A CMU testing method, device and system

Abstract

The present invention provides a CMU testing method, device and system. The method includes: obtaining battery sampling chip information and testing requirements corresponding to the CMU to be tested; configuring a communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip, where the BMU simulator is used to simulate the functions of the BMU; configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the number of battery sampling chips and the configuration information of each battery sampling chip; generating a first test instruction based on the testing requirements; and sending the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol and sends it to the CMU to be tested for testing. The automated testing of the CMU is realized, the testing efficiency of the CMU is improved, the testing cost is reduced, corresponding test instructions are generated through different testing requirements, the testing flexibility is higher, and the functional testing is more comprehensive.

Description

Technical Field

[0001] The present invention relates to the technical field of batteries, and particularly to a CMU testing method, device and system. Background Art

[0002] A battery management system (BMS) mainly consists of a cell monitor unit (CMU) and a battery management unit (BMU). Among them, the CMU is responsible for measuring parameters such as the voltage, current and temperature of the battery, and also has functions such as balancing. The BMU is responsible for evaluating the data transmitted by the CMU. If the data is abnormal, it will protect the battery and also manage the power and temperature of the battery.

[0003] Currently, the battery modules use BMS integrated or split-type acquisition. For the split-type acquisition CMU, its flexibility is better than that of the integrated type. In actual applications, different manufacturers' battery sampling chips (Analog front end), referred to as AFE chips, are often used to design the CMU. The resulting problem is that in the production line test of the CMU, different BMUs need to be frequently replaced to test the functions and performances of CMUs of different AFE chip types. This manual testing method has low testing efficiency and also increases the testing cost due to the need to replace different BMUs. Summary of the Invention

[0004] In view of this, embodiments of the present invention provide a CMU testing method, device and system to overcome the problems of low testing efficiency and high testing cost in the manual testing of CMUs designed by AFE chips of different manufacturers in the prior art.

[0005] Embodiments of the present invention provide a CMU testing method, which is applied to a host computer. The method includes:

[0006] Obtain the battery sampling chip information and testing requirements corresponding to the CMU to be tested. The battery sampling chip information includes: the type, quantity of the battery sampling chip, and the configuration information of each battery sampling chip;

[0007] Configure the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip. The BMU simulator is used to simulate the functions of the BMU;

[0008] Configure the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chip and the configuration information of each battery sampling chip;

[0009] Generate a first test instruction based on the testing requirements;

[0010] Send the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol and sends it to the CMU to be tested for testing.

[0011] Optionally, the method further includes:

[0012] Receive the first test data sent by the BMU simulator, where the first test data is the test data obtained by the BMU after converting the second test data sent by the CMU to be tested according to the communication protocol;

[0013] Analyze the first test data to generate a test result corresponding to the CMU to be tested.

[0014] Optionally, the configuration information includes: the number of single cells actually connected to the battery sampling chip and the temperature channels actually used by the battery sampling chip. Based on the number of battery sampling chips and the configuration information of each battery sampling chip, configuring the corresponding acquisition channels of each battery sampling chip in the BMU simulator includes:

[0015] Based on the number of battery sampling chips, sequentially select the current battery sampling chip;

[0016] Obtain the number of single cells actually connected to the current battery sampling chip and the temperature channels actually used currently;

[0017] Configure the corresponding single cell acquisition channels of the current battery sampling chip in the BMU simulator according to the number of single cells actually connected currently;

[0018] Configure the corresponding temperature acquisition channels of the current battery sampling chip in the BMU simulator according to the temperature channels actually used currently

[0019] Optionally, the method further includes:

[0020] Record one or more of the communication protocol between the BMU simulator and the CMU to be tested, the corresponding acquisition channels of each battery sampling chip in the BMU simulator, the first test instruction, the first test data, and the test result.

[0021] An embodiment of the present invention further provides a CMU testing method, which is applied to a BMU simulator. The BMU simulator is used to simulate the functions of a BMU. The method includes:

[0022] Receive the first test instruction sent by the host computer. The first test instruction is for the host computer to obtain the battery sampling chip information and test requirements corresponding to the CMU to be tested. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip. Configure the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip. After configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip, generate a test instruction based on the test requirements.

[0023] Convert the first test instruction into a second test instruction according to the communication protocol.

