Optical measuring device

Abstract

An optical measurement device is provided. The optical measurement device includes: a light sensor that measures a light waveform of a reference object or a measurement object; a learner that receives a first light waveform of the reference object from the light sensor and learns the frequency characteristics of the first light waveform; a filter generator that analyzes the frequency characteristics of the first light waveform and generates a frequency filter; a frequency modeling unit that receives a second light waveform of the measurement object from the light sensor and models the frequency characteristics of the second light waveform; and a light characteristics detection unit that calculates a light characteristics index of the second light waveform based on an output value of the frequency modeling unit and the frequency filter.

Description

Technical Field

[0001] The present invention relates to an optical measuring device for measuring the brightness and flicker of a display device. Background Art

[0002] A display device includes a display panel equipped with multiple pixels that display images, a gate driver that provides gate signals to the pixels, and a data driver that provides data voltages to the pixels. The pixels are composed of light-emitting elements and pixel circuits that drive the light-emitting elements.

[0003] The display device can be driven through a refresh period and a hold period within multiple frames. The pixel circuit of the display device can be driven at a low speed to reduce power consumption, and the refresh period can be increased. Moreover, as the refresh period increases, the time interval between adjacent refresh periods may increase, and the reduction in brightness of the light-emitting element generated during the refresh period may be noticeable to the viewer's eyes. Accordingly, pixels driven at a low speed may produce flicker due to the reduction in brightness and charging delay, thereby reducing the visual experience.

[0004] Optical measurement devices can measure the brightness and flicker of display devices during their manufacturing process. Existing optical measurement devices can measure the brightness of low-speed driven display panels or display modules and analyze flicker. Summary of the Invention

[0005] The present invention aims to provide an optical measurement device that learns the frequency characteristics of a first light waveform emitted from a display module including a display panel and a display driver, thereby learning the frequency characteristics caused by the display panel and the frequency characteristics caused by the display driver.

[0006] The problem to be solved by the present invention is to provide an optical measurement device that learns the frequency characteristics of a first light waveform emitted from a display module driven by a display driver and measures a second light waveform emitted from a display panel driven by a lighting device, thereby enabling the frequency characteristics of the first light waveform to be measured from the second light waveform.

[0007] The problems of the present invention are not limited to the problems mentioned above, and those skilled in the art can clearly understand other technical problems not mentioned through the following description.

[0008] An optical measurement device according to one embodiment for solving the above-mentioned problems includes: a light sensor for measuring a light waveform of a reference object or a measurement object; a learner for receiving a first light waveform of the reference object from the light sensor and learning the frequency characteristics of the first light waveform; a filter generator for analyzing the frequency characteristics of the first light waveform and generating a frequency filter; a frequency modeling unit for receiving a second light waveform of the measurement object from the light sensor and modeling the frequency characteristics of the second light waveform; and a light characteristics detection unit for calculating a light characteristics index of the second light waveform based on an output value of the frequency modeling unit and the frequency filter.

[0009] The reference object may be a display module including: a first display panel; and a display driving unit configured to provide a data voltage to the first display panel according to a predetermined driving frequency.

[0010] The learner may include: a first domain transformation unit that receives the first optical waveform and transforms it into the frequency domain; a weight application unit that applies at least one weight filter to the output value of the first domain transformation unit; and a classification unit that distinguishes the type of the first optical waveform based on the output value of the weight application unit.

[0011] The first domain conversion unit may convert the domain of the first optical waveform using Fast Fourier Transform (FFT).

[0012] The at least one weight filter may include a plurality of weights respectively corresponding to frequency components of the first light waveform.

[0013] The weight application section may apply an activation function to an output value of the at least one weight filter.

[0014] The learner may receive a second optical waveform of the measurement object, thereby learning a frequency characteristic of the second optical waveform.

[0015] The learner may transform the first optical waveform or the second optical waveform into a frequency domain and apply at least one weight filter to the frequency domain, thereby learning the frequency characteristics of the first optical waveform or the second optical waveform.

[0016] The filter generator may calculate a range of frequency domain values ​​of the first optical waveforms of the plurality of reference objects based on an output value of the first domain conversion unit for each of the plurality of reference objects, and may convert the calculated value into a time domain to generate a frequency filter.

[0017] The filter generator may generate a band pass filter (Band Pass Filter) that passes a specific frequency band in the first light waveform.

[0018] The measurement object may be a second display panel that receives a DC voltage from a lighting device and emits light.

[0019] The frequency modeling unit may transform the second optical waveform into a frequency domain to model the frequency characteristics of the second optical waveform.

[0020] The light characteristic detection unit may calculate the flicker index of the second light waveform by applying the frequency filter and the flicker filter to the output value of the frequency modeling unit.

[0021] The flicker filter may be a contrast sensitivity function (Contrast Sensitivity Function).

[0022] An optical measurement device according to one embodiment for solving the above-mentioned problem includes: a learner for receiving a first light waveform from a first display module and learning the frequency characteristics of the first light waveform, wherein the first display module includes a first display panel and a display driver for providing a data voltage to the first display panel according to a predetermined driving frequency; a filter generator for analyzing the frequency characteristics of the first light waveform and generating a frequency filter; a frequency modeling unit for receiving a second light waveform from a second display panel that receives a DC voltage from a lighting device and modeling the frequency characteristics of the second light waveform; and a light characteristics detection unit for calculating a light characteristics index of the second light waveform based on an output value of the frequency modeling unit and the frequency filter.

[0023] The learner may include: a first domain transformation unit that receives the first optical waveform and transforms it into the frequency domain; a weight application unit that applies at least one weight filter to the output value of the first domain transformation unit; and a classification unit that distinguishes the type of the first optical waveform based on the output value of the weight application unit.

[0024] The learner may receive the second light waveform of the second display panel, and thereby may learn the frequency characteristics of the second light waveform.

[0025] The learner may transform the first optical waveform or the second optical waveform into a frequency domain and apply at least one weight filter to the frequency domain, thereby learning the frequency characteristics of the first optical waveform or the second optical waveform.

[0026] The light characteristic detection unit may calculate the flicker index of the second light waveform by applying the frequency filter and the flicker filter to the output value of the frequency modeling unit.

[0027] The light characteristic detection unit may interpret a flicker characteristic of a second display module based on a flicker index of the second light waveform, wherein the second display module may include the second display panel and the display driving unit.

[0028] Details of other embodiments are included in the detailed description and accompanying drawings.

[0029] According to the optical measuring device of the embodiment, the optical measuring device can learn the frequency characteristics caused by the display panel and the display driving unit by learning the frequency characteristics of the first light waveform emitted from the display module driven by the display driving unit.

