A method for selecting shield machine control system

Abstract

The present invention provides a method for selecting a shield machine control system, which belongs to the field of shield machine control systems, and in particular, relates to a method for selecting a control system according to the working requirements of a shield machine. The present invention provides a method for selecting a shield machine control system, which obtains the number of points to be controlled in a target shield machine, and calculates the address occupancy of the corresponding number of points, and then selects the model of the control system according to the corresponding relationship between the control system model obtained by operation and the address space of the control system, ensures that the address space of the selected control system is greater than the address occupancy, and then selects the control system according to the model of the control system. The present invention can effectively control the cost of purchasing a control system for a shield machine, and avoid excessive costs while ensuring that the control system can meet the working requirements of the shield machine.

Description

Technical Field

[0001] The invention provides a method for selecting a shield machine control system, belongs to the field of shield machine control systems, and particularly relates to a method for selecting a control system according to working requirements of a shield machine. Background Art

[0002] The control system is one of the core systems of the shield machine. However, there are few reference standards when selecting the controller and control system network structure for the shield machine. When selecting the shield machine control system, due to the lack of clear performance indicators, the selection is usually based on the personal experience of the designer. One method is: if a certain control system has been used in other projects, then in this project, adjustments are made according to the points required by the project, and the required parameters are enlarged, and sufficient margin is reserved for selection; another method is: use the controller of the previous project, what was used before, what is used now, add or subtract points according to the project volume, leave enough margin, and expand performance.

[0003] However, the controller performance selected by these two methods is usually much higher than the actual performance required, resulting in a large margin of control system performance and serious controller performance surplus, resulting in resource waste and not conducive to product cost control. Moreover, with the high integration of shield machine equipment functions and the increasing demand for intelligent products, the common control system network structure and performance in the industry are difficult to meet the needs. Without application cases or system testing, new technologies and solutions are difficult to be effectively promoted in the manufacturing industry.

[0004] In addition, there is no professional testing of the performance of controllers used in the control system industry. The performance indicators are completely dependent on the supplier's product manual. The nominal performance in the product manual usually refers to the optimal performance of the controller in a certain aspect. In actual use, it is often different from the nominal value and cannot meet the actual project requirements. Moreover, there are few control system brands in the shield machine industry, which easily forms a technical barrier for a certain brand or several brands of controllers in the shield machine industry, which is not conducive to the promotion and popularization of new technologies and new products in the industry, affecting the technological update of the entire industry, and is not conducive to the entry of new manufacturers into the industry, affecting the healthy competition of controller manufacturers in the industry, and thus affecting the cost control of products.

[0005] In summary, for manufacturers using control systems, difficulty in selecting a controller that meets project requirements will lead to increased product and project costs. Summary of the invention

[0006] The object of the present invention is to provide a method for selecting a shield machine control system, which is used to solve the problem of high cost caused by difficulty in selecting a suitable control system according to the working requirements of the shield machine.

[0007] In order to achieve the above object, the present invention provides a method for selecting a shield machine control system, comprising the following steps:

[0008] S1. Obtain the number of points to be controlled in the shield machine;

[0009] S2. Calculate the corresponding address occupancy according to the number of points;

[0010] S3. According to the correspondence between the control system and the control system address space acquired in advance, a control system whose control system address space is larger than the address occupancy is selected for controlling the shield machine.

[0011] In order to effectively control the cost of purchasing a control system for a shield machine, and to ensure that the control system can meet the working requirements of the shield machine while avoiding excessive costs, the present invention provides a method for selecting a shield machine control system. The method obtains the number of points to be controlled in a target shield machine, and calculates the address occupancy of the corresponding number of points. Then, the model of the control system is selected according to the corresponding relationship between the control system model obtained during operation and the address space of the control system, and it is ensured that the address space of the selected control system is greater than the address occupancy. A plurality of control system models that meet the requirements can be obtained, and then the control system is selected according to the model of the control system.

