Fault Detection Method, Device, Electronic Device and Storage Medium of an Electronic Device

Abstract

The present application relates to a fault detection method, device, electronic device, and storage medium for an electronic device. Among them, the fault detection method for the electronic device includes: performing self-check on each transmitter to obtain a first self-check result of each transmitter; performing self-check on each sensor to obtain a second self-check result of each sensor; detecting the corresponding relationship between multiple transmitters and multiple sensors, and determining a supporting detection result of the transmitter and the sensor according to the corresponding relationship; determining the fault location of the electronic device according to the first self-check result, the second self-check result, and the supporting detection result. Through the present application, the problem that the fault location of the electronic device cannot be automatically detected in the related art is solved.

Description

Technical Field

[0001] The present application relates to the field of sensors, and in particular, to a method, apparatus, electronic device, and storage medium for fault detection of an electronic device. Background Art

[0002] With the improvement of the intelligence level of sewing machines, the number of sensors in sewing machines is also increasing. Many sensors adopt the opposed mode, that is, the transmitter and the inductor are not integrated in the mechanical structure, but are separately arranged at different positions of the sewing machine. For example, the transmitter is arranged at the upper part of the machine head, and the inductor is arranged on the sewing or needle plate. Generally, the transmitter and the inductor need to be used in corresponding sets. For example, the front transmitter needs to be used in combination with the front inductor. However, during the assembly, maintenance, and cleaning of the sewing machine, it is very easy to have a situation where the corresponding relationship between the transmitter and the inductor is chaotic, resulting in the sewing machine being unable to be used normally, which will bring great trouble to the users of the sewing machine. In the related art, professional maintenance personnel manually check the cause of the failure of the sewing machine. However, this method requires the maintenance personnel to master very professional knowledge to check the inductor with a failure, and the checking time is relatively long, which is very inconvenient for the users of the sewing machine. In addition, an additional maintenance fee needs to be paid.

[0003] Currently, in view of the problem in the related art that the fault location of an electronic device cannot be automatically detected, no effective solution has been proposed. Summary of the Invention

[0004] Embodiments of the present application provide a method, apparatus, electronic device, and storage medium for fault detection of an electronic device, so as to at least solve the problem in the related art that the fault location of an electronic device cannot be automatically detected.

[0005] In a first aspect, an embodiment of the present application provides a method for fault detection of an electronic device, which is applied to an electronic device. The electronic device includes a plurality of transmitters and inductors used in combination. The method includes:

[0006] Performing self-check on each of the transmitters to obtain a first self-check result of each of the transmitters;

[0007] Performing self-check on each of the inductors to obtain a second self-check result of each of the inductors;

[0008] Detecting the corresponding relationship between the plurality of transmitters and the plurality of inductors, and determining a matching detection result of the transmitter and the inductor according to the corresponding relationship;

[0009] Determining the fault location of the electronic device according to the first self-check result, the second self-check result, and the matching detection result.

[0010] In some of these embodiments, the drive circuit of the transmitter includes a carrier circuit and a current regulation circuit; the self-check of each transmitter to obtain the first self-check result of each transmitter includes:

[0011] For each transmitter, turn off the signal source of the carrier circuit corresponding to the transmitter, and obtain the output voltage of the current regulation circuit corresponding to the transmitter;

[0012] Based on the output voltage, obtain the first self-check result of the transmitter.

[0013] In some of these embodiments, the self-check of each sensor to obtain the second self-check result of each sensor includes:

[0014] If all the transmitters are normal, obtain the induction voltage of each sensor;

[0015] Compare the induction voltage of each sensor with a first preset voltage threshold to obtain a second comparison result;

[0016] Based on the second comparison result, determine the second self-check result of each sensor.

[0017] In some of these embodiments, the detection of the corresponding relationship between multiple transmitters and multiple sensors, and based on the corresponding relationship, determining the matching detection result between the transmitter and the sensor includes:

[0018] Select one transmitter from multiple transmitters as the currently detected transmitter;

[0019] Set the currently detected transmitter to be in a first state, and set other transmitters to be in a second state;

[0020] Obtain the induction voltage of each sensor;

[0021] Based on the induction voltage of each sensor, the first state, and the second state, obtain the corresponding relationship detection result of the currently detected transmitter, and determine the next detected transmitter, and so on until all the transmitters are traversed;

[0022] Based on all the corresponding relationship detection results and a preset corresponding relationship, obtain the matching detection result between the transmitter and the sensor.

[0023] In some of these embodiments, the setting the currently detected transmitter to be in a first state, and setting other transmitters to be in a second state includes:

[0024] Set the currently detected transmitter to be in an on state, and set other transmitters to be in an off state; or,

[0025] Set the currently detected transmitter to the off state and set other transmitters to the on state.

[0026] In some embodiments, the obtaining the correspondence detection result of the currently detected transmitter according to the induction voltage of each sensor, the first state, and the second state includes:

[0027] Compare the induction voltage of each sensor with a second preset voltage threshold to obtain a third comparison result;

[0028] Determine the sensors corresponding to the currently detected transmitter according to the third comparison result, the first state, and the second state.

