A method for realizing an automatic testing system for axis-angle chips

Abstract

The present invention is a method for realizing an automatic test system for an axis-angle chip, in the field of chip automatic test. The method is based on the interface control software developed on the LabView platform, and cooperates with the embedded control software developed on the Keil platform to complete parameter setting, operation control and data acquisition for test and measurement equipment and instruments, realize the communication, data exchange and command control between the computer and the main control board, complete the automatic test process, and realize the test of the voltage and current of the axis-angle chip, the angle conversion accuracy and the integral nonlinear error, the speed accuracy and the maximum tracking speed, the reference signal frequency, the reference center voltage and the DC mismatch, the reference voltage and the AC mismatch, the reference voltage and the reference voltage suppression, and the logic output high level and low level function. The method of the present invention can effectively replace the manual test of the corresponding parameters of the chip, and at the same time improve the test efficiency of the single-chip chip and the reliability of the test data.

Description

Technical Field

[0001] The present invention belongs to the technical field of automatic testing of axis-angle chips, and is used for automatic measurement of chips with axis-angle solving functions. The testing system mainly controls the testing equipment and the main control board by testing software to realize automatic testing of the chip. Background Art

[0002] With the trend of localization of chips, independent research and development is developing rapidly. The independent research and development of axis-angle chips will vigorously promote the development of axis-angle conversion related technical fields. Since the functions and characteristics of axis-angle chips are quite different from other conventional chips, they face more difficulties and problems in research and development, testing and mass production. Manual testing can only meet the basic verification in the research and development stage. In order to improve the production capacity of such chips and realize the fast and reliable test and measurement of the core functions and performance of chips such as angle conversion accuracy, speed accuracy, maximum tracking speed, and output excitation performance, a test system combining software and hardware is needed to realize automatic testing. Summary of the invention

[0003] The technical problem to be solved by the present invention is to address the deficiencies in the prior art and to provide a system for automatically testing the core functions of a specific type of chip through the cooperation of hardware and software, which can effectively replace the manual testing of the corresponding parameters of the chip, while improving the testing efficiency of the single-chip chip and the reliability of the test data.

[0004] The technical problem to be solved by the present invention is achieved through the following technical solutions. The present invention is an implementation method of an automatic test system for axis-angle chips, which is characterized in that: the implementation method is based on the interface control software developed on the LabView platform, and cooperates with the embedded control software developed on the Keil platform to complete parameter setting, operation control and data acquisition for test and measurement equipment and instruments, realize the communication, data exchange and command control between the computer and the main control board, complete the automatic test process, realize the test of the voltage and current of the axis-angle chip, angle conversion accuracy and integral nonlinear error, speed accuracy and maximum tracking speed, reference signal frequency, reference center voltage and DC mismatch, reference voltage and AC mismatch, reference voltage and reference voltage suppression, as well as logic output high level and low level functions, and complete the automatic recording and storage of all data during the test process;

[0005] The hardware equipment tested mainly includes: shaft angle signal source, digital multimeter, programmable power supply, and main control board; all hardware equipment has the ability to communicate with the computer, and the main control board has the ability to communicate with the computer as well as data acquisition and processing capabilities;

[0006] The software tested are interface control software and embedded control software. The interface control software has the capabilities of human-computer interaction, status display and control, and data processing, while the embedded control software has the capabilities of data collection, analysis and control.

[0007] The implementation method of an automatic test system for axis-angle chips described in the present invention, and its further preferred technical solution is: the interface control software completes various configuration settings and equipment control through human-computer interaction, and its process is: determining the model of the chip to be tested, selecting test cases, configuring case parameters, controlling the test instrument, establishing communication with the main control board, sending instructions, data analysis and storage, giving test results, and generating a test report in a predetermined format; the test process of the embedded control software is: communicating with the computer, instruction parsing, chip status control, data acquisition and analysis, and uploading to the computer in a predetermined format.

[0008] The implementation method of an automatic testing system for axis-angle chips described in the present invention, and its further preferred technical solution is: the automatic testing method for the voltage and current of the axis-angle chips is: to control the programmable power supply through the interface control software, configure the voltage value and maximum output current of the two channels of the programmable power supply, and control the on and off of the switch, and when the switch is turned on, start to read the real-time output voltage and output current values ​​of the programmable power supply at a regular interval, and synchronously display them in the voltage and current display area of ​​the interface control software, and by judging whether the difference between the current voltage and current and the preset voltage and current indicators meets the test qualification standard, the switch state of the programmable power supply is controlled to complete the automatic test of the chip voltage and current, and finally record the test data and results.

