Tile quality monitoring method, device, system and computer-readable storage medium

Abstract

The present invention provides a ceramic tile quality monitoring method, device, system, and computer-readable storage medium. The method detects the quality of ceramic tile samples moving through an assembly line and then evaluates their thickness. This method automatically evaluates the quality of each ceramic tile sample in the assembly line during production, avoiding the defects of existing manual sampling methods that can lead to missed inspections, false inspections, and an inability to guarantee the quality of each product. The method provided by the present invention improves detection accuracy and precision, reduces production costs, and facilitates the quality inspection of ceramic tile blanks.

Description

Technical Field

[0001] The present invention relates to the technical field of tile production quality inspection, and more specifically, to a tile quality monitoring method, device, system and computer-readable storage medium. Background Art

[0002] Ceramic tiles are a building or decorative material with acid and alkali-resistant porcelain or stone textures, made from a combination of refractory metal oxides and / or semi-metal oxides through a process of grinding, mixing, pressing, glazing, and sintering. The raw materials are typically clay and quartz sand, mixed at high temperatures and compressed, resulting in a generally very hard material.

[0003] During the production process of ceramic tiles, when the bricks are punched into block-shaped green bricks by a brick press, the thickness of the bricks in different batches on the production line, and even the front and back bricks of the same batch, will vary to varying degrees due to the operating conditions of the brick press and the parameters of the raw materials.

[0004] The existing quality inspection method on production lines relies on technicians to periodically check the thickness of bricks using a vernier caliper to ensure product quality. This method suffers from the inability to monitor all bricks produced in real time. Furthermore, spot checks are limited to a single brick, failing to ensure overall product quality. Furthermore, spot checks require labor, which in turn increases production costs. Summary of the Invention

[0005] In view of this, the present invention provides a ceramic tile quality monitoring method, which is applied to the detection of ceramic tile samples to be tested moving in an assembly line, comprising:

[0006] Obtain the standard plate data of the calibration sample;

[0007] Acquiring the test data of the tile sample to be tested according to the preset first sampling coordinate information;

[0008] Calculate the comprehensive thickness evaluation value based on the standard plate data and the test data of the sample to be tested;

[0009] The comprehensive thickness evaluation value is compared with a preset brick specification threshold value to evaluate the quality of the tile sample to be tested.

[0010] Preferably, the step of obtaining the standard plate data of the calibration template includes:

[0011] According to the first sampling coordinate information, the upper standard plate distance and the lower standard plate distance are obtained, and the upper standard plate distance and the lower standard plate distance are used as standard plate data; wherein,

[0012] The upper standard plate distance is the distance to the upper plane of the calibration template collected by the first laser ranging sensor; the lower standard plate distance is the distance to the lower plane of the calibration template collected by the second laser ranging sensor.

[0013] Preferably, the detection data of the sample to be tested includes: an upper distance to the sample to be tested and a lower distance to the sample to be tested; wherein the upper distance to the sample to be tested is the distance to the upper plane of the tile sample to be tested collected by the first laser ranging sensor; the lower distance to the sample to be tested is the distance to the lower plane of the tile sample to be tested collected by the second laser ranging sensor;

[0014] The comprehensive thickness evaluation value calculated based on the standard plate data and the test data of the sample to be tested includes:

[0015] The comprehensive thickness evaluation value is obtained by calculating the distance between the upper sample to be measured, the lower sample to be measured, the upper standard plate and the lower standard plate using the standard plate data of the calibration template as a reference.

[0016] Preferably, the comprehensive thickness evaluation value includes: the thickness measured at a fixed point;

[0017] The brick specification thresholds include: brick thickness thresholds;

[0018] The comprehensive thickness evaluation value is calculated based on the upper sample distance to be measured, the lower sample distance to be measured, the upper standard plate distance, and the lower standard plate distance, using the standard plate data of the calibration template as a reference, including:

[0019] Calculating the standard plate thickness corresponding to the coordinates in the first sampling coordinate information of the tile sample to be tested by the standard plate data;

[0020] Use the following formula to calculate the measured thickness at a fixed point:

[0021] H=H0+(H 10 -H 1i )+(H 20 -H 2i );

[0022] Wherein, H is the measured thickness at the fixed point, H0 is the thickness of the standard plate, and H 10 is the upper standard plate distance, H 20 is the lower standard plate distance, H 1i is the distance to the sample to be tested, H 2i is the distance of the sample to be tested;

[0023] The step of comparing the comprehensive thickness evaluation value with the brick specification threshold value to evaluate the quality of the tile sample to be tested includes:

[0024] Determining whether the thickness actually measured at the fixed point exceeds the brick thickness threshold;

[0025] If so, the tile sample to be tested is determined to be a defective tile blank, and a first alarm message is generated so as to determine the corresponding tile sample to be tested according to the first alarm message.

[0026] Preferably, the comprehensive thickness evaluation value further includes: the upper surface range value and the lower surface range value of the tile sample to be tested;

[0027] The brick specification threshold also includes: an upper range threshold and a lower range threshold; wherein the upper surface range value corresponds to the upper range threshold, and the lower surface range value corresponds to the lower range threshold;

[0028] The method further comprises: using the standard plate data of the calibration template as a reference, calculating the comprehensive thickness evaluation value according to the upper sample distance to be measured, the lower sample distance to be measured, the upper standard plate distance, and the lower standard plate distance.

[0029] Obtain all the upper sample distances to be measured corresponding to the first sampling coordinate information, and filter out the maximum value thereof as H 1imax ; Filter out the minimum value as H 1imin ; and, obtaining all the next sample distances to be measured corresponding to the first sampling coordinate information, screening out the maximum value thereof, as H 2imax ; Filter out the minimum value as H 2imin ;

[0030] The upper surface range value and the lower surface range value of the tile sample to be tested are calculated using the following formula:

[0031] H1=H 1imax -H 1imin ;

[0032] H2=H 2imax -H 2imin ;

[0033] Among them, H1 is the upper surface range value, H2 is the lower surface range value, H 1imax is the maximum value of the distance of the sample to be tested, H 1imin is the minimum value of the distance to be tested, H 2imax is the maximum value of the distance of the sample to be tested, H 2imin is the minimum value of the distance of the sample to be tested;

[0034] The method of comparing the comprehensive thickness evaluation value with the brick specification threshold value to evaluate the quality of the tile sample to be tested further includes:

[0035] Determine whether the upper surface range value exceeds the upper range threshold value corresponding thereto, and whether the lower surface range value exceeds the lower range threshold value corresponding thereto;

[0036] If one or both of the upper surface range value and the lower surface range value exceed the corresponding upper range threshold and the lower range threshold, the tile sample to be tested is determined to be a defective brick, and a second alarm message is generated to facilitate determining the corresponding tile sample to be tested based on the second alarm message.

[0037] Preferably, after determining whether the thickness measured at the fixed point exceeds the brick thickness threshold, the method further includes:

[0038] If not, then according to the preset second sampling coordinate information, obtain the upper sample distance and the lower sample distance corresponding to each coordinate in the second sampling coordinate information of the tile sample to be tested; wherein the first sampling coordinate information includes at least four coordinates, and the coordinates can form a first matrix adapted to the size of the upper surface of the tile sample to be tested; the second sampling coordinate information includes at least four coordinates, and the coordinates can form a second matrix adapted to the size of the lower surface of the tile sample to be tested;

[0039] Based on a preset upper 3D error threshold and a preset lower 3D error threshold, determining a defective brick according to the upper distance to be measured and the lower distance to be measured corresponding to the first sampling coordinate information in the first matrix, and the upper distance to be measured and the lower distance to be measured corresponding to the second sampling coordinate information in the second matrix;

[0040] The upper 3D error threshold and the lower 3D error threshold are respectively the upper 3D error threshold of the upper surface and the lower 3D error threshold of the lower surface of the tile sample to be tested, which are preset according to the first sampling coordinate information and the second sampling coordinate information.

