Parameter Determination Method, Device and Computer Equipment for Impulse Voltage Generation Circuit

Abstract

The present application relates to a method, apparatus, and computer device for determining parameters of an impulse voltage generating circuit. The method includes: obtaining a parameter set of the impulse voltage generating circuit to be processed; establishing a simulation test circuit based on the parameter set and the impulse voltage generating circuit, and determining an output waveform based on the simulation test circuit; if the output waveform does not meet a preset condition, adjusting the parameter set and repeating the process of determining the output waveform until the determined output waveform meets the preset condition, and taking the parameter set corresponding to the output waveform that meets the preset condition as the target parameter set. By using this method, a parameter set of an impulse voltage generating circuit that meets the requirements can be obtained quickly and efficiently.

Description

Technical Field

[0001] This application relates to the technical field of circuit design, and particularly to a method, apparatus, and computer device for determining parameters of an impulse voltage generating circuit. Background Art

[0002] When conducting an impulse voltage test, it is necessary to dynamically adjust the wavefront and wave tail resistance values inside the generator according to the parameters of the device, so that the system can output the required voltage waveform.

[0003] Large impulse voltage generators often include hundreds of resistance values that need to be adjusted, and the equipment is relatively tall. Conducting an electronic adjustment takes a lot of time. During the test process, multiple "adjustment - test - adjustment" cycles will be experienced, and the test efficiency is extremely low. Summary of the Invention

[0004] Based on this, in view of the above technical problems, it is necessary to provide a method, apparatus, and computer device for determining parameters of an impulse voltage generating circuit that can quickly and efficiently obtain a parameter set of an impulse voltage generating circuit that meets the requirements.

[0005] In a first aspect, this application provides a method for determining parameters of an impulse voltage generating circuit. The method includes:

[0006] Obtain a parameter set of the impulse voltage generating circuit to be processed;

[0007] Based on the parameter set and the impulse voltage generating circuit, establish a simulation test circuit, and determine the output waveform based on the simulation test circuit;

[0008] If the output waveform does not meet the preset conditions, adjust the parameter set, and repeat the process of determining the output waveform until the determined output waveform meets the preset conditions. Use the circuit parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set.

[0009] In one embodiment, the parameter set includes: wavefront resistance value, wave tail resistance value, and capacitance value; if the output waveform does not meet the preset conditions, adjusting the circuit parameter set includes:

[0010] If the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, then adjust the wavefront resistance value or the wave tail resistance value;

[0011] If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range, then adjust the capacitance value.

[0012] In one embodiment, the preset conditions include: the wavefront time is within a first interval, the overshoot is within a preset overshoot range, and the half-peak time is within a second interval.

[0013] In one embodiment, if the output waveform does not meet the preset conditions, and the wavefront resistance value is within a first range and the wave-tail resistance value is within a second range, then adjusting the wavefront resistance value or the wave-tail resistance value includes:

[0014] If the wavefront time of the output waveform is not within the first interval, the overshoot is not within the preset overshoot range, and the wavefront resistance value is within the first range, then adjust the wavefront resistance value according to a first step size;

[0015] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, the half-peak time of the output waveform is not within the second interval, and the wave-tail resistance value is within the second range, then adjust the wave-tail resistance value according to a second step size.

[0016] In one embodiment, if the wavefront time of the output waveform is not within the first interval and the wavefront resistance value is within the first range, then adjusting the wavefront resistance value according to the first step size includes:

[0017] If the wavefront time of the output waveform is less than the minimum value of the first interval and the wavefront resistance value is within the first range, then increase the wavefront resistance value by the first step size;

[0018] If the wavefront time of the output waveform is greater than the minimum value of the first interval and the wavefront resistance value is within the first range, then decrease the wavefront resistance value by the first step size.

[0019] In one embodiment, if the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave-tail resistance value is not within the second range, then adjust the capacitance value

[0020] If the wavefront time of the output waveform is not within the first interval, the overshoot is not within the preset overshoot range, and the wavefront resistance value is not within the first range, then adjust the capacitance value;

[0021] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset range, the wave-tail resistance value is not within the second range, and the wave-tail resistance value is not within the second range, then adjust the capacitance value.

[0022] In a second aspect, the present application also provides a parameter determination device for an impulse voltage generating circuit. The device includes:

[0023] An acquisition module, configured to acquire a parameter set of an impulse voltage generating circuit to be processed, where the parameter set includes: the number of generator stages, the front-wave resistance value of each stage, the tail-wave resistance value of each stage, the inductance value of each stage, and the capacitance value of each stage;

[0024] A simulation module, configured to establish a simulation test circuit based on the parameter set and the impulse voltage generating circuit, and determine an output waveform based on the simulation test circuit;

[0025] A parameter adjustment module, configured to, if the output waveform does not meet a preset condition, adjust the circuit parameter set, and repeat the process of determining the output waveform above until the determined output waveform meets the preset condition, and use the circuit parameter set corresponding to the output waveform that meets the preset condition as the target parameter set.

