Circuit board electrical testing fixture and electrical tester

Abstract

The application provides a circuit board electrical test clamp and an electrical tester. The circuit board electrical test clamp comprises a fixing assembly and an electrical test assembly. The fixing assembly comprises an insulating plate and a plurality of insulating pieces, and the plurality of insulating pieces are connected with the insulating plate. The electrical test assembly comprises an electrical test lead wire and a plurality of electrical test conductive pieces, and the plurality of electrical test conductive pieces are connected with the insulating plate. The ends of the plurality of electrical test conductive pieces away from the insulating plate are used for abutting against electrical test positions on a to-be-tested circuit board. The electrical test lead wire is connected with at least two electrical test conductive pieces. At least one electrical test conductive piece is used for being connected with an external detection device to turn on the electrical test conductive pieces connected with the electrical test lead wire. Some electrical test conductive pieces correspond to the electrical test positions on the to-be-tested circuit board. The electrical test lead wire connects the electrical test conductive pieces corresponding to the electrical test positions, avoids welding copper wires on the electrical test positions of the circuit board, reduces the scrap rate of the to-be-tested circuit board, and effectively reduces the test cost of the to-be-tested circuit board.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit boards, and in particular to a circuit board electrical testing fixture and an electrical testing instrument. Background Art

[0002] With the rapid development of printed circuit board technology, integrated PCBs have become the mainstream, with circuit boards manufactured according to specific circuit diagrams. After production, PCBs are sampled and tested for their high-voltage resistance. This testing primarily aims to verify the insulation properties of the board material and the adequacy of spacing between the wires. Currently, specialized machines are used within the industry to test PCBs for high-voltage resistance. Multiple test locations on the board are connected by soldering copper wires for rapid testing.

[0003] However, traditional testing is a destructive test. Moreover, after the test is completed, the circuit board is directly scrapped, resulting in waste of the circuit board, which in turn leads to an increase in the testing cost of the circuit board, and further leads to excessively high production costs of the circuit board. Summary of the Invention

[0004] The purpose of the present invention is to overcome the deficiencies in the prior art and provide a circuit board electrical testing fixture and an electrical tester that effectively reduce testing costs.

[0005] The object of the present invention is achieved through the following technical solutions:

[0006] A circuit board electrical testing fixture comprises: a fixing assembly and an electrical testing assembly; the fixing assembly comprises an insulating plate and a plurality of insulating members, the plurality of insulating members being connected to the insulating plate, a fixed space being formed between the plurality of insulating members, the fixed space being used to accommodate a circuit board to be tested, so that the plurality of insulating members can jointly clamp the circuit board to be tested; the electrical testing assembly comprises an electrical testing wire and a plurality of electrical testing conductive members, the plurality of electrical testing conductive members being connected to the insulating plate, the ends of the plurality of electrical testing conductive members being remote from the insulating plate being used to abut against electrical testing points on the circuit board to be tested, the electrical testing wire being connected to at least two of the electrical testing conductive members, wherein at least one of the electrical testing conductive members is used to connect to an external testing device to conduct electricity to the electrical testing conductive members connected to the electrical testing wire.

[0007] In one embodiment, the distance that the electrically conductive member protrudes from the insulating plate is smaller than the distance that the insulating member protrudes from the insulating plate.

[0008] In one embodiment, the electrical measuring component further includes a plurality of auxiliary support columns, each of which is connected to the insulating plate. The plurality of auxiliary support columns and the plurality of electrical measuring conductive parts jointly support the circuit board to be tested, and at least one of the auxiliary support columns is arranged away from each of the electrical measuring conductive parts.

[0009] In one embodiment, a plurality of auxiliary support column arrays are distributed on the insulating plate.

[0010] In one embodiment, the electrical measuring conductive member includes an electrical measuring conductive body and an electrical measuring support portion, the electrical measuring conductive body is connected to the insulating plate, the electrical measuring support portion abuts against the circuit board to be tested, the electrical measuring support portion is located on a side of the electrical measuring conductive body away from the insulating plate, and the electrical measuring support portion is movably connected to the electrical measuring conductive body so that the electrical measuring support portion moves away from or close to the insulating plate.