[0030] According to an embodiment of the optical measurement device, the optical measurement device can measure a second light waveform emitted from a display panel driven by a lighting device, thereby detecting a light characteristic index caused by a display driver unit from the second light waveform. Therefore, the optical measurement device can use the learning results of the frequency characteristics of the first light waveform to measure the frequency characteristics of the first light waveform from the second light waveform. Furthermore, the test results of the display panel driven by the lighting device can be used to omit the testing process of the display module driven by the display driver unit. This can eliminate the need for display module testing after learning the display module, reducing costs and time in the manufacturing process of display devices or display modules.

[0031] The effects according to the embodiment are not limited to the above-exemplified ones, and more various effects are included in this specification. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 FIG2 is a diagram illustrating an optical measuring device according to an embodiment.

[0033] Figure 2 FIG. 1 is a block diagram illustrating a learner of an optical measuring device according to an embodiment.

[0034] Figure 3 is a block diagram illustrating a filter generator of an optical measuring device according to an embodiment.

[0035] Figure 4 It shows Figure 1 FIG. 1 shows a diagram of a first display module.

[0036] Figure 5 It shows Figure 1 FIG2 is a diagram of a second display module shown.

[0037] Figure 6 is a sequence diagram illustrating a calculation process of a light characteristic index according to an embodiment.

[0038] Figure 7is a graph showing a frequency domain of a first optical waveform according to an embodiment.

[0039] Figure 8 is a diagram illustrating a frequency characteristic learning process of a learner according to an embodiment.

[0040] Figure 9 FIG. 1 is a sequence diagram illustrating a frequency characteristic learning process of a learner according to an embodiment.

[0041] Figure 10 is a sequence diagram showing a frequency characteristic learning process of a learner according to another embodiment.

[0042] Figure 11 is a graph illustrating a range of frequency domain values ​​of a first optical waveform according to an embodiment.

[0043] Figure 12 is a graph illustrating a frequency filter according to an embodiment.

[0044] Figure 13 FIG. 1 is a sequence diagram illustrating a frequency filter generation process of a filter generator according to an embodiment.

[0045] Figure 14 is a graph illustrating a flicker filter according to an embodiment.

[0046] Figure 15 FIG. 1 is a diagram illustrating a flicker index calculation process of a light characteristics detection unit according to an embodiment.

[0047] Figure 16 is a graph illustrating a flicker index according to an embodiment.

[0048] Explanation of symbols:

[0049] 10: Optical measuring device 100: Light sensor

[0050] 200: Learner 210: First domain transformation unit

[0051] 220: Weight application unit 230: Classification unit

[0052] 300: Filter generator 310: Frequency domain receiver

[0053] 320: Range calculation unit 330: Second domain conversion unit

[0054] 400: Frequency modeling unit 500: Optical characteristics detection unit

[0055] 20: First display module 21: First display panel

[0056] 22: First circuit board 23: Display driver

[0057] 24: Scanning drive unit 30: Second display module

[0058] 31: Second display panel 32: Lighting pad

[0059] 33: Second circuit board 34: Lighter

[0060] 35: Scanning drive unit DETAILED DESCRIPTION

[0061] The advantages and features of the present invention, as well as methods for achieving these advantages and features, will become apparent by referring to the embodiments described in detail below in conjunction with the accompanying drawings. However, the present invention may be implemented in a variety of different forms and is not limited to the embodiments disclosed below. These embodiments are provided only to complete the disclosure of the present invention and are intended to fully inform those with ordinary knowledge in the technical field to which the present invention belongs. The present invention is defined solely by the scope of the claims.

[0062] Although terms such as "first" and "second" are used to describe various components, it is obvious that these components are not limited to these terms. These terms are only used to distinguish one component from another. Therefore, it is obvious that the first component mentioned below can also be the second component within the technical concept of the present invention.

[0063] Each feature of the multiple embodiments of the present invention can be combined or combined with each other partially or as a whole, and can achieve multiple technical linkages and drives. Moreover, the various embodiments can be implemented independently of each other, or can be implemented together in a related relationship.

[0064] Hereinafter, specific embodiments will be described with reference to the accompanying drawings.

[0065] Figure 1 is a diagram showing an optical measuring device according to an embodiment, Figure 2 is a block diagram showing a learner of an optical measurement device according to an embodiment, Figure 3 is a block diagram illustrating a filter generator of an optical measuring device according to an embodiment.

[0066] Reference Figures 1 to 3 The optical measurement device 10 can measure the light waveform of an illumination device or an image display device and calculate the light characteristic index of the corresponding light waveform. For example, the optical measurement device 10 can measure the light waveform of a display panel or a display module and calculate the light characteristic index of the corresponding light waveform caused by the display panel, the light characteristic index caused by the display module, or the light characteristic index caused by the display driver.

[0067] The first display module 20 may include a first display panel 21, a first circuit board 22, and a display driver 23. The display area DA of the first display panel 21 may include data lines, scan lines, voltage supply lines, and a plurality of pixels connected to the corresponding data lines and scan lines. The non-display area NDA of the first display panel 21 may include a scan driver (not shown) that applies scan signals to the scan lines, and a pad PAD connected to the display driver 23.

[0068] The first circuit board 22 can be attached to the pad PAD using an anisotropic conductive film. The display driver 23 can be disposed on the first circuit board 22 to drive the first display panel 21 according to a predetermined driving frequency. For example, the display driver 23 can be formed as an integrated circuit (IC) and mounted on the first circuit board 22.

[0069] For example, the display driver 23 can drive the first display panel 21 through a refresh period and a hold period within multiple frames. During the refresh period, the display driver 23 can initialize the data voltage for each of the multiple pixels. By adjusting the refresh period, the display driver 23 controls the initialization and update speeds of the data voltages, thereby reducing power consumption and preventing degradation of the pixel's drive transistors and light-emitting elements. For example, when displaying a still image that does not require rapid data voltage updates, the display driver 23 can reduce the initialization and update speeds of the data voltages and drive the display at a low speed, thereby reducing power consumption.

[0070] Therefore, the first display module 20 can be driven by the display driver 23, so that the first light waveform OW1 emitted from the first display module 20 can have frequency characteristics caused by the first display panel 21 and the frequency characteristics caused by the display driver 23. The optical measurement device 10 can learn the frequency characteristics caused by the first display panel 21 and the frequency characteristics caused by the display driver 23 by learning the frequency characteristics of the first light waveform OW1 emitted from the first display module 20.

[0071] The second display module 30 may include a second display panel 31, a lighting pad 32, a second circuit board 33, and a lighting device 34. The display area DA of the second display panel 31 may include data lines, scan lines, voltage supply lines, and a plurality of pixels connected to the corresponding data lines and scan lines. The non-display area NDA of the second display panel 31 may include a scan driver (not shown) that applies a scan signal to the scan line and a first pad PAD1 connected to the second pad PAD2. For example, the second display panel 31 may have the same specifications as the first display panel 21, and the first display panel 21 and the second display panel 31 may have differences in how they are driven by the display driver 23 or the lighting device 34.