[0026] In a third aspect, the present application further provides a computer device. The computer device includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0027] Acquire a parameter set of an impulse voltage generating circuit to be processed;

[0028] Establish a simulation test circuit based on the parameter set and the impulse voltage generating circuit, and determine an output waveform based on the simulation test circuit;

[0029] If the output waveform does not meet a preset condition, adjust the parameter set, and repeat the process of determining the output waveform above until the determined output waveform meets the preset condition, and use the circuit parameter set corresponding to the output waveform that meets the preset condition as the target parameter set.

[0030] In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, and when the computer program is executed by a processor, the following steps are implemented:

[0031] Acquire a parameter set of an impulse voltage generating circuit to be processed;

[0032] Establish a simulation test circuit based on the parameter set and the impulse voltage generating circuit, and determine an output waveform based on the simulation test circuit;

[0033] If the output waveform does not meet a preset condition, adjust the parameter set, and repeat the process of determining the output waveform above until the determined output waveform meets the preset condition, and use the circuit parameter set corresponding to the output waveform that meets the preset condition as the target parameter set.

[0034] Fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program which, when executed by a processor, implements the following steps:

[0035] Obtain a parameter set of the impulse voltage generating circuit to be processed;

[0036] Based on the parameter set and the impulse voltage generating circuit, establish a simulation test circuit, and determine the output waveform based on the simulation test circuit;

[0037] If the output waveform does not meet the preset conditions, adjust the parameter set, and repeat the process of determining the output waveform until the determined output waveform meets the preset conditions, and use the parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set.

[0038] The above method, device and computer equipment for determining the parameters of the impulse voltage generating circuit establish a simulation test circuit according to the parameter set and the impulse voltage generating circuit, and determine the output waveform based on the simulation test circuit. If the output waveform does not meet the preset conditions, adjust the parameter set. Through a cyclic iteration process, adjust the parameter set multiple times to make the output waveform meet the preset conditions and obtain the target parameter set; by using the simulation test circuit, it avoids manually adjusting the parameter set of the impulse voltage generating circuit in actual experiments. By using the simulation test circuit, the parameter set can be flexibly adjusted, and the time for adjusting the parameter set and simulating the output waveform is short, and the parameter set corresponding to the output waveform that meets the preset conditions can be obtained quickly and efficiently. Description of the Drawings

[0039] Figure 1 It is a schematic flowchart of a method for determining the parameters of an impulse voltage generating circuit in an embodiment;

[0040] Figure 2 In a specific embodiment, it is a schematic flowchart of a method for determining the parameters of an impulse voltage generating circuit;

[0041] Figure 3 It is a structural block diagram of a device for determining the parameters of an impulse voltage generating circuit in an embodiment;

[0042] Figure 4 It is an internal structure diagram of a computer device in an embodiment. Detailed Embodiments

[0043] In order to make the objectives, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0044] In one embodiment, asFigure 1 As shown, a method for determining the parameters of an impulse voltage generating circuit is provided. In this embodiment, the method is exemplified by its application to a terminal. It can be understood that the method can also be applied to a server and can also be applied to a system including a terminal and a server, and is implemented through the interaction between the terminal and the server. In this embodiment, the method includes the following steps:

[0045] S101, obtain the parameter set of the impulse voltage generating circuit to be processed.

[0046] Among them, the impulse voltage generating circuit includes an impulse voltage generator, which is a high-voltage power generating device that generates pulse waves and is mainly used for impulse voltage tests of full-wave lightning impulse voltage, chopped lightning impulse voltage, and switching impulse voltage wave on test objects such as power equipment to test insulation performance.

[0047] The parameter set includes: the wavefront resistance value, the wave tail resistance value, and the capacitance value. The wavefront resistance value is the total wavefront resistance value of the impulse voltage generator, the wave tail resistance value is the total wave tail resistance value of the impulse voltage generator, and the capacitance value is the value of each stage of capacitance in the impulse voltage generator.

[0048] Specifically, the impulse voltage generating circuit is preset. The number of stages of the impulse voltage generator is set according to requirements, and the capacitance value is determined according to the number of stages. The capacitance values of any two stages are the same; the sub-wavefront resistance value and the sub-wave tail resistance value of each stage are initialized. The sub-wavefront resistance values of each stage are the same, and the sub-wave tail resistance values of each stage are the same. The wavefront resistance value is equal to the product of the sub-wavefront resistance value of each stage in the impulse voltage generator and the number of stages of the impulse voltage generator. The wave tail resistance value is the total wave tail resistance value of the impulse voltage generator, which is equal to the product of the sub-wave tail resistance value of each stage in the impulse voltage generator and the number of stages of the impulse voltage generator.

[0049] S102, establish a simulation test circuit based on the parameter set and the impulse voltage generating circuit, and determine the output waveform based on the simulation test circuit.

