Temperature self-calibration method, temperature measurement network, electronic device and electronic equipment

Abstract

The present application provides a temperature self-calibration method, a temperature measurement network, an electronic device, and an electronic equipment. The method is executed on a controller, and the controller is connected to at least one ATS and at least one DTS; the DTSs are arranged around the ATSs, and the ATSs and DTSs are arranged on the temperature measurement area of the chip; the method includes: obtaining first temperature data detected by the ATSs and digital codes detected by the DTSs; taking the first temperature data as a reference, determining the latest calibration parameters of the DTSs according to the first temperature data and the digital codes detected by the DTSs; and updating the calibration parameters of the DTSs to the latest calibration parameters. This solution can achieve automatic correction of the calibration parameters of the DTSs. Compared with the current situation where the calibration parameters cannot be adjusted after the DTS devices age, after adopting the solution of the present application, the accuracy will be higher, and the service life of the DTSs can be extended.

Description

Technical Field

[0001] The present application relates to the technical field of electronic circuits, and in particular, to a temperature self-calibration method, a temperature measurement network, an electronic device, and an electronic equipment. Background Art

[0002] In recent years, integrated circuits have developed rapidly, the process manufacturing level has been continuously improved, the number of components on a unit chip area has become larger and larger, and the heat generation of the chip has also become larger and larger, increasing the hidden danger of device performance degradation or even failure, which has thus triggered people's attention to chip temperature monitoring and management. For a relatively large-scale chip such as a CPU, the on-chip temperature distribution range is wide, and it is more necessary to be able to detect the chip temperature at multiple locations.

[0003] The traditional temperature network realizes temperature measurement by arranging ATS (Analog Temperature Sensor) or DTS (Digital Temperature Sensor) in each temperature measurement area on the chip. However, although ATS has the advantages of high temperature accuracy and simple calibration, the layout area of ATS is large and the physical implementation is complex. Compared with ATS, DTS has the advantages of small area and being conducive to integration. However, due to the implementation principle of DTS: using devices that can sense temperature (such as triodes, diodes, resistors, capacitors, MOS (metal oxide semiconductor) transistors, etc.), converting temperature into temperature signals such as voltage, current or clock frequency, and then through an analog-to-digital converter or other means, quantifying and converting the sensed temperature signal into a digital code. The change of this digital code can represent the temperature, and in an ideal situation, this digital code is proportional or has other relationships with the temperature. However, in reality, due to the non-ideality of the devices and circuits, the temperature and the digital code are not strictly proportional. At this time, a polynomial can be used to fit the temperature. Among them, the parameters used in the fitting are the calibration parameters. Therefore, the output accuracy of DTS will be affected by the calibration parameters. As the working time of DTS increases, DTS will cause the original calibration parameters to fail due to device aging, thereby causing temperature deviation. Summary of the Invention

[0004] The purpose of the embodiments of the present application is to provide a temperature self-calibration method, a temperature measurement network, an electronic device, and an electronic equipment, so as to realize the self-correction of the calibration parameters of DTS.

[0005] An embodiment of the present application provides a temperature self-calibration method, which is applied to a controller. The controller is connected to at least one ATS and at least one DTS; the DTS is arranged around the ATS, and the ATS and the DTS are arranged on the temperature measurement area of the chip; the method includes: obtaining the first temperature data detected by the ATS and the digital code detected by the DTS; taking the first temperature data as a reference, and determining the latest calibration parameter of the DTS according to the first temperature data and the digital code detected by the DTS; updating the calibration parameter of the DTS to the latest calibration parameter.

[0006] In the above implementation process, by arranging the ATS on the temperature measurement area of the chip and arranging the DTS around the ATS, the characteristic of high temperature accuracy of the ATS is utilized. Taking the first temperature data detected by the ATS as a reference, the latest calibration parameter calculated according to the first temperature data and the digital code of the DTS is obtained, and the calibration parameter of the DTS is updated to the latest calibration parameter. This realizes the automatic correction of the calibration parameter of the DTS without manual participation. Since the temperature deviation between adjacent temperature measurement areas on the same chip is usually not too large, although there may still be a certain error in the calibration parameter obtained by adjusting based on the first temperature data of the adjacent ATS, this error is acceptable in industrial applications. When the original calibration parameter of the DTS fails due to device aging as the working time of the DTS increases, the above method can still ensure that the temperature measured by the DTS has a high credibility. Compared with the current situation where the calibration parameter cannot be adjusted after the DTS device ages, after adopting the solution of the present application, the accuracy will be higher and the service life of the DTS will be extended.