[0024] Send the second test instruction to the CMU to be tested so that the CMU to be tested performs tests based on the second test instruction.

[0025] Optionally, the method further includes:

[0026] Receive the second test data sent by the CMU to be tested. The second test data is the test data generated by the CMU to be tested after performing tests based on the second test instruction.

[0027] Convert the second test data into the first test data according to the communication protocol.

[0028] Send the first test data to the host computer.

[0029] An embodiment of the present invention further provides a CMU test device, which is applied to a host computer. The device includes:

[0030] An acquisition module, configured to obtain the battery sampling chip information and test requirements corresponding to the CMU to be tested. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip.

[0031] A first processing module, configured to configure the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip. The BMU simulator is used to simulate the functions of the BMU.

[0032] A second processing module, configured to configure the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip.

[0033] A third processing module, configured to generate a first test instruction based on the test requirements.

[0034] A first sending module, configured to send the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol and sends the second test instruction to the CMU under test for testing.

[0035] An embodiment of the present invention further provides a CMU testing device, which is applied to a BMU simulator. The BMU simulator is used to simulate the functions of a BMU. The device includes:

[0036] A receiving module, configured to receive a first test instruction sent by a host computer. The first test instruction is that the host computer obtains battery sampling chip information and test requirements corresponding to the CMU under test. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; configuring a communication protocol between the BMU simulator and the CMU under test based on the type of the battery sampling chips; after configuring the acquisition channels corresponding to the battery sampling chips in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip, generating a test instruction based on the test requirements;

[0037] A fourth processing module, configured to convert the first test instruction into a second test instruction according to the communication protocol;

[0038] A second sending module, configured to send the second test instruction to the CMU under test, so that the CMU under test performs testing based on the second test instruction.

[0039] An embodiment of the present invention further provides a CMU testing system, including: a host computer and a BMU simulator. The BMU simulator is used to simulate the functions of a BMU. Among them,

[0040] The host computer is configured to obtain battery sampling chip information and test requirements corresponding to the CMU under test. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; configuring a communication protocol between the BMU simulator and the CMU under test based on the type of the battery sampling chips; configuring the acquisition channels corresponding to the battery sampling chips in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip; generating a first test instruction based on the test requirements; sending the first test instruction to the BMU simulator;

[0041] The BMU simulator is configured to receive the first test instruction sent by the host computer; convert the first test instruction into a second test instruction according to the communication protocol; send the second test instruction to the CMU under test, so that the CMU under test performs testing based on the second test instruction.

[0042] Optionally, the BMU simulator is further configured to receive second test data sent by the CMU under test, where the second test data is test data generated by the CMU under test after testing based on the second test instruction; convert the second test data into first test data according to the communication protocol; and send the first test data to the host computer.

[0043] The host computer is further configured to receive the first test data sent by the BMU simulator; analyze the first test data to generate a test result corresponding to the CMU under test.

[0044] The technical solution of the present invention has the following advantages:

[0045] The embodiment of the present invention provides a CMU testing method and device. By obtaining the battery sampling chip information and test requirements corresponding to the CMU under test, the battery sampling chip information includes: the type, quantity of the battery sampling chip, and the configuration information of each battery sampling chip; configuring the communication protocol between the BMU simulator and the CMU under test based on the type of the battery sampling chip, where the BMU simulator is used to simulate the functions of the BMU; configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip; generating a first test instruction based on the test requirements; and sending the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol and sends it to the CMU under test for testing. Thus, according to the information of the battery sampling chips that make up the CMU under test, the communication protocol between the BMU simulator and the CMU under test and the acquisition channels corresponding to each battery sampling chip configured in the BMU simulator are flexibly configured, enabling the BMU simulator to be flexibly used in the testing of CMUs designed with different battery sampling chips. By converting the test instruction sent by the host computer according to the configured communication protocol and then sending it to the CMU for testing, the automated testing of the CMU is realized, and there is no need to frequently replace the BMU, greatly improving the testing efficiency of the CMU, reducing the testing cost, and generating corresponding test instructions through different test requirements, with higher testing flexibility and more comprehensive functional testing.