[0029] In some embodiments, the obtaining the correspondence detection result of the currently detected transmitter according to the induction voltage of each sensor, the first state, and the second state includes:

[0030] Calculate the difference between the induction voltage of each sensor and the second preset voltage threshold;

[0031] Determine the sensors corresponding to the currently detected transmitter according to the difference, a preset difference threshold, the first state, and the second state.

[0032] In a second aspect, an embodiment of the present application provides a fault detection device for an electronic device, including:

[0033] A first self-checking module for performing self-checking on each transmitter to obtain a first self-checking result of each transmitter;

[0034] A second self-checking module for performing self-checking on each sensor to obtain a second self-checking result of each sensor;

[0035] A matching detection module for detecting the correspondence between a plurality of the transmitters and a plurality of the sensors, and determining a matching detection result of the transmitters and the sensors according to the correspondence;

[0036] A fault determination module for determining the fault location of the electronic device according to the first self-checking result, the second self-checking result, and the matching detection result.

[0037] In a third aspect, an embodiment of the present application provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, where when the processor executes the computer program, it implements the fault detection method of the electronic device as described in the first aspect above.

[0038] In a fourth aspect, an embodiment of the present application provides a storage medium, on which a computer program is stored, and when the program is executed by a processor, it implements the fault detection method of the electronic device as described in the first aspect above.

[0039] Compared with the related art, the fault detection method, device, electronic device and storage medium of the electronic device provided by the embodiments of the present application obtain a first self-check result of each transmitter by performing self-check on each transmitter; obtain a second self-check result of each sensor by performing self-check on each sensor; detect the corresponding relationship between multiple transmitters and multiple sensors, and determine the matching detection result of the transmitter and the sensor according to the corresponding relationship; determine the fault location of the electronic device according to the first self-check result, the second self-check result and the matching detection result, which solves the problem that the fault location of the electronic device cannot be automatically detected in the related art.

[0040] Details of one or more embodiments of the present application are set forth in the following drawings and description to make other features, objects, and advantages of the present application more concise and understandable. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation of the present application. In the drawings:

[0042] Figure 1 is a flowchart of the fault detection method of the electronic device according to the embodiment of the present application;

[0043] Figure 2 is a flowchart of performing self-check on each transmitter in the embodiment of the present application;

[0044] Figure 3 is a schematic diagram of the drive circuit of the transmitter in the embodiment of the present application;

[0045] Figure 4 is a flowchart of performing self-check on each sensor in the embodiment of the present application;

[0046] Figure 5 is a flowchart of determining the matching detection result of the transmitter and the sensor in the embodiment of the present application;

[0047] Figure 6 is a process of obtaining the corresponding relationship detection result of the currently detected transmitter according to the induced voltage, the first state and the second state in the embodiment of the present application Figure 1 ;

[0048] Figure 7 is a process of obtaining the corresponding relationship detection result of the currently detected transmitter according to the induced voltage, the first state and the second state in the embodiment of the present applicationFigure 2 ;

[0049] Figure 8 Flow chart of the fault detection method for the electronic device according to the specific embodiment of the present application;

[0050] Figure 9 Hardware structure block diagram of the terminal of the fault detection method for the electronic device according to the embodiment of the present application;

[0051] Figure 10 Structure block diagram of the fault detection device for the electronic device according to the embodiment of the present application. Detailed implementation manners

[0052] In order to make the objectives, technical solutions and advantages of the present application clearer and more understandable, the present application will be described and explained below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments provided in the present application without making creative efforts fall within the scope of protection of the present application. In addition, it can also be understood that although the efforts made in this development process may be complex and time-consuming, for those of ordinary skill in the art related to the content disclosed in the present application, some design, manufacturing or production changes based on the technical content disclosed in the present application are only conventional technical means and should not be understood that the content disclosed in the present application is insufficient.

[0053] Referring to "embodiment" in the present application means that the specific features, structures or characteristics described in connection with the embodiment may be included in at least one embodiment of the present application. The phrase appears in various positions in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those of ordinary skill in the art explicitly and implicitly understand that the embodiments described in the present application may be combined with other embodiments without conflict.

[0054] Unless otherwise defined, the technical terms or scientific terms involved in this application shall have the ordinary meanings understood by those with ordinary skills in the technical field to which this application belongs. The words such as "a", "an", "one kind", "the" and the like involved in this application do not indicate a quantity limitation and may represent a singular or plural number. The terms "comprise", "include", "have" and any variations thereof involved in this application are intended to cover non-exclusive inclusion; for example, a process, method, system, product or device that includes a series of steps or modules (units) is not limited to the listed steps or units, but may further include steps or units not listed, or may further include other steps or units inherent to these processes, methods, products or devices. The similar words such as "connect", "be connected", "couple" and the like involved in this application are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The "plurality" involved in this application means greater than or equal to two. "And / or" describes the association relationship of associated objects and indicates that three relationships may exist. For example, "A and / or B" may represent: A exists alone, A and B exist simultaneously, and B exists alone. The terms "first", "second", "third" and the like involved in this application are only used to distinguish similar objects and do not represent a specific order of the objects.

