Temperature Sensor, Temperature Sensing Method, and Storage Medium

Abstract

The present invention relates to a temperature sensor, a temperature sensing method, and a storage medium. The temperature sensor includes: an analog front-end circuit, an analog-to-digital conversion circuit, and a first splicing circuit. The analog front-end circuit is configured to: generate an input signal and a reference signal in response to a temperature change. The analog-to-digital conversion circuit is connected to the analog front-end circuit and is configured to: perform quantization processing on the input signal based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; and after the number of bits of the first data component reaches a preset threshold, perform quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component. The first splicing circuit is connected to the analog-to-digital conversion circuit and is configured to: splice the first data component and the second data component to obtain a target data. The above temperature sensor has the advantages of high precision and low power consumption.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic circuits, and particularly to a temperature sensor, a temperature sensing method, and a storage medium. Background Art

[0002] A temperature sensor refers to a sensor that can sense temperature and convert it into a digital signal, and is widely used in fields such as medical treatment, industrial control, and household appliances.

[0003] Since there is a corresponding relationship between the actual temperature and the voltage value or current value, the temperature sensor can usually obtain the temperature change by collecting the change of the voltage or current. That is, the temperature sensor can obtain a digital signal representing the temperature by converting the voltage signal or current signal. However, the accuracy of the temperature sensor is often limited by the conversion accuracy when converting the voltage signal or current signal into a digital signal. Summary of the Invention

[0004] Based on this, it is necessary to provide a temperature sensor, a temperature sensing method, and a storage medium to improve the accuracy of the temperature sensor.

[0005] A temperature sensor includes: an analog front-end circuit, an analog-to-digital conversion circuit, and a first splicing circuit.

[0006] The analog front-end circuit is configured to: generate an input signal and a reference signal in response to a temperature change.

[0007] The analog-to-digital conversion circuit is connected to the analog front-end circuit and is configured to: perform quantization processing on the input signal based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; and after the number of bits of the first data component reaches a preset threshold, perform quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component.

[0008] The first splicing circuit is connected to the analog-to-digital conversion circuit and is configured to: splice the first data component and the second data component to obtain a target data.

[0009] In the above temperature sensor, the analog front-end circuit can generate an input signal and a reference signal in response to temperature changes. After obtaining the input signal and the reference signal, the analog-to-digital conversion circuit can perform quantization processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error. Thus, after the number of bits of the first data component reaches a preset threshold, further quantization processing can be continued on the quantization error in the second analog-to-digital conversion mode to obtain a second data component. Then, the first splicing circuit can splice the first data component and the second data component to obtain the target data. That is to say, the above temperature sensor can perform further conversion on the quantization error after the first conversion of the input signal, which is beneficial to making the target data obtained after conversion have a high conversion accuracy, that is, the temperature sensor has the advantage of high precision.

[0010] In some embodiments, the analog-to-digital conversion circuit includes: an incremental analog-to-digital conversion circuit.

[0011] The incremental analog-to-digital conversion circuit is respectively connected to the analog front-end circuit and the first splicing circuit, and is configured to: perform oversampling processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error, and transmit the first data component to the first splicing circuit.

[0012] In the above temperature sensor, an incremental analog-to-digital conversion circuit can be used to perform oversampling processing on the input signal to obtain a first data component and a quantization error. This can improve the conversion accuracy, so that the first data component has a high accuracy and the quantization error is small, which is beneficial to further improving the accuracy of the temperature sensor. In addition, the incremental analog-to-digital conversion circuit has good linearity, which is also beneficial to improving the conversion accuracy.

[0013] In some embodiments, the analog-to-digital conversion circuit further includes: a cyclic analog-to-digital conversion circuit and a second splicing circuit.

[0014] The cyclic analog-to-digital conversion circuit is connected to the incremental analog-to-digital conversion circuit and is configured to: after the number of bits of the first data component reaches a preset threshold, collect the quantization error and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component.

[0015] The second splicing circuit is respectively connected to the cyclic analog-to-digital conversion circuit and the first splicing circuit, and is configured to: splice multiple conversion results to obtain a second data component and transmit the second data component to the first splicing circuit.

[0016] In some embodiments, the analog-to-digital conversion circuit includes: a signal acquisition circuit, a hybrid analog-to-digital conversion circuit, and a third splicing circuit.