[0007] Further, taking the first temperature data as a reference, and determining the latest calibration parameter of the DTS according to the first temperature data and the digital code detected by the DTS includes: calculating the second temperature data of the DTS according to the digital code detected by the DTS at the current moment and the current calibration parameter of the DTS; determining the latest calibration parameter of the DTS according to the difference between the first temperature data and the second temperature data.

[0008] In the above implementation process, since the controller can obtain the first temperature data of the ATS and the digital code of the DTS in real time, the calibration parameter of the DTS can be continuously iterated, so that the calibration parameter is updated to meet the expectation, and thus the DTS can continuously have good temperature measurement performance.

[0009] Further, according to the difference between the first temperature data and the second temperature data, determining the latest calibration parameter of the DTS, including: calculating the temperature error of the DTS according to the first temperature data and the second temperature data; calculating a parameter deviation according to the temperature error and the digital code detected by the DTS at the current moment; and determining the latest calibration parameter of the DTS according to the current calibration parameter of the DTS and the parameter deviation.

[0010] In the above implementation process, calculating a parameter deviation according to the temperature error of the DTS and the digital code detected by the DTS can easily determine the direction of the parameter deviation, so that through continuous iteration, the calibration parameter can be updated to meet the expectation, and thus the DTS can continuously have good temperature measurement performance.

[0011] Further, calculating a parameter deviation according to the temperature error and the digital code detected by the DTS at the current moment includes: calculating the parameter deviation according to the following formula:

[0012] ΔA = μ · (Temp DTS -Temp ATS ) · [0x 0 x 1 …x n-1 -1

[0013] where ΔA is the parameter deviation, μ is a preset constant, Temp DTS is the second temperature data, Temp ATS is the first temperature data, and x is the digital code.

[0014] The above implementation process can easily obtain the parameter deviation. The scheme is simple to implement and is conducive to implementation in a controller with limited computing power. And engineers can also control the iteration data and iteration accuracy by setting the value of μ, so as to meet different setting requirements.

[0015] Further, obtaining the first temperature data detected by the ATS and the digital code detected by the DTS includes: obtaining the first temperature data detected by the ATS at n moments respectively and the digital code detected by the DTS at the n moments respectively; n is a preset positive integer greater than 1;

[0016] ​Based on the first temperature data, determine the latest calibration parameters of the DTS according to the first temperature data and the digital code detected by the DTS, including: using the first temperature data at each moment as the standard temperature data that the DTS should measure at each moment, constructing a system of equations related to the first temperature data, the latest calibration parameters, and the digital code with the latest calibration parameters as the unknowns; solving the system of equations to obtain the latest calibration parameters.

[0017] In the above implementation process, by obtaining the first temperature data and digital codes at n moments, and using the first temperature data at each moment as the standard temperature data that the DTS should measure at each moment, a system of equations is constructed, so that the latest calibration parameters that conform to the first temperature data can be directly analyzed, so that the update of the calibration parameters can meet the expectations, and the DTS can continuously have good temperature measurement performance.

[0018] Further, before determining the latest calibration parameters of the DTS based on the first temperature data according to the first temperature data and the digital code detected by the DTS, the method further includes: calculating the second temperature data of the DTS according to the digital code detected by the DTS at the current moment and the current calibration parameters of the DTS; calculating the temperature error of the DTS according to the first temperature data and the second temperature data; determining that the temperature error of the DTS is not within the preset allowable temperature error range.

[0019] In the above implementation process, before determining the latest calibration parameters of the DTS, first judge whether the temperature error of the DTS is within the preset allowable temperature error range. When the temperature error of the DTS is not within the preset allowable temperature error range, the latest calibration parameters are determined, so that unnecessary calculation consumption can be reduced and the calculation overhead can be reduced.

[0020] Further, there are multiple ATSs, which are arranged in different temperature measurement areas of the chip; there are multiple DTSs, which are respectively arranged around at least one of the ATSs; the corresponding relationship between each DTS and the ATS corresponding to each DTS is pre-recorded in the controller; based on the first temperature data, determine the latest calibration parameters of the DTS according to the first temperature data and the digital code detected by the DTS, including: determining the target ATS corresponding to the currently to-be-calibrated DTS according to the corresponding relationship; based on the first temperature data of the target ATS, determine the latest calibration parameters of the currently to-be-calibrated DTS according to the first temperature data of the target ATS and the digital code detected by the currently to-be-calibrated DTS.

[0021] In the above implementation process, DTSs are respectively arranged around multiple ATSs, and the corresponding relationships between each DTS and the ATSs adjacent to each DTS are pre-recorded, so as to correct the current calibration parameters of the DTSs based on the first temperature data of the adjacent ATSs. This effectively ensures the calibration reliability of each DTS on a chip with a large area.

