Pick-up mechanism and its application equipment

Abstract

The present invention provides a picking mechanism and an operating equipment used therein, comprising a picking tool and a base, wherein the picking tool is used for picking up and placing electronic components, and defines a first operating surface and a second operating surface along an axis, wherein the first operating surface is provided with a first long axis and a first short axis, and two ends of the first short axis are provided with tapered line segments toward two ends of the first long axis to form a first contour that is not a perfect circular curve, and the first operating surface is provided with a tapered contact surface toward the second operating surface, and a receiving groove of the base is used to accommodate the picking tool, and defines a third operating surface and a fourth operating surface along the axis, wherein the third operating surface is provided with a third long axis and a third short axis, and two ends of the third short axis are provided with tapered line segments toward two ends of the third long axis to form a third contour that is not a perfect circular curve, and the third operating surface is provided with a tapered receiving surface toward the fourth operating surface, so that the picking tool and the base are mutually abutted in a non-perfect circular curve to prevent arbitrary horizontal rotation, and the contact surface of the picking tool is positioned to fit the receiving surface of the base without any gap, thereby improving the transfer accuracy of the picking tool.

Description

Technical Field

[0001] The invention relates to a picking mechanism which can prevent a picking tool from rotating horizontally at will. Background Art

[0002] Nowadays, pick-up mechanisms are used in various devices to transfer and pick up electronic components. Electronic components are becoming increasingly small and precise, and the number of contacts is large. Therefore, the pick-up accuracy of the pick-up mechanism is required to be quite high. Figure 1 A receiving hole 111 is provided inside the body 11 of the picking mechanism, and an air suction passage 112 communicating with the receiving hole 111 is opened. A long hole 113 is also provided at the top of the body 11. A picking member 12 is assembled in the receiving hole 111 of the body 11, and a suction nozzle 121 is provided at one end for adsorbing the electronic component 14. An air passage 122 communicating with the suction nozzle 121 and the receiving hole 111 is provided inside the picking member 12. A through hole 123 is provided at the other end of the picking member 12 for the shaft rod 13 to pass through the long hole 113 of the body 11 and the through hole 123 of the picking member 12. The picking member 12 uses the shaft rod 13 to perform linear displacement along the long hole 113 of the body 11, so that the picking member 12 can float for buffering.

[0003] However, there is a sliding clearance between the accommodating hole 111 of the main body 11 and the picking member 12, and there is also a sliding clearance between the long hole 113 of the main body 11 and the shaft 13. These two sliding clearances cause the picking member 12 to easily drive the electronic component 14 to rotate horizontally when the electronic component 14 is being transferred. Especially for tiny electronic components, a slight horizontal rotation of the picking member 12 will cause the reference contact of the electronic component 14 to be unable to accurately align with the reference probe of the tester (not shown), so that the electronic component 14 is misjudged as a defective product, thereby affecting the test quality. Furthermore, since the picking member 12 and the accommodating hole 111 of the main body 11 are assembled in the form of a long straight rod and a long straight hole, when the main body 11 of the picking mechanism and the tester cannot remain parallel, or the top surface of the electronic component 14 has an inclination, the picking member 12 cannot swing vertically, so that the picking member 12 cannot evenly press down the electronic component 14 to perform the test operation. The electronic component 14 will be in a state of uneven force, which will affect the test quality. Summary of the invention

[0004] The purpose of the present invention is to provide a picking mechanism and an operating device using the same to solve the above-mentioned technical problems existing in the prior art.

[0005] To achieve the above object, the technical solution adopted by the present invention is:

[0006] A picking mechanism, characterized by comprising:

[0007] The pick-up tool is provided with at least one pick-up component for picking up electronic components, and defines a first working surface and a second working surface along the axis, the first working surface is provided with at least one first long axis and at least one first short axis, and the ends of the first long axis and the first short axis are connected to form a first contour in the form of a non-circular curve, and the first working surface of the pick-up tool is provided with a gradually shrinking bonding surface facing the second working surface;

[0008] Base: A receiving groove is provided for receiving the picking tool, the receiving groove defines a third working surface and a fourth working surface along the axis, the third working surface is provided with at least one third long axis and at least one third short axis, and the ends of the third long axis and the third short axis are connected to form a third contour in a non-circular curve, the third working surface of the receiving groove is provided with a receiving surface with a gradually reduced size facing the fourth working surface, so as to fit and clamp against the contact surface of the picking tool.