[0055] The various technologies described in this application can be, but are not limited to, applied to the detection systems of various electronic devices.

[0056] This application provides a fault detection method for an electronic device. The electronic device includes a plurality of transmitters and sensors used in combination. Taking a sewing machine as an example, this embodiment will be described. Figure 1 It is a flowchart of the fault detection method for the electronic device according to the embodiment of this application, as Figure 1 shown. This process includes the following steps:

[0057] Step S110, perform self-check on each transmitter to obtain the first self-check result of each transmitter.

[0058] Step S120, perform self-check on each sensor to obtain the second self-check result of each sensor.

[0059] When all transmitters are in a normal state, perform self-check on each sensor to determine whether there is a faulty sensor among the plurality of sensors;

[0060] If all the plurality of sensors are in a normal state, the correspondence between the plurality of transmitters and the plurality of sensors can be further detected; if it is detected that a certain sensor is in a faulty state, remove the faulty sensor and install a new sensor at the position of the original faulty sensor, and then detect the correspondence between the plurality of transmitters and the plurality of sensors.

[0061] Step S130: Detect the corresponding relationship between multiple transmitters and multiple sensors, and determine the matching detection result of the transmitters and sensors according to the corresponding relationship.

[0062] Step S140: Determine the fault location of the electronic device according to the first self-check result, the second self-check result, and the matching detection result.

[0063] It should be noted that before the detection, it is necessary to ensure that there is no object blocking between the transmitter and the sensor.

[0064] Through the above steps S110 to S140, each transmitter is self-checked to obtain the first self-check result of each transmitter; each sensor is self-checked to obtain the second self-check result of each sensor; the corresponding relationship between multiple transmitters and multiple sensors is detected, and the matching detection result of the transmitters and sensors is determined according to the corresponding relationship; the fault location of the electronic device is determined according to the first self-check result, the second self-check result, and the matching detection result. By combining the self-check of the transmitter, the self-check of the sensor, and the matching detection of the transmitter and the sensor, the present application can quickly and accurately detect the fault location of the electronic device. The entire detection process is automatic without manual intervention, and the user does not need to master very professional knowledge to detect the fault location of the electronic device, solving the problem in the related art that the fault location of the electronic device cannot be automatically detected.

[0065] In some embodiments, the drive circuit of the transmitter includes a carrier wave circuit and a current regulation circuit; Figure 2 This is the flowchart of self-checking each transmitter in the embodiments of the present application. As Figure 2 shown, the process includes the following steps:

[0066] Step S210: For each transmitter, turn off the signal source of the carrier wave circuit corresponding to the transmitter, and obtain the output voltage of the current regulation circuit corresponding to the transmitter.

[0067] Figure 3 This is the schematic diagram of the drive circuit of the transmitter in the embodiments of the present application. Taking Figure 3 as an example to illustrate this embodiment. As Figure 3 shown, the signal source CARRIER_WAVE, resistor R1, resistor R2, resistor R3, triode Q1, and triode Q2 constitute the carrier wave circuit of the transmitter IR LED, which is used to generate the carrier wave signal of the transmitter IR LED, so as to drive the transmitter IR LED to emit infrared light.

[0068] DUTY_CYCLE, resistor R4, resistor R5, resistor R6, sampling resistor R7, capacitor C1, triode Q3 and comparator U1A constitute the current regulation circuit of the emitter IR LED. DUTY_CYCLE is a PWM wave, and the operating current of the emitter IR LED can be adjusted by adjusting the duty cycle of the PWM wave.

[0069] Among them, the output voltage of the current regulation circuit is the output voltage of pin 1 at the output terminal of comparator U1A. CARRIER_WAVE can be a signal with a frequency of 5KHz, and DUTY_CYCLE can be a PWM wave with a frequency of 20KHz. The frequencies of these two signals can also be other values.

[0070] When performing self-check on the emitter IR LED, the signal source CARRIER_WAVE = 0, triode Q2 is turned off, triode Q1 is turned off, the voltage of pin 1 at the output terminal of comparator U1A is obtained, and this voltage is used as the output voltage of the current regulation circuit.

[0071] Step S220, obtain the first self-check result of the emitter according to the output voltage.

[0072] Through the above steps S210 to S220, for each emitter, turn off the signal source of the corresponding carrier circuit of the emitter, and obtain the output voltage of the corresponding current regulation circuit of the emitter; according to the output voltage, obtain the first self-check result of the emitter. In this embodiment, by detecting the output voltage of the corresponding current regulation circuit of the emitter, it can be determined whether the emitter is faulty according to the output voltage. The entire detection process is automatic and does not require manual intervention. The user does not need to master very professional knowledge to troubleshoot the faulty emitter. The detection period is short, which can improve the self-check efficiency of the emitter. The detection steps are simple and easy to operate, which is very convenient for the users of electronic devices. There is no need to invite professional maintenance personnel for troubleshooting, and it can also save an extra maintenance cost for the users of electronic devices.