[0009] The implementation method of an automatic testing system for axis-angle chips described in the present invention, and its further preferred technical solution is: the testing method of the angle conversion accuracy and integral nonlinear error of the axis-angle chips is: the interface control software configures the parameters of the signal source according to the preset parameter group, controls the signal source to receive the reference voltage output by the chip under test, so that the signal source provides the standard test angle to the chip under test as required, and at the same time the interface control software sends a parallel port acquisition or serial port acquisition instruction to the main control board, and the main control board selects the corresponding acquisition method, and quickly and multiple times acquires the current measured angle value at the same angle, analyzes and processes the data according to a certain algorithm, and obtains the integral nonlinear error value and the solution accuracy value respectively, and then uploads the processed data to the computer in real time, and the interface control software completes data statistics, judgment, storage and test result recording.

[0010] The implementation method of the automatic testing system of an axis-angle chip described in the present invention, and its further preferred technical solution is: the testing method of the speed accuracy and maximum tracking speed of the axis-angle chip is: through the interface control software according to the requirements of the test parameter group, the signal source is controlled to output the angle at a certain speed, the main control board receives the control instructions of the interface control software, configures the working state of the chip under test, and selects the corresponding serial port or parallel port to collect speed conversion data, and then uploads the data to the interface control software, and the interface control software completes the data judgment, analysis and storage, and completes the test result recording.

[0011] The implementation method of the automatic testing system of the axis-angle chip described in the present invention, and its further preferred technical scheme is: the testing method of the reference signal frequency of the axis-angle chip is: controlling the digital multimeter to switch to the frequency measurement gear through the interface control software, and sending the control instruction of the reference signal frequency test to the main control board at the same time, the main control board configures the excitation output of the chip under test according to the received instruction, and controls the relay to complete the switching of the digital multimeter test point, and the interface control software retrieves the data on the digital multimeter, judges and stores the data, and completes the test result recording.

[0012] The implementation method of the automatic testing system of an axis-angle chip described in the present invention, and its further preferred technical scheme is: the testing method of the reference center voltage and reference DC mismatch of the axis-angle chip is: controlling the digital multimeter through the interface control software to switch it to the DC voltage test gear, and sending the test instruction to the main control board at the same time, the main control board configures the reference signal of the chip under test according to the instruction, and controls the switching of the test point to between the tested pin and the analog ground, the interface control software reads the DC voltage data on the digital multimeter, directly reads the center voltage value, and calculates the center voltage to obtain the DC mismatch value, and finally completes the judgment, storage and recording of the test results.

[0013] The implementation method of an automatic test system for axis-angle chips described in the present invention, and its further preferred technical solution is: the test method of the reference voltage and reference AC mismatch of the axis-angle chips is: the digital multimeter is controlled to switch to the AC voltage gear through the interface control software, and the test instructions are sent to the main control board at the same time. The main control board configures the reference signal of the chip under test according to the instructions, and controls the switching of the test point to between the tested pin and the analog ground. The interface control software reads the AC voltage data on the digital multimeter, directly reads the reference signal voltage value, and calculates the reference voltage to obtain the AC mismatch value, and finally completes the judgment, storage and recording of the test results.

[0014] The implementation method of an automatic test system for axis-angle chips described in the present invention, and its further preferred technical scheme is: the test method of the reference voltage and reference voltage suppression of the axis-angle chips is: the digital multimeter is controlled to switch to the DC voltage position through the interface control software, and the control instruction of the reference voltage test is sent to the main control board at the same time, the main control board configures the excitation output of the chip under test according to the received instruction, and controls the relay to complete the switching of the digital multimeter test point to the reference voltage output pin, and then the interface control software retrieves the DC voltage data on the digital multimeter, which is the measured reference voltage value, and then the interface software controls the programmable power supply to change the power supply voltage to the chip under test, and the output value of the reference voltage pin is tested again at the upper and lower limits of the power supply voltage, and the reference voltage suppression value is obtained by calculation, and the measured reference voltage and the calculated suppression value are compared, judged, and stored with the standard data respectively to complete the test result recording.

[0015] The implementation method of the automatic testing system of an axis-angle chip described in the present invention, and its further preferred technical scheme is: the testing method of the high level and low level of the logic output of the axis-angle chip is: the digital multimeter is controlled to switch to the AC and DC voltage gear through the interface control software, and when testing the high level, the signal source is controlled to output an angle of 181°, the main control board configures the excitation output of the chip under test according to the received instructions, and controls the relay to complete the switching of the digital multimeter test point to the highest pin of the chip parallel port output data line, and then the interface control software retrieves the DC voltage data on the digital multimeter, when testing the low level, the signal source is controlled to output a 1° angle, and the DC voltage data collection on the highest bit of the parallel port output data line is completed in the same way as the high level test, and finally the interface control software compares the test data with the standard value, completes the judgment and storage, and completes the test result recording.

