Using vibration to locate devices in test systems

Abstract

The present invention discloses an exemplary testing system, which includes a tray for holding a device, wherein the device includes a device to be tested or a tested device; a motor that can be controlled to cause vibration; and a component that connects the motor to the tray so that the tray vibrates in response to the vibration of the motor.

Description

Technical Field

[0001] This specification generally relates to using focused vibration to position a device in a test system. Background Art

[0002] The test system is configured to test the operation of electronic devices such as microprocessors and memory chips. Testing may include sending signals to the device and determining how the device reacts to these signals based on its response. The reaction of the device will determine whether the device passes or fails the test. Summary of the invention

[0003] An exemplary test system includes a tray for holding a device, wherein the device includes a device to be tested or a tested device; a motor that can be controlled to cause vibration; and a component that couples the motor to the tray so that the tray vibrates in response to the vibration of the motor. The test system may include one or more of the following features (alone or in combination).

[0004] The component may be configured to hold the motor against the tray to directly couple the motor to the tray. An exemplary test system may include a frame for holding the tray. The component may be configured to hold the motor against the frame to couple the motor to the tray via the frame. The component may be flexible and may be configured to bend away from the tray in response to contact with the tray.

[0005] The tray may include containers, wherein each container is configured to hold a device. The vibration may be calibrated so that the misaligned device within the container is seated within the container. The exemplary test system may also include a power supply for powering the motor. The motor may include an eccentric mass. The exemplary test system may include a control system for setting a voltage input to the motor to control the rotation speed of the eccentric mass to cause vibration at a specific frequency and amplitude, and setting an operating duration of the motor. The voltage may be 3 volts to 4 volts, and the duration may be 1 second to 3 seconds.

[0006] The exemplary test system may also include a feeder for moving a tray containing untested devices into a position close to the motor. The control system may be configured to control the operation of the motor to cause vibration after the feeder is moved into the position. As described above, the exemplary test system may also include a frame for holding the tray. The feeder may be configured to move the frame holding the tray so that the tray is in a suitable position relative to the motor. The feeder may include a belt for moving the tray and a pushing device for pushing the tray against the surface of the frame. The tray may be part of a box of multiple trays. The tray may move up and down in the box relative to the surface holding the test system.

[0007] The control system may be configured to cause operation of the motor based on the total mass of the devices in the tray. The feeder may be configured to move the tray containing the tested devices away from the motor. The control system may be configured to cause operation of the motor before the feeder moves away from the motor. The feeder may be configured to move the tray containing the tested devices away from the motor and may be configured to move the tray containing the tested devices toward the motor. The control system may be configured to cause operation of the motor before the feeder moves away from the motor and after the tray moves toward the motor.

[0008] The exemplary test system may also include a test carrier for holding at least some of the devices; a device shuttle for transferring at least some of the devices between a pallet and the test carrier; and a first robot for moving at least some of the devices between the test carrier and the device shuttle. The device shuttle may be configured to move a first device between devices that have not yet been tested toward a level of the test system containing the first robot. The device shuttle may be configured to move in a first dimension. The first robot may be configured to move the first device from the device shuttle to the test carrier. The first robot may be configured to move in a second dimension different from the first dimension. The second robot may be configured to move at least some of the devices between the pallet and the device shuttle. The exemplary test system may also include a second robot for moving the first device from the first pallet to the shuttle, and moving the second device in the tested device from the shuttle to the second pallet.

[0009] The tray may be a first tray; the motor may be a first motor; and the component may be a first component. The exemplary test system may further include a second tray for holding a device; a second motor that is controllable to cause vibration; and a second component that couples the second motor to the second tray so that the second tray vibrates in response to vibration of the second motor. The exemplary test system may further include a third tray for holding a device; a third motor that is controllable to cause vibration; and a third component that couples the third motor to the third tray so that the third tray vibrates in response to vibration of the third motor. The first tray, the second tray, and the third tray may be arranged in parallel in the test system.