[0017] The signal acquisition circuit is connected to the analog front-end circuit and is configured to: acquire an input signal and a reference signal in a first analog-to-digital conversion mode; and acquire a quantization error in a second analog-to-digital conversion mode.

[0018] The hybrid analog-to-digital conversion circuit is respectively connected to the signal acquisition circuit and the first splicing circuit and is configured to: perform oversampling processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error, transmit the first data component to the first splicing circuit, and latch the quantization error; and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is a bit of data in the second data component.

[0019] The third splicing circuit is respectively connected to the hybrid analog-to-digital conversion circuit and the first splicing circuit and is configured to: splice the multiple conversion results in the second analog-to-digital conversion mode to obtain a second data component and transmit the second data component to the first splicing circuit.

[0020] In the above temperature sensor, the cooperation of the signal acquisition circuit and the hybrid analog-to-digital conversion circuit can be utilized to perform oversampling processing on the input signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error, and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results. After obtaining the multiple conversion results, the third splicing circuit can also be utilized to splice the multiple conversion results in the second analog-to-digital conversion mode to obtain a second data component. That is to say, the above temperature sensor can meet the conversion requirements of different analog-to-digital conversion modes by using the same circuit elements, thereby realizing the reuse of circuit elements, facilitating the simplification of the circuit, and reducing the volume of the temperature sensor.

[0021] In some embodiments, the temperature sensor further includes: a digital compensation circuit connected to the first splicing circuit. The digital compensation circuit is configured to: compensate the target data to obtain a temperature value.

[0022] Based on the same inventive concept, an embodiment of the present application also provides a temperature sensing method, which is applied to the temperature sensor in some of the foregoing embodiments. The technical effects that can be achieved by the temperature sensor in some of the foregoing embodiments can also be achieved by this temperature sensing method, which will not be elaborated herein.

[0023] The temperature sensing method includes the following steps.

[0024] In response to a temperature change, an input signal and a reference signal are generated. The input signal is quantized based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error. After the number of bits of the first data component reaches a preset threshold, the quantization error is quantized in a second analog-to-digital conversion mode to obtain a second data component. The first data component and the second data component are concatenated to obtain a target data.

[0025] In the above temperature sensing method, an input signal and a reference signal can be generated in response to a temperature change. After obtaining the input signal and the reference signal, the input signal can be quantized based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error. Next, after the number of bits of the first data component reaches a preset threshold, the quantization error can be further quantized in a second analog-to-digital conversion mode to obtain a second data component. Then, the first data component and the second data component can be concatenated to obtain the target data. In this way, it is beneficial to make the target data obtained after conversion have a high conversion accuracy.

[0026] In some embodiments, the quantization process of the input signal in the first analog-to-digital conversion mode includes: oversampling process.

[0027] In the above temperature sensing method, the input signal can be oversampled to make the first data component have a high accuracy and make the quantization error small.

[0028] In some embodiments, after the number of bits of the first data component reaches a preset threshold, the quantization error is quantized in a second analog-to-digital conversion mode to obtain a second data component, including the following steps.

[0029] After the number of bits of the first data component reaches a preset threshold, the quantization error is collected. The quantization error is subjected to multiple analog-to-digital conversions in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is a bit of data in the second data component. The multiple conversion results are concatenated to obtain the second data component.

[0030] In some embodiments, after obtaining the target data, the temperature conversion method further includes: compensating the target data to obtain a temperature value.

[0031] The embodiments of the present application also provide a storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the temperature sensing method in some of the foregoing embodiments are implemented. The storage medium can also achieve all the technical effects that the foregoing temperature sensing method can achieve. Description of the Drawings

[0032] Figure 1 It is a structural block diagram of a temperature sensor provided for an embodiment;

[0033] Figure 2 Schematic diagram of the circuit structure of an analog front-end circuit provided for an embodiment;

[0034] Figure 3 Schematic diagram of the circuit structure of another analog front-end circuit provided for an embodiment;

[0035] Figure 4 Block diagram of the structure of another temperature sensor provided for an embodiment;

[0036] Figure 5 Schematic diagram of the circuit structure of an analog-to-digital conversion circuit provided for an embodiment;

[0037] Figure 6 Block diagram of the structure of yet another temperature sensor provided for an embodiment;

[0038] Figure 7 Schematic diagram of the circuit structure of another analog-to-digital conversion circuit provided for an embodiment;

[0039] Figure 8 Flowchart of a temperature sensing method provided for an embodiment;

[0040] Figure 9 Flowchart of each step in step S300 provided for an embodiment.