[0041] Preferably, the method of determining a defective brick based on a preset upper 3D error threshold and a preset lower 3D error threshold, according to the upper distance to be measured and the lower distance to be measured corresponding to the first sampling coordinate information in the first matrix, and the upper distance to be measured and the lower distance to be measured corresponding to the second sampling coordinate information in the second matrix, includes:

[0042] Obtaining the size specification data of the ceramic tile sample to be tested as the measurement bottom surface corresponding to the ceramic tile sample to be tested;

[0043] Taking the measurement bottom surface as the base, the upper sample distance H to be measured based on each second sampling coordinate information in the second matrix 1i, construct a 3D upper groove morphology model corresponding to the upper surface of the tile sample to be tested; and, with the measurement bottom surface as the base, the lower sample distance H of each second sampling coordinate information in the second matrix is 2i , constructing a 3D lower groove morphology model corresponding to the lower surface of the tile sample to be tested;

[0044] According to the measured thickness H of the tile sample to be tested at the fixed point, with the measured bottom surface as the base, the upper distance H of the sample to be tested based on each first sampling coordinate information in the first matrix 1i and the distance H between the lower sample to be tested 2i , constructing a 3D model of the tile sample to be tested;

[0045] Determining whether the degree of match between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model exceeds the upper 3D error threshold, and whether the degree of match between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model exceeds the corresponding lower 3D error threshold;

[0046] If the matching degree between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model, as well as the matching degree between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model, one or all of them exceed the corresponding upper 3D error threshold and the lower 3D error threshold, then the tile sample to be tested is determined to be a defective brick, and a third alarm message is generated to facilitate determination of the corresponding tile sample to be tested based on the third alarm message.

[0047] In addition, to solve the above problems, the present invention also provides a tile quality monitoring device, which is used to detect tile samples to be tested moving in an assembly line, comprising:

[0048] An acquisition module is used to obtain the standard plate data of the calibration sample;

[0049] The acquisition module is further configured to acquire the test data of the tile sample to be tested according to the preset first sampling coordinate information;

[0050] A calculation module, configured to calculate a comprehensive thickness evaluation value based on the standard plate data and the test data of the sample to be tested;

[0051] The evaluation module is used to compare the comprehensive thickness evaluation value with a preset brick specification threshold value so as to evaluate the quality of the tile sample to be tested.

[0052] In addition, to solve the above problems, the present invention also provides a tile quality monitoring system, including a memory and a processor, wherein the memory is used to store a tile quality monitoring program, and the processor runs the tile quality monitoring program to enable the tile quality monitoring system to execute the tile quality monitoring method as described above.

[0053] In addition, to solve the above problems, the present invention also provides a computer-readable storage medium, on which a tile quality monitoring program is stored. When the tile quality monitoring program is executed by a processor, the tile quality monitoring method as described above is implemented.

[0054] The present invention provides a method, device, system, and computer-readable storage medium for monitoring the quality of ceramic tiles. The method comprises obtaining standard plate data for a calibration template; obtaining sample detection data of a ceramic tile sample to be tested based on preset first sampling coordinate information; calculating a comprehensive thickness evaluation value based on the standard plate data and the sample detection data; and comparing the comprehensive thickness evaluation value with a preset brick blank specification threshold value to facilitate evaluation of the quality of the ceramic tile sample to be tested. The present invention can automatically evaluate the quality of ceramic tile samples to be tested during the production process of the production line by detecting the quality of the ceramic tile samples to be tested moving in the production line, thereby avoiding the defects of missed inspections and wrong inspections in manual sampling in existing quality inspection methods, and failing to guarantee the quality of each product, thereby reducing production costs and bringing convenience to the quality inspection of ceramic tile blanks. BRIEF DESCRIPTION OF THE DRAWINGS

[0055] Figure 1 This is a schematic diagram of the hardware operating environment involved in the embodiment of the ceramic tile quality monitoring method of the present invention;

[0056] Figure 2 This is a flow chart of a first embodiment of a method for monitoring tile quality according to the present invention;

[0057] Figure 3 This is a flow chart of a second embodiment of the ceramic tile quality monitoring method of the present invention;

[0058] Figure 4 This is a flow chart of a third embodiment of a method for monitoring tile quality according to the present invention;

[0059] Figure 5 4 is a flowchart of the detailed steps S110 and S200, and S300 and S400 of the third embodiment of the ceramic tile quality monitoring method of the present invention;

[0060] Figure 6 This is a flow chart of a fourth embodiment of a method for monitoring tile quality according to the present invention;

[0061] Figure 7This is a flow chart of a fifth embodiment of a method for monitoring tile quality according to the present invention;

[0062] Figure 8 This is a schematic diagram of a detailed flow chart of step S440 in the fifth embodiment of the ceramic tile quality monitoring method of the present invention;

[0063] Figure 9 Schematic diagram of a 3D sample model for testing in a fifth embodiment of the ceramic tile quality monitoring method of the present invention (the left side is the ceramic tile sample for testing, and the right side is the 3D sample model for testing);

[0064] Figure 10 Schematic diagram of the matching process of step S444 in the fifth embodiment of the ceramic tile quality monitoring method of the present invention (top: 3D upper groove morphology model; middle: 3D sample model to be tested; bottom: 3D lower groove morphology model);

[0065] Figure 11 This is a schematic diagram of the functional modules of the tile quality monitoring device of the present invention;

[0066] Figure 12 This is a schematic diagram of the circuit connection and module connection of the tile quality monitoring system of the present invention.

[0067] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0068] The embodiments of the present invention are described in detail below, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions.

[0069] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0070] In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "connect," "fixed," etc. should be understood broadly. For example, they may refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0071] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0072] like Figure 1 As shown, Figure 1 It is a structural diagram of the hardware operating environment of the terminal involved in the embodiment of the present invention.

[0073] The tile quality monitoring system of the embodiment of the present invention can be a PC, or a mobile terminal device such as a smart phone, a tablet computer or a portable computer. Figure 1 As shown, the tile quality monitoring system may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, and a communication bus 1002. The communication bus 1002 is used to enable communication between these components. The user interface 1003 may include a display screen, an input unit such as a keyboard, or a remote control. Optionally, the user interface 1003 may also include a standard wired interface or a wireless interface. The network interface 1004 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface). The memory 1005 may be a high-speed RAM memory or a stable memory such as a disk drive. The memory 1005 may also be a storage device independent of the aforementioned processor 1001. Optionally, the tile quality monitoring system may also include RF (Radio Frequency) circuits, audio circuits, a WiFi module, and the like. Furthermore, the tile quality monitoring system may also be configured with other sensors such as a gyroscope, a barometer, a hygrometer, a thermometer, and an infrared sensor, which are not described in detail here.

[0074] Those skilled in the art will understand that Figure 1 The tile quality monitoring system shown in the figure does not constitute a limitation thereof, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently. Figure 1 As shown, the memory 1005 as a computer-readable storage medium may include an operating system, a data interface control program, a network connection program, and a tile quality monitoring program.

[0075] The present invention provides a ceramic tile quality monitoring method and device. The method can automatically evaluate the quality of ceramic tile samples moving in a certain direction on an assembly line, thereby improving the precision and accuracy of quality inspection, reducing production costs, and facilitating the quality inspection of ceramic tile blanks.

[0076] Example 1:

[0077] Reference Figure 2 A first embodiment of the present invention provides a ceramic tile quality monitoring method, which is applied to the detection of ceramic tile samples moving in an assembly line, comprising:

[0078] Step S100, obtaining standard plate data of the calibration sample;

[0079] Step S200, obtaining the test data of the tile sample to be tested according to the preset first sampling coordinate information;

[0080] As mentioned above, in step S100, before obtaining the standard plate data of the calibration template, if the following information is not preset, a preset step may be further included, where the preset information includes the first sampling coordinate information and the brick specification threshold.

[0081] The above-mentioned production process of ceramic tile blanks is aimed at ceramic tile samples to be tested that are moved in an orderly manner by conveyor belts, conveyor tables, and other moving devices in the assembly line.

[0082] The ceramic tile samples to be tested are the sample ceramic tiles that are conveyed in the production line and need to be inspected for quality.