[0073] In some embodiments, a test line CURRENT_CHECK is led out at pin 1 of the output terminal of comparator U1A, and this test line CURRENT_CHECK is connected to the single-chip microcomputer for detecting the output voltage of comparator U1A.

[0074] Specifically, if the single-chip microcomputer detects that the output voltage of comparator U1A is at a low level, it is determined that the emitter IR LED is in a normal state; if the single-chip microcomputer detects that the output voltage of comparator U1A is always at a high level, it is determined that the emitter IR LED is in a faulty state.

[0075] It should be noted that when the transmitter IR LED is self - tested, the signal source CARRIER_WAVE = 0, the triode Q2 is turned off, the triode Q1 is turned off, and the DUTY_CYCLE outputs a PWM waveform with a duty cycle of B1. After passing through the filter circuit composed of the resistor R4, the capacitor C1, and the resistor R5, the generated voltage A1 is input to the non - inverting terminal 3 of the comparator U1A, and the voltage A2 on the sampling resistor R7 is input to the inverting terminal 2 of the comparator U1A.

[0076] If the voltage A2 on the sampling resistor R7 exceeds the voltage A1, the output terminal 1 of the comparator U1A outputs a low level, that is, CURRENT_CHECK is at a low level. When the single - chip microcomputer detects that CURRENT_CHECK is at a low level, the transmitter IR LED is in a normal state.

[0077] If the IR LED is in an open state, the voltage A2 on the sampling resistor R7 will not exceed the voltage A1. Then, the output terminal 1 of the comparator U1A always outputs a high level, that is, CURRENT_CHECK is always at a high level. If the single - chip microcomputer detects that CURRENT_CHECK is always at a high level within a certain period of time, it indicates that the transmitter IR LED is in a faulty state.

[0078] Through this embodiment, a test line CURRENT_CHECK is led out at the output terminal 1 of the comparator U1A, and this test line CURRENT_CHECK is connected to the single - chip microcomputer. Thus, it is possible to quickly determine whether the transmitter IR LED is faulty according to the detected voltage of the single - chip microcomputer, further improving the self - test efficiency of the transmitter.

[0079] In some of these embodiments, taking a sewing machine as an example, this embodiment is described. Figure 4 This is the flowchart for self - testing each sensor in the embodiment of the present application, as Figure 4 shown. This process includes the following steps:

[0080] Step S410, if all transmitters are normal, obtain the sensing voltage of each sensor.

[0081] Step S420, compare the sensing voltage of each sensor with a first preset voltage threshold to obtain a second comparison result.

[0082] Among them, the first preset voltage threshold is set according to the empirical values of multiple detections.

[0083] Step S430, determine the second self - test result of each sensor according to the second comparison result.

[0084] In some of these embodiments, according to each sensor, if the induced voltage of the sensor is less than or equal to the first preset voltage threshold, it is determined that the sensor is in a faulty state; if the induced voltage of the sensor is greater than the first preset voltage threshold, it is determined that the sensor is in a normal state.

[0085] Through the above steps S410 to S430, if all transmitters are normal, the induced voltage of each sensor is obtained; the induced voltage of each sensor is compared with the first preset voltage threshold to obtain a second comparison result; according to the second comparison result, the second self-check result of each sensor is determined. In this embodiment, by obtaining the induced voltage of each sensor and using the second comparison result of the induced voltage of each sensor with the first preset voltage threshold to determine whether there is a fault in each sensor, the entire detection process is automated without manual intervention. Users do not need to master very professional knowledge to detect the faulty sensor. The detection cycle is short, which can improve the self-check efficiency of the sensor.

[0086] In some of these embodiments, it is assumed that n transmitters and m sensors are installed on a sewing machine. The duty cycles DUTYCYCLE[1], DUTYCYCLE[1],..., DUTYCYCLE[n] of the PWM waves of the n transmitters are respectively set to CURRENT_SET[1], CURRENT_SET[2],..., CURRENT_SET[n], and a carrier signal of the transmitter is generated through a carrier circuit to drive the transmitter to emit infrared light. When the sensor receives the infrared light emitted by the transmitter, an induced signal is output to the pin of the single-chip microcomputer after passing through a filter circuit, so as to obtain the induced voltage of each sensor. The induced voltages of the m sensors are respectively V[1], V[2],..., V[m]. If the value of V[1] is less than the first preset voltage threshold, it is determined that the first sensor is faulty. If the value of V[m] is less than the first preset voltage threshold, it is determined that the mth sensor is faulty.

[0087] In some of these embodiments, Figure 5 is a flowchart for determining the matching detection result of the transmitter and the sensor in the embodiments of the present application. As Figure 5 shown, this process includes the following steps:

[0088] Step S510, select one transmitter from multiple transmitters as the currently detected transmitter.

