A correction method for soil sampling depth of direct-push soil drilling rig

By calculating the correction distance between the soil sample collection position and the top of the soil layer, the sampling depth of the vertical push soil extraction drilling rig is corrected, and the problem of sampling depth measurement error is solved, and more accurate soil sample formation positioning is achieved.

CN114878221BActive Publication Date: 2025-08-29SHANGHAI DI MINE ENG KANCHA CO LTD
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Patent Information

Application Number
CN202210621982.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-06-02
Publication Date
2025-08-29
Estimated Expiration
2042-06-02

AI Technical Summary

Technical Problem

During the soil sample sampling process, the sampling depth measurement errors occur due to the small diameter of the sampling tube and the different soil compressibility.

Method used

By determining the thickness of each soil layer in the real strata, the correction distance between the soil sample collection position within the sampling back to the top of the soil layer, and the correction depth is corrected using formulas, including thread drilling and auger drilling to determine the thickness and correction distance of each layer, and the correction depth is calculated.

Benefits of technology

Reduced sampling depth measurement errors and achieved more accurate soil sample formation positioning.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses a method for correcting the sampling depth of soil samples for a direct-push soil drilling rig. In this method, the thickness of each soil layer in the actual stratum is first determined; then, based on the distance from the soil sample collection position to the top of the soil layer within a sampling round, the thickness of the soil layer where the soil sample is located within the sampling round, and the thickness of the soil layer where the soil sample is located in the actual stratum, the distance from the soil sample collection position to the top of the soil layer within the corrected sampling round is calculated; finally, based on the distance from the soil sample collection position to the top of the soil layer within the corrected sampling round, the number of sampling rounds, the length of the sampling round, and the distance from the top of the soil layer where the soil sample is located within the sampling round to the starting position of the sampling round, the corrected sampling depth of the soil sample is calculated. This method can more accurately locate the stratum where the soil sample is located.
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Description

Technical Field

[0001] The present invention relates to the technical field of soil measurement, and in particular to a method for correcting the sampling depth of soil samples of a direct-push soil drilling rig. Background Art

[0002] In soil contamination surveys, Geoprobe direct-push soil drilling rigs are widely used to collect soil samples, effectively preventing secondary contamination caused by sampling operations. However, due to the small diameter of the sampling tubes used with direct-push drills, typically 30-50mm, and the inherent compressibility of soil, which varies from stratum to stratum, the sampling tubes can contain gaps within each sampling pass. This can lead to significant errors in the soil sampling depths determined based on the sampling tubes. Figure 1 The figure shows a schematic diagram of the sampling tube of a direct-push soil drilling rig sampling back to the goaf section. Figure 1 As shown, there is a mined-out distance between the sampling position of the soil sample in each sampling round and the top of the sampling round where the soil sample is located, that is, there is a mined-out section in each sampling round, which leads to errors in directly measuring the sampling depth of the soil sample displayed by the sampling tube.

[0003] Therefore, a correction method for measuring the sampling depth of soil samples is needed, which can correct the error in measuring the soil sampling depth based on the sampling tube of a direct-push soil drilling rig to solve the problems existing in the above-mentioned prior art. Summary of the Invention

[0004] In view of the above problems, the present invention is proposed to provide a method for correcting the sampling depth of soil samples of a direct-push soil drilling rig that overcomes the above problems or at least partially solves the above problems. In this method, first, the thickness of each soil layer in the real stratum is determined; then, based on the distance from the soil sample collection position to the top of the soil layer within the sampling round, the thickness of the soil layer where the soil sample is located within the sampling round, and the thickness of the soil layer where the soil sample is located in the real stratum, the corrected distance from the soil sample collection position within the sampling round to the top of the soil layer is calculated; finally, based on the corrected distance from the soil sample collection position to the top of the soil layer within the sampling round, the number of sampling rounds, the length of the sampling round, and the distance from the top of the soil layer where the soil sample is located within the sampling round to the starting position of the sampling round, the corrected sampling depth of the soil sample is calculated.