[0083] The calibration template, as described above, serves as a reference sample for calibrating the laser rangefinder. It's like a standard sample for a particular batch and type of tile, and is used to evaluate the quality of other tile samples against the specifications of this calibration template. During calibration, the data from the reference sample is captured, effectively resetting the laser rangefinder. When evaluating tile samples in the production line, the increase or decrease relative to the original calibration template's specifications is calculated based on this calibration template, thereby determining whether the current tile sample is defective or meets specification requirements.

[0084] As mentioned above, the preset information can be manually preset or automatically preset by the system according to the on-site working conditions, sample status and situation.

[0085] As mentioned above, the first sampling coordinate information is a pre-set set of coordinate points for sampling on the surface of the tile to be tested, which may include one or more coordinate points. Each coordinate point is a set of coordinate points with the plane where the tile is located as the platform and the overall horizontal plane size of the tile to be tested as the range, that is, each coordinate point in the first sampling coordinate information falls within the range of the overall horizontal plane size of the tile to be tested.

[0086] Step S300, calculating a comprehensive thickness evaluation value based on the standard plate data and the test data of the sample to be tested;

[0087] Step S400: comparing the comprehensive thickness evaluation value with a preset brick specification threshold value to evaluate the quality of the tile sample to be tested.

[0088] The above-mentioned detection data of the sample to be tested is the data detected for each coordinate point in the first sampling coordinate information of the tile sample to be tested, including but not limited to laser ranging, surface area measurement, etc.

[0089] As mentioned above, the comprehensive thickness evaluation value is calculated based on the standard plate data and the test data of the sample to be tested, which is a value for evaluating the surface thickness of different coordinate points or a single coordinate point in the tile to be tested, and is used to evaluate the flatness of the tile to be tested.

[0090] As mentioned above, the brick specification threshold is the pre-set maximum and / or minimum value of the thickness, shape, and condition of the batch of tiles, which may include but is not limited to the threshold of thickness condition, such as the maximum thickness value, the minimum thickness value, and may also be the surface area, surface texture, etc.

[0091] The present embodiment provides a method and device for monitoring the quality of ceramic tiles. The method includes presetting first sampling coordinate information, a brick blank specification threshold, and obtaining standard plate data for a calibration template; obtaining the test data of the ceramic tile sample to be tested based on the first sampling coordinate information; calculating a comprehensive thickness evaluation value based on the standard plate data and the test data of the sample to be tested; and comparing the comprehensive thickness evaluation value with the brick blank specification threshold to facilitate the evaluation of the quality of the ceramic tile sample to be tested. The present embodiment can detect the quality of the ceramic tile sample to be tested moving in the assembly line, and then evaluate the thickness of the ceramic tile sample to be tested. It can automatically evaluate the quality of the ceramic tile sample to be tested during the assembly line production process, avoiding the existing quality inspection method that can only be carried out through manual sampling, which has the problems of missed inspection and wrong inspection, so that the quality of each product cannot be guaranteed. The present method improves the precision and accuracy of quality inspection, can timely locate defective products, reduces production costs, and brings convenience to the quality inspection of ceramic tile blanks.

[0092] Example 2:

[0093] Reference Figure 3 The second embodiment of the present invention provides a method for monitoring tile quality. Based on the above embodiment 1, the step S100 of obtaining the standard plate data of the calibration sample includes:

[0094] Step S110: Acquire an upper standard plate distance and a lower standard plate distance according to the first sampling coordinate information, and use the upper standard plate distance and the lower standard plate distance as standard plate data; wherein the upper standard plate distance is the distance to the upper plane of the calibration template collected by the first laser ranging sensor; and the lower standard plate distance is the distance to the lower plane of the calibration template collected by the second laser ranging sensor.

[0095] It should be noted that the system utilized in the tile quality monitoring method provided in this embodiment includes an assembly line, which is provided with a conveying device (conveyor belt, or a slide) that can move tile products in a directional manner. The tiles can move along the conveyor belt, and the upper and lower surfaces of the tiles can be mounted on the conveyor belt without obstruction.

[0096] It should be noted that the system includes two laser ranging sensors, namely the first laser ranging sensor located above the conveyor belt and the second laser ranging sensor located below the conveyor belt. The positions of the two sensors correspond to each other, one above and one below, and the lasers emitted are facing each other, corresponding to each other, and can overlap. They are used to detect the distance data of a certain coordinate of the first sampling coordinate information in the horizontal plane of the tile sample to be tested or the calibration template based on the ranging sensor.

[0097] As mentioned above, in step S110, the first laser ranging sensor is used to emit a laser downward to collect the distance between the sensor and the upper standard plate on the upper surface of the tile sample to be tested; similarly, the second laser ranging sensor is used to collect the distance between the lower standard plate and the lower surface of the distance calibration template; the two template data are used together as the standard plate data.

[0098] In this embodiment, the upper second laser ranging sensor is used to collect the sample distances of the upper and lower planes of the calibration sample as standard plate data, which is used to evaluate the thickness deviation between the ceramic tile sample to be tested and the calibration sample. It can more accurately indicate the thickness deviation of the ceramic tile sample to be tested and the calibration sample at different coordinates on the assembly line, thereby improving the accuracy of quality inspection.

[0099] Example 3:

[0100] Reference Figure 4-5 This embodiment provides a method for monitoring tile quality, based on the above embodiment 2.

[0101] In step S200, the detection data of the sample to be tested includes: an upper distance to the sample to be tested and a lower distance to the sample to be tested; wherein the upper distance to the sample to be tested is the distance to the upper plane of the tile sample to be tested collected by the first laser ranging sensor; the lower distance to the sample to be tested is the distance to the lower plane of the tile sample to be tested collected by the second laser ranging sensor;

[0102] In addition, based on the above embodiment, the standard plate data includes: the upper standard plate distance and the lower standard plate distance;

[0103] The step S300 of calculating the comprehensive thickness evaluation value based on the standard plate data and the test data of the sample to be tested includes:

[0104] Step S310 , using the standard plate data of the calibration template as a reference, the comprehensive thickness evaluation value is calculated according to the upper sample distance to be measured, the lower sample distance to be measured, the upper standard plate distance, and the lower standard plate distance.

[0105] In this embodiment, by using the standard plate data as a reference, a comprehensive thickness evaluation value is calculated based on the upper sample distance to be tested, the lower sample distance to be tested, the upper standard plate distance and the lower standard plate distance, which is used to evaluate the thickness of the upper and lower planes of the ceramic tile sample to be tested, thereby improving the accuracy of ceramic tile quality inspection.

[0106] Furthermore, the comprehensive thickness evaluation value includes: the thickness measured at a fixed point;

[0107] Brick specification thresholds include: brick thickness threshold;

[0108] The tile green thickness threshold is the range threshold for the thickness of a standard sample (reference sample, calibration sample, or reference tile used as a benchmark for quality evaluation). This range threshold can be a maximum and minimum value, used to evaluate the thickness of tiles in the production line, indicating that the tile must not exceed either the maximum or minimum thickness. This threshold can be the average thickness of the entire green tile, used to evaluate the overall thickness of the tile sample or the thickness of each coordinate point.

[0109] The step S310, using the standard plate data of the calibration template as a reference, calculates the comprehensive thickness evaluation value according to the upper sample distance to be measured, the lower sample distance to be measured, the upper standard plate distance, and the lower standard plate distance, including:

[0110] Step S311, calculating the standard plate thickness corresponding to the coordinates in the first sampling coordinate information of the tile sample to be tested through the standard plate data;

[0111] The above-mentioned standard plate data includes the upper standard plate distance and the lower standard plate distance. The thickness of the calibration sample used as a reference can be calculated by the upper standard plate distance and the lower standard plate distance. For example, by using the total distance between the first laser distance sensor and the second laser distance sensor as D, the standard plate thickness H0 = D - (H 10 +H 20 ). The thickness is the standard plate thickness for the coordinate position of the first sampling coordinate information.

[0112] Step S312: Calculate the measured thickness at a fixed point using the following formula:

[0113] H=H0+(H 10 -H 1i )+(H20 -H 2i );

[0114] Among them, H is the measured thickness at a fixed point, H0 is the standard plate thickness, and H 10 is the distance from the upper standard plate, H 20 is the distance from the lower standard plate, H 1i is the distance to the sample to be tested, H 2i is the distance of the next sample to be tested;

[0115] The step S400, comparing the comprehensive thickness evaluation value with a preset brick specification threshold value to evaluate the quality of the tile sample to be tested, includes:

[0116] Step S410, determining whether the thickness measured at the fixed point exceeds the brick thickness threshold;

[0117] Step S420: If yes, the tile sample to be tested is determined to be a defective tile, and a first alarm message is generated so as to determine the corresponding tile sample to be tested according to the first alarm message.