[0072] The lighting pad 32 can be arranged on one side of the second display panel 31, and the second pad PAD2 of the lighting pad 32 can be connected to the first pad PAD1 of the second display panel 31. The lighting pad 32 can be connected to the igniter 34 during the testing of the second display panel 31, and can be removed from the second display panel 31 after the testing of the second display panel 31 is completed.

[0073] The second circuit board 33 can be adhered to the second pad PAD2 using an anisotropic conductive film. The igniter 34 can provide a lighting voltage or a driving voltage to the second display panel 31 via the second circuit board 33 and the second pad PAD2. For example, the igniter 34 can provide a DC lighting voltage to each of the multiple pixels via the data lines of the second display panel 31, and can provide a DC driving voltage to each of the multiple pixels via the voltage supply lines of the second display panel 31.

[0074] Therefore, the second display module 30 is driven by the lighting device 34 , so that the second light waveform OW2 emitted from the second display module 30 may have a frequency characteristic caused by the second display panel 31 .

[0075] After testing the second display module 30 driven by the igniter 34, the second display panel 31 can be used as the first display panel 21 of the first display module 20. After testing the second display module 30, testing of the first display module 20 driven by the display driver 23 can be performed. Therefore, after testing both the first display module 20 and the second display module 30, the light characteristic index caused by the display panel can be detected based on the test results of the second display module 30, and the light characteristic index caused by the display driver 23 can be detected based on the test results of the first display module 20.

[0076] The optical measurement device 10 can learn the frequency characteristics of the first light waveform OW1 of the reference object and detect a frequency characteristic identical or similar to the first light waveform OW1 from the second light waveform OW2 of the measurement object. The optical measurement device 10 can learn the frequency characteristics of the first light waveform OW1 emitted by the first display module 20 and measure a frequency characteristic identical or similar to the first light waveform OW1 from the second light waveform OW2 emitted by the second display module 30. Therefore, the optical measurement device 10 can use the results of the frequency characteristic learning to measure the frequency characteristics of the first light waveform OW1 from the second light waveform OW2 and can use the test results of the second display module 30 to omit the testing process of the first display module 20. The optical measurement device 10 can omit the testing process of the first display module 20 after the learning of the first display module 20 is completed, thereby reducing costs and time in the manufacturing process of the display device or display module.

[0077] The optical measuring device 10 may include a light sensor 100 , a learner 200 , a filter generator 300 , a frequency modeling section 400 , and a light characteristic detection section 500 .

[0078] The light sensor 100 may be in direct contact with the first display module 20 or the second display module 30 or spaced apart from the first display module 20 or the second display module 30 to measure the first light waveform OW1 of the first display module 20 or the second light waveform OW2 of the second display module 30. For example, the light sensor 100 may measure the brightness of light emitted from the first display module 20 or the second display module 30 and may convert the measured brightness into a voltage.

[0079] The learner 200 can receive a first light waveform OW1 of a reference object from the optical sensor 100 and learn the frequency characteristics of the first light waveform OW1. The learner 200 can receive a first light waveform OW1 of a reference object or a second light waveform OW2 of a measurement object from the optical sensor 100 and learn the frequency characteristics of the first light waveform OW1 or the second light waveform OW2. The learner 200 can receive a first light waveform OW1 of a first display module 20 or a second light waveform OW2 of a second display module 30 from the optical sensor 100 and learn the frequency characteristics of the first light waveform OW1 or the second light waveform OW2. The learner 200 may include a first domain transformation unit 210, a weight application unit 220, and a classification unit 230.

[0080] The first domain converter 210 can receive the first optical waveform OW1 from the optical sensor 100 and convert it into the frequency domain. The first optical waveform OW1 can be represented in the time domain, and the first domain converter 210 can convert the first optical waveform OW1 in the time domain into the frequency domain. Therefore, the first domain converter 210 can represent the first optical waveform OW1 as a magnitude value based on frequency. For example, the first domain converter 210 can use a fast Fourier transform (FFT) to convert the domain of the first optical waveform OW1, but this is not limiting.

[0081] The weight application unit 220 may apply at least one weight filter to the output values ​​of the first domain transformation unit 210. The output values ​​of the first domain transformation unit 210 may be frequency-domain values ​​of the first optical waveform OW1. The output values ​​of the first domain transformation unit 210 may include frequency-dependent magnitude values ​​of the first optical waveform OW1. The weight application unit 220 may apply frequency-dependent weights to the frequency-domain values ​​of the first optical waveform OW1 to extract the frequency characteristics of the first optical waveform OW1. Therefore, the learner 200 can more easily grasp the frequency characteristics of the first optical waveform OW1.

[0082] The weight application unit 220 may include at least one weight filter. For example, the weight application unit 220 may include a first weight filter and a second weight filter. The first weight filter and the second weight filter may have different weights for each of the multiple frequencies. The weight values ​​of the first weight filter and the second weight filter may be preset according to the use and purpose of the optical measurement device 10. For example, the weight values ​​of the first weight filter and the second weight filter may be preset by the user. As another example, the weight values ​​of the first weight filter and the second weight filter may be updated based on repeated learning of the frequency characteristics. As yet another example, the weight values ​​of the first weight filter and the second weight filter may be preset by the user and then changed by the user, and may reflect the learning results of the frequency characteristics.

[0083] The weight application unit 220 can apply an activation function to the output value of at least one weight filter. For example, when the output value of the weight filter for a predetermined frequency (fk, k is a natural number greater than 1) is close to 1, the activation function can output a value of 1 (h(fk)=1), and when the output value of the weight filter for a predetermined frequency (fk) is close to 0, the activation function can output a value of 0 (h(fk)=0). As another example, when learning the frequency characteristics of the first light waveform OW1 for the first display module 20, the activation function can output a value of 1 (h(fk)=1), and when learning the frequency characteristics of the second light waveform (OW2) for the second display module 30, the activation function can output a value of 0 (h(fk)=0). Therefore, the weight application unit 220 can use the activation function to change the output of the weight application unit 220 to a nonlinear value.

[0084] The classifier 230 can distinguish the type of the first optical waveform OW1 based on the output value of the weight application unit 220. Alternatively, the classifier 230 can distinguish the type of the first optical waveform OW1 or the second optical waveform OW2 based on the output value of the weight application unit 220. For example, if the output value of the weight application unit 220 is 1, the classifier 230 can determine that the corresponding optical waveform is the optical waveform of the first display module 20. If the output value of the weight application unit 220 is 0, the classifier 230 can determine that the corresponding optical waveform is the optical waveform of the second display module 30.

[0085] Therefore, the learner 200 can receive the first light waveform OW1 of the reference object or the second light waveform OW2 of the measurement object from the optical sensor 100 and learn the frequency characteristics of the first light waveform OW1 or the second light waveform OW2. The learning result of the learner 200 can be reflected in the filter generation process of the filter generator 300.

