A code type switching device and an interface test system

Abstract

The embodiment of the present application relates to the field of computer, and discloses a code type switching device and an interface test system.In the present application, the code type switching device comprises: a first connector, which is used for electrically connecting with an external signal generator to receive a pulse signal output by the signal generator and used for triggering a code type of a to-be-tested interface to switch; a clock circuit, which is used for outputting a pulse signal used for triggering the code type of the to-be-tested interface to switch; a first switch, which is selectively electrically connected with the first connector or the clock circuit; and a second connector, which is electrically connected with the first switch and is used for electrically connecting with the to-be-tested interface to transmit the pulse signal to the to-be-tested interface so as to switch the code type of an output signal of the to-be-tested interface.The code type switching device and the interface test system provided by the present application can switch the code type of the output signal of the to-be-tested interface during the test process of the to-be-tested interface, so as to realize the test of the signal quality of the to-be-tested interface.

Description

TECHNICAL FIELD

[0001] The embodiment of the present application relates to the field of computer, in particular to a code type switching device and an interface test system. BACKGROUND

[0002] With the continuous development of computer hardware, the full coverage test of various data transmission interface output signals is becoming increasingly important. For example, the USB (Universal Serial Bus, Universal Serial Bus) interface is a common data transmission interface in daily life. In the research and development stage of the USB interface, the signal quality of the USB interface is usually tested, and the output signal of the USB interface needs to be tested in multiple codes (such as LFPS (Low Frequency Period Singal, Low Frequency Period Singal) and the like) in the whole test process.

[0003] Therefore, it is necessary to provide a device to switch the code type of the output signal of the interface to be tested in the test process. SUMMARY

[0004] The embodiment of the present application aims to provide a code type switching device and an interface test system, which can switch the code type of the output signal of the interface to be tested in the test process of the interface to be tested, so as to realize the signal quality test of the interface to be tested.

[0005] In order to solve the above technical problems, the embodiment of the present application provides a code type switching device, which comprises: a first connector, which is used for electrically connecting with an external signal generator to receive a pulse signal output by the signal generator and used for triggering the interface to be tested to switch the code type; a clock circuit, which is used for outputting a pulse signal used for triggering the interface to be tested to switch the code type; a first switch, which is selectively electrically connected with the first connector or the clock circuit; and a second connector, which is electrically connected with the first switch and used for electrically connecting with the interface to be tested to transmit the pulse signal to the interface to be tested so as to switch the code type of the output signal of the interface to be tested.

[0006] The embodiment of the present application further provides an interface test system, which comprises: a test fixture, a monitoring device and the code type switching device as described above; the test fixture comprises a receiving port, a test interface and a sending port; the receiving port is connected with the second connector of the code type switching device and used for receiving the pulse signal transmitted by the second connector; the test interface is used for connecting with the interface to be tested to transmit the pulse signal to the interface to be tested so as to switch the code type of the output signal of the interface to be tested; and the sending port is connected with the monitoring device and used for transmitting the test data corresponding to the code type of the output signal to the monitoring device.

[0007] Compared with the prior art, the first connector can be electrically connected with an external signal generator, so as to receive a pulse signal output by the signal generator and used for triggering a to-be-tested interface switching pattern, the clock circuit can also output a pulse signal used for triggering the to-be-tested interface switching pattern, the first switch is selectively electrically connected with the first connector or the clock circuit, so that the pulse signal transmitted by the first connector or the pulse signal output by the clock circuit can be transmitted to the second connector and then transmitted to the to-be-tested interface via the second connector, so as to switch the code type of the output signal of the to-be-tested interface in the to-be-tested interface test process, thereby realizing the signal quality test of the to-be-tested interface.

[0008] In addition, the first switch is a single-pole double-throw switch having a first state and a second state; in the first state, the first switch connects the first connector with the second connector; in the second state, the first switch connects the clock circuit with the second connector.

