Chip testing device

Abstract

The present invention provides a chip testing device, which includes a fixing frame, a connecting column, a clamping part, and a spacing adjusting component. The connecting column is arranged on the fixing frame, the clamping part is arranged on the fixing frame, the clamping part includes a plurality of clamping units, the clamping unit includes a first clamping part and a second clamping part, an opening for clamping the chip pins is formed between the first clamping part and the second clamping part, one of the first clamping part and the second clamping part is electrically connected to the connecting column, the spacing adjusting component is arranged on the fixing frame, the spacing adjusting component includes a first adjusting component and a second adjusting component, the first adjusting component and the second adjusting component are connected by a linkage adjusting part, and a plurality of the first clamping parts and the second clamping parts are respectively connected to the first adjusting component and the second adjusting component. The chip testing device provided by the embodiment of the present invention can enable the chip pins to be quickly and effectively electrically connected to the testing device, reducing the operation difficulty.

Description

Technical Field

[0001] The present invention belongs to the technical field of circuit testing, and particularly relates to a chip testing device. Background Art

[0002] Currently, during the development and testing of base stations and communication products, various chips are usually used, such as communication chips, power chips, ASIC chips, etc. With the improvement of chip manufacturing processes, the size of chips has become smaller and the number of pins has increased, ranging from a few to hundreds, resulting in increasingly dense chip pins, making it difficult for traditional testing methods to adapt, and it is very difficult to quickly and effectively locate and test specific pins during debugging.

[0003] Therefore, there is an urgent need for a new chip testing device. Summary of the Invention

[0004] An embodiment of the present invention provides a chip testing device, enabling quick and effective electrical connection between chip pins and the testing device to reduce the operation difficulty.

[0005] On the one hand, an embodiment of the present invention provides a chip testing device, including a fixing frame, a connecting column, a clamping part, and a spacing adjusting component. Among them, the connecting column is arranged on the fixing frame, the clamping part is arranged on the fixing frame, the clamping part includes a plurality of clamping units, each clamping unit includes a first clamping part and a second clamping part, an opening for clamping chip pins is formed between the first clamping part and the second clamping part, one of the first clamping part and the second clamping part is electrically connected to the connecting column, the spacing adjusting component is arranged on the fixing frame, the spacing adjusting component includes a first adjusting component and a second adjusting component, and the first adjusting component and the second adjusting component are connected by a linkage adjusting part so that the first adjusting component and the second adjusting component are linked, and a plurality of first clamping parts and second clamping parts are respectively connected to the first adjusting component and the second adjusting component to realize the separation and combination between the first clamping part and the second clamping part in each clamping unit.

[0006] According to one aspect of the embodiment of the present invention, both the first clamping part and the second clamping part extend along a first direction and extend out of a part of the fixing frame.

[0007] According to one aspect of the embodiment of the present invention, connecting parts extending along the first direction are arranged on both the first adjusting component and the second adjusting component, the first clamping part and the second clamping part are respectively connected to the first adjusting component and the second adjusting component through the connecting parts; both the first adjusting component and the second adjusting component include a plurality of adjusting units, and the plurality of adjusting units are sequentially connected by a first connecting shaft, and the connecting parts are connected to the first connecting shaft; each adjusting unit includes a first connecting rod and a second connecting rod, and the first connecting rod and the second connecting rod are cross-connected by a second connecting shaft.

[0008] According to one aspect of the embodiments of the present invention, the linkage adjusting member includes a first linkage slide rail and a second linkage slide rail. Both sides of the first linkage slide rail and the second linkage slide rail are provided with connection grooves matching the first connection shaft. The first connection shaft is inserted into the connection groove and is in sliding fit with the connection groove.

[0009] According to one aspect of the embodiments of the present invention, the fixing frame includes a first fixing plate and a second fixing plate arranged oppositely. The first adjusting component and the second adjusting component are arranged between the first fixing plate and the second fixing plate through a second connection shaft. The inner surfaces of the first fixing plate and the second fixing plate are both provided with limiting grooves extending along the second direction and matching the second connection shaft. The second connection shaft is inserted into the limiting groove and is in sliding fit with the limiting groove. The first direction intersects the second direction.

[0010] According to one aspect of the embodiments of the present invention, both the first clamping portion and the second clamping portion include a base and a clamping block. Among them, the base is fixed to the connecting member. One of the base and the clamping block is provided with a shaft hole, and the other is provided with a rotating shaft matching the shaft hole. The rotating shaft is inserted into the shaft hole and is in rotational fit with the shaft hole.

[0011] An elastic block is arranged between the base and the clamping block. The clamping block is in contact connection with the elastic block. One end of the clamping block close to the elastic block is an eccentric structure, so that the clamping block has a resilience force approaching the chip pin when rotating; limiting blocks are arranged on both sides of the base to limit the clamping block to a preset position; one of the first clamping portion and the second clamping portion electrically connected to the connecting column further includes an electrical connecting member. The electrical connecting member is fixed to one side surface of the clamping block facing the adjacent other clamping block, and the other clamping block is an insulator.

[0012] According to one aspect of the embodiments of the present invention, the first adjusting component further includes a transmission switching mechanism, a first transmission rack and a second transmission rack. The transmission switching mechanism is arranged on the second fixing plate and includes a first transmission gear. The first transmission gear is meshed with the first transmission rack to drive the first transmission rack. The first transmission rack is slidably connected to an inner surface of the fixing frame and is meshed and driven with the second transmission rack through an opposed gear, so that the moving directions of the first transmission rack and the second transmission rack are opposite. One of the first transmission rack and the second transmission rack is connected to the first link of the first adjusting component, and the other is connected to the second link of the first adjusting component above; a first adjusting block extending along the second direction is arranged at one end of the first transmission rack, and a second adjusting block extending along the second direction is arranged at the end of the second transmission rack far from the first adjusting block. One of the first adjusting block and the second adjusting block is movably connected to the first link, and the other is movably connected to the second link; the first transmission rack and the first adjustment, as well as the second transmission rack and the second adjusting block, are all integral structures.

