Test probe

Abstract

The present invention discloses a test probe, comprising a test needle and a connecting needle shaft; the test needle is composed of a detection part and a connecting shaft part connected to the detection part, the connecting needle shaft comprises a first connecting member, the first end of the first connecting member is provided with a plug hole matching the connecting shaft part, the connecting shaft part is inserted into the plug hole to make the connecting shaft part and the connecting needle shaft conduct; the material of the test needle is palladium alloy. The test probe of the present invention can effectively reduce the manufacturing cost of the test probe, and is conducive to maintaining the contact stability between the test needle and the workpiece to be tested.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a testing probe. Background Art

[0002] Test probes can be used to evaluate the electrical characteristics of semiconductor components such as integrated circuits, flat panel displays, etc., specifically to perform power-on checks and insulation checks on them.

[0003] At present, the probe of the test probe is generally plated with a palladium alloy coating to improve the detection accuracy. The palladium alloy coating plated on the test probe in the prior art is prone to wear after repeated use, and the wear effect is difficult to observe with the naked eye, resulting in a decrease in detection accuracy. In addition, the unit price of palladium alloy is relatively high, and the cost of a test probe made of all palladium alloy is relatively high.

[0004] In view of this, it is necessary to design a test probe that can maintain stable detection accuracy and effectively reduce costs. Summary of the invention

[0005] The object of the present invention is to provide a test probe which can maintain stable detection accuracy and effectively reduce costs.

[0006] To achieve this object, the present invention adopts the following technical solutions:

[0007] A test probe comprises a test needle head and a connecting needle shaft;

[0008] The test needle is composed of a detection part and a connecting shaft part connected to the detection part, the connecting needle shaft includes a first connecting member, a first end of the first connecting member is provided with a plug hole matching the connecting shaft part, the connecting shaft part is inserted into the plug hole to make the connecting shaft part and the connecting needle shaft conduct;

[0009] The material of the test needle is palladium alloy.

[0010] Optionally, the connecting shaft portion and the plug-in hole are interference fit.

[0011] Optionally, the connecting shaft portion is provided with an annular groove, and the plug-in hole is provided with a protrusion for clamping the connecting shaft portion, and the protrusion extends into the annular groove.

[0012] Optionally, the connecting needle shaft further comprises a connecting needle tube;

[0013] One end of the connecting needle tube is sleeved on the second end of the first connecting member, and the connecting needle tube is connected to the first connecting member.

[0014] Optionally, the test probe further comprises an elastic member and a metal needle rod with one end slidably extending into the connecting needle tube, and an outer peripheral surface of one end of the metal needle rod is in conduction with an inner tube surface of the connecting needle tube;

[0015] The elastic member is compressed and arranged in the connecting needle tube, and the first end of the elastic member abuts against the first connecting member, and the second end abuts against one end of the metal needle rod.

[0016] Optionally, a limiting portion is provided at the tube opening of the connecting needle tube away from the first connecting member;

[0017] The metal needle rod comprises a first shaft portion slidably mounted in the connecting needle tube and a second shaft portion extending out of the connecting needle tube, wherein the diameter of the first shaft portion is smaller than the diameter of the second shaft portion;

[0018] The limiting portion forms a through hole, and the diameter of the through hole is larger than the diameter of the second shaft portion and smaller than the diameter of the first shaft portion.

[0019] Optionally, the first connecting member and the metal needle rod are both structural members made of beryllium copper, and the connecting needle tube is a structural member made of phosphor copper.

[0020] Optionally, the first connecting member, the connecting needle tube and the metal needle rod are all gold-plated.

[0021] Optionally, the elastic member is a spring with a gold-plated surface.

[0022] Optionally, a connecting column portion is provided at the second end of the first connecting member, and the connecting needle tube is sleeved on the connecting column portion.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] In the present embodiment, a test needle is arranged to directly contact a semiconductor element or a circuit board, a connecting needle shaft is used to install the test needle, and the connecting needle shaft and the test needle are conductively connected to each other. By setting the test needle as a component made of palladium alloy as a whole, the wear and fall of the palladium alloy coating, which causes a decrease in detection accuracy, is effectively avoided, and the contact stability between the test needle and the workpiece to be tested is effectively maintained, thereby effectively improving the detection accuracy. In addition, since only the test needle needs to be set as a palladium alloy component, other components of the test probe can be set as other conductive metal materials, which effectively reduces the manufacturing cost of the test probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0026] The structures, proportions, sizes, etc. illustrated in the drawings of this specification are only used to match the contents disclosed in the specification so as to facilitate understanding and reading by persons familiar with the technology. They are not used to limit the conditions under which the present invention can be implemented, and therefore have no substantive technical significance. Any structural modification, change in proportion or adjustment of size shall still fall within the scope of the technical contents disclosed in the present invention without affecting the effects and purposes that can be achieved by the present invention.