[0118] The fixed-point measured thickness is the thickness value of the tile sample to be measured corresponding to each coordinate in the preset first sampling coordinate information.

[0119] As mentioned above, the brick thickness threshold may be a specific range of values, and exceeding the brick thickness threshold may be greater than the threshold or less than the threshold, that is, exceeding the brick thickness threshold is considered to be not within the threshold range.

[0120] The first alarm signal, described above, indicates the presence of defective tiles. This signal is used to locate and identify the tile sample to be tested that has a thickness defect. This alarm signal indicates that the thickness of a product in the production line has exceeded the threshold for the actual thickness of the tile blank, indicating that the product is defective.

[0121] In this embodiment, based on the data collected by the second laser ranging sensor, the calibration sample is used as a reference. The thickness of the sample to be tested corresponding to a certain coordinate is first calculated, and then the thickness is compared with the brick thickness threshold of the calibration sample used as the reference. If the threshold is exceeded, it is determined that a defective product has appeared. Then, the defective ceramic tile sample to be tested is determined through the first alarm information. This can automatically evaluate the quality of the ceramic tile sample to be tested during the assembly line production process, avoiding the defects of missed inspections and false inspections in manual sampling in existing quality inspection methods and the inability to guarantee the quality of each product, reducing production costs, and bringing convenience to the quality inspection of ceramic tile blanks.

[0122] Example 4:

[0123] Reference Figure 6, this embodiment provides a ceramic tile quality monitoring method, based on the above embodiment 3, the comprehensive thickness evaluation value further includes: the upper surface extreme value and the lower surface extreme value of the ceramic tile sample to be tested;

[0124] The brick specification threshold also includes: an upper range threshold and a lower range threshold; wherein the upper surface range value corresponds to the upper range threshold, and the lower surface range value corresponds to the lower range threshold;

[0125] As mentioned above, the upper range threshold and the lower range threshold are preset, and the matching thresholds corresponding to the calibration template can be range values. If they enter the range, they meet the conditions. If they exceed the range, they are defective bricks. They are used to evaluate the flatness of the ceramic tile samples to be tested and can reflect the overall state of the plane.

[0126] The step S310, using the standard plate data of the calibration template as a reference, calculates the comprehensive thickness evaluation value according to the upper sample distance to be measured, the lower sample distance to be measured, the upper standard plate distance, and the lower standard plate distance, and further includes:

[0127] Step S313: Obtain all the upper sample distances to be measured corresponding to the first sampling coordinate information, and select the maximum value thereof as H 1imax ; Filter out the minimum value as H 1imin ; and, obtaining all the next sample distances to be measured corresponding to the first sampling coordinate information, screening out the maximum value thereof, as H 2imax ; Filter out the minimum value as H 2imin ;

[0128] As described above, in the production line, when the tile sample to be tested moves along the conveying device, the upper sample distance to be tested and the lower sample distance to be tested corresponding to each coordinate in the first sampling coordinate information are obtained, and the H 1imax 、H 1imin 、H 2imax and H 2imin For example, you can sort the data and then select the maximum and minimum values.

[0129] Step S314, using the following formula to calculate the upper surface range value and the lower surface range value of the tile sample to be tested:

[0130] H1=H 1imax -H 1imin ;

[0131] H2=H 2imax -H 2imin ;

[0132] Among them, H1 is the upper surface range value, H2 is the lower surface range value, H 1imax is the maximum value of the distance of the sample to be tested, H 1imin is the minimum value of the distance to be tested, H 2imax is the maximum value of the distance of the sample to be tested, H 2imin is the minimum value of the distance of the sample to be tested;

[0133] As mentioned above, the surface flatness of the tile is calculated by the difference between the maximum and minimum values in the upper sample distance to be measured and the difference between the maximum and minimum values in the lower sample distance to be measured corresponding to each coordinate in the first sampling coordinate information.

[0134] The step S400 of comparing the comprehensive thickness evaluation value with a preset brick specification threshold value to evaluate the quality of the tile sample to be tested further includes:

[0135] Step S430, determining whether the upper surface range value exceeds the upper range threshold value corresponding thereto, and whether the lower surface range value exceeds the lower range threshold value corresponding thereto;

[0136] Step S440: If one or both of the upper surface range value and the lower surface range value exceed the corresponding upper range threshold and the lower range threshold, the tile sample to be tested is determined to be a defective brick, and a second alarm message is generated to facilitate determining the corresponding tile sample to be tested based on the second alarm message.

[0137] It should be noted that the range, also known as the error range or the full range (Range), can be represented by R. It is used to represent the measure of variation in statistical data, the difference between its maximum and minimum values, that is, the data obtained by subtracting the minimum value from the maximum value.

[0138] In statistics, the range is used to characterize the degree of dispersion of a set of data. It reflects the range of variation and dispersion of the variable distribution. The difference between the standard values of any two units in the population cannot exceed the range. It also reflects the range of fluctuation within a set of data. A larger range indicates a greater degree of dispersion, and vice versa.

[0139] In this embodiment, the range is used to evaluate the discreteness of the distance data between the surface of the tile sample to be tested and the laser ranging sensor, thereby being able to directly reflect the flatness of the surface of the tile sample to be tested.

[0140] In step S430, it is determined whether the upper surface range value and the lower surface range value exceed their corresponding upper range threshold and lower range threshold; these are two determination steps performed according to the corresponding relationship:

[0141] Step 1: Determine whether the upper surface range value exceeds the upper range threshold;

[0142] Step 2: Determine whether the lower surface range value exceeds the lower range threshold.

[0143] The two judgment steps 1-2 can be performed simultaneously or sequentially. For example, if a result exceeds the threshold in one of the judgment steps (e.g., step 1), the other judgment step is not repeated and an alarm message is generated directly. In other words, if either step fails, the entire judgment step fails. Only when both steps 1-2 pass can the judgment step pass, confirming that the product is not defective.

[0144] Therefore, if the judgment is made at the same time, the above judgment results may have four situations:

[0145] A: 1-2 both do not exceed the extreme value threshold; B: 1 exceeds the extreme value threshold, 2 does not; C: 1 does not exceed the extreme value threshold, 2 exceeds the extreme value threshold; D: 1-2 both exceed the extreme value threshold.

[0146] Among them, the three situations B, C, and D will all trigger the judgment result, that is, the tile sample to be tested is judged to be a defective brick, and the second alarm information will be generated.

[0147] As mentioned above, the tile quality monitoring method provided in this embodiment includes consideration of the flatness of the tile sample to be tested. This technical solution can be carried out simultaneously with the technical solution for thickness value evaluation in Example 3, or the order of calculation can be swapped and evaluated separately, which does not affect the technical effect of this embodiment.

[0148] The second alarm information mentioned above is different from the first alarm information. This information is used to prompt that one or both of the upper surface extreme value and the lower surface extreme value of the product in the assembly line exceeds the corresponding extreme value threshold. The product is a product that has passed the first step of inspection (the actual measured thickness at the fixed point does not exceed the brick thickness threshold), but has not passed the additional second step inspection provided in this embodiment. Therefore, the product is a defective product.

[0149] In addition, the technical solution in Example 3 can also be used as a pre-judgment procedure, that is, the thickness value in Example 3 is evaluated first. If the evaluation passes, that is, step S410, the next step is "if not", then step S430 in this embodiment is performed for further evaluation, thereby improving the overall accuracy of the evaluation of whether the tile surface meets the control sample through two tile judgment methods.

