A thermal history simulation method and related device based on the Ar-Ar dating method

Abstract

The present application discloses a thermal history simulation method and related device based on the Ar-Ar dating method, which obtains a plurality of vertical profile thermal history curve groups of the geological formation to be simulated. Each group of vertical profile thermal history curve groups includes the thermal history curves of samples at different heights on the vertical profile of the geological formation to be simulated. Based on the preset closure temperature, the Ar-Ar simulation age groups corresponding to each group of vertical profile thermal history curve groups are obtained by the Ar-Ar dating method. The goodness of fit of each group of vertical profile thermal history curve groups is calculated according to the Ar-Ar simulation age group corresponding to the minimum closure temperature and the Ar-Ar simulation age group corresponding to the maximum closure temperature. The vertical profile thermal history curve groups are screened by the goodness of fit of each group of vertical profile thermal history curve groups, and the final simulation result of the geological formation to be simulated is obtained based on the screened vertical profile thermal history curve groups, which improves the technical problem of low accuracy of the thermal history simulation result on the vertical profile existing in the prior art.

Description

Technical Field

[0001] This application relates to the field of geological technologies, and in particular, to a thermal history simulation method and related device based on the Ar-Ar dating method. Background Art

[0002] As one of the research methods in thermochronology, the Ar-Ar dating method has the characteristics of high precision, high accuracy, maturity and reliability, and has been widely used in the fields of geological research, oil and gas exploration, etc.

[0003] The Ar-Ar chronology methods of minerals such as mica and hornblende are currently mainly used to date a single sample to give a relatively accurate age. However, for continuous sampling on a vertical section, the technology for obtaining thermal history simulation results is not yet mature, and the accuracy of the thermal history simulation results on the vertical section is relatively low. Summary of the Invention

[0004] This application provides a thermal history simulation method and related device based on the Ar-Ar dating method, which are used to improve the technical problem of relatively low accuracy of the thermal history simulation results on the vertical section existing in the prior art.

[0005] In view of this, the first aspect of this application provides a thermal history simulation method based on the Ar-Ar dating method, including:

[0006] Obtain a plurality of vertical section thermal history curve groups of the geological body to be simulated, where each vertical section thermal history curve group includes thermal history curves of samples at different heights on the vertical section of the geological body to be simulated;

[0007] Based on a preset closure temperature, obtain an Ar-Ar simulation age group corresponding to each vertical section thermal history curve group through the Ar-Ar dating method, where the Ar-Ar simulation age group includes an Ar-Ar simulation age group corresponding to the minimum closure temperature and an Ar-Ar simulation age group corresponding to the maximum closure temperature;

[0008] Calculate the goodness of fit of each vertical section thermal history curve group according to the Ar-Ar simulation age group corresponding to the minimum closure temperature and the Ar-Ar simulation age group corresponding to the maximum closure temperature;

[0009] Screen the vertical section thermal history curve groups through the goodness of fit of each vertical section thermal history curve group to obtain the screened vertical section thermal history curve groups;

[0010] Obtain the final simulation result of the geological body to be simulated based on the screened vertical section thermal history curve groups.

[0011] Optionally, the calculation formula for the goodness of fit is:

[0012]

[0013] In the formula, p is the goodness of fit, A is the experimentally measured age, σ is the error of the experimentally measured age, x is the Ar-Ar simulated age, is the ratio coefficient, Min is the minimum value function, D is the group of experimentally measured ages, is the mean error of the group of experimentally measured ages, M 1 、M 2 are respectively the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature.

[0014] Optionally, the screening of the vertical profile thermal history curve group by the goodness of fit of each group of the vertical profile thermal history curve group to obtain the screened vertical profile thermal history curve group includes:

[0015] Set a first threshold and a second threshold, and the first threshold is less than the second threshold;

[0016] Retain the vertical profile thermal history curve group with the goodness of fit greater than the first threshold as the acceptable vertical profile thermal history curve group;

[0017] Retain the vertical profile thermal history curve group with the goodness of fit greater than the second threshold as the high-precision vertical profile thermal history curve group.