[0010] Any two or more of the features described in this specification (including this Summary) can be combined to form implementations not specifically described herein.

[0011] The systems and techniques and technologies described herein, or a portion thereof, may be implemented as or controlled by a computer program product that includes instructions stored on one or more non-transitory machine-readable storage media and that may be executed on one or more processing devices to control (e.g., coordinate) the operations described herein. The systems and techniques and technologies described herein, or a portion thereof, may be implemented as an apparatus, method, or electronic system that may include one or more processing devices and a memory storing executable instructions for implementing various operations.

[0012] The details of one or more implementations are set forth in the accompanying drawings and the following detailed description. Other features, objects, and advantages will be apparent from the detailed description and drawings, and from the claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 is a perspective view of an exemplary testing system.

[0014] Figure 2 and Figure 3 is shown in different configurations during operation Figure 1 A perspective view of an example of the internal components of a testing system.

[0015] Figure 4 is included for Figures 1 to 3 A perspective view of a portion of an exemplary assembly of components for adding vibration to a test tray in an exemplary system of FIG.

[0016] Figure 5 yes Figure 3 An exploded view of a portion of the assembly shown.

[0017] Like reference numbers in different drawings indicate similar elements. DETAILED DESCRIPTION

[0018] This article describes an exemplary embodiment of a carrier-based test system. In addition to other components, an exemplary carrier-based test system includes a carrier having one or more test sockets, each test socket being used to receive a device to be tested. The device being tested is referred to as a device under test or DUT. The DUT can be loaded into the test system and removed from the test system using a tray such as a JEDEC (Joint Electron Device Engineering Council) tray. For example, a transport robot can be configured and controlled to place a tested device into a tray and remove an untested device from the tray for testing. Each tray may include multiple containers, which are also referred to as "nested pieces". The size of the container can be set to accommodate the DUT being tested. However, the alignment of each container by the transport robot may not always be perfect, which causes one or more DUTs in the DUT to deviate from the center or rotate in the container. Improper handling of untested DUTs by technicians can also cause one or more DUTs in the DUT to deviate from the center in the container. In order to solve this problem-for example, in order to improve the positioning of the DUT in the tray container-the tray can be subjected to focused and controlled vibration. For example, a rotary vibration motor can be directly or indirectly physically connected to the tray. The motors are run at the appropriate frequency for the appropriate time to cause the DUTs to move within their respective containers. This movement of the DUTs causes all or some of the DUTs in the DUTs to be properly positioned within their respective containers. As a result, all or some of the DUTs in the DUTs can be better positioned in their respective trays for removal by a robot or other automated component of the test system.

[0019] The concepts described herein are not limited to use with the test systems described herein, or to use with testing in general. Rather, the concepts may be applied in any appropriate technical context.

[0020] See also Figure 1 , Figure 2 and Figure 3 , the exemplary test system 10 includes five levels (or zones) per automated test subsystem; however, any suitable number of levels may be included in the test system. In this regard, the exemplary test system is modular, thereby enabling the test system to adapt to various testing requirements. Each unit of the test system is referred to as a slice. Two or more slices may be combined and controlled to operate together (e.g., dependently) or independently to perform test operations.

[0021] In an exemplary embodiment, the five stages include an input / output (I / O) stage 14, a transfer stage 17, a loading stage 18, an insertion stage 19, and a test stage 20. The definitions of the various stages are not intended to be limiting, and one or more components may perform functions in two or more of the stages. In some embodiments, different stages are configured to operate at different levels of precision. For example, a higher level of precision (e.g., up to micron level) may be used in the loading stage, while a lower level of precision may be used in some or all other stages. System components (such as mechanical components) may be configured to operate within tolerances of achieving a lower level of precision in some stages. By reducing higher precision to the level where it may be needed, the cost and complexity of the test system may be controlled in some cases.