[0041] Description of reference numerals:

[0042] 100 - Analog front-end circuit; 110 - Bias current generation circuit; 111 - First dynamic matching circuit;

[0043] 112 - Chopper modulation circuit; 120 - Voltage generation circuit; 121 - Second dynamic matching circuit;

[0044] 200 - Analog-to-digital conversion circuit; 211 - Delta-sigma analog-to-digital conversion circuit; 2111 - First accumulator;

[0045] 2112 - Integrator; 2113 - First comparator; 2114 - First digital-to-analog converter;

[0046] 212 - Cyclic analog-to-digital conversion circuit; 2121 - Second accumulator; 2122 - First amplifier;

[0047] 2123 - Second comparator; 2124 - Second digital-to-analog converter; 213 - Second splicing circuit;

[0048] 221 - Signal acquisition circuit; 222 - Hybrid analog-to-digital conversion circuit;

[0049] 2221 - Second amplifier; 2222 - Third comparator; 223 - Third splicing circuit;

[0050] 300 - First splicing circuit; 400 - Digital compensation circuit. Detailed implementation mode

[0051] To facilitate the understanding of the present invention, the present invention will be described more comprehensively below with reference to the relevant drawings. Preferred embodiments of the present invention are shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0052] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present invention belongs. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0053] When using "including", "having", and "comprising" described herein, unless a clear limiting term is used, such as "only", "consisting of", etc., another component can also be added. Unless otherwise mentioned, terms in the singular form can include the plural form and should not be construed as having a quantity of one.

[0054] Please refer to Figure 1 , an embodiment of the present application provides a temperature sensor. It includes: an analog front - end circuit 100, an analog - to - digital conversion circuit 200, and a first splicing circuit 300.

[0055] The analog front - end circuit 100 is configured to: in response to a temperature change, generate an input signal and a reference signal.

[0056] Exemplarily, both the input signal and the reference signal can be voltage signals or current signals. For the sake of convenience of understanding, the following takes the case where both the input signal and the reference signal are voltage signals as an example for explanation.

[0057] In some embodiments, the analog front - end circuit 100 is as Figure 2 shown. The input signal is DeltaV be , the reference signal is V be , and the ratio of the two currents is 1:m (m is a positive integer). DeltaV be and V be can be respectively represented by the following formulas.

[0058]

[0059]

[0060] Wherein, K is the Boltzmann constant, T is the temperature, q is the electric charge quantity, I is the bias current, Ic is the collector current of the bipolar transistor, and Is is the saturation current (determined by process parameters).

[0061] In some other embodiments, such as Figure 3 As shown, the analog front-end circuit 100 includes: a bias current generation circuit 110 and a voltage generation circuit 120 connected to the bias current generation circuit 110. Among them, the bias current generation circuit 110 is configured to: provide a bias current for the voltage generation circuit 120. The voltage generation circuit 120 is configured to: generate an input signal of DeltaV be and a reference signal of V be .

[0062] Optionally, the bias current is a current proportional to absolute temperature (Proportional to Absolute Temperature, abbreviated as PTAT).

[0063] Part of the circuit of the bias current generation circuit 110 can adopt a first dynamic matching circuit 111 and a chopper modulation circuit 112 connected to the first dynamic matching circuit 111. Part of the circuit of the voltage generation circuit 120 can adopt a second dynamic matching circuit 121 connected to the first dynamic matching circuit 111. This is beneficial to improving the accuracy of the temperature sensor.

[0064] The analog-to-digital conversion circuit 200 is connected to the analog front-end circuit 100 and is configured to: perform quantization processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error; and after the number of bits of the first data component reaches a preset threshold, perform quantization processing on the quantization error in the second analog-to-digital conversion mode to obtain a second data component. The preset threshold is related to the conversion accuracy. A high conversion accuracy indicates that the number of bits of the converted data is larger, that is, the preset threshold is larger.