[0012] Furthermore, the above method also includes: calculating the actual scanning period of the control system scanning the points to be controlled based on the number of points to be controlled and the control system selected in step S3; and selecting a control system whose actual scanning period is less than the required scanning period based on the actual scanning period and the required scanning period of the shield machine obtained in advance, for controlling the shield machine.

[0013] Since the scanning cycle of the control system given by the control system manufacturer usually describes the optimal scanning cycle of the control system, which does not meet the actual use requirements of the shield machine, the actual scanning cycle of the selected control system when scanning the points to be controlled is calculated through the number of points to be controlled and the multiple control system models selected. According to the required scanning cycle of the shield machine obtained in advance, the control system model is screened again to narrow the selection range of the control system, which helps to select a control system that better meets the working requirements of the shield machine, thereby reducing costs.

[0014] Furthermore, in the above method, the method for calculating the actual scanning period is: according to the pre-acquired bit instruction operation time and floating-point operation time of the control system, the product of the number of digital points in the points to be controlled and the bit instruction operation time is calculated as the first operation time, and the product of the number of analog points in the points to be controlled and the floating-point operation time is calculated as the second operation time, and the actual scanning period is calculated according to the first operation time and the second operation time.

[0015] The points to be controlled include digital points and analog points. According to the bit instruction operation time of the control system scanning a single digital point and the floating-point operation time of the control system scanning a single analog point, the first operation time and the second operation time are calculated, and then the sum of the first operation time and the second operation time is calculated as the actual scanning period, which is simple to calculate.

[0016] Furthermore, in the above method, the sum of the first operation time and the second operation time is calculated, and the sum is multiplied by a set operation coefficient to obtain a logic operation time, and the logic operation time is used as the actual scanning period.

[0017] After calculating the sum of the first operation time and the second operation time, the sum is multiplied by a set coefficient to obtain the logic operation time. The logic operation time is used as the actual scanning period to provide a margin for the control system to scan the points to be controlled in the shield machine, and the calculation is simple.

[0018] Furthermore, in the above method, the sum of the first operation time and the second operation time is calculated, and the sum is multiplied by the set operation coefficient as the logic operation time; the input reading time, communication processing time, system diagnosis time and operation output time of the control system selected in step S3 are also obtained, and the sum of the logic operation time, input reading time, communication processing time, system diagnosis time and operation output time is calculated as the actual scanning period.

[0019] Taking into account that when the control system scans the controlled points, there will be input reading time, communication processing time, system diagnosis time and operation output time, the sum of the logic operation time, input reading time, communication processing time, system diagnosis time and operation output time is also calculated, and the sum is used as the actual scanning cycle. The selected control system is more in line with the working requirements of the shield machine.

[0020] Furthermore, in the above method, the number of points is obtained by the following method: the diameter of the shield machine is obtained, and according to the correspondence between the diameter of the shield machine and the number of points obtained in advance, the number of points corresponding to the diameter of the shield machine is obtained as the number of points to be controlled.

[0021] The number of points to be controlled in the shield machine can be obtained by manual counting, but this method is time-consuming and laborious. Therefore, by pre-establishing the corresponding relationship between the diameter of the shield machine and the number of points, the number of points to be controlled can be directly obtained on the basis of obtaining the diameter of the shield machine, thereby reducing the processing volume.

[0022] Furthermore, the above method also includes: obtaining the designed working environment of the shield machine, and selecting a control system that can adapt to the designed working environment for controlling the shield machine; the designed working environment includes one or more of the designed working temperature, designed working humidity, designed salt and alkali resistance, and designed vibration resistance of the shield machine.

[0023] In order to ensure that the selected control system can operate normally in the working environment of the shield machine, the designed working environment of the shield machine is also obtained, such as the temperature range, humidity range, salt and alkali resistance and vibration resistance of the working environment. By designing the working environment, a suitable control system is selected to ensure that the selected control system can adapt to the designed working environment of the shield machine.

[0024] The present invention also provides a shield machine control system selection method, comprising the following steps:

[0025] S1. Obtain design parameters of a shield machine, wherein the design parameters include a diameter of the shield machine;

[0026] S2. Obtaining the address occupancy corresponding to the diameter of the shield machine according to the pre-acquired correspondence between the diameter of the shield machine and the address occupancy;

[0027] S3. According to the correspondence between the control system and the control system address space acquired in advance, a control system whose control system address space is larger than the address occupancy is selected for controlling the shield machine.