[0009] In addition, the second switch is further included, the second connector is electrically connected with the first switch via the second switch; the second switch allows one pulse signal to pass through each time it is pressed. In this way, the second switch only needs to be pressed once each time the code type of the output signal of the to-be-tested interface needs to be changed, which is simple and convenient to operate.

[0010] In addition, the first connector is an SMP radio frequency connector or an SMA radio frequency connector; and / or, the second connector is an SMP radio frequency connector.

[0011] In addition, the clock circuit includes a crystal oscillator connected with the first switch and a power input interface electrically connected with the crystal oscillator.

[0012] In addition, the clock circuit further includes a power conversion chip, the power conversion chip is electrically connected with the power input interface and the crystal oscillator, and is used for converting a first voltage input by the power input interface into a second voltage and outputting the second voltage to the crystal oscillator, wherein the second voltage is less than the first voltage.

[0013] In addition, an oscilloscope electrically connected with the first connector is further included; the first connector is an SMP radio frequency connector, the first connector is connected with the oscilloscope via a first SMP cable, a first adapter and a first SMA cable.

[0014] In addition, a signal generator electrically connected with the first connector is further included; the first connector is an SMP radio frequency connector, the first connector is connected with the signal generator via a first SMP cable, a first adapter, a first SMA cable, a second adapter and a first BNC cable.

[0015] In addition, the second connector is an SMP radio frequency connector, and the second connector is connected to the receiving port of the test fixture via a second SMP cable, a third adapter, and a second SMA cable. BRIEF DESCRIPTION OF DRAWINGS

[0016] One or more embodiments are illustrated by way of example in the figures that are part of this disclosure and which are illustrative, but not restrictive, of the present embodiments, wherein like references numerals refer to like elements, unless otherwise specified, and wherein the figures are not necessarily drawn to scale. The figures illustrate various embodiments of the present embodiments and to explain the best mode contemplated.

[0017] Figure 1 is a structural schematic diagram of a code type switching device provided by a second embodiment of the present application;

[0018] Figure 2 is a structural schematic diagram of an interface test system provided by the second embodiment of the present application;

[0019] Figure 3 is a schematic diagram of the working process of the interface test system provided by the second embodiment of the present application. DETAILED DESCRIPTION

[0020] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the various embodiments of the present application will be described in detail below with reference to the accompanying drawings. However, those of ordinary skill in the art can understand that, in the various embodiments of the present application, many technical details are presented in order to make the reader better understand the present application. However, the technical solutions claimed by the present application can be implemented even without these technical details and based on various changes and modifications of the following embodiments.

[0021] The inventor found that the test fixture used by the current standard USB, NVME4.0, and M.2 PCIE does not have a code type switching function. In order to realize code type switching, the inventor designed a code type switching device. This code type switching device can be applied to all high-speed signal tests that require clock edge triggering for code type switching, and is not limited to the signal quality tests of the above-mentioned USB, NVME4.0, and M.2 PCIE.

[0022] The first embodiment of the present application relates to a code type switching device 100, as shown in Figure 1As shown, the device comprises: a first connector 11, which is electrically connected with an external signal generator to receive a pulse signal output by the signal generator for triggering the code pattern of the interface to be tested; a clock circuit 12, which is used to output a pulse signal for triggering the code pattern of the interface to be tested; a first switch 13, which is selectively electrically connected with the first connector 11 or the clock circuit 12; and a second connector 14, which is electrically connected with the first switch 13 and is used to be electrically connected with the interface to be tested to transmit the pulse signal to the interface to be tested so as to switch the code pattern of the output signal of the interface to be tested.

[0023] The first connector 11 can be electrically connected with an external signal generator to receive a pulse signal output by the signal generator for triggering the code pattern of the interface to be tested, the clock circuit 12 can also output a pulse signal for triggering the code pattern of the interface to be tested, the first switch 13 is selectively electrically connected with the first connector 11 or the clock circuit 12, so that the pulse signal transmitted by the first connector 11 or the pulse signal output by the clock circuit 12 can be transmitted to the second connector 14 and then transmitted to the interface to be tested via the second connector 14, so as to switch the code pattern of the output signal of the interface to be tested during the testing process of the interface to be tested, thereby realizing the testing of the signal quality of the interface to be tested.