[0005] Optionally, in the above method, the thickness of each soil layer in the actual formation is determined by screw drilling using a threaded borehole.

[0006] Optionally, in the above method, the corrected distance from the soil sample collection location to the top of the soil layer within the sampling round is calculated by the following formula:

[0007]

[0008] Among them, x i is the corrected distance from the i-th soil sample collection location to the top of the soil layer in the i-th sampling round, m' i is the thickness of the soil layer where the i-th soil sample is located in the i-th sampling round, m i is the thickness of the soil layer where the i-th soil sample is located in the real stratum, x' i It is the distance from the i-th soil sample collection location to the top of the i-th soil layer in the i-th sampling round.

[0009] Optionally, the corrected sampling depth of the soil sample is calculated by the following formula:

[0010] d i =(n-1)×L+S i +x i .

[0011] Among them, d i is the corrected sampling depth of the i-th soil sample, n is the number of sampling rounds, L is the length of the i-th sampling round, S i is the distance from the top of the i-th soil layer where the i-th soil sample is located to the starting position of the sampling round, x i It is the corrected distance from the i-th soil sample collection location to the top of the i-th soil layer in the i-th sampling round.

[0012] Optionally, the direct-push soil drilling rig includes multiple sampling tubes, one sampling tube represents one sampling round, and there is a mining distance between the sampling position of the soil sample in each sampling round and the top of the sampling round where the soil sample is located.

[0013] According to the solution of the present invention, by correcting the distance from the soil sample collection position to the top of the soil layer in each sampling round and calculating the corrected sampling depth of each soil sample, the mining error caused by directly calculating the sampling depth of the soil sample displayed in the sampling tube can be reduced, and the stratum where the soil sample is located can be located more accurately.

[0014] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are specifically listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present invention. The same reference symbols are used throughout the drawings to represent the same components. In the drawings:

[0016] Figure 1 A schematic diagram of the goaf section within the sampling cycle of the sampling tube of a direct-push soil drilling rig is shown.

[0017] Figure 2 A schematic flow chart of a method 200 for correcting the soil sampling depth of a direct-push soil drilling rig according to an embodiment of the present invention is shown;

[0018] Figure 3 A schematic diagram showing the correction of the distance from the soil sample collection position to the top of the soil layer within a sampling round according to one embodiment of the present invention is shown;

[0019] Figure 4 A schematic diagram showing correction of the sampling depth of soil samples according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0020] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0021] A direct-push soil drill pushes a sampling tube into the soil without adding water or rotating the drill. This allows for continuous and rapid extraction of cylindrical soil samples at a specific depth, unaffected by external interference. However, compression of the soil's pore volume causes compression deformation of the soil sample in the sampling tube, resulting in gaps between sampling passes and affecting the accuracy of soil sample depth measurements. This proposal proposes a method for correcting the sampling depth of soil samples collected by a direct-push soil drill. This method can correct for errors in the sampling depth obtained during each sampling pass.

[0022] Figure 2 FIG. 2 is a flow chart showing a method 200 for correcting the soil sampling depth of a direct-push soil drilling rig according to an embodiment of the present invention. Figure 2 As shown, the method starts at step S210, where the thickness of each soil layer in the actual stratum is determined.

[0023] In order to more accurately confirm the collection depth of each soil sample, manual threaded drilling can be used next to each detection point (near the sampling tube) to confirm the precise stratum distribution and determine the thickness of each soil layer in the actual stratum.

[0024] Then, step S220 is executed to calculate the corrected distance from the soil sample collection location to the top of the soil layer within the sampling round, based on the distance from the soil sample collection location within the sampling round to the top of the soil layer, the thickness of the soil layer containing the soil sample within the sampling round, and the thickness of the soil layer containing the soil sample in the actual stratum. Each time the drill tool is lowered to the bottom of the hole and drilled until it is completely lifted out of the hole, it constitutes one operation cycle, known as a sampling round. A direct-push soil drilling rig includes multiple sampling tubes, and each sampling tube represents one sampling round.