[0009] The picking mechanism, wherein: the first major axis and the first minor axis of the picking tool intersect, and the line segment of the first contour is a straight line or a curved arc.

[0010] The picking mechanism, wherein: the line segment of the first contour of the picking tool gradually decreases in size from the end of the first short axis toward the end of the first long axis.

[0011] The picking mechanism, wherein: the contact surface of the picking tool is a plane or a curved surface.

[0012] The picking mechanism, wherein: the third major axis and the third minor axis of the base intersect, and the line segment of the third contour is a straight line or a curved arc.

[0013] The picking mechanism, wherein: the line segment of the third contour of the base gradually decreases in size from the end of the third short axis toward the end of the third long axis.

[0014] The picking-up mechanism, wherein: the receiving surface of the base is a plane or a curved surface.

[0015] The picking mechanism further comprises a pressure device, which is mounted on the base to press down the picking tool.

[0016] The picking mechanism further comprises an actuating arm for driving the base to move in at least one direction.

[0017] An operating device, characterized in that it comprises:

[0018] Machine;

[0019] A feeding device: arranged on the machine platform and provided with at least one feeding receiving device for accommodating electronic components to be processed;

[0020] A receiving device: arranged on the machine, and provided with at least one receiving receiving device for accommodating the processed electronic components;

[0021] Operation device: configured on the machine and provided with at least one operation device for performing a preset operation on the electronic component;

[0022] Conveying device: arranged on the machine platform and provided with at least one of the above-mentioned picking mechanisms for transferring electronic components;

[0023] Central control device: used to control and integrate the operations of various devices.

[0024] The first advantage of the present invention is that it provides a picking mechanism, including a picking tool and a base. The picking tool is used for picking up and placing electronic components, and defines a first working surface and a second working surface along an axis. The first working surface is provided with a first long axis and a first short axis, and two ends of the first short axis are provided with tapered line segments toward the two ends of the first long axis to form a first contour that is not a perfect circular curve. The first working surface is provided with a tapered contact surface toward the second working surface. The accommodating groove of the base is used to accommodate the picking tool, and defines a third working surface and a fourth working surface along the axis. The third working surface is provided with a third long axis and a third short axis, and two ends of the third short axis are provided with tapered line segments toward the two ends of the third long axis to form a third contour that is not a perfect circular curve. The third working surface is provided with a tapered receiving surface toward the fourth working surface, so that the picking tool and the base are mutually abutted in a non-perfect circular curve to prevent arbitrary horizontal rotation, and the contact surface of the picking tool is positioned to fit the receiving surface of the base without any gap, thereby improving the transfer accuracy of the picking tool.

[0025] The second advantage of the present invention is to provide a picking mechanism, which further includes a pressure device, which is arranged above the picking tool to press against the picking tool. When the picking tool takes out the electronic component, the pressure device is used to apply pressure to the picking piece, so that the contact surface of the picking tool is more accurately contacted with the receiving surface of the base and positioned, so that the picking tool can maintain accurate transfer of electronic components during the transfer stroke, thereby improving the picking efficiency.

[0026] The third advantage of the present invention is to provide a picking mechanism, wherein the contact surface of the picking tool and the receiving surface of the base are matched with a gradually decreasing slope, so that the picking tool can swing vertically when contacting the electronic component to adjust the contact angle, so that the picking tool can evenly press the electronic component, thereby improving the test quality.

[0027] Advantage four of the present invention is to provide an operating equipment, including a machine, a feeding device, a receiving device, an operating device, a conveying device and a central control device; the feeding device is arranged on the machine, and is provided with at least one feeding receiver for accommodating electronic components to be operated; the receiving device is arranged on the machine, and is provided with at least one receiving receiver for accommodating electronic components that have been operated; the operating device is arranged on the machine, and is provided with at least one operating device for performing preset operations on electronic components; the conveying device is arranged on the machine, and is provided with at least one picking mechanism of the present invention for transferring electronic components; the central control device is used to control and integrate the actuation of each device to perform automated operations, thereby achieving the practical benefit of improving operating efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of an existing picking mechanism.

[0029] Figure 2 It is the appearance diagram of the picking mechanism of the present invention.