[0046] An embodiment of the present invention also provides a CMU testing method and apparatus. By receiving a first test instruction sent by a host computer, the first test instruction is for the host computer to obtain battery sampling chip information and test requirements corresponding to the CMU to be tested. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; configuring the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chips; after configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip, generating a test instruction based on the test requirements; converting the first test instruction into a second test instruction according to the communication protocol; and sending the second test instruction to the CMU to be tested, so that the CMU to be tested performs tests based on the second test instruction. Thus, according to the information of the battery sampling chips that make up the CMU to be tested, the communication protocol between the BMU simulator and the CMU to be tested and the acquisition channels corresponding to each battery sampling chip configured in the BMU simulator are flexibly configured, enabling the BMU simulator to be flexibly used in the testing of CMUs designed with different battery sampling chips. By converting the test instruction sent by the host computer according to the configured communication protocol and then sending it to the CMU for testing, the automated testing of the CMU is realized, and there is no need to frequently replace the BMU, greatly improving the testing efficiency of the CMU, reducing the testing cost, and generating corresponding test instructions through different test requirements, with higher testing flexibility and more comprehensive functional testing.

[0047] An embodiment of the present invention further provides a CMU test system, including a host computer and a BMU simulator. The BMU simulator is used to simulate the functions of the BMU. Among them, the host computer is used to obtain the battery sampling chip information and test requirements corresponding to the CMU to be tested. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; based on the type of the battery sampling chips, configure the communication protocol between the BMU simulator and the CMU to be tested; based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip, configure the acquisition channels corresponding to each battery sampling chip in the BMU simulator; based on the test requirements, generate a first test instruction; send the first test instruction to the BMU simulator; the BMU simulator is used to receive the first test instruction sent by the host computer; convert the first test instruction into a second test instruction according to the communication protocol; send the second test instruction to the CMU to be tested, so that the CMU to be tested performs tests based on the second test instruction. Thus, according to the information of the battery sampling chips that make up the CMU to be tested, the communication protocol between the BMU simulator and the CMU to be tested and the acquisition channels corresponding to the configuration of each battery sampling chip in the BMU simulator can be flexibly configured, so that the BMU simulator can be flexibly used for the tests of CMUs designed by different battery sampling chips. By converting the test instructions sent by the host computer according to the configured communication protocol and then sending them to the CMU for testing, the automated testing of the CMU is realized, and there is no need to frequently replace the BMU, which greatly improves the test efficiency of the CMU, reduces the test cost, and generates corresponding test instructions through different test requirements, with higher test flexibility and more comprehensive functional testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0049] Figure 1 It is a schematic diagram of the CMU test system in the embodiment of the present invention;

[0050] Figure 2 It is a schematic diagram of the interaction process of the CMU test in the embodiment of the present invention;

[0051] Figure 3 It is a schematic diagram of the structure of the CMU test device in the embodiment of the present invention;

[0052] Figure 4 It is a schematic diagram of the structure of another CMU test device in the embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0053] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0054] The technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0055] The current battery module uses BMS integrated or split-type acquisition. For the split-type acquisition CMU, its flexibility is better than that of the integrated type. In practical applications, battery sampling chips (Analog front end), abbreviated as AFE chips, from different manufacturers are often used to design the CMU. The resulting problem is that different BMU need to be frequently replaced during the production offline test of the CMU to test the functions and performances of CMUs with different AFE chip types. This manual testing method has low testing efficiency and also increases the testing cost due to the need to replace different BMU.

[0056] Based on the above problems, the embodiments of the present invention provide a CMU testing system, as Figure 1 shown. The testing system includes: a host computer 1 and a BMU simulator 2, where the BMU simulator 2 is used to simulate the functions of the BMU.

[0057] Specifically, the host computer 1 is used to obtain the battery sampling chip information and testing requirements corresponding to the CMU 3 to be tested. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; configure the communication protocol between the BMU simulator 2 and the CMU 3 to be tested based on the type of the battery sampling chip; configure the acquisition channels corresponding to each battery sampling chip in the BMU simulator 2 based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip; generate a first test instruction based on the testing requirements; send the first test instruction to the BMU simulator 2; the BMU simulator 2 is used to receive the first test instruction sent by the host computer 1; convert the first test instruction into a second test instruction according to the communication protocol; and send the second test instruction to the CMU 3 to be tested, so that the CMU 3 to be tested performs tests based on the second test instruction.