[0027] Figure 1 A schematic diagram of the structure of a test probe provided by an embodiment of the present invention;

[0028] Figure 2 A schematic front view of a test probe provided by an embodiment of the present invention;

[0029] Figure 3 A schematic diagram of the cross-sectional structure of a test probe provided by an embodiment of the present invention;

[0030] Figure 4 Based Figure 3 A magnified schematic diagram of position A in the middle.

[0031] Illustrations: 1. Test needle; 11. Detection part; 12. Connecting shaft; 121. Annular groove; 2. Connecting needle shaft; 21. First connecting member; 211. Plug hole; 212. Connecting column; 213. Protrusion; 22. Connecting needle tube; 3. Elastic member; 4. Metal needle rod; 221. Limiting part; 41. First shaft; 42. Second shaft. DETAILED DESCRIPTION

[0032] In order to make the purpose, features and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described below are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0033] In the description of the present invention, it should be understood that the terms "upper", "lower", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention. It should be noted that when a component is considered to be "connected" to another component, it may be directly connected to the other component or there may be a centrally arranged component at the same time.

[0034] The technical solution of the present invention is further described below with reference to the accompanying drawings and through specific implementation methods.

[0035] An embodiment of the present invention provides a test probe, in which the test needle 1 is made of palladium alloy as a whole, and other components of the test probe are not made of palladium alloy. This can effectively avoid the situation in the prior art where the detection accuracy is reduced due to the wear of the palladium alloy plating, and will not cause the manufacturing cost of the test probe to be too high.

[0036] See also Figures 1 to 4 , the test probe comprises a test needle 1 and a connecting needle shaft 2;

[0037] The test needle 1 consists of a detection part 11 and a connecting shaft part 12 connected to the detection part 11. The connecting needle shaft 2 includes a first connecting member 21. The first end of the first connecting member 21 is provided with a plug hole 211 matching the connecting shaft part 12. The connecting shaft part 12 is inserted into the plug hole 211 to make the connecting shaft part 12 and the connecting needle shaft 2 conductive. The test needle 1 is a structural member made of palladium alloy.

[0038] Specifically, the test needle 1 is installed on the first connecting member 21, and the test needle 1 and the first connecting member 21 are conductive, and the connecting needle shaft 2 can effectively transmit the detection signal of the test needle 1. In addition, the material of the test needle 1 is palladium alloy, and slight wear and tear will not cause a significant change in the detection performance, and the detection stability of the test probe is effectively improved. It should also be noted that only one end of the connecting needle shaft 2 needs to be provided with a test needle 1 with a smaller overall volume, and the amount of palladium alloy used is less, which is conducive to reducing the manufacturing cost of the test probe.

[0039] Optionally, the connecting shaft portion 12 and the plug hole 211 are interference fit, so that a good conduction effect is maintained between the connecting shaft portion 12 and the first connecting member 21, so as to reduce the resistance between the test needle 1 and the connecting needle shaft 2, thereby improving the detection accuracy.

[0040] Optionally, the connecting shaft portion 12 is provided with an annular groove 121 , and a protrusion 213 for clamping the connecting shaft portion 12 is provided in the inserting hole 211 , and the protrusion 213 extends into the annular groove 121 .

[0041] Specifically, in order to prevent the connecting shaft portion 12 from slipping out of the plug hole 211, an annular groove 121 is provided on the connecting shaft portion 12, and a protrusion 213 is provided in the plug hole 211. The protrusion 213 is placed in the annular groove 121 to fix the connecting shaft portion 12 in the plug hole 211. It is worth noting that the protrusion 213 can be formed before the connecting shaft portion 12 is inserted into the plug hole 211, or after the connecting shaft portion 12 is inserted into the plug hole 211, a dot is made on the outer side of the first connecting member 21 so that the protrusion 213 is formed on the inner side wall of the plug hole 211.

[0042] Optionally, the connecting needle shaft 2 further includes a connecting needle tube 22 ; one end of the connecting needle tube 22 is sleeved on the second end of the first connecting member 21 , and the connecting needle tube 22 and the first connecting member 21 are in conduction.

[0043] It is worth noting that the connecting needle tube 22 and the first connecting member 21 maintain a good conductive connection to improve the performance of signal transmission and ensure detection accuracy.

[0044] Optionally, the test probe further includes an elastic member 3 and a metal needle rod 4 whose one end can be slidably extended into the connecting needle tube 22, and the outer peripheral surface of one end of the metal needle rod 4 is in conduction with the inner tube surface of the connecting needle tube 22;

[0045] The elastic member 3 is compressed and disposed in the connecting needle tube 22 , and a first end of the elastic member 3 abuts against the first connecting member 21 , and a second end of the elastic member 3 abuts against one end of the metal needle rod 4 .

[0046] In the actual detection process, the metal needle rod 4 is pushed away from one end of the test needle 1, so that the test needle 1 moves toward the workpiece to be tested, and the test needle 1 contacts the workpiece to be tested for detection. During the detection process, the elastic member 3 has a buffering effect to avoid excessive impact on the workpiece and damage to the workpiece.

[0047] It should be noted that the metal needle rod 4 can slide along the inner hole of the connecting needle tube 22 and maintain a good conduction effect with the connecting needle tube 22.