[0016] Compared with the prior art, the method of the present invention has the following beneficial effects: the present invention is a system for automatically testing the core functions of a specific type of chip through the coordination of hardware and software, which can effectively replace the manual testing of the corresponding parameters of the chip, while improving the testing efficiency of the single-chip chip and the reliability of the test data. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is the structural block diagram of the automatic test system for axis-angle chips;

[0018] Figure 2 It is an automatic test flow chart;

[0019] Figure 3 It is the voltage and current test flow chart;

[0020] Figure 4 This is the flow chart of angle conversion accuracy and integral nonlinear error test;

[0021] Figure 5 It is the flow chart of speed accuracy and maximum tracking speed test;

[0022] Figure 6 It is the reference signal frequency test flow chart;

[0023] Figure 7 is the reference center voltage and DC mismatch test flow chart;

[0024] Figure 8 It is the reference voltage and AC mismatch test flow chart;

[0025] Fig. 9 is a reference voltage and reference voltage suppression test flow chart;

[0026] Fig.10 It is the logic output high level and low level test flow chart. DETAILED DESCRIPTION

[0027] The technical solution of the present invention is further described below with reference to the accompanying drawings so that those skilled in the art can further understand the present invention, but it does not constitute a limitation on the rights of the present invention.

[0028] Embodiment 1, a method for implementing an automatic test system for an axis-angle chip, the method for implementing an interface control software developed based on the LabView platform, in conjunction with an embedded control software developed based on the Keil platform, completes parameter setting, manipulation control and data acquisition for test and measurement equipment and instruments, realizes communication, data exchange and command control between a computer and a main control board, completes an automatic test process, realizes the test of the voltage and current of the axis-angle chip, angle conversion accuracy and integral nonlinear error, speed accuracy and maximum tracking speed, reference signal frequency, reference center voltage and DC mismatch, reference voltage and AC mismatch, reference voltage and reference voltage suppression, as well as logic output high level and low level functions, and completes the automatic recording and storage of all data during the test process;

[0029] The hardware equipment tested mainly includes: shaft angle signal source, digital multimeter, programmable power supply, and main control board; all hardware equipment has the ability to communicate with the computer, and the main control board has the ability to communicate with the computer as well as data acquisition and processing capabilities;

[0030] The software tested are interface control software and embedded control software. The interface control software has the capabilities of human-computer interaction, status display and control, and data processing, while the embedded control software has the capabilities of data collection, analysis and control.

[0031] The interface control software completes various configuration settings and equipment control through human-computer interaction, and its process is: determine the model of the chip to be tested, select test cases, configure case parameters, control the test instrument, establish communication with the main control board, send instructions, analyze and store data, give test results, and generate a test report in a predetermined format; the test process of the embedded control software is: communicate with the computer, parse instructions, control the chip status, collect and analyze data, and upload to the computer in a predetermined format.

[0032] The automatic test method for the voltage and current of the axis angle chip is: to control the programmable power supply through the interface control software, configure the voltage value and maximum output current of the two channels of the programmable power supply, and control the on and off of the switch. When the switch is turned on, the real-time output voltage and output current values ​​of the programmable power supply are read regularly, and synchronously displayed in the voltage and current display area of ​​the interface control software. By judging whether the difference between the current voltage and current and the preset voltage and current indicators meets the test qualification standard, the switch state of the programmable power supply is controlled to complete the automatic test of the chip voltage and current, and finally record the test data and results.

[0033] The test method for the angle conversion accuracy and integral nonlinear error of axis-angle chips is: the interface control software configures the parameters of the signal source according to the preset parameter group, controls the signal source to receive the reference voltage output by the chip under test, so that the signal source provides the standard test angle to the chip under test as required, and at the same time, the interface control software sends parallel port acquisition or serial port acquisition instructions to the main control board, and the main control board selects the corresponding acquisition method. Under the same angle quantity, the current measured angle value is quickly and multiple times acquired, and the data is analyzed and processed according to a certain algorithm to obtain the integral nonlinear error value and the solution accuracy value respectively, and then the processed data is uploaded to the computer in real time, and the interface control software completes data statistics, judgment, storage and test result recording.

[0034] The test method for the speed accuracy and maximum tracking speed of the axis angle chip is: through the interface control software, according to the requirements of the test parameter group, the signal source is controlled to output the angle at a certain speed. The main control board receives the control instructions of the interface control software, configures the working state of the chip under test, and selects the corresponding serial port or parallel port to collect the speed conversion data. The data is then uploaded to the interface control software, which completes the data judgment, analysis and storage, and completes the test result recording.

[0035] The test method for the reference signal frequency of the axis angle chip is: control the digital multimeter to switch to the frequency measurement position through the interface control software, and send the control command of the reference signal frequency test to the main control board. The main control board configures the excitation output of the chip under test according to the received command, and controls the relay to complete the switching of the digital multimeter test point. The interface control software retrieves the data on the digital multimeter, judges and stores the data, and completes the test result recording.