[0150] In this embodiment, by utilizing the upper surface range value and the lower surface range value, the flatness of the tile sample to be tested can be reflected from the overall perspective of the tile by utilizing the statistical range, and the above values are compared with the preset upper range threshold and lower range threshold respectively. As long as one of them exceeds the threshold, it is determined that a defective product has appeared, and then the defective tile sample to be tested is determined through the first alarm information. This can realize automatic evaluation of the quality of the tile sample to be tested during the assembly line production process, avoiding the defects of missed inspections and wrong inspections in manual sampling in existing quality inspection methods, and failing to guarantee the quality of each product, thereby reducing production costs and bringing convenience to the quality inspection of tile blanks.

[0151] Example 5:

[0152] Reference Figure 7-10 This embodiment provides a method for monitoring tile quality. Based on the above embodiment 3, this embodiment provides another implementation scheme. After determining whether the thickness measured at the fixed point exceeds the brick thickness threshold in step S410, the method further includes:

[0153] Step S430: If not, then according to the preset second sampling coordinate information, obtain the upper distance to be measured and the lower distance to be measured corresponding to each coordinate in the second sampling coordinate information of the tile sample to be measured; wherein the first sampling coordinate information includes at least four coordinates, and the coordinates can form a first matrix adapted to the size of the upper surface of the tile sample to be measured; the second sampling coordinate information includes at least four coordinates, and the coordinates can form a second matrix adapted to the size of the lower surface of the tile sample to be measured;

[0154] Step S440: Determine defective bricks based on a preset upper 3D error threshold and a preset lower 3D error threshold, and according to the upper distance to be measured and the lower distance to be measured corresponding to the first sampling coordinate information in the first matrix, and the upper distance to be measured and the lower distance to be measured corresponding to the second sampling coordinate information in the second matrix;

[0155] The upper 3D error threshold and the lower 3D error threshold are respectively the upper 3D error threshold of the upper surface and the lower 3D error threshold of the lower surface of the tile sample to be tested, which are preset according to the first sampling coordinate information and the second sampling coordinate information.

[0156] As described above, before obtaining the standard plate data of the calibration template in step S100, in addition to presetting the first sampling coordinate information and the brick specification threshold, it is also necessary to pre-set the second sampling coordinate information corresponding to the first sampling coordinate information, and the upper 3D error threshold of the upper surface and the lower 3D error threshold of the lower surface of the tile sample to be tested are preset based on the first sampling coordinate information and the second sampling coordinate information; wherein,

[0157] The first sampling coordinate information includes at least four coordinates, and the coordinates can form a first matrix that is adapted to the surface size of the tile sample to be tested;

[0158] The second sampling coordinate information contains at least four coordinates, and the coordinates can form a second matrix adapted to the surface size of the tile sample to be tested;

[0159] The preset upper 3D error threshold for the upper surface and lower 3D error threshold for the lower surface of the tile sample to be tested are for both the upper and lower surfaces of the tile sample to be tested. Generally, only one upper surface error threshold is required for the data, as tiles generally have only one processing surface and one adhesive surface, and the adhesive surface often does not require high-precision quality inspection. However, to ensure the universality of the method provided in this embodiment, a corresponding error threshold can be preset for both the upper and lower surfaces for calculation and testing. The error threshold is the acceptable range of matching between models, or the error range.

[0160] As mentioned above, both the first sampling coordinate information and the second sampling coordinate information can be directed to a tile blank of a ceramic tile sample to be tested having an uneven processing surface, or can be directed to a ceramic tile having a flat surface.

[0161] As mentioned above, the first sampling coordinate information and the second sampling coordinate information are both preset coordinate information, which include multiple coordinate points. Each sampling coordinate information includes at least four coordinates. The multiple coordinates can form a matrix that matches the surface of the tile sample to be tested or the control sample. For example, if the tile sample to be tested is a 300*300 square tile, the horizontal and vertical directions are both defined as points of 100 pixels, and the coordinates are defined as the corresponding positions of the pixel points. The first sampling information can be A1(30,30), B1(70,30), C1(30,70), and D1(70,70) in the clockwise direction.

[0162] The coordinates in the second sampling coordinate information should correspond to those in the first sampling coordinate information. That is, if the first sampling coordinate information contains 10 coordinates, the second sampling coordinate information will contain the same 10 coordinates. However, the coordinates in the second sampling information may be different from the coordinate values in the first sampling information. For example, for the first sampling information in the previous paragraph, the second sampling information may be A2(35,35), B2(75,35), C2(35,75), and D2(75,75) in a clockwise direction.

[0163] The purpose is that there may be multiple protrusions or grooves on a tile process surface, so in order to detect the position of the protrusion or groove, each sampling coordinate point A1 is set, and another coordinate point A2 with a related and similar coordinate position is used as a comparison.

[0164] For example, a coordinate A1 (first sampling coordinate information) is set for the bulge 1 position on the upper left side of the tile, and then a check coordinate is made near the bulge 1 position A1, namely A2 (second sampling coordinate information). A1 and A2 are both aimed at the same bulge position of the tile for quality inspection. At the same time, there is a corresponding groove position next to the bulge position 1 of the tile, defined as groove 1, and B1 (first sampling coordinate information) and B2 (second sampling coordinate information) are defined at this position respectively. When matching, A1 and A2 match, B1 and B2 match, and A1A2 and B1B2 have a corresponding height difference relationship or position relationship or morphological relationship, that is, the two sets of coordinates can match in morphology and meet the preset error standard, which means that the bulge 1 and groove 1 positions of the tile have passed the quality inspection; otherwise, it is a defective brick.

[0165] It should be noted that general ceramic tiles (for home decoration and industrial use) include two surfaces, one is the process surface (the surface for display) and the other is the adhesive surface (the surface for coating concrete for adhesive). Existing quality inspection schemes for ceramic tiles are all aimed at ceramic tiles with flat process surfaces, which have no uneven process protrusions or grooves on the surface and are complete horizontal flat surfaces. However, the process surfaces of most of the existing process ceramic tiles on the market are not flat surfaces. Their process surfaces often have protrusions, grooves, process shapes, etc. made by etching, pasting, firing, etc. Therefore, it is impossible to use traditional automated methods to conduct quality inspection on such ceramic tiles with uneven process surfaces, and it is impossible to reflect the quality of the tiles. Quality inspection can only be carried out by quality inspectors through manual visual inspection, hand touch, rulers, etc., resulting in inconsistent quality inspection scales and standards, prone to missed inspections and wrong inspections, and increased production costs and reduced efficiency.

[0166] To solve the above problem, this embodiment provides a method that uses some of the existing data in the aforementioned embodiment to construct a 3D model and uses the re-collected data corresponding to the second sampling coordinate information to construct a model of the tile. The two or even multiple sets of coordinate data are all targeted at multiple different coordinate points on the tile process surface that can form a matrix. The data is sampled and evaluated using a preset error threshold between the multiple sets of data. If the 3D models of the two sets of data components can match and meet the conditions within the error range, the tile is confirmed to have passed the quality inspection. Otherwise, it is marked as a defective tile. The method provided by this embodiment can accurately evaluate the uneven process surface of each tile itself, improve the efficiency and accuracy of quality inspection, and avoid missed inspections and false inspections.

[0167] Furthermore, step S440, based on a preset upper 3D error threshold and a preset lower 3D error threshold, determines a defective brick according to the upper distance to be measured and the lower distance to be measured corresponding to the first sampling coordinate information in the first matrix, and the upper distance to be measured and the lower distance to be measured corresponding to the second sampling coordinate information in the second matrix, including:

[0168] Step S441, obtaining the size specification data of the tile sample to be tested as the measurement bottom surface corresponding to the tile sample to be tested;

[0169] The above-mentioned size specification data is the current length a and width b of a tile, for example, a300cm×b300cm, and the area value S can be obtained. Therefore, when constructing the corresponding model, the space can be modeled based on a, b and S; or, only the square box corresponding to the tile constructed with length a and width b can be included.

[0170] Step S442, (refer to Figure 10 ) Taking the measurement bottom surface as the base, based on the upper sample distance H of each second sampling coordinate information in the second matrix 1i , construct a 3D upper groove morphology model corresponding to the upper surface of the tile sample to be tested; and, with the measurement bottom surface as the base, the lower sample distance H of each second sampling coordinate information in the second matrix is 2i , constructing a 3D lower groove morphology model corresponding to the lower surface of the tile sample to be tested;

[0171] As mentioned above, the 3D upper groove morphology model and the 3D lower groove morphology model are both high cubes approximately in the vertical direction with the measured bottom surface corresponding to the tile as the base and the corresponding coordinate point as the height, and the direction facing the tile is a plane matching the relative surface of the tile.

