A performance testing method, device, equipment and storage medium for a solid-state hard drive

Abstract

The present application discloses a method for testing the performance of a solid-state drive (SSD). After the SSD to be tested is connected to a test host, the SSD to be tested is controlled to be in a fixed temperature state and a temperature-variable state, respectively, so as to perform performance tests on the SSD to be tested at different target temperature states, and obtain performance test results of the SSD to be tested at the target temperature state. Compared with the prior art method of only obtaining performance test results when the SSD is at the optimal temperature, the performance test method of the SSD disclosed in the present application covers the temperature state of the SSD more comprehensively, thereby obtaining more reliable SSD performance test results, which helps developers discover hidden problems of the SSD and solve them in a targeted manner. The present application also discloses a performance test device, equipment and storage medium for the SSD, which have the above-mentioned beneficial effects.

Description

Technical Field

[0001] The present application relates to the technical field of solid-state hard disks, and in particular to a performance testing method, apparatus, device, and storage medium for solid-state hard disks. Background Art

[0002] A solid-state drive (SSD), also known as a solid-state drive (SSD), is a hard drive made with an array of solid-state electronic storage chips. When performing read and write operations on an SSD, the SSD itself calculates a comprehensive temperature that represents the disk's temperature. As the read and write pressure increases, the SSD's temperature rises accordingly. The comprehensive temperature calculated by the SSD is transmitted to the server. When the SSD's temperature rises to a certain value, the server increases the fan speed through calculations to cool the SSD. When the SSD's temperature drops, the server lowers the fan speed to reduce server power consumption. In this way, the SSD is maintained at an optimal temperature during the read and write process, ensuring maximum, stable, and reliable read and write performance. During the development and testing of SSDs, the actual operating scenarios of the SSD are simulated based on the control method of this operating process, and then the performance parameters of the SSD are tested.

[0003] However, when simulating the above-mentioned server control scenario of the hard disk, the performance parameters of the solid-state hard disk obtained are only the performance test results when the solid-state hard disk is at the optimal temperature. It cannot cover the situations where the solid-state hard disk is in other temperature states during actual operation, resulting in incomplete test results and inability to discover hidden problems of the solid-state hard disk. Summary of the Invention

[0004] The purpose of this application is to provide a performance testing method, apparatus, device and storage medium for solid-state drives, which are used to obtain more comprehensive performance test results in solid-state drive development and testing.

[0005] To solve the above technical problems, the present application provides a performance testing method for a solid-state drive, comprising:

[0006] After the solid-state drive to be tested is connected to the test host, the solid-state drive to be tested is controlled to be in a target temperature state;

[0007] Performing a performance test on the solid-state drive to be tested;

[0008] Obtaining a performance test result of the solid-state hard disk to be tested under the target temperature state;

[0009] The target temperature state includes a fixed temperature state and a temperature-varying state.

[0010] Optionally, the fixed temperature state specifically includes multiple temperature ranges.

[0011] Optionally, the temperature change state includes at least one of a temperature oscillation change state, a constant rate temperature change state and a temperature sudden change state.

[0012] Optionally, controlling the solid-state drive to be tested to be in a target temperature state is specifically:

[0013] After the solid state hard disk to be tested is subjected to read and write pressure, the server fan is controlled to control the temperature of the solid state hard disk to be tested so that the solid state hard disk to be tested is in the target temperature state.

[0014] Optionally, after the read and write pressure is applied to the solid-state hard disk to be tested, controlling the server fan to control the temperature of the solid-state hard disk to be tested so that the solid-state hard disk is at the target temperature state specifically includes:

[0015] Repeat the steps of reading and writing pressure on the solid-state hard disk to be tested until the temperature of the solid-state hard disk to be tested increases, adjusting the speed of the server fan to the maximum, and adjusting the speed of the server fan to the minimum after the temperature of the solid-state hard disk to be tested decreases, so that the solid-state hard disk to be tested is in a temperature oscillation state.

[0016] Optionally, controlling the solid-state drive to be tested to be in a target temperature state is specifically:

[0017] The temperature of the solid state hard disk to be tested is adjusted by using a temperature adjustment device so that the solid state hard disk to be tested is in the target temperature state.

[0018] Optionally, the performance test specifically includes: at least one of high and low format test, adjustment test, normal power-off test, abnormal power-off test, protocol test, sequential read and write test, random read and write test, mixed read and write test and stability test.