[0065] It should be noted that the quantization error refers to the difference between the quantization result and the analog quantity to be quantized. Since the digital signal reflects discontinuous discrete information, while the voltage value or current value is a continuously changing physical quantity, the process of converting from a continuously changing physical quantity to discontinuous discrete information will introduce a quantization error. A large quantization error indicates a low conversion accuracy, and correspondingly, the accuracy of the temperature sensor will also be low. A small quantization error indicates a high conversion accuracy, and correspondingly, the accuracy of the temperature sensor will also be high.

[0066] The first splicing circuit 300 is connected to the analog-to-digital conversion circuit 200 and is configured to: splice the first data component and the second data component to obtain the target data.

[0067] The above target data is the conversion result after converting a voltage signal or a current signal, and the target data can be expressed as:

[0068] In the above temperature sensor, the analog front-end circuit 100 can generate an input signal and a reference signal in response to temperature changes. After obtaining the input signal and the reference signal, the analog-to-digital conversion circuit 200 can perform quantization processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error. In this way, after the number of bits of the first data component reaches a preset threshold, the quantization error can be further quantized in the second analog-to-digital conversion mode to obtain a second data component. Then, the first splicing circuit 300 can splice the first data component and the second data component to obtain the target data. That is to say, the above temperature sensor can further convert the quantization error after the first conversion of the input signal, which is beneficial to making the target data obtained after conversion have a high conversion accuracy, that is, the temperature sensor has the advantage of high precision.

[0069] Please continue to refer to Figure 1 , in some embodiments, the temperature sensor further includes: a digital compensation circuit 400 connected to the first splicing circuit. The digital compensation circuit 400 is configured to: compensate the target data to obtain a temperature value.

[0070] Exemplarily, the temperature value T can be expressed as:

[0071]

[0072] Among them, α is a compensation coefficient, which can be determined according to the process. According to the above formula, it can be seen that the temperature value T is only related to Y.

[0073] Please refer to Figure 4 , in some embodiments, the analog-to-digital conversion circuit 200 includes: an incremental analog-to-digital conversion circuit 211.

[0074] The incremental analog-to-digital conversion circuit 211 is respectively connected to the analog front-end circuit 100 and the first splicing circuit 300, and is configured to: perform oversampling processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error, and transmit the first data component to the first splicing circuit 300.

[0075] Oversampling refers to the process of sampling an input signal with a sampling signal that is much higher than twice the bandwidth of the input signal. Every time oversampling is performed 4 times, the preset threshold increases by one bit.

[0076] In the above temperature sensor, an incremental analog-to-digital conversion circuit 211 can be used to perform oversampling on the input signal to obtain a first data component and a quantization error. This can improve the conversion accuracy, so that the first data component has a high accuracy and the quantization error is small, which is beneficial to further improve the accuracy of the temperature sensor. In addition, the linearity of the incremental analog-to-digital conversion circuit 211 is good, which is also beneficial to improving the conversion accuracy.

[0077] In some embodiments, the analog-to-digital conversion circuit further includes: a cyclic analog-to-digital conversion circuit 212 and a second splicing circuit 213.

[0078] The cyclic analog-to-digital conversion circuit 212 is connected to the incremental analog-to-digital conversion circuit 211 and is configured to: after the number of bits of the first data component reaches a preset threshold, collect the quantization error and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results; where each conversion result is a bit of data in the second data component.

[0079] The second splicing circuit 213 is connected to the cyclic analog-to-digital conversion circuit 212 and the first splicing circuit 300 respectively and is configured to: splice multiple conversion results to obtain a second data component and transmit the second data component to the first splicing circuit.

[0080] The above temperature sensor can adopt a combination of the incremental analog-to-digital conversion circuit 211 and the cyclic analog-to-digital conversion circuit 212 to perform quantization processing on the input signal. Compared with a temperature sensor using a Sigma Delta type analog-to-digital converter with high precision and high power consumption, the temperature sensor in the embodiment of the present application can have a lower power consumption while having a higher precision.

[0081] In some embodiments, the specific circuits of the incremental analog-to-digital conversion circuit 211 and the cyclic analog-to-digital conversion circuit 212 are as Figure 5 shown.

[0082] The incremental analog-to-digital conversion circuit 211 includes: a first accumulator 2111, an integrator 2112, a first comparator 2113, and a first digital-to-analog converter (DAC) 2114; where the connection relationships between the components are as Figure 5 shown in.