[0086] The filter generator 300 can analyze the frequency characteristics of the first light waveform OW1 and generate a frequency filter. Based on the output value of the first domain conversion unit 210 for each of the multiple reference objects, the filter generator 300 can calculate the range of frequency domain values ​​of the first light waveform OW1 for the multiple reference objects, and transform the calculated value into the time domain to generate the frequency filter. For example, the filter generator 300 can calculate the range of frequency domain values ​​of the first light waveform OW1 based on the output value of the first domain conversion unit 210 for each of the multiple first display modules 20, and transform the calculated value into the time domain to generate the frequency filter.

[0087] The filter generator 300 may include a frequency domain receiving section 310 , a range calculating section 320 , and a second domain transforming section 330 .

[0088] The frequency domain receiving unit 310 may receive the output value of the first domain transform unit 210 for each of the plurality of reference objects and provide the value to the range calculating unit 320. For example, the frequency domain receiving unit 310 may receive the output value of the first domain transform unit 210 for each of the plurality of first display modules 20. Therefore, the frequency domain receiving unit 310 may receive the frequency domain value of each of the plurality of first light waveforms OW1 and provide the value to the range calculating unit 320.

[0089] The range calculation unit 320 can calculate the range of frequency domain values ​​of the first light waveform OW1 of multiple reference objects. The range calculation unit 320 can calculate the range of frequency domain values ​​of the first light waveform OW1 for each of the multiple first display modules 20. For example, the range calculation unit 320 can calculate the range of magnitudes of the first light waveform OW1 by frequency. The range of magnitudes of the first light waveform OW1 by frequency can correspond to the statistical frequency characteristics of the frequency domain values ​​of the first light waveform OW1.

[0090] The second domain transform unit 330 can transform the output value of the range calculation unit 320 into the time domain to generate a frequency filter. The output value of the range calculation unit 320 can be represented in the frequency domain, and the second domain transform unit 330 can transform the range of frequency magnitudes into the time domain. Therefore, the second domain transform unit 330 can generate a frequency filter represented in the time domain. For example, the second domain transform unit 330 can transform the domain of the output value of the range calculation unit 320 using an inverse fast Fourier transform (IFFT), but this is not necessarily limited to this.

[0091] For example, the frequency filter of the filter generator 300 may be a bandpass filter that passes a specific frequency band in the first optical waveform OW1. As another example, the frequency filter of the filter generator 300 may be a lowpass filter, a highpass filter, a bandstop filter, or an allpass filter.

[0092] The frequency modeling unit 400 can receive the second optical waveform OW2 of the measurement object from the optical sensor 100 and model the frequency characteristics of the second optical waveform OW2. The frequency modeling unit 400 can receive the second optical waveform OW2 from the second display module 30 from the optical sensor 100 and transform it into the frequency domain. The second optical waveform OW2 can be represented in the time domain, and the frequency modeling unit 400 can transform the second optical waveform OW2 in the time domain into the frequency domain. Therefore, the frequency modeling unit 400 can represent the second optical waveform OW2 using frequency-dependent magnitude values. For example, the frequency modeling unit 400 can transform the domain of the second optical waveform OW2 using a fast Fourier transform (FFT), but this is not necessarily limited to this.

[0093] The optical characteristics detection unit 500 can calculate an optical characteristics index of the second light waveform OW2 based on the output value of the frequency modeling unit 400 and the frequency filter generated by the filter generator 300. Here, the optical characteristics index of the second light waveform OW2 indicates the extent to which the second light waveform OW2 shares the frequency characteristics of the first light waveform OW1. For example, the higher the optical characteristics index of the second light waveform OW2, the more similar the frequency characteristics of the second light waveform OW2 and the first light waveform OW1 may be. Furthermore, when the optical characteristics index of the second light waveform OW2 is high, the second light waveform OW2 of the second display module 30 and the first light waveform OW1 of the first display module 20 may have similar frequency characteristics.

[0094] The light characteristics detection unit 500 applies a frequency filter and a flicker filter to the output value of the frequency modeling unit 400 to calculate a flicker index of the second light waveform OW2. The flicker index of the second light waveform OW2 indicates the degree to which flicker in the second light waveform OW2 is caused by the display driver 23. For example, the flicker filter may be a contrast sensitivity function, but this is not necessarily limited to this. The higher the flicker index of the second light waveform OW2, the more likely the flicker in the second light waveform OW2 caused by the display driver 23 is.

[0095] Therefore, the optical measuring device 10 can use the learning results of the frequency characteristics to measure the frequency characteristics of the first light waveform OW1 from the second light waveform OW2, and can use the test results of the second display module 30 to omit the testing process of the first display module 20. The optical measuring device 10 can omit the testing process of the first display module 20 after the learning of the first display module 20 is completed, and can reduce costs and time in the manufacturing process of the display device or display module.

[0096] The optical measurement device 10 may also include a control unit (not shown). This unit, serving as a central processing unit, controls the overall operation of the optical measurement device 10 and executes functions based on user operations or controls. For example, the control unit controls the operation of the optical sensor 100, learner 200, filter generator 300, frequency modeling unit 400, and optical characteristics detection unit 500, as well as the signal transmission between these components. The control unit also processes external input signals or data.

[0097] The optical measurement device 10 may also include a memory (not shown). The memory can store the operating system of the optical measurement device 10, multiple applications, and externally input data. The memory can also store algorithms and data for calculating optical characteristic indices. For example, the memory can store frequency characteristic learning information, filter information used in the optical measurement device 10, and information about the algorithm for calculating optical characteristic indices. The information stored in the memory can be updated based on repeated frequency characteristic learning.

[0098] Figure 4 It shows Figure 1 FIG. 1 shows a diagram of a first display module.

[0099] Reference Figure 4 The first display module 20 may include a first display panel 21 , a first circuit board 22 and a display driving unit 23 .

[0100] The first display panel 21 can be formed as a plane having a rectangular shape with a short side in a first direction (X-axis direction) and a long side in a second direction (Y-axis direction) intersecting the first direction (X-axis direction). The corner (Corner) where the short side in the first direction (X-axis direction) and the long side in the second direction (Y-axis direction) intersect can be smoothly formed or formed as a right angle in a manner having a predetermined curvature. The planar shape of the first display panel 21 is not limited to a quadrilateral, and can be formed as other polygons, a circle or an ellipse. The first display panel 21 can be formed flat, but is not limited to this, and can include a curved portion formed at the left and right ends and having a predetermined curvature or a varying curvature. In addition, the first display panel 21 can be formed flexibly so as to be able to bend, bend, fold or curl.

[0101] The first display panel 21 may include a display area DA formed by pixels SP to display an image, and a non-display area NDA surrounding the display area DA. The display area DA may include pixels SP, scan lines SL connected to the pixels SP, emission control lines EL, data lines DL, and voltage supply lines VL. The scan lines SL and emission control lines EL may be arranged side by side along a first direction (X-axis direction), and the data lines DL and voltage supply lines VL may be arranged side by side along a second direction (Y-axis direction) that intersects the first direction (X-axis direction).