[0050] Specifically, the parameter set further includes: the number of stages of the impulse voltage generator, the wiring length, and the inductance value of each stage; according to the number of stages, the wiring length, the capacitance value of each stage, the inductance value of each stage, the wavefront resistance value, the wave tail resistance value, and the impulse voltage generating circuit, an equivalent simulation test circuit is established on a circuit simulation platform, and the output waveform is obtained through the simulation test circuit.

[0051] S103, if the output waveform does not meet the preset conditions, adjust the parameter set and repeat the above process of determining the output waveform until the determined output waveform meets the preset conditions, and use the circuit parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set.

[0052] Among them, the preset condition is used to reflect the waveform parameters of the reference waveform. If the output waveform does not meet the preset condition, it means that the output waveform does not meet the requirements, and the parameter set needs to be adjusted so that the output waveform meets the requirements.

[0053] Specifically, if the output waveform does not meet the preset condition, adjust the wavefront resistance value, or the wave tail resistance value, or the capacitance value, and then repeat the above process of determining the output waveform according to the adjusted parameter set to obtain the output waveform corresponding to the adjusted parameter set. Repeat this process in a loop until the output waveform meets the preset condition, and use the loop parameter set corresponding to the output waveform that meets the preset condition as the target parameter set.

[0054] In the above method for determining the parameters of the impulse voltage generating circuit, a simulation test circuit is established according to the parameter set and the impulse voltage generating circuit, and the output waveform is determined based on the simulation test circuit. If the output waveform does not meet the preset condition, the parameter set is adjusted. Through a loop iteration process, the parameter set is adjusted multiple times to make the output waveform meet the preset condition and obtain the target parameter set; The use of a simulation test circuit avoids manually adjusting the parameter set of the impulse voltage generating circuit in actual experiments. By using a simulation test circuit, the parameter set can be flexibly adjusted, and the time for adjusting the parameter set and simulating the output waveform is short, so that the parameter set corresponding to the output waveform that meets the preset condition can be obtained quickly and efficiently.

[0055] In one embodiment, S103 includes:

[0056] S310. If the output waveform does not meet the preset condition, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, then adjust the wavefront resistance value or the wave tail resistance value.

[0057] Among them, the preset condition includes: the wavefront time is within the first interval, the overshoot is within the preset overshoot range, and the half-peak time is within the second interval. The first interval includes: the minimum value of the first interval (the preset minimum wavefront time) and the maximum value of the first interval (the preset maximum wavefront time). The second interval includes: the minimum value of the second interval (the preset minimum half-peak time) and the maximum value of the second interval (the preset maximum half-peak time). The first interval and the second interval can be set according to requirements. For example, the first interval can be set to: 1.2us ± 5%, that is, the minimum value of the first interval is: 1.14us, and the maximum value of the first interval is: 1.26us; The second interval can be set to: 50us ± 5%, that is, the minimum value of the second interval is: 47.5us, and the maximum value of the second interval is: 52.5us.

[0058] The first range is used to reflect the maximum adjustment value and the minimum adjustment value of the wavefront resistance, and the second range is used to reflect the maximum adjustment value and the minimum adjustment value of the wave tail resistance.

[0059] Specifically, obtain the wavefront time and the half-peak time of the output waveform. If the wavefront time is within the first interval, the overshoot is within the preset overshoot range, and the half-peak time is within the second interval, it indicates that the output waveform meets the preset conditions. If the output waveform does not meet the second preset condition, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, the wavefront resistance value is preferentially adjusted, and then the wave tail resistance value is adjusted.

[0060] In one embodiment, S310 includes:

[0061] S320, if the wavefront time of the output waveform is not within the first interval, or the overshoot is not within the preset overshoot range, and the wavefront resistance value is within the first range, adjust the wavefront resistance value according to the first step size.

[0062] Specifically, the first step size is preset. The first range includes a first minimum value and a first maximum value. The first minimum value is determined according to the first step size and the first threshold of the wavefront resistance. The first threshold is the minimum threshold of the wavefront resistance, and the adjusted wavefront resistance value cannot be less than the first threshold. The first minimum value is equal to the sum between the first threshold and the first step size. The first maximum value is determined according to the first step size and the second threshold of the wavefront resistance. The second threshold is the maximum threshold of the wavefront resistance, and the adjusted wavefront resistance value cannot be greater than the second threshold. The first maximum value is equal to the difference between the second threshold and the first step size. The first threshold and the second threshold can be set according to requirements. For example, the first threshold can be 10 ohms, and the second threshold can be 100 ohms.

[0063] If the wavefront time of the output waveform is less than the minimum value of the first interval, or the wavefront time of the output waveform is greater than the minimum value of the first interval, or the overshoot is not within the preset overshoot range, and the wavefront resistance value is within the first range, then adjust the wavefront resistance value.

[0064] Since the wavefront time and the wavefront resistance value are positively correlated, if the wavefront time of the output waveform is less than the minimum value of the first interval and the wavefront resistance value is within the first range, add the first step size to the wavefront resistance value. If the wavefront time of the output waveform is greater than the minimum value of the first interval and the wavefront resistance value is within the first range, subtract the first step size from the wavefront resistance value. The first step size can be set according to requirements. For example, the first step size can be set to 1 ohm.