[0028] The address occupancy of the shield machine is calculated by obtaining the diameter of the shield machine and combining the previously obtained correspondence between the diameter of the shield machine and the address occupancy. Then, the model of the control system is selected based on the correspondence between the control system model obtained during operation and the address space of the control system. It is ensured that the address space of the selected control system is greater than the address occupancy, and multiple control system models that meet the requirements can be obtained. Then, the control system is selected based on the model of the control system, which can effectively reduce the cost of purchasing the control system for the shield machine user.

[0029] Furthermore, in the above method, the design parameters also include the required scanning cycle of the shield machine and the number of points to be controlled in the shield machine; based on the number of points and the control system selected in step S3, the actual scanning cycle of the control system scanning the points to be controlled is calculated; based on the actual scanning cycle and the required scanning cycle of the shield machine obtained in advance, a control system whose actual scanning cycle is less than the required scanning cycle is also selected for controlling the shield machine.

[0030] Furthermore, in the above method, the method for calculating the actual scanning period is: according to the pre-acquired bit instruction operation time and floating-point operation time of the control system, the product of the number of digital points in the points to be controlled and the bit instruction operation time is calculated as the first operation time, and the product of the number of analog points in the points to be controlled and the floating-point operation time is calculated as the second operation time, and the actual scanning period is calculated according to the first operation time and the second operation time.

[0031] Furthermore, in the above method, the sum of the first operation time and the second operation time is calculated, and the sum is multiplied by a set operation coefficient to obtain a logic operation time, and the logic operation time is used as the actual scanning period.

[0032] Furthermore, in the above method, the sum of the first operation time and the second operation time is calculated, and the sum is multiplied by the set operation coefficient as the logic operation time; the input reading time, communication processing time, system diagnosis time and operation output time of the control system selected in step S3 are also obtained, and the sum of the logic operation time, input reading time, communication processing time, system diagnosis time and operation output time is calculated as the actual scanning period.

[0033] Furthermore, in the above method, in step S2, the corresponding relationship between the diameter of the shield machine and the address occupancy is established by the following method: obtaining the number of points to be controlled of shield machines of different diameters, and calculating the address occupancy corresponding to the number of points as the address occupancy of the shield machine of the corresponding diameter; according to the diameter of the shield machine and the address occupancy of the shield machine of the corresponding diameter, establishing the corresponding relationship between the diameter of the shield machine and the address occupancy.

[0034] Shield machines of different diameters have different numbers of points to be controlled, resulting in different address occupancy of shield machines of different diameters. By counting the number of points to be controlled of shield machines of different diameters, and then calculating the address occupancy of shield machines of different diameters according to the different address occupancy corresponding to a single point, a corresponding relationship between the diameter of the shield machine and the address occupancy point is established, which facilitates the application of the present invention to shield machines of different diameters.

[0035] Furthermore, in the above method, the design parameters also include a designed working environment of the shield machine, and a control system that can adapt to the designed working environment is selected for controlling the shield machine; the designed working environment includes one or more of the designed working temperature, designed working humidity, designed salt and alkali resistance, and designed vibration resistance of the shield machine. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 It is a flowchart of the shield machine control system selection method in the method embodiment 1 of the present invention;

[0037] Figure 2 This is a flowchart of the shield machine control system selection method in Example 2 of the method of the present invention. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention is further described in detail below with reference to the accompanying drawings and embodiments.

[0039] Method Example 1:

[0040] Different products are usually controlled by different control systems during operation. However, when purchasing a control system, the selection often relies on the personal experience of the designer. In order to ensure that the product can operate normally, the designer usually selects a control system in which the number of control system points far exceeds the actual number of product points. In addition, the performance parameters of the control system provided by the control system manufacturer are often the optimal parameters when the control system realizes a single function. In actual use, the controller needs to realize multiple control functions at the same time. The information provided by the control system manufacturer is not reliable enough for actual application and does not meet the project requirements that the control system should meet when it is actually used. Therefore, the present invention provides a method for selecting a shield machine control system, which is used to select a control system that can meet the normal operation requirements of the shield machine and reduce costs as much as possible, so as to facilitate the shield machine user to effectively control costs.