[0022] An embodiment of the present application further provides a temperature measurement network, including: at least one ATS arranged on the temperature measurement area of the chip; at least one DTS arranged on the temperature measurement area of the chip and around the ATS; a controller connected to the at least one ATS and the at least one DTS, configured to obtain the first temperature data detected by the ATS and the digital codes detected by the DTS, and determine the latest calibration parameters of the DTS based on the first temperature data, and update the calibration parameters of the DTS to the latest calibration parameters according to the first temperature data and the digital codes detected by the DTS.

[0023] In the above implementation structure, ATSs are arranged on the temperature measurement area of the chip, and DTSs are arranged around the ATSs. Thus, the controller can utilize the characteristic of high temperature accuracy of the ATSs, and update the calibration parameters of the DTSs based on the first temperature data detected by the ATSs and according to the first temperature data and the digital codes of the DTSs, which realizes the automatic correction of the calibration parameters of the DTSs without manual participation.

[0024] Since the temperature deviation between adjacent temperature measurement areas on the same chip is usually not too large, although there may still be a certain error in the calibration parameters obtained by adjusting based on the first temperature data of the adjacent ATSs, this error is acceptable in industrial applications. When the original calibration parameters of the DTS become invalid due to device aging as the working time of the DTS increases, the above method can still ensure that the temperature measured by the DTS has a high credibility. Compared with the current situation where the calibration parameters cannot be adjusted after the DTS device ages, the accuracy will be higher and the service life of the DTS will be extended after adopting the solution of the present application.

[0025] Further, there are multiple ATSs arranged on different temperature measurement areas of the chip; there are multiple DTSs respectively arranged around at least one of the ATSs; and the corresponding relationships between each DTS and the ATSs corresponding to each DTS are pre-recorded in the controller.

[0026] In the above implementation structure, DTSs are respectively arranged around multiple ATSs, and the corresponding relationship between each DTS and the ATSs adjacent to each DTS is pre-recorded, so as to correct the current calibration parameters of the DTSs based on the first temperature data of the adjacent ATSs. This effectively ensures the calibration reliability of each DTS even on a chip with a large area.

[0027] Further, the controller is the chip.

[0028] In the above implementation structure, there is no need to additionally set a controller, which is convenient for the electronic device to adopt this temperature measurement network.

[0029] An embodiment of the present application also provides an electronic device, including the temperature measurement network of any one of the above.

[0030] An embodiment of the present application also provides an electronic equipment, including the above electronic device.

[0031] An embodiment of the present application also provides a computer-readable storage medium, which stores one or more programs, and the one or more programs can be executed by one or more controllers to implement the temperature self-calibration method of any one of the above. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings required to be used in the embodiments of the present application. It should be understood that the following drawings only show some embodiments of the present application, so they should not be regarded as limiting the scope. For those of ordinary skill in the art, other related drawings can be obtained based on these drawings without creative efforts.

[0033] Figure 1 It is a schematic structural diagram of a temperature measurement network with one ATS provided by an embodiment of the present application;

[0034] Figure 2 It is a schematic structural diagram of a temperature measurement network with multiple ATSs provided by an embodiment of the present application;

[0035] Figure 3 It is a schematic flowchart of a temperature self-calibration method provided by an embodiment of the present application;

[0036] Figure 4 It is a schematic flowchart of automatic calibration parameter correction for one DTS provided by an embodiment of the present application;

[0037] Figure 5 It is a schematic structural diagram of a temperature self-calibration device provided by an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0038] The technical solutions in the embodiments of the present application will be described below in conjunction with the accompanying drawings in the embodiments of the present application.

[0039] Embodiment 1:

[0040] In order to realize the self - calibration of the calibration parameters of the DTS and improve the service life of the DTS, a temperature measurement network and a temperature self - calibration method are provided in the embodiments of the present application.

[0041] Reference can be made to Figure 1 as shown Figure 1 which is a schematic diagram of the basic structure of the temperature measurement network provided in the embodiments of the present application, including: at least one ATS, at least one DTS, and a controller. Among them:

[0042] At least one ATS is disposed on the temperature - measuring area of the chip.

[0043] At least one DTS is disposed on the temperature - measuring area of the chip and is disposed around the ATS.

[0044] The controller is connected to each ATS and each DTS, and is used to obtain the first temperature data detected by the ATS and the digital code detected by the DTS, and based on the first temperature data detected by the ATS, determine the latest calibration parameter of the DTS according to the first temperature data detected by the ATS and the digital code detected by the DTS, and update the calibration parameter of the DTS to the latest calibration parameter.