[0018] Optionally, the obtaining of the final simulation result of the geological formation to be simulated based on the screened vertical profile thermal history curve group includes:

[0019] When the screened vertical profile thermal history curve group includes the high-precision vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the high-precision vertical profile thermal history curve group at several identical time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated;

[0020] When the screened vertical profile thermal history curve group does not include the high-precision vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the acceptable vertical profile thermal history curve group at several identical time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

[0021] The second aspect of the present application provides a thermal history simulation device based on the Ar-Ar dating method, including:

[0022] A thermal history curve acquisition unit for acquiring a plurality of vertical profile thermal history curve groups of the geological formation to be simulated, wherein each vertical profile thermal history curve group includes thermal history curves of samples at different heights on the vertical profile of the geological formation to be simulated;

[0023] A simulated age acquisition unit for obtaining an Ar-Ar simulated age group corresponding to each vertical profile thermal history curve group based on a preset closure temperature by the Ar-Ar dating method, wherein the Ar-Ar simulated age group includes an Ar-Ar simulated age group corresponding to the minimum closure temperature and an Ar-Ar simulated age group corresponding to the maximum closure temperature;

[0024] A calculation unit for calculating the goodness of fit of each vertical profile thermal history curve group according to the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature;

[0025] A screening unit for screening the vertical profile thermal history curve groups through the goodness of fit of each vertical profile thermal history curve group to obtain the screened vertical profile thermal history curve groups;

[0026] A simulation result acquisition unit for obtaining the final simulation result of the geological formation to be simulated based on the screened vertical profile thermal history curve groups.

[0027] Optionally, the formula for calculating the goodness of fit is:

[0028]

[0029] In the formula, p is the goodness of fit, A is the experimental test age, σ is the experimental test age error, x is the Ar-Ar simulated age, is the ratio coefficient, Min is the function of taking the minimum value, D is the experimental test age group, is the mean value of the experimental test age group error, M 1 、M 2 are the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature respectively.

[0030] Optionally, the screening unit is specifically configured to:

[0031] Set a first threshold and a second threshold, where the first threshold is less than the second threshold;

[0032] Retain the vertical profile thermal history curve groups with the goodness of fit greater than the first threshold as acceptable vertical profile thermal history curve groups;

[0033] Retain the vertical profile thermal history curve groups with the goodness of fit greater than the second threshold as high-precision vertical profile thermal history curve groups.

[0034] Optionally, the simulation result acquisition unit is specifically configured to:

[0035] When the filtered vertical profile thermal history curve group includes the high-precision vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the high-precision vertical profile thermal history curve group at a plurality of same time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated;

[0036] When the filtered vertical profile thermal history curve group does not include the high-precision vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the acceptable vertical profile thermal history curve group at a plurality of same time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

[0037] The third aspect of the present application provides a thermal history simulation device based on the Ar-Ar dating method, and the device includes a processor and a memory;

[0038] The memory is used to store program codes and transmit the program codes to the processor;

[0039] The processor is configured to execute any one of the thermal history simulation methods based on the Ar-Ar dating method described in the first aspect according to the instructions in the program codes.

[0040] The fourth aspect of the present application provides a computer-readable storage medium, and the computer-readable storage medium is used to store program codes, and when the program codes are executed by a processor, any one of the thermal history simulation methods based on the Ar-Ar dating method described in the first aspect is implemented.

[0041] It can be seen from the above technical solutions that the present application has the following advantages:

[0042] The present application provides a thermal history simulation method based on the Ar-Ar dating method, including: obtaining a plurality of groups of thermal history curves of vertical profiles of the geological formation to be simulated, where each group of thermal history curves of vertical profiles includes the thermal history curves of samples at different heights on the vertical profile of the geological formation to be simulated; based on the preset closure temperature, obtaining the Ar-Ar simulation age group corresponding to each group of thermal history curves of vertical profiles through the Ar-Ar dating method, where the Ar-Ar simulation age group includes the Ar-Ar simulation age group corresponding to the minimum closure temperature and the Ar-Ar simulation age group corresponding to the maximum closure temperature; calculating the goodness of fit of each group of thermal history curves of vertical profiles according to the Ar-Ar simulation age group corresponding to the minimum closure temperature and the Ar-Ar simulation age group corresponding to the maximum closure temperature; screening the groups of thermal history curves of vertical profiles through the goodness of fit of each group of thermal history curves of vertical profiles to obtain the screened groups of thermal history curves of vertical profiles; and obtaining the final simulation result of the geological formation to be simulated based on the screened groups of thermal history curves of vertical profiles.