[0030] Figure 3 It is an exploded view of the parts of the pickup mechanism of the present invention.

[0031] Figure 4 It is a combined sectional view of the pickup mechanism of the present invention.

[0032] Figure 5 It is a bottom view of the pickup tool of the present invention.

[0033] Figure 6 It is a top view of the base of the present invention.

[0034] Figure 7 1 is a schematic diagram of the use of the pickup mechanism of the present invention.

[0035] Figure 8 2 is a schematic diagram of the use of the pickup mechanism of the present invention.

[0036] Fig. 9 Schematic diagram of the use of the pickup mechanism of the present invention (III).

[0037] Fig.10 It is another use schematic diagram of the picking mechanism of the present invention.

[0038] Fig.11 It is a schematic diagram of the pickup mechanism of the present invention applied to working equipment.

[0039] Description of reference numerals: body 11; accommodating hole 111; air suction channel 112; long hole 113; picking member 12; suction nozzle 121; air duct 122; through hole 123; shaft 13; electronic component 14; picking tool 21; first working surface 211; first long axis 2111; first short axis 2112; first contour 2113; second working surface 212; second contour 2121; pressure-bearing surface 213; contact surface 214; bottom surface 215; picking members 216, 217; base 22; accommodating groove 221; third working surface 222; third long axis 2221; third short axis 2222 Axis 2222; third contour 2223; fourth working surface 223; fourth contour 2231; receiving surface 224; receiving portion 225; diaphragm 231; cover plate 232; vent 2321; air chamber 233; actuator arm 24; axis X; carrier 31; electronic components 32, 34; tester 33; machine 40; feeding device 50; feeding holder 51; receiving device 60; receiving holder 61; working device 70; circuit board 71; test socket 72; conveying device 80; first material mover 81; feeding carrier 82; unloading carrier 83; second material mover 84. DETAILED DESCRIPTION

[0040] In order to further understand the present invention, a preferred embodiment is given below with reference to the accompanying drawings.

[0041] See also Figure 2 to Figure 6 The picking mechanism of the present invention includes a picking tool 21 and a base 22 , and further includes a pressure device and an actuating arm 24 .

[0042] The picking tool 21 defines a first working surface 211 and a second working surface 212 along the axis X. Furthermore, the first working surface 211 can be the top surface or any horizontal surface of the picking tool 21, and the second working surface 212 can be the bottom surface or any horizontal surface of the picking tool 21. In this embodiment, the top of the picking tool 21 is a pressure-bearing surface 213, and a horizontal surface close to the pressure-bearing surface 213 is defined along the axis X as the first working surface 211, and another horizontal surface at an appropriate height from the first working surface 211 is defined along the axis X as the second working surface 212. The first working surface 211 is provided with at least one first long axis 2111 and at least one first short axis 2112, and a first contour 2113 which is a non-circular curve is connected along the ends of the first long axis 2111 and the first short axis 2112. Furthermore, the first long axis 2111 and the first short axis 2112 intersect, and the line segments of the first contour 2113 may be straight lines or curved lines. For example, a straight line segment with a gradually decreasing size is provided from the first short axis end of the first short axis 2112 toward the first long axis end of the first long axis 2111, so that the first contour 2113 is rhombus-shaped; for example, a curved line segment with a gradually decreasing size is provided from the first short axis end of the first short axis 2112 toward the first long axis end of the first long axis 2111, so that the first contour 2113 is elliptical.

[0043] In this embodiment, a curved line segment with a gradually decreasing size is provided from the first short axis end of the first short axis 2112 of the first working surface 211 toward the first long axis end of the first long axis 2111, so as to connect the two first long axis ends of the first long axis 2111 and the two first short axis ends of the first short axis 2112 to form an elliptical first contour 2113; and a contact surface 214 with a gradually decreasing size is provided on the first working surface 211 of the picking tool 21 toward the second working surface 212. Furthermore, the contact surface 214 may be a plane or an arc surface. In this embodiment, the contact surface 214 is an arc surface; at least one picking component 216 is provided on the bottom surface 215 of the picking tool 21 for picking up and contacting electronic components. In this embodiment, the picking component 216 is a suction nozzle and is connected to a vacuum device (not shown) for sucking or releasing electronic components.