[0065] After adjusting the wavefront resistance value, repeat the determination of the output waveform. During the iteration process, by adjusting the wavefront resistance value, the wavefront time of the output waveform is within the first interval, and the overshoot is within the preset overshoot range. Then, determine whether the half-peak time of the output waveform is within the second interval. If the half-peak time of the output waveform is within the second interval, the output waveform meets the preset conditions, stop the iteration process, and use the set of loop parameters corresponding to the output waveform that meets the preset conditions as the target parameter set; if the half-peak time of the output waveform is not within the second interval, enter S320.

[0066] S320: If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, the half-peak time of the output waveform is not within the second interval, and the wave tail resistance value is within the second range, then adjust the wave tail resistance value according to the second step size.

[0067] Specifically, the second step size is preset, and the second step size can be equal to the first step size. The second range includes a second minimum value and a second maximum value; the second minimum value is determined according to the second step size and the third threshold of the wave tail resistance. The third threshold is the minimum threshold of the wave tail resistance, and the adjusted wave tail resistance value cannot be less than the third threshold. The second minimum value is equal to the sum between the third threshold and the second step size; the second maximum value is determined according to the second step size and the fourth threshold of the wave tail resistance. The fourth threshold is the maximum threshold of the wave tail resistance, and the adjusted wave tail resistance value cannot be greater than the fourth threshold. The second maximum value is equal to the difference between the fourth threshold and the second step size. The third threshold and the fourth threshold can be set according to requirements. For example, the third threshold can be 10 ohms, and the fourth threshold can be 100 ohms.

[0068] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, and the wave tail resistance value is within the second range, and the half-peak time of the output waveform is less than the minimum value of the second interval, or the half-peak time of the output waveform is greater than the maximum value of the second interval, then adjust the wave tail resistance value.

[0069] Since the half-peak time and the wave tail resistance value are positively correlated, if the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, and the wave tail resistance value is within the second range, and the half-peak time of the output waveform is less than the minimum value of the second interval, then increase the second step size on the wave tail resistance value; if the wavefront time of the output waveform is within the first interval, and the wave tail resistance value is within the second range, and the half-peak time of the output waveform is greater than the maximum value of the second interval, then decrease the second step size on the wave tail resistance value.

[0070] S311. If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range, then adjust the capacitance value.

[0071] Specifically, the situations where the output waveform does not meet the preset conditions include: if the wavefront time of the output waveform is not within the first interval, and the overshoot is not within the preset overshoot range, the situations where the output waveform does not meet the preset conditions also include: if the wavefront time of the output waveform is within the first interval and the overshoot is within the preset range, but the wave tail resistance value is not within the second range.

[0072] If the wavefront time of the output waveform is not within the first interval, and the overshoot is not within the preset overshoot range, it means that the wavefront resistance value has been adjusted multiple times according to the first step size, and the adjusted wavefront resistance value is no longer within the first range, and the wavefront time of the output waveform still cannot be made within the first interval and the overshoot is not within the preset overshoot range, then the capacitance value needs to be adjusted.

[0073] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset range, but the wave tail resistance value is not within the second range, and it is no longer possible to make the half-peak time of the output waveform belong to the second interval by adjusting the wave tail resistance value, then the capacitance value needs to be adjusted.

[0074] To adjust the capacitance value, the staff can analyze the situation of the current impulse voltage generation circuit and adjust the inductance value. After adjusting the capacitance value, repeat S102 and S103, and through the iterative process, make the output waveform meet the preset conditions. If the wavefront time of the output waveform is greater than the first maximum value of the first interval and the overshoot exceeds the preset overshoot range, the capacitance value can be increased.

[0075] For the convenience of explaining the above method, see Figure 2 , in a specific embodiment, the method includes the following steps:

[0076] 10. Establish a simulation test circuit based on the parameter set and the impulse voltage generation circuit, and determine the output waveform;

[0077] 11. Obtain the wavefront time, half-peak time, and overshoot of the output waveform;

[0078] 12. Judge whether the wavefront time is within the first interval and whether the overshoot is within the preset overshoot range. If not, go to step 13; if so, go to step 15;

[0079] 13. Judge whether the wavefront resistance value is within the first range. If so, go to step 14; if not, go to step 18;

[0080] 14. Adjust the wave-tail resistance value according to the first step length, and enter step 10;

[0081] 15. Determine whether the half-peak time is within the second interval. If not, enter step 16; if so, enter step 19;

[0082] 16. Determine whether the wave-tail resistance value is within the second range. If so, enter step 17; if not, enter step 18. 17. Adjust the wave-tail resistance value according to the second step length, and enter step 10;

[0083] 18. Adjust the capacitance value, and enter step 10;

[0084] 19. Obtain the target parameter set.

[0085] In one embodiment, if the output waveform does not meet the preset condition and the number of adjustments reaches the candidate threshold, adjust the number of stages of the impulse voltage generator, and repeat the process of determining the output waveform until the determined output waveform meets the preset condition.