[0043] In the present application, by obtaining the thermal history curves of multiple samples at different heights on the vertical profile, a plurality of groups of thermal history curves of vertical profiles are obtained. Through the Ar-Ar dating method, the Ar-Ar simulation ages of each sample are obtained. Since the preset closure temperature is a range, the corresponding Ar-Ar simulation ages are also a range. By comparing the boundary values of the Ar-Ar simulation ages with the measured ages respectively, and then evaluating the goodness of fit through the comparison results of the two boundary values, the possible range is expanded a lot, that is, the admission conditions are very wide, so as to retain as much effective simulated thermal history as possible, which helps to improve the simulation accuracy and solve the technical problem of the low accuracy of the thermal history simulation results on the vertical profile existing in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0045] Figure 1 It is a schematic flow chart of a thermal history simulation method based on the Ar-Ar dating method provided by an embodiment of the present application;

[0046] Figure 2 It is a schematic diagram of a thermal history simulation result provided by an embodiment of the present application;

[0047] Figure 3 It is a schematic structural diagram of a thermal history simulation device based on the Ar-Ar dating method provided by an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0048] To enable those skilled in the art to better understand the solution of this application, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in this application without making creative efforts belong to the scope of protection of this application.

[0049] For ease of understanding, please refer to Figure 1 , the embodiments of this application provide a thermal history simulation method based on the Ar-Ar dating method, including:

[0050] Step 101: Obtain several groups of vertical profile thermal history curves of the geological body to be simulated, where each group of vertical profile thermal history curves includes the thermal history curves of samples at different heights on the vertical profile of the geological body to be simulated.

[0051] Several groups of vertical profile thermal history curves can be randomly assumed by methods such as Monte Carlo. Specifically, after obtaining several samples at different heights on the vertical profile of the geological body to be simulated, select one sample from all the samples as the target sample, and assume N thermal history curves of the target sample within a preset time range and a preset temperature range. The thermal history curve is a time-temperature curve; calculate the temperature difference between each non-target sample and the target sample according to the height difference between each non-target sample and the target sample; superimpose the temperature difference between each non-target sample and the target sample on the basis of each thermal history curve of the target sample to obtain the thermal history curves of each non-target sample, thereby obtaining N groups of vertical profile thermal history curves.

[0052] Obtain multiple samples of the geological formation to be simulated at different altitudes on a vertical section, and select one sample from the multiple samples as the target sample. The target sample can be the bottom sample or the top sample, etc. Determine the preset time range and preset temperature range of the thermal history curve of the sample according to the geological background of the geological formation to be simulated, and then generate N thermal history curves of the target sample by means of hypothesis within the preset time range and preset temperature range. The thermal history curves of other non-target samples can be obtained by deforming the thermal history curve of the target sample. First, calculate the height difference between each non-target sample and the target sample, and multiply the height difference between each non-target sample and the target sample by the paleogeothermal gradient to obtain the temperature difference between each non-target sample and the target sample. Select a thermal history curve i of the target sample, and superimpose the temperature difference between each non-target sample and the target sample on the basis of this thermal history curve to obtain the thermal history curves of each non-target sample. At this time, the thermal history curves of each non-target sample obtained based on the thermal history curve i and this thermal history curve i of the target sample together form a set of thermal history curves for the vertical section, that is, when a thermal history curve of a sample is assumed, a set of thermal history curves representing samples at different heights on the vertical section can be constructed. Since there are N thermal history curves of the target sample, correspondingly, N sets of thermal history curves for the vertical section can be obtained, and the number of thermal history curves in each set of thermal history curves for the vertical section is the same as the number of samples of the geological formation to be simulated.