[0036] The test method for the reference center voltage and reference DC mismatch of the axis angle chip is: control the digital multimeter through the interface control software to switch it to the DC voltage test position, and send a test instruction to the main control board at the same time. The main control board configures the reference signal of the chip under test according to the instruction, and controls the switching of the test point to between the tested pin and the analog ground. The interface control software reads the DC voltage data on the digital multimeter, directly reads the center voltage value, and calculates the center voltage to obtain the DC mismatch value, and finally completes the judgment, storage and recording of the test results.

[0037] The test method for the reference voltage and reference AC mismatch of the axis angle chip is: control the digital multimeter to switch to the AC voltage position through the interface control software, and send a test instruction to the main control board at the same time. The main control board configures the reference signal of the chip under test according to the instruction, and controls the switching of the test point to between the tested pin and the analog ground. The interface control software reads the AC voltage data on the digital multimeter, directly reads the reference signal voltage value, and calculates the reference voltage to obtain the AC mismatch value, and finally completes the judgment, storage and recording of the test results.

[0038] The test method for the reference voltage and reference voltage suppression of the axis angle chip is: control the digital multimeter to switch to the DC voltage position through the interface control software, and send the control command of the reference voltage test to the main control board at the same time. The main control board configures the excitation output of the chip under test according to the received command, and controls the relay to complete the switching of the digital multimeter test point to the reference voltage output pin. The interface control software then retrieves the DC voltage data on the digital multimeter, which is the measured reference voltage value. After that, the interface software controls the programmable power supply to change the power supply voltage to the chip under test, and tests the output value of the reference voltage pin again at the upper and lower limits of the power supply voltage. The reference voltage suppression value is obtained by calculation, and the measured reference voltage and the calculated suppression value are compared, judged, and stored with the standard data to complete the test result recording.

[0039] The test method for the high and low levels of the logic output of the axis angle chip is: control the digital multimeter to switch to the AC and DC voltage position through the interface control software. When testing the high level, control the signal source to output an angle of 181°. The main control board configures the excitation output of the chip under test according to the received instructions, and controls the relay to complete the switching of the digital multimeter test point to the highest pin of the chip parallel port output data line. The interface control software then retrieves the DC voltage data on the digital multimeter. When testing the low level, control the signal source to output an angle of 1°, and complete the DC voltage data collection on the highest bit of the parallel port output data line in the same way as the high level test. Finally, the interface control software compares the test data with the standard value, completes the judgment and storage, and completes the test result recording.

[0040] Example 2, Experiment on the implementation method of the automatic testing system for axis-angle chips:

[0041] The test equipment supporting the test system includes: computers, integrated cabinets, high-precision shaft angle signal sources, digital multimeters, multi-channel control power supplies, main control boards, cables, and chip positioning fixtures. The hardware is hard-wired by cables, and controlled, communicated, and combined by software. The interface control software completes human-computer interaction and operation control, realizes communication between computers, test instruments, and main control boards, matches test parameter groups according to predetermined processes, mobilizes test cases, tests the functional indicators of the chip to be tested, analyzes data, makes judgments, and generates reports. Figure 1 .

[0042] Specific test items include: voltage and current, angle conversion accuracy and integral nonlinear error, speed accuracy and maximum tracking speed, reference signal frequency, reference center voltage and DC mismatch, reference voltage and AC mismatch, reference voltage and reference voltage suppression, logic output high level and low level test. The details are as follows:

[0043] 1) Automatic testing:

[0044] Automatic testing is a process of fully automatic testing in a certain order for all testable items or partially selected test items for a model of chip that can be provided on the current interface control software. The implementation process is as follows:

[0045] a) Start the interface control software and confirm the model of the chip under test;

[0046] b) Select the items to be tested, or default to testing all items;

[0047] c) Configure test case library and parameter groups;

[0048] d) Start the power supply and confirm the voltage and current working status, or start it with one button;

[0049] e) If all items are executed by default, the tests are carried out in the order of voltage and current, angle conversion accuracy and integral nonlinear error, speed accuracy and maximum tracking speed, reference signal frequency, reference center voltage and reference DC mismatch, reference voltage and reference AC mismatch, reference voltage and reference voltage suppression, logic output high level and low level test, and the voltage and current parameter changes are monitored throughout the process;

[0050] f) If some items are selected for testing, in the default test item sequence, the unselected items will be skipped and not executed. However, regardless of whether the voltage and current items are selected, the items will be automatically tested and monitored throughout the process;

[0051] g) After each single test is completed, save the test data and proceed to the next test;

[0052] h) After all tests are completed, the signal source output is cut off, the chip power supply is cut off, the single chip test is completed and a reminder is given, and whether the current chip has passed the test is displayed;

[0053] i) Output the test report in Excel format. When all the selected test items are completed, a table file named after the chip model and number is generated and saved in the set path.