[0013] According to one aspect of the embodiment of the present invention, the transmission switching mechanism further includes a second transmission gear, a first driving gear, and a second driving gear. Among them, the first driving gear is in meshing transmission connection with the first transmission gear, and the second driving gear is in meshing transmission connection with the second transmission gear. The radial dimension of the first transmission gear is larger than that of the second transmission gear, and the radial dimension of the first driving gear is smaller than that of the second driving gear. One of the groups of the first driving gear and the first transmission gear or the second driving gear and the second transmission gear can be in a meshing state, so that the transmission switching mechanism can perform speed or precision switching; the first driving gear and the second driving gear are coaxially connected by a rotating shaft, and the first transmission gear and the second transmission gear are coaxially connected by a transmission shaft. Both the rotating shaft and the transmission shaft are perpendicular to the second fixing plate and are rotatably connected to the second fixing plate. The distance between the first driving gear and the second driving gear is greater than the distance between the first transmission gear and the second transmission gear; a rotating knob is fixed to the end of the rotating shaft away from the second fixing plate.

[0014] According to one aspect of the embodiment of the present invention, a return spring is provided between the second fixing plate and the second driving gear. When the return spring is compressed by an external force, the second driving gear and the second transmission gear are in a meshing state. When the external force is removed, the return spring rebounds, so that the first driving gear and the first transmission gear are in a meshing state; the rotating shaft is a telescopic rod-shaped structure, and the return spring is sleeved on the rotating shaft.

[0015] According to one aspect of the embodiment of the present invention, the second adjusting component further includes a moving member extending along the first direction and an adjusting mechanism connected to the moving member. The moving member is respectively movably connected to the first connecting rod and the second connecting rod of the second adjusting component, and the adjusting mechanism drives a plurality of adjusting units of the second adjusting component to reciprocate through the moving member.

[0016] According to one aspect of the embodiment of the present invention, the adjusting mechanism includes an adjusting wheel rotatably connected to the second fixing plate. The adjusting wheel is located on the side of the moving member close to the adjusting unit and is in contact connection with the moving member. The adjusting wheel is an eccentric structure to drive the moving member to reciprocate along the second direction by rotating the adjusting wheel; the adjusting wheel and the second fixing plate are rotatably connected by a rotating shaft. The adjusting wheel has a connecting hole, and the rotating shaft is inserted into the connecting hole and is in contact connection with the connecting hole, so that the adjusting wheel applies a transmission friction force to the rotating shaft; the adjusting mechanism further includes an adjusting arm fixedly connected to the adjusting wheel. The adjusting arm and the adjusting wheel are of an integral structure; the adjusting arm extends along the first direction and extends out of the second fixing plate by a part. The second fixing plate has a limiting groove corresponding to the adjusting arm to limit the adjusting arm to a preset position of the second fixing plate.

[0017] According to one aspect of an embodiment of the present invention, the adjustment mechanism further includes a fixing part fixed to the second fixing plate, the fixing part is located on the side of the moving part away from the adjusting wheel, a separation spring is arranged between the fixing part and the moving part, and the separation spring is always in a compressed state so that the moving part has a tendency to move away from the fixed part; a sliding rod is arranged on the side of the moving part close to the fixed part, the fixing part is provided with an axial hole matching the sliding rod, the sliding rod is inserted into the axial hole and slides with the parallel axial hole, and the separation spring is sleeved on the sliding rod.

[0018] Compared with the prior art, the chip testing device provided by the embodiment of the present invention has a clamping part including a plurality of clamping units, each clamping unit fixing a chip pin, thereby avoiding the problem of contact short circuit between the plurality of chip pins. At the same time, the chip pins can form a stable connection with the test probe through the clamping unit and the connecting column, thereby avoiding the signal jitter problem caused by the hand-held probe test. In addition, the spacing between adjacent clamping units is adjusted by linkage between the first adjustment component and the second adjustment component to adapt to chips with different chip pin spacings, thereby improving universality. At the same time, the spacing between adjacent second clamping parts is adjusted by the second adjustment component, so that the second clamping part is close to the first clamping part, thereby enabling the first clamping part and the second clamping part to be fixedly connected to the chip pins without welding, thereby reducing the difficulty of operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Other features, objects and advantages of the present invention will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings, in which the same or similar reference numerals represent the same or similar features.

[0020] Figure 1 and Figure 2 A schematic diagram showing the structure of a chip testing device provided by an embodiment of the present invention is shown;

[0021] Figure 3 A partial structural schematic diagram of a spacing adjustment component of a chip testing device provided by an embodiment of the present invention is shown;

[0022] Figure 4 A schematic diagram showing the connection between the clamping portion and the spacing adjustment component of the chip testing device provided by an embodiment of the present invention;

[0023] Figure 5 A schematic diagram showing the structure of an adjustment unit of a chip testing device provided by an embodiment of the present invention is shown;

[0024] Figure 6 A schematic diagram showing the connection between the first adjustment component and the second adjustment component of the chip testing device provided by an embodiment of the present invention;

[0025] Figure 7 A schematic diagram showing the structure of a clamping portion of a chip testing device provided by an embodiment of the present invention;

[0026] Figure 8 Partial structural schematic diagram of the first adjustment component of the chip testing device provided by an embodiment of the present invention is shown;

[0027] Figure 9 Structural schematic diagram of the transmission switching mechanism of the chip testing device provided by an embodiment of the present invention is shown;

[0028] Figure 10 Partial structural schematic diagram of the second adjustment component of the chip testing device provided by an embodiment of the present invention is shown.