[0022] Computing system 45 communicates with test system 10 to control and coordinate the operation of test system 10. Computing system 45 may include one or more processing devices, examples of which are described herein. Communication between test system 10 and computing system 45 is represented by dashed arrow 46.

[0023] The different stages of the test system can be operated independently and simultaneously. Figure 2 In the example of , each stage includes two parallel paths 21 and 22. Each of the parallel paths includes an automated device, such as a robot, that transfers trays, carriers, devices, or both between adjacent stages. The operation of different stages independently, simultaneously, and in parallel paths can support higher test throughput and speed than some equivalent test systems.

[0024] exist Figure 1 In the example of , I / O level 14 includes, but is not limited to, a feeder for receiving trays of tested devices and for providing trays of untested devices to the test system. The feeder is where a human operator interacts with the tester system. As mentioned above, examples of trays that can be used include JEDEC trays; however, the system can use any suitable type of tray. Figure 1In the example of , there are three feeders 23, 24, 25 for each slice; however, the system is not limited to use with three feeders. The first feeder 23 is used for trays containing untested devices; the second feeder 24 is used for trays containing tested devices that have not passed the test, and the third feeder 25 is used for trays containing devices that have passed the test. In this example, the feeder 23 is manually loaded with trays of untested devices. A tray in a stack of trays containing untested devices is fed from the feeder 23 to the transport stage 17. After all devices on the tray have been forwarded for testing and the tray is empty, the tray is retracted into the feeder and a new tray containing untested devices is fed to the transport stage. After the device is loaded onto the tray after testing and the tray is full (in some embodiments), the tray is retracted into the feeder, and a new empty tray is fed from the I / O stage to the transport stage from either feeder 24 or 25. In some embodiments, the operation of feeders 24 and 25 may be the same for trays containing devices that have passed the test and trays containing devices that have not passed the test. In some embodiments, the tray handled by feeder 24 is part of a box containing multiple trays that move up and down within the feeder. Based on the reasons why these devices failed to test, the devices can be enclosed on different trays handled by feeder 24. Exemplary boxes are physical and logical locations for separating devices for post-test sorting. Therefore, in the case of feeder 24, the feeder can feed a first tray containing tested devices into the system, remove the first tray after the tested devices have been added, feed a second tray into the system, remove the second tray after the tested devices have been added, and feed the first tray into the system again to accommodate devices that failed to test for the same reason as other devices in the first tray.

[0025] Figure 4 and Figure 5 Components of an exemplary assembly 72 that may be incorporated into the I / O stage 14 for holding a tray, such as Figure 2 and Figure 3 Trays 34, 35 and 36. Figure 4 A perspective view of a portion of assembly 72 is shown (broken apart at line 73), and Figure 5 A partially exploded view of a portion of the assembly 72 is shown. In the assembly 72, a tray 74 (which may be Figure 2 and Figure 3 The example of the tray 34, 35 and 36 of FIG. 1 includes a two-dimensional container array 75 for holding tested DUTs, untested DUTs, or both tested DUTs and untested DUTs. In some embodiments, the tray may include a one-dimensional container array. In some embodiments, the tray may include a three-dimensional container array.

[0026] Assembly 72 includes a frame 76 that holds a tray 74. The frame includes a belt 80 ( Figure 4 Only one belt is visible in the figure), which can be controlled to move the tray in the direction of arrows 82 and 83. When fully extended in the direction of arrow 82, as shown in FIG. Figure 4 and Figure 5 As shown, the tray is in Figure 2 and Figure 3 The trays 34, 35 and 36 are in the positions shown. Figure 2 and Figure 3 When the trays 34, 35 and 36 are in the positions shown, the transfer robot 30 described below can remove untested DUTs from the trays or add tested DUTs to the trays, as described further below. When moving in the direction of arrow 83, the tray retracts to its corresponding feeder, such as feeder 23, 24 or 25. Then, a new tray can be introduced into the system by moving in the direction of arrow 82.

