylinder 2, and the two nuts at the upper end of the adjusting screw are respectively located at the upper and lower sides of the horizontal fold of the L-shaped plate. By changing the position of the nut, the height of the corresponding end of the simulated cylinder 2 can be adjusted.

[0047] like Figures 3 to 5 As shown, the first particle trap 8 is provided with a circular hole 81 , the second particle trap 7 is provided with an axial long hole 71 extending axially along the simulated cylinder 2 , and the third particle trap 5 is provided with a circumferential long hole 51 extending circumferentially along the simulated cylinder 2 .

[0048] Example 2 of the metal particle trapping test device of the present invention:

[0049] The difference from the embodiment 1 of the metal particle trap capture test device is that there is only one test position in the simulation cylinder, and the simulation cylinder can only perform a particle capture test on one particle trap at a time.

[0050] Example 3 of the metal particle trapping test device of the present invention:

[0051] The difference from Example 1 of the metal particle trap capture test device is that the particle placement hole is a hand hole and the hole cover is a hand hole cover. If it is necessary to observe the particle capture process of the particle trap, an observation window can be set on the simulation cylinder.

[0052] Example 4 of the metal particle trapping test device of the present invention:

[0053] The difference from the first embodiment of the metal particle trapping test device is that two particle placement holes are provided, and one particle placement hole is used to place metal particles beside the two particle traps.

[0054] Example 5 of the metal particle trapping test device of the present invention:

[0055] The difference from the first embodiment of the metal particle trap test device is that no adjusting screw is provided, and the horizontality of the upper flanges of the two I-beams needs to be ensured.

[0056] Example 1 of the metal particle trapping test method of the present invention:

[0057] When conducting a particle capture test, 1) first adjust the horizontality of the simulated cylinder 2, then place the assembled first, second and third post insulator assemblies at the corresponding test positions in the simulated cylinder 2, open the observation window 6, and place metal particles next to the test position of the simulated cylinder 2 through the particle placement hole 11, and then close the observation window 6; 2) fill the simulated cylinder 2 and the bushing assembly 1 with a gas insulating medium; 3) after the gas insulating medium is filled, apply a voltage of a certain amplitude to the conductive rod 4 through the bushing assembly 1, and make the voltage amplitude greater than the lifting voltage of the metal particles. After a period of time, remove the voltage and observe the capture effect of each particle collector on the metal particles.

[0058] In this embodiment, Figure 6 As shown, the voltage applied to the conductive rod 4 is a DC voltage, so as to obtain the capture effect of each particle trap under a single voltage. Figure 7As shown, the DC voltage can first apply positive pressure and then negative pressure to verify the effectiveness of the capture effect of each particle trap. It should be noted that the amplitude and time of the DC voltage can be selected as needed to obtain different capture effects, thereby providing an experimental basis for the design of particle traps.

[0059] In this embodiment, when testing the above three particle traps, in step (1), metal particles of the same quantity and specification are placed at the same distance beside each particle trap to facilitate comparison of the capture effect of each particle trap.

[0060] Example 2 of the metal particle trapping test method of the present invention:

[0061] The difference from Example 1 of the metal particle trap capture test method is that an AC voltage is applied to the conductive rod in the simulated cylinder through the sleeve assembly to observe the capture effect of each particle trap.

[0062] Example 3 of the metal particle trapping test method of the present invention:

[0063] The difference from the first embodiment of the metal particle trap test method is that the metal particles placed beside each particle trap are at different distances from the corresponding particle trap. Of course, in other embodiments, the number or specifications of the metal particles beside each particle trap may be different.

[0064] Example 4 of the metal particle trap capture test method of the present invention:

[0065] The difference from Example 1 of the metal particle trap capture test method is that before the particle capture test is performed, if the simulation cylinder is already horizontal, there is no need to level the simulation cylinder before the test.

[0066] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. The patent protection scope of the present invention shall be based on the claims. All equivalent structural changes made using the contents of the description and drawings of the present invention should also be included in the protection scope of the present invention.

Claims

1. A metal particle trap capture test method, characterized in that: The metal particle trap capture device comprises a simulation cylinder, a conductive rod, and a bushing assembly. A test position is provided on the inner wall of the simulation cylinder for supporting and placing a post insulator assembly equipped with a particle trap to be tested. The bushing assembly is assembled with the simulation cylinder to apply voltage to the conductive rod. A particle placement hole is provided on the cylinder wall of the simulation cylinder and is located beside the particle trap. There are three particle traps. A circular hole is provided on the first particle trap. An axial long hole extending along the axial direction of the simulation cylinder is provided on the second particle trap. A circumferential long hole extending along the circumferential direction of the simulation cylinder is provided on the third particle trap. The three particle traps correspond to the three particle placement holes one by one. The test method comprises the following steps: 1) Place the same number of metal particles of the same specifications into the simulation cylinder beside the corresponding particle trap through the particle placement hole; 2) Fill the simulated cylinder and bushing assembly with gas insulation medium; 3) Apply voltage to the conductive rod in the simulated cylinder through the casing assembly, and make the applied voltage amplitude greater than the lifting voltage of the metal particles. After the set test time, remove the voltage and observe the capture effect of the particle collector on the metal particles; in step 3), apply a DC voltage to the conductive rod in the simulated cylinder through the casing assembly, and the DC voltage is applied in a positive pressure and then a negative pressure; in step 3), apply different voltage amplitudes and different time pressurization programs to the conductive rod through the casing assembly to obtain the capture effect of the particle collector under different pressurization programs.

2. The metal particle trapping test method according to claim 1, characterized in that: In step 1), metal particles of the same quantity and specification are placed at the same distances beside each particle trap.

3. The metal particle trapping test method according to claim 1, characterized in that: In step 1), the simulated cylinder is leveled before placing the metal particles.

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