[0102] Each pixel SP may be connected to at least one scan line SL, at least one data line DL, at least one emission control line EL, and at least one voltage supply line VL. Each pixel SP may be connected to two scan lines SL, one data line DL, one emission control line EL, and one voltage supply line VL, but the present invention is not limited thereto. As another example, each pixel SP may be connected to three scan lines SL.

[0103] Each pixel SP may include a driving transistor, at least one switching transistor, a light-emitting element, and at least one capacitor. When a scan signal is applied from a scan line SL, the switching transistor may be turned on, whereby the data voltage of the data line DL may be applied to the gate electrode of the driving transistor. The driving transistor may provide a driving current to the light-emitting element according to the data voltage applied to the gate electrode, and the light-emitting element may emit light with a predetermined brightness according to the magnitude of the driving current. For example, the driving transistor and the at least one switching transistor may be a thin film switching transistor (TFT). The light-emitting element may be an organic light emitting diode (OLED) including a first electrode, an organic light-emitting layer, and a second electrode. The capacitor may constantly maintain the data voltage applied to the gate electrode of the driving transistor.

[0104] The non-display area NDA may be defined as an area extending from the outer side of the display area DA to the edge of the first display panel 21. The non-display area NDA may include a scan driver 24 that applies scan signals to the scan lines SL, and a pad PAD connected to the display driver 23. For example, the pad PAD may be disposed on one side edge of the first display panel 21.

[0105] The first circuit board 22 can be attached to the pad PAD using an anisotropic conductive film. This allows the leads of the first circuit board 22 to be electrically connected to the pad PAD. The first circuit board 22 can be a flexible printed circuit board (FPC), a printed circuit board (PCB), or a flexible film such as a chip on film (CFP).

[0106] The display driver 23 can be disposed on the first circuit board 22 and drive the first display panel 21 according to a predetermined driving frequency. The display driver 23 can provide a scan control signal SCS to the scan driver 24 via a plurality of scan control lines SCL. The display driver 23 can provide a first drive voltage VDD, a second drive voltage VSS, and an initialization voltage Vint to the plurality of pixels SP via a voltage supply line VL. The display driver 23 can provide data voltages VDR, VDG, and VDB to the plurality of pixels SP via data lines DL. For example, the display driver 23 can be formed as an integrated circuit IC and mounted on the first circuit board 22.

[0107] For example, the display driver 23 can drive the first display panel 21 through a refresh period and a hold period within multiple frames. During the refresh period, the display driver 23 can initialize the data voltage for each of the multiple pixels. By adjusting the refresh period, the display driver 23 controls the initialization and update speeds of the data voltages, thereby reducing power consumption and preventing degradation of the pixel's drive transistors and light-emitting elements. For example, when displaying a still image that does not require rapid data voltage updates, the display driver 23 can reduce the initialization and update speeds of the data voltages to drive the display at a low speed, thereby reducing power consumption.

[0108] Therefore, the first display module 20 can be driven by the display driver 23, and the first light waveform OW1 emitted from the first display module 20 can have frequency characteristics caused by the first display panel 21 and the display driver 23. The optical measurement device 10 can learn the frequency characteristics caused by the first display panel 21 and the display driver 23 by learning the frequency characteristics of the first light waveform OW1 emitted from the first display module 20.

[0109] The scan driver 24 may be connected to the display driver 23 via a plurality of scan control lines SCL. The scan driver 24 may receive a scan control signal SCS from the display driver 23 via the plurality of scan control lines SCL.

[0110] Figure 5 It shows Figure 1 Here, Figure 5 The second display panel 31 is a Figure 4 The first display panel 21 has the same specifications as the display panel 21, and the same configuration as the above configuration will be briefly described or omitted.

[0111] Reference Figure 5 The second display module 30 may include a second display panel 31, a lighting pad 32, a second circuit board 33, a lighting device 34, and a scan driver 35. The display area DA of the second display panel 31 may include data lines, scan lines, voltage supply lines, and a plurality of pixels connected to the corresponding data lines and scan lines. The non-display area NDA of the second display panel 31 may include: a scan driver 35 that applies scan signals to the scan lines; and a first pad PAD1 connected to a second pad PAD2. For example, the second display panel 31 may have the same specifications as the first display panel 21, and the first display panel 21 and the second display panel 31 may have different driving methods by the display driver 23 or the lighting device 34.

[0112] The lighting pad 32 can be arranged on one side of the second display panel 31, and the second pad PAD2 of the lighting pad 32 can be connected to the first pad PAD1 of the second display panel 31. The lighting pad 32 can be connected to the igniter 34 during the testing of the second display panel 31, and can be removed from the second display panel 31 after the testing of the second display panel 31 is completed.

[0113] The second circuit board 33 can be adhered to the second pad PAD2 using an anisotropic conductive film. The igniter 34 can provide a lighting voltage or a driving voltage to the second display panel 31 through the second circuit board 33 and the second pad PAD2. For example, the igniter 34 can provide a scan control signal SCS to the scan driver 35 through a plurality of scan control lines SCL. The igniter 34 can provide a first driving voltage VDD, a second driving voltage VSS, and an initialization voltage Vint to a plurality of pixels SP through a voltage supply line VL. The igniter 34 can provide DC lighting voltages DCR, DCG, and DCB to a plurality of pixels SP through a data line DL. Therefore, the second display module 30 is driven by the igniter 34, so that the second light waveform OW2 emitted from the second display module 30 can have a frequency characteristic caused by the second display panel 31.

[0114] After the test of the second display module 30 driven by the igniter 34 is completed, the second display panel 31 can be used as the first display panel 21 of the first display module 20. After the test of the second display module 30 is completed, the test of the first display module 20 driven by the display driver 23 can be performed. Therefore, when the tests of both the first display module 20 and the second display module 30 are completed, the light characteristic index caused by the display panel can be detected based on the test results of the second display module 30, and the light characteristic index caused by the display driver 23 can be detected based on the test results of the first display module 20.

[0115] The scan driver 35 may be connected to the lamp 34 via a plurality of scan control lines SCL. The scan driver 35 may receive a scan control signal SCS from the lamp 34 via the plurality of scan control lines SCL.

[0116] Figure 6 is a sequence diagram illustrating a calculation process of a light characteristic index according to an embodiment.

[0117] Reference Figure 6 The light sensor 100 may measure the first light waveform OW1 of the first display module 20 (S110) by being in direct contact with the first display module 20 or spaced apart from the first display module 20. For example, the light sensor 100 may measure the brightness of light emitted from the first display module 20 and may convert the measured brightness into a voltage.

[0118] The learner 200 may receive the first light waveform OW1 of the reference object from the optical sensor 100 and learn the frequency characteristics of the first light waveform OW1 (S120). For example, the learner 200 may receive the first light waveform OW1 of the first display module 20 or the second light waveform OW2 of the second display module 30 from the optical sensor 100 and learn the frequency characteristics of the first light waveform OW1 or the second light waveform OW2.