[0058] Specifically, in the embodiment of the present invention, the above-mentioned host computer 1 is a control end for CMU testing, such as processors like CPU, single-chip microcomputer, etc. Testers can generate test cases, send test instructions, and view test results by operating on the host computer 1. The BMU simulator 2 is a functional simulation software for BMU. The host computer 1 can achieve the functions of BMU by performing corresponding configurations in this functional simulation software. It should be noted that other specific development methods of the functional simulation software for BMU can be implemented with reference to the design ideas of the functional simulation software for BMU in the prior art. The R & D process of the BMU simulator 2 is not the inventive point of the present invention and will not be elaborated here. The specific interaction process between the above-mentioned host computer 1 and the BMU simulator 2 is shown in Figure 2 the interaction schematic diagram as shown.

[0059] Specifically, in one embodiment, the BMU simulator 2 is further configured to receive second test data sent by the CMU 3 to be tested. The second test data is test data generated by the CMU 3 to be tested after testing based on the second test instruction; convert the second test data into first test data according to the communication protocol; send the first test data to the host computer 1; the host computer 1 is further configured to receive the first test data sent by the BMU simulator 2; analyze the first test data to generate a test result corresponding to the CMU 3 to be tested.

[0060] For a more detailed description of the above-mentioned host computer 1 and BMU simulator 2, refer to the relevant descriptions in the corresponding method embodiments below, which will not be elaborated here.

[0061] Through the collaborative cooperation of the above-mentioned various components, the CMU test system provided by the embodiment of the present invention can flexibly configure the communication protocol between the BMU simulator and the CMU to be tested and the corresponding acquisition channels of each battery sampling chip configured in the BMU simulator according to the information of the battery sampling chips that make up the CMU to be tested, so that the BMU simulator can be flexibly used for the testing of CMUs designed by different battery sampling chips. By converting the test instructions sent by the host computer according to the configured communication protocol and then sending them to the CMU for testing, the automated testing of the CMU is realized, and there is no need to frequently replace the BMU, which greatly improves the test efficiency of the CMU, reduces the test cost, and generates corresponding test instructions according to different test requirements, with higher test flexibility and more comprehensive functional testing.

[0062] The embodiment of the present invention also provides a CMU test method, which is applied to the host computer 1 and BMU simulator 2 as shown in Figure 1 wherein, as shown in Figure 2 the host computer 1 is configured to execute steps S101 to S105, and the BMU simulator 2 is configured to execute steps S201 to S203.

[0063] Step S101: Obtain the battery sampling chip information and test requirements corresponding to the CMU to be tested.

[0064] Among them, the battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip. Specifically, the above-mentioned configuration information includes: the number of single cells actually connected by the battery sampling chip and the temperature channels actually used by the battery sampling chip. The type of the battery sampling chip can be uniquely determined according to its product model. For example, the user inputs the specific model of the battery sampling chip as MC33771C, etc. through the host computer.

[0065] Step S102: Configure the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip.

[0066] Specifically, the BMU simulator is used to simulate the functions of the BMU. Since the communication protocols supported by different types of battery sampling chips, hereinafter referred to as AFE chips for short, are different, in order to achieve normal communication with the CMU, it is necessary to configure the communication protocol between the BMU simulator and the CMU to be tested according to the communication protocol supported by the AFE chip.

[0067] Step S103: Configure the corresponding acquisition channels of each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip.

[0068] Specifically, the quantity of AFE chips and the actual configuration information of AFE chips in different CMUs may not be the same. Therefore, by configuring the corresponding acquisition channels for each AFE chip in the BMU simulator, the same acquisition function as that of the BMU corresponding to the current CMU can be achieved. This acquisition channel is used to implement the test of the corresponding functions of the CMU.

[0069] The above Step S103 is specifically implemented through the following process:

[0070] Based on the quantity of the battery sampling chips, sequentially select the current battery sampling chip; obtain the number of single cells actually connected by the current battery sampling chip and the temperature channels actually used by the current battery sampling chip; configure the corresponding single cell acquisition channels of the current battery sampling chip in the BMU simulator according to the number of single cells actually connected; configure the corresponding temperature acquisition channels of the current battery sampling chip in the BMU simulator according to the temperature channels actually used.