[0029] Accompanying drawings

[0030] 110 - Fixed frame, 111 - First fixing plate, 112 - Second fixing plate;

[0031] 120 - Connecting column;

[0032] 130 - Clamping unit, 131 - First clamping part, 131a - Base, 131b - Clamping block, 131c - Elastic block, 131d - Limiting block, 131e - Electrical connecting member; 132 - Second clamping part;

[0033] 140 - First adjustment component, 141 - Connecting member, 142 - Adjusting unit, 142a - First connecting rod, 142b - Second connecting rod, 143 - Transmission switching mechanism, 143a - First transmission gear, 143b - Second transmission gear, 143c - First driving gear, 143d - Second driving gear, 143e - Rotating knob, 144 - First transmission rack, 144a - First adjusting block, 145 - Second transmission rack, 145a - Second adjusting block, 146 - Opposing gear;

[0034] 150 - Second adjustment component, 151 - Moving member, 152 - Adjusting mechanism, 152a - Adjusting wheel, 152b - Adjusting arm, 152c - Fixing member, 152d - Separating spring, 152e - Sliding rod;

[0035] 160 - Linkage adjusting member, 161 - First linkage slide rail, 162 - Second linkage slide rail;

[0036] X - First direction, Y - Second direction. Detailed implementation manners

[0037] The features and exemplary embodiments of various aspects of the present invention will be described in detail below. To make the objectives, technical solutions, and advantages of the present invention clearer and more understandable, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only configured to explain the present invention and are not configured to limit the present invention. For those skilled in the art, the present invention can be implemented without some of these specific details. The following description of the embodiments is only provided to provide a better understanding of the present invention by showing examples of the present invention.

[0038] The orientation terms used in the following description are all the directions shown in the figures and do not limit the specific structure of the embodiments of the present invention. In the description of the present invention, it should also be noted that, unless otherwise clearly specified and limited, the terms "installation" and "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected or indirectly connected. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0039] Please refer to Figures 1 to 4 , Figure 1 and Figure 2 which show the structural schematic diagram of the chip testing device provided by the embodiments of the present invention, Figure 3 which show the partial structural schematic diagram of the spacing adjustment component of the chip testing device provided by the embodiments of the present invention, Figure 4 which show the connection schematic diagram between the clamping part and the spacing adjustment component of the chip testing device provided by the embodiments of the present invention. Among them, the layer structural schematic diagrams in this application are all schematic diagrams in terms of structural principles, and the actual sizes, detailed positions, etc. of the various components included in the chip testing device can be adjusted according to the actual situation.

[0040] The chip testing device provided by the embodiments of the present invention includes a fixed frame 110, a connecting column 120, a clamping part, and a spacing adjustment component.

[0041] The connecting column 120 is arranged on the fixing frame 110, the clamping part is arranged on the fixing frame 110, the clamping part includes a plurality of clamping units 130, the clamping unit 130 includes a first clamping part 131 and a second clamping part 132, an opening for clamping the chip pins is formed between the first clamping part 131 and the second clamping part 132, one of the first clamping part 131 and the second clamping part 132 is electrically connected to the connecting column 120, the spacing adjusting assembly is arranged on the fixing frame 110, the spacing adjusting assembly includes a first adjusting assembly 140 and a second adjusting assembly 150, and the first adjusting assembly 140 and the second adjusting assembly 150 are connected by a linkage adjusting part 160 so that the first adjusting assembly 140 and the second adjusting assembly 150 are linked, and a plurality of first clamping parts 131 and second clamping parts 132 are respectively connected to the first adjusting assembly 140 and the second adjusting assembly 150 to realize the separation and combination between the first clamping part 131 and the second clamping part 132 in each clamping unit 130.

[0042] According to the chip testing device provided by the embodiment of the present invention, the clamping part includes a plurality of clamping units, and each clamping unit 130 fixes one chip pin, thereby avoiding the problem of contact short circuit between multiple chip pins. At the same time, the chip pin can form a stable connection with the test probe through the clamping unit and the connecting column 120, thereby avoiding the signal jitter problem caused by manually holding the probe for testing.

[0043] In addition, the distance between adjacent clamping units 130 is adjusted through the linkage between the first adjusting assembly 140 and the second adjusting assembly 150 to adapt to chips with different chip pin distances, improving the universality. At the same time, the distance between adjacent second clamping parts is adjusted through the second adjusting assembly, so that a plurality of second clamping parts 132 approach the first clamping part 131, and then the first clamping part 131 and the second clamping part 132 are fixedly connected to the chip pin without welding, reducing the operation difficulty.

[0044] It can be understood that for the chip testing device provided by the embodiment of the present invention, the number of clamping units 130, that is, the number of the first clamping part 131 and the second clamping part 132, can be selected according to actual needs, and the present application does not make specific limitations on this.

[0045] In some optional embodiments, both the first clamping part 131 and the second clamping part 132 may extend along the first direction X and extend out of a part of the fixing frame 110, which is convenient for the fixed connection between the chip pin and the first clamping part 131 and the second clamping part 132.

[0046] Optionally, both the first adjusting assembly 140 and the second adjusting assembly 150 may be provided with connectors 141 extending along the first direction X, and the first clamping part 131 and the second clamping part 132 are respectively connected to the first adjusting assembly 140 and the second adjusting assembly 150 through the connectors 141.