[0044] The base 22 is provided with a receiving groove 221 for accommodating the picking tool 21. The receiving groove 221 defines a third working surface 222 and a fourth working surface 223 along the axis X. Furthermore, the third working surface 222 can be the top surface or any horizontal surface of the receiving groove 221, and the fourth working surface 223 can be the bottom surface or any horizontal surface of the receiving groove 221. In this embodiment, the receiving groove 221 has a connected top surface and bottom surface, and defines the top surface along the axis X as the third working surface 222, and defines a bottom surface at an appropriate height from the third working surface 222 along the axis X as the fourth working surface 223. The third working surface 222 is provided with at least one third long axis 2221 and at least one third short axis 2222, and a third contour 2223 which is a non-circular curve is formed along the ends of the third long axis 2221 and the third short axis 2222. Furthermore, the third long axis 2221 and the third short axis 2222 intersect each other, and the size of the third contour 2223 can be the same as or different from the size of the first contour 2113. The line segment of the third contour 2223 can be a straight line or a curved line. For example, the third short axis 2221 and the third short axis 2222 are connected to form a non-circular curve. The third minor axis end of the shaft 2222 is provided with a straight line segment with a gradually decreasing size toward the third major axis end of the third major axis 2221, so that the third profile 2223 is a rhombus; for example, the third minor axis end of the third minor axis 2222 is provided with a curved line segment with a gradually decreasing size toward the third major axis end of the third major axis 2221, so that the third profile 2223 is an ellipse; in this embodiment, the third minor axis end of the third minor axis 2222 of the third working surface 222 is provided with a curved line segment with a gradually decreasing size toward the third major axis end of the third major axis 2221 The third working surface 222 of the receiving groove 221 is provided with a receiving surface 224 with a gradually decreasing size toward the fourth working surface 223. In this embodiment, the size of the fourth profile 2231 of the fourth working surface 223 is larger than the size of the second profile 2121 of the second working surface 212. Furthermore, the receiving surface 224 of the third working surface 222 of the receiving groove 221 is provided with a gradually decreasing size receiving surface 224. The contact surface 224 can be a plane or an arc surface. In this embodiment, the receiving surface 224 is an arc surface, and the curve is the same as the curve of the contact surface 214 of the picking tool 21. When the picking tool 21 is accommodated in the accommodating groove 221, the receiving surface 224 of the accommodating groove 221 is fitted and clamped against the contact surface 214 of the picking tool 21, so that the picking tool 21 can be displaced along the axis X and prevent the picking tool 21 from detaching; the base 22 is provided with a receiving portion 225 along the axis X that is connected to the accommodating groove 221 and is located above.

[0045] Moreover, the size of the fourth contour 2231 of the fourth working surface 223 of the accommodating groove 221 may be the same as or different from the size of the second contour 2121 of the second working surface 212, as long as the receiving surface 224 of the accommodating groove 221 can be stuck against the contact surface 214 of the picking tool 21 to prevent the picking tool 21 from detaching.

[0046] Furthermore, the number of the third major axis 2221 and the third minor axis 2222 of the third working surface 222 of the accommodating groove 221 may be the same as or different from the number of the first major axis 2111 and the first minor axis 2112 of the first working surface 211 of the picking tool 21, so that the accommodating groove 221 can be matched with picking tools 21 of different shapes; for example, the third working surface 222 of the accommodating groove 221 has a third contour of a double elliptical intersecting curve, so as to be matched with the first working surface 211 of the picking tool 21 having a single elliptical first contour 2113, and therefore, it is not limited to this embodiment.

[0047] The pressure device is used to apply a pressure to the picking tool 21 during the process of transferring electronic components, so that the contact surface 214 of the picking tool 21 is actually in contact with the receiving surface 224 of the accommodating groove 221 for positioning; further, the pressure device can be a pressure cylinder, a diaphragm type pressure device or an air bag type pressure device. In this embodiment, the pressure device is a diaphragm type pressure device, including a diaphragm 231 and a cover plate 232. The diaphragm 231 is assembled on the receiving portion 225 of the base 22 and is located above the picking tool 21. The cover plate 232 has a vent 2321 and is assembled above the diaphragm 231. An air chamber 233 is formed between the cover plate 232 and the diaphragm 231. The vent 2321 of the cover plate 232 is used to inject gas into the air chamber 233 so that the diaphragm 231 can expand and deform downward to apply a pressure to the picking tool 21.