[0089] It should be noted that one transmitter can be selected from multiple transmitters as the currently detected transmitter in a certain order, or one transmitter can be arbitrarily selected from multiple transmitters as the currently detected transmitter. This embodiment does not make any restrictions.

[0090] Step S520: Set the currently detected transmitter to the first state and set other transmitters to the second state.

[0091] Herein, the first state and the second state are two opposite states.

[0092] Step S530: Obtain the induced voltage of each inductor.

[0093] The induced voltage represents the voltage of the induced signal received by the inductor.

[0094] Step S540: Based on the induced voltage of each inductor, the first state, and the second state, obtain the corresponding relationship detection result of the currently detected transmitter, and determine the next transmitter to be detected, and so on until all transmitters are traversed.

[0095] Step S550: Based on all the corresponding relationship detection results and the preset corresponding relationship, obtain the matching detection result of the transmitter and the inductor.

[0096] It should be noted that by setting the currently detected transmitter and other transmitters to two different states, the corresponding relationship of a certain transmitter can be detected separately to see if it corresponds to the preset corresponding relationship. If the corresponding relationship of this transmitter is consistent with the preset corresponding relationship, it is determined that the corresponding relationship between the transmitter and its corresponding inductor has not been disordered;

[0097] If the corresponding relationship of this transmitter is inconsistent with the preset corresponding relationship, it is determined that the corresponding relationship between the transmitter and its corresponding inductor has been disordered, and thus the connection relationship between the relevant transmitter and inductor can be adjusted according to the preset corresponding relationship.

[0098] Through the above embodiments, one transmitter is selected from multiple transmitters as the currently detected transmitter, and the currently detected transmitter and other transmitters are set to two different states to achieve the detection of the corresponding relationship of each transmitter one by one, and each corresponding relationship detection result is compared with the preset corresponding relationship, so as to determine whether the corresponding relationship between the transmitter and the inductor has been disordered according to the comparison result. This detection method is simple to operate, has a relatively short detection period, detects the corresponding relationship of each transmitter separately, is not easy to make mistakes, realizes the fast and accurate detection of the corresponding relationship between the transmitter and the inductor, and improves the efficiency and accuracy of the matching detection of the transmitter and the inductor.

[0099] In some embodiments, set the currently detected transmitter to the on state and set other transmitters to the off state; or,

[0100] Set the currently detected transmitter to the off state and set other transmitters to the on state.

[0101] In some of these embodiments, Figure 6 The process of obtaining the corresponding relationship detection result of the currently detected transmitter according to the induced voltage, the first state, and the second state in the embodiments of the present application Figure 1 , as Figure 6 shown, this process includes the following steps:

[0102] Step S610, compare the induced voltage of each inductor with a second preset voltage threshold to obtain a third comparison result.

[0103] Step S620, determine the inductor that has a corresponding relationship with the currently detected transmitter according to the third comparison result, the first state, and the second state.

[0104] In some of these embodiments, set the currently detected transmitter to the on state and set other transmitters to the off state, that is, the first state is the on state and the second state is the off state;

[0105] If the induced voltage of a certain inductor is greater than the second preset voltage threshold and the induced voltages of other inductors are all less than the second preset voltage threshold, then it is determined that this inductor has a corresponding relationship with the currently detected transmitter.

[0106] For example, assume that the induced voltage U[x] of the x-th inductor is greater than the second preset voltage threshold, while the induced voltages of other inductors are all lower than the second preset voltage threshold, then it is determined that the infrared light emitted by the currently detected transmitter is received by the x-th inductor, that is, the x-th inductor has a corresponding relationship with the currently detected transmitter.

[0107] In some of these embodiments, set the currently detected transmitter to the off state and set other transmitters to the on state, that is, the first state is the off state and the second state is the on state;

[0108] If the induced voltage of a certain inductor is less than the second preset voltage threshold and the induced voltages of other inductors are all greater than the second preset voltage threshold, then it is determined that this inductor has a corresponding relationship with the currently detected transmitter.

[0109] Through the above steps S610 to S620, the induced voltage of each inductor is compared with the second preset voltage threshold to obtain a third comparison result, and according to the third comparison result, the first state, and the second state, the inductor that has a corresponding relationship with the currently detected transmitter can be quickly determined, further improving the efficiency of the matching detection of the transmitter and the inductor.

[0110] In some of these embodiments, Figure 7 The process of obtaining the corresponding relationship detection result of the currently detected transmitter according to the induced voltage, the first state, and the second state in the embodiments of the present application Figure 2, such as Figure 7 As shown, the process includes the following steps:

[0111] Step S710, calculate the difference between the induction voltage of each sensor and the second preset voltage threshold.

[0112] Step S720, determine the sensor corresponding to the currently detected transmitter according to the difference, the preset difference threshold, the first state, and the second state.