[0086] Wherein, the number of adjustments is the number of times of adjusting the capacitance value; the candidate threshold is preset. The candidate threshold can be set to a smaller value. For example, the candidate threshold can be set to 2 or 3.

[0087] Specifically, after the first adjustment of the capacitance value, the number of adjustments is 1. Repeat S102 and S103 again, adjust the capacitance value for the second time, and add 1 to the number of adjustments. The number of adjustments is 2. Iterate in this way. If the number of adjustments reaches the candidate threshold and the output waveform does not meet the preset condition, adjust the number of stages of the impulse voltage generator.

[0088] When adjusting the number of stages of the impulse voltage generator, the impulse voltage generating circuit will also be adjusted accordingly. The parameter set can be re-obtained according to the adjusted impulse voltage generating circuit, including: determining the capacitance value according to the number of stages of the adjusted impulse voltage generator, initializing the wave-front resistance value and the wave-tail resistance value, and then looping and iterating S102 and S103. Or, the wave-front resistance value, the wave-tail resistance value, and the capacitance value in the current parameter set can be applied to the adjusted impulse voltage generating circuit, and then loop and iterate S102 and S103.

[0089] In this embodiment, a simulation test circuit is established according to a parameter set and an impulse voltage generation circuit, and an output waveform is determined based on the simulation test circuit. If the output waveform does not meet the preset conditions, the parameter set is adjusted. Through a cyclic iteration process, the parameter set is adjusted multiple times to make the output waveform meet the preset conditions, and a target parameter set is obtained. Various parameter adjustment situations in actual applications are comprehensively considered, and different ways of adjusting the parameter set are set for various situations where the output waveform does not meet the preset conditions, with strong applicability. By using a simulation test circuit, it is avoided to manually adjust the parameter set of the impulse voltage generation circuit in actual experiments. By using a simulation test circuit, the parameter set can be flexibly adjusted, and the time for adjusting the parameter set and simulating the output waveform is short, and the parameter set corresponding to the output waveform that meets the preset conditions can be obtained quickly and efficiently.

[0090] It should be understood that although the steps in the flowcharts involved in the above-described embodiments are shown in sequence according to the arrows, these steps do not necessarily have to be executed in the order indicated by the arrows. Unless there is a clear indication in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least some of the steps in the flowcharts involved in the above-described embodiments may include multiple steps or multiple stages. These steps or stages do not necessarily have to be executed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least some of the steps or stages in other steps or other steps.

[0091] Based on the same inventive concept, an embodiment of the present application also provides a parameter determination device for an impulse voltage generation circuit for implementing the parameter determination method of the impulse voltage generation circuit involved above. The implementation solution provided by this device to solve the problem is similar to the implementation solution described in the above method. Therefore, the specific limitations in one or more embodiments of the parameter determination device for the impulse voltage generation circuit provided below can refer to the limitations on the parameter determination method of the impulse voltage generation circuit in the above text, and will not be repeated here.

[0092] In one embodiment, as Figure 3 shown, a parameter determination device for an impulse voltage generation circuit is provided, including: an acquisition module, a simulation module, and a parameter adjustment module, where:

[0093] The acquisition module is used to acquire a parameter set of the impulse voltage generation circuit to be processed, where the parameter set includes: the number of generator stages, the wavefront resistance value of each stage, the wave tail resistance value of each stage, the inductance value of each stage, and the capacitance value of each stage;

[0094] A simulation module, configured to establish a simulation test circuit based on the parameter set and the impulse voltage generating circuit, and determine an output waveform based on the simulation test circuit;

[0095] A parameter adjustment module, configured to, if the output waveform does not meet a preset condition, adjust the circuit parameter set, and repeat the process of determining the output waveform until the determined output waveform meets the preset condition, and use the circuit parameter set corresponding to the output waveform that meets the preset condition as the target parameter set.

[0096] In one embodiment, the parameter set includes: a front-wave resistance value, a tail-wave resistance value, and a capacitance value, and the parameter adjustment module includes: a first adjustment unit and a second adjustment unit, including:

[0097] The first adjustment unit is configured to, if the output waveform does not meet the preset condition, and the front-wave resistance value is within a first range and the tail-wave resistance value is within a second range, adjust the front-wave resistance value or the tail-wave resistance value;

[0098] The second adjustment unit is configured to, if the output waveform does not meet the preset condition, and the front-wave resistance value is not within the first range, or the tail-wave resistance value is not within the second range, adjust the capacitance value.

[0099] In one embodiment, the preset condition includes: the front-wave time is within a first interval, and the half-peak time is within a second interval.

[0100] In one embodiment, the first adjustment unit includes: a first sub-unit and a second sub-unit, where:

[0101] The first sub-unit is configured to, if the front-wave time of the output waveform is not within the first interval, or the overshoot is not within the preset overshoot range, and the front-wave resistance value is within the first range, adjust the front-wave resistance value by a first step size;

[0102] The second sub-unit is configured to, if the front-wave time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, the half-peak time of the output waveform is not within the second interval, and the tail-wave resistance value is within the second range, adjust the tail-wave resistance value by a second step size.