[0053] Step 102: Based on the preset closure temperature, obtain the Ar-Ar simulated age group corresponding to each set of thermal history curves for the vertical section by the Ar-Ar dating method, where the Ar-Ar simulated age group includes the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature.

[0054] Preset the Ar closure temperature to obtain the preset closure temperature. According to the spherical grain diffusion equation of the mica Ar-Ar chronology method, calculate the Ar-Ar simulated age to obtain the Ar-Ar simulated age group corresponding to each set of thermal history curves for the vertical section. The preset closure temperature in the embodiments of the present application is a range, which can be 350-450 °C. Then, the calculation results of the Ar-Ar simulated age corresponding to each set of thermal history curves for the vertical section each have a maximum value and a minimum value, corresponding to the maximum closure temperature (such as 450 °C) and the minimum closure temperature (such as 350 °C) respectively, which means that the Ar-Ar simulated age group corresponding to each set of thermal history curves for the vertical section is also a range.

[0055] Step 103: Calculate the goodness of fit of each set of thermal history curves for the vertical section according to the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature.

[0056] Since the Ar-Ar simulated age of each sample is a range, for example, 100 - 200 Ma, rather than a specific simulated age value obtained by methods such as fission track and U-Th / He. Therefore, the existing goodness-of-fit calculation method cannot be used to calculate the goodness-of-fit of each group of vertical profile thermal history curves. The formula for the goodness-of-fit in this application is as follows:

[0057]

[0058] In the formula, p is the goodness-of-fit, A is the experimental test age, σ is the experimental test age error, x is the Ar-Ar simulated age, is the ratio coefficient, which plays a key role in the calculation of the goodness-of-fit, Min is the minimum value function, D is the experimental test age group, is the mean value of the experimental test age group error, M 1 、M 2 are respectively the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature.

[0059] In the embodiment of this application, by comparing the boundary values of the Ar-Ar simulated age with the test age respectively, and then evaluating the goodness-of-fit through the comparison results of the two boundary values, the possible range is expanded a lot, that is, the admission condition is very wide, so as to retain the effective simulated thermal history as much as possible, which helps to improve the simulation accuracy.

[0060] Step 104: Screen the vertical profile thermal history curves through the goodness-of-fit of each group of vertical profile thermal history curves to obtain the screened vertical profile thermal history curves.

[0061] Set a first threshold and a second threshold, where the first threshold is less than the second threshold; retain the vertical profile thermal history curves with a goodness-of-fit greater than the first threshold as the acceptable vertical profile thermal history curves; retain the vertical profile thermal history curves with a goodness-of-fit greater than the second threshold as the high-precision vertical profile thermal history curves.

[0062] After obtaining the goodness-of-fit of each group of vertical profile thermal history curves, set the threshold of the p value to determine whether each group of thermal history curves is eliminated or retained. For example, we can set the first threshold to 0.05, and retain the vertical profile thermal history curves with p > 0.05 as the acceptable vertical profile thermal history curves; we can set the second threshold to 0.5, and retain the vertical profile thermal history curves with p > 0.5, and all are marked as thermal history curves with high precision and high probability close to the true value, that is, as the high-precision vertical profile thermal history curves.

[0063] Step 105: Obtain the final simulation result of the geological area to be simulated based on the screened vertical profile thermal history curves.

[0064] When the high-precision vertical profile thermal history curve group is included in the filtered vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the high-precision vertical profile thermal history curve group at a number of identical time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated;

[0065] When the high-precision vertical profile thermal history curve group is not included in the filtered vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the acceptable vertical profile thermal history curve group at a number of identical time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

[0066] The retained thermal history curves can be divided into 100 equal parts by time for average value calculation, that is, the temperature values of all the thermal history curves corresponding to each sample are averaged according to the same time coordinate to obtain a series of average temperature-time nodes, and connecting them in chronological order is output as the final result of the thermal history simulation. If there is a high-precision vertical profile thermal history curve group, the average value of the high-precision vertical profile thermal history curve group is preferentially obtained as the final simulation result. If no high-precision thermal history curve is retained, the average value of the acceptable vertical profile thermal history curve group is output as the final result.