[0011] In one embodiment, the insulating plate is provided with a plurality of through holes, each of which is provided with an electrical conductive body, and at least one electrical conductive body is located at an end of the insulating plate away from the circuit board to be tested for connection with an external testing device.

[0012] In one embodiment, the fixing assembly further includes a sealing splint, a sealing ring, a connecting bolt and an external wire. The sealing splint is located on the side of the insulating plate away from the circuit board to be tested, the connecting bolt is respectively connected to the sealing splint and the insulating plate, the sealing ring is located between the sealing splint and the insulating plate, the sealing ring is respectively in contact with the sealing splint and the insulating plate, the sealing ring is provided with a lead hole, the external wire is passed through the lead hole, one end of the external wire is connected to one of the electrical conductive bodies, and the other end of the external wire is used to connect to an external detection device.

[0013] In one embodiment, the electrical conductive body includes an electrical block and an electrical spring connected to each other, the electrical block is connected to the insulating plate, the electrical support portion is located on a side of the electrical spring away from the electrical block, and the electrical support portion is connected to the electrical spring.

[0014] In one embodiment, the electrical testing block is provided with a guide groove, the opening of the guide groove faces the circuit board to be tested, the electrical testing spring is located in the guide groove, and part of the electrical testing support portion is movably arranged in the guide groove.

[0015] An electrical tester comprises the circuit board electrical testing fixture described in any one of the above embodiments.

[0016] Compared with the prior art, the present invention has at least the following advantages:

[0017] Part of the electrically conductive member corresponds to the electrically measured position on the circuit board to be measured, and the electrically conductive member is connected with the electrically measured position by the electrically conductive wire, thereby avoiding the soldering of copper wire on each electrically measured position of the circuit board, reducing the scrap rate of the circuit board to be measured, and effectively reducing the testing cost of the circuit board to be measured. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiments will be briefly introduced as follows. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor.

[0019] Figure 1 Fig. 1 is a schematic diagram of a circuit board electrically measured fixture in an embodiment;

[0020] Figure 2 Fig. 2 is a schematic diagram of an electrically conductive member of the circuit board electrically measured fixture shown in Fig. 1; Figure 1

[0021] Figure 3 Fig. 3 is an enlarged schematic diagram of the electrically conductive member at A1 shown in Fig. 2; Figure 2

[0022] Figure 4 Fig. 4 is an enlarged schematic diagram of the electrically conductive member at A2 shown in Fig. 2. Figure 2 DETAILED DESCRIPTION In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the accompanying drawings. The preferred embodiments of the present application are shown in the drawings. However, the present application can be implemented in many different forms, and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0023] It should be noted that when an element is referred to as being "fixed" to another element, it can be directly on the other element or there can be an intervening element. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or there can be an intervening element. The terms "vertical", "horizontal", "left", "right", and similar expressions used herein are for illustrative purposes only and are not intended to be the only implementation.

[0024] It should be noted that when an element is referred to as being "fixed" to another element, it can be directly on the other element or there can be an intervening element. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or there can be an intervening element. The terms "vertical", "horizontal", "left", "right", and similar expressions used herein are for illustrative purposes only and are not intended to be the only implementation.

[0025] ​​Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this invention pertains. The terms used herein in the specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0026] The present invention relates to a circuit board electrical testing fixture. In one embodiment, the circuit board electrical testing fixture includes a fixing component and an electrical testing component. The fixing component includes an insulating plate and a plurality of insulating parts. The plurality of insulating parts are connected to the insulating plate, and a fixed space is formed between the plurality of insulating parts. The fixed space is used to accommodate the circuit board to be tested so that the plurality of insulating parts can jointly clamp the circuit board to be tested. The electrical testing component includes an electrical testing wire and a plurality of electrical testing conductive parts. The plurality of electrical testing conductive parts are connected to the insulating plate, and the ends of the plurality of electrical testing conductive parts away from the insulating plate are used to abut against the electrical testing position on the circuit board to be tested. The electrical testing wire is connected to at least two of the electrical testing conductive parts. At least one of the electrical testing conductive parts is used to connect to an external detection device to conduct electricity to the electrical testing conductive parts connected to the electrical testing wire. Some electrical measuring conductive parts correspond to electrical measuring positions on the circuit board to be tested, and the electrical measuring wires are connected to the electrical measuring conductive parts corresponding to the electrical measuring positions, thereby avoiding the need to weld copper wires on the electrical measuring positions of the circuit board, reducing the probability of scrapping the circuit board to be tested, and effectively reducing the testing cost of the circuit board to be tested.