[0027] like Figure 4 and Figure 5 As shown, assembly 72 includes a motor 84 that can be controlled to cause vibration. For example, the motor can be controlled by a computing system 45 that can control the tester system. In some embodiments, the motor includes an eccentric mass. The computing system can be configured to set a voltage input to the motor to control the rotation speed of the eccentric mass to cause vibration, and to set the operating duration of the motor. The magnitude or amplitude, frequency, and duration of the vibration will depend on the physical properties of the tray and the physical properties of the DUT. For example, the magnitude or amplitude, frequency, and duration of the vibration may depend on the size of the DUT, the size of the container, the size of the DUT relative to the size of the container, the weight of the tray, the weight of the tray when the DUT is added, etc., and can be set based on these.

[0028] In any case, the magnitude, frequency, and duration of the vibration should be sufficient to move each DUT into its corresponding container, but not cause a single DUT to move out of its corresponding container. For example, the magnitude, frequency, and duration of the vibration may be sufficient to cause all or some of the DUTs in a single DUT to be placed in their corresponding containers. For example, the vibration may be calibrated so that a misaligned device in a container is placed in the container. For example, the magnitude, frequency, and duration of the vibration may be sufficient to cause all or some of the DUTs in a single DUT to be placed in their corresponding containers so that the approximate center of each DUT is aligned with the approximate center of its corresponding container. The DUT may also be rotated about its center to be properly oriented with the container.

[0029] In an exemplary embodiment, the motor 84 is a coin cell motor. In one example, the coin cell motor includes a printed circuit board (PCB) containing a three-pole commutation circuit around an internal shaft in the center of the motor. Two voice coils and an eccentric mass are integrated into a flat plastic disk with a bearing in the middle. This arrangement is mounted on the shaft. Brushes on the underside of the plastic disk contact the PCB commutation pads and provide power to the voice coil. This creates a magnetic field. This magnetic field interacts with the magnetic flux generated by the disk magnet attached to the chassis of the motor. The commutation circuit alternates the direction of the magnetic field through the voice coil. This alternating magnetic field interacts with the north / south pole pair that is part of the magnet. As a result, the plastic disk rotates. As a result, the eccentric mass in the disk rotates, causing vibrations. These vibrations are transmitted to the motor housing. In some embodiments, the coin cell motor runs for 1 second to 3 seconds using a voltage of 3 volts to 4 volts. In some embodiments, the coin cell motor runs for different durations using different voltages. A power supply (not shown) may be included to provide power to the motor.

[0030] Arrangement 72 also includes components, such as arms 85, that couple motor 84 to tray 74 so that the tray vibrates in response to vibrations of the motor. The coupling between the motor and the tray can be direct. For example, the motor can be in direct contact with the tray. In this case, the vibrations of the motor are directly transmitted to the tray. The coupling between the motor and the tray can be indirect. For example, there can be one or more components, such as frame 76, between the motor and the tray. In this case, the vibrations from the motor are transmitted to the tray through one or more components, such as frame 76, between the tray and the motor.

[0031] exist Figure 4 In the example of FIG. 8 , arm 85 is physically connected to frame 76. Arm 85 holds the motor on the side 86 of the arm facing tray 74. In this example, frame 76 includes an opening 88 at its end 89. Thus, when moved to Figure 4 and Figure 5 , the tray 74 can be directly adjacent to and in contact with the motor 84 when in the position shown in . Thus, the motor is in direct contact with the tray 74. However, in some embodiments, the motor may not be in direct contact with the tray. For example, the motor may be located at the side 90 or 91 of the frame 76. Alternatively, the frame 76 may completely surround the tray. In these examples of indirect coupling between the motor and the tray, vibrations are transmitted from the motor to the frame and then to the tray.