[0024] Specifically, the interface to be tested is used to switch the test code pattern according to the received pulse signal when entering the test mode. For example, when the interface to be tested is a USB interface, the USB controller is modified when the USB interface receives the pulse signal, so that the USB controller outputs the required code pattern. The code pattern of the output signal of the USB interface includes a low-frequency periodic signal LFPS, CP0 and CP1.

[0025] The signal generator can be an oscilloscope 16 or a signal generator 17, and the first connector 11 can be an SMP radio frequency connector or an SMA radio frequency connector. When the first connector 11 is an SMP radio frequency connector, the first connector 11 can be connected with the oscilloscope 16 via a first SMP cable, a first adapter (SMP to SMA), a first SMA cable, or the first connector 11 can be connected with the signal generator 17 via a first SMP cable, a first adapter (SMP to SMA), a first SMA cable, a second adapter (SMA to BNC) and a first BNC cable. When the first connector 11 is an SMA radio frequency connector, the first connector 11 can be connected with the oscilloscope 16 via a first SMA cable, or the first connector 11 can be connected with the signal generator 17 via a first SMA cable, a second adapter (SMA to BNC) and a first BNC cable.

[0026] The second connector 14 can be an SMP radio frequency connector, and the second connector 14 can be connected to a receiving port of a test fixture via a second SMP cable, a third adapter (SMP to SMA), and a second SMA cable, so as to be connected to a to-be-tested interface via a test interface of the test fixture.

[0027] Specifically, the first switch 13 can be a single-pole double-throw switch having a first state and a second state, in the first state, the first switch 13 connects the first connector 11 to the second connector 14, and in the second state, the first switch 13 connects the clock circuit 12 to the second connector 14. By setting the first switch 13 in the first state, the first connector 11 can be connected to the second connector 14, so as to realize the access of the pulse signal output by the external signal generator; by setting the first switch 13 in the second state, the clock circuit 12 can be connected to the second connector 14, so as to realize the access of the pulse signal output by the clock circuit 12.

[0028] In actual application, the code type switching device 100 can further include a second switch 15 (which can be an automatic rebound switch), the second connector 14 is electrically connected to the first switch 13 via the second switch 15, and the second switch 15 allows one pulse signal to pass through each time it is pressed. In this way, each time the code type of the output signal of the to-be-tested interface needs to be changed, the code type of the output signal of the to-be-tested interface can be switched once by pressing the second switch 15 once, which is simple and convenient to operate. Further, the second switch can be used in combination with an edge trigger, so as to output only one clock edge each time the second switch is pressed. For example, an edge trigger can be arranged between the second connector 14 and the second switch 15, or an edge trigger can be arranged between the second switch 15 and the first switch 13.

[0029] Specifically, the clock circuit 12 can include a crystal oscillator 121 connected to the first switch 13, and a power input interface 122 electrically connected to the crystal oscillator 121. Optionally, the clock circuit 12 can further include a power conversion chip 123 electrically connected to the power input interface 122 and the crystal oscillator 121, and configured to convert a first voltage input by the power input interface 122 into a second voltage and output the second voltage to the crystal oscillator 121, wherein the second voltage is less than the first voltage. The power input interface 122 can input a voltage of 12V or 5V, and the power conversion chip 123 can convert the voltage into a voltage of 3.3V.

[0030] Optionally, the power conversion chip 123 can be electrically connected to the first switch 13, so as to supply power to the first switch 13, thereby realizing the automatic switching of the first switch 13 to select the signal generator (oscilloscope 16 or signal generator 17) or the clock circuit 12 as the signal input source.

[0031] In practical applications, clock circuit 12 can output a 100MHz clock (i.e., 100*10^6 clock cycles per second), oscilloscope 16 can output a 1KHz clock (i.e., 1000 clock cycles per second), and signal generator 17 can output a 100MHz clock (i.e., 100*10^6 clock cycles per second).