[0083] The cyclic analog-to-digital conversion circuit 212 includes: a second accumulator 2121, a first amplifier 2122, a second comparator 2123, and a second digital-to-analog converter (DAC) 2124; where the connection relationships between the components are as Figure 5 shown in.

[0084] For the convenience of understanding, the following takes the input signal DeltaV beis 0.06V, reference signal V be Taking the reference signal V as 0.68V, the number of bits of the first data component converted by the incremental analog-to-digital conversion circuit 211 is 6 bits (the preset threshold is 6), and the number of bits of the second data component converted by the cyclic analog-to-digital conversion circuit 212 is 8 bits as an example to illustrate the working principle of the above circuit.

[0085] When the input signal DeltaV be (0.06V) and the reference signal is V be (0.68V) are input into the incremental analog-to-digital conversion circuit 211 (the reference signal V be is collected through the first digital-to-analog converter 2114), the input signal DeltaV be will be input into the integrator 2112 through the first accumulator 2111. The integrator 2112 will store the first input input signal DeltaV be and input the input signal DeltaV be into the first comparator 2113 for comparison with 0. At this time, the input signal DeltaV be is greater than 0, and the first comparator 2113 will output 1 as its first comparison result.

[0086] The first digital-to-analog converter 2114 will output the positive reference signal V be (0.68V) to the first accumulator 2111. The first accumulator 2111 will subtract the positive reference signal V be (0.68V) from the input signal DeltaV be (0.06V) to get -0.62V as the output result. The integrator 2112 will add the result output by the first accumulator 2111 to the existing data (0.06V) in the integrator 2112 to get the integration result (i.e., -0.56V). The first comparator 2113 will compare the integration result with 0. At this time, the integration result is less than 0, and the first comparator 2113 will output 0 as its second comparison result. The first digital-to-analog converter 2114 will output the negative reference signal V be to the first accumulator 2111.

[0087] The first accumulator 2111 will subtract the negative reference signal V be (0.06V) from the input signal DeltaV be(-0.68V), 0.74V is obtained as the output result. The integrator 2112 will add the output result (0.74V) of the first accumulator 2111 to the existing data (-0.56V) to obtain an integration result (0.18V). The first comparator 2113 will compare the integration result with 0. At this time, the integration result is greater than 0, and the first comparator 2113 will output 1 as its third comparison result. The first digital-to-analog converter 2114 will output a positive reference signal V be to the first accumulator 2111. The first accumulator 2111 will subtract the input signal DeltaV be (0.06V) from the positive reference signal V be (0.68V) to obtain -0.62V as the output result, and input the output result into the integrator 2112.

[0088] Since the number of bits of the first data component converted by the incremental analog-to-digital conversion circuit 211 is 6 bits, the above process will stop after repeating 64 times (2 6 ). The first comparator 2113 will output 64 comparison results. The incremental analog-to-digital conversion circuit 211 further includes: a digital filter ( Figure 5 not shown in the figure) connected to the first comparator 2113. The digital filter will filter and convert the above 64 comparison results to obtain the first data component D_MSB.

[0089] After the incremental analog-to-digital conversion circuit 211 completes the conversion, there will still be an un-converted quantization error. The incremental analog-to-digital conversion circuit 211 will amplify the quantization error by 64 times to obtain an amplified quantization error Vres. The amplified quantization error Vres can be calculated by the following formula.

[0090]

[0091] The incremental analog-to-digital conversion circuit 211 will input the amplified quantization error Vres into the cyclic analog-to-digital conversion circuit 212 for re-conversion.

[0092] First, switch the switch to terminal A to collect the amplified quantization error V res (-0.24V) and the reference signal V be into the cyclic analog-to-digital conversion circuit 212 (the reference signal V be is collected through the second digital-to-analog converter 2124). After collecting the data, switch the switch to terminal B. During the collection, the first amplifier 2122 will amplify the amplified quantization error V res (-0.24V) by two times to obtain an amplified result, and input the amplified result (-0.48V) into the second comparator 2123 and the second accumulator 2121.