[0027] See also Figure 1 , which is a structural diagram of a circuit board electrical testing fixture according to an embodiment of the present invention.

[0028] A circuit board electrical testing fixture 10 according to one embodiment includes a fixing assembly 100 and an electrical testing assembly 200. The fixing assembly 100 includes an insulating plate 110 and multiple insulating members 120. The multiple insulating members 120 are connected to the insulating plate 110, with a fixed space 122 formed between the multiple insulating members 120. The fixed space 122 is used to accommodate the circuit board under test, so that the multiple insulating members 120 can jointly clamp the circuit board under test. The electrical testing assembly 200 includes an electrical testing wire 210 and multiple electrical testing conductive members 220. The multiple electrical testing conductive members 220 are connected to the insulating plate 110, with one end of each of the multiple electrical testing conductive members 220 facing away from the insulating plate 110 being designed to abut against an electrical testing point on the circuit board under test. The electrical testing wire 210 is connected to at least two of the electrical testing conductive members 220. At least one of the electrical testing conductive members 220 is designed to connect to an external testing device to provide electrical continuity between the electrical testing conductive members 220 connected to the electrical testing wire 210.

[0029] In this embodiment, some electrical testing conductive elements 220 correspond to electrical testing locations on the circuit board under test. Electrical testing wires 210 connect to the electrical testing conductive elements 220 corresponding to the testing locations, eliminating the need to solder copper wires to each testing location on the circuit board. This reduces the likelihood of scrapping the circuit board under test and effectively lowers the testing cost of the circuit board under test. The electrical testing signal transmitted by the external testing device through the electrical testing conductive elements 220 can be a single-wire control signal or a two-wire power supply signal.

[0030] In another embodiment, some of the plurality of electrical testing conductive members 220 correspond to electrical testing locations on the circuit board under test, while the remaining electrical testing conductive members 220 support the circuit board under test. Furthermore, the electrical testing conductive members 220 used to support the circuit board under test are not connected to the electrical testing wires 210. In this way, for circuit boards under test with different electrical testing locations, electrical testing can be performed on different circuit boards simply by adjusting the electrical testing conductive members 220 connected to the electrical testing wires 210, thereby improving the electrical testing adaptability of the circuit board electrical testing fixture.

[0031] In one embodiment, see Figure 1The distance that the electrically conductive member 220 protrudes from the insulating plate 110 is less than the distance that the insulating member 120 protrudes from the insulating plate 110. In this embodiment, the electrically conductive member 220 serves as a supporting component and a conductive component for the circuit board under test. The end of the electrically conductive member 220 away from the insulating plate 110 supports the circuit board under test. Furthermore, the end of the electrically conductive member 220 away from the insulating plate 110 abuts against an electrical side of the circuit board under test, facilitating transmission of an electrical signal to the circuit board under test via the electrically conductive member 220, thereby facilitating electrical performance testing of the circuit board under test. The electrically conductive member 220 and the insulating member 120 both protrude from the insulating plate 110 and are located on the same side of the insulating plate 110, i.e., the electrically conductive member 220 and the insulating member 120 protrude from the insulating plate 110 in the same direction. The distance that the electrically conductive member 220 protrudes from the insulating plate 110 is less than the distance that the insulating member 120 protrudes from the insulating plate 110, indicating that the height of the electrically conductive member 220 on the insulating plate 110 is less than the height of the insulating member 120 on the insulating plate 110, that is, the electrically conductive member 220 is lower than the insulating member 120 on the insulating plate 110. In this way, when the circuit board to be tested is placed in the fixed space 122, the circuit board to be tested can be clamped by each insulating member 120 to improve the stability of the circuit board to be tested on the circuit board electrical testing fixture, and the electrical testing position on the circuit board to be tested can also be aligned with the electrically conductive member 220 connected to the external testing equipment, so as to facilitate electrical testing of the circuit board to be tested.