[0172] Step S443, (refer to Figure 9) According to the measured thickness H of the tile sample to be tested, with the measurement bottom surface as the base, the upper sample distance H based on each first sampling coordinate information in the first matrix 1i and the distance H between the lower sample to be tested 2i , constructing a 3D model of the tile sample to be tested;

[0173] As mentioned above, the order of step S443 and step S442 can be interchanged or performed simultaneously without affecting each other, which is not limited here.

[0174] As mentioned above, if the 3D upper groove morphology model and the 3D lower groove morphology model are combined together, with reference to the thickness value, a groove with a cross-section that matches the shape of the tile sample to be tested can be formed. If the 3D sample model of the tile sample to be tested meets the standard, that is, the coordinates meet the preset error threshold, then it can just match the upper and lower groove morphology models, which means that the tile sample provided in this embodiment is not a defective tile and can pass the quality inspection.

[0175] As mentioned above, the thickness H measured at the fixed point is known, and the corresponding distance H from the sample to be measured is 1i The distance H between the sample to be tested and the 2i It is known that the measured thickness at a fixed point, the distance between the upper sample to be measured, and the distance between the lower sample to be measured are all measured values for the coordinate points. Therefore, with a sufficient number of coordinate points, the surface morphology of the front and back surfaces of the tile sample to be tested can be determined based on the measured values at each coordinate point, and a 3D model of the surface can be constructed based on the measured surface values at each coordinate point.

[0176] As mentioned above, if the technical surface of the tile blank is a relatively complex pattern with complex shapes, protrusions, and grooves, then by ensuring computing power and quality inspection time (modeling time, matching time), a sufficient number of coordinate points of the first sampling information can be selected. When building the model, the model can basically reflect the shape and state of the original surface of the tile to be tested. In short, the more coordinate points, the closer it is to restoring the original appearance of the tile to be tested, and the more accurate the quality inspection results.

[0177] Step S444, (refer to Figure 10 ) determining whether a degree of matching between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model exceeds an upper 3D error threshold, and whether a degree of matching between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model exceeds a corresponding lower 3D error threshold;

[0178] Step S445: If the degree of match between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model, as well as the degree of match between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model, one or all of them exceed the corresponding upper 3D error threshold and the lower 3D error threshold, then the tile sample to be tested is determined to be a defective brick blank, and a third alarm message is generated to facilitate determination of the corresponding tile sample to be tested based on the third alarm message.

[0179] In step S444, two judgment steps are performed according to the corresponding relationship:

[0180] Step 1: Determine whether the matching degree between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model exceeds the upper 3D error threshold;

[0181] Step 2: Determine whether the matching degree between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model exceeds the lower 3D error threshold.

[0182] Steps 1 and 2 can be performed simultaneously or sequentially. For example, if one of the two judgment steps fails, the other step is not repeated and an alarm message is generated directly. In other words, if either step fails, the entire judgment fails. Only if both steps 1 and 2 pass does the judgment step pass, confirming that the product is not defective.

[0183] Therefore, if the judgment is performed simultaneously, the above judgment results may be as follows:

[0184] A: Steps 1 and 2 do not exceed the 3D error threshold; B: Step 1 exceeds the 3D error threshold, but step 2 does not; C: Step 1 does not exceed the 3D error threshold, but step 2 exceeds the 3D error threshold; D: Steps 1 and 2 both exceed the 3D error threshold.

[0185] Among them, the three situations B, C, and D will all trigger the judgment result, that is, the tile sample to be tested is judged to be a defective brick, and the third alarm information will be generated.

[0186] The matching method between 3D models can be a matching calculation between the features of the models, for example, extracting the feature set of model A as A x , extract the feature set of model B as B x , calculate A x With B x The degree of matching (fitness) between two feature sets. In addition, the projection of the model component can be constructed, and the degree of matching between the projection and the plug-in component can be calculated, etc., which will not be repeated here.

[0187] The third alarm information mentioned above is different from the second alarm information and the first alarm information. This information is used to prompt that the product in the assembly line has one or all of the matching degrees between the upper surface and the 3D upper groove morphology model, and the matching degrees between the lower surface and the 3D lower groove morphology model that exceed the corresponding 3D error threshold. The product is a product that has passed the first step of inspection (the actual measured thickness at the fixed point does not exceed the brick thickness threshold), but has not passed the inspection equivalent to the additional second step provided in this embodiment. Therefore, the product is a defective product.

[0188] In this embodiment, some of the existing data in the aforementioned embodiments are used to construct a 3D model of the sample to be tested, and the re-collected data corresponding to the second sampling coordinate information are used to construct a 3D upper groove morphology model and a 3D lower groove morphology model of the tile. The two or even multiple groups of coordinate data are all targeted at multiple different coordinate points on the tile process surface that can form a matrix for data sampling, and the preset error threshold between the multiple groups of data is used for evaluation, that is, to determine whether the matching degree between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model exceeds the upper 3D error threshold, or whether the matching degree between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model exceeds the lower 3D error threshold; if the 3D models of the two groups of data components can match and meet the conditions within the error range, it is confirmed that the tile can pass the quality inspection, otherwise it is marked as a defective brick.

[0189] In this embodiment, based on the method in embodiment 3, firstly, the thickness of the tile sample to be tested is measured at a fixed point H=H0+(H 10 -H 1i )+(H 20 -H 2i ) is calculated, and the actual thickness measured at the fixed point is compared with the brick thickness threshold, and then the thickness of the tile sample to be tested is evaluated to see if it meets the standard. If it meets the product standard within the thickness consideration standard range, then in order to ensure that the tile sample to be tested with complex process surface morphology can meet the special morphology and shape unique to the tile, in addition to considering its thickness, it is also necessary to evaluate whether its specific 3D surface morphology meets the standard. This embodiment uses the upper surface extreme value and the lower surface extreme value to reflect the flatness of the tile sample to be tested from the overall perspective of the tile, and compares the above values with the preset upper extreme value and lower extreme value respectively. If the threshold is exceeded, it is determined that a defective product has occurred, and then the defective tile sample to be tested is determined through the first alarm information.

[0190] In summary, the method provided in this embodiment, through two consecutive evaluation steps, first evaluates the thickness, and after meeting the thickness standard, evaluates the 3D specific shape. If it meets the standard, the tile sample to be tested can ensure that the thickness meets the standard, and the surface morphology can also meet the specific standard. Therefore, the method in this embodiment can automatically evaluate the quality of the tile sample to be tested with complex process surface morphology from different angles (brick thickness, surface morphology) in the assembly line production process, avoiding the defects of missed inspections and wrong inspections in manual sampling in existing quality inspection methods, and the inability to guarantee the quality of each product. The method in this embodiment greatly improves the quality inspection accuracy, can carry out targeted quality inspection on ceramic tile blanks with complex process surfaces, improves the detection rate of defective brick blanks, improves the efficiency and accuracy of quality inspection, indirectly reduces production costs, and brings convenience to the quality inspection of ceramic tile blanks.

[0191] In addition, refer to the attached Figure 11 The present application also provides a tile quality monitoring device, which is used to detect tile samples moving in an assembly line, including:

[0192] An acquisition module 10 is used to acquire standard plate data for calibration sample;

[0193] The acquisition module 10 is further configured to acquire the test data of the tile sample to be tested according to the preset first sampling coordinate information;

[0194] A calculation module 20 is used to calculate a comprehensive thickness evaluation value based on the standard plate data and the test data of the sample to be tested;

[0195] The comparison module 30 is used to compare the comprehensive thickness evaluation value with a preset brick specification threshold value so as to evaluate the quality of the tile sample to be tested.

[0196] In addition, the present application also provides a tile quality monitoring system, including a memory and a processor, wherein the memory is used to store a tile quality monitoring program, and the processor runs the tile quality monitoring program to enable the tile quality monitoring system to perform the tile quality monitoring method as described above.