[0045] In this way, the controller can utilize the high temperature accuracy of the ATS, and based on the first temperature data detected by the ATS, update the current calibration parameter of the DTS, which realizes the automatic calibration of the calibration parameter of the DTS without manual participation.

[0046] Since the temperature deviation between adjacent temperature - measuring areas on the same chip is usually not too large, the calibration parameter adjusted based on the first temperature data of the adjacent ATS may still have a certain error, but this error is acceptable in industrial applications. Compared with the current situation where the calibration parameter cannot be adjusted after the DTS device ages, after the calibration parameter is corrected, the accuracy of the DTS will be higher and the service life of the DTS will be extended.

[0047] In an alternative implementation manner of the embodiments of the present application, the controller can be the chip itself. In the embodiments of the present application, the chip can be a power management, analog - to - digital / digital - to - analog conversion, radio frequency, CPU (Central Processing Unit / Processor, central processing unit) and other chips, but it is not limited thereto.

[0048] Of course, in the embodiments of the present application, the controller can also be implemented by another electronic device with data processing function independent of the chip. At this time, there is no strict position limitation between the controller and the chip. That is to say, the controller can be set on the chip or outside the chip.

[0049] It should be noted that, in the embodiments of the present application, there can be one ATS, for example Figure 1 as shown. At this time, each DTS takes the first temperature data measured by this ATS as a reference, and updates the current calibration parameters of each DTS respectively according to the difference between the first temperature data and the second temperature data measured by each DTS itself.

[0050] In addition, in the embodiments of the present application, there can also be multiple ATSs, for example Figure 2 as shown. At this time, multiple ATSs can be respectively arranged on different temperature measurement areas of the chip, and each DTS is respectively arranged around at least one ATS.

[0051] At this time, if the chip is small and the spatial differences of each temperature measurement area are not significant, then a feasible implementation is that the average value of the first temperature data measured by these multiple ATSs can be taken as a reference, and the current calibration parameters of each DTS are updated respectively according to the average value of each first temperature data.

[0052] In the embodiments of the present application, another feasible implementation is that the corresponding relationship between each DTS and the ATS adjacent to each DTS can be pre-recorded in the controller according to whether they are adjacent in position. For example Figure 2 in the structure shown, it can be associated and recorded that DTS1 corresponds to ATS1, DTS2 corresponds to ATS2, and DTS3 and DTS4 correspond to ATS3.

[0053] After that, after the controller obtains the digital codes detected by each DTS and the first temperature data detected by each ATS, for each DTS, the target ATS corresponding to the currently to-be-calibrated DTS can be determined according to the pre-recorded corresponding relationship between each DTS and the ATS adjacent to each DTS, and then the current calibration parameters of the currently to-be-calibrated DTS are updated according to the first temperature data of the target ATS and the digital code of the currently to-be-calibrated DTS.

[0054] In this way, even on a chip with a large temperature measurement area, the calibration parameters of each DTS can be corrected well.

[0055] Next, refer to Figure 3 the temperature self-calibration method shown, Figure 1 and Figure 2The shown controller can correct the calibration parameters of each DTS by executing the temperature self - calibration method. The temperature self - calibration method includes:

[0056] S301: Obtain the first temperature data detected by the ATS and the digital code detected by the DTS.

[0057] S302: Based on the first temperature data, determine the latest calibration parameter of the DTS according to the first temperature data and the digital code detected by the DTS.

[0058] S303: Update the calibration parameter of the DTS to the latest calibration parameter.

[0059] In a feasible implementation manner of the embodiment of the present application, the controller can continuously obtain the first temperature data detected by the ATS and the digital code detected by the DTS at the current moment.

[0060] Then, according to the digital code detected by the DTS at the current moment and the current calibration parameter of the DTS, calculate the second temperature data of the DTS.

[0061] Then, determine the latest calibration parameter of the DTS according to the difference between the first temperature data and the second temperature data.

[0062] Finally, execute step S303 to update the calibration parameter of the DTS to the latest calibration parameter.

[0063] It should be understood that the implementation principle of the DTS is as follows: Use a device that can sense temperature to convert the temperature into a temperature signal such as voltage, current, or clock frequency, and then through an analog - to - digital converter or other means, quantify and convert the sensed temperature signal into a digital code. The change of this digital code can represent the temperature. In an ideal situation, this digital code is proportional or has other relationships with the temperature. However, in reality, due to the non - ideality of the device and the circuit, the temperature and the digital code are not strictly proportional. At this time, a polynomial can be used to fit the temperature. The formula is as follows:

[0064] Temp DTS = a0·x 0 + a1·x + a2·x 2 + a3·x 3 …+ a n ·x n = A·X -1 ; where: Temp DTS is the second temperature data of the DTS calculated; A = [a0 a1 a2 a3 … a n , is the calibration parameter; X = [x 0 x 1 x 2 x 3 … xn , which is a polynomial of the digital code x. Among them, the value of n is set by the engineer according to actual needs.