[0071] Specifically, for the actual connection method of CMU monomers, confirm how many monomer cells are connected to each AFE chip and configure all the AFE channel information. After the configuration is completed, synchronize the configuration information to the BMU simulator through communication in the same way, so that the BMU simulator can access the CMU according to the configuration information. The configuration method of the temperature acquisition channel is similar to that of the monomer cell acquisition channel. For example, according to the enabled number of the temperature acquisition channels of the current AFE chip, configure the temperature acquisition channels correspondingly, and synchronize the final configuration information to the BMU simulator.

[0072] Step S104: Generate a first test instruction based on the test requirements.

[0073] Among them, the test requirements can be flexibly set according to user needs. It can be the verification of a certain CMU function or can also include multiple function tests at the same time. The present invention is not limited thereto. The above first test instruction is a function test instruction generated corresponding to the test requirements, such as: CELL monomer acquisition, temperature channel acquisition, balancing function, loopback function, wake-up and sleep function, power supply voltage acquisition of the chip, and so on.

[0074] Step S105: Send the first test instruction to the BMU simulator.

[0075] Specifically, encapsulate the first test instruction into a data frame in a specified format, and transmit the data frame containing the first test instruction to the BMU simulator through a pre-set communication method with the BMU simulator, such as wireless communication, serial communication, CAN communication, etc.

[0076] Step S201: Receive the first test instruction sent by the host computer.

[0077] Step S202: Convert the first test instruction into a second test instruction according to the communication protocol.

[0078] Among them, the communication protocol is the communication protocol configured by the host computer.

[0079] Step S203: Send the second test instruction to the CMU to be tested, so that the CMU to be tested conducts tests based on the second test instruction.

[0080] Specifically, the BMU simulator combines the first test instruction as valid data into a daisy-chain communication protocol frame of the CMU to be tested according to the communication protocol configured by the host computer. This daisy-chain communication protocol frame is the above-mentioned second test instruction. After receiving the daisy-chain communication protocol frame, the CMU can parse it according to the communication protocol and then execute relevant functions according to the parsed instructions, such as: collecting the temperature of the corresponding battery cell, etc.

[0081] By performing the above steps, the CMU testing method provided by the embodiments of the present invention can flexibly configure the communication protocol between the BMU simulator and the CMU to be tested and the corresponding acquisition channels of each battery sampling chip configured in the BMU simulator according to the information of the battery sampling chips that make up the CMU to be tested, so that the BMU simulator can be flexibly used in the testing of CMUs designed by different battery sampling chips. By converting the test instructions sent by the host computer according to the configured communication protocol and then sending them to the CMU for testing, the automated testing of the CMU is realized, and there is no need to frequently replace the BMU, which greatly improves the testing efficiency of the CMU, reduces the testing cost, and generates corresponding test instructions according to different testing requirements, with higher testing flexibility and more comprehensive functional testing.

[0082] Specifically, in one embodiment, as Figure 2 shown, the above-mentioned host computer 1 is further configured to execute steps S106 to S107, and the above-mentioned BMU simulator 2 is further configured to execute steps S204 to S206.

[0083] Step S204: Receive the second test data sent by the CMU to be tested.

[0084] Wherein, the second test data is the test data generated by the CMU to be tested based on the second test instruction. Exemplarily, when the second test instruction is a cell temperature acquisition instruction, the test data may be the corresponding cell temperature acquisition data. Specifically, the detailed process of generating the test data by the CMU to be tested based on the second test instruction is the prior art for performing corresponding functional tests on the CMU, and will not be elaborated herein.

[0085] Step S205: Convert the second test data into the first test data according to the communication protocol.

[0086] Specifically, by following the communication protocol between the BMU simulator and the CMU to be tested configured by the host computer, the second test data can be parsed and processed into the first test data. In practical applications, the second test data is the test data generated after the CMU completes the test, and then the test data is encapsulated in the form of a communication protocol frame as valid data and sent to the BMU simulator. The first test data is the test data generated after the CMU test.

[0087] Step S206: Send the first test data to the host computer.

[0088] Step S106: Receive the first test data sent by the BMU simulator.

[0089] Step S107: Analyze the first test data to generate the test result corresponding to the CMU to be tested.

[0090] By further processing and analyzing the test data through the host computer, the test results of the CMU to be tested can be obtained. Specifically, the method for the host computer to analyze the test data can adopt the method for analyzing and processing the test data obtained from the CMU test in the prior art, and can be specifically selected according to actual needs. The present invention is not limited thereto.