[0093] The second comparator 2123 compares the amplified result with 0. At this time, the amplified result is less than 0, and the second comparator 2123 outputs 0 as its first comparison result. The second digital-to-analog converter 2124 outputs a negative reference signal V be (-0.68V) to the second accumulator 2121. The second accumulator 2121 subtracts the negative reference signal V be (-0.68V) from the output result (-0.48V) of the first amplifier 2122 to obtain 0.2V as the output result. The first amplifier 2122 amplifies the output result of the second accumulator 2121 by 2 times to obtain an amplified result (0.4V), and inputs the amplified result into the second comparator 2123 and the second accumulator 2121.

[0094] The second comparator 2123 compares the amplified result with 0. At this time, the amplified result is greater than 0, and the second comparator 2123 outputs 1 as its second comparison result. The second digital-to-analog converter 2124 outputs a positive reference signal V be (0.68V) to the second accumulator 2121. The second accumulator 2121 subtracts the positive reference signal V be (0.68V) from the output result (0.4V) of the first amplifier 2122 to obtain -0.28V as the output result. The first amplifier 2122 amplifies the output result of the second accumulator 2121 by 2 times to obtain an amplified result (-0.56V), and inputs the amplified result into the second comparator 2123 and the second accumulator 2121.

[0095] Since the number of bits of the second data component converted by the cyclic analog-to-digital conversion circuit 212 is 8 bits, the above process will stop after repeating 8 times. The second comparator 2123 outputs 8 comparison results. Each comparison result represents one bit of data in the second data component.

[0096] Using a second splicing circuit ( Figure 5 (not shown) to splice the multiple comparison results output by the second comparator 2123, the second data component D_LSB can be obtained.

[0097] The structure of the analog-to-digital conversion circuit 200 may also have other different implementation manners.

[0098] Please refer to Figure 6 , in some embodiments, the analog-to-digital conversion circuit 200 includes: a signal acquisition circuit 221, a hybrid analog-to-digital conversion circuit 222, and a third splicing circuit 223.

[0099] The signal acquisition circuit 221 is connected to the analog front-end circuit 100 and is configured to: acquire an input signal and a reference signal in the first analog-to-digital conversion mode; and acquire a quantization error in the second analog-to-digital conversion mode.

[0100] The hybrid analog-to-digital conversion circuit 222 is respectively connected to the signal acquisition circuit 221 and the first splicing circuit 300, and is configured to: perform oversampling processing on the input signal based on a reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error, transmit the first data component to the first splicing circuit 300, and latch the quantization error; and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component.

[0101] The third splicing circuit 223 is respectively connected to the hybrid analog-to-digital conversion circuit 222 and the first splicing circuit 300, and is configured to: splice multiple conversion results in the second analog-to-digital conversion mode to obtain a second data component, and transmit the second data component to the first splicing circuit 300.

[0102] Exemplarily, the specific circuits of the signal acquisition circuit 221 and the hybrid analog-to-digital conversion circuit 222 are as Figure 7 shown.

[0103] The signal acquisition circuit 221 includes switches SW1 to SW12 and 4 sampling capacitors C in . The gating circuit includes switches SW13 to SW16. In the first analog-to-digital conversion mode, switches SW1, SW12, SW13, and SW16 are turned off, and switches SW2 to SW11, SW14, and SW15 are turned on to acquire the input signal DeltaV be and the reference signal V be . The sampling capacitor C in is used to hold the acquired signal for a period of time. After the signal is acquired, switches SW14 and SW15 are turned off, and switches SW13 and SW16 are turned on, so that the input signal DeltaV be and the reference signal V be can be input into the hybrid analog-to-digital conversion circuit 222. In the first analog-to-digital conversion mode, the second amplifier 2221 in the hybrid analog-to-digital conversion circuit 222 is used as an integrator (whose function is the same as that of the integrator 2112 above), and the function of the third comparator 2222 is the same as that of the first comparator 2113. In addition, the third comparator 2222 will latch the quantization error so that the signal acquisition circuit 221 can acquire the quantization error in the second analog-to-digital conversion mode.