[0103] In one embodiment, the first sub-unit includes: a first adjustment component and a second adjustment component, where:

[0104] The first adjustment component is configured to, if the front-wave time of the output waveform is less than the minimum value of the first interval, and the front-wave resistance value is within the first range, increase the first step size to the front-wave resistance value;

[0105] The second adjustment component is configured to reduce a first step length from the wavefront resistance value if the wavefront time of the output waveform is greater than the minimum value of the first interval and the wavefront resistance value is within a first range.

[0106] In one embodiment, the second adjustment unit includes: a third subunit and a fourth subunit, where:

[0107] The third subunit is configured to adjust the capacitance value if the wavefront time of the output waveform is not within the first interval, the overshoot is not within the preset overshoot range, and the wavefront resistance value is not within the first range;

[0108] The fourth subunit is configured to adjust the capacitance value if the wavefront time of the output waveform is within the first interval, the overshoot is within the preset range, the wave tail resistance value is not within a second range, and the wave tail resistance value is not within the second range.

[0109] Each module in the parameter determination device of the above impulse voltage generation circuit can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in the processor of the computer device in hardware form or be independent of it, or be stored in the memory of the computer device in software form, so that the processor can call and execute the operations corresponding to the above modules.

[0110] In one embodiment, a computer device is provided. The computer device can be a terminal, and its internal structure diagram can be as Figure 4 shown. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner. The wireless manner can be achieved through WIFI, a mobile cellular network, NFC (Near Field Communication), or other technologies. The computer program, when executed by the processor, implements a method for determining parameters of an impulse voltage generation circuit. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen. The input device of the computer device can be a touch layer covering the display screen, or a button, a trackball, or a touchpad provided on the housing of the computer device, or an external keyboard, touchpad, or mouse, etc.

[0111] Those skilled in the art can understand, Figure 4The structure shown is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have a different component layout.

[0112] In one embodiment, a computer device is provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the following steps are implemented:

[0113] Obtain a parameter set of the impulse voltage generation circuit to be processed;

[0114] Based on the parameter set and the impulse voltage generation circuit, establish a simulation test circuit, and determine the output waveform based on the simulation test circuit;

[0115] If the output waveform does not meet the preset conditions, adjust the parameter set, and repeat the process of determining the output waveform until the determined output waveform meets the preset conditions. Take the parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set.

[0116] In one embodiment, the parameter set includes: wavefront resistance value, wave tail resistance value, and capacitance value; when the processor executes the computer program, the following steps are also implemented:

[0117] The step of adjusting the circuit parameter set if the output waveform does not meet the preset conditions includes:

[0118] If the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, then adjust the wavefront resistance value or the wave tail resistance value;

[0119] If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range, then adjust the capacitance value.

[0120] In one embodiment, the preset conditions include: the front time is within the first interval, and the half-peak time is within the second interval.

[0121] In one embodiment, when the processor executes the computer program, the following steps are also implemented:

[0122] The step of adjusting the wavefront resistance value or the wave tail resistance value if the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, includes:

[0123] If the wavefront time of the output waveform is not within the first interval, or the overshoot is not within the preset overshoot range, and the wavefront resistance value is within the first range, then adjust the wavefront resistance value by the first step size;

[0124] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, the half-peak time of the output waveform is not within the second interval, and the wave tail resistance value is within the second range, then adjust the wave tail resistance value by the second step size.

[0125] In one embodiment, when the processor executes the computer program, the following steps are further implemented:

[0126] The step of adjusting the wavefront resistance value by the first step size when the wavefront time of the output waveform is not within the first interval and the wavefront resistance value is within the first range includes:

[0127] If the wavefront time of the output waveform is less than the minimum value of the first interval and the wavefront resistance value is within the first range, then increase the first step size to the wavefront resistance value;

[0128] If the wavefront time of the output waveform is greater than the minimum value of the first interval and the wavefront resistance value is within the first range, then decrease the first step size to the wavefront resistance value.

[0129] In one embodiment, when the processor executes the computer program, the following steps are further implemented:

[0130] The step of adjusting the capacitance value when the output waveform does not meet the preset conditions and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range includes:

[0131] If the wavefront time of the output waveform is not within the first interval, the overshoot is not within the preset overshoot range, and the wavefront resistance value is not within the first range, then adjust the capacitance value;

[0132] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset range, the wave tail resistance value is not within the second range, and the wave tail resistance value is not within the second range, then adjust the capacitance value.

[0133] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0134] Obtain the parameter set of the impulse voltage generating circuit to be processed;

[0135] Establish a simulation test circuit based on the parameter set and the impulse voltage generation circuit, and determine the output waveform based on the simulation test circuit;

[0136] If the output waveform does not meet the preset conditions, adjust the parameter set, and repeat the process of determining the output waveform until the determined output waveform meets the preset conditions, and use the circuit parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set.