[0041] The shield machine control system selection method of the present invention is as follows Figure 1 As shown, the following steps are included:

[0042] 1) Obtain the number S of points to be controlled in the shield machine.

[0043] According to different division methods, the shield machine can be divided into different subsystems. For example, according to the functions performed by different structures of the shield machine, it can be divided into main drive system, grouting system, screw machine system, belt conveyor system, propulsion system, articulation system, guide system, foam system, bentonite system, assembly system, water system, grease system and air system, a total of 13 subsystems, and the combination of each subsystem of the shield machine is stable.

[0044] Since the shield machine has different subsystems, the number of points to be controlled in each subsystem of the shield machine is calculated. n , and then the number of points to be controlled in the shield machine S is calculated by formula (1). Formula (1) is shown as follows:

[0045] S=S 1 +…+S n +…+S 13 (1)

[0046] In formula (1), Sn is the number of points to be controlled in each subsystem of the shield machine, n is the number of subsystems in the shield machine, and in this embodiment, 1≤n≤13.

[0047] The number of points to be controlled in each subsystem of the shield machine S n It can be obtained through mathematical statistics that the number of points to be controlled in each subsystem is different for different shield machine diameters. Generally, the number of points to be controlled in each system is positively correlated with the diameter of the shield machine. Different subsystems have different numbers of points to be controlled per unit diameter.

[0048] According to the point type, the points to be controlled can be divided into internal points and external points. Internal points refer to the points where the control system directly accesses the various subsystems of the shield machine through the internal bus, such as DI, DO, AI and AO of the PLC control system; external points refer to the points where the control system accesses third-party devices connected to the shield machine through communication boards or communication interfaces. Third-party devices refer to devices that the control system expands through serial ports, such as inverters, remote controls, etc. Specifically, the points to be controlled refer to the signal quantities that need to be controlled or collected when the shield machine is working, such as the control quantities of structures such as switches and valves, or the collection quantities of collection devices such as pressure sensors and flow meters, or the communication quantities for communicating with third-party devices.

[0049] Internal points include digital points and analog points, and external points also include digital points and analog points. For example, the signal for controlling devices such as switches or valves can be regarded as a digital point, and the signal for collecting or controlling the state quantities of the device such as temperature, humidity or vibration can be regarded as an analog point.

[0050] Therefore, when calculating the number of points to be controlled in each subsystem, different point coefficients are set according to the point type, and the number of points to be controlled in each subsystem S is obtained by the following formula (2): n :

[0051] S n =r×(p nd ×g nd +p na ×g na +p nc ×g nc ) (2)

[0052] In formula (2), r is the diameter of the shield machine, p nd is the digital quantity point coefficient of the nth subsystem, g nd is the number of digital points per unit diameter of the nth subsystem, p na is the analog point coefficient of the nth subsystem, g nais the number of analog points of the nth subsystem per unit diameter, p nc is the external point coefficient of the nth subsystem, g nc is the number of external points per unit diameter of the nth subsystem.

[0053] Since different types of control systems have different numbers of control points, the control system model can be simply screened according to the number of control points M of the control system and the number of points to be controlled S of the shield machine to ensure that the number of control points M is greater than the number of points to be controlled S, thereby satisfying the control system's control of the shield machine during normal operation of the shield machine.

[0054] In addition, according to the types of digital points and analog points, the total number of digital points g in the points to be controlled during normal operation of the shield machine can also be calculated. da And the sum of analog points g aa .

[0055] 2) According to the sum of digital quantity points g da And the sum of analog points g aa , and the correspondence between the pre-acquired points and the address occupancy: the address occupancy corresponding to a single digital point is 1 / 8, the address occupancy corresponding to a single analog point is 2, and the address occupancy Q corresponding to the number of points to be calculated.