[0104] In the second analog-to-digital conversion mode, switches SW2, SW11, SW13, and SW16 are turned off, and switches SW1, SW3 to SW10, SW12, SW14, and SW15 are turned on to acquire the quantization error and the reference signal V be。After the signal is collected, switch SW14 and switch SW15 are turned off, and switch SW13 and switch SW16 are turned on to input the quantization error and reference signal V be into the hybrid analog-to-digital conversion circuit 222. In the second analog-to-digital conversion mode, the second amplifier 2221 in the hybrid analog-to-digital conversion circuit 222 is used as an amplifier (with the same function as the first amplifier 2122 described above), and the third comparator 2222 has the same function as the second comparator 2123.

[0105] Two capacitors C in the hybrid analog-to-digital conversion circuit 222 f are integration capacitors. Switch SW17 and switch SW18 will be turned on before converting the input signal DeltaV be to clear the charge on the integration capacitors.

[0106] In the first analog-to-digital conversion mode, the signal acquisition circuit 221 and the hybrid analog-to-digital conversion circuit 222 function the same as the incremental analog-to-digital conversion circuit 211 described above. In the second analog-to-digital conversion mode, the signal acquisition circuit 221 and the hybrid analog-to-digital conversion circuit 222 function the same as the cyclic analog-to-digital conversion circuit 212 described above.

[0107] In the above temperature sensor, the signal acquisition circuit 221 and the hybrid analog-to-digital conversion circuit 222 can be used in cooperation to perform oversampling on the input signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error, and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results. After obtaining multiple conversion results, the third stitching circuit 223 can also be used to stitch multiple conversion results in the second analog-to-digital conversion mode to obtain the second data component. That is to say, the above temperature sensor can meet the conversion requirements of different analog-to-digital conversion modes with the same circuit components, thus realizing the reuse of circuit components, which is beneficial to simplifying the circuit and reducing the volume of the temperature sensor.

[0108] Based on the same inventive concept, the embodiment of the present application also provides a temperature sensing method, which is applied to the temperature sensor in some of the foregoing embodiments. The technical effects that can be achieved by the temperature sensor in some of the foregoing embodiments can also be achieved by this temperature sensing method, which will not be elaborated here.

[0109] Please refer to Figure 8 , the temperature sensing method includes the following steps.

[0110] S100, in response to a temperature change, generate an input signal and a reference signal.

[0111] S200, perform quantization processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error.

[0112] S300, after the number of bits of the first data component reaches a preset threshold, perform quantization processing on the quantization error in the second analog-to-digital conversion mode to obtain a second data component.

[0113] S400, splice the first data component and the second data component to obtain the target data.

[0114] In the above temperature sensing method, an input signal and a reference signal can be generated in response to a temperature change. After obtaining the input signal and the reference signal, quantization processing can be performed on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error. Next, after the number of bits of the first data component reaches a preset threshold, further quantization processing can be continued on the quantization error in the second analog-to-digital conversion mode to obtain a second data component. Then, the first data component and the second data component can be spliced to obtain the target data. In this way, it is beneficial to make the target data obtained after conversion have a high conversion accuracy.

[0115] Please continue to refer to Figure 8 , in some embodiments, after obtaining the target data, the temperature conversion method further includes the following steps.

[0116] S500, compensate the target data to obtain a temperature value.

[0117] In some embodiments, the quantization processing of the input signal in the first analog-to-digital conversion mode includes: oversampling processing.

[0118] In the above temperature sensing method, oversampling processing can be performed on the input signal to make the first data component have a high accuracy and make the quantization error small.

[0119] Please refer to Figure 9 , in some embodiments, step S300 includes the following steps.

[0120] S310, after the number of bits of the first data component reaches a preset threshold, collect the quantization error.

[0121] S320, perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein, each conversion result is a bit of data in the second data component.

[0122] S330, splice the multiple conversion results to obtain the second data component.

[0123] The embodiments of the present application also provide a storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the temperature sensing method in some of the foregoing embodiments are implemented. The storage medium can also achieve the technical effects that the foregoing temperature sensing method can achieve.

[0124] In some embodiments, the processor can be implemented by a general integrated circuit chip or an application-specific integrated circuit chip. For example, the integrated circuit chip can be disposed on a main board. For example, a storage medium and a power supply circuit can also be disposed on the main board. In addition, the processor can also be implemented by a circuit or in a manner of software, hardware (circuit), firmware, or any combination thereof.