[0019] To solve the above technical problems, the present application also provides a performance testing device for a solid-state drive, comprising:

[0020] A control unit, configured to control the solid-state hard disk to be tested to maintain a target temperature after the solid-state hard disk to be tested is connected to the test host;

[0021] A testing unit, configured to perform a performance test on the solid-state drive to be tested;

[0022] An acquiring unit, configured to acquire a performance test result of the solid-state drive to be tested under the target temperature state;

[0023] The target temperature state includes a fixed temperature state and a temperature-varying state.

[0024] To solve the above technical problems, the present application also provides a solid-state drive performance testing device, comprising:

[0025] A memory for storing instructions, wherein the instructions include the steps of any one of the above-mentioned methods for testing the performance of a solid-state drive;

[0026] A processor is configured to execute the instructions.

[0027] To solve the above technical problems, the present application also provides a storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the performance testing method for a solid-state hard disk as described in any one of the above items are implemented.

[0028] The performance testing method for solid-state drives provided in the present application controls the solid-state drive to be tested to be in a fixed temperature state and a temperature-varying state, respectively, after the solid-state drive to be tested is connected to a test host, so as to perform performance tests on the solid-state drive to be tested under different target temperature states, and obtain performance test results of the solid-state drive to be tested under the target temperature state. Compared with the prior art in which performance test results are only obtained when the solid-state drive is at the optimal temperature, the temperature state covered by the solid-state drive provided in the present application is more comprehensive, thereby obtaining more reliable solid-state drive performance test results, which helps developers discover hidden problems of solid-state drives and solve them in a targeted manner.

[0029] The present application also provides a performance testing device, equipment and storage medium for a solid-state hard disk, which have the above-mentioned beneficial effects and will not be described in detail here. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the embodiments of the present application or the technical solutions of the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0031] Figure 1 A flowchart of a method for testing the performance of a solid-state drive provided in an embodiment of the present application;

[0032] Figure 2 A schematic diagram of the temperature control effect of a solid-state hard disk to be tested provided in an embodiment of the present application;

[0033] Figure 3 A schematic diagram of the temperature control effect of another solid-state drive to be tested provided in an embodiment of the present application;

[0034] Figure 4 A schematic diagram of the structure of a performance testing device for a solid-state drive provided in an embodiment of the present application;

[0035] Figure 5A schematic diagram of the structure of a solid-state drive performance testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0036] The core of this application is to provide a performance testing method, device, equipment and storage medium for solid-state hard drives, which are used to obtain more comprehensive performance test results in solid-state hard drive development and testing.

[0037] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0038] Example 1

[0039] Figure 1 A flowchart of a solid-state drive performance testing method provided in an embodiment of the present application.

[0040] like Figure 1 As shown, the performance testing method of the solid-state drive provided in the embodiment of the present application includes:

[0041] S101: After the solid state drive to be tested is connected to the test host, the solid state drive to be tested is controlled to be in a target temperature state.

[0042] S102: Performing a performance test on the solid state drive to be tested.

[0043] S103: Obtaining a performance test result of the solid-state drive to be tested under a target temperature state.

[0044] The target temperature state includes a fixed temperature state and a temperature change state.

[0045] In a specific implementation, the performance testing method for a solid-state drive provided in an embodiment of the present application can be executed based on one server, namely, a test host, or can be executed based on another server connected to the test host.

[0046] The temperature control strategy of a typical solid-state drive is that, during the reading and writing process, if its own temperature continues to rise, the solid-state drive will reduce its bandwidth, thereby reducing its own performance to avoid damage to the solid-state drive caused by excessive temperature; and when its own temperature drops, the solid-state drive bandwidth increases, and the solid-state drive performance is improved. When the temperature is too high, the bandwidth of the solid-state drive is reduced to 0, and all data input and output (IO) is stopped. For step S101, the method of controlling the solid-state drive to be in the target temperature state can specifically be to control the temperature of the solid-state drive to be tested by performing read and write pressure on the solid-state drive to be tested, so that the solid-state drive to be tested is in the target temperature state. When the test host is performing the test, it can simultaneously perform read and write pressure on the solid-state drive to cause temperature changes inside the solid-state drive, and control the server fan to cool the outside of the solid-state drive to make the solid-state drive to be tested reach the target temperature state.