[0047] Optionally, both the first adjusting component 140 and the second adjusting component 150 include a plurality of adjusting units 142, and the plurality of adjusting units 142 are sequentially connected by a connecting shaft.

[0048] The setting position of the connecting member 141 on the first adjusting component 140 and the second adjusting component 150 is not limited. For example, in some alternative embodiments, the connecting member 141 may be provided on the adjusting units of the first adjusting component 140 and the second adjusting component 150. Of course, in other embodiments, the connecting member 141 may also be provided between adjacent adjusting units, that is, provided on the first connecting shaft, which facilitates the connection between the connecting member 141 and the first adjusting component 140 and the second adjusting component 150.

[0049] Optionally, the connecting member 141 may be a plate-like structure extending along the first direction X, and the connecting member 141 may have a long-strip connecting hole extending along the first direction X. The connecting member 141 is connected to two first connecting shafts between the connecting hole and the adjusting unit.

[0050] Please refer to Figure 5 , Figure 5 which shows a schematic structural diagram of the adjusting unit of the chip testing device provided by the embodiment of the present invention.

[0051] Further, the adjusting unit 142 includes a first connecting rod 142a and a second connecting rod 142b. The first connecting rod 142a and the second connecting rod 142b are cross-connected by a second connecting shaft. The adjusting unit 142 formed by the first connecting rod 142a and the second connecting rod 142b, and the first adjusting component 140 and the second adjusting component 150 formed by a plurality of adjusting units 142 have a simple structure.

[0052] Please refer to Figure 6 , Figure 6 which shows a schematic connection diagram of the first adjusting component and the second adjusting component of the chip testing device provided by the embodiment of the present invention.

[0053] In some alternative embodiments, the linkage adjusting member 160 includes a first linkage slide rail 161 and a second linkage slide rail 162. Both sides of the first linkage slide rail 161 and the second linkage slide rail 162 have connection grooves matching the first connecting shaft. Two first connecting shafts between the adjusting units 142 are respectively inserted into the connection grooves outside the first linkage slide rail 161 and the connection grooves outside the second linkage slide rail 162 and are slidably matched with the connection grooves, so as to realize the linkage of the first adjusting component 140 and the second adjusting component 150. Through the above settings, only by adjusting one of the first adjusting component 140 and the second adjusting component 150, the adjacent clamping units 130 can be moved closer to or away from each other.

[0054] In some alternative embodiments, the fixing bracket 110 includes a first fixing plate 111 and a second fixing plate 112 which are oppositely arranged. The first adjusting component 140 and the second adjusting component 150 are arranged between the first fixing plate 111 and the second fixing plate 112 through the second connecting shaft. The inner surfaces of the first fixing plate 111 and the second fixing plate 112 both have limiting grooves extending along the second direction Y and matching the second connecting shaft. The second connecting shaft is inserted into the limiting groove and slidably engaged with the limiting groove to limit the first adjusting component 140 and the second adjusting component 150 at a preset position, thereby increasing the sliding stability of the first adjusting component 140 and the second adjusting component 150.

[0055] Optionally, the first direction X and the second direction Y may intersect. Further, for the convenience of fixedly connecting the chip pins with the first clamping portion 131 and the second clamping portion 132, the first direction X and the second direction Y are perpendicular.

[0056] Optionally, the connecting column 120 may be fixed to the second fixing plate 112. The connection manner between the connecting column 120 and the second fixing plate 112 is not limited and may be a fixed connection, a detachable connection, or an integral structure.

[0057] Further, the connecting column may include a main body and a movable member detachably connected to the main body. The main body passes through the through hole on the first fixing plate and is connected to the connecting member on the first fixing plate to facilitate the test probe. Optionally, the main body and the movable member may be in a threaded connection, and the movable member may be a screw.

[0058] Optionally, the number of the connecting columns 120 may be the same as the number of the clamping units 130.

[0059] Optionally, the first fixing plate 111 and the second fixing plate 112 may be detachably connected.

[0060] Please refer to Figure 7 , Figure 7 which shows a schematic structural diagram of the clamping portion of the chip testing device provided by the embodiment of the present invention.

[0061] In some alternative embodiments, both the first clamping portion 131 and the second clamping portion 132 include a base 131a and a clamping block 131b. Among them, the base 131a is fixed to the connecting member 141. One of the base 131a and the clamping block 131b is provided with a shaft hole, and the other is provided with a rotating shaft matching the shaft hole. The rotating shaft is inserted into the shaft hole and rotatably engaged with the shaft hole. When the clamping block 131b clamps the chip pins, it will rotate appropriately according to the actual pitch of the pins, feeding back to the user that the clamping block 131b correctly contacts the chip pins, and at the same time ensuring that the direct movement of the clamping block 131b does not damage the chip pins.

[0062] Further, an elastic block 131c is provided between the base 131a and the clamping block 131b. The clamping block 131b is in contact connection with the elastic block 131c. One end of the clamping block 131b close to the elastic block 131c is an eccentric structure, so that when the clamping block 131b rotates, it has a resilience force approaching the chip pin, enabling the clamping block 131b to always be in contact with the chip pin end, thereby preventing poor electrical connection caused by insufficient adjustment of the distance of the clamping block 131b.

[0063] Optionally, the elastic block 131c can be a rubber block or other elastic block structures, and the present application does not make specific limitations thereto.

[0064] In some alternative embodiments, limiting blocks 131d can be provided on both sides of the base 131a to limit the clamping block 131b to a preset position, prevent the clamping block 131b from rotating excessively, and further prevent the clamping block 131b from contacting the clamping block 131b of another adjacent clamping unit.