[0032] Compared with the prior art, the embodiments of the present invention can be electrically connected to an external signal generator through the first connector 11, thereby receiving the pulse signal output by the signal generator to trigger the switching code pattern of the interface under test. The clock circuit 12 can also output a pulse signal to trigger the switching code pattern of the interface under test. The first switch 13 can be selectively electrically connected to the first connector 11 or the clock circuit 12, so that the pulse signal transmitted by the first connector 11 or the pulse signal output by the clock circuit 12 can be transmitted to the second connector 14, and then transmitted to the interface under test through the second connector 14, so as to switch the code pattern of the output signal of the interface under test during the testing of the interface under test, thereby realizing the signal quality testing of the interface under test.

[0033] The second embodiment of the present invention relates to an interface testing system, such as... Figure 2 As shown, it includes: a test fixture 18, a monitoring device 19 (which may be an oscilloscope), and a code switching device 100 as in the first embodiment; the test fixture 18 includes a receiving port (RX end), a test interface, and a transmitting port (TX end); the receiving port is connected to the second connector 14 of the code switching device 100 and is used to receive the pulse signal transmitted by the second connector 14; the test interface is used to connect to the interface under test 20 to transmit the pulse signal to the interface under test 20 in order to switch the code of the output signal of the interface under test 20; the transmitting port is connected to the monitoring device 19 and is used to transmit the test data corresponding to the code of the output signal to the monitoring device 19.

[0034] Optionally, the interface testing system may also include an oscilloscope 16 electrically connected to the first connector 11. The first connector 11 is an SMP radio frequency connector. The first connector 11 is connected to the oscilloscope 16 via a first SMP cable, a first adapter, and a first SMA cable. The oscilloscope 16 can output a 1KHz clock (i.e., 1000 clock cycles per second).

[0035] Of course, the interface testing system may also include a signal generator 17 electrically connected to the first connector 11. The first connector 11 is an SMP radio frequency connector. The first connector 11 is connected to the signal generator 17 via a first SMP cable, a first adapter, a first SMA cable, a second adapter, and a first BNC cable. The signal generator 17 can output a 100MHz clock (i.e., output 100*10^6 clock cycles per second).

[0036] In practical application, the second connector 14 can be an SMP radio frequency connector, and the second connector 14 is connected to the receiving port of the test fixture 18 via the second SMP cable, the third adapter and the second SMA cable.

[0037] The specific description of the working process of the interface test system will be given below in combination with the accompanying drawings. Figure 3 The specific description of the working process of the interface test system will be given below in combination with the accompanying drawings.

[0038] Firstly, the oscilloscope 16 is connected to the first connector 11, and then the first switch 13 is set to the first state to connect the first connector 11 with the second connector 14, so as to realize the access of the pulse signal output by the oscilloscope 16; or, the signal generator 17 is connected to the first connector 11, and then the first switch 13 is set to the first state to connect the first connector 11 with the second connector 14, so as to realize the access of the pulse signal output by the signal generator 17 (of course, the oscilloscope 16 and the signal generator 17 can also be connected to the first connector 11, and then the second switch 15 is used to select one of them); or, the first switch 13 is directly set to the second state to connect the clock circuit 12 with the second connector 14, so as to realize the access of the pulse signal output by the clock circuit 12.

[0039] Secondly, the second switch 15 is pressed to input the pulse signal.

[0040] Thirdly, the code type of the output signal of the interface under test 20 displayed by the monitoring device 19 is observed to determine whether it is the code type required by the test, if not, the first switch 13 is pressed again, and if yes, the process is ended.

[0041] Compared with the prior art, the first connector 11 can be electrically connected with the external signal generator, so as to receive the pulse signal output by the signal generator and used to trigger the code type switching of the interface under test 20, the clock circuit 12 can also output the pulse signal used to trigger the code type switching of the interface under test 20, the first switch 13 is selectively electrically connected with the first connector 11 or the clock circuit 12, so as to transmit the pulse signal transmitted by the first connector 11 or the pulse signal output by the clock circuit 12 to the second connector 14, the pulse signal is transmitted to the interface under test 20 via the second connector 14 and the test fixture 18, so as to switch the code type of the output signal of the interface under test 20 during the test of the interface under test 20, and the code type of the output signal of the interface under test 20 is observed by the monitoring device 19, so as to realize the signal quality test of the interface under test 20.