[0091] In addition, during the entire test process of the CMU, the embodiments of the present invention also record one or more of the communication protocol between the BMU simulator and the CMU to be tested, the acquisition channels corresponding to each battery sampling chip in the BMU simulator, the first test instruction, the first test data, and the test results, so as to provide a basis and reference for later problem analysis.

[0092] Next, the CMU test process provided by the embodiments of the present invention will be described in detail in combination with specific application examples.

[0093] 1. The user selects the AFE model of the CMU on the host computer panel and synchronizes it to the BMU simulator through a communication method, so that the BMU simulator can select the communication protocol with the CMU according to the configuration information of the AFE model.

[0094] 2. According to the actual connection method of the CMU cells, confirm how many single cells are connected to each AFE chip and configure all the AFE channel information (in the embodiments of the present invention, the maximum number of AFEs that can be configured is 10, only for example, and not limited thereto). After the configuration is completed, the configuration information is also synchronized to the BMU simulator through a communication method, so that the BMU simulator can access the CMU according to the configuration information. The configuration method of the temperature channel is the same as that of the single cell channel. After the configuration is completed, the information is then synchronized to the BMU simulator.

[0095] 3. All the configuration information and configuration processes will be recorded and saved, and the quick configuration restoration can be completed by reading the configuration of the software. When saving the data, the configuration information, etc. will be synchronized and saved.

[0096] 4. The BMU simulator can perform some function tests alone or automatically according to the instructions of the host computer, such as single cell acquisition, temperature channel acquisition, balancing function, loopback function, wake-up and sleep function, power supply voltage acquisition of the chip, etc. All the test process data will be synchronously recorded, and all the functions can generate corresponding codes according to the selection for use in the development of the real BMU. The generated test data can provide a basis and reference for later problem analysis.

[0097] The core purpose of the CMU test method provided by the embodiments of the present invention is to generate configuration code and functional verification code and be applicable to different AFE chips. It can be configured through the host computer, and the configuration information is synchronized to the BMU simulator (a dedicated hardware device), and then the simulator communicates and controls with the CMU. Different models of AFE chips can be configured according to different configurations of the CMU; the channels of the AFE can be configured according to the actual electrical connections; the configuration information can also be saved, and configuration code can be generated (for use in the actual BMU engineering code), and the data stream after configuration can be stored; the acquisition and diagnosis functions of the AFE can be actively verified according to the selection, and all data streams during the entire verification process will be automatically saved. Functional verification and diagnostic verification can also generate corresponding functional code for use in the actual BMU engineering code.

[0098] The embodiments of the present invention also provide a CMU test device, which is applied to a host computer as shown in Figure 1 shown, and as shown in Figure 3 shown, the CMU test device includes:

[0099] An acquisition module 101, configured to acquire battery sampling chip information and test requirements corresponding to the CMU to be tested, where the battery sampling chip information includes: the type, quantity of the battery sampling chip, and the configuration information of each battery sampling chip. For detailed content, refer to the relevant description of step S101 in the above method embodiment, and details will not be described herein again.

[0100] A first processing module 102, configured to configure the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip, where the BMU simulator is used to simulate the functions of the BMU. For detailed content, refer to the relevant description of step S102 in the above method embodiment, and details will not be described herein again.

[0101] A second processing module 103, configured to configure the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip. For detailed content, refer to the relevant description of step S103 in the above method embodiment, and details will not be described herein again.

[0102] A third processing module 104, configured to generate a first test instruction based on the test requirements. For detailed content, refer to the relevant description of step S104 in the above method embodiment, and details will not be described herein again.

[0103] A first sending module 105, configured to send the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol and sends it to the CMU to be tested for testing. For detailed content, refer to the relevant description of step S105 in the above method embodiment, and details will not be described herein again.

[0104] Through the collaborative cooperation of the above-mentioned various components, the CMU test device provided by the embodiment of the present invention can flexibly configure the communication protocol between the BMU simulator and the CMU to be tested and the corresponding acquisition channels of each battery sampling chip configured in the BMU simulator according to the information of the battery sampling chips that make up the CMU to be tested, so that the BMU simulator can be flexibly used in the test of CMUs designed by different battery sampling chips. By converting the test instructions sent by the host computer according to the configured communication protocol and then sending them to the CMU for testing, the automated testing of the CMU is realized, and there is no need to frequently replace the BMU, which greatly improves the test efficiency of the CMU, reduces the test cost, and generates corresponding test instructions according to different test requirements, with higher test flexibility and more comprehensive functional testing.