[0047] Specifically, the test host can use the FIO tool to read and write pressure on the SSD under test, and use the ipmitool tool to control the speed of the server fan. The specific implementation of adjusting the server fan speed through the ipmitool tool is as follows:

[0048] Open ipmitool to adjust the server fan function:

[0049] Run the command ipmitool-I lanplus-U ipmiusername-P ipmipassword-H serveraddressraw 0x300x300x01 0x00 (this command is proprietary to the server and may vary depending on the manufacturer).

[0050] Adjust the server fan through ipmitool:

[0051] Run the command ipmitool-I lanplus-U ipmiusername-P ipmipassword-H serveraddressraw 0x30 0x300x20 0xff 0x20 (this command is proprietary to the server and varies from manufacturer to manufacturer. The last hexadecimal number represents the fan speed; a larger value indicates a higher fan speed).

[0052] The above command can be written into an automation control script to automatically call and execute control of the server fan.

[0053] Alternatively, in step S101, the method for controlling the solid-state drive to be at the target temperature state can also be to use a temperature adjustment device to adjust the temperature of the solid-state drive to be at the target temperature state. The temperature adjustment device can be a heat flow hood, a rapid temperature change test chamber, etc., in which the solid-state drive to be tested is placed, and the temperature of the solid-state drive to be tested is changed by changing the ambient temperature of the solid-state drive to be tested, so that the solid-state drive to be tested reaches the target temperature state.

[0054] The test host can read the comprehensive temperature of the solid-state drive under test through the NVMe smart-log, or obtain the comprehensive temperature of the solid-state drive under test through a temperature sensor installed on the solid-state drive under test.

[0055] In step S102, when the SSD under test is at the target temperature, a performance test is performed on the SSD under test. Specifically, the performance test may include at least one of a high and low format test, a trim test, a normal power-off test, an abnormal power-off test, a protocol test, a sequential read / write test, a random read / write test, a mixed read / write test, and a stability test. Based on development requirements, one or more of these tests may be selected and the test sequence arranged, and the tests may be performed at the target temperature.

[0056] In step S103 , the test parameters may be read from the solid state drive to be tested and analyzed to obtain the performance test results.

[0057] It should be noted that the temperature scenarios that need to be covered in the embodiment of the present application include fixed temperature states and temperature change states, that is, at least two actual temperature scenarios are included, so steps S101 to S103 need to be executed at least twice, one time corresponding to one target temperature state.

[0058] The performance testing method for solid-state drives provided in the embodiment of the present application, after the solid-state drive to be tested is connected to the test host, controls the solid-state drive to be tested to be in a fixed temperature state and a temperature variable state respectively, so as to perform performance tests on the solid-state drive to be tested under different target temperature states, and obtain performance test results of the solid-state drive to be tested under the target temperature state. Compared with the prior art in which performance test results are only obtained when the solid-state drive is at the optimal temperature, the performance testing method for solid-state drives provided in the embodiment of the present application covers the temperature states of the solid-state drive more comprehensively, thereby obtaining more reliable solid-state drive performance test results, which helps developers discover hidden problems of solid-state drives and solve them in a targeted manner.

[0059] Example 2

[0060] Figure 2 A schematic diagram of the temperature control effect of a solid-state drive to be tested provided in an embodiment of the present application.

[0061] Based on the above embodiments, it is considered that the SSD may not always maintain the optimal temperature during actual operation, and the temperature may deviate from the optimal temperature due to increased load, poor server fan regulation, virus invasion, etc. Therefore, based on the above embodiments, in the SSD performance testing method provided in the embodiments of the present application, the SSD to be tested is controlled to be in a fixed temperature state of the target temperature state, specifically including multiple temperature ranges.

[0062] In a specific implementation, the temperature range in which the SSD to be tested can operate can be determined based on the temperature control strategy of the SSD to be tested, and then multiple temperature ranges can be intercepted from the temperature range, for example, divided into temperature range 1 (normal temperature to 60°C), temperature range 2 (60°C to 70°C), temperature range 3 (70°C to 80°C), and temperature range 4 (above 80°C). In addition to this example, the temperature range can be more finely divided based on the specific temperature control strategy of the SSD to be tested.