[0125] In some embodiments, the processor can also be a central processing unit or a microprocessor, such as an X86 processor or an ARM processor, or can be a graphics processing unit (GPU) or a tensor processing unit (TPU), or can be a digital signal processor (DSP), etc.

[0126] The storage medium used in each of the embodiments provided by the present application can include at least one of non-volatile and volatile memories. The non-volatile memory can include a read-only memory (ROM), magnetic tape, floppy disk, flash memory, or optical memory, etc. The volatile memory can include a random access memory (RAM) or an external cache memory. By way of illustration and not limitation, RAM can be in various forms, such as a static random access memory (SRAM) or a dynamic random access memory (DRAM), etc.

[0127] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0128] The above-described embodiments only represent several implementation manners of the present invention. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the invention patent should be subject to the appended claims.

Claims

1. A temperature sensor, characterized in that, it includes: an analog front-end circuit configured to generate an input signal and a reference signal in response to a temperature change; an analog-to-digital conversion circuit connected to the analog front-end circuit and configured to perform quantization processing on the input signal based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; and after the number of bits of the first data component reaches a preset threshold, perform quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component; a first splicing circuit connected to the analog-to-digital conversion circuit and configured to splice the first data component and the second data component to obtain target data with a target conversion accuracy, where the preset threshold is related to the target conversion accuracy.

2. The temperature sensor according to claim 1, characterized in that, the analog-to-digital conversion circuit includes: an incremental analog-to-digital conversion circuit connected to the analog front-end circuit and the first splicing circuit respectively and configured to perform oversampling processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error, and transmit the first data component to the first splicing circuit.

3. The temperature sensor according to claim 2, characterized in that, the analog-to-digital conversion circuit further includes: a cyclic analog-to-digital conversion circuit connected to the incremental analog-to-digital conversion circuit and configured to collect the quantization error after the number of bits of the first data component reaches a preset threshold, and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one-bit data in the second data component; a second splicing circuit connected to the cyclic analog-to-digital conversion circuit and the first splicing circuit respectively and configured to splice the multiple conversion results to obtain the second data component and transmit the second data component to the first splicing circuit.

4. The temperature sensor according to claim 1, characterized in that, the analog-to-digital conversion circuit includes: a signal acquisition circuit connected to the analog front-end circuit and configured to acquire the input signal and the reference signal in the first analog-to-digital conversion mode; and acquire the quantization error in the second analog-to-digital conversion mode; a hybrid analog-to-digital conversion circuit connected to the signal acquisition circuit and the first splicing circuit respectively and configured to perform oversampling processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error, and transmit the first data component to the first splicing circuit and latch the quantization error; and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one-bit data in the second data component; A third splicing circuit, connected to the hybrid analog-to-digital conversion circuit and the first splicing circuit respectively, is configured to: splice a plurality of the conversion results in the second analog-to-digital conversion mode to obtain the second data component, and transmit the second data component to the first splicing circuit.

5. The temperature sensor according to claim 1, wherein, the temperature sensor further includes: a digital compensation circuit connected to the first splicing circuit; the digital compensation circuit is configured to: compensate the target data to obtain a temperature value.

6. A temperature sensing method, wherein, it includes: generating an input signal and a reference signal in response to a temperature change; performing quantization processing on the input signal based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; after the number of bits of the first data component reaches a preset threshold, performing quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component; splicing the first data component and the second data component to obtain a target data with a target conversion accuracy, where the preset threshold is related to the target conversion accuracy.

7. The temperature sensing method according to claim 6, wherein, the quantization processing of the input signal in the first analog-to-digital conversion mode includes: oversampling processing.

8. The temperature sensing method according to claim 6, wherein, the obtaining of the second data component by performing quantization processing on the quantization error in the second analog-to-digital conversion mode after the number of bits of the first data component reaches a preset threshold includes: acquiring the quantization error after the number of bits of the first data component reaches a preset threshold; performing multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain a plurality of conversion results; wherein each of the conversion results is a bit of data in the second data component; splicing the plurality of conversion results to obtain the second data component.

9. The temperature sensing method according to claim 6, wherein, after obtaining the target data, the temperature conversion method further includes: compensating the target data to obtain a temperature value.

10. A storage medium, wherein, a computer program is stored thereon, and when the computer program is executed by a processor, the steps of the temperature sensing method according to any one of claims 6 to 9 are implemented.

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