[0048] Optionally, a limiting portion 221 is provided at the tube opening of the connecting needle tube 22 away from the first connecting member 21;

[0049] The metal needle rod 4 includes a first shaft portion 41 slidably mounted in the connecting needle tube 22 and a second shaft portion 42 extending out of the connecting needle tube 22, wherein the diameter of the first shaft portion 41 is smaller than the diameter of the second shaft portion 42;

[0050] The limiting portion 221 forms a through hole, and the diameter of the through hole is larger than the diameter of the second shaft portion 42 and smaller than the diameter of the first shaft portion 41 .

[0051] Specifically, the setting of the limiting portion 221 enables the first shaft portion 41 to slide only in the inner hole of the connecting needle tube 22 .

[0052] Optionally, the first connecting member 21 and the metal needle rod 4 are both structural members made of beryllium copper. The connecting needle tube 22 is a structural member made of phosphor copper. Specifically, beryllium copper has a series of excellent physical, chemical and mechanical properties such as corrosion resistance, wear resistance, cold resistance, high conductivity, non-magneticity, and no sparks when impacted, which can effectively improve the detection accuracy. In addition, the connecting needle tube 22 is a tubular structure, which is formed by an extrusion process. Its material is phosphor copper, which not only reduces the cost of the material, but also facilitates extrusion molding.

[0053] Optionally, the first connecting member 21, the connecting needle tube 22 and the metal needle rod 4 are all surface-plated with gold. Specifically, the surface-plated with gold effectively improves the corrosion resistance of the first connecting member 21, the connecting needle tube 22 and the metal needle rod 4.

[0054] Optionally, the elastic member 3 is a spring with a gold-plated surface. Similarly, the gold-plated spring has better corrosion resistance, which is beneficial to extending the service life of the test probe.

[0055] It is worth noting that the gold-plated first connector 21, the connecting needle tube 22, the metal needle rod 4 and the spring are beneficial to reducing the resistance of the test probe and improving the detection accuracy of the test probe.

[0056] Optionally, a connecting column portion 212 is provided at the second end of the first connecting member 21 , and the connecting needle tube 22 is sleeved on the connecting column portion 212 .

[0057] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0058] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

[0059] As described above, the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features thereof may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test probe, characterized in that: It comprises a test needle (1) and a connecting needle shaft (2); The test needle (1) is composed of a detection portion (11) and a connecting shaft portion (12) connected to the detection portion (11); the connecting needle shaft (2) comprises a first connecting member (21); a first end of the first connecting member (21) is provided with a plug hole (211) matching the connecting shaft portion (12); the connecting shaft portion (12) is inserted into the plug hole (211) so that the connecting shaft portion (12) and the connecting needle shaft (2) are in conduction; The material of the test needle (1) is palladium alloy; The connecting shaft portion (12) is provided with an annular groove (121), and a protrusion (213) for clamping the connecting shaft portion (12) is provided in the plug hole (211), and the protrusion (213) extends into the annular groove (121); The connecting needle shaft (2) also includes a connecting needle tube (22); One end of the connecting needle tube (22) is sleeved on the second end of the first connecting member (21), and the connecting needle tube (22) and the first connecting member (21) are in conduction; The test probe further comprises an elastic member (3) and a metal needle rod (4) one end of which is slidably inserted into the connecting needle tube (22), and the outer peripheral surface of one end of the metal needle rod (4) is in conductive contact with the inner tube surface of the connecting needle tube (22); The elastic member (3) is compressed and arranged in the connecting needle tube (22), and the first end of the elastic member (3) abuts against the first connecting member (21), and the second end abuts against one end of the metal needle rod (4).

2. The test probe according to claim 1, characterized in that: The connecting shaft portion (12) and the inserting hole (211) are interference fit.

3. The test probe according to claim 1, characterized in that: A limiting portion (221) is provided at the tube opening of the connecting needle tube (22) away from the first connecting member (21); The metal needle rod (4) comprises a first shaft portion (41) slidably mounted in the connecting needle tube (22) and a second shaft portion (42) extending out of the connecting needle tube (22), wherein the diameter of the first shaft portion (41) is smaller than the diameter of the second shaft portion (42); The limiting portion (221) forms a through hole, the diameter of which is larger than the diameter of the second shaft portion (42) and smaller than the diameter of the first shaft portion (41).

4. The test probe according to claim 1, characterized in that: The first connecting member (21) and the metal needle rod (4) are both structural members made of beryllium copper, and the connecting needle tube (22) is a structural member made of phosphor copper.

5. The test probe according to claim 4, characterized in that: The first connecting piece (21), the connecting needle tube (22) and the metal needle rod (4) are all gold-plated on their surfaces.

6. The test probe according to claim 1, characterized in that: The elastic member (3) is a spring with a gold-plated surface.

7. The test probe according to claim 1, characterized in that: The second end of the first connecting member (21) is provided with a connecting column portion (212), and the connecting needle tube (22) is sleeved on the connecting column portion (212).

Images