[0063] When the solid-state hard disk to be tested is controlled to be in the target temperature state in step S101, if the server fan is controlled to perform temperature control on the solid-state hard disk to be tested after reading and writing pressure on the solid-state hard disk to be tested, so that the solid-state hard disk to be tested is in the target temperature state, then in the specific control, the reading and writing pressure of the solid-state hard disk to be tested can be increased to increase the temperature of the solid-state hard disk to be tested to a certain temperature within the current temperature range to be tested (such as temperature range 1) or slightly higher than the current temperature range to be tested. Use the ipmitool command to adjust the speed of the server fan through the PID control algorithm to control the temperature of the solid-state hard disk to be tested so that the temperature of the solid-state hard disk to be tested is within the current temperature range to be tested (such as temperature range 1). At this time, the ipmitool command needs to be dynamically issued to adjust the speed of the server fan, and dynamically and automatically control the temperature of the solid-state hard disk to be tested to achieve the following results: Figure 2 The temperature control effect is shown.

[0064] like Figure 2 As shown, when the temperature of the solid-state hard drive to be tested is stable within the current temperature range to be tested (such as temperature range 1), step S102 can be entered to perform a performance test on the solid-state hard drive to be tested. After obtaining the performance test results in the temperature range, based on the above method, the performance and stability of the solid-state hard drive to be tested in other temperature ranges (temperature range 2, temperature range 3, temperature range 4) can be automatically tested in the same way.

[0065] In practical applications, specific parameters of the fixed temperature state to be simulated can be selected according to the performance target and actual needs of the solid-state drive to be tested, including the temperature values ​​and allowable error values ​​corresponding to each temperature range.

[0066] Example 3

[0067] Figure 3 A schematic diagram of the temperature control effect of another solid-state drive to be tested provided in an embodiment of the present application.

[0068] Based on the above embodiments, it is considered that in addition to being fixed within a certain temperature range, SSDs may also experience sudden temperature changes (sudden temperature increase or decrease) during actual operation, which may also expose certain performance issues of the SSD. Therefore, based on the above embodiments, in the SSD performance testing method provided in the embodiments of the present application, the SSD to be tested is controlled to be in a temperature change state of the target temperature state, which may specifically include at least one of a temperature oscillation change state, a constant rate temperature change state, and a sudden temperature change state.

[0069] In a specific implementation, if the performance of a solid-state drive under temperature oscillation is tested, after the solid-state drive under test is subjected to read and write stress, the server fan is controlled to control the temperature of the solid-state drive under test so that the solid-state drive is at the target temperature state, specifically including:

[0070] Repeat the steps of reading and writing pressure on the solid-state hard disk to be tested until the temperature of the solid-state hard disk to be tested increases, adjusting the speed of the server fan to the maximum, and adjusting the speed of the server fan to the minimum after the temperature of the solid-state hard disk to be tested decreases, so that the solid-state hard disk to be tested is in a temperature oscillation state.

[0071] Specifically, by increasing the read and write pressure of the solid-state hard disk to be tested to increase the temperature of the solid-state hard disk to be tested, use the ipmitool command to control the server fan. After the temperature of the solid-state hard disk to be tested rises, adjust the speed of the server fan to the maximum; after the temperature of the solid-state hard disk to be tested drops, adjust the speed of the server fan to the minimum, so as to achieve the following results: Figure 3 The temperature oscillation effect of the solid-state drive under test is shown, which realizes the automatic adjustment of the sudden increase and decrease of the temperature of the solid-state drive under test. At this time, a time period can be selected to perform performance testing on the solid-state drive under test.

[0072] If the performance of the solid-state drive to be tested is tested in a constant-rate temperature change state or a sudden temperature change state, a time period can be intercepted from the temperature oscillation change state for testing, or the temperature of the solid-state drive to be tested can be changed externally by a temperature adjustment device (which can be cooperated with a server fan) to make the temperature of the solid-state drive to be tested appear in a constant-rate temperature change state or a sudden temperature change state.

[0073] In practical applications, specific parameters of the temperature change state to be simulated can be selected according to the performance target and actual needs of the solid-state drive to be tested, including the temperature range and temperature change rate of the temperature change state.

[0074] The above describes in detail various embodiments corresponding to the performance testing method of a solid-state drive. On this basis, the present application also discloses a performance testing device, equipment, and storage medium for a solid-state drive corresponding to the above method.

[0075] Example 4

[0076] Figure 4 A schematic structural diagram of a solid-state drive performance testing device provided in an embodiment of the present application.