[0119] The filter generator 300 may analyze the frequency characteristics of the first light waveform OW1 and generate a frequency filter (S130). For example, the filter generator 300 may calculate a range of frequency domain values ​​of the first light waveform OW1 based on the output value of the first domain conversion unit 210 for each of the plurality of first display modules 20, and may convert the calculated value into the time domain to generate a frequency filter.

[0120] The light sensor 100 may measure the second light waveform OW2 of the second display module 30 in direct contact with or spaced apart from the second display module 30 (S140). For example, the light sensor 100 may measure the brightness of light emitted from the second display module 30 and may convert the measured brightness into a voltage.

[0121] The frequency modeling unit 400 may receive the second light waveform OW2 of the measurement object from the optical sensor 100 and model the frequency characteristics of the second light waveform OW2 ( S150 ). The frequency modeling unit 400 may transform the second light waveform OW2 of the second display module 30 into the frequency domain, thereby representing the second light waveform OW2 as a magnitude value based on frequency.

[0122] The light characteristics detection unit 500 may calculate a light characteristics index of the second light waveform OW2 based on the output value of the frequency modeling unit 400 and the frequency filter generated by the filter generator 300 (S160). For example, the light characteristics detection unit 500 may apply a frequency filter and a flicker filter to the output value of the frequency modeling unit 400 to calculate the flicker index of the second light waveform OW2.

[0123] Figure 7 is a graph showing a frequency domain of a first optical waveform according to an embodiment, Figure 8 is a diagram illustrating a frequency characteristic learning process of a learner according to an embodiment.

[0124] Reference Figure 7 as well as Figure 8 The first domain conversion unit 210 can receive the first light waveform OW1 from the optical sensor 100 and convert it into the frequency domain FD1. The first domain conversion unit 210 can receive the first light waveform OW1 of multiple reference objects from the optical sensor 100. Here, the multiple reference objects can be multiple first display modules 20 to be used for frequency characteristic learning. For example, the number of reference objects used for frequency characteristic learning can be hundreds or thousands. However, for ease of explanation, the following description uses the first to third reference objects MOD1, MOD2, and MOD3 as examples.

[0125] Figure 7In the example, the first reference object MOD1 can correspond to a first display module 20 driven at a 10 Hz drive frequency, the second reference object MOD1 can correspond to another first display module 20 driven at a 10 Hz drive frequency, and the third reference object MOD3 can correspond to yet another first display module 20 driven at a 30 Hz drive frequency. The frequency domains FD1 of the first and second reference objects MOD1 and MOD2 can each have a peak at multiples of 10 Hz, while the frequency domain FD1 of the third reference object MOD3 can have a peak at multiples of 30 Hz. Therefore, the frequency domains FD1 of the first through third reference objects MOD1, MOD2, and MOD3 can each have a peak at multiples of the drive frequency. The first through third frequency waveforms FW1, FW2, and FW3 of the first through third reference objects MOD1, MOD2, and MOD3 can each be represented as a curve by connecting the peaks located at multiples of the drive frequency.

[0126] exist Figure 8 In the embodiment, the first domain converter 210 may receive the first optical waveform OW1 of the first reference object MOD1 and convert it into the frequency domain FD1. The frequency domain FD1 of the first reference object MOD1 may have peaks at multiples of 10 Hz. The output value of the first domain converter 210 may include frequency-dependent magnitude values ​​of the first optical waveform OW1 of the first reference object MOD1.

[0127] The weight application unit 220 can apply at least one weight filter to the output value of the first domain transformation unit 210. The weight application unit 220 can extract the frequency characteristics of the first optical waveform OW1 by applying frequency-specific weights to the frequency-domain values ​​of the first optical waveform OW1. Therefore, the learner 200 can more easily grasp the frequency characteristics of the first optical waveform OW1.

[0128] The weight application unit 220 may include a first weight filter WT1 and a second weight filter WT2. The first weight filter WT1 and the second weight filter WT2 each have different weights for each of a plurality of frequencies f1 to fk (k is a natural number greater than or equal to 1). The first weight filter WT1 may apply a weight according to frequency to the output value of the first domain transformation unit 210, and the second weight filter WT2 may apply a weight according to frequency to the output value of the first weight filter WT1. The weight values ​​of the first weight filter WT1 and the second weight filter WT2 may be preset according to the use and purpose of the optical measuring device 10. As an example, the weight values ​​of the first weight filter WT1 and the second weight filter WT2 may be preset by a user. As another example, the weight values ​​of the first weight filter WT1 and the second weight filter WT2 may be updated based on repeated learning of frequency characteristics. As yet another example, after the weight values ​​of the first weight filter WT1 and the second weight filter WT2 are preset by the user, they may be changed by the user and may reflect the learning results of the frequency characteristics.

[0129] The weight application unit 220 can apply the activation function ACT to the output value of the second weight filter WT2. As an example, when the output value of the second weight filter WT2 for a predetermined frequency fk (k is a natural number greater than 1) is close to 1, the activation function ACT can output a value of 1 (h(fk)=1), and when the output value of the second weight filter WT2 for a predetermined frequency fk is close to 0, the activation function ACT can output a value of 0 (h(fk)=0). As another example, when learning the frequency characteristics of the first light waveform OW1 for the first display module 20, the activation function ACT can output a value of 1 (h(fk)=1), and when learning the frequency characteristics of the second light waveform OW2 for the second display module 30, the activation function ACT can output a value of 0 (h(fk)=0). Therefore, the weight application unit 220 can use the activation function ACT to change the output of the weight application unit 220 to a nonlinear value.

[0130] The classifier 230 can distinguish the type of the first optical waveform OW1 based on the output value of the weight application unit 220. Alternatively, the classifier 230 can distinguish the type of the first optical waveform OW1 or the second optical waveform OW2 based on the output value of the weight application unit 220. For example, if the output value of the weight application unit 220 is 1, the classifier 230 can determine that the corresponding optical waveform is the first optical waveform OW1 of the first display module 20. If the output value of the weight application unit 220 is 0, the classifier 230 can determine that the corresponding optical waveform is the second optical waveform OW2 of the second display module 30.

[0131] Figure 9FIG. 1 is a sequence diagram illustrating a frequency characteristic learning process of a learner according to an embodiment.

[0132] Reference Figure 9 The first domain conversion unit 210 may receive the first light waveform OW1 from the optical sensor 100 (S210), and may convert the first light waveform in the time domain into the frequency domain (S220). For example, the first domain conversion unit 210 may receive the first light waveform OW1 of a plurality of reference objects from the optical sensor 100. Here, the plurality of reference objects may be a plurality of first display modules 20 to be used for learning frequency characteristics.

[0133] The weight application unit 220 may apply at least one weight filter to the output value of the first domain transformation unit 210 ( S230 ). The weight application unit 220 may extract the frequency characteristics of the first optical waveform OW1 by applying frequency-dependent weights to the frequency domain values ​​of the first optical waveform OW1 .