[0067] Thermal history simulation is carried out on the muscovite Ar-Ar age, and the parameters are shown in Table 1. The thermal history simulation results are as Figure 2 shown. Each simulation searches 10,000 times. The gray and black areas represent the acceptable thermal history (GOF>0.05) and the high-precision thermal history (GOF>0.5) respectively. The two solid lines in the middle are the average values of the acceptable vertical profile thermal history curve group (GOF>0.05) and the high-precision vertical profile thermal history curve group (GOF>0.5) respectively.

[0068] Table 1 Selection of thermal history simulation parameters

[0069]

[0070] In the embodiments of the present application, by obtaining the thermal history curves of multiple samples at different heights on a vertical section, several vertical section thermal history curve groups are obtained. By using the Ar-Ar dating method to obtain the Ar-Ar simulated ages of each sample, since the preset closure temperature is a range, the corresponding Ar-Ar simulated ages are also a range. By comparing the boundary values of the Ar-Ar simulated ages with the measured ages respectively, and then evaluating the goodness of fit through the comparison results of the two boundary values, the range of possibilities is expanded a lot, that is, the admission conditions are very wide, so as to retain as much effective simulated thermal history as possible, which helps to improve the simulation accuracy and solve the technical problem of the low accuracy of the thermal history simulation results on the vertical section existing in the prior art.

[0071] The above is an embodiment of a thermal history simulation method based on the Ar-Ar dating method provided by the present application. The following is an embodiment of a thermal history simulation device based on the Ar-Ar dating method provided by the present application.

[0072] Please refer to Figure 3 , a thermal history simulation device based on the Ar-Ar dating method provided by the embodiments of the present application includes:

[0073] A thermal history curve acquisition unit for acquiring several vertical section thermal history curve groups of the geological body to be simulated, where each vertical section thermal history curve group includes the thermal history curves of samples at different heights on the vertical section of the geological body to be simulated;

[0074] A simulated age acquisition unit for obtaining an Ar-Ar simulated age group corresponding to each vertical section thermal history curve group based on the preset closure temperature by using the Ar-Ar dating method, where the Ar-Ar simulated age group includes the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature;

[0075] A calculation unit for calculating the goodness of fit of each vertical section thermal history curve group according to the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature;

[0076] A screening unit for screening the vertical section thermal history curve groups through the goodness of fit of each vertical section thermal history curve group to obtain the screened vertical section thermal history curve groups;

[0077] A simulated result acquisition unit for obtaining the final simulated result of the geological body to be simulated based on the screened vertical section thermal history curve groups.

[0078] As a further improvement, the calculation formula for the goodness of fit is:

[0079]

[0080] Wherein, p is the goodness of fit, A is the experimentally tested age, σ is the error of the experimentally tested age, x is the Ar-Ar simulated age, is the ratio coefficient, Min is the minimum value function, D is the experimentally tested age group, is the mean error of the experimentally tested age group, M 1 、M 2 are respectively the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature.

[0081] As a further improvement, the screening unit is specifically used for:

[0082] Set a first threshold and a second threshold, where the first threshold is less than the second threshold;

[0083] Retain the vertical profile thermal history curve group with a goodness of fit greater than the first threshold as the acceptable vertical profile thermal history curve group;

[0084] Retain the vertical profile thermal history curve group with a goodness of fit greater than the second threshold as the high-precision vertical profile thermal history curve group.

[0085] As a further improvement, the simulation result acquisition unit is specifically used for:

[0086] When the high-precision vertical profile thermal history curve group is included in the screened vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the high-precision vertical profile thermal history curve group at several identical time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated;

[0087] When the high-precision vertical profile thermal history curve group is not included in the screened vertical profile thermal history curve group, calculate the average value of the curve values of the thermal history curves of the same sample in the acceptable vertical profile thermal history curve group at several identical time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

[0088] The embodiment of the present application also provides a thermal history simulation device based on the Ar-Ar dating method, and the device includes a processor and a memory;

[0089] The memory is used to store program codes and transmit the program codes to the processor;

[0090] The processor is used to execute the thermal history simulation method based on the Ar-Ar dating method in the foregoing method embodiment according to the instructions in the program codes.