[0077] like Figure 4 As shown, the performance testing device for a solid-state drive provided in an embodiment of the present application includes:

[0078] The control unit 401 is used to control the solid-state drive to be tested to be in a target temperature state after the solid-state drive to be tested is connected to the test host;

[0079] The testing unit 402 is used to perform a performance test on the solid-state drive to be tested;

[0080] An acquiring unit 403 is configured to acquire a performance test result of the solid state drive to be tested under a target temperature state;

[0081] The target temperature state includes a fixed temperature state and a temperature change state.

[0082] Specifically, the fixed temperature state may include multiple temperature ranges.

[0083] Specifically, the temperature change state may include at least one of a temperature oscillation change state, a constant rate temperature change state, and a temperature sudden change state.

[0084] Furthermore, the control unit 401 controls the solid state drive to be tested to be in a target temperature state, specifically:

[0085] After the solid-state drive to be tested is subjected to read and write pressure, the server fan is controlled to control the temperature of the solid-state drive to be tested so that the solid-state drive to be tested is at a target temperature state.

[0086] Furthermore, after the control unit 401 performs read and write pressure on the solid-state drive to be tested, it controls the server fan to control the temperature of the solid-state drive to be tested so that the solid-state drive is at a target temperature state, specifically including:

[0087] Repeat the steps of reading and writing pressure on the solid-state hard disk to be tested until the temperature of the solid-state hard disk to be tested increases, adjusting the speed of the server fan to the maximum, and adjusting the speed of the server fan to the minimum after the temperature of the solid-state hard disk to be tested decreases, so that the solid-state hard disk to be tested is in a temperature oscillation state.

[0088] Furthermore, the control unit 401 controls the solid state drive to be tested to be in a target temperature state, specifically:

[0089] The temperature of the solid state drive to be tested is adjusted by using a temperature adjustment device so that the solid state drive to be tested is at a target temperature state.

[0090] Specifically, the performance test may include at least one of: high and low format test, adjustment test, normal power-off test, abnormal power-off test, protocol test, sequential read and write test, random read and write test, mixed read and write test and stability test.

[0091] Since the embodiments of the apparatus part correspond to the embodiments of the method part, please refer to the description of the embodiments of the method part for the embodiments of the apparatus part, and they will not be repeated here.

[0092] The performance testing device for a solid-state hard disk provided in an embodiment of the present application has a control unit that controls the solid-state hard disk to be in a fixed temperature state and a temperature-varying state respectively after the solid-state hard disk to be tested is connected to a test host, so that the testing unit performs performance tests on the solid-state hard disk to be tested under different target temperature states, and the acquisition unit obtains the performance test results of the solid-state hard disk to be tested under the target temperature state. Compared with the prior art in which performance test results are only obtained when the solid-state hard disk is at the optimal temperature, the performance testing method for a solid-state hard disk provided in an embodiment of the present application covers the temperature state of the solid-state hard disk more comprehensively, thereby obtaining more reliable solid-state hard disk performance test results, which helps developers discover hidden problems of the solid-state hard disk and solve them in a targeted manner.

[0093] Example 5

[0094] Figure 5 A schematic diagram of the structure of a solid-state drive performance testing device provided in an embodiment of the present application.

[0095] like Figure 5 As shown, the performance testing equipment for the solid-state drive provided in the embodiment of the present application includes:

[0096] A memory 510 is configured to store instructions, wherein the instructions include the steps of the solid-state drive performance testing method according to any one of the above embodiments;

[0097] The processor 520 is configured to execute the instructions.

[0098] Among them, the processor 520 may include one or more processing cores, such as a 3-core processor, an 8-core processor, etc. The processor 520 can be implemented in at least one hardware form of digital signal processing DSP (Digital Signal Processing), field programmable gate array FPGA (Field-Programmable Gate Array), and programmable logic array PLA (Programmable Logic Array). The processor 520 may also include a main processor and a coprocessor. The main processor is a processor for processing data in the awake state, also known as the central processing unit CPU (Central Processing Unit); the coprocessor is a low-power processor for processing data in the standby state. In some embodiments, the processor 520 may be integrated with a graphics processing unit GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content to be displayed on the display screen. In some embodiments, the processor 520 may also include an artificial intelligence AI (Artificial Intelligence) processor, which is used to process computing operations related to machine learning.