[0134] The classification unit 230 may distinguish the type of the first optical waveform OW1 based on the output value of the weight application unit 220 ( S240 ).

[0135] Figure 10 is a sequence diagram showing a frequency characteristic learning process of a learner according to another embodiment.

[0136] Reference Figure 10 The first domain converter 210 may receive the first optical waveform OW1 or the second optical waveform OW2 from the optical sensor 100 ( S310 ).

[0137] The first domain conversion unit 210 may convert the first light waveform OW1 or the second light waveform OW2 in the time domain into the frequency domain (S320). For example, the first domain conversion unit 210 may receive the first light waveform OW1 of multiple reference objects from the optical sensor 100. The first domain conversion unit 210 may also receive the second light waveform OW2 of multiple measurement objects from the optical sensor 100. Here, the multiple reference objects may be multiple first display modules 20 to be used for learning frequency characteristics, and the multiple measurement objects may be second display modules 30 for calculating light characteristic indices.

[0138] The weight application unit 220 may apply at least one weight filter to the output values ​​of the first domain transformation unit 210 (S330). The weight application unit 220 may apply at least one weight filter to the frequency domain values ​​of the first optical waveform OW1 and at least one weight filter to the frequency domain values ​​of the second optical waveform OW2. The weight application unit 220 may extract the frequency characteristics of the first optical waveform OW1 or the second optical waveform OW2 by applying frequency-dependent weights to the frequency domain values ​​of the first optical waveform OW1 or the second optical waveform OW2.

[0139] The classification unit 230 may distinguish the type of the first optical waveform OW1 or the second optical waveform OW2 based on the output value of the weight application unit 220 ( S340 ).

[0140] The learner 200 can learn the frequency characteristics of the corresponding optical waveform based on the classification result of the classifier 230 (S350). Therefore, the learner 200 receives the first optical waveform OW1 of the reference object or the second optical waveform OW2 of the measurement object from the optical sensor 100 and learns the frequency characteristics of the first optical waveform OW1 or the second optical waveform OW2. The learning results of the learner 200 can be reflected in the filter generation process of the filter generator 300.

[0141] Figure 11 is a graph showing a range of frequency domain values ​​of a first optical waveform according to an embodiment, Figure 12 is a graph illustrating a frequency filter according to an embodiment.

[0142] The filter generator 300 may include a frequency domain receiving section 310 , a range calculating section 320 , and a second domain transforming section 330 .

[0143] Reference Figure 11 as well as Figure 12 The frequency domain receiving unit 310 can receive the output value of the first domain conversion unit 210 for each of the multiple reference objects and provide it to the range calculating unit 320. For example, when the first domain conversion unit 210 converts the first optical waveform OW1 of each of the first through n-th reference objects into the frequency domain FD1, the output value of the first domain conversion unit 210 for each of the first through n-th reference objects can have multiple peaks. The first frequency waveforms FW1 through FWn of the first through n-th reference objects can be displayed as a curve by connecting the multiple peaks.

[0144] The range calculation unit 320 can calculate the range of the first frequency waveform FW1 through the nth frequency waveform FWn for the first through the nth reference objects. For example, the range calculation unit 320 can calculate the range of the first frequency waveform FW1 through the nth frequency waveform FWn by frequency. The range of the first optical waveform OW1 by frequency can correspond to the statistical frequency characteristics of the frequency domain values ​​of the first optical waveform OW1.

[0145] The second domain conversion unit 330 can convert the output value of the range calculation unit 320 into the time domain to generate a frequency filter FT. The output value of the range calculation unit 320 can be represented in the frequency domain, and the second domain conversion unit 330 can convert the range of frequency magnitudes into the time domain. Therefore, the second domain conversion unit 330 can generate a frequency filter FT represented in the time domain. For example, the second domain conversion unit 330 can convert the domain of the output value of the range calculation unit 320 using an inverse fast Fourier transform, but this is not necessarily limited to this method.

[0146] For example, the frequency filter FT of the filter generator 300 may be a bandpass filter that passes a specific frequency band in the first optical waveform OW1. In this case, the frequency filter FT may cut off frequency components below a first cutoff frequency fL and frequency components above a second cutoff frequency fH. Therefore, the frequency filter FT may have a bandwidth between the first cutoff frequency fL and the second cutoff frequency fH.

[0147] Figure 13 FIG. 1 is a sequence diagram illustrating a frequency filter generation process of a filter generator according to an embodiment.

[0148] The filter generator 300 may include a frequency domain receiving section 310 , a range calculating section 320 , and a second domain transforming section 330 .

[0149] Reference Figure 13 The frequency domain receiving unit 310 may receive the frequency domain value of each of the plurality of first optical waveforms OW1 ( S410 ) and may provide the output value of the first domain transform unit 210 for each of the plurality of reference objects to the range calculating unit 320 .

[0150] The range calculation unit 320 may calculate the range of the frequency domain values ​​of the first light waveform OW1 of the plurality of reference objects ( S420 ). The range calculation unit 320 may calculate the range of the frequency domain values ​​of the first light waveform OW1 of each of the plurality of first display modules 20 .

[0151] The second domain conversion unit 330 may convert the output value of the range calculation unit 320 into the time domain ( S430 ). For example, the second domain conversion unit 330 may convert the domain of the output value of the range calculation unit 320 using an inverse fast Fourier transform.

[0152] The second domain converter 330 may generate a frequency filter FT expressed in the time domain ( S440 ). The frequency filter FT may be a bandpass filter that passes a specific frequency band in the first optical waveform OW1 , but is not necessarily limited thereto.

[0153] Figure 14 is a graph showing a flicker filter according to an embodiment, Figure 15FIG. 1 is a diagram illustrating a flicker index calculation process of a light characteristics detection unit according to an embodiment.

[0154] Reference Figure 14 as well as Figure 15 , the light characteristic detection unit 500 can apply the frequency filter FT and the flicker filter CSF to the output value of the frequency modeling unit 400 (a(fk), fk is a frequency from 1 Hz to k Hz), thereby calculating the flicker index (FI(fk)) of the second light waveform OW2 (FI(fk)=a(fk)*b(fk)*c(fk)). Here, a(fk) can be equivalent to the frequency domain value of the second light waveform OW2, b(fk) can be equivalent to the frequency filter FT value in the predetermined frequency fk, and c(fk) can be equivalent to the flicker filter value CSF Value in the predetermined frequency fk. Here, the flicker index (FI(fk)) of the second light waveform OW2 represents the degree to which the flicker phenomenon generated from the second light waveform OW2 is caused by the display driving unit 23. Figure 14 The flicker filter CSF may be a contrast sensitivity function (CSF), but is not necessarily limited thereto. The higher the flicker index (FI(fk)) of the second light waveform OW2 is, the greater the degree of flicker in the second light waveform OW2 caused by the display driver 23 may be.