[0032] In some embodiments, the arm is flexible and is configured to bend away from the tray in response to contact with the tray. For example, the arm may be made of bendable plastic, rubber, aluminum, a composite material, or any other suitable material that bends and returns to its original position. In some embodiments, the arm may be spring loaded. In operation, as the tray advances in the direction of arrow 82, the tray eventually contacts the motor 84 mounted on the arm 85. The arm bends in response to this contact and forces the motor against the tray. In some embodiments, for example, where a frame surrounds the tray, the arm holds the motor against the frame to couple the motor to the tray via the frame.

[0033] In some embodiments, the frame 76 includes a member 92 made of a flexible material. The member 92 applies a diagonal force to the tray 74 in the direction of arrow 94. The amount of force is sufficient to push the tray against the frame and the arm without preventing the tray from moving within the frame. The amount of force required will vary based on factors such as the size, shape and weight of the tray, the pre-existing compliance between the tray and the frame, the shape of the frame and the flexibility of the arms. Other factors may also affect the amount of force that may be required.

[0034] In some embodiments, the motor is operated to Figure 4 For example, when the tray contains untested DUTs, when the tray is in the Figure 4 When the tray is in the position shown, the vibration is activated to position the untested devices in the tray container. For example, when the tray contains tested DUTs, when the tray is in Figure 4 When the tray is in the position shown, vibration is activated to place the tested devices in the tray containers. The tray containing the test DUTs can then be retracted into a feeder as described herein and replaced with a new empty tray or a different tray containing some tested DUTs and unoccupied containers to accommodate additional tested DUTs.

[0035] In some embodiments, the motor may be operated at times other than those described above. For example, in embodiments where the motor contacts the frame, vibrations may be induced at any suitable time. For example, when the tray is in Figure 4 When the tray travels from the feeder to Figure 4 When the tray is initially introduced into the system, for example at a position adjacent to a feeder, vibrations may be induced.

[0036] As explained herein, in some embodiments, a system may include three trays arranged in parallel, each tray having Figure 2 and Figure 3 In some embodiments, there may be fewer than two trays or more than two trays.

[0037] See also Figure 2 and Figure 3 , the transfer stage 17 includes but is not limited to a transfer robot 30 (e.g., Figure 2 ) and two device shuttles 31, 32 (e.g., Figure 3 ). The two equipment shuttles provide parallel transfer paths into and out of the loading stage 18 described below and support test throughput and redundant reliability in some examples. The transfer robot 30 is controllable to load and unload the test equipment from a tray 34 (e.g., Figure 2 ) picks up the untested device and places the untested device into the device shuttle 31 and / or 32 (e.g., Figure 3 ). The transfer robot 30 is controllable to pick up a test device from the device shuttles 31 and 32 and place the test device into the appropriate one of the trays 35 or 36, depending on whether the particular device passed or failed the test. In some embodiments, the transfer robot 30 can pick up and hold the device by air suction or using a mechanical clamp or other mechanical mechanism. After operation of the transfer robot, as described with respect to Figure 4 and Figure 5 As described, vibrations may be introduced into the tray.

[0038] In some embodiments, two equipment shuttles can be configured and controlled to operate in parallel, independently, simultaneously and / or in parallel. For example, a transfer robot can provide an equipment shuttle with a device to be tested, while removing the tested device from another equipment shuttle. The two equipment shuttles can be configured to move between the loading level and the transmission level independently, in parallel, simultaneously and / or in parallel. For example, one equipment shuttle can transfer the device to be tested from the transmission level toward the loading level and transfer it to the loading level, while another equipment shuttle transfers the tested device away from the loading level and transfers it to the transmission level. In addition, one equipment shuttle can be stationary while the other equipment shuttle is moving. For example, one equipment shuttle can receive the device to be tested, while the other equipment shuttle transfers the device to the loading level or transfers the device from the loading level.

[0039] In some embodiments, the loading stage 18 includes, but is not limited to, loading robots 48, 49 and areas for loading devices into and unloading devices from a test carrier (such as 50 and 51). In this example, there are two loading robots per slice; however, the test system may include any appropriate number of loading robots. In this example, the loading robots 48, 49 are configured to move in the X dimension and also move in the Z dimension to perform pick and place operations on the devices. For example, untested devices are picked up from a shuttle and moved to a carrier for testing, and tested devices are picked up from a carrier and moved to a shuttle.