[0099] The memory 510 may include one or more storage media, which may be non-transitory. The memory 510 may also include a high-speed random access memory, and a non-volatile memory, such as one or more disk storage devices, flash memory storage devices. In this embodiment, the memory 510 is at least used to store the following computer program 511, wherein, after the computer program 511 is loaded and executed by the processor 520, it can implement the relevant steps in the performance testing method of the solid-state hard disk disclosed in any of the aforementioned embodiments. In addition, the resources stored in the memory 510 may also include an operating system 512 and data 513, etc., and the storage method may be temporary storage or permanent storage. Among them, the operating system 512 may be Windows. The data 513 may include but is not limited to the data involved in the above method.

[0100] In some embodiments, the performance testing device for a solid state drive may further include a display screen 530 , a power supply 540 , a communication interface 550 , an input / output interface 560 , a sensor 570 , and a communication bus 580 .

[0101] Those skilled in the art will understand that Figure 5 The structure shown in the figure does not constitute a limitation on the performance test equipment of the solid state drive, and may include more or fewer components than shown in the figure.

[0102] The performance testing device for a solid-state hard disk provided in an embodiment of the present application includes a memory and a processor. When the processor executes a program stored in the memory, after the solid-state hard disk to be tested is connected to a test host, the processor controls the solid-state hard disk to be tested to be in a fixed temperature state and a temperature-varying state respectively, so as to perform performance tests on the solid-state hard disk to be tested under different target temperature states, and obtain performance test results of the solid-state hard disk to be tested under the target temperature state. Compared with the prior art in which performance test results are only obtained when the solid-state hard disk is at an optimal temperature, the performance testing device for the solid-state hard disk provided in the embodiment of the present application covers the temperature state of the solid-state hard disk more comprehensively, thereby obtaining more reliable solid-state hard disk performance test results, which helps developers discover hidden problems of the solid-state hard disk and solve them in a targeted manner.

[0103] Example 6

[0104] It should be noted that the above-described embodiments of the apparatus and equipment are merely illustrative. For example, the division of modules is merely a logical function division. In actual implementation, there may be other division methods, such as multiple modules or components may be combined or integrated into another system, or some features may be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, indirect coupling or communication connection of the apparatus or module, which may be electrical, mechanical or other forms. The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place, or they may be distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment.

[0105] In addition, the functional modules in the various embodiments of the present application may be integrated into a processing module, or each module may exist physically separately, or two or more modules may be integrated into a single module. The above-mentioned integrated modules may be implemented in the form of hardware or software functional modules.

[0106] If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of this application, or the part that contributes to the existing technology, or all or part of the technical solution can be embodied in the form of a software product. This computer software product is stored in a storage medium and performs all or part of the steps of the method described in each embodiment of this application.

[0107] To this end, an embodiment of the present application further provides a storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of a performance testing method for a solid-state drive are implemented.

[0108] The storage medium may include: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc., which can store program codes.

[0109] The computer program contained in the storage medium provided in this embodiment can, when executed by the processor, control the solid-state hard disk to be tested to be in a fixed temperature state and a temperature-varying state respectively after the solid-state hard disk to be tested is connected to the test host, so as to perform performance tests on the solid-state hard disk to be tested under different target temperature states, and obtain performance test results of the solid-state hard disk to be tested under the target temperature state. Compared with the prior art in which performance test results are only obtained when the solid-state hard disk is at the optimal temperature, the performance test method for the solid-state hard disk executed by the storage medium provided in the embodiment of the present application covers the temperature state of the solid-state hard disk more comprehensively, thereby obtaining more reliable solid-state hard disk performance test results, which helps developers discover hidden problems of the solid-state hard disk and solve them in a targeted manner.

[0110] The above is a detailed introduction to the performance testing method, device, equipment and storage medium of a solid-state hard disk provided by the present application. The various embodiments in the specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same and similar parts between the various embodiments can be referred to each other. For the devices, equipment and storage media disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple, and the relevant parts can be referred to the method part description. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of this application, several improvements and modifications can be made to this application, and these improvements and modifications also fall within the scope of protection of the claims of this application.

[0111] It should also be noted that, in this specification, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus comprising the element.