[0155] Figure 16 is a graph illustrating a flicker index according to an embodiment. Figure 16 The driving frequencies (fd) of the illustrated first to third reference objects MOD1 , MOD2 , MOD3 may be different from the driving frequencies (fd) of the first to third reference objects MOD1 , MOD2 , MOD3 described above.

[0156] Reference Figure 16 The waveform of the flicker index (FI) of each of the first to third reference objects MOD1 , MOD2 , and MOD3 may have a period (T) corresponding to the driving frequency (fd) of the corresponding reference object (T=1 / fd).

[0157] The waveform of the flicker index (FI) of the first reference object MOD1 may have a first ripple value RIP1, the waveform of the flicker index (FI) of the second reference object MOD2 may have a second ripple value RIP2, and the waveform of the flicker index (FI) of the third reference object MOD3 may have a third ripple value RIP3. Here, the ripple value may correspond to the difference between the maximum and minimum values ​​of the flicker index (FI). A larger ripple value of the flicker index (FI) indicates an increased degree of flicker in the second light waveform OW2 caused by the display driver 23.

[0158] For example, the flicker phenomenon of the second light waveform OW2 caused by the display driver 23 may occur relatively most in the first reference object MOD1 , and the flicker phenomenon of the second light waveform OW2 caused by the display driver 23 may occur relatively little in the third reference object MOD3 .

[0159] Therefore, the optical measurement device 10 can use the frequency characteristic learning results to measure the frequency characteristics of the first light waveform OW1 from the second light waveform OW2, and can use the test results of the second display module 30 to omit the testing process of the first display module 20. After the learning of the first display module 20 is completed, the optical measurement device 10 can omit the testing process of the first display module 20, thereby reducing costs and time in the manufacturing process of the display device or display module.

[0160] While the embodiments of the present invention have been described above with reference to the accompanying drawings, it will be understood by those skilled in the art that the present invention may be implemented in other specific forms without changing the technical concept or essential features of the present invention. Therefore, the embodiments described above should be considered in all respects as illustrative rather than restrictive.

Claims

1. An optical measuring device comprising: A light sensor that measures the light waveform of a reference object or a measurement object; a learner that receives a first light waveform of the reference object from the light sensor, thereby learning a frequency characteristic of the first light waveform; a filter generator that analyzes the frequency characteristics of the first optical waveform to generate a frequency filter; a frequency modeling unit that receives a second light waveform of the measurement object from the optical sensor, thereby modeling a frequency characteristic of the second light waveform; as well as an optical characteristic detection unit that calculates an optical characteristic index of the second light waveform based on an output value of the frequency modeling unit and the frequency filter, The optical characteristic index of the second optical waveform indicates the extent to which the second optical waveform has the frequency characteristics of the first optical waveform.

2. The optical measuring device according to claim 1, wherein The reference object is a display module, and the display module includes: a first display panel; and a display driving unit that provides a data voltage to the first display panel according to a predetermined driving frequency.

3. The optical measuring device according to claim 1, wherein The learner comprises: a first domain conversion unit, receiving the first optical waveform and converting it into a frequency domain; a weight application unit that applies at least one weight filter to the output value of the first domain transformation unit; and The classifying unit classifies the first optical waveform into types based on the output value of the weight applying unit.

4. The optical measuring device according to claim 3, wherein: The first domain conversion unit converts the domain of the first optical waveform using fast Fourier transform.

5. The optical measuring device according to claim 3, wherein: The at least one weighting filter includes a plurality of weights corresponding to frequency components of the first light waveform, respectively.

6. The optical measuring device according to claim 3, wherein: The weight application section applies an activation function to an output value of the at least one weight filter.

7. The optical measuring device according to claim 3, wherein: The learner receives a second optical waveform of the measurement object, thereby learning a frequency characteristic of the second optical waveform.

8. The optical measuring device according to claim 7, wherein: The learner transforms the first optical waveform or the second optical waveform into a frequency domain and applies at least one weight filter to the frequency domain, thereby learning a frequency characteristic of the first optical waveform or the second optical waveform.

9. The optical measuring device according to claim 3, wherein: The first domain conversion unit outputs a plurality of output values ​​corresponding to the first optical waveform of each of the plurality of reference objects, and the filter generator calculates a range of a plurality of frequency domain values ​​of the plurality of first optical waveforms according to frequency based on the plurality of output values, and converts the calculated values ​​into the time domain to generate a frequency filter.

10. The optical measuring device according to claim 3, wherein: The filter generator generates a bandpass filter that passes a specific frequency band in the first light waveform.

11. The optical measuring device according to claim 1, wherein: The measurement object is a second display panel that receives a DC voltage from a lighting device and emits light.

12. The optical measuring device according to claim 1, wherein The frequency modeling unit transforms the second optical waveform into a frequency domain to model the frequency characteristics of the second optical waveform.

13. The optical measuring device according to claim 1, wherein The light characteristic detection unit calculates a flicker index of the second light waveform by applying the frequency filter and the flicker filter to the output value of the frequency modeling unit.

14. The optical measuring device according to claim 13, wherein: The flicker filter is a contrast sensitivity function.

15. An optical measuring device comprising: a learner configured to receive a first light waveform from a first display module and learn a frequency characteristic of the first light waveform, wherein the first display module includes a first display panel and a display driver, the display driver providing a data voltage to the first display panel according to a predetermined driving frequency; a filter generator that analyzes the frequency characteristics of the first optical waveform to generate a frequency filter; a frequency modeling unit that receives a second light waveform of a second display panel that receives a DC voltage from a lighting device, thereby modeling a frequency characteristic of the second light waveform; and an optical characteristic detection unit that calculates an optical characteristic index of the second light waveform based on an output value of the frequency modeling unit and the frequency filter, The optical characteristic index of the second optical waveform indicates the extent to which the second optical waveform has the frequency characteristics of the first optical waveform.

16. The optical measuring device according to claim 15, wherein The learner comprises: a first domain conversion unit, receiving the first optical waveform and converting it into a frequency domain; a weight application unit that applies at least one weight filter to the output value of the first domain transformation unit; and The classifying unit classifies the first optical waveform into types based on the output value of the weight applying unit.

17. The optical measuring device according to claim 15, wherein: The learner receives the second light waveform of the second display panel, thereby learning the frequency characteristics of the second light waveform.

18. The optical measuring device according to claim 17, wherein: The learner transforms the first optical waveform or the second optical waveform into a frequency domain and applies at least one weight filter to the frequency domain, thereby learning a frequency characteristic of the first optical waveform or the second optical waveform.

19. The optical measuring device according to claim 15, wherein: The light characteristic detection unit calculates a flicker index of the second light waveform by applying the frequency filter and the flicker filter to the output value of the frequency modeling unit.

20. The optical measuring device according to claim 19, wherein The light characteristic detection unit interprets a flicker characteristic of a second display module based on a flicker index of the second light waveform, wherein the second display module includes the second display panel and the display driving unit.

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