[0042] Since the first embodiment and the present embodiment correspond to each other, the present embodiment can be implemented in cooperation with the first embodiment. The technical details mentioned in the first embodiment are still valid in the present embodiment, and the technical effects achieved in the first embodiment can also be achieved in the present embodiment. In order to reduce repetition, they will not be described here. Correspondingly, the technical details mentioned in the present embodiment can also be applied in the first embodiment.

[0043] Those skilled in the art can understand that the above-mentioned embodiments are specific examples for implementing the present application, and in actual application, various changes can be made in form and details without departing from the spirit and scope of the present application.

Claims

1. A mode switching apparatus, characterized by comprising: The code type switching device comprises: a first connector for electrically connecting with an external signal generator to receive a pulse signal output by the signal generator for triggering a code type of an interface to be tested; a clock circuit for outputting a pulse signal for triggering the code type of the interface to be tested; a first switch selectively electrically connected with the first connector or the clock circuit; a second connector electrically connected with the first switch and used for electrically connecting with the interface to be tested to transmit the pulse signal to the interface to be tested so as to switch the code type of an output signal of the interface to be tested; a second switch is further included, and the second connector is electrically connected with the first switch via the second switch; the second switch allows one pulse signal to pass through each time the second switch is pressed; an edge trigger is arranged between the second connector and the second switch, or an edge trigger is arranged between the second switch and the first switch; the second switch and the edge trigger are used for outputting only one clock edge each time the second switch is pressed.

2. The pattern switching apparatus of claim 1, wherein the first switch is a single-pole double-throw switch having a first state and a second state; in the first state, the first switch connects the first connector with the second connector; in the second state, the first switch connects the clock circuit with the second connector.

3. The pattern switching apparatus of claim 1, wherein the first connector is an SMP radio frequency connector or an SMA radio frequency connector; and / or, the second connector is an SMP radio frequency connector.

4. The constellation switching apparatus of claim 1, wherein the clock circuit comprises a crystal oscillator connected with the first switch, and a power input interface electrically connected with the crystal oscillator.

5. The constellation switching apparatus of claim 4, wherein the clock circuit further comprises a power conversion chip electrically connected with the power input interface and the crystal oscillator, and used for converting a first voltage input by the power input interface into a second voltage and outputting the second voltage to the crystal oscillator, wherein the second voltage is less than the first voltage.

6. An interface test system, characterized by The code type switching device comprises: a test fixture, a monitoring device, and the code type switching device according to any one of claims 1 to 5; the test fixture comprises a receiving port, a test interface, and a sending port; the receiving port is connected with the second connector of the code type switching device, and used for receiving the pulse signal transmitted by the second connector; the test interface is used for connecting with the interface to be tested to transmit the pulse signal to the interface to be tested so as to switch the code type of the output signal of the interface to be tested; the sending port is connected with the monitoring device, and used for transmitting test data corresponding to the code type of the output signal to the monitoring device.

7. The interface test system of claim 6, wherein, an oscilloscope electrically connected with the first connector is further included; the first connector is an SMP radio frequency connector, and the first connector is connected with the oscilloscope via a first SMP cable, a first adapter, and a first SMA cable.

8. The interface test system of claim 6, wherein, a signal generator electrically connected with the first connector is further included; the first connector is an SMP radio frequency connector, and the first connector is connected with the signal generator via a first SMP cable, a first adapter, a first SMA cable, a second adapter, and a first BNC cable.

9. The interface test system of claim 6, wherein, The second connector is an SMP RF connector, the second connector is connected to a receiving port of the test fixture via a second SMP cable, a third adapter, and a second SMA cable.

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