[0065] Through the above formula, the second temperature data of the DTS can be calculated based on the digital code of the DTS and the current calibration parameters of the DTS.

[0066] In this feasible implementation, the controller can calculate the temperature error of the DTS based on the first temperature data and the second temperature data, and then calculate the parameter deviation by using the least squares method or other methods according to the temperature error and the digital code detected by the DTS at the current moment. Then, based on the current calibration parameters of the DTS and the parameter deviation, the latest calibration parameters are determined. Finally, the calibration parameters of the DTS are updated to the latest calibration parameters.

[0067] Exemplarily, the parameter deviation can be calculated according to the following formula:

[0068] ΔA = μ·(Temp DTS - Temp ATS )·[0 x 0 x 1 … x n-1 -1

[0069] Among them, ΔA is the parameter deviation, μ is a preset constant, Temp DTS is the second temperature data, Temp ATS is the first temperature data, and x is the digital code.

[0070] After that, it only needs to subtract this ΔA from the current calibration parameters of the DTS.

[0071] It should be noted that in the embodiments of the present application, when there are multiple ATSs and the correspondence between each DTS and the ATSs adjacent to each DTS is pre-recorded in the controller, Temp ATS in the above formula is the first temperature data detected by the target ATS corresponding to the currently calculated DTS.

[0072] When there are multiple ATSs and the calibration parameters are corrected according to the average value of the first temperature data of the multiple ATSs, Temp ATS in the above formula is the average value of the first temperature data of the multiple ATSs.

[0073] In another feasible implementation of the embodiments of the present application, it may also be by obtaining the first temperature data detected by the ATS at n (n is a preset positive integer greater than 1) moments respectively and the digital codes detected by the DTS at these n moments respectively.

[0074] ​Then, using the first temperature data at each moment as the standard temperature data that the DTS should measure at each moment, construct a system of equations related to the first temperature data, the latest calibration parameters, and the digital code with the latest calibration parameters as the unknowns, and solve the system of equations to obtain the latest calibration parameters.

[0075] Finally, execute step S303 to update the calibration parameters of the DTS to the latest calibration parameters.

[0076] Exemplarily, for each moment, an equation can be constructed according to the following formula to obtain a system of equations:

[0077] Temp ATS = a0·x 0 + a1·x + a2·x 2 + a3·x 3 … + a n ·x n = A·X -1 ; where: Temp ATS is the first temperature data detected by the ATS; A = [a0 a1 a2 a3 … a n , is the calibration parameter, which is an unknown and needs to be solved through the system of equations; X = [x 0 x 1 x 2 x 3 … x n , is a polynomial of the digital code x, and x is the digital code detected by the DTS.

[0078] It should be noted that in the embodiment of the present application, before executing step S302, the second temperature data of the DTS can also be calculated first according to the digital code detected by the DTS at the current moment and the current calibration parameters of the DTS, and then according to the currently calculated second temperature data of the DTS and its corresponding first temperature data, calculate the temperature error of the DTS (Temp DTS - Temp ATS ), and then determine whether the temperature error is within the preset allowable temperature error range.

[0079] If it is, it indicates that for this DTS, the temperature data calculated based on the current calibration parameters is acceptable, so step S302 can be skipped and the current calibration parameters can be continued to be used to calculate the second temperature data measured by this DTS.

[0080] On the contrary, if the temperature error is not within the preset allowable temperature error range, it means that for this DTS, the temperature data calculated based on the current calibration parameters is acceptable, so step S302 needs to be executed.

[0081] Since the controller can continuously obtain the first temperature data newly measured by the ATS and the digital code newly measured by the DTS, through the above two feasible implementation manners, as long as the temperature error of the DTS is not within the preset allowable temperature error range, the calibration parameters of the DTS will be continuously updated and iterated until the temperature error of the DTS is within the preset allowable temperature error range.

[0082] In the embodiment of the present application, the allowable temperature error range can be set by an engineer according to actual requirements.

[0083] It should be noted that for the first feasible implementation manner above, in the actual application process, the engineer can set the value of μ in the formula of the first feasible implementation manner according to actual needs, so as to control the iteration efficiency and iteration accuracy. When the value of μ is set larger, the iteration efficiency is higher, and it is easier to iterate to the calibration parameters that make the temperature error within the preset allowable temperature error range. On the contrary, when the value of μ is set smaller, the iteration accuracy is higher, but the iteration efficiency will become lower.