[0040] exist Figure 2 and Figure 3In the example of FIG, two test arms 77, 78 are shown per slice; however, the test system may include any suitable number of test arms. The test arms may move in all three dimensions (X, Y, and Z), including rotation and flipping, to insert test carriers containing untested devices into test slots in the test rack and extract or remove test carriers containing tested devices from test slots in the test rack. The carriers containing tested devices are moved back to the loading stage, where the devices are unloaded onto the shuttle by the loading robot.

[0041] Each test arm is configured to hold two test carriers simultaneously, one on each face or side of the test arm. In some embodiments, each side of the test arm (e.g., 77 or 78) includes a carrier holding container, such as a clamp, for receiving, holding and releasing the test carrier. In one example, the clamp is spring loaded to accept a test carrier containing an untested device from a carrier shuttle and release the test carrier containing a tested device to a (same or different) carrier shuttle. The carrier shuttle can be configured to control the opening and closing of each clamp. The carrier shuttle 82 can move the carrier between the test arm and the loading position.

[0042] The test rack 70 includes a plurality of test slots. The carrier 71 is shown in the corresponding slot of the test rack. Each test slot can be configured and controlled to test the device in the test socket on the test carrier, and the test results are reported back to the computing system controlling the test system. The computing system tracks which devices have passed the test and which devices have failed the test, classifies the devices accordingly and reports the test results. The test slots in the test rack are served by the test arm. In some embodiments, during the test, except for a short time during the exchange of the test carrier in the slot, the test slot always remains occupied. For example, the test arm 77 or 78 can reach the test slot while maintaining the test carrier containing the untested device, extract the test carrier containing the tested device from the test slot, and insert the test carrier containing the untested device into the same test slot from which another test carrier is extracted. Therefore, except for the time between removing and inserting the test carrier, the test slot is still occupied. It is possible to provide services for each test slot in the test rack in this way to improve the test throughput. The following provides an example of how to insert and extract the test carrier.

[0043] In operation, the test arm 77 or 78 moves (e.g., flips and rotates) to position itself to pick up a test carrier containing an untested device from a carrier shuttle such as the carrier shuttle 50, and deposit the test carrier containing the tested device onto the (same or different) carrier shuttle. In this example, the test carrier rotates (e.g., about 170°) and flips. The rotation is around the longitudinal axis of the test arm, and the flipping includes a rotation in the X dimension. Due to this movement, the first gripper above the test arm is in a suitable position to pick up the test carrier containing the untested device from the carrier shuttle. Therefore, the first gripper is controlled to pick up the test carrier containing the untested device from the carrier shuttle. Then, the test arm rotates at a point above or near the carrier shuttle along its longitudinal axis to position the test carrier containing the tested device to be deposited onto the carrier shuttle. The second gripper holding the test carrier on the test arm is opened, so that the test carrier containing the tested device is deposited on the carrier shuttle. Then, the carrier shuttle transfers the test carrier containing the tested device to the loading stage.

[0044] Therefore, at this time, the second clamp is empty and the first clamp holds the test carrier containing the untested device. Therefore, the test arm rotates and flips to position the test arm to provide service for the test slot. The test arm can also move vertically to position itself in front of the target test slot to be serviced. This rotation and flipping is opposite to the rotation and flipping performed by positioning the test arm above the carrier shuttle. Therefore, the test arm is positioned to extract or receive the test carrier containing the tested device from the target test slot. The test carrier containing the tested device is received in the second clamp that was previously empty. After receiving the test carrier containing the tested device, the test arm rotates to position the test carrier in the first clamp containing the device that has not been tested to an appropriate position to be inserted into the same test slot. Then, the test carrier containing the device that has not been tested is pushed into the test slot, and the above operation is repeated slot by slot.