[0065] Optionally, the base 131a and the limiting blocks 131d can be an integral structure, which is beneficial for molding.

[0066] In some alternative embodiments, one of the first clamping part 131 and the second clamping part 132 that is electrically connected to the connecting column 120 further includes an electrical connector 131e. The electrical connector 131e is fixed to the side surface of the clamping block 131b facing another adjacent clamping block 131b. The other clamping block 131b is an insulator, and contact between the other clamping block 131b and the chip pin during the clamping process will not cause a short circuit.

[0067] Exemplarily, the electrical connector 131e is fixed to the side surface of the clamping block 131b of the first clamping part 131 facing the clamping block 131b of the second clamping part. The first clamping part 131 forms an electrical connection with the connecting column 120 through the electrical connector 131e, and the clamping block 131b of the second clamping part 132 is an insulator.

[0068] Optionally, the electrical connector 131e can be a plate-shaped metal part or other metal parts, and the present application does not make specific limitations thereto. Optionally, the electrical connector 131e and the connecting column 120 can be electrically connected through a wire or other conductive media. Further, to avoid the wire affecting the elongation or shortening of the adjusting unit 142, the wire can be fixedly connected to the connector 141.

[0069] Please refer to Figure 8 and Figure 9 , Figure 8 , which shows a partial structural schematic diagram of the first adjusting component of the chip testing device provided by the embodiment of the present invention, Figure 9 , which shows a structural schematic diagram of the transmission switching mechanism of the chip testing device provided by the embodiment of the present invention.

[0070] In some alternative embodiments, the first adjusting assembly 140 further includes a transmission switching mechanism 143, a first transmission rack 144, and a second transmission rack 145. The transmission switching mechanism is disposed on the second fixing plate 112 and includes a first transmission gear 143a. The first transmission gear 143a is meshed and connected with the first transmission rack 144 to drive the first transmission rack 144. The first transmission rack 144 is slidably connected to an inner surface of the fixing frame 110 and is meshed and driven with the second transmission rack 145 through an opposed gear 146, so that the moving directions of the first transmission rack 144 and the second transmission rack 145 are opposite. One of the first transmission rack 144 and the second transmission rack 145 is connected to the first link 142a of the first adjusting assembly 140, and the other is connected to the upper second link 142b of the first adjusting assembly 140. The transmission switching mechanism causes the first transmission rack 144 and the second transmission rack 145 to move oppositely, and then it is converted into the elongation or shortening of multiple adjusting units 142 of the first adjusting assembly 140, thereby realizing the approach or separation of adjacent clamping units 130.

[0071] Further, a first adjusting block 144a extending along the second direction Y is disposed at one end of the first transmission rack 144, and a second adjusting block 145a extending along the second direction Y is disposed at an end of the second transmission rack 145 away from the first adjusting block 144a. One of the first adjusting block 144a and the second adjusting block 145a is movably connected to the first link 142a, and the other is movably connected to the second link 142b.

[0072] Exemplarily, the first transmission rack 144 is movably connected to the first link 142a of the first adjusting assembly 140 through the first adjusting block 144a, and the second transmission rack 145 is movably connected to the second link 142b of the first adjusting assembly 140 through the second adjusting block 145a. By driving the first transmission gear 143a, the first transmission rack 144 and the second transmission rack 145 move oppositely, so that multiple adjusting units 142 of the first adjusting assembly 140 and the second adjusting assembly 150 elongate or shorten simultaneously, and further the adjacent clamping units 130 are separated or approached.

[0073] Optionally, the first adjusting block 144a and the second adjusting block 145a may both have connection holes, and the first adjusting block 144a and the second adjusting block 145a are hinged to the first link 142a and the second link 142b through the connection holes.

[0074] Optionally, between the first drive rack and the first adjustment block 144a, and between the second drive rack 145 and the second adjustment block 145a, a split structure may be adopted, and they are fixedly connected or detachably connected to each other. Of course, in some embodiments, between the first drive rack and the first adjustment block 144a, and between the second drive rack 145 and the second adjustment block 145a, an integral structure may also be adopted, which is beneficial to molding.

[0075] In some alternative embodiments, the transmission switching mechanism 143 may further include a second drive gear 143b, a first drive gear 143c, and a second drive gear 143d. The first drive gear 143a, the second drive gear 143b, the first drive gear 143c, and the second drive gear 143d have the same module. The first drive gear 143c is in meshing transmission connection with the first drive gear 143a, and the second drive gear 143d is in meshing transmission connection with the second drive gear 143b. The radial dimension of the first drive gear 143a is larger than the radial dimension of the second drive gear 143b, and the radial dimension of the first drive gear 143c is smaller than the radial dimension of the second drive gear 143d. That is to say, the first drive gear 143a and the second drive gear 143d are large gears, and the second drive gear 143b and the first drive gear 143c are small gears. One of the groups of the first drive gear 143c and the first drive gear 143a or the second drive gear 143d and the second drive gear 143b can be in a meshing state, so that the transmission switching mechanism can perform speed or precision switching, and the speed adjustment or precision adjustment of the transmission switching mechanism can be switched according to the distances between the first clamping portion 131 and the second clamping portion 132 and the chip pins, so as to improve the moving speed and precision during the clamping of the chip pins.