[0084] It should be noted that the temperature self-calibration method provided in the embodiment of the present application can be applied in a laboratory environment, that is, the factory calibration parameters of the DTS can be configured by the above method in the laboratory environment. At this time, by configuring the laboratory environment, the temperatures of each temperature measurement area of the chip can be kept the same, so as to obtain more accurate factory calibration parameters for each DTS.

[0085] In addition, the temperature self-calibration method provided in the embodiment of the present application can also be applied in the normal use environment after leaving the factory. When the DTS ages over time and the original calibration parameters become invalid due to device aging, the above method can still ensure that the temperature measured by the DTS has a high credibility. Compared with the current situation where the calibration parameters cannot be adjusted after the DTS device ages, the accuracy will be higher and the service life of the DTS will be extended after adopting the solution of the present application.

[0086] In the embodiment of the present application, an electronic device is further provided, which includes the temperature measurement network provided in the embodiment of the present application, and a chip for arranging the ATS and DTS in the temperature measurement network.

[0087] Exemplarily, the electronic device can be a CPU (Central Processing Unit / Processor, central processor), DPU (Distributed Processing Unit, distributed processing unit), battery manager, communication module, radio frequency module, etc. with a chip and having a chip temperature measurement requirement, but it is not limited thereto.

[0088] The embodiments of the present application also provide an electronic device, which may include any one of the electronic devices provided by the embodiments of the present application.

[0089] Exemplarily, the electronic device may be a mobile phone, a computer, a server, etc., but is not limited thereto.

[0090] The temperature measurement network, temperature self-calibration method, electronic device, and electronic device provided by the embodiments of the present application can achieve automatic correction of the calibration parameters of the DTS without manual intervention. And when the original calibration parameters of the DTS become invalid due to device aging, the high temperature detection accuracy of the DTS can be ensured through automatic correction.

[0091] Embodiment 2:

[0092] To facilitate understanding of the solution of the present application, on the basis of Embodiment 1, taking the process of automatic correction of the calibration parameters for a DTS as an example, the present application will be further illustrated by examples.

[0093] See Figure 4 As shown, after the chip is powered on, the controller enters the temperature calibration mode and performs the following operations:

[0094] The controller obtains the digital code x of the DTS to be corrected currently, and the first temperature data Temp detected by the corresponding ATS of the DTS ATS .

[0095] Calculate the current second temperature data Temp of the DTS according to the digital code x DTS .

[0096] Calculate the temperature error of the DTS: Temp DTS -Temp ATS .

[0097] Judge whether the temperature error is within the preset allowable range of temperature error.

[0098] If not, according to the formula A1 = A0 - μ · (Temp DTS -Temp ATS ) · [0 x 0 x 1 … x n-1 -1 Calculate the calibration parameter A1 to be updated this time. Update the current calibration parameter A0 to the value of A1, and then newly obtain the digital code x of the DTS to be corrected currently, and the first temperature data Temp detected by the corresponding ATS of the DTS ATS , and repeat the above process.

[0099] ​If the temperature error is within the preset allowable range of temperature error, the calibration is ended, and the current calibration parameters of the DTS are saved.

[0100] In the above solution, the calibration parameters of the DTS are automatically corrected by the analog ATS, which can combine the advantages of the two temperature sensors. During physical implementation, complex wiring is no longer required, and the post-silicon test and calibration processes are not needed, greatly saving the test cost while ensuring that the temperature accuracy is not affected.

[0101] In addition, the above solution can not only calibrate the temperature error caused by process deviation of the DTS, but also calibrate the error caused by device aging due to time variation.

[0102] Embodiment 3:

[0103] Based on the same inventive concept as Embodiment 1, a temperature self-calibration device 500 is further provided in an embodiment of the present application. Please refer to Figure 5 as shown, Figure 5 shows a temperature self-calibration device adopting the Figure 3 method shown. The device can be a controller. It should be understood that the specific functions of the device 500 can be referred to the description above. To avoid repetition, the detailed description is appropriately omitted here. The device 500 includes at least one software function module that can be stored or solidified in the controller in the form of software or firmware. Specifically:

[0104] Referring to Figure 5 as shown, the device 500 includes: an acquisition module 501, a calculation module 502, and a calibration module 503. Among them:

[0105] The acquisition module 501 is configured to acquire the first temperature data detected by the ATS and the digital code detected by the DTS.

[0106] The calculation module 502 is configured to determine the latest calibration parameters of the DTS based on the first temperature data and according to the first temperature data and the digital code detected by the DTS.

[0107] The calibration module 503 is configured to update the calibration parameters of the DTS to the latest calibration parameters.