[0113] Set the currently detected transmitter to the on state, and set other transmitters to the off state, that is, the first state is the on state, and the second state is the off state;

[0114] If the difference corresponding to a certain sensor is greater than the preset difference threshold, and the differences corresponding to other sensors are all less than the preset difference threshold, then it is determined that this sensor has a corresponding relationship with the currently detected transmitter.

[0115] For example, assume that the difference between the induction voltage U[x] of the x-th sensor and the second preset voltage threshold is greater than the preset difference threshold, while the differences between the induction voltages of other sensors and the second preset voltage threshold are all lower than the preset difference threshold. Then it is determined that the infrared light emitted by the currently detected transmitter is received by the x-th sensor, that is, the x-th sensor has a corresponding relationship with the currently detected transmitter.

[0116] In some embodiments, set the currently detected transmitter to the off state, and set other transmitters to the on state, that is, the first state is the off state, and the second state is the on state;

[0117] If the difference corresponding to a certain sensor is less than the preset difference threshold, and the differences corresponding to other sensors are all greater than the preset difference threshold, then it is determined that this sensor has a corresponding relationship with the currently detected transmitter.

[0118] The following describes and illustrates the embodiments of the present application through specific embodiments.

[0119] Figure 8 is a flowchart of the fault detection method for the electronic device of the specific embodiment of the present application. As Figure 8 shown, the fault detection method for the electronic device includes the following steps:

[0120] Step S810, for each transmitter, turn off the signal source of the carrier circuit corresponding to the transmitter, and obtain the output voltage of the current adjustment circuit corresponding to the transmitter; according to the output voltage, obtain the first self-check result of the transmitter.

[0121] Step S820: If all transmitters are normal, obtain the induced voltage of each sensor; compare the induced voltage of each sensor with the first preset voltage threshold to obtain a second comparison result; determine the second self-check result of each sensor according to the second comparison result.

[0122] Step S830: Select one transmitter from multiple transmitters as the currently detected transmitter; set the currently detected transmitter to be in the first state and set other transmitters to be in the second state.

[0123] Step S840: Obtain the induced voltage of each sensor; obtain the corresponding relationship detection result of the currently detected transmitter according to the induced voltage of each sensor, the first state and the second state, and determine the next detected transmitter, and so on until all transmitters are traversed.

[0124] Step S850: Obtain the matching detection result of the transmitter and the sensor according to all the corresponding relationship detection results and the preset corresponding relationship.

[0125] Step S860: Determine the fault location of the electronic device according to the first self-check result, the second self-check result and the matching detection result.

[0126] It should be noted that the steps shown in the above process or the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although the logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in a different order than here.

[0127] The method embodiment provided in this embodiment can be executed on a terminal, a computer or a similar computing device. Taking running on a terminal as an example, Figure 9 is the hardware structure block diagram of the terminal for the fault detection method of the electronic device according to the embodiment of the present application. As Figure 9 shown, the terminal 90 may include one or more ( Figure 9 only one is shown in Figure 9 processors 902 (the processors 902 may include, but are not limited to, processing devices such as a microprocessor MCU or a programmable logic device FPGA) and a memory 904 for storing data. Optionally, the above terminal may further include a transmission device 906 for communication functions and an input / output device 909. Those of ordinary skill in the art can understand that Figure 9 the structure shown is only schematic and does not limit the structure of the above terminal. For example, the terminal 90 may further include more or fewer components than those shown in Figure 9 or have a different configuration from that shown in

[0128] The memory 904 can be used to store computer programs, for example, software programs and modules of application software, such as the computer program corresponding to the fault detection method of the electronic device in the embodiments of the present application. The processor 902 executes various functional applications and data processing by running the computer program stored in the memory 904, that is, implements the above-mentioned method. The memory 904 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memories, or other non-volatile solid-state memories. In some instances, the memory 904 may further include a memory remotely disposed relative to the processor 902, and these remote memories can be connected to the terminal 90 through a network. Examples of the above network include but are not limited to the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof.

[0129] The transmission device 906 is used to receive or send data via a network. Specific examples of the above network may include a wireless network provided by a communication provider of the terminal 90. In one instance, the transmission device 906 includes a network adapter (Network Interface Controller, abbreviated as NIC), which can be connected to other network devices through a base station and thus communicate with the Internet. In one instance, the transmission device 906 may be a radio frequency (Radio Frequency, abbreviated as RF) module, which is used to communicate with the Internet wirelessly.

[0130] This embodiment also provides a fault detection device for an electronic device. This device is used to implement the above-mentioned embodiments and preferred implementation manners, and those that have been described will not be repeated. As used hereinafter, terms such as "module", "unit", "sub-unit", etc. may be a combination of software and / or hardware that can implement a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, implementation in hardware, or a combination of software and hardware is also possible and contemplated.