[0076] It can be understood that when the first drive gear 143c is in meshing connection with the first drive gear 143a, at this time, the second drive gear 143d is disengaged from meshing with the second drive gear 143b, and the small gear drives the large gear, that is, a large transmission ratio transmission, and the transmission switching mechanism performs speed adjustment. When the second drive gear 143d is in meshing connection with the second drive gear 143b, at this time, the first drive gear 143c is disengaged from meshing with the first drive gear 143a, and the large gear drives the small gear, that is, a small transmission ratio transmission, and the transmission switching mechanism performs precision adjustment.

[0077] Optionally, the first drive gear 143c and the second drive gear 143d may be coaxially connected by a rotating shaft, and the first drive gear 143a and the second drive gear 143b are coaxially connected by a transmission shaft. The rotating shaft and the transmission shaft are perpendicular to the second fixing plate 112 and are rotatably connected to the second fixing plate 112. The distance between the first drive gear 143c and the second drive gear 143d is greater than the distance between the first drive gear 143a and the second drive gear 143b.

[0078] It can be understood that when the second driving gear 143d is meshed and connected with the second transmission gear 143b, the transmission switching mechanism 143 is in the precision adjustment state, and when the first driving gear 143c is meshed and connected with the first transmission gear 143a, the transmission switching mechanism 143 is in the speed adjustment state. For example, assuming that the initial state of the transmission switching mechanism 143 is the precision adjustment state, that is, the second driving gear 143d is meshed and connected with the second transmission gear 143b, press down or lift the rotating shaft to make the first driving gear 143c meshed and connected with the first transmission gear 143a, and the transmission switching mechanism 143 switches to the speed adjustment state.

[0079] Optionally, a rotary knob 143e may be fixed to one end of the rotating shaft away from the second fixing plate 112, and the first driving gear 143c and the second driving gear 143d are driven to rotate through the rotary knob 143e, which is convenient for adjusting the transmission switching mechanism 143.

[0080] It can be understood that the first transmission rack 144 may have three rows of teeth extending along the first direction X and are respectively meshed and connected with the first transmission gear 143a, the second transmission gear 143b and the opposing gear 146.

[0081] In some alternative embodiments, a return spring is provided between the second fixing plate 112 and the second driving gear 143d. When the return spring is compressed by an external force, the second driving gear 143d and the second transmission gear 143b are in the meshed state. When the external force is removed, the return spring rebounds, so that the first driving gear 143c and the first transmission gear 143a are in the meshed state. That is to say, under the condition of not applying an external force, the second driving gear 143d and the second transmission gear 143b are always in the meshed state, that is, the transmission switching mechanism 143 is in the precision adjustment state.

[0082] It can be understood that when the adjacent clamping units 130 are far apart, the rotary knob can be pressed down to make the first driving gear 143c meshed and connected with the first transmission gear 143a, and the transmission switching mechanism adjusts the speed, so that the adjacent clamping units 130 quickly approach or move away, shortening the connection and fixing time between the clamping unit and the chip pin.

[0083] Optionally, the rotating shaft may be a telescopic rod-shaped structure, such as a two-stage or multi-stage telescopic rod, which is not specifically limited in this application, and the return spring is sleeved on the rotating shaft.

[0084] Please refer to Figure 10 , Figure 10 which shows a partial structural schematic diagram of the second adjustment component of the chip testing device provided by the embodiment of the present invention.

[0085] In some alternative embodiments, the second adjustment assembly 150 further includes a moving member 151 extending along the first direction X and an adjustment mechanism 152 connected to the moving member 151. The moving member 151 is movably connected to the first link 142a and the second link 142b of the second adjustment assembly 150 respectively. The adjustment mechanism 152 drives the plurality of adjustment units 142 of the second adjustment assembly 150 to reciprocate through the moving member 151. That is to say, the adjustment mechanism 152 is the power source.

[0086] Exemplarily, the plurality of adjustment units 142 of the second adjustment assembly 150 are connected to the second clamping portion 132 through a connecting member 141, that is, the plurality of second clamping portions 132 can be reciprocated by the adjustment mechanism 152.

[0087] Optionally, the moving member 151 can be a strip-shaped plate-like structure or a structure of other shapes, which is not specifically limited in this application.

[0088] Optionally, the adjustment mechanism 152 can include an adjustment wheel 152a rotatably connected to the second fixing plate 112. The adjustment wheel 152a is located on the side of the moving member 151 close to the adjustment unit 142 and is in contact connection with the moving member 151. The adjustment wheel 152a is an eccentric structure to drive the moving member to reciprocate along the second direction Y by rotating the adjustment wheel.

[0089] It can be understood that the adjustment wheel 152a is in contact connection with the moving member 151, and the adjustment wheel 152a is an eccentric structure. When the adjustment wheel 152a rotates, the distance between its axis and the moving member 151 will change, thereby pushing the moving member 151 to generate a linear displacement.

[0090] The adjustment wheel 152a is rotatably connected to the second fixing plate 112 through a rotating shaft. The adjustment wheel 152a has a connection hole, and the rotating shaft is inserted into the connection hole and is in contact connection with the connection hole, so that the adjustment wheel 152a applies a transmission friction force to the rotating shaft.

[0091] It can be understood that there is a friction force at the contact end between the adjustment wheel 152a and the rotating shaft, which can prevent the adjustment wheel 152a from moving after the rotation stops, and further prevent the plurality of adjustment units 142 of the second adjustment assembly 150 from moving, so that the first clamping portion 131 and the second clamping portion 132 clamp the chip pins.

[0092] In some alternative embodiments, the adjustment mechanism 152 further includes an adjustment arm 152b fixedly connected to the adjustment wheel 152a to drive the adjustment wheel 152a to rotate through the adjustment arm 152b. The adjustment arm 152b and the adjustment wheel 152a are of an integral structure, which is beneficial to molding.