[0197] Another embodiment provides a tile quality monitoring system, referring to Figure 12 , which may include a ceramic tile thickness online monitoring device and a sensor, wherein the ceramic tile thickness online monitoring device includes a display unit, a thickness and surface flatness calculation unit, a laser ranging channel 1 (a channel corresponding to the first laser ranging sensor), a laser ranging channel 2 (a channel corresponding to the second laser ranging sensor), an RS458 interface, and a power supply (24V DC); wherein the sensor includes a first laser ranging sensor and a second laser ranging sensor.

[0198] The first laser distance sensor measures the distance H between the upper surface of the brick and the sensor in real time. 1i ,The second laser ranging sensor measures the distance H between the lower surface of the brick and the sensor in real time 2i , according to the measurement range of the laser ranging sensor, it is converted into a corresponding electrical signal (current or voltage);

[0199] As mentioned above, the laser ranging channel 1 and laser ranging channel 2 of the thickness online monitoring instrument receive the electrical signals output by the first laser ranging sensor and the second laser ranging sensor respectively, and convert the input electrical signals into corresponding distance values through analog-to-digital conversion, and send them to the thickness and upper and lower surface extreme difference calculation unit to calculate the brick thickness and upper and lower surface extreme difference. The thickness and flatness calculation method is as follows:

[0200] 1) Instrument initial value setting:

[0201] Before the instrument is put into operation, enter the instrument parameter setting interface and set the brick thickness, upper and lower thickness limits, upper surface extreme value lower limit and lower surface extreme value lower limit;

[0202] Select the data sampling period in the instrument parameter setting interface;

[0203] Place a flat plate with a known thickness (Ho) on the brick roller conveyor to simulate the brick;

[0204] In the instrument parameter setting interface, enter the thickness of the plate and select Confirm;

[0205] The instrument automatically memorizes the measured value H of the first laser distance sensor and the second laser distance sensor when confirming the selection 10 and H 20 ;

[0206] After exiting the setting interface, the instrument will automatically start running;

[0207] 2) Thickness calculation during operation:

[0208] The instrument collects the output signals H of the first laser ranging sensor and the second laser ranging sensor in real time through the laser ranging channel 1 and the laser ranging channel 2. 1i and H 2i ;

[0209] The brick thickness H is calculated once in each sampling period according to the following formula;

[0210] H=H0+(H 10 -H 1i )+(H 20 -H 2i );

[0211] After transferring a brick, calculate the upper surface range value (H1) and the lower surface range value (H2);

[0212] H1=H 1imax -H 1imin ;H2=H 2imax -H 2imin ;

[0213] H 1imax 、H 1imin 、H 2imax 、H 2imin The calculation results of the maximum and minimum values H, H1, H2 during the transmission of a brick are sent to the instrument display unit (display screen) for display, and are connected to an external computer via RS485.

[0214] When the calculated results of H, H1 and H2 exceed the settings (upper and lower limits of thickness, lower limit of upper and lower limit of extreme difference of upper surface and lower limit of extreme difference of lower surface), an audible and visual alarm will be issued and the alarm signal can be transmitted remotely via RS485.

[0215] In this embodiment, the following technical effects are achieved:

[0216] 1. The tile thickness online monitoring instrument can be used as a single instrument, or it can be used in conjunction with the instrument's RS485 communication port and computer software for local and remote thickness monitoring and alarm.

[0217] 2. When used alone, the brick production device can display the brick thickness in real time online. When the thickness exceeds the tolerance, it will send out sound and light and dry contact alarm signals. The dry contact alarm signal can be connected to the alarm system of the main control room of the tile production to drive the sound and light alarm in the main control room.

[0218] 3. When used in conjunction with computer software, the brick thickness and the absolute flatness of the upper and lower surfaces of the same brick measured at different points on the longitudinal straight line can be displayed remotely and in real time online, and the measurement results can be displayed in the form of a trend chart. The measurement results can be viewed at any time on the trend chart and the historical data of the measurement results can be saved. When the thickness or flatness exceeds the set value, an audible and visual alarm signal will be issued. In addition, the number of bricks produced and the number of bricks with abnormal flatness and thickness can be counted.

[0219] In addition, the present application also provides a computer-readable storage medium, on which a tile quality monitoring program is stored. When the tile quality monitoring program is executed by a processor, the tile quality monitoring method as described above is implemented.

[0220] In summary, the present application provides a method and device for monitoring the quality of ceramic tiles. The method includes obtaining standard plate data of a calibration template; obtaining the test data of the ceramic tile sample to be tested according to the preset first sampling coordinate information; calculating a comprehensive thickness evaluation value based on the standard plate data and the test data of the sample to be tested; and comparing the comprehensive thickness evaluation value with the preset brick blank specification threshold value to facilitate the evaluation of the quality of the ceramic tile sample to be tested. The present application can detect the quality of the ceramic tile sample to be tested moving in the assembly line, and then evaluate the thickness of the ceramic tile sample to be tested, thereby automatically evaluating the quality of the ceramic tile sample to be tested during the assembly line production process, avoiding the defects of missed inspections and wrong inspections in the manual sampling of the existing quality inspection methods, and failing to guarantee the quality of each product, thereby reducing production costs and bringing convenience to the quality inspection of ceramic tile blanks.

[0221] The serial numbers of the above embodiments of the present invention are for description only and do not represent the advantages or disadvantages of the embodiments.

[0222] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus the necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, including a number of instructions for enabling a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present invention. The above is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly used in other related technical fields, are similarly included in the patent protection scope of the present invention.

Claims

1. A method for monitoring tile quality, characterized in that: Applicable to the detection of ceramic tile samples moving in the production line, including: According to the first sampling coordinate information, an upper standard plate distance and a lower standard plate distance are obtained, and the upper standard plate distance and the lower standard plate distance are used as standard plate data; wherein the upper standard plate distance is the distance to the upper plane of the calibration template acquired by the first laser ranging sensor; and the lower standard plate distance is the distance to the lower plane of the calibration template acquired by the second laser ranging sensor; According to the preset first sampling coordinate information, the sample detection data of the tile sample to be tested is obtained; the sample detection data includes: an upper sample distance to be tested and a lower sample distance to be tested; wherein the upper sample distance to be tested is the distance to the upper plane of the tile sample to be tested collected by the first laser ranging sensor; the lower sample distance to be tested is the distance to the lower plane of the tile sample to be tested collected by the second laser ranging sensor; The comprehensive thickness evaluation value is calculated based on the upper sample distance, the lower sample distance, the upper standard plate distance, and the lower standard plate distance using the standard plate data of the calibration template as a reference, including: calculating the standard plate thickness corresponding to the coordinates in the first sampling coordinate information of the tile sample to be tested using the standard plate data; the comprehensive thickness evaluation value includes: the fixed-point measured thickness; the fixed-point measured thickness is calculated using the following formula: H=H0+(H 10 -H 1i ) + (H 20 -H 2i ); wherein H is the measured thickness at the fixed point, H0 is the thickness of the standard plate, and H 10 is the upper standard plate distance, H 20 is the lower standard plate distance, H 1i is the distance to the sample to be tested, H 2i is the distance of the sample to be tested; Comparing the comprehensive thickness evaluation value with a preset brick green specification threshold value to evaluate the quality of the tile sample to be tested; the brick green specification threshold value includes: a brick green thickness threshold value; comparing the comprehensive thickness evaluation value with the brick green specification threshold value to evaluate the quality of the tile sample to be tested, including: Determining whether the thickness actually measured at the fixed point exceeds the brick thickness threshold; If yes, the tile sample to be tested is determined to be a defective tile blank, and a first alarm message is generated, so as to determine the corresponding tile sample to be tested according to the first alarm message; If not, then obtaining, according to the preset second sampling coordinate information, the upper distance to be measured and the lower distance to be measured corresponding to each coordinate in the second sampling coordinate information of the tile sample to be measured; wherein the first sampling coordinate information includes at least four coordinates, and the coordinates can form a first matrix adapted to the surface size of the tile sample to be measured; and the second sampling coordinate information includes at least four coordinates, and the coordinates can form a second matrix adapted to the surface size of the tile sample to be measured; Obtaining the size specification data of the ceramic tile sample to be tested as the measurement bottom surface corresponding to the ceramic tile sample to be tested; Taking the measurement bottom surface as the base, the upper sample distance H to be measured based on each second sampling coordinate information in the second matrix 1i , construct a 3D upper groove morphology model corresponding to the upper surface of the tile sample to be tested; and, with the measurement bottom surface as the base, the lower sample distance H of each second sampling coordinate information in the second matrix is 2i , constructing a 3D lower groove morphology model corresponding to the lower surface of the tile sample to be tested; According to the measured thickness H of the tile sample to be tested at the fixed point, with the measured bottom surface as the base, the upper distance H of the sample to be tested based on each first sampling coordinate information in the first matrix 1i and the distance H between the lower sample to be tested 2i , constructing a 3D model of the tile sample to be tested; Determine whether the degree of match between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model exceeds an upper 3D error threshold, and whether the degree of match between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model exceeds a corresponding lower 3D error threshold; wherein the upper 3D error threshold and the lower 3D error threshold are respectively the upper 3D error threshold of the upper surface and the lower 3D error threshold of the lower surface of the tile sample to be tested, which are preset according to the first sampling coordinate information and the second sampling coordinate information; If the matching degree between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model, as well as the matching degree between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model, one or all of them exceed the corresponding upper 3D error threshold and the lower 3D error threshold, then the tile sample to be tested is determined to be a defective brick, and a third alarm message is generated to facilitate determination of the corresponding tile sample to be tested based on the third alarm message.