[0056] Since different types of control systems have different sizes of inherent address spaces N, the address space utilization l of each control system is different, and various points need to have a mapping address in the address space. Therefore, according to the address occupancy Q of the shield machine, the control system model can be screened again to ensure that N×l≥Q, so as to meet the control system's control of the shield machine during normal operation.

[0057] 3) Different control systems execute different numbers of commands in a scanning cycle, and can control different numbers of points. The shorter the scanning cycle, the better the real-time performance of the system. Therefore, different types of control systems have different scanning cycles when scanning the points to be controlled. For a shield machine with S points to be controlled, it is necessary to determine the time the control system needs to consume when scanning the points to be controlled based on the number of points to be controlled S, as the actual scanning cycle T of the control system. c , and then according to the actual scanning period T c Screen the control system models again.

[0058] Actual scanning period T c Including the input reading time T when the control system controls the control point i , logical operation time T l , Communication processing time T m , System diagnosis time Td Sum operation output time T o ,Right now:

[0059] T c =T i +T l +T m +T d +T o (3)

[0060] In general, the input reading time of the control system is T i , System diagnosis time T d , Operation output time T o and communication processing time T m are all microsecond parameters, and the logic operation time T l It is a millisecond level parameter. Therefore, it affects the actual scanning period T c The main factor is the logic operation time T l , formula (3) can be simplified as: T c ≈T l .

[0061] Logical operation time T l It is calculated by the following formula (4):

[0062] T l =(g da ×T by +g aa ×T fl )×h l (4)

[0063] In formula (4), g da is the sum of the digital points in the control points during the normal operation of the shield machine, g aa is the sum of the analog points in the control points during the normal operation of the shield machine, T by is the bit instruction processing time, T fl is the floating point operation time, h l is the logic operation coefficient.

[0064] Therefore, T c ≈(g da ×T by +g aa ×T fl )×h l .

[0065] Based on the historical operating data of the shield machine during normal operation, we can obtain multiple historical scanning cycles of the control system scanning when the number of points to be controlled is S during the normal operation of the shield machine. By using mathematical statistical methods, such as calculating the average value, we can obtain a design scanning cycle T for the control system to scan the points to be controlled in the shield machine.

[0066] According to the designed scanning cycle T and the actual scanning cycle T c , the control system model is screened again to ensure that the screened control system meets the following requirements: when the control system scans all the points to be controlled by the shield machine, the actual scanning cycle T C Should not be greater than T, that is, T C ≤T.

[0067] 4) In addition, considering the harsh working environment around the shield machine during normal operation, it is also possible to obtain the environmental parameters of the surrounding environment of the shield machine during normal operation, such as temperature range, humidity range, salinity range and vibration capacity, and then screen the control system again according to the working environment parameters such as temperature adaptability range, humidity adaptability range, salt and alkali resistance and vibration resistance of different types of control systems, so as to ensure that the selected control system can operate in the working environment of the shield machine.

[0068] In addition, the control system software's scalability and ease of use in the control system program writing process can be evaluated through actual use. Through system configuration, variable table establishment, program writing and the use of control system programming software, the control system software's engineering capabilities can be comprehensively evaluated, and a more suitable control system can be selected.

[0069] Through actual use, it is also possible to test the richness of the programming languages ​​used in the control system software, the nested use of different programming languages, and comprehensively analyze the convenience of the control system in realizing different functions in the shield machine; thus, a more suitable control system can be selected.

[0070] Through actual use, it is also possible to test the nesting capability of branch judgments in the programming language available in the control system software, test the programming logic implementation capability of multiple conditions and multiple conclusions, and then select a more suitable control system.

[0071] Through actual use, it is also possible to test the control system's software's deep calling capabilities between programs, test the underlying program encapsulation depth and the underlying code reuse capabilities of the application, and thus select a more suitable control system.