[0032] In one embodiment, see Figure 1The electrical testing assembly 200 further includes a plurality of auxiliary support columns 230, each of which is connected to the insulating plate 110. The plurality of auxiliary support columns 230 and the plurality of electrical testing conductive members 220 jointly support the circuit board under test, with at least one auxiliary support column 230 disposed away from each of the electrical testing conductive members 220. In this embodiment, in addition to the electrical testing conductive members 220 supporting the circuit board under test, the insulating plate 110 also includes a plurality of auxiliary support columns 230. The plurality of auxiliary support columns 230 protrude in the same direction as the electrical testing conductive members 220. The plurality of auxiliary support columns 230 assist the electrical testing conductive members 220 in supporting the circuit board under test, thereby further stabilizing the circuit board under test on the circuit board electrical testing fixture. In another embodiment, a plurality of the auxiliary support columns 230 are distributed in an array on the insulating plate 110. For example, there is at least one auxiliary support column 230 corresponding to each of the four corners of the circuit board to be tested, so that the circuit board to be tested is subjected to uniform force, further improving the stability of the circuit board to be tested on the circuit board electrical testing fixture.

[0033] In one embodiment, see Figure 2 The electrical conductive member 220 includes an electrical conductive body 222 and an electrical support portion 224. The electrical conductive body 222 is connected to the insulating plate 110, and the electrical support portion 224 abuts the circuit board under test. The electrical support portion 224 is located on the side of the electrical conductive body 222 away from the insulating plate 110. The electrical support portion 224 is movably connected to the electrical conductive body 222 to allow the electrical support portion 224 to move away from or toward the insulating plate 110. In this embodiment, both the electrical conductive body 222 and the electrical support portion 224 are made of conductive material to facilitate electrical connection between the circuit board under test and external testing equipment. The electrically conductive body 222 is movably connected to the electrically conductive support portion 224. The electrically conductive body 222 is disposed on the insulating plate 110, facilitating movement of the electrically conductive support portion 224 relative to the electrically conductive body 222. For example, the electrically conductive support portion 224 can move away from or toward the insulating plate 110, thereby extending and retracting the electrically conductive support portion 224 relative to the electrically conductive body 222. The height of the electrically conductive member 220 protruding from the insulating plate 110 is equal to the height of the insulating member 120 protruding from the insulating plate 110. When the circuit board under test is placed on the electrically conductive member 220, the electrically conductive support portion 224 contracts due to the pressure from the circuit board under test, facilitating the retention of the circuit board under test within the fixed space 122.

[0034] Furthermore, the insulating plate is provided with a plurality of through-holes, each of which is provided with an electrically conductive body. At least one electrically conductive body is located on the end of the insulating plate facing away from the circuit board under test for connection to external testing equipment. In this embodiment, each electrically conductive body is provided within a corresponding through-hole, so that each electrically conductive body has a protruding portion on both sides of the insulating plate. Specifically, a portion of the electrically conductive body is located on the side of the insulating plate facing away from the circuit board under test. This facilitates connecting a connecting wire of an external testing device to the electrically conductive body on the side of the insulating plate facing away from the circuit board under test, thereby facilitating connection between the electrically conductive body and the external testing equipment and reducing the difficulty of wiring between the electrically conductive body and the external testing equipment.

[0035] For further information, see Figure 1 The fixing assembly 100 further includes a sealing clamping plate 130, a sealing ring (not shown), a connecting bolt 140, and an external wire 150. The sealing clamping plate 130 is located on the side of the insulating plate 110 away from the circuit board to be tested. The connecting bolt 140 is respectively connected to the sealing clamping plate 130 and the insulating plate 110. The sealing ring is located between the sealing clamping plate 130 and the insulating plate 110. The sealing ring is respectively in contact with the sealing clamping plate 130 and the insulating plate 110. The sealing ring is provided with a lead hole, and the external wire 150 is passed through the lead hole. One end of the external wire 150 is connected to one of the electrical conductive bodies 222, and the other end of the external wire 150 is used to connect to an external detection device. In this embodiment, the sealing clamp 130 is positioned opposite the insulating plate 110 and is located on the side of the insulating plate 110 facing away from the circuit board under test. A sealed space is formed between the sealing clamp 130 and the insulating plate 110, facilitating sealing of the portion of the electrically conductive body 222 located on the side of the insulating plate 110 facing away from the circuit board under test within the sealed space. The sealing ring seals the sealed space, preventing moisture and dust from the outside air from corroding the portion of the electrically conductive body 222 located on the side of the insulating plate 110 facing away from the circuit board under test. Furthermore, the portion of the electrically conductive body 222 located on the side of the insulating plate 110 facing away from the circuit board under test is connected to the external lead 150, facilitating positioning of the connection point between external testing equipment and the electrically conductive member 220 within the sealed space.

