8results about "Thermometer with A/D converters" patented technology

A system and method provide on-line, wafer-level, die-level, or package-level thermal calibration of an integrated measurement resistor with a single temperature insertion. The system includes a measurement resistor integrated on a substrate with an unknown temperature coefficient and a temperature reference sensor thermally coupled to the measurement resistor. A measurement circuit measures an indication of a resistance of the measurement resistor. An electrically-controllable integrated heat source is operated by a controller to change a temperature of the measurement resistor and the temperature reference sensor and stores values of the resistance indication and the sensed temperature corresponding to multiple temperatures of the temperature of the measurement resistor and the temperature reference sensor. The controller generates or approximates a mathematical relationship between the resistance of the measurement resistor and the temperature of the measurement resistor and the temperature reference sensor from the stored values.

The present disclosure describes embodiments of a temperature sensor with full band PSR. The temperature sensor can include a reference voltage generator, a temperature circuit, and an analog-to-digital converter (ADC). The reference voltage generator is configured to generate a reference voltage. The temperature circuit is configured to operate under a substantially constant bias current and to generate a temperature signal proportional to temperature. The ADC is electrically coupled to the reference voltage generator and the temperature circuit and configured to convert the temperature signal to a digital representation based on a sampling frequency. The ADC comprises a frequency generator configured to generate a modulation frequency having a random variation. The sampling frequency is modulated by the modulation frequency.

The application provides a four-wire temperature acquisition and self-checking circuit, which comprises a constant current source generation circuit, a constant current source detection circuit, a first operational amplifier conditioning circuit, a second operational amplifier conditioning circuit, a four-wire temperature acquisition unit and an ADC data conversion and communication control unit; the ADC data conversion and communication control unit comprises an ADC conversion chip A3 for outputting and inputting a reference voltage VREF; the constant current I_TEMP output by the constant current source generation circuit flows through the sampling resistor R10 and the four-wire temperature acquisition unit, and the voltage generated across the sampling resistor R10 is input to the constant current source detection circuit to output the voltage TEMP_V to the ADC conversion chip A3; when the I_TEMP flows through the four-wire temperature measuring element RT in the four-wire temperature acquisition unit, the voltage generated across the four-wire temperature measuring element RT is input to the first operational amplifier conditioning circuit and the second operational amplifier conditioning circuit respectively, and then the stable voltages TEMP_VA and TEMP_VB are output to the ADC conversion chip A3 respectively. The application can improve the temperature measuring precision and the accuracy of detecting the voltages of the circuits, and ensure the normal operation of the system in the case of one-side fault.

A temperature measurement arrangement for measuring a temperature in a noise voltage-inducing environment includes a sensing circuit including a Negative Temperature Coefficient Thermistor (NTC) for sensing a temperature and a filter for compensating the induced noise voltage at a filter frequency.

The present disclosure relates to a multichannel thermocouple measurement device, which may comprise: a thermocouple-thermistor pair; a terminal to which an analog signal of the thermocouple-thermistor pair is input; and a detection unit which converts the analog signal of the thermocouple-thermistor pair, input via the terminal, into a digital signal.

In some examples, this disclosure describes a method of measuring a temperature-dependent voltage drop over a temperature sensitive resistor. The method may comprise delivering a reference voltage to the temperature sensitive resistor in a first instance of time; determining an auto-ranging current through the temperature sensitive resistor while the reference voltage is delivered to the temperature sensitive resistor; determining a temperature measurement current based on the auto-ranging current; delivering the temperature measurement current to the temperature sensitive resistor in a second instance of time, wherein the second instance of time is after the first instance of time; and measuring the temperature-dependent voltage drop over the temperature sensitive resistor while the temperature measurement current is delivered to the temperature sensitive resistor.

The application discloses a kind of temperature measurement method and device based on photoelastic modulation magneto-optical Kerr optical system, belong to magneto-optical detection and temperature measurement technical field, comprising: S 1, the optical axis azimuth angle of the polarizer and the photoelastic modulator is adjusted, so that the detection light intensity of the photoelectric detector only has direct current component;And the optical axis azimuth angle α of the polarizer is set to be less than 45°, and under the azimuth angle α, the detection light intensity is greater than the quantization error of data acquisition;S2, according to the detection light intensity, the direct current amplitude, the first harmonic amplitude and the second harmonic amplitude of light intensity at photoelastic modulation frequency are obtained by Fourier transform;S3, the magneto-optical signal of magnetic nanometer film sample is calculated;S4, the temperature of the magnetic nanometer film sample is changed, and the numerical relationship between the magneto-optical signal MO (T) and temperature T is calibrated.The application can directly measure temperature based on photoelastic modulation magneto-optical Kerr optical system, and the resolution of temperature measurement on the surface of sample can reach mK level.