[0091] In the embodiments of the present application, by obtaining the thermal history curves of multiple samples at different heights on a vertical section, a number of vertical section thermal history curve groups are obtained. The Ar-Ar simulated ages of each sample are obtained by the Ar-Ar dating method. Since the preset closure temperature is a range, the corresponding Ar-Ar simulated ages are also a range. By comparing the boundary values of the Ar-Ar simulated ages with the measured ages respectively, and then evaluating the goodness of fit through the comparison results of the two boundary values, the range of possibilities is expanded a lot, that is, the admission conditions are very wide, so as to retain the effective simulated thermal history as much as possible, which helps to improve the simulation accuracy and solve the technical problem of the low accuracy of the thermal history simulation results on the vertical section existing in the prior art.

[0092] The embodiments of the present application also provide a computer-readable storage medium, which is used to store program codes. When the program codes are executed by a processor, the thermal history simulation method based on the Ar-Ar dating method in the foregoing method embodiments is implemented.

[0093] Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the above-described devices and units can refer to the corresponding processes in the foregoing method embodiments, and will not be elaborated herein.

[0094] The terms "first", "second", "third", "fourth", etc. (if any) in the specification of the present application and the above-mentioned drawings are used to distinguish similar objects, and do not have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units does not have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0095] It should be understood that in this application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects and indicates that three relationships can exist. For example, "A and / or B" can mean: only A exists, only B exists, and both A and B exist at the same time. Among them, A and B can be singular or plural. The character " / " generally indicates that the associated objects before and after are in an "or" relationship. "At least one (item) of the following" or its similar expression refers to any combination of these items, including any combination of single item (item) or plural items (items). For example, at least one (item) of a, b, or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0096] In several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection to each other can be through some interfaces. The indirect coupling or communication connection of the devices or units can be in electrical, mechanical or other forms.

[0097] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they may be located in one place, or may be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0098] In addition, the functional units in each embodiment of this application can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

[0099] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of this application. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (English full name: Read-Only Memory, English abbreviation: ROM), random access memories (English full name: Random Access Memory, English abbreviation: RAM), magnetic disks, or optical discs.

[0100] As described above, the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit them; although this application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of various embodiments of this application.

Claims

1. A thermal history simulation method based on the Ar-Ar dating method, characterized in that, it includes: Obtain a group of thermal history curves of several vertical profiles of the geological body to be simulated, where each group of the vertical profile thermal history curves includes the thermal history curves of samples at different heights on the vertical profile of the geological body to be simulated; Based on the preset closure temperature, obtain the Ar-Ar simulated age group corresponding to each group of the vertical profile thermal history curves through the Ar-Ar dating method, where the Ar-Ar simulated age group includes the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature; Calculate the goodness of fit of each group of the vertical profile thermal history curves according to the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature; the calculation formula of the goodness of fit is: Wherein, p is the goodness of fit, A is the experimentally measured age, σ is the error of the experimentally measured age, x is the Ar-Ar simulated age, is the ratio coefficient, Min is the minimum value function, D is the experimentally measured age group, is the mean error of the experimentally measured age group, M 1 and M 2 are the Ar-Ar simulated age groups corresponding to the minimum closure temperature and the maximum closure temperature, respectively; Screen the vertical profile thermal history curves through the goodness of fit of each group of the vertical profile thermal history curves to obtain the screened vertical profile thermal history curves; Obtain the final simulation result of the geological body to be simulated based on the screened vertical profile thermal history curves.

2. The thermal history simulation method based on the Ar-Ar dating method according to claim 1, characterized in that, The screening of the vertical profile thermal history curves through the goodness of fit of each group of the vertical profile thermal history curves to obtain the screened vertical profile thermal history curves includes: Set a first threshold and a second threshold, and the first threshold is less than the second threshold; Retain the vertical profile thermal history curves with a goodness of fit greater than the first threshold as acceptable vertical profile thermal history curves; Retain the vertical profile thermal history curves with a goodness of fit greater than the second threshold as high-precision vertical profile thermal history curves.