[0025] Figure 3 FIG. 1 shows a schematic diagram of the distance correction from the soil sample collection position to the top of the soil layer within a sampling round according to an embodiment of the present invention. Figure 3 As shown in the figure, a sampling tube includes four sampling rounds. The thickness of the first soil layer where the first soil sample collected in the first sampling round in the real stratum is m1, and the distance from the first soil sample collection position to the top of the first soil layer in the first sampling round is x'1. The thickness of the first soil layer where the first soil sample is collected in the first sampling round is m'1. Therefore, the corrected distance x1 from the first soil sample collection position to the top of the first soil layer can be calculated by the following formula:

[0026]

[0027] By analogy, the thickness of the second soil layer where the second soil sample collected in the second sampling round in the real stratum is located is m2, the distance from the second soil sample collection position to the top of the second soil layer in the second sampling round is x'2, and the thickness of the second soil layer where the second soil sample is located in the second sampling round is m'2. Therefore, the corrected distance x2 from the second soil sample collection position to the top of the second soil layer can be calculated by the following formula:

[0028]

[0029] The corrected distance x3 from the third soil sample collection location to the top of the third soil layer in the third sampling round, and the corrected distance x4 from the fourth soil sample collection location to the top of the fourth soil layer in the fourth sampling round, are calculated using the methods described above and are not further described here. It should be noted that the number of sampling rounds within the sampling tube is merely exemplary and can be increased or decreased based on the actual desired soil sampling depth.

[0030] Finally, step S230 is executed to calculate the corrected sampling depth of the soil sample based on the corrected distance from the soil sample collection position to the top of the soil layer within the sampling round, the number of sampling rounds, the length of the sampling round, and the distance from the top of the soil layer where the soil sample is located to the starting position of the sampling round.

[0031] Figure 4 FIG. 1 shows a schematic diagram of the correction of the soil sample sampling depth according to an embodiment of the present invention. Figure 4 As shown, n is the total number of sampling rounds. In the embodiment of the present invention, the value of n is 4. L is the length of the third sampling round. The length of each sampling round in the sampling tube can be the same or different, which is not limited here. S3 is the distance from the top of the third soil layer where the third soil sample is located to the starting position of the third sampling round. x3 is the corrected distance from the third soil sample collection position to the top of the third soil layer within the third sampling round. Therefore, the corrected sampling depth d3 of the third soil sample can be calculated by the following formula:

[0032] d3=3×L+S3+x3

[0033] It can be obtained by formula d i =(n-1)×L+S i +x i Calculate the corrected sampling depth for each soil sample in turn.

[0034] Through the above scheme, by correcting the distance from the soil sample collection position to the top of the soil layer in each sampling round and calculating the corrected sampling depth of each soil sample, the mining error caused by directly calculating the sampling depth of the soil sample displayed in the sampling tube can be reduced, and the stratum where the soil sample is located can be located more accurately.

[0035] In the description provided herein, a large number of specific details are described. However, it is understood that embodiments of the present invention can be practiced without these specific details. In some instances, well-known methods, structures, and techniques are not shown in detail so as not to obscure the understanding of this description.

[0036] Similarly, it should be understood that in order to streamline the present disclosure and aid in understanding one or more of the various inventive aspects, in the above description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together into a single embodiment, figure, or description thereof. However, this disclosed method should not be interpreted as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim. Rather, as reflected in the claims below, inventive aspects lie in less than all the features of the individual embodiments disclosed above. Accordingly, the claims that follow the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of the invention.

[0037] Those skilled in the art will appreciate that the modules, units, or components of the devices in the examples disclosed herein may be arranged in the device described in the embodiment, or alternatively may be located in one or more devices different from the devices in the examples. The modules in the foregoing examples may be combined into one module or further divided into multiple submodules.