[0036] In one embodiment, see Figure 2The electric measurement conducting body 222 comprises electric measurement blocks 2222 connected to each other and electric measurement springs 2224, the electric measurement supporting parts 224 are located on the side of the electric measurement springs 2224 away from the electric measurement blocks 2222, and the electric measurement supporting parts 224 are connected to the electric measurement springs 2224. In the embodiment, the electric measurement blocks 2222 are arranged in the through holes so that the electric measurement blocks 2222 are clamped on the insulating plates 110, the electric measurement springs 2224 are connected to the electric measurement blocks 2222 and the electric measurement supporting parts 224 respectively, and the deformation displacement distance is provided for the expansion and contraction of the electric measurement supporting parts 224, so that the electric measurement supporting parts 224 are extended or contracted relative to the insulating plates 110, wherein the electric measurement blocks 2222 are electrically conductive blocks, i.e. the material of the electric measurement blocks 2222 is electrically conductive, and the electric measurement blocks 2222 are used to be connected to external detection equipment. The material of the electric measurement springs 2224 is also electrically conductive.

[0037] Further, referring to Figure 2 The electric measurement blocks 2222 are provided with guide grooves 2226, the openings of the guide grooves 2226 face the to-be-measured circuit boards, the electric measurement springs 2224 are located in the guide grooves 2226, and part of the electric measurement supporting parts 224 is movably arranged in the guide grooves 2226. In the embodiment, part of the electric measurement supporting parts 224 and the electric measurement springs 2224 are placed in the guide grooves 2226, part of the electric measurement supporting parts 224 slides in the guide grooves 2226, the electric measurement supporting parts 224 slide along the inner walls of the guide grooves 2226, the electric measurement supporting parts 224 are expanded and contracted along the opening direction of the guide grooves 2226, so that the expansion and contraction direction of the electric measurement supporting parts 224 is limited, and the electric measurement supporting parts 224 are aligned with the electric measurement positions on the to-be-measured circuit boards.

[0038] It can be understood that the electric measurement conducting part 220 is used as a telescopic needle to abut against the electric measurement position when the to-be-measured circuit board is placed thereon, i.e. the electric measurement conducting part 220 abuts against the pads of the electric measurement position on the to-be-measured circuit board, so that the external detection equipment provides an electric measurement signal to the to-be-measured circuit board through the electric measurement conducting part 220. After the electric measurement supporting parts 224 are extruded by the to-be-measured circuit board, the electric measurement springs 2224 are extruded, so that the electric measurement springs 2224 are contracted, the number of the electric measurement supporting parts 224 entering the guide grooves 2226 is increased, and the to-be-measured circuit board is clamped by the insulating parts 120.

[0039] However, the electrical measurement support portion 224 needs to extend and retract within the guide groove 2226, and the electrical measurement support portion 224 and the inner wall of the guide groove 2226 often rub against each other, which can easily cause wear of at least one of the electrical measurement support portion 224 and the electrical measurement block 2222, thereby easily causing the distance between the electrical measurement support portion 224 and the inner wall of the guide groove 2226 to increase, and further easily causing the electrical measurement support portion 224 to deviate within the guide groove 2226, thereby reducing the alignment accuracy between the electrical measurement support portion 224 and the electrical measurement position on the circuit board to be tested, thereby resulting in poor detection accuracy.