[0048] The actuator arm 24 is used to drive the base 22 to move in at least one direction. The actuator arm 24 can be connected to the base 22 or the pressure feeder. In this embodiment, the actuator arm 24 is connected to the base 22 and is located above the cover 232 of the diaphragm pressure feeder to drive the base 22, the diaphragm pressure feeder and the pickup 21 to move in the XYZ directions synchronously to transfer electronic components to different devices.

[0049] See also Figure 7 The actuating arm 24 of the picking mechanism drives the base 22, the diaphragm-type pressure feeder and the picking tool 21 to synchronously move in the XYZ directions to a carrier 31 carrying an electronic component 32, so that the picking component 216 of the picking tool 21 slightly presses against the electronic component 32. The electronic component 32 will generate a reaction force on the picking tool 21, and push the picking tool 21 to move slightly upward in the Z direction. The pressure-bearing surface 213 of the picking tool 21 presses against the diaphragm 231 to make a buffer floating displacement.

[0050] See also Figure 3 , Figure 8 , Fig. 9Since the third minor axis end of the third minor axis 2222 of the base 22 is provided with a curved line segment with a gradually decreasing size toward the third major axis end of the third major axis 2221, a third contour 2223 which is a non-circular curve is formed, and the first minor axis end of the first minor axis 2112 of the pick-up tool 21 is provided with a curved line segment with a gradually decreasing size toward the first major axis end of the first major axis 2111, a first contour 2113 which is a non-circular curve is formed. The curved line segments of the three contours 2223 with gradually decreasing sizes can be stuck against the curved line segments of the first contour 2113 with gradually decreasing sizes of the pick-up tool 21 to prevent the pick-up tool 21 from rotating horizontally at will. When the pick-up part 216 of the pick-up tool 21 takes out the electronic component 32, the vent 2321 of the pressurizer injects gas into the air chamber 233, and the diaphragm 231 is expanded and deformed to a downward arc convex shape by the preset air pressure, thereby pressing against the pick-up tool 21 to move downward, and the receiving surface 224 of the base 22 is guided. The contact surface 214 of the pick-up tool 21 is guided to slide and fit together. Since the receiving surface 224 of the base 22 and the contact surface 214 of the pick-up tool 21 have a curved arc that matches each other and has a gradually decreasing size, the receiving surface 224 of the base 22 can be stuck against the contact surface 214 of the pick-up tool 21, thereby positioning the pick-up tool 21 on the base 22. When the receiving surface 224 of the base 22 and the contact surface 214 of the pick-up tool 21 fit together, the receiving groove of the base 22 There is no assembly gap between 221 and the pick-up device 21; therefore, the pick-up device 21 will not randomly rotate horizontally or swing vertically during the transfer stroke. In other words, the pick-up device 21 can keep the electronic component 32 in the correct placement position and angle during the transfer stroke, and then accurately transfer the correctly placed electronic component 32 to the tester 33, so that the contacts of the electronic component 32 can accurately electrically contact the probes of the tester 33 to perform the test operation, thereby improving the test quality.

[0051] See also Fig. 9 , Fig.10 Another type of picking component 217 of the picking tool 21 of the picking mechanism has the function of picking up and crimping. When the picking tool 21 is used to pick up and crimp another electronic component 34 with an inclined top surface, the picking tool 21 will bear the reaction force of the electronic component 34 and press the diaphragm 231 upward for buffering displacement. Since the contact surface 214 of the picking tool 21 and the receiving surface 224 of the base 22 are matched in an arc, the picking tool 21 can be tilted (for example, swung vertically) to match the top surface inclination of the electronic component 34, so that the picking component 217 of the picking tool 21 fits and evenly crimps the electronic component 34, so that the electronic component 34 can perform testing operations under a state of even force, thereby improving the test quality. When the pick-up tool 21 takes out the electronic component 34 , the diaphragm 231 presses the pick-up tool 21 downward, and the pick-up tool 21 uses the contact surface 214 to move along the receiving surface 224 of the base 22 to correct the position.