[0072] By adopting the present invention, a knowledge base of the control system is established, in which the corresponding relationships among the control system model, the control system address space, the control system bit instruction processing time, the floating-point operation time and the working environment parameters of the control system are included. When the method of the present invention is actually used, the design parameters of the shield machine are obtained and input into the test software, and the test software processes and compares the data, and the control system model that meets the working requirements of the shield machine is quickly selected from the knowledge base, thereby helping the shield machine user to effectively control costs.

[0073] Method Example 2:

[0074] The shield machine control system selection method of the present invention is as follows Figure 2 As shown, the following steps are included:

[0075] 1) Obtain the diameter r of the shield machine.

[0076] 2) According to the pre-acquired correspondence between the diameter of the shield machine and the address occupancy, the address occupancy Q of the shield machine is calculated.

[0077] The corresponding relationship between the diameter of the shield machine and the address occupancy is obtained by the following method: according to the number and type of points to be controlled by shield machines of different diameters, and the pre-acquired corresponding relationship between points and address occupancy: the address occupancy corresponding to a single digital point is 1 / 8, and the address occupancy corresponding to a single analog point is 2, the address occupancy of shield machines of different diameters is calculated. Then, the corresponding relationship between the diameter of the shield machine and the address occupancy is established by the data fitting method.

[0078] Taking the eighth subsystem of the shield machine, the foam system, as an example, according to the size of the shield machine, for a shield machine with a diameter between 6 meters and 16 meters, the number of foam circuits in the foam system is between 6 and 16. Ignoring minor influencing factors, the number of foam circuits m in the foam system can be numerically considered to be equal to the diameter r of the shield machine, that is, m=r.

[0079] The points included in a single-channel foam loop are shown in Table 1 below. Table 1 includes the point name, point type, number of points and the number of bytes occupied by each point.

[0080] Table 1 Single-circuit foam loop point table in foam system

[0081]

[0082]

[0083] According to the above table, the address occupancy Q of the points to be controlled in the foam system can be calculated. 8 for:

[0084]

[0085] The address occupancy Q of the points to be controlled in the foam system 8 Round up, Q 8 =41r. Therefore, the relationship between the address occupied by the foam system and the diameter of the shield machine is: Q 8 =41r.

[0086] Using the same method, the corresponding relationship between the address occupancy of other subsystems in the shield machine and the diameter of the shield machine can be calculated, and then the corresponding relationship between the address occupancy of the shield machine and the diameter of the shield machine can be calculated.

[0087] As another embodiment, the address occupancy Q corresponding to the input point in the foam system can also be calculated. in The address occupied by the output point is Q qn , and then calculate the address occupancy Q of the entire shield machine.

[0088] For example, the address space occupied by the input point in a single foam loop is recorded as Q is , then from Table 1 above we can get:

[0089]

[0090] Calculate the address space that needs to be allocated to the input point in the foam system and round it to get Q in =23r.

[0091] The address space occupied by the output point in a single foam loop is recorded as Q qs , then from Table 1 above we can get:

[0092]

[0093] Calculate the address space that needs to be allocated to the output point in the foam system and round it to get Q qn =19r.

[0094] In summary, the address occupancy of the foam system Q 8 =23r+19r=42r.

[0095] Since different types of control systems have different sizes of inherent address spaces N, the address space utilization l of each control system is different, and various points need to have a mapping address in the address space. Therefore, according to the address occupancy Q of the shield machine, the control system model can be screened to ensure that N×l≥Q, so as to meet the control system's control of the shield machine during normal operation.

[0096] 3) Different control systems execute different numbers of commands in a scanning cycle and can control different numbers of points. The shorter the scanning cycle, the better the real-time performance of the system. Therefore, we also obtain the required scanning cycle T of the shield machine and the number of points to be controlled in the shield machine S. According to the number of points to be controlled S, we determine the time the control system needs to consume when scanning the points to be controlled, which is used as the actual scanning cycle T of the control system. c , and then according to the required scanning cycle T and the actual scanning cycle T c Screen the control system models again.

[0097] Actual scanning period T c Including the input reading time T when the control system controls the control point i , logical operation time T l , Communication processing time T m , System diagnosis time T d Sum operation output time T o .