[0054] During the automatic test process, the voltage and current status are monitored throughout the process. If the voltage and current data changes are found to exceed the error range of the chip parameter, the current test will be terminated immediately, and a pop-up window will be displayed on the interface software to remind you to check the test system status. If the value deviation is large, the chip fault status will be fed back to directly determine that the chip has failed or has a high risk of failure. If the power supply current is normal throughout the process, but other project tests find that the measured parameters exceed the error, the test will still be executed. After completing the single test, the data value of the current test will be recorded, and the test will be judged as failed. The next test will be entered and finally recorded and notified in the test report. The interface control software of the automatic test system is as follows: Figure 1 As shown, the software logic control flow is as follows Figure 2 shown.

[0055] 2) Voltage and current test process

[0056] The voltage and current test is realized by controlling the program-controlled power supply by the interface software. The program-controlled power supply selects the three-way synchronous output power supply of ITECH Company and uses the serial port to maintain communication with the computer. The specific implementation process is as follows:

[0057] a) Start the test, the interface control software configures the parameters according to the test case, controls the output voltage parameters and current limiting parameters of each channel of the program-controlled power supply to match, and retrieves the current status of the program-controlled power supply to confirm that the power supply is working normally;

[0058] b) The interface software executes the power-on command, instructs the program-controlled power supply to output according to the configuration parameters, supplies power to the chip under test, and monitors the implementation status value of the current program-controlled power supply feedback;

[0059] c) Read the actual voltage and current values ​​of the three power supplies, compare them with the test standards, determine whether the test passes, and record them.

[0060] The specific implementation of the logical control process is as follows Figure 3 shown.

[0061] 3) Angle conversion accuracy and integral nonlinear error test process

[0062] The test mainly uses the interface software to control the program-controlled power supply and high-precision shaft angle signal source to complete the parameter configuration and output control of the test case. At the same time, the interface software transmits the chip parameter configuration command to the main control board, which controls the chip under test and collects the digital angle output by the chip. The specific implementation process is as follows:

[0063] a) Start the test, the interface control software configures the program-controlled power supply according to the parameter group in the use case library, so that it supplies power to the chip under test, monitors the chip voltage and current value status, and sends instructions to the main control board;

[0064] b) The main control board configures the hardware pins of the chip under test according to the instructions, completes the read and write mode configuration for the A1 and A2 pins, completes the resolution configuration for the RES0 and RES1 pins, completes the serial port or parallel port selection configuration for the SOE pin, and writes the reference output register according to the instructions to control the chip under test to output the reference signal;

[0065] c) The interface control software configures the parameters of the signal source according to the preset parameter group, switches the signal source to the external excitation state, and receives the reference signal state fed back by the signal source. When it is judged to be in the normal state, the interface controls the signal source to provide the standard test angle as required;

[0066] d) The main control board collects quantitative data from the chip and uploads it to the computer in real time;

[0067] e) The interface control software completes data statistics, judgment, storage and test result recording.

[0068] The test is carried out by using the method of collecting the same angle value multiple times. The interface control software calculates and processes the data. The error between the collected single angle value and the standard value is the integral nonlinear error of the current angle value. The statistical average value of the integral nonlinear error is the accuracy value of the current angle. The specific implementation of the logic control process is as follows: Figure 4 shown.

[0069] 4) Speed ​​accuracy and maximum tracking speed test process

[0070] This test targets the core indicators of the chip and needs to complete the speed accuracy function test and the limit tracking speed test. The interface software mainly controls the programmable power supply and the high-precision shaft angle signal source, and cooperates with the main control board to perform hardware configuration and software register configuration on the chip pins, so that it can perform speed conversion under different parameters such as data output resolution and reference signal output frequency. At the same time, according to the instructions issued by the interface software, select the serial port or parallel port mode to collect the speed value. The specific implementation process is as follows:

[0071] a) Start the test, the interface control software configures the programmable power supply to supply power to the chip under test, monitors the chip voltage and current value status, and sends instructions to the main control board;

[0072] b) The main control board configures the hardware pins of the chip under test according to the instructions, completes the read-write mode configuration and the switching of the speed value and the angle value through the A1 and A2 pins, completes the resolution configuration for the RES0 and RES1 pins, completes the serial port and parallel port selection configuration for the SOE pin, and writes the reference output register according to the instructions to control the chip under test to output the reference signal;

[0073] c) The interface control software controls the signal source to be in an external excitation state, and controls it to output analog signals in a constant speed mode at predetermined different speeds;

[0074] d) The main control board collects data from the chip under test at a certain frequency and uploads the data to the interface control software in real time;

[0075] e) The interface control software completes data statistics, judgment, storage and test result recording.