2. The method for monitoring tile quality according to claim 1, wherein: The comprehensive thickness evaluation value also includes: the upper surface extreme value and the lower surface extreme value of the tile sample to be tested; The brick specification threshold also includes: an upper range threshold and a lower range threshold; wherein the upper surface range value corresponds to the upper range threshold, and the lower surface range value corresponds to the lower range threshold; The method further comprises: using the standard plate data of the calibration template as a reference, calculating the comprehensive thickness evaluation value according to the upper sample distance to be measured, the lower sample distance to be measured, the upper standard plate distance, and the lower standard plate distance. Obtain all the upper sample distances to be measured corresponding to the first sampling coordinate information, and filter out the maximum value thereof as H 1imax ; Filter out the minimum value as H 1imin ;and, Obtain all the next sample distances to be measured corresponding to the first sampling coordinate information, and filter out the maximum value as H 2imax ; Filter out the minimum value as H 2imin ; The upper surface range value and the lower surface range value of the tile sample to be tested are calculated using the following formula: H1= H 1imax -H 1imin ; H2= H 2imax -H 2imin ; Among them, H1 is the upper surface range value, H2 is the lower surface range value, H 1imax is the maximum value of the distance of the sample to be tested, H 1imin is the minimum value of the distance to be tested, H 2imax is the maximum value of the distance of the sample to be tested, H 2imin is the minimum value of the distance of the sample to be tested; The method of comparing the comprehensive thickness evaluation value with the brick specification threshold value to evaluate the quality of the tile sample to be tested further includes: Determine whether the upper surface range value exceeds the upper range threshold value corresponding thereto, and whether the lower surface range value exceeds the lower range threshold value corresponding thereto; If one or both of the upper surface range value and the lower surface range value exceed the corresponding upper range threshold and the lower range threshold, the tile sample to be tested is determined to be a defective brick, and a second alarm message is generated to facilitate determining the corresponding tile sample to be tested based on the second alarm message.

3. A tile quality monitoring device, used for detecting tile samples moving in an assembly line, characterized in that: include: an acquisition module, configured to acquire an upper standard plate distance and a lower standard plate distance based on the first sampling coordinate information, and use the upper standard plate distance and the lower standard plate distance as standard plate data; wherein the upper standard plate distance is the distance to the upper plane of the calibration template acquired by the first laser ranging sensor; and the lower standard plate distance is the distance to the lower plane of the calibration template acquired by the second laser ranging sensor; The acquisition module is further used to acquire the sample detection data of the tile sample to be tested according to the preset first sampling coordinate information; the sample detection data includes: the upper sample distance to be tested and the lower sample distance to be tested; wherein the upper sample distance to be tested is the distance to the upper plane of the tile sample to be tested collected by the first laser ranging sensor; the lower sample distance to be tested is the distance to the lower plane of the tile sample to be tested collected by the second laser ranging sensor The calculation module is used to calculate the comprehensive thickness evaluation value based on the upper sample distance to be measured, the lower sample distance to be measured, the upper standard plate distance and the lower standard plate distance by using the standard plate data of the calibration template as a reference, including: calculating the standard plate thickness corresponding to the coordinates in the first sampling coordinate information of the tile sample to be measured by using the standard plate data; the comprehensive thickness evaluation value includes: the fixed-point measured thickness; the fixed-point measured thickness is calculated using the following formula: H=H0+(H 10 -H 1i ) + (H 20 -H 2i ); wherein H is the measured thickness at the fixed point, H0 is the thickness of the standard plate, and H 10 is the upper standard plate distance, H 20 is the lower standard plate distance, H 1i is the distance to the sample to be tested, H 2i is the distance of the sample to be tested; An evaluation module is configured to compare the comprehensive thickness evaluation value with a preset brick specification threshold value to evaluate the quality of the ceramic tile sample to be tested; the brick specification threshold value includes a brick thickness threshold value; comparing the comprehensive thickness evaluation value with the brick specification threshold value to evaluate the quality of the ceramic tile sample to be tested includes: Determining whether the thickness actually measured at the fixed point exceeds the brick thickness threshold; If yes, the tile sample to be tested is determined to be a defective tile blank, and a first alarm message is generated, so as to determine the corresponding tile sample to be tested according to the first alarm message; If not, then obtaining, according to the preset second sampling coordinate information, the upper distance to be measured and the lower distance to be measured corresponding to each coordinate in the second sampling coordinate information of the tile sample to be measured; wherein the first sampling coordinate information includes at least four coordinates, and the coordinates can form a first matrix adapted to the surface size of the tile sample to be measured; and the second sampling coordinate information includes at least four coordinates, and the coordinates can form a second matrix adapted to the surface size of the tile sample to be measured; Obtaining the size specification data of the ceramic tile sample to be tested as the measurement bottom surface corresponding to the ceramic tile sample to be tested; Taking the measurement bottom surface as the base, the upper sample distance H to be measured based on each second sampling coordinate information in the second matrix 1i , construct a 3D upper groove morphology model corresponding to the upper surface of the tile sample to be tested; and, with the measurement bottom surface as the base, the lower sample distance H of each second sampling coordinate information in the second matrix is 2i , constructing a 3D lower groove morphology model corresponding to the lower surface of the tile sample to be tested; According to the measured thickness H of the tile sample to be tested at the fixed point, with the measured bottom surface as the base, the upper distance H of the sample to be tested based on each first sampling coordinate information in the first matrix 1i and the distance H between the lower sample to be tested 2i , constructing a 3D model of the tile sample to be tested; Determine whether the degree of match between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model exceeds an upper 3D error threshold, and whether the degree of match between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model exceeds a corresponding lower 3D error threshold; wherein the upper 3D error threshold and the lower 3D error threshold are respectively the upper 3D error threshold of the upper surface and the lower 3D error threshold of the lower surface of the tile sample to be tested, which are preset according to the first sampling coordinate information and the second sampling coordinate information; If the matching degree between the upper surface of the 3D sample model to be tested and the 3D upper groove morphology model, as well as the matching degree between the lower surface of the 3D sample model to be tested and the 3D lower groove morphology model, one or all of them exceed the corresponding upper 3D error threshold and the lower 3D error threshold, then the tile sample to be tested is determined to be a defective brick, and a third alarm message is generated to facilitate determination of the corresponding tile sample to be tested based on the third alarm message.

4. A tile quality monitoring system, characterized in that: The system comprises a memory and a processor, wherein the memory is used to store a tile quality monitoring program, and the processor runs the tile quality monitoring program to enable the tile quality monitoring system to perform the tile quality monitoring method according to any one of claims 1 to 2.

5. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a tile quality monitoring program, which, when executed by a processor, implements the tile quality monitoring method according to any one of claims 1 to 2.

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