[0040] In order to improve the alignment accuracy between the electrical test support portion 224 and the electrical test position on the circuit board to be tested, please refer to Figure 2The electrical measurement support part 224 includes a support shell 2242, a pushing rod 2244 and at least two stabilizing springs 2246. At least a portion of the support shell 2242 is located in the guide groove 2226. The support shell 2242 has a receiving groove 2248. The opening direction of the receiving groove 2248 is arranged opposite to the opening direction of the guide groove 2226. At least a portion of the pushing rod 2244 is located in the receiving groove 2248. The pushing rod 2244 is respectively connected to the support shell 2242 and the electrical measurement spring 2224. At least two stabilizing springs 2246 are respectively located on both sides of the pushing rod 2244. Each stabilizing spring 2246 is respectively connected to the pushing rod 2244 and the side wall of the receiving groove 2248. In this embodiment, the support shell 2242 moves in the guide groove 2226, that is, the support shell 2242 extends and retracts under the guidance of the guide groove 2226, one end of the pushing rod 2244 abuts against the support shell 2242, and the other end of the pushing rod 2244 is connected to the electric measuring spring 2224. With the help of the abutment between the pushing rod 2244 and the support shell 2242, the electric measuring spring 2224 facilitates pushing the support shell 2242 closer to or away from the insulating plate 110, wherein the material of the pushing rod 2244, the support shell 2242 and the stabilizing spring 2246 are all conductive materials, which facilitates electrical communication between the support shell 2242 and the electric measuring block 2222. At least one stabilizing spring 2246 is disposed on each side of the push rod 2244. For example, a stabilizing spring 2246 is disposed on two opposing sides of the push rod 2244. The two ends of each stabilizing spring 2246 abut against the push rod 2244 and the sidewalls of the receiving groove 2248. Thus, under the action of the stabilizing spring 2246, the force on the push rod 2244 is uniform, so that the sidewalls of the receiving groove 2248 are uniformly stressed. Furthermore, the elastic force on the sidewalls of the receiving groove 2248 is directed toward the sidewalls of the guide groove 2226, thereby facilitating the stable placement of the support shell 2242 within the guide groove 2226. This reduces the possibility of the electrical test support portion 224 tilting within the guide groove 2226, and improves the alignment accuracy between the electrical test support portion 224 and the electrical test position on the circuit board under test. Among them, since the electric measuring spring 2224 pushes the support shell 2242 through the pushing rod 2244, the support shell 2242, the pushing rod 2244 and each of the stabilizing springs 2246 remain relatively stationary, reducing the uniformity and direction consistency of the elastic force generated by the stabilizing spring 2246, and ensuring that the support shell 2242 is stably supported on the side wall of the guide groove 2226.

[0041] Furthermore, because the electrical testing spring 2224 serves as both the elastic force providing member and the electrical testing conductive member 220, during electrical testing, the circuit board under test compresses the electrical testing spring 2224, and a corresponding current flows through the electrical testing spring 2224. If the electrical testing spring 2224 is excessively contracted for a long time while current flows through it, that is, if the electrical testing spring 2224 is subjected to excessive pressure and excessive heat for a long time, metal fatigue may occur in the electrical testing spring 2224, which may lead to damage to the electrical testing spring 2224, affecting the retractable height of the support shell 2242 and thus affecting the accuracy of testing the circuit board under test.

[0042] To reduce the chance of damage to the electric test spring 2224, please refer to Figure 3 The electrical measurement support portion 224 further includes a separation ring 2241 connected to the support shell 2242. The separation ring 2241 is located on the outer wall of the support shell 2242 and has a separation slope 2243. The separation slope 2243 is inclined away from the electrical measurement block 2222 and is configured to slide against the sidewall of the guide groove 2226. In this embodiment, the separation ring 2241 protrudes from the outer wall of the support shell 2242 and is used to separate the electrical measurement block 2222 from the support shell 2242. The separation bevel 2243 on the separation convex ring 2241 has an inclined angle. In the direction approaching the electric measuring block 2222, the distance between the separation bevel 2243 and the outer wall of the support shell 2242 gradually decreases, so that when the separation convex ring 2241 enters the guide groove 2226, the separation bevel 2243 pushes the electric measuring block 2222 away, so that the outer wall of the support shell 2242 is out of contact with the side wall of the guide groove 2226, thereby disconnecting the electrical connection between the support shell 2242 and the electric measuring block 2222, thereby avoiding the situation where the electric measuring spring 2224 is damaged due to excessive heat when the weight of the circuit board to be tested is too heavy, thereby effectively protecting the electric measuring spring 2224. Because the electrical measurement block 2222 is connected to external testing equipment, there is no electrical measurement feedback after the electrical measurement block 2222 is disconnected from the support shell 2242. This absence of electrical measurement feedback allows the tester to determine that the circuit board under test is too heavy, allowing the tester to promptly remove the circuit board. In another embodiment, the position of the separation ring 2241 on the outer wall of the support shell 2242 can be determined based on the rated gravity load of the electrical measurement spring 2224 to ensure safe use of the electrical measurement spring 2224.