[0093] Further, the adjusting arm 152b can extend along the first direction X and extend out of a part of the second fixing plate to facilitate driving the adjusting wheel 152a. The second fixing plate 112 has a limiting groove corresponding to the adjusting arm 152b for restricting the adjusting arm 152b to a preset position of the second fixing plate.

[0094] Optionally, the adjusting mechanism may further include a fixing member 152c fixed to the second fixing plate 112. The fixing member 152c is located on the side of the moving member 151 away from the adjusting wheel 152a. A separating spring 152d is provided between the fixing member 152c and the moving member 151. The separating spring 152d is always in a compressed state to cause the moving member 151 to have a tendency to move away from the fixing member 152c. Thus, before the chip pin falls between the first clamping portion 131 and the second clamping portion 132, the first clamping portion 131 and the second clamping portion 132 always have a tendency to move away from each other.

[0095] Optionally, the fixing member 152c can be a strip-shaped plate-like structure or a structure of other shapes, which is not specifically limited in this application.

[0096] In some alternative embodiments, a sliding rod 152e is provided on the side of the moving member 151 close to the fixing member 152c. The fixing member is provided with a shaft hole matching the sliding rod 152e. The sliding rod 152e is inserted into the shaft hole and slidably engaged with the shaft hole. The separating spring 152d is sleeved on the sliding rod 152e to increase the stability of the moving member 151 and prevent the separating spring 152d from detaching.

[0097] Exemplarily, when the clamping unit 130 clamps the chip pins, it can first rotate the rotary knob 143e according to the pitch of each chip pin to adjust the pitch of each first clamping portion 131, so that the pitch of each first clamping portion 131 matches the pitch of each chip pin, and the chip pins fall between the first clamping portion 131 and the second clamping portion 132. Then rotate the rotary knob 143e to make the electrical connector 131e of the first clamping portion 131 contact the chip pin. During adjustment, according to the distance between the first clamping portion 131 and the chip pin, two modes of precision adjustment or speed adjustment can be selectively used to control the moving speed of the first clamping portion 131. The user can judge whether the first clamping portion 131 contacts the chip pin according to the angular change of the clamping block 131b of the first clamping portion 131, and make the first clamping portion 131 have a certain error tolerance to prevent the first clamping portion 131 from directly contacting the chip pin rigidly and damaging the chip pin. After the pitch of the first clamping portion 131 contacts the chip pin, then rotate the adjusting arm 152b to adjust the distance between the second clamping portion 132 and the first clamping portion 131. The first clamping portion 131 and the second clamping portion 132 clamp the chip pin therebetween. The connection between the connection column 120 and the chip pin is realized through the wire connected between the first clamping portion 131 and the connection column 120. After the clamping is completed, the connection part of the test device can be directly electrically connected to the dispersedly arranged connection columns 120, so that the connection between the chip pin and the test device becomes very easy, without the problem of accidental touch, and multiple connection methods can also be selected to connect to the connection columns 120, and the connection process is easy and convenient.

[0098] In the present application, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance. The term "plurality" means two or more unless otherwise clearly defined.

[0099] Those skilled in the art will readily conceive of other embodiments of the present invention after considering the specification and practicing the disclosure herein. This application is intended to cover any variations, uses, or adaptations of the present invention that follow the general principles of the present invention and include common general knowledge or conventional technical means in the technical field not disclosed in this application. The specification and examples are only regarded as exemplary, and the true scope and spirit of the present invention are pointed out by the following claims.

[0100] It should be understood that the present application is not limited to the exact structures described above and shown in the drawings, and various modifications and changes can be made without departing from its scope. The scope of the present application is only limited by the appended claims.

Claims

1. A chip testing device, characterized in that, Comprising: A fixing frame, including a first fixing plate and a second fixing plate arranged oppositely; A connecting column, arranged on the fixing frame; A clamping part, arranged on the fixing frame, the clamping part includes a plurality of clamping units, each clamping unit includes a first clamping part and a second clamping part, an opening for clamping the chip pins is formed between the first clamping part and the second clamping part, and one of the first clamping part and the second clamping part is electrically connected to the connecting column; A pitch adjusting assembly, arranged on the fixing frame, the pitch adjusting assembly includes a first adjusting assembly and a second adjusting assembly, the first adjusting assembly and the second adjusting assembly are connected by a linkage adjusting part so that the first adjusting assembly and the second adjusting assembly are linked, and a plurality of the first clamping parts and the second clamping parts are respectively connected to the first adjusting assembly and the second adjusting assembly to realize the separation and combination between the first clamping part and the second clamping part in each clamping unit; The first adjusting assembly and the second adjusting assembly are both provided with connecting parts extending in a first direction, and the first clamping part and the second clamping part are respectively connected to the first adjusting assembly and the second adjusting assembly through the connecting parts; Both the first adjusting assembly and the second adjusting assembly include a plurality of adjusting units, and the plurality of adjusting units are sequentially connected by a first connecting shaft, and the connecting part is connected to the first connecting shaft; The adjusting unit includes a first connecting rod and a second connecting rod, and the first connecting rod and the second connecting rod are cross-connected by a second connecting shaft; The first adjusting assembly and the second adjusting assembly are arranged between the first fixing plate and the second fixing plate through the second connecting shaft, and the inner surfaces of the first fixing plate and the second fixing plate both have a limiting groove extending in a second direction and matching with the second connecting shaft, and the second connecting shaft is inserted into the limiting groove and slidably matched with the limiting groove, and the first direction intersects with the second direction; The first adjusting assembly further includes a transmission switching mechanism, a first transmission rack and a second transmission rack, the transmission switching mechanism is arranged on the second fixing plate and includes a first transmission gear, the first transmission gear is meshed and connected with the first transmission rack to drive the first transmission rack, the first transmission rack is slidably connected to an inner surface of the fixing frame and is meshed and driven with the second transmission rack through an opposed gear so that the moving directions of the first transmission rack and the second transmission rack are opposite, and one of the first transmission rack and the second transmission rack is connected to the first connecting rod of the first adjusting assembly, and the other is connected to the second connecting rod of the first adjusting assembly; One end of the first transmission rack is provided with a first adjusting block extending in the second direction, and one end of the second transmission rack away from the first adjusting block is provided with a second adjusting block extending in the second direction, and one of the first adjusting block and the second adjusting block is movably connected to the first connecting rod, and the other is movably connected to the second connecting rod; The first transmission rack and the first adjusting block, as well as the second transmission rack and the second adjusting block, are all of integral structure; The transmission switching mechanism further includes a second transmission gear, a first driving gear, and a second driving gear. Among them, the first driving gear is in meshing transmission connection with the first transmission gear, the second driving gear is in meshing transmission connection with the second transmission gear. The radial dimension of the first transmission gear is larger than that of the second transmission gear, and the radial dimension of the first driving gear is smaller than that of the second driving gear. One of the groups of the first driving gear and the first transmission gear or the second driving gear and the second transmission gear can be in a meshing state, so that the transmission switching mechanism can perform speed or precision switching; The first driving gear and the second driving gear are coaxially connected by a rotating shaft, the first transmission gear and the second transmission gear are coaxially connected by a transmission shaft. The rotating shaft and the transmission shaft are both perpendicular to the second fixing plate and are rotatably connected to the second fixing plate. The distance between the first driving gear and the second driving gear is greater than the distance between the first transmission gear and the second transmission gear; A rotary knob is fixed to one end of the rotating shaft away from the second fixing plate.