[0098] In general, the input reading time of the control system is T i , System diagnosis time T d , Operation output time T o and communication processing time T m All are microsecond level parameters, and the logic operation time T l It is a millisecond level parameter. Therefore, it affects the actual scanning period T c The main factor is the logic operation time T l .

[0099] Logical operation time T l Calculated by the above formula (4), therefore, T c ≈(g da ×T by +g aa ×T fl )×h l .

[0100] Based on the historical operating data of the shield machine during normal operation, we can obtain multiple historical scanning cycles of the control system scanning when the number of points to be controlled is S during the normal operation of the shield machine. By using mathematical statistical methods, such as calculating the average value, we can obtain a design scanning cycle T for the control system to scan the points to be controlled in the shield machine.

[0101] According to the designed scanning cycle T and the actual scanning cycle T c , the control system model is screened again to ensure that the screened control system meets the following requirements: when the control system scans all the points to be controlled by the shield machine, the actual scanning cycle T C Should not be greater than T, that is, TC ≤T.

[0102] 4) In addition, considering the harsh working environment around the shield machine during normal operation, it is also possible to obtain the environmental parameters of the surrounding environment of the shield machine during normal operation, such as temperature range, humidity range, salinity range and vibration capacity, and then screen the control system again according to the temperature adaptability range, humidity adaptability range, salt and alkali resistance and vibration resistance of different types of control systems, so as to ensure that the selected control system can operate in the working environment of the shield machine.

[0103] By adopting the present invention, it is possible to avoid selecting an inappropriate control system for a normally operating shield machine, thereby ensuring that excessive costs are avoided when purchasing the control system.

Claims

1. A method for selecting a shield machine control system. It is characterized in that The steps include: S1. Obtain the number of points to be controlled in the shield machine; The number of points to be controlled in the shield machine, S, is obtained by the following formula: S=S 1 +…+S n +…+S 13 S n is the number of points to be controlled in each subsystem of the shield machine, n is the number of subsystems in the shield machine, 1≤n≤13; The number of points to be controlled in each subsystem of the shield machine S n , obtained by the following formula: S n =r×(p nd ×g ad +p na ×g na +p nc ×g nc ) Where r is the diameter of the shield machine, p nd is the digital quantity point coefficient of the nth subsystem, g nd is the number of digital points per unit diameter of the nth subsystem, p na is the analog point coefficient of the nth subsystem, g na is the number of analog points of the nth subsystem per unit diameter, p nc is the external point coefficient of the nth subsystem, g nc is the number of external points of the nth subsystem per unit diameter; S2. Calculate the corresponding address occupancy according to the number of points; S3. According to the correspondence between the control system and the control system address space acquired in advance, a control system whose control system address space is larger than the address occupancy is selected for controlling the shield machine.

2. According to the shield machine control system selection method of claim 1, It is characterized in that Also includes: According to the number of points to be controlled and the control system selected in step S3, the actual scanning period of the control system scanning the points to be controlled is calculated; according to the actual scanning period and the required scanning period of the shield machine obtained in advance, a control system whose actual scanning period is less than the required scanning period is selected for controlling the shield machine.

3. The shield machine control system selection method according to claim 2, It is characterized in that The method for calculating the actual scanning cycle is: according to the pre-acquired bit instruction operation time and floating-point operation time of the control system, the product of the number of digital points in the points to be controlled and the bit instruction operation time is calculated as the first operation time, and the product of the number of analog points in the points to be controlled and the floating-point operation time is calculated as the second operation time, and the actual scanning cycle is calculated according to the first operation time and the second operation time.

4. The shield machine control system selection method according to claim 3, It is characterized in that The sum of the first operation time and the second operation time is calculated, and the sum is multiplied by a set operation coefficient to obtain a logic operation time, and the logic operation time is used as the actual scanning period.

5. The shield machine control system selection method according to claim 3, It is characterized in that Calculate the sum of the first operation time and the second operation time, and multiply the sum by the set operation coefficient as the logic operation time; also obtain the input reading time, communication processing time, system diagnosis time and operation output time of the control system selected in step S3, and calculate the sum of the logic operation time, input reading time, communication processing time, system diagnosis time and operation output time as the actual scanning period.