[0043] For further information, please also refer to Figure 3 and Figure 4The electrical measuring block 2222 is provided with a limiting groove 2228 that communicates with the guide groove 2226. The limiting groove 2228 opens toward the outer wall of the support shell 2242 and is configured to accommodate the separation protrusion 2241. In this embodiment, when the circuit board under test is overweight, after the circuit board under test is placed on the support shell 2242, the separation protrusion 2241 on the support shell 2242 will directly enter the guide groove 2226. Furthermore, under the pressure of the circuit board under test, the separation protrusion 2241 will engage with the limiting groove 2228, thereby stopping the circuit board under test from being further pressed downward. This also prevents the compressive force on the electrical measuring spring 2224 from exceeding the maximum value, effectively reducing the probability of breakage of the electrical measuring spring 2224. In addition, since the limiting groove 2228 can clamp the separation convex ring 2241, an overweight detection can be performed each time an electrical test is performed. For example, the circuit board to be tested is first placed on the support shell 2242 once, and then removed. If the support shell 2242 no longer rises or the separation convex ring 2241 can no longer be seen, it can be determined that the current circuit board to be tested is overweight. There is no need to judge based on the electrical test feedback result after power is turned on, which is convenient for testing circuit boards to be tested with heavier weight, and for replacing the electrical measuring conductive part 220 according to the weight of the circuit board to be tested, so that the electrical measuring spring 2224 in the replaced electrical measuring conductive part 220 is suitable for the current circuit board to be tested, further reducing the probability of damage to the electrical measuring spring 2224 in the electrical measuring conductive part 220.

[0044] In one embodiment, the present application further provides an electrical tester, comprising the circuit board electrical testing fixture described in any of the above embodiments. In this embodiment, the circuit board electrical testing fixture comprises a fixing assembly and an electrical testing assembly. The fixing assembly comprises an insulating plate and a plurality of insulating members. The plurality of insulating members are all connected to the insulating plate, and a fixed space is formed between the plurality of insulating members. The fixed space is used to accommodate the circuit board to be tested, so that the plurality of insulating members can jointly clamp the circuit board to be tested. The electrical testing assembly comprises an electrical testing wire and a plurality of electrical testing conductive members. The plurality of electrical testing conductive members are all connected to the insulating plate, and the ends of the plurality of electrical testing conductive members away from the insulating plate are all used to abut against electrical testing points on the circuit board to be tested. The electrical testing wire is connected to at least two of the electrical testing conductive members. At least one of the electrical testing conductive members is used to connect to an external detection device to conduct electricity to the electrical testing conductive members connected to the electrical testing wire. Some electrical measuring conductive parts correspond to electrical measuring positions on the circuit board to be tested, and the electrical measuring wires are connected to the electrical measuring conductive parts corresponding to the electrical measuring positions, thereby avoiding the need to weld copper wires on the electrical measuring positions of the circuit board, reducing the probability of scrapping the circuit board to be tested, and effectively reducing the testing cost of the circuit board to be tested.

[0045] The above-described embodiments merely illustrate several implementations of the present invention, and while their descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent. It should be noted that a person skilled in the art would be able to make numerous variations and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the patent for this invention shall be determined by the appended claims.