[0131] Figure 10 is a structural block diagram of the fault detection device for the electronic device of the embodiments of the present application. As Figure 10 shown, the device includes:

[0132] The first self-check module 110 is used to perform a self-check on each transmitter to obtain a first self-check result of each transmitter;

[0133] The second self-check module 120 is used to perform a self-check on each sensor to obtain a second self-check result of each sensor;

[0134] The supporting detection module 130 is used to detect the corresponding relationship between multiple transmitters and multiple sensors, and determine a supporting detection result of the transmitter and the sensor according to the corresponding relationship;

[0135] A fault determination module 140 is configured to determine the fault location of the electronic device according to the first self-check result, the second self-check result, and the matching detection result.

[0136] In some embodiments, the first self-check module 110 is further configured to, for each transmitter, turn off the signal source of the carrier circuit corresponding to the transmitter, and obtain the output voltage of the current adjustment circuit corresponding to the transmitter; and obtain the first self-check result of the transmitter according to the output voltage.

[0137] In some embodiments, the second self-check module 120 is further configured to, if all transmitters are normal, obtain the induced voltage of each inductor; compare the induced voltage of each inductor with a first preset voltage threshold to obtain a second comparison result; and determine the second self-check result of each inductor according to the second comparison result.

[0138] In some embodiments, the matching detection module 130 includes a selection unit, a setting unit, an acquisition unit, a detection unit, and a determination unit, where:

[0139] The selection unit is configured to select one transmitter from multiple transmitters as the currently detected transmitter.

[0140] The setting unit is configured to set the currently detected transmitter to be in a first state, and set other transmitters to be in a second state.

[0141] The acquisition unit is configured to obtain the induced voltage of each inductor.

[0142] The detection unit is configured to obtain the corresponding relationship detection result of the currently detected transmitter according to the induced voltage of each inductor, the first state, and the second state, and determine the next detected transmitter, and so on, until all transmitters are traversed.

[0143] The determination unit is configured to obtain the matching detection result between the transmitter and the inductor according to all the corresponding relationship detection results and the preset corresponding relationship.

[0144] In some embodiments, the setting unit is further configured to set the currently detected transmitter to be in an on state, and set other transmitters to be in an off state; or, set the currently detected transmitter to be in an off state, and set other transmitters to be in an on state.

[0145] In some embodiments, the detection unit is further configured to compare the induced voltage of each inductor with a second preset voltage threshold to obtain a third comparison result; and determine the inductor having a corresponding relationship with the currently detected transmitter according to the third comparison result, the first state, and the second state.

[0146] In some of these embodiments, the detection unit is further configured to calculate the difference between the induction voltage of each inductor and a second preset voltage threshold; and determine the inductor corresponding to the currently detected transmitter according to the difference, a preset difference threshold, a first state, and a second state.

[0147] It should be noted that the above-mentioned various modules can be functional modules or program modules, and can be implemented either by software or by hardware. For the modules implemented by hardware, the above-mentioned various modules can be located in the same processor; or the above-mentioned various modules can also be located in different processors in any combined form.

[0148] This embodiment also provides an electronic device, including a memory and a processor. A computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0149] Optionally, the above-mentioned electronic device may further include a transmission device and an input / output device. Among them, the transmission device is connected to the above-mentioned processor, and the input / output device is connected to the above-mentioned processor.

[0150] Optionally, in this embodiment, the above-mentioned processor may be configured to execute the following steps through a computer program:

[0151] S1, perform self-check on each transmitter to obtain a first self-check result of each transmitter.

[0152] S2, perform self-check on each inductor to obtain a second self-check result of each inductor.

[0153] S3, detect the corresponding relationship between multiple transmitters and multiple inductors, and determine the matching detection result of the transmitter and the inductor according to the corresponding relationship.

[0154] S4, determine the fault location of the electronic device according to the first self-check result, the second self-check result, and the matching detection result.

[0155] It should be noted that the specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementation manners, and will not be elaborated herein.

[0156] In addition, in combination with the electronic device fault detection method in the above embodiments, an embodiment of the present application can be implemented by providing a storage medium. A computer program is stored on the storage medium; when the computer program is executed by a processor, it implements any one of the above-mentioned electronic device fault detection methods.

[0157] Those skilled in the art should understand that the technical features of the above embodiments can be combined arbitrarily. For the sake of brevity in description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as falling within the scope described in this specification.