Claims

1. A performance testing method for a solid state drive, characterized in that: include: After connecting the SSD to be tested to the test host, performing read and write pressure on the SSD to be tested, controlling the server fan to control the temperature of the SSD to be tested so that the SSD to be tested is at the target temperature state; Performing a performance test on the solid-state drive to be tested; Obtaining a performance test result of the solid-state hard disk to be tested under the target temperature state; Wherein, the target temperature state includes a fixed temperature state and a temperature change state; The fixed temperature state specifically includes a plurality of temperature ranges intercepted from the temperature range in which the solid state drive to be tested can operate; For a fixed temperature state, after the solid-state hard disk to be tested is subjected to read and write pressure, the server fan is controlled to perform temperature control on the solid-state hard disk to be tested so that the solid-state hard disk to be tested is in a target temperature state, specifically including: increasing the read and write pressure of the solid-state hard disk to be tested so that the temperature of the solid-state hard disk to be tested is raised to within the temperature range to be tested or slightly higher than the temperature range to be tested, using the ipmitool command to adjust the speed of the server fan through the PID control algorithm to control the temperature of the solid-state hard disk to be tested so that the temperature of the solid-state hard disk to be tested is within the temperature range to be tested, and dynamically issuing the ipmitool command to adjust the speed of the server fan to dynamically and automatically control the temperature of the solid-state hard disk to be tested; For the temperature change state, after the solid-state hard disk to be tested is subjected to read and write pressure, the server fan is controlled to perform temperature control on the solid-state hard disk to be tested, so that the solid-state hard disk to be tested is in a target temperature state, specifically comprising: repeatedly performing the steps of reading and writing pressure on the solid-state hard disk to be tested until the temperature of the solid-state hard disk to be tested increases, adjusting the speed of the server fan to the maximum, and after the temperature of the solid-state hard disk to be tested decreases, adjusting the speed of the server fan to the minimum, so that the solid-state hard disk to be tested is in a temperature oscillation change state; The temperature change state includes at least one of a temperature oscillation change state, a constant rate temperature change state and a temperature sudden change state; The performance test specifically includes: at least one of high and low format test, adjustment test, normal power-off test, abnormal power-off test, protocol test, sequential read and write test, random read and write test, mixed read and write test and stability test.

2. A performance testing device for a solid state drive, characterized in that: include: A control unit is configured to connect the solid-state drive to be tested to a test host, perform read and write operations on the solid-state drive to be tested, and then control a server fan to control the temperature of the solid-state drive to be tested so that the solid-state drive to be tested is at a target temperature; A testing unit, configured to perform a performance test on the solid-state drive to be tested; An acquiring unit, configured to acquire a performance test result of the solid-state drive to be tested under the target temperature state; Wherein, the target temperature state includes a fixed temperature state and a temperature change state; The fixed temperature state specifically includes a plurality of temperature ranges intercepted from the temperature range in which the solid state drive to be tested can operate; For a fixed temperature state, after the solid-state hard disk to be tested is subjected to read and write pressure, the server fan is controlled to perform temperature control on the solid-state hard disk to be tested so that the solid-state hard disk to be tested is in a target temperature state, specifically including: increasing the read and write pressure of the solid-state hard disk to be tested so that the temperature of the solid-state hard disk to be tested is raised to within the temperature range to be tested or slightly higher than the temperature range to be tested, using the ipmitool command to adjust the speed of the server fan through the PID control algorithm to control the temperature of the solid-state hard disk to be tested so that the temperature of the solid-state hard disk to be tested is within the temperature range to be tested, and dynamically issuing the ipmitool command to adjust the speed of the server fan to dynamically and automatically control the temperature of the solid-state hard disk to be tested; For the temperature change state, after the solid-state hard disk to be tested is subjected to read and write pressure, the server fan is controlled to perform temperature control on the solid-state hard disk to be tested, so that the solid-state hard disk to be tested is in a target temperature state, specifically comprising: repeatedly performing the steps of reading and writing pressure on the solid-state hard disk to be tested until the temperature of the solid-state hard disk to be tested increases, adjusting the speed of the server fan to the maximum, and after the temperature of the solid-state hard disk to be tested decreases, adjusting the speed of the server fan to the minimum, so that the solid-state hard disk to be tested is in a temperature oscillation change state; The temperature change state includes at least one of a temperature oscillation change state, a constant rate temperature change state and a temperature sudden change state; The performance test specifically includes: at least one of high and low format test, adjustment test, normal power-off test, abnormal power-off test, protocol test, sequential read and write test, random read and write test, mixed read and write test and stability test.

3. A performance testing device for a solid state drive, characterized in that: include: A memory for storing instructions, wherein the instructions include the steps of the solid state drive performance testing method according to claim 1; A processor is configured to execute the instructions.

4. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the solid state drive performance testing method as claimed in claim 1 are implemented.

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