[0076] Under different parameter groups, the chip speed conversion design limits are different. The functionality and indicators that need to be proved in this test are selected. The parameter group is selected as the reference signal frequency is 20MHz. Under each resolution, the conversion data of four speed values ​​are tested. These four speed values ​​include the maximum and minimum speed limits. The specific implementation logic control flow is as follows: Figure 5 shown.

[0077] 5) Reference signal frequency test process

[0078] The reference signal frequency test requires the interface control software to control the power supply and digital multimeter, and cooperate with the main control board to write the reference signal frequency register of the chip under test. The control process is as follows:

[0079] a) Start the test, the interface controls the programmable power supply to provide power to the chip under test, monitors the changes in voltage and current parameters throughout the process, and sends instructions to the main control board;

[0080] b) The main control board configures the hardware pins of the chip under test according to the instructions, completes the read-write mode configuration and the switching of the speed value and the angle value through the A1 and A2 pins, completes the resolution configuration for the RES0 and RES1 pins, completes the serial port and parallel port selection configuration for the SOE pin, and writes the reference output register according to the instructions to control the chip under test to output the reference signal;

[0081] c) The interface control software controls the digital multimeter to switch to the frequency gear;

[0082] d) The main control board selects the parallel port normal mode to perform register write operation on the chip under test according to the instruction requirements, and writes the frequency value to be tested;

[0083] e) The main control board switches the EXC+ and EXC- pins of the chip under test to the test points of the digital multimeter by controlling the relay;

[0084] f) The interface control software reads the data currently measured by the digital multimeter and completes the judgment, storage and recording of test results.

[0085] The frequency range of the chip reference signal is 2KHz~20KHz. The parameter group will select four different frequency values ​​for testing, including the maximum frequency and the minimum frequency. The specific implementation of the logic control flow is as follows Figure 6 shown.

[0086] 6) Reference center voltage and DC mismatch test process

[0087] This test requires the interface control software to control the power supply and digital multimeter. At the same time, the main control board switches the reference signal pin to the test point. The control process is as follows:

[0088] a) Start the test, the interface controls the programmable power supply to provide power to the chip under test, monitors the changes in voltage and current parameters throughout the process, and sends instructions to the main control board;

[0089] b) The main control board uses the serial port configuration mode to read the status register of the chip under test, confirm that the chip under test is running in the default state, and output a 10MHz reference signal;

[0090] c) The interface control software controls the digital multimeter to switch to the DC voltage position;

[0091] d) The main control board switches the EXC+ pin and analog ground pin of the chip under test to the test point of the digital multimeter by controlling the relay;

[0092] e) The interface control software reads the DC voltage data on the digital multimeter, which is the center voltage between EXC+ and the ground, and completes data judgment, recording and storage;

[0093] f) Repeat steps d) and e) to test the DC voltage value between the EXC- pin and the ground, which is the center voltage between the EXC- and the ground, and complete data judgment, recording and storage;

[0094] g) The interface control software calculates the difference between the two center voltages, whose absolute value is the DC mismatch value of the reference signal, and completes data judgment, recording and storage.

[0095] The specific implementation of the logical control process is as follows Figure 7 shown.

[0096] 7) Reference voltage and AC mismatch test process

[0097] This test requires the interface control software to control the power supply and digital multimeter. At the same time, the main control board switches the reference signal pin to the test point. The control process is as follows:

[0098] a) Start the test, the interface controls the programmable power supply to provide power to the chip under test, monitors the changes in voltage and current parameters throughout the process, and sends instructions to the main control board;

[0099] a) The main control board configures the hardware pins of the chip under test according to the instructions, completes the read and write mode configuration of the A1 and A2 pins, completes the serial communication configuration of the SOE pin, and writes a value to the reference signal frequency register, so that the chip under test outputs a 20MHz reference signal;

[0100] b) The interface control software controls the digital multimeter to switch to the AC voltage position;

[0101] c) The main control board switches the EXC+ pin and EXC- pin of the chip under test to the test point of the digital multimeter through the control relay;

[0102] d) The interface control software reads the AC voltage data on the digital multimeter, which is referenced by the signal voltage to complete data judgment, record and store;

[0103] e) The main control board switches the EXC+ pin and the ground pin of the chip under test to the test point of the digital multimeter. The interface control software reads the AC voltage data on the digital multimeter and records the data as the single-side voltage of EXC+ to ground;

[0104] f) Repeat step f) to test the AC voltage between the EXC- pin and the ground, and record it as the single-side voltage of EXC- to the ground;

[0105] g) The interface control software calculates the difference between the two unilateral voltages, whose absolute value is the AC mismatch value of the reference signal, and completes data judgment, recording and storage.