[0105] The further function descriptions of the above-mentioned various modules are the same as those in the corresponding method embodiments above, and will not be elaborated here.

[0106] The embodiment of the present invention also provides a CMU test device, which is applied to the BMU simulator as shown in Figure 1 and as shown in Figure 4 The CMU test device includes:

[0107] A receiving module 201, configured to receive a first test instruction sent by a host computer. The first test instruction is that the host computer obtains the battery sampling chip information and test requirements corresponding to the CMU to be tested. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; configuring the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chips; after configuring the corresponding acquisition channels of each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip, generating a test instruction based on the test requirements. For the detailed content, refer to the relevant description of step S201 in the above method embodiment, and will not be elaborated here.

[0108] A fourth processing module 202, configured to convert the first test instruction into a second test instruction according to the communication protocol. For the detailed content, refer to the relevant description of step S202 in the above method embodiment, and will not be elaborated here.

[0109] A second sending module 203, configured to send the second test instruction to the CMU to be tested, so that the CMU to be tested performs tests based on the second test instruction. For the detailed content, refer to the relevant description of step S203 in the above method embodiment, and will not be elaborated here.

[0110] Through the collaborative cooperation of the above-mentioned various components, the CMU test device provided by the embodiment of the present invention flexibly configures the communication protocol between the BMU simulator and the CMU to be tested and the corresponding acquisition channels of each battery sampling chip configured in the BMU simulator according to the information of the battery sampling chips that make up the CMU to be tested, so that the BMU simulator can be flexibly used for the testing of CMUs designed by different battery sampling chips. By converting the test instructions sent by the host computer according to the configured communication protocol and then sending them to the CMU for testing, the automated testing of the CMU is realized, and there is no need to frequently replace the BMU, which greatly improves the testing efficiency of the CMU, reduces the testing cost, and generates corresponding test instructions according to different testing requirements, with higher testing flexibility and more comprehensive functional testing.

[0111] The further function descriptions of the above-mentioned various modules are the same as those in the corresponding method embodiments described above, and will not be repeated here.

[0112] Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations fall within the scope defined by the appended claims.

Claims

1. A CMU testing method, applied to a host computer, characterized in that, The method includes: Obtaining battery sampling chip information and test requirements corresponding to the CMU to be tested, where the battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; Configuring the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip, where the BMU simulator is used to simulate the functions of the BMU; Configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip; Generating a first test instruction based on the test requirements; Sending the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol and sends it to the CMU to be tested for testing; The configuration information includes: the number of single cells actually connected to the battery sampling chip and the temperature channels actually used by the battery sampling chip. Configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip includes: Sequentially selecting the current battery sampling chip based on the quantity of the battery sampling chips; Obtaining the number of single cells actually connected to the current battery sampling chip and the temperature channels actually used by the current battery sampling chip; Configuring the single cell acquisition channel corresponding to the current battery sampling chip in the BMU simulator according to the number of single cells actually connected; Configuring the temperature acquisition channel corresponding to the current battery sampling chip in the BMU simulator according to the temperature channels actually used.

2. The method according to claim 1, characterized in that, It further includes: Receiving the first test data sent by the BMU simulator, where the first test data is the test data obtained by the BMU after converting the second test data sent by the CMU to be tested according to the communication protocol; Analyzing the first test data to generate the test result corresponding to the CMU to be tested.

3. The method according to claim 2, characterized in that, It further includes: Recording one or more of the communication protocol between the BMU simulator and the CMU to be tested, the acquisition channels corresponding to each battery sampling chip in the BMU simulator, the first test instruction, the first test data, and the test result.

4. A CMU testing method, applied to a BMU simulator, where the BMU simulator is used to simulate the functions of a BMU, characterized in that, The method includes: Receiving the first test instruction sent by the host computer, where the first test instruction is the test instruction generated by the host computer after obtaining the battery sampling chip information and test requirements corresponding to the CMU to be tested, where the battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; configuring the communication protocol between the BMU simulator and the CMU to be tested based on the type of the battery sampling chip; and configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip, and then based on the test requirements; Converting the first test instruction into a second test instruction according to the communication protocol; Send the second test instruction to the CMU under test, so that the CMU under test performs tests based on the second test instruction.