2. The chip testing device according to claim 1, wherein Both the first clamping portion and the second clamping portion extend along the first direction and extend out of a part of the fixing frame.

3. The chip testing device according to claim 1, wherein The linkage adjusting member includes a first linkage slide rail and a second linkage slide rail. Both sides of the first linkage slide rail and the second linkage slide rail are provided with connection grooves matching the first connecting shaft. The first connecting shaft is inserted into the connection groove and is in sliding fit with the connection groove.

4. The chip testing device according to claim 1, wherein, Both the first clamping portion and the second clamping portion include a base and a clamping block. Among them, the base is fixed to the connecting member. One of the base and the clamping block is provided with a shaft hole, and the other is provided with a rotating shaft matching the shaft hole. The rotating shaft is inserted into the shaft hole and is in rotational fit with the shaft hole.

5. The chip testing device according to claim 4, wherein, An elastic block is arranged between the base and the clamping block. The clamping block is in contact connection with the elastic block. One end of the clamping block close to the elastic block is an eccentric structure, so that the clamping block has a resilience force approaching the chip pin when rotating; Limit blocks are arranged on both sides of the base to limit the clamping block to a preset position; The one of the first clamping portion and the second clamping portion that is electrically connected to the connecting column further includes an electrical connecting member. The electrical connecting member is fixed to a side surface of the clamping block facing the adjacent other clamping block, and the other clamping block is an insulator.

6. The chip testing device according to claim 1, characterized in that, A return spring is arranged between the second fixing plate and the second driving gear. When the return spring is compressed by an external force, the second driving gear and the second transmission gear are in a meshing state. When the external force is removed, the return spring rebounds, so that the first driving gear and the first transmission gear are in a meshing state; The rotating shaft is a telescopic rod-shaped structure, and the return spring is sleeved on the rotating shaft.

7. The chip testing device according to claim 1, wherein, The second adjustment component further includes a moving member extending along the first direction and an adjustment mechanism connected to the moving member. The moving member is respectively movably connected to the first link and the second link of the second adjustment component. The adjustment mechanism drives a plurality of the adjustment units of the second adjustment component to reciprocate through the moving member.

8. The chip testing device according to claim 7, wherein, The adjustment mechanism includes an adjustment wheel rotatably connected to the second fixing plate. The adjustment wheel is located on one side of the moving member close to the adjustment unit and is in contact connection with the moving member. The adjustment wheel is an eccentric structure to drive the moving member to reciprocate along the second direction by rotating the adjustment wheel. The adjustment wheel and the second fixing plate are rotatably connected through a rotating shaft. The adjustment wheel has a connection hole. The rotating shaft is inserted into the connection hole and is in contact connection with the connection hole, so that the adjustment wheel applies a transmission friction force to the rotating shaft. The adjustment mechanism further includes an adjustment arm fixedly connected to the adjustment wheel. The adjustment arm and the adjustment wheel are of an integral structure. The adjustment arm extends along the first direction and extends out of the second fixing plate by a part. The second fixing plate has a limiting groove corresponding to the adjustment arm to limit the adjustment arm to a preset position of the second fixing plate.

9. The chip testing device according to claim 8, wherein, The adjustment mechanism further includes a fixing member fixed to the second fixing plate. The fixing member is located on one side of the moving member away from the adjustment wheel. A separation spring is arranged between the fixing member and the moving member. The separation spring is always in a compressed state to make the moving member tend to move away from the fixing member. A sliding rod is arranged on one side of the moving member close to the fixing member. The fixing member is provided with a shaft hole matching the sliding rod. The sliding rod is inserted into the shaft hole and is in sliding fit with the shaft hole. The separation spring is sleeved on the sliding rod.

Images