[0038] Those skilled in the art will appreciate that the modules in the devices in the embodiments may be adaptively changed and arranged in one or more devices different from the embodiments. The modules or units or components in the embodiments may be combined into one module or unit or component, and in addition may be divided into multiple submodules or subunits or subcomponents. All features disclosed in this specification (including the accompanying claims, abstracts and drawings) and all processes or units of any method or device disclosed herein may be combined in any combination, except that at least some of such features and / or processes or units are mutually exclusive. Unless expressly stated otherwise, each feature disclosed in this specification (including the accompanying claims, abstracts and drawings) may be replaced by an alternative feature providing the same, equivalent or similar purpose.

[0039] Furthermore, those skilled in the art will appreciate that although some embodiments described herein include certain features included in other embodiments but not other features, combinations of features from different embodiments are intended to be within the scope of the present invention and to form different embodiments. For example, in the claims below, any of the claimed embodiments may be used in any combination.

[0040] In addition, some of the embodiments are described herein as methods or combinations of method elements that can be implemented by a processor of a computer system or by other devices that perform the functions described. Thus, a processor having the necessary instructions for implementing the method or method element forms a device for implementing the method or method element. Furthermore, the elements described herein of the device embodiments are examples of devices for implementing the functions performed by the elements for the purpose of implementing the invention.

[0041] As used herein, unless otherwise specified, the use of ordinal numbers "first," "second," "third," etc. to describe common objects merely indicates that different instances of similar objects are involved and are not intended to imply that the objects so described must have a given order in time, space, ranking, or in any other manner.

[0042] Although the present invention has been described with respect to a limited number of embodiments, it will be apparent to those skilled in the art, having benefit of the foregoing description, that other embodiments are contemplated within the scope of the invention thus described. Furthermore, it should be noted that the language used in this specification has been selected primarily for readability and didactic purposes, rather than for the purpose of explaining or limiting the subject matter of the present invention. Consequently, many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the appended claims. The disclosure of the present invention is intended to be illustrative and not restrictive of the scope of the invention, which is defined by the appended claims.

Claims

1. A method for correcting the sampling depth of soil samples of a direct-push soil drilling rig, characterized in that: The method comprises: determining the thickness of each soil layer in the actual formation, including determining the thickness of each soil layer in the actual formation using a screw drill; According to the distance from the soil sample collection position to the top of the soil layer within the sampling round, the thickness of the soil layer where the soil sample is located within the sampling round, and the thickness of the soil layer where the soil sample is located in the actual stratum, the corrected distance from the soil sample collection position to the top of the soil layer within the sampling round is calculated using the following formula: ; in, is the corrected distance from the i-th soil sample collection location to the top of the soil layer in the i-th sampling round, is the thickness of the soil layer where the i-th soil sample is located in the i-th sampling round, is the thickness of the soil layer where the i-th soil sample is located in the real stratum, is the distance from the i-th soil sample collection location to the top of the i-th soil layer in the i-th sampling round; The corrected sampling depth of the soil sample is calculated based on the corrected distance from the soil sample collection location to the top of the soil layer within the sampling round, the number of sampling rounds, the length of the sampling round, and the distance from the top of the soil layer where the soil sample is located to the starting position of the sampling round. The formula is as follows: ; in, is the corrected sampling depth of the i-th soil sample, n is the number of sampling rounds, L is the length of the i-th sampling round, is the distance from the top of the i-th soil layer where the i-th soil sample is located to the starting position of the sampling round, It is the corrected distance from the i-th soil sample collection location to the top of the i-th soil layer in the i-th sampling round.

2. The method according to claim 1, characterized in that The direct-push soil drilling rig includes multiple sampling tubes, and one sampling tube is used for one sampling round.

3. The method according to claim 1, characterized in that There is a mined-out distance between the sampling position of the soil sample within the sampling round and the top of the sampling round where the soil sample is located.

Citation Information

Patent Citations

  • Multilayer sampling device for determining contaminated soil and sampling method thereof

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