[0108] In a feasible implementation manner of the embodiment of the present application, the calculation module 502 is specifically configured to calculate the second temperature data of the DTS according to the digital code detected by the DTS at the current moment and the current calibration parameters of the DTS; determine the latest calibration parameters of the DTS according to the difference between the first temperature data and the second temperature data.

[0109] In an alternative example of the above feasible implementation manner, the calculation module 502 is specifically configured to: calculate the temperature error of the DTS according to the first temperature data and the second temperature data; calculate a parameter deviation according to the temperature error and the digital code detected by the DTS at the current moment; and determine the latest calibration parameter of the DTS according to the current calibration parameter of the DTS and the parameter deviation.

[0110] In the above alternative example, the calculation module 502 is specifically configured to calculate the parameter deviation according to the following formula:

[0111] ΔA = μ · (Temp DTS -Temp ATS ) · [0x 0 x 1 …x n-1 -1

[0112] where ΔA is the parameter deviation, μ is a preset constant, Temp DTS is the second temperature data, Temp ATS is the first temperature data, and x is the digital code.

[0113] In another feasible implementation manner of the embodiment of the present application, the acquisition module 501 is specifically configured to acquire the first temperature data detected by the ATS at n moments respectively and the digital codes detected by the DTS at the n moments respectively; n is a preset positive integer greater than 1;

[0114] The calculation module 502 is specifically configured to use the first temperature data at each moment as the standard temperature data that the DTS should measure at each moment, construct a system of equations related to the first temperature data, the latest calibration parameter, and the digital code with the latest calibration parameter as the unknown quantity; and solve the system of equations to obtain the latest calibration parameter.

[0115] In the embodiment of the present application, the calculation module 502 is further configured to, before determining the latest calibration parameter of the DTS based on the first temperature data and according to the first temperature data and the digital code detected by the DTS, calculate the second temperature data of the DTS according to the digital code detected by the DTS at the current moment and the current calibration parameter of the DTS, calculate the temperature error of the DTS according to the first temperature data and the second temperature data, and determine that the temperature error of the DTS is not within the preset allowable temperature error range.

[0116] ​In an embodiment of the present application, when there are multiple ATSs disposed on different temperature measurement regions of the chip; there are multiple DTSs respectively disposed around at least one of the ATSs; and the controller has pre-recorded the correspondence between each of the DTSs and the corresponding ATSs, the calibration module 503 is specifically configured to, according to the correspondence, determine the target ATS corresponding to the currently to-be-calibrated DTS, and based on the first temperature data of the target ATS, determine the latest calibration parameter of the currently to-be-calibrated DTS according to the first temperature data of the target ATS and the digital code detected by the currently to-be-calibrated DTS.

[0117] It should be understood that, for the sake of concise description, some content described in the first embodiment will not be repeated in this embodiment.

[0118] This embodiment also provides a computer-readable storage medium, such as a floppy disk, an optical disc, a hard disk, a flash memory, a USB flash drive, an SD (Secure Digital Memory Card) card, an MMC (Multimedia Card) card, etc. One or more programs for implementing the above-mentioned respective steps are stored in the computer-readable storage medium, and these one or more programs can be executed by one or more controllers to implement the temperature self-calibration method executed by the controller in the above-mentioned first embodiment and / or the second embodiment. Details are not described herein again.

[0119] In the embodiments provided by the present application, it should be understood that the disclosed device and method can be implemented in other ways. The device embodiments described above are only illustrative. For example, the division of the units is only a logical function division, and there may be other division methods in actual implementation. For another example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed mutual coupling or direct coupling or communication connection can be through some communication interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical, mechanical or other form.

[0120] In addition, the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they can be located in one place, or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0121] Furthermore, in each embodiment of the present application, the various functional modules can be integrated together to form an independent part, or each module can exist alone, or two or more modules can be integrated to form an independent part.

[0122] In this document, relational terms such as first and second are used solely to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations.

[0123] In this document, "a plurality of" means two or more.

[0124] The above description is only an embodiment of the present application and is not intended to limit the protection scope of the present application. For those skilled in the art, the present application may have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A temperature self-calibration method, characterized in that, Applied to a controller, the controller is connected to at least one analog temperature sensor ATS and at least one digital temperature sensor DTS; the DTS is arranged around the ATS, and the ATS and the DTS are arranged on the temperature measurement area of the chip; the method includes: Obtain the first temperature data detected by the ATS and the digital code detected by the DTS; Taking the first temperature data as a reference, determine the latest calibration parameter of the DTS according to the first temperature data and the digital code detected by the DTS; Update the calibration parameter of the DTS to the latest calibration parameter; the calibration parameter is the parameter for fitting the digital code to obtain temperature data; Taking the first temperature data as a reference, determine the latest calibration parameter of the DTS according to the first temperature data and the digital code detected by the DTS, including: Calculate the second temperature data of the DTS according to the digital code detected by the DTS at the current moment and the current calibration parameter of the DTS; Calculate the temperature error of the DTS according to the first temperature data and the second temperature data; Calculate the parameter deviation according to the temperature error and the digital code detected by the DTS at the current moment; Determine the latest calibration parameter of the DTS according to the current calibration parameter of the DTS and the parameter deviation.