[0106] The specific implementation of the logical control process is as follows Figure 8 shown.

[0107] 8) Reference voltage and reference voltage suppression test process

[0108] This test requires the interface control software to control the power supply and digital multimeter. At the same time, the main control board switches the reference voltage output pin to the test point. The control process is as follows:

[0109] a) Start the test, the interface controls the programmable power supply to provide nominal power to the chip under test, monitors the changes in voltage and current parameters throughout the process, and sends instructions to the main control board;

[0110] b) The main control board uses the parallel port normal mode to read the status register of the chip under test, confirm that the chip under test is running in the default state, and output a 10MHz reference signal;

[0111] c) The interface control software controls the digital multimeter to switch to the AC voltage position;

[0112] d) The main control board switches the REFOUT pin and analog ground pin of the chip under test to the test point of the digital multimeter by controlling the relay;

[0113] e) The interface control software reads the AC voltage data on the digital multimeter, which is the reference voltage, and completes data judgment, recording and storage;

[0114] f) The interface control software controls the program-controlled power supply to provide a nominal voltage value (1+5%) to the chip under test, and reads the AC voltage data V on the digital multimeter. Rout | +5％ , then control the programmable power supply to provide a voltage value of the nominal value (1-5%), and record the voltage data V on the digital multimeter again Rout | -5％ ;

[0115] g) Calculate the data under non-nominal value according to the suppression value calculation method to obtain the reference voltage suppression value And record the data.

[0116] The specific implementation of the logical control process is as follows Fig. 9 shown.

[0117] 9)Logic output high level and low level test

[0118] The test is controlled by the interface software to control the programmable power supply and high-precision shaft angle signal source, and the chip pins are configured by hardware and software registers through the main control board. Finally, the digital multimeter is controlled by the interface software to test the DC voltage of the highest digit of the parallel port data line. The specific implementation process is as follows:

[0119] a) Start the test, the interface controls the programmable power supply to provide power to the chip under test, monitors the changes in voltage and current parameters throughout the process, and sends instructions to the main control board;

[0120] b) The main control board configures the hardware pins of the chip under test according to the instructions, completes the configuration of the normal angle data output mode for the A1 and A2 pins, completes the configuration of the 16-bit resolution for the RES0 and RES1 pins, completes the parallel port configuration for the SOE pin, and writes the reference output register according to the instructions to control the chip under test to output a 20MHz reference signal;

[0121] c) The interface control software controls the digital multimeter to switch to the DC voltage position;

[0122] d) The main control board switches the DB15 pin and the digital ground pin of the chip under test to the test point of the digital multimeter by controlling the relay;

[0123] e) The interface control software controls the signal source to output an angle of 181° and reads the current DC voltage value of the digital multimeter, which is the output high level, and finally completes data judgment and storage;

[0124] f) The interface control software controls the signal source to output 1° angle measurement and reads the current DC voltage value of the digital multimeter, which is the output low level, and finally completes data judgment and storage;

[0125] The specific implementation of the logical control process is as follows Fig.10 shown.

Claims

1. A method for implementing an automatic testing system for axis-angle chips, characterized in that: The implementation method is based on the interface control software developed on the LabView platform, and cooperates with the embedded control software developed on the Keil platform to complete parameter setting, operation control and data acquisition of test and measurement equipment and instruments, realize the communication, data exchange and command control between the computer and the main control board, complete the automatic test process, realize the test of the voltage and current of the axis angle chip, the angle conversion accuracy and integral nonlinear error, the speed accuracy and the maximum tracking speed, the reference signal frequency, the reference center voltage and DC mismatch, the reference voltage and AC mismatch, the reference voltage and reference voltage suppression, and the logic output high level and low level function, and complete the automatic recording and storage of all data in the test process; The hardware equipment tested includes: shaft angle signal source, digital multimeter, programmable power supply and main control board; all hardware equipment has the ability to communicate with the computer, and the main control board has the ability to communicate with the computer as well as data acquisition and processing capabilities; The software tested are interface control software and embedded control software. The interface control software has the capabilities of human-computer interaction, status display and control, and data processing, while the embedded control software has the capabilities of data collection, analysis, and control. The test method for the angle conversion accuracy and integral nonlinear error of axis-angle chips is: the interface control software configures the parameters of the axis-angle signal source according to the preset parameter group, controls the axis-angle signal source to receive the reference voltage output by the chip under test, so that the axis-angle signal source provides the standard test angle to the chip under test as required, and at the same time, the interface control software sends parallel port acquisition or serial port acquisition instructions to the main control board, and the main control board selects the corresponding acquisition method. Under the same angle quantity, the current measured angle value is quickly and multiple times acquired, and the data is analyzed and processed according to a certain algorithm to obtain the integral nonlinear error value and the solution accuracy value respectively, and then the processed data is uploaded to the computer in real time, and the interface control software completes data statistics, judgment, storage and test result recording.

2. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The interface control software completes various configuration settings and equipment control through human-computer interaction, and its process is: determine the model of the chip to be tested, select test cases, configure test case parameters, control the test instrument, establish communication with the main control board, send instructions, analyze and store data, give test results, and generate a test report in a predetermined format; The testing process of embedded control software is: communicating with the computer, parsing instructions, controlling chip status and collecting and analyzing data, and uploading to the computer in a predetermined format.

3. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The automatic test method for the voltage and current of the axis angle chip is: to control the programmable power supply through the interface control software, configure the voltage value and maximum output current of the two channels of the programmable power supply, and control the on and off of the switch. When the switch is turned on, the real-time output voltage and output current values ​​of the programmable power supply are read regularly, and synchronously displayed in the voltage and current display area of ​​the interface control software. By judging whether the difference between the current voltage and current and the preset voltage and current indicators meets the test qualification standard, the switch state of the programmable power supply is controlled to complete the automatic test of the chip voltage and current, and finally record the test data and results.

4. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The test method for the speed accuracy and maximum tracking speed of the shaft angle chip is: through the interface control software, according to the requirements of the test parameter group, the shaft angle signal source is controlled to output the angle at a certain speed. The main control board receives the control instructions of the interface control software, configures the working state of the chip under test, and selects the corresponding serial port or parallel port to collect the speed conversion data. The data is then uploaded to the interface control software, and the interface control software completes the data judgment, analysis and storage, and completes the test result recording.

5. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The test method for the reference signal frequency of the axis angle chip is: control the digital multimeter to switch to the frequency measurement position through the interface control software, and send the control command of the reference signal frequency test to the main control board at the same time. The main control board configures the excitation output of the chip under test according to the received command, and controls the relay to complete the switching of the digital multimeter test point. The interface control software retrieves the data on the digital multimeter, judges and stores the data, and completes the test result recording.

6. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The test method for the reference center voltage and reference DC mismatch of the axis angle chip is: control the digital multimeter through the interface control software to switch it to the DC voltage test position, and send a test instruction to the main control board at the same time. The main control board configures the reference signal of the chip under test according to the instruction, and controls the switching of the test point to between the tested pin and the analog ground. The interface control software reads the DC voltage data on the digital multimeter, directly reads the center voltage value, and calculates the center voltage value to obtain the DC mismatch value, and finally completes the judgment, storage and recording of the test results.

7. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The test method for the reference voltage and reference AC mismatch of the axis angle chip is: control the digital multimeter to switch to the AC voltage position through the interface control software, and send a test instruction to the main control board at the same time. The main control board configures the reference signal of the chip under test according to the instruction, and controls the switching of the test point to between the tested pin and the analog ground. The interface control software reads the AC voltage data on the digital multimeter, directly reads the reference signal voltage value, and calculates the reference voltage to obtain the AC mismatch value, and finally completes the judgment, storage and recording of the test results.

8. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The test method for the reference voltage and reference voltage suppression of the axis angle chip is: control the digital multimeter to switch to the DC voltage position through the interface control software, and send the control command of the reference voltage test to the main control board at the same time. The main control board configures the excitation output of the chip under test according to the received command, and controls the relay to complete the switching of the digital multimeter test point to the reference voltage output pin. The interface control software then retrieves the DC voltage data on the digital multimeter, which is the measured reference voltage value. After that, the interface software controls the programmable power supply to change the power supply voltage to the chip under test, and tests the output value of the reference voltage pin again at the upper and lower limits of the power supply voltage. The reference voltage suppression value is obtained by calculation, and the measured reference voltage and the calculated suppression value are compared, judged and stored with the standard data to complete the test result recording.

9. The method for implementing an automatic testing system for axis-angle chips according to claim 1, characterized in that: The test method for the high and low levels of the logic output of the shaft angle chip is: control the digital multimeter to switch to the AC and DC voltage position through the interface control software. When testing the high level, control the shaft angle signal source to output an angle of 181°. The main control board configures the excitation output of the chip under test according to the received instructions, and controls the relay to complete the switching of the digital multimeter test point to the highest pin of the chip parallel port output data line. The interface control software then retrieves the DC voltage data on the digital multimeter. When testing the low level, control the shaft angle signal source to output an angle of 1°, and completes the DC voltage data collection on the highest bit of the parallel port output data line in the same way as the high level test. Finally, the interface control software compares the test data with the standard value, completes the judgment and storage, and completes the test result recording.

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