[0137] In one embodiment, the parameter set includes: the wavefront resistance value, the wave tail resistance value, and the capacitance value; when the computer program is executed by the processor, the following steps are further implemented:

[0138] The step of adjusting the circuit parameter set if the output waveform does not meet the preset conditions includes:

[0139] If the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, then adjust the wavefront resistance value or the wave tail resistance value;

[0140] If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range or the wave tail resistance value is not within the second range, then adjust the capacitance value.

[0141] In one embodiment, the preset conditions include: the wavefront time is within the first interval, the overshoot is within the preset overshoot range, and the half-peak time is within the second interval.

[0142] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented:

[0143] The step of adjusting the wavefront resistance value or the wave tail resistance value if the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range includes:

[0144] If the wavefront time of the output waveform is not within the first interval, or the overshoot is not within the preset overshoot range, and the wavefront resistance value is within the first range, then adjust the wavefront resistance value according to the first step size;

[0145] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, the half-peak time of the output waveform is not within the second interval, and the wave tail resistance value is within the second range, then adjust the wave tail resistance value according to the second step size.

[0146] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented:

[0147] If the front time of the output waveform is not within the first interval and the front resistance value is within the first range, adjusting the front resistance value according to the first step length includes:

[0148] If the front time of the output waveform is less than the minimum value of the first interval and the front resistance value is within the first range, adding the first step length to the front resistance value;

[0149] If the front time of the output waveform is greater than the minimum value of the first interval and the front resistance value is within the first range, subtracting the first step length from the front resistance value.

[0150] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0151] If the output waveform does not meet the preset conditions and the front resistance value is not within the first range, or the tail resistance value is not within the second range, adjusting the capacitance value includes:

[0152] If the front time of the output waveform is not within the first interval, the overshoot is not within the preset overshoot range, and the front resistance value is not within the first range, adjusting the capacitance value;

[0153] If the front time of the output waveform is within the first interval, the overshoot is within the preset range, the tail resistance value is not within the second range, and the tail resistance value is not within the second range, adjusting the capacitance value.

[0154] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the following steps:

[0155] Obtain a parameter set of the impulse voltage generating circuit to be processed;

[0156] Based on the parameter set and the impulse voltage generating circuit, establish a simulation test circuit, and determine the output waveform based on the simulation test circuit;

[0157] If the output waveform does not meet the preset conditions, adjust the parameter set, and repeat the process of determining the output waveform until the determined output waveform meets the preset conditions, and use the circuit parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set.

[0158] In one embodiment, the parameter set includes: front resistance value, tail resistance value, and capacitance value; when the computer program is executed by a processor, the following steps are further implemented:

[0159] If the output waveform does not meet the preset conditions, adjusting the circuit parameter set includes:

[0160] If the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave-tail resistance value is within the second range, then adjust the wavefront resistance value or the wave-tail resistance value;

[0161] If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave-tail resistance value is not within the second range, then adjust the capacitance value.

[0162] In one embodiment, the preset conditions include: the wavefront time is within the first interval and the half-peak time is within the second interval.

[0163] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented:

[0164] The step of, if the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave-tail resistance value is within the second range, then adjust the wavefront resistance value or the wave-tail resistance value, includes:

[0165] If the wavefront time of the output waveform is not within the first interval, or the overshoot is not within the preset overshoot range, and the wavefront resistance value is within the first range, then adjust the wavefront resistance value according to the first step size;

[0166] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, the half-peak time of the output waveform is not within the second interval, and the wave-tail resistance value is within the second range, then adjust the wave-tail resistance value according to the second step size.

[0167] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented:

[0168] The step of, if the wavefront time of the output waveform is not within the first interval, and the wavefront resistance value is within the first range, then adjust the wavefront resistance value according to the first step size, includes:

[0169] If the wavefront time of the output waveform is less than the minimum value of the first interval, and the wavefront resistance value is within the first range, then increase the first step size to the wavefront resistance value;

[0170] If the wavefront time of the output waveform is greater than the minimum value of the first interval, and the wavefront resistance value is within the first range, then decrease the first step size to the wavefront resistance value.

[0171] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented:

[0172] If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range, then adjusting the capacitance value includes:

[0173] If the wavefront time of the output waveform is not within the first interval, the overshoot is not within the preset overshoot range, and the wavefront resistance value is not within the first range, then adjust the capacitance value;

[0174] If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset range, the wave tail resistance value is not within the second range, and the wave tail resistance value is not within the second range, then adjust the capacitance value.

[0175] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium provided in the embodiments of the present application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments of the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments of the present application can be general-purpose processors, central processors, graphics processors, digital signal processors, programmable logic devices, data processing logics based on quantum computing, etc., without limitation.