3. The thermal history simulation method based on the Ar-Ar dating method according to claim 2, characterized in that, The obtaining of the final simulation result of the geological body to be simulated based on the screened vertical profile thermal history curves includes: When the screened vertical profile thermal history curves include the high-precision vertical profile thermal history curves, calculate the average value of the curve values of the thermal history curves of the same sample in the high-precision vertical profile thermal history curves at several same time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological body to be simulated; When the screened vertical profile thermal history curves do not include the high-precision vertical profile thermal history curves, calculate the average value of the curve values of the thermal history curves of the same sample in the acceptable vertical profile thermal history curves at several same time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological body to be simulated.

4. A thermal history simulation device based on the Ar-Ar dating method, characterized in that, it includes: A thermal history curve acquisition unit for obtaining a group of thermal history curves of several vertical profiles of the geological body to be simulated, where each group of the vertical profile thermal history curves includes the thermal history curves of samples at different heights on the vertical profile of the geological body to be simulated; A simulated age acquisition unit, configured to obtain an Ar-Ar simulated age group corresponding to each group of the vertical profile thermal history curve groups based on a preset closure temperature through the Ar-Ar dating method, where the Ar-Ar simulated age group includes an Ar-Ar simulated age group corresponding to the minimum closure temperature and an Ar-Ar simulated age group corresponding to the maximum closure temperature; A calculation unit, configured to calculate the goodness of fit of each group of the vertical profile thermal history curve groups according to the Ar-Ar simulated age group corresponding to the minimum closure temperature and the Ar-Ar simulated age group corresponding to the maximum closure temperature; the calculation formula of the goodness of fit is: Wherein, p is the goodness of fit, A is the experimentally measured age, σ is the error of the experimentally measured age, x is the Ar-Ar simulated age, is the ratio coefficient, Min is the minimum value function, D is the experimentally measured age group, is the mean error of the experimentally measured age group, M 1 、M 2 are the Ar-Ar simulated age groups corresponding to the minimum closure temperature and the maximum closure temperature, respectively; A screening unit, configured to screen the vertical profile thermal history curve groups through the goodness of fit of each group of the vertical profile thermal history curve groups to obtain the screened vertical profile thermal history curve groups; A simulation result acquisition unit, configured to obtain the final simulation result of the geological formation to be simulated based on the screened vertical profile thermal history curve groups.

5. The thermal history simulation device based on the Ar-Ar dating method according to claim 4, wherein, the screening unit is specifically configured to: set a first threshold and a second threshold, where the first threshold is less than the second threshold; retain the vertical profile thermal history curve groups with the goodness of fit greater than the first threshold as acceptable vertical profile thermal history curve groups; retain the vertical profile thermal history curve groups with the goodness of fit greater than the second threshold as high-precision vertical profile thermal history curve groups.

6. The thermal history simulation device based on the Ar-Ar dating method according to claim 5, wherein, the simulation result acquisition unit is specifically configured to: when the screened vertical profile thermal history curve groups include the high-precision vertical profile thermal history curve groups, calculate the average value of the curve values of the thermal history curves of the same sample in the high-precision vertical profile thermal history curve groups at a plurality of same time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated; when the screened vertical profile thermal history curve groups do not include the high-precision vertical profile thermal history curve groups, calculate the average value of the curve values of the thermal history curves of the same sample in the acceptable vertical profile thermal history curve groups at a plurality of same time points, and connect the average values of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

7. A thermal history simulation device based on the Ar-Ar dating method, wherein, the device includes a processor and a memory; the memory is configured to store program codes and transmit the program codes to the processor; the processor is configured to execute the thermal history simulation method based on the Ar-Ar dating method according to any one of claims 1-3 according to the instructions in the program codes.

8. A computer-readable storage medium, wherein, the computer-readable storage medium is configured to store program codes, and when the program codes are executed by a processor, the thermal history simulation method based on the Ar-Ar dating method according to any one of claims 1-3 is implemented.

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