[0158] The above embodiments only express several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several deformations and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A fault detection method for an electronic device, which is applied to the electronic device. The electronic device includes a plurality of transmitters and sensors used in combination, and is characterized in that, The electronic device includes a sewing machine, and the method includes: Performing self-check on each of the transmitters to obtain a first self-check result of each of the transmitters; Performing self-check on each of the sensors to obtain a second self-check result of each of the sensors; Detecting the correspondence between a plurality of the transmitters and a plurality of the sensors, and determining a matching detection result of the transmitters and the sensors according to the correspondence; Determining a fault location of the electronic device according to the first self-check result, the second self-check result, and the matching detection result; The detecting the correspondence between a plurality of the transmitters and a plurality of the sensors, and determining a matching detection result of the transmitters and the sensors according to the correspondence includes: Selecting one transmitter from a plurality of the transmitters as a currently detected transmitter; Setting the currently detected transmitter in a first state and setting other transmitters in a second state; Obtaining an induced voltage of each of the sensors; Obtaining a correspondence detection result of the currently detected transmitter according to the induced voltage of each of the sensors, the first state, and the second state, and determining a next detected transmitter, and so on until all the transmitters are traversed; Obtaining a matching detection result of the transmitters and the sensors according to all the correspondence detection results and a preset correspondence; Wherein, a driving circuit of the transmitter includes a carrier wave circuit and a current regulating circuit; the carrier wave circuit includes a resistor R1, a resistor R2, a resistor R3, a triode Q1, and a triode Q2; the carrier wave circuit is configured to generate a carrier signal of the transmitter to drive the transmitter to emit infrared light; the current regulating circuit includes a resistor R4, a resistor R5, a resistor R6, a sampling resistor R7, a capacitor C1, a triode Q3, and a comparator; The performing self-check on each of the transmitters to obtain a first self-check result of each of the transmitters includes: For each of the transmitters, turning off a signal source of a carrier wave circuit corresponding to the transmitter, and obtaining an output voltage of a current regulating circuit corresponding to the transmitter; wherein, the output voltage of the current regulating circuit is an output voltage of an output end of the comparator; Obtaining a first self-check result of the transmitter according to the output voltage.

2. The method according to claim 1, wherein The performing self-check on each of the sensors to obtain a second self-check result of each of the sensors includes: If all the transmitters are normal, obtaining an induced voltage of each of the sensors; Comparing the induced voltage of each of the sensors with a first preset voltage threshold to obtain a second comparison result; Determining a second self-check result of each of the sensors according to the second comparison result.

3. The method according to claim 1, characterized in that The setting the currently detected transmitter in a first state and setting other transmitters in a second state includes: Setting the currently detected transmitter in an on state and setting other transmitters in an off state; or Setting the currently detected transmitter in an off state and setting other transmitters in an on state.

4. The method according to claim 3, wherein The obtaining of the corresponding relationship detection result of the currently detected transmitter according to the induction voltage of each sensor, the first state, and the second state includes: Comparing the induction voltage of each sensor with a second preset voltage threshold to obtain a third comparison result; Determining the sensors having a corresponding relationship with the currently detected transmitter according to the third comparison result, the first state, and the second state.

5. The method according to claim 3, wherein The obtaining of the corresponding relationship detection result of the currently detected transmitter according to the induction voltage of each sensor, the first state, and the second state includes: Calculating the difference between the induction voltage of each sensor and the second preset voltage threshold; Determining the sensors having a corresponding relationship with the currently detected transmitter according to the difference, a preset difference threshold, the first state, and the second state.

6. A fault detection device for an electronic device, characterized in that, Including: A first self-check module for performing a self-check on each transmitter to obtain a first self-check result of each transmitter; A second self-check module for performing a self-check on each sensor to obtain a second self-check result of each sensor; A matching detection module for detecting the corresponding relationship between multiple transmitters and multiple sensors, and determining a matching detection result of the transmitters and the sensors according to the corresponding relationship; A fault determination module for determining the fault location of the electronic device according to the first self-check result, the second self-check result, and the matching detection result; The matching detection module includes a selection unit, a setting unit, an acquisition unit, a detection unit, and a determination unit; The selection unit is used to select one transmitter from multiple transmitters as the currently detected transmitter; The setting unit is used to set the currently detected transmitter to be in the first state and set other transmitters to be in the second state; The acquisition unit is used to acquire the induction voltage of each sensor; The detection unit is used to obtain the corresponding relationship detection result of the currently detected transmitter according to the induction voltage of each sensor, the first state, and the second state, and determine the next transmitter to be detected, and so on until all transmitters are traversed; The determination unit is used to obtain the matching detection result of the transmitters and the sensors according to all the corresponding relationship detection results and a preset corresponding relationship; Wherein, the drive circuit of the transmitter includes a carrier circuit and a current regulation circuit; the carrier circuit includes a resistor R1, a resistor R2, a resistor R3, a triode Q1, and a triode Q2; the carrier circuit is used to generate a carrier signal of the transmitter to drive the transmitter to emit infrared light; the current regulation circuit includes a resistor R4, a resistor R5, a resistor R6, a sampling resistor R7, a capacitor C1, a triode Q3, and a comparator; The first self-check module is further used to, for each transmitter, turn off the signal source of the carrier circuit corresponding to the transmitter and acquire the output voltage of the current regulation circuit corresponding to the transmitter; wherein, the output voltage of the current regulation circuit is the output voltage of the output terminal of the comparator. Based on the output voltage, obtain the first self-check result of the transmitter.

7. An electronic device, comprising a memory and a processor, characterized in that, A computer program is stored in the memory, and the processor is configured to run the computer program to execute the fault detection method of the electronic device according to any one of claims 1 to 5.

8. A storage medium, characterized in that, A computer program is stored in the storage medium, wherein the computer program is configured to execute the fault detection method of the electronic device according to any one of claims 1 to 5 when running.

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