[0176] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0177] The above-described embodiments merely represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims

1. A method for determining parameters of an impulse voltage generating circuit, characterized in that, The method includes: Obtaining a parameter set of the impulse voltage generating circuit to be processed; Based on the parameter set and the impulse voltage generating circuit, establishing a simulation test circuit, and determining an output waveform based on the simulation test circuit; If the output waveform does not meet the preset conditions, adjust the parameter set, and repeat the process of determining the output waveform until the determined output waveform meets the preset conditions, and use the circuit parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set; Wherein, the parameter set includes: a wavefront resistance value, a wave tail resistance value, and a capacitance value; if the output waveform does not meet the preset conditions, adjusting the circuit parameter set includes: If the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, then adjust the wavefront resistance value or the wave tail resistance value; If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range, then adjust the capacitance value; Wherein, the first range includes a first minimum value and a first maximum value; the first minimum value is determined according to a first step length and a first threshold of the wavefront resistance; the first maximum value is determined according to the first step length and a second threshold of the wavefront resistance; the adjusted wavefront resistance cannot be less than the first threshold and cannot be greater than the second threshold; the first threshold and the second threshold can be set according to requirements; the first step length is preset; Wherein, the second range includes a second minimum value and a second maximum value; the second minimum value is determined according to a second step length and a third threshold of the wave tail resistance, and the second maximum value is determined according to the second step length and a fourth threshold of the wave tail resistance; the adjusted wave tail resistance value cannot be less than the third threshold and cannot be greater than the fourth threshold; the third threshold and the fourth threshold can be set according to requirements; the second step length is preset.

2. The method according to claim 1, wherein The preset conditions include: the wavefront time is within the first interval, the overshoot is within the preset overshoot range, and the half-peak time is within the second interval.

3. The method according to claim 2, wherein If the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, then adjusting the wavefront resistance value or the wave tail resistance value includes: If the wavefront time of the output waveform is not within the first interval, or the overshoot is not within the preset overshoot range, and the wavefront resistance value is within the first range, then adjust the wavefront resistance value according to the first step length; If the wavefront time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, the half-peak time of the output waveform is not within the second interval, and the wave tail resistance value is within the second range, then adjust the wave tail resistance value according to the second step length.

4. The method according to claim 3, wherein If the wavefront time of the output waveform is not within the first interval, and the wavefront resistance value is within the first range, then adjusting the wavefront resistance value according to the first step length includes: If the wavefront time of the output waveform is less than the minimum value of the first interval, and the wavefront resistance value is within the first range, then increase the wavefront resistance value by the first step length; If the front time of the output waveform is greater than the minimum value of the first interval and the wavefront resistance value is within the first range, then reduce the first step length on the wavefront resistance value.

5. The method according to any one of claims 2 to 4, characterized in that, If the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range, then adjusting the capacitance value includes: If the front time of the output waveform is not within the first interval, the overshoot is not within the preset overshoot range, and the wavefront resistance value is not within the first range, then adjust the capacitance value; If the front time of the output waveform is within the first interval, the overshoot is within the preset overshoot range, and the wave tail resistance value is not within the second range, then adjust the capacitance value.

6. A parameter determination device for an impulse voltage generating circuit, characterized in that, The device includes: An acquisition module, configured to acquire a parameter set of the impulse voltage generating circuit to be processed; A simulation module, configured to establish a simulation test circuit based on the parameter set and the impulse voltage generating circuit, and determine an output waveform based on the simulation test circuit; A parameter adjustment module, configured to, if the output waveform does not meet the preset conditions, adjust the circuit parameter set, and repeat the process of determining the output waveform above until the determined output waveform meets the preset conditions, and use the circuit parameter set corresponding to the output waveform that meets the preset conditions as the target parameter set; Wherein, the parameter set includes: a wavefront resistance value, a wave tail resistance value, and a capacitance value; the parameter adjustment module includes: A first adjustment unit, configured to, if the output waveform does not meet the preset conditions, and the wavefront resistance value is within the first range and the wave tail resistance value is within the second range, then adjust the wavefront resistance value or the wave tail resistance value; A second adjustment unit, configured to, if the output waveform does not meet the preset conditions, and the wavefront resistance value is not within the first range, or the wave tail resistance value is not within the second range, then adjust the capacitance value; Wherein, the first range includes a first minimum value and a first maximum value; the first minimum value is determined according to the first step length and the first threshold of the wavefront resistance; the first maximum value is determined according to the first step length and the second threshold of the wavefront resistance; the adjusted wavefront resistance cannot be less than the first threshold and cannot be greater than the second threshold; the first threshold and the second threshold can be set according to requirements; the first step length is preset; Wherein, the second range includes a second minimum value and a second maximum value; the second minimum value is determined according to the second step length and the third threshold of the wave tail resistance, and the second maximum value is determined according to the second step length and the fourth threshold of the wave tail resistance; the adjusted wave tail resistance value cannot be less than the third threshold and cannot be greater than the fourth threshold; the third threshold and the fourth threshold can be set according to requirements; the second step length is preset.

7. The device according to claim 6, characterized in that, The preset conditions include: the front time is within the first interval, the overshoot is within the preset overshoot range, and the half-peak time is within the second interval.

8. A computer device, comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, the steps of the method according to any one of claims 1 to 5 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 5 are implemented.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 5.

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