2. The temperature self-calibration method according to claim 1, characterized in that, Calculating the parameter deviation according to the temperature error and the digital code detected by the DTS at the current moment, including: Calculate the parameter deviation according to the following formula: ΔA = μ·(Temp DTS - Temp ATS )·[0x 0 x 1 …x n-1 -1 ​ where ΔA is the parameter deviation, μ is a preset constant, Temp DTS is the second temperature data, Temp ATS is the first temperature data, and x is the digital code.

3. The temperature self-calibration method according to claim 1, characterized in that Obtain the first temperature data detected by the ATS and the digital code detected by the DTS, including: Obtain the first temperature data detected by the ATS at n moments respectively and the digital codes detected by the DTS at the n moments respectively; n is a preset positive integer greater than 1; Taking the first temperature data as a reference, determine the latest calibration parameter of the DTS according to the first temperature data and the digital code detected by the DTS, including: Taking the first temperature data at each moment as the standard temperature data that the DTS should measure at each moment, construct a system of equations related to the first temperature data, the latest calibration parameter and the digital code with the latest calibration parameter as the unknown; Solve the system of equations to obtain the latest calibration parameter.

4. The temperature self-calibration method according to claim 1, characterized in that Before determining the latest calibration parameter of the DTS according to the first temperature data and the digital code detected by the DTS, the method further includes: Calculate the second temperature data of the DTS according to the digital code detected by the DTS at the current moment and the current calibration parameter of the DTS; Calculate the temperature error of the DTS according to the first temperature data and the second temperature data; Determine that the temperature error of the DTS is not within the preset allowable temperature error range.

5. The temperature self-calibration method according to any one of claims 1-3, characterized in that, There are multiple ATSs, which are arranged on different temperature measurement areas of the chip; there are multiple DTSs, which are respectively arranged around at least one of the ATSs; the corresponding relationship between each DTS and the ATS corresponding to each DTS is pre-recorded in the controller; Based on the first temperature data, determine the latest calibration parameters of the DTS according to the first temperature data and the digital code detected by the DTS, including: Determine the target ATS corresponding to the DTS to be calibrated currently according to the corresponding relationship; Based on the first temperature data of the target ATS, determine the latest calibration parameters of the DTS to be calibrated currently according to the first temperature data of the target ATS and the digital code detected by the DTS to be calibrated currently.

6. A temperature measurement network, characterized in that, Including: At least one analog temperature sensor (ATS), disposed on the temperature measurement area of the chip; At least one digital temperature sensor (DTS), disposed on the temperature measurement area of the chip and around the ATS; A controller, connected to the at least one ATS and the at least one DTS, configured to obtain the first temperature data detected by the ATS and the digital code detected by the DTS, based on the first temperature data, determine the latest calibration parameters of the DTS according to the first temperature data and the digital code detected by the DTS, and update the calibration parameters of the DTS to the latest calibration parameters; The calibration parameter is a parameter for fitting the digital code to obtain temperature data; Wherein, based on the first temperature data, determine the latest calibration parameters of the DTS according to the first temperature data and the digital code detected by the DTS, including: Calculate the second temperature data of the DTS according to the digital code detected by the DTS at the current moment and the current calibration parameters of the DTS; Calculate the temperature error of the DTS according to the first temperature data and the second temperature data; Calculate the parameter deviation according to the temperature error and the digital code detected by the DTS at the current moment; Determine the latest calibration parameters of the DTS according to the current calibration parameters of the DTS and the parameter deviation.

7. The temperature measurement network according to claim 6, characterized in that There are multiple ATSs, disposed on different temperature measurement areas of the chip; there are multiple DTSs, respectively disposed around at least one of the ATSs; the corresponding relationship between each DTS and the ATS corresponding to each DTS is pre-recorded in the controller.

8. The temperature measurement network according to claim 7, wherein The controller is the chip.

9. An electronic device, characterized in that, Including the temperature measurement network according to any one of claims 6-8.

10. An electronic device, characterized in that, Including the electronic device according to claim 9.

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