6. The shield machine control system selection method according to claim 1, It is characterized in that The number of points is obtained by the following method: the diameter of the shield machine is obtained, and according to the correspondence between the diameter of the shield machine and the number of points obtained in advance, the number of points corresponding to the diameter of the shield machine is obtained as the number of points to be controlled.

7. The shield machine control system selection method according to claim 1 or 2, It is characterized in that Also includes: Acquiring a designed working environment of the shield machine, and selecting a control system that can adapt to the designed working environment for controlling the shield machine; The designed working environment includes one or more of the designed working temperature, designed working humidity, designed salt and alkali resistance and designed vibration resistance of the shield machine.

8. A method for selecting a shield machine control system. It is characterized in that The steps include: S1. Obtain design parameters of the shield machine, wherein the design parameters include the diameter of the shield machine; establish a corresponding relationship between the diameter of the shield machine and the address occupancy according to the number and type of points to be controlled of shield machines of different diameters, and the corresponding relationship between the points and the address occupancy obtained in advance; S2. Obtaining the address occupancy corresponding to the diameter of the shield machine according to the pre-acquired correspondence between the diameter of the shield machine and the address occupancy; S3, according to the correspondence between the control system and the control system address space obtained in advance, selecting a control system whose control system address space is larger than the address occupation amount, for controlling the shield machine; Among them, the number of points to be controlled in the shield machine, S, is obtained by the following formula: S=S 1 +…+S n +…+S 13 S n is the number of points to be controlled in each subsystem of the shield machine, n is the number of subsystems in the shield machine, 1≤n≤13; The number of points to be controlled in each subsystem of the shield machine S n , obtained by the following formula: S n =r×(p nd ×g ad +p na ×g na +p nc ×g nc ) Specifically, r is the diameter of the shield machine, p nd is the digital quantity point coefficient of the nth subsystem, g nd is the number of digital points per unit diameter of the nth subsystem, p na is the analog point coefficient of the nth subsystem, g na is the number of analog points of the nth subsystem per unit diameter, p nc is the external point coefficient of the nth subsystem, g nc is the number of external points per unit diameter of the nth subsystem.

9. The shield machine control system selection method according to claim 8, It is characterized in that The design parameters also include a required scanning cycle of the shield machine; based on the number of points and the control system selected in step S3, the actual scanning cycle of the control system scanning the points to be controlled is calculated; based on the actual scanning cycle and the required scanning cycle of the shield machine obtained in advance, a control system whose actual scanning cycle is less than the required scanning cycle is selected for controlling the shield machine.

10. The shield machine control system selection method according to claim 9, It is characterized in that The method for calculating the actual scanning cycle is: according to the pre-acquired bit instruction operation time and floating-point operation time of the control system, the product of the number of digital points in the points to be controlled and the bit instruction operation time is calculated as the first operation time, and the product of the number of analog points in the points to be controlled and the floating-point operation time is calculated as the second operation time, and the actual scanning cycle is calculated according to the first operation time and the second operation time.

11. The shield machine control system selection method according to claim 10, It is characterized in that The sum of the first operation time and the second operation time is calculated, and the sum is multiplied by a set operation coefficient to obtain a logic operation time, and the logic operation time is used as the actual scanning period.

12. The shield machine control system selection method according to claim 10, It is characterized in that Calculate the sum of the first operation time and the second operation time, and multiply the sum by the set operation coefficient as the logic operation time; also obtain the input reading time, communication processing time, system diagnosis time and operation output time of the control system selected in step S3, and calculate the sum of the logic operation time, input reading time, communication processing time, system diagnosis time and operation output time as the actual scanning period.

13. The shield machine control system selection method according to claim 8 or 9, It is characterized in that The design parameters also include the designed working environment of the shield machine, and a control system that can adapt to the designed working environment is selected for controlling the shield machine; the designed working environment includes one or more of the designed working temperature, designed working humidity, designed salt and alkali resistance, and designed vibration resistance of the shield machine.

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