Claims

1. A circuit board electrical testing fixture, characterized in that: include: A fixing assembly, the fixing assembly comprising an insulating plate and a plurality of insulating members, the plurality of insulating members being connected to the insulating plate, a fixed space being formed between the plurality of insulating members, the fixed space being used to accommodate the circuit board to be tested, so that the plurality of insulating members can jointly clamp the circuit board to be tested; An electrical measuring assembly, the electrical measuring assembly comprising an electrical measuring wire and a plurality of electrical measuring conductive members, the plurality of electrical measuring conductive members being connected to the insulating plate, the ends of the plurality of electrical measuring conductive members being remote from the insulating plate being configured to abut against electrical measuring points on the circuit board to be tested, the electrical measuring wire being connected to at least two of the electrical measuring conductive members, wherein at least one of the electrical measuring conductive members is configured to be connected to an external testing device to provide electrical conduction between the electrical measuring conductive members connected to the electrical measuring wire; The electrical conductive member includes an electrical conductive body and an electrical testing support portion. The electrical testing body is connected to the insulating plate, and the electrical testing support portion abuts the circuit board to be tested. The electrical testing support portion is located on a side of the electrical testing body away from the insulating plate and is movably connected to the electrical testing body so as to move the electrical testing support portion away from or closer to the insulating plate. The electrical testing body includes an electrical testing block and an electrical testing spring that are connected to each other, and the electrical testing block defines a guide groove. The electrical testing support portion includes a support shell, a push rod, and at least two stabilizing springs. At least a portion of the support shell is located within the guide groove. The support shell has an accommodating groove, the opening of which is arranged opposite to the opening of the guide groove. At least a portion of the push rod is located within the accommodating groove. The push rod is respectively connected to the support shell and the electrical testing spring. At least two stabilizing springs are respectively located on either side of the push rod, and each stabilizing spring is respectively connected to the push rod and a side wall of the accommodating groove. The electrical measurement support portion also includes a separation convex ring connected to the support shell, the separation convex ring is located on the outer wall of the support shell, the separation convex ring has a separation inclined surface, and the separation inclined surface is inclined in a direction away from the electrical measurement block. The separation inclined surface is used to slide and abut against the side wall of the guide groove, so that when the separation convex ring enters the guide groove, the separation inclined surface pushes the electrical measurement block away, so that the outer wall of the support shell is out of contact with the side wall of the guide groove.

2. The circuit board electrical testing fixture according to claim 1, characterized in that: The distance that the electrically conductive member protrudes from the insulating plate is smaller than the distance that the insulating member protrudes from the insulating plate.

3. The circuit board electrical testing fixture according to claim 1, characterized in that: The electrical measuring assembly further includes a plurality of auxiliary support columns, each of which is connected to the insulating plate. The plurality of auxiliary support columns and the plurality of electrical measuring conductive parts jointly support the circuit board to be tested, and at least one of the auxiliary support columns is arranged away from each of the electrical measuring conductive parts.

4. The circuit board electrical testing fixture according to claim 3, characterized in that: A plurality of auxiliary support columns are arrayed and distributed on the insulating plate.

5. The circuit board electrical testing fixture according to claim 1, characterized in that: The insulating plate is provided with a plurality of through holes, each of which is provided with an electrical conductive body. At least one electrical conductive body is located at an end of the insulating plate away from the circuit board to be tested and is used for connecting to an external testing device.

6. The circuit board electrical testing fixture according to claim 5, characterized in that: The fixing assembly also includes a sealing clamp, a sealing ring, a connecting bolt and an external wire. The sealing clamp is located on the side of the insulating plate away from the circuit board to be tested, the connecting bolt is respectively connected to the sealing clamp and the insulating plate, the sealing ring is located between the sealing clamp and the insulating plate, and the sealing ring is respectively in contact with the sealing clamp and the insulating plate. The sealing ring is provided with a lead hole, the external wire is passed through the lead hole, one end of the external wire is connected to one of the electrical conductive bodies, and the other end of the external wire is used to connect to an external detection device.

7. The circuit board electrical testing fixture according to claim 1, characterized in that: The electric measuring block is connected to the insulating plate. The electric measuring support portion is located on a side of the electric measuring spring away from the electric measuring block. The electric measuring support portion is connected to the electric measuring spring.

8. The circuit board electrical testing fixture according to claim 7, characterized in that: The opening of the guide groove faces the circuit board to be tested, the electric testing spring is located in the guide groove, and a part of the electric testing support portion is movably arranged in the guide groove.

9. An electrical measuring instrument, characterized in that: The invention comprises the circuit board electrical testing fixture according to any one of claims 1 to 8.

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