[0052] See also Figure 2 to Figure 6, Fig.11 , an operating equipment, comprising a machine 40, a feeding device 50, a receiving device 60, an operating device 70, a conveying device 80 and a central control device (not shown); the feeding device 50 is mounted on the machine 40, and is provided with at least one feeding support 51 for accommodating at least one electronic component to be operated; the receiving device 60 is mounted on the machine 40, and is provided with at least one receiving support 61 for accommodating at least one electronic component that has been operated; the operating device 70 is mounted on the machine 40, and is provided with at least one operating device for performing a preset operation on the electronic component; in this embodiment, the operating device is a tester, and the tester is provided with an electrically connected circuit board 71 and a test socket 72 with a probe to perform a test operation on the electronic component; the conveying device 80 is configured on the machine 40, and is provided with at least one picking mechanism of the present invention for transferring the electronic component; in this embodiment, the conveying device 80 uses a first material mover 81 to pick up the electronic component from the feeding support 51 of the feeding device 50 The electronic components to be tested are taken out and transferred to an infeed carrier 82. The infeed carrier 82 carries the electronic components to be tested to the side of the operating device 70. The picking mechanism of the present invention drives the picking device 21 to take out the electronic components to be tested from the infeed carrier 82 with the actuator arm 24, and prevents the electronic components to be tested from any horizontal rotation during the transfer stroke, so that the electronic components to be tested maintain the correct placement position and angle. The picking device 21 accurately moves the electronic components to be tested into the test seat 72 of the operating device 70 to perform the test operation, and transfers the tested electronic components to an outfeed carrier 83. The outfeed carrier 83 carries out the tested electronic components. A second material mover 84 takes out the tested electronic components from the outfeed carrier 83, and according to the test results, transports the tested electronic components to the receiving device 60 at the receiving device 61 for classified storage. The central control device is used to control and integrate the actuation of each device to perform automated operations, thereby achieving the practical benefit of improving operating efficiency.

Claims

1. A picking mechanism, characterized in that: Include: The pick-up tool is provided with at least one pick-up component for picking up electronic components, and defines a first working surface and a second working surface along the axis, the first working surface is provided with at least one first long axis and at least one first short axis, and the ends of the first long axis and the first short axis are connected to form a first contour in the form of a non-circular curve, and the first working surface of the pick-up tool is provided with a gradually shrinking bonding surface facing the second working surface; Base: A receiving groove is provided for receiving the picking tool, the receiving groove defines a third working surface and a fourth working surface along the axis, the third working surface is provided with at least one third long axis and at least one third short axis, and the ends of the third long axis and the third short axis are connected to form a third contour in a non-circular curve, the third working surface of the receiving groove is provided with a receiving surface with a gradually reduced size facing the fourth working surface, so as to fit and clamp against the contact surface of the picking tool.

2. The picking mechanism according to claim 1, characterized in that: The first major axis and the first minor axis of the pick-up tool intersect, and the line segment of the first contour is a straight line or a curved line.

3. The picking mechanism according to claim 1, characterized in that: The line segment of the first contour of the pick-up tool gradually decreases in size from the end of the first short axis toward the end of the first long axis.

4. The picking mechanism according to claim 1, characterized in that: The contact surface of the pick-up tool is a plane or a curved surface.

5. The picking mechanism according to claim 1, characterized in that: The third major axis and the third minor axis of the base intersect, and the line segment of the third contour is a straight line or a curved line.

6. The picking mechanism according to claim 1, characterized in that: The line segment of the third contour of the base gradually decreases in size from the end of the third short axis toward the end of the third long axis.

7. The picking mechanism according to claim 1, characterized in that: The receiving surface of the base is a plane or a curved surface.

8. The picking mechanism according to any one of claims 1 to 7, characterized in that: The utility model also comprises a pressure device, which is assembled on the base and used for pressing down the picking tool.

9. The picking mechanism according to any one of claims 1 to 7, characterized in that: The utility model also comprises an actuating arm for driving the base to move in at least one direction.

10. An operating device, characterized in that: Include: Machine; A feeding device: arranged on the machine platform and provided with at least one feeding receiving device for accommodating electronic components to be processed; A receiving device: arranged on the machine, and provided with at least one receiving receiving device for accommodating the processed electronic components; Operation device: configured on the machine and provided with at least one operation device for performing a preset operation on the electronic component; A conveying device: arranged on the machine and provided with at least one picking mechanism as described in any one of claims 1 to 7 for transferring electronic components; Central control device: used to control and integrate the operations of various devices.

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