5. The method according to claim 4, characterized in that It further includes: Receive the second test data sent by the CMU under test, where the second test data is the test data generated by the CMU under test after performing tests based on the second test instruction; Convert the second test data into first test data according to the communication protocol; Send the first test data to the host computer.

6. A CMU test device is applied to a host computer, characterized in that, The device includes: An acquisition module, configured to acquire battery sampling chip information and test requirements corresponding to the CMU under test, where the battery sampling chip information includes: the type, quantity of the battery sampling chip, and the configuration information of each battery sampling chip; A first processing module, configured to configure the communication protocol between the BMU simulator and the CMU under test based on the type of the battery sampling chip, where the BMU simulator is used to simulate the functions of the BMU; A second processing module, configured to configure the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip; the configuration information includes: the number of single-cell batteries actually connected to the battery sampling chip and the temperature channels actually used by the battery sampling chip. Configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip includes: sequentially selecting the current battery sampling chip based on the quantity of the battery sampling chips; acquiring the number of single-cell batteries actually connected to the current battery sampling chip and the temperature channels actually used by the current battery sampling chip; configuring the single-cell battery acquisition channels corresponding to the current battery sampling chip in the BMU simulator according to the number of single-cell batteries actually connected; configuring the temperature acquisition channels corresponding to the current battery sampling chip in the BMU simulator according to the temperature channels actually used. A third processing module, configured to generate a first test instruction based on the test requirements; A first sending module, configured to send the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol and sends it to the CMU under test for testing.

7. A CMU test device is applied to a BMU simulator, and the BMU simulator is used to simulate the functions of a BMU. It is characterized in that, The device includes: A receiving module, configured to receive the first test instruction sent by the host computer, where the first test instruction is a test instruction generated by the host computer after acquiring the battery sampling chip information and test requirements corresponding to the CMU under test, where the battery sampling chip information includes: the type, quantity of the battery sampling chip, and the configuration information of each battery sampling chip; configuring the communication protocol between the BMU simulator and the CMU under test based on the type of the battery sampling chip; and configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip; A fourth processing module, configured to convert the first test instruction into a second test instruction according to the communication protocol; A second sending module, configured to send the second test instruction to the CMU under test, so that the CMU under test performs tests based on the second test instruction.

8. A CMU test system, characterized in that, Comprising: A host computer and a BMU simulator, where the BMU simulator is used to simulate the functions of the BMU. Among them, The host computer is configured to obtain the battery sampling chip information and test requirements corresponding to the CMU under test. The battery sampling chip information includes: the type, quantity of the battery sampling chips, and the configuration information of each battery sampling chip; configure the communication protocol between the BMU simulator and the CMU under test based on the type of the battery sampling chip; configure the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip; generate a first test instruction based on the test requirements; send the first test instruction to the BMU simulator; the configuration information includes: the number of single cells actually connected to the battery sampling chip and the temperature channels actually used by the battery sampling chip. Configuring the acquisition channels corresponding to each battery sampling chip in the BMU simulator based on the quantity of the battery sampling chips and the configuration information of each battery sampling chip includes: sequentially selecting the current battery sampling chip based on the quantity of the battery sampling chips; obtaining the number of single cells actually connected to the current battery sampling chip and the temperature channels actually used by the current battery sampling chip; configuring the single cell acquisition channel corresponding to the current battery sampling chip in the BMU simulator according to the number of single cells actually connected; configuring the temperature acquisition channel corresponding to the current battery sampling chip in the BMU simulator according to the temperature channels actually used. The BMU simulator is configured to receive the first test instruction sent by the host computer; convert the first test instruction into a second test instruction according to the communication protocol; send the second test instruction to the CMU under test, so that the CMU under test performs tests based on the second test instruction.

9. The CMU test system according to claim 8, wherein The BMU simulator is further configured to receive the second test data sent by the CMU under test, where the second test data is the test data generated by the CMU under test after performing tests based on the second test instruction; convert the second test data into the first test data according to the communication protocol; send the first test data to the host computer; The host computer is further configured to receive the first test data sent by the BMU simulator; analyze the first test data to generate the test result corresponding to the CMU under test.

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