[0045] Include Figures 1 to 3 An exemplary embodiment of a system with some features of the present invention is described in U.S. Patent Publication No. 2019 / 0064305, entitled "Calibration Process For An Automated Test System," filed on August 28, 2017. U.S. Patent Publication No. 2019 / 006430 is incorporated herein by reference. For example, the robot and other components of the input / output (I / O) stage 14, the transfer stage 17, the loading stage 18, the insertion stage 19, and the test stage 20 are incorporated into this application by reference from U.S. Patent Publication No. 2019 / 006430.

[0046] A carrier-based test system may be, but is not necessarily, a system-level test (SLT) system. System-level testing involves testing an entire device, rather than testing individual components of the device. If a device passes a series of system-level tests, it is assumed that the individual components of the device are operating normally. SLT has become more common as the complexity of devices and the number of components in a device have increased. For example, a chip-implemented system, such as an application-specific integrated circuit (ASIC), may be tested at the system level to determine that the components comprising the chip are operating correctly.

[0047] The exemplary systems described herein may be implemented and / or controlled using one or more computer systems including hardware or a combination of hardware and software. For example, a system similar to the system described herein may include various controllers and / or processing devices positioned at various points in the system to control the operation of the automation elements. A central computer may coordinate operations in the various controllers or processing devices. The central computer, controllers, and processing devices may execute various software routines to achieve control and coordination of the various automation elements.

[0048] The exemplary systems described herein may be controlled at least in part using one or more computer program products, e.g., one or more computer programs tangibly embodied in one or more information carriers (such as one or more non-transitory machine-readable media) for execution by or to control the operation of one or more data processing devices, e.g., a programmable processor, a computer, multiple computers, and / or a programmable logic component.

[0049] A computer program may be written in any form of programming language, including compiled or interpreted languages, and may be deployed in any form, including as a stand-alone program or as a module, component, subroutine, or other unit suitable for use in a computing environment. A computer program may be deployed to be executed on one computer or on multiple computers at one site or distributed across multiple sites and interconnected by a network.

[0050] The actions associated with implementing all or part of the test may be performed by one or more programmable processors that execute one or more computer programs to perform some of the functions described herein. All or part of the test may be implemented using dedicated logic circuits such as FPGAs (field programmable gate arrays) and / or ASICs (application specific integrated circuits).

[0051] Processors suitable for computer program execution include, by way of example, both general and special purpose microprocessors, and any one or more processors of any kind of digital computer. Typically, a processor will receive instructions and data from a read-only storage area or a random access storage area or both. Elements of a computer (including a server) include one or more processors for executing instructions and one or more storage area devices for storing instructions and data. Typically, a computer will also include (or be operatively coupled to receive data from it or transmit data to it or both) one or more machine-readable storage media, such as a mass storage device for storing data, for example, a magnetic disk, a magneto-optical disk, or an optical disk. Machine-readable storage media suitable for embodying computer program instructions and data include all forms of non-volatile storage areas, including, by way of example, semiconductor storage area devices, such as EPROM, EEPROM, and flash storage area devices; magnetic disks, such as internal hard disks or removable disks; magneto-optical disks; and CD-ROM and DVD-ROM disks.

[0052] As used herein, any "electrical connection" may imply a direct physical connection, or a wired or wireless connection that may or may not include intermediate components but still allows electrical signals to flow between the connected components. Unless otherwise specified, any "connection" involving a circuit that allows signal flow is an electrical connection, not necessarily a direct physical connection, regardless of whether the term "connection" is modified by "electrical".

[0053] The elements of different specific implementations described herein can be combined together to form other embodiments that are not specifically illustrated above. Multiple elements can be excluded from the structure described herein without adversely affecting its operation. In addition, each individual element can be combined into one or more single elements to carry out the function described herein.

Claims

1. A test system, comprising: a tray comprising a container for holding equipment, including equipment to be tested or equipment that has been tested; a motor controllable to cause vibration; and a component that couples the motor to a side of the tray so that the tray vibrates in response to vibrations of the motor, the side of the tray surrounding the container, Wherein the member is flexible and is configured to flex away from the tray in response to contact with the tray. 2 . The testing system of claim 1 , wherein the component is configured to hold the motor against the tray to directly couple the motor to the tray.

3. The test system according to claim 1, further comprising: a frame for holding the tray; Wherein the component is configured to hold the motor against the frame to couple the motor to the tray via the frame.

4. The test system of claim 1 , wherein the tray is a first tray, the motor is a first motor, and the component is a first component; and wherein the test system further comprises: a second tray for holding the device; a second motor controllable to induce vibration; and A second component couples the second motor to the second tray so that the second tray vibrates in response to vibration of the second motor.

5. The test system according to claim 4, further comprising: a third tray, the third tray being used to hold the device; a third motor controllable to cause vibration; and a third component coupling the third motor to the third tray so that the third tray vibrates in response to vibration of the third motor; The first tray, the second tray and the third tray are arranged in parallel in the testing system.

6. The testing system of claim 1, wherein the vibration is calibrated to cause a misalignment device within a container to be seated within the container.

7. The test system according to claim 1, further comprising: A power supply is used to supply power to the motor.

8. The test system of claim 1 , wherein the motor includes an eccentric mass, and The test system includes a control system for setting a voltage input to the motor to control the rotation speed of the eccentric mass to induce the vibration at a specific frequency and amplitude, and setting an operation duration of the motor.

9. The test system of claim 8, wherein the voltage is 3 volts to 4 volts, and wherein the duration is 1 second to 3 seconds.

10. The testing system of claim 1, further comprising a feeder for moving the tray containing untested devices into a position proximate to the motor.

11. The test system according to claim 10, further comprising: A control system is provided for controlling operation of the motor to cause the vibration after the feeder is moved into the position.

12. The test system according to claim 10, further comprising: a frame for holding the tray; wherein the feeder is configured to move the frame holding the tray so that the tray is in a proper position relative to the motor; and Wherein the feeder comprises a belt for moving the tray and a pushing device for pushing the tray against a surface of the frame.

13. The testing system of claim 1, wherein the tray is part of a box of multiple trays, the tray being movable up and down within the box relative to a surface holding the testing system.

14. The test system according to claim 1, further comprising: A control system is provided for causing operation of the motor based on the total mass of the equipment in the tray.

15. The testing system of claim 1, further comprising a feeder for moving the tray containing tested devices away from the motor.

16. The test system according to claim 15, further comprising: A control system is provided for causing operation of the motor before the feeder moves away from the motor.

17. The testing system of claim 1, further comprising a feeder for moving the tray containing tested devices away from the motor and moving the tray containing tested devices toward the motor.

18. The test system according to claim 17, further comprising: A control system is provided for causing operation of the motor before the feeder moves away from the motor and after the tray moves toward the motor.

19. The test system according to claim 1, further comprising: a test carrier for holding at least some of the devices; a device shuttle for transferring the at least some of the devices between the tray and the test carrier; and a first robot for moving at least some of the devices in the device between the test carrier and the device shuttle; wherein the device shuttle is configured to move a first device between the devices that have not yet been tested toward a stage of the testing system containing the first robot, the device shuttle being configured to move in a first dimension; and Wherein the first robot is configured to move the first device from the device shuttle to the test carrier, the first robot being configured to move in a second dimension different from the first dimension.

20. The test system according to claim 19, further comprising: A second robot is provided for moving at least some of the equipment between the tray and the equipment shuttle.

21. The testing system of claim 19, wherein the tray is a first tray; and The test system further comprises: a second tray for holding the device; and A second robot is used to move the first device from the first tray to the shuttle and to move a second device of